Datasheet MRF5S19150HR3, MRF5S19150HSR3 Datasheet (Freescale)

Page 1
查询MRF5S19100H供应商
Freescale Semiconductor
Technical Data
RF Power Field Effect Transistors
N-Channel Enhancement-Mode Lateral MOSFETs
Designed for PCN and PCS base station applications at frequencies from 1900 to 2000 MHz. Suitable for TDMA, CDMA and multicarrier amplifier applications.
Typical 2- Carrier N-CDMA Performance for V
1400 mA, Avg., P (Pilot, Sync, Paging, Traffic Codes 8 Through 13) Channel Bandwidth =
= 32 Watts Avg., Full Frequency Band, IS- 95 CDMA
out
1.2288 MHz. Peak/Avg. = 9.8 dB @ 0.01% Probability on CCDF. Power Gain — 14 dB Drain Efficiency — 26% IM3 @ 2.5 MHz Offset — -36.5 dBc @ 1.2288 MHz Bandwidth ACPR @ 885 kHz Offset — -50 dB @ 30 kHz Bandwidth
Capable of Handling 5:1 VSWR, @ 28 Vdc, f1 = 1960 MHz,
100 Watts CW Output Power
Characterized with Series Equivalent Large- Signal Impedance Parameters
Internally Matched, Controlled Q, for Ease of Use
Qualified Up to a Maximum of 32 V Operation
Integrated ESD Protection
Lower Thermal Resistance Package
Low Gold Plating Thickness on Leads, 40
In Tape and Reel. R3 Suffix = 250 Units per 56 mm, 13 inch Reel.
= 28 Volts, IDQ =
DD
µ″ Nominal.
MRF5S19150H
Rev. 1, 12/2004
MRF5S19150HR3
MRF5S19150HSR3
1990 MHz, 32 W AVG., 28 V
2 x N- CDMA
LATERAL N- CHANNEL
RF POWER MOSFETs
CASE 465B-03, STYLE 1
NI-880
MRF5S19150HR3
CASE 465C-02, STYLE 1
NI-880S
MRF5S19150HSR3
Table 1. Maximum Ratings
Rating Symbol Value Unit
Drain-Source Voltage V
Gate-Source Voltage V
Total Device Dissipation @ TC = 25°C
Derate above 25°C
Storage Temperature Range T
Operating Junction Temperature T
CW Operation CW 100 W
DSS
GS
P
stg
D
J
-0.5, +65 Vdc
-0.5, +15 Vdc
427
2.44
- 65 to +150 °C
200 °C
Table 2. Thermal Characteristics
Characteristic Symbol Value
Thermal Resistance, Junction to Case
Case Temperature 80°C, 100 W CW Case Temperature 75°C, 32 W CW
1. MTTF calculator available at http://www.freescale.com/rf. Select Tools/Software/Application Software/Calculators to access the MTTF calculators by product.
2. Refer to AN1955/D, Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf. Select Documentation/Application Notes - AN1955.
NOTE - CAUTION packaging MOS devices should be observed.
- MOS devices are susceptible to damage from electrostatic charge. Reasonable precautions in handling and
R
θ
JC
(1,2)
0.41
0.44
W
W/°C
Unit
°C/W
Freescale Semiconductor, Inc., 2004. All rights reserved.
