Designed for PCN and PCS base station applications at frequencies from
1900 to 2000 MHz. Suitable for TDMA, CDMA and multicarrier amplifier
applications.
• Typical 2- Carrier N-CDMA Performance for V
1400 mA, Avg., P
(Pilot, Sync, Paging, Traffic Codes 8 Through 13) Channel Bandwidth =
= 32 Watts Avg., Full Frequency Band, IS- 95 CDMA
out
1.2288 MHz. Peak/Avg. = 9.8 dB @ 0.01% Probability on CCDF.
Power Gain — 14 dB
Drain Efficiency — 26%
IM3 @ 2.5 MHz Offset — -36.5 dBc @ 1.2288 MHz Bandwidth
ACPR @ 885 kHz Offset — -50 dB @ 30 kHz Bandwidth
• Capable of Handling 5:1 VSWR, @ 28 Vdc, f1 = 1960 MHz,
100 Watts CW Output Power
• Characterized with Series Equivalent Large- Signal Impedance Parameters
• Internally Matched, Controlled Q, for Ease of Use
• Qualified Up to a Maximum of 32 V Operation
• Integrated ESD Protection
• Lower Thermal Resistance Package
• Low Gold Plating Thickness on Leads, 40
• In Tape and Reel. R3 Suffix = 250 Units per 56 mm, 13 inch Reel.
= 28 Volts, IDQ =
DD
µ″ Nominal.
MRF5S19150H
Rev. 1, 12/2004
MRF5S19150HR3
MRF5S19150HSR3
1990 MHz, 32 W AVG., 28 V
2 x N- CDMA
LATERAL N- CHANNEL
RF POWER MOSFETs
CASE 465B-03, STYLE 1
NI-880
MRF5S19150HR3
CASE 465C-02, STYLE 1
NI-880S
MRF5S19150HSR3
Table 1. Maximum Ratings
RatingSymbolValueUnit
Drain-Source VoltageV
Gate-Source VoltageV
Total Device Dissipation @ TC = 25°C
Derate above 25°C
Storage Temperature RangeT
Operating Junction TemperatureT
CW OperationCW100W
DSS
GS
P
stg
D
J
-0.5, +65Vdc
-0.5, +15Vdc
427
2.44
- 65 to +150°C
200°C
Table 2. Thermal Characteristics
CharacteristicSymbolValue
Thermal Resistance, Junction to Case
Case Temperature 80°C, 100 W CW
Case Temperature 75°C, 32 W CW
1. MTTF calculator available at http://www.freescale.com/rf. Select Tools/Software/Application Software/Calculators to access
the MTTF calculators by product.
2. Refer to AN1955/D, Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf.
Select Documentation/Application Notes - AN1955.
NOTE - CAUTION
packaging MOS devices should be observed.
- MOS devices are susceptible to damage from electrostatic charge. Reasonable precautions in handling and
R
θ
JC
(1,2)
0.41
0.44
W
W/°C
Unit
°C/W
Freescale Semiconductor, Inc., 2004. All rights reserved.
RF Device DataFreescale Semiconductor
MRF5S19150HR3 MRF5S19150HSR3
1
Page 2
Table 3. ESD Protection Characteristics
Test ConditionsClass
Human Body Model1 (Minimum)
Machine ModelM3 (Minimum)
Charge Device ModelC7 (Minimum)
Table 4. Electrical Characteristics (T
Characteristic
Off Characteristics
Zero Gate Voltage Drain Leakage Current
(V
= 65 Vdc, VGS = 0 Vdc)
DS
Zero Gate Voltage Drain Leakage Current
(V
= 28 Vdc, VGS = 0 Vdc)
DS
Gate-Source Leakage Current
(V
= 5 Vdc, VDS = 0 Vdc)
GS
On Characteristics
Gate Threshold Voltage
(V
= 10 Vdc, ID = 360 µAdc)
DS
Gate Quiescent Voltage
(V
= 28 Vdc, ID = 1400 mAdc)
DS
Drain-Source On-Voltage
(V
= 10 Vdc, ID = 3.6 Adc)
GS
Forward Transconductance
(V
= 10 Vdc, ID = 3.6 Adc)
DS
Dynamic Characteristics
Reverse Transfer Capacitance
(VDS = 28 Vdc, VGS = 0, f = 1 MHz)
Functional Tests (In Freescale Test Fixture, 50 ohm system) VDD = 28 Vdc, IDQ = 1400 mA, P
f2 = 1932.5 MHz and f1 = 1987.5 MHz, f2 = 1990 MHz, 2-Carrier N - CDMA, 1.2288 MHz Channel Bandwidth Carriers. ACPR measured in
30 kHz Channel Bandwidth @ ±885 kHz Offset. IM3 measured in 1.2288 MHz Channel Bandwidth @ ±2.5 MHz Offset. Peak/Avg = 9.8 dB @
0.01% Probability on CCDF.
Power Gain
Drain Efficiencyη
Intermodulation DistortionIM3—-36.5-35dBc
Adjacent Channel Power RatioACPR—-50-48dBc
Input Return LossIRL—-17-9dB
1. Part is internally matched both on input and output.
(1)
= 25°C unless otherwise noted)
C
SymbolMinTypMaxUnit
I
DSS
I
DSS
I
GSS
V
GS(th)
V
GS(Q)
V
DS(on)
C
G
g
fs
rss
ps
D
——10µAdc
——1µAdc
——1µAdc
2.52.83.5Vdc
—3.8—Vdc
—0.24—Vdc
—9—S
—3.1—pF
= 32 W Avg., f1 = 1930 MHz,
out
1314—dB
2426—%
MRF5S19150HR3 MRF5S19150HSR3
2
RF Device Data
Freescale Semiconductor
Page 3
V
BIAS
+
C9
R1
R2
+
C8
C7C6
B1
R3
C5
C17C18C19C20
C14
++
V
SUPPLY
+
++
C23C