RF Device Data Freescale Semiconductor
MRF5S19150HR3 MRF5S19150HSR3
1
Page 2
Table 3. ESD Protection Characteristics
Test Conditions Class
Human Body Model 1 (Minimum)
Machine Model M3 (Minimum)
Charge Device Model C7 (Minimum)
Table 4. Electrical Characteristics (T
Characteristic
Off Characteristics
Zero Gate Voltage Drain Leakage Current
(V
= 65 Vdc, VGS = 0 Vdc)
DS
Zero Gate Voltage Drain Leakage Current
(V
= 28 Vdc, VGS = 0 Vdc)
DS
Gate-Source Leakage Current
(V
= 5 Vdc, VDS = 0 Vdc)
GS
On Characteristics
Gate Threshold Voltage
(V
= 10 Vdc, ID = 360 µAdc)
DS
Gate Quiescent Voltage
(V
= 28 Vdc, ID = 1400 mAdc)
DS
Drain-Source On-Voltage
(V
= 10 Vdc, ID = 3.6 Adc)
GS
Forward Transconductance
(V
= 10 Vdc, ID = 3.6 Adc)
DS
Dynamic Characteristics
Reverse Transfer Capacitance
(VDS = 28 Vdc, VGS = 0, f = 1 MHz)
Functional Tests (In Freescale Test Fixture, 50 ohm system) VDD = 28 Vdc, IDQ = 1400 mA, P f2 = 1932.5 MHz and f1 = 1987.5 MHz, f2 = 1990 MHz, 2-Carrier N - CDMA, 1.2288 MHz Channel Bandwidth Carriers. ACPR measured in 30 kHz Channel Bandwidth @ ±885 kHz Offset. IM3 measured in 1.2288 MHz Channel Bandwidth @ ±2.5 MHz Offset. Peak/Avg = 9.8 dB @
0.01% Probability on CCDF.
Power Gain
Drain Efficiency η
Intermodulation Distortion IM3 -36.5 -35 dBc
Adjacent Channel Power Ratio ACPR -50 -48 dBc
Input Return Loss IRL -17 -9 dB
1. Part is internally matched both on input and output.
(1)
= 25°C unless otherwise noted)
C
Symbol Min Typ Max Unit
I
DSS
I
DSS
I
GSS
V
GS(th)
V
GS(Q)
V
DS(on)
C
G
g
fs
rss
ps
D
10 µAdc
1 µAdc
1 µAdc
2.5 2.8 3.5 Vdc
3.8 Vdc
0.24 Vdc
9 S
3.1 pF
= 32 W Avg., f1 = 1930 MHz,
out
13 14 dB
24 26 %
MRF5S19150HR3 MRF5S19150HSR3
2
RF Device Data
Freescale Semiconductor
Page 3
V
BIAS
+
C9
R1
R2
+
C8
C7 C6
B1
R3
C5
C17 C18 C19 C20
C14
++
V
SUPPLY
+
++
C23C16C15
C22C21
RF
INPUT
Z1 Z2 Z4 Z5 Z6
C1
Z1 1.023 x 0.082 Microstrip Z2 0.398 x 0.082 Microstrip Z3 0.203 x 0.082 Microstrip Z4 0.074 x 0.082 Microstrip Z5 0.630 x 0.084 Microstrip Z6 0.557 x 1.030 x 0.237 Microstrip Taper Z7 0.103 x 1.030 Microstrip Z8 1.280 x 0.046 Microstrip
C2
Z3
C3
+
C10
Z11
DUT
C4
C11 C12
B2
R4
Z8
Z7
Z9
C13
Z13 Z14
Z10 Z15
Z12
C26 C27 C32 C33
C25
Z9 1.280 x 0.046 Microstrip Z10 0.090 x 1.055 Microstrip Z11 1.125 x 0.068 Microstrip Z12 1.125 x 0.068 Microstrip Z13 0.505 x 1.055 Microstrip Z14 0.898 x 0.105 Microstrip Z15 1.133 x 0.082 Microstrip PCB Arlon GX0300-55-22, 0.03″, ε
C24
C29C28 C31C30
Figure 1. MRF5S19150HR3(SR3) Test Circuit Schematic
RF
OUTPUT
++
++
= 2.55
r
Table 5. MRF5S19150HR3(SR3) Test Circuit Component Designations and Values
Part Description
B1, B2 Short RF Beads
C1, C2 0.6 – 4.5 Variable Capacitors, Gigatrim
C3 0.8 pF Chip Capacitor
C4, C5, C13, C14, C24, C25 9.1 pF Chip Capacitors
C8, C10 1.0 µF, 50 V SMT Tantalum Capacitors
C6, C12, C16, C17, C18, C27, C28, C29 0.1 µF Chip Capacitors
C7, C11, C15, C26 1000 pF Chip Capacitors
C9 100 µF, 50 V Electrolytic Capacitor
C23 470 µF, 63 V Electrolytic Capacitor
C19, C20, C21, C22, C30, C31, C32, C33 22 µF, 35 V Tantalum Capacitors
R1
R2
R3, R4
1 kW Chip Resistor
560 kW Chip Resistor
12 W Chip Resistors
RF Device Data Freescale Semiconductor
MRF5S19150HR3 MRF5S19150HSR3
3
Page 4
C17 C18
C9
B1
R3
C5
R2
R1
C8
C7
C6
V
GG
C14
C15
C19 C20
C16
C23
C21 C22
V
DD
C4
C2
C10
B2
C3
C11
R4
C12
C13
CUT OUT AREA
C26
C27
C25
C28 C29
C1
MRF5S19150 Rev 4
Freescale has begun the transition of marking Printed Circuit Boards (PCBs) with the Freescale Semiconductor signature/logo. PCBs may have either Motorola or Freescale markings during the transition period. These changes will have no impact on form, fit or function of the current product.
C24
C32 C33
C30 C31
Figure 2. MRF5S19150HR3(SR3) Test Circuit Component Layout
MRF5S19150HR3 MRF5S19150HSR3
4
RF Device Data
Freescale Semiconductor
Page 5
TYPICAL CHARACTERISTICS
16
IDQ = 2100 mA
15
14
13
, POWER GAIN (dB)
ps
G
12
11
1700 mA
1400 mA
1050 mA
700 mA
1
Figure 4. Two - Tone Power Gain versus
15
14 35
G
ps
η
13 30
D
12 25
11 2 0
10 −30
IRL
9 −35
, POWER GAIN (dB)
IM3
ps
8 −40
G
7 −45
ACPR
6 −50
5 1900
VDD = 28 Vdc, P 2−Carrier N−CDMA, 2.5 MHz Carrier Spacing
1.228 MHz Channel Bandwidth Peak/Avg. = 9.8 dB @ 0.01% Probability (CCDF)
1920 1940 1960 1980 2000
Figure 3. 2- Carrier N - CDMA Broadband Performance
VDD = 28 Vdc f1 = 1958.75 MHz, f2 = 1961.25 MHz Two−Tone Measurement, 2.5 MHz Tone Spacing
10
P
, OUTPUT POWER (WATTS) PEP
out
Output Power
= 32 W (Avg.), IDQ = 1400 mA
out
f, FREQUENCY (MHz)
100
−15 VDD = 28 Vdc
−20
f1 = 1958.75 MHz, f2 = 1961.25 MHz Two−Tone Measurement, 2.5 MHz Tone Spacing
−25
−30
−35
−40
IMD, THIRD ORDER
INTERMODULATION DISTORTION (dBc)
700 mA
−45
−50
−55
1
Figure 5. Third Order Intermodulation versus
40
, DRAIN
D
η
EFFICIENCY (%)
−10
−20
−30
−40
−50
IM3 (dBc), ACPR (dBc)
−55
2020
P
−60
1700 mA
1050 mA
10
, OUTPUT POWER (WATTS) PEP
out
Output Power
INPUT RETURN LOSS (dB)IRL,
IDQ = 2100 mA
1400 mA
100
−20
−25
−30
3rd Order
−35
−40 5th Order
−45 7th Order
−50
INTERMODULATION DISTORTION (dBc)IMD,
−55
−60
VDD = 28 Vdc, P Two−Tone Measurements, Center Frequency = 1960 MHz
0.1
= 150 W (PEP), IDQ = 1400 mA
out
1
TWO−TONE SPACING (MHz)
Figure 6. Intermodulation Distortion Products
versus Tone Spacing
RF Device Data Freescale Semiconductor
59
58
57
56
55
P1dB = 53.01 dBm (199.99 W)
54
53
, OUTPUT POWER (dBm)
52
out
P
51
50
49
10
35
P3dB = 53.71 dBm (234.96 W)
VDD = 28 Vdc, IDQ = 1400 mA Pulsed CW, 8 µsec (on), 1 msec (off) Center Frequency = 1960 MHz
, INPUT POWER (dBm)
P
in
45
444342414039383736
Figure 7. Pulse CW Output Power versus
Input Power
MRF5S19150HR3 MRF5S19150HSR3
5
Page 6
TYPICAL CHARACTERISTICS
−10
−20
−30
−40
45
VDD = 28 Vdc, IDQ = 1400 mA
40 −30
f1 = 1958.75 MHz, f2 = 1961.25 MHz 2 x N−CDMA, 2.5 MHz @ 1.2288 MHz Bandwidth
35 −35
Peak/Avg. = 9.8 dB @ 0.01% Probability (CCDF)
IM3
η
−25
D
30 −40
, POWER GAIN (dB)
25 −45
ps
20 −50
15 −55
10 −60
ACPR
G
ps
IM3 (dBc), ACPR (dBc)
5 −65
0
, DRAIN EFFICIENCY (%), G
D
η
1
, OUTPUT POWER (WATTS) AVG., N−CDMA
P
out
10
−70
Figure 8. 2- Carrier N - CDMA ACPR, IM3, Power
Gain, Drain Efficiency versus Output Power
0
1.2288 MHz Channel BW
−IM3 @
1.2288 MHz
Integrated BW
+IM3 @
1.2288 MHz
Integrated BW
9
10
)
2
8
10
−50
(dB)
−60
−70
−80
−90
−100
−ACPR @ 30 kHz Integrated BW
+ACPR @ 30 kHz
Integrated BW
f, FREQUENCY (MHz)
Figure 9. 2- Carrier N - CDMA Spectrum
61.5 4.530−1.5−3−4.5−6−7.5 7.5
7
10
MTTF FACTOR (HOURS X AMPS
6
10
100
120 140 160 180 200
TJ, JUNCTION TEMPERATURE (°C)
This above graph displays calculated MTTF in hours x ampere
2
drain current. Life tests at elevated temperatures have correlated to better than ±10% of the theoretical prediction for metal failure. Divide MTTF factor by I
2
for MTTF in a particular application.
D
Figure 10. MTTF Factor versus Junction Temperature
220
MRF5S19150HR3 MRF5S19150HSR3
6
RF Device Data
Freescale Semiconductor
Page 7
f = 1990 MHz
f = 1930 MHz
Z
load
f = 1930 MHz
f = 1990 MHz
MHz
Z
source
V
= 28 V, IDQ = 1400 mA, P
DD
f
Z
source
Zo = 10
= 32 W Avg.
out
Z
load
1930
1960
1990
Z
source
Z
load
Input Matching Network
= Test circuit impedance as measured from
= Test circuit impedance as measured
1.89 - j5.24
1.64 - j5.29
1.3 - j5.49
gate to ground.
from drain to ground.
Device Under Test
Z
source
1.06 - j1.58
0.88 - j1.37
0.90 - j1.21
Z
load
Output Matching Network
Figure 11. Series Equivalent Source and Load Impedance
RF Device Data Freescale Semiconductor
MRF5S19150HR3 MRF5S19150HSR3
7
Page 8
NOTES
MRF5S19150HR3 MRF5S19150HSR3
8
RF Device Data
Freescale Semiconductor
Page 9
NOTES
RF Device Data Freescale Semiconductor
MRF5S19150HR3 MRF5S19150HSR3
9
Page 10
NOTES
MRF5S19150HR3 MRF5S19150HSR3
10
RF Device Data
Freescale Semiconductor
Page 11
PACKAGE DIMENSIONS
B
B
(FLANGE)
K
G
1
2
D
M
bbb B
M
bbb B
M
ccc B
M
A
T
M
A
T
M
A
T
H
E
AA
(FLANGE)
3
M
(INSULATOR)
M
M
(LID)
N
M
Q
2X
M
bbb B
M
A
T
ccc B
aaa B
M
M
A
T
M
A
T
R
M
S
M
(LID)
M
(INSULATOR)
M
C
F
SEATING
T
PLANE
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M−1994.
2. CONTROLLING DIMENSION: INCH.
3. DIMENSION H IS MEASURED 0.030 (0.762) AWAY FROM PACKAGE BODY.
4. DELETED
DIM MIN MAX MIN MAX
A 1.335 1.345 33.91 34.16 B 0.535 0.545 13.6 13.8 C 0.147 0.200 3.73 5.08 D 0.495 0.505 12.57 12.83 E 0.035 0.045 0.89 1.14 F 0.003 0.006 0.08 0.15 G 1.100 BSC 27.94 BSC H 0.057 0.067 1.45 1.70 K 0.170 0.210 4.32 5.33
M 0.872 0.888 22.15 22.55
N 0.871 0.889 19.30 22.60 Q .118 .138 3.00 3.51 R 0.515 0.525 13.10 13.30
S 0.515 0.525 13.10 13.30 aaa 0.007 REF 0.178 REF bbb 0.010 REF 0.254 REF ccc 0.015 REF 0.381 REF
STYLE 1:
PIN 1. DRAIN
2. GATE
3. SOURCE
MILLIMETERSINCHES
CASE 465B- 03
ISSUE B
NI- 880
MRF5S19150HR3
B
B
(FLANGE)
K
M
bbb B
M
bbb B
T
M
ccc B
T
H
E
AA
(FLANGE)
1
2
D
M
A
T
M
A
M
A
M
(INSULATOR)
M
M
(LID)
N
M
R
M
ccc B
M
A
T
S
M
aaa B
M
A
T
(LID)
M
(INSULATOR)
M
C
F
SEATING
T
PLANE
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M−1994.
2. CONTROLLING DIMENSION: INCH.
3. DIMENSION H IS MEASURED 0.030 (0.762) AWAY FROM PACKAGE BODY.
DIM MIN MAX MIN MAX
A 0.905 0.915 22.99 23.24 B 0.535 0.545 13.60 13.80 C 0.147 0.200 3.73 5.08 D 0.495 0.505 12.57 12.83 E 0.035 0.045 0.89 1.14 F 0.003 0.006 0.08 0.15 H 0.057 0.067 1.45 1.70 K 0.170 0.210 4.32 5.33 M 0.872 0.888 22.15 22.55 N 0.871 0.889 19.30 22.60 R 0.515 0.525 13.10 13.30
S 0.515 0.525 13.10 13.30 aaa 0.007 REF 0.178 REF bbb 0.010 REF 0.254 REF ccc 0.015 REF 0.381 REF
STYLE 1:
PIN 1. DRAIN
2. GATE
3. SOURCE
MILLIMETERSINCHES
CASE 465C- 02
ISSUE A NI- 880S
MRF5S19150HSR3
RF Device Data Freescale Semiconductor
MRF5S19150HR3 MRF5S19150HSR3
11
Page 12
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Freescalet and the Freescale logo are trademarks of Freescale Semiconductor, Inc. All other product or service names are the property of their respective owners. Freescale Semiconductor, Inc. 2004. All rights reserved.
MRF5S19150HR3 MRF5S19150HSR3
Document Number: Rev. 1, 12/2004
MRF5S19150H
12
RF Device Data
Freescale Semiconductor
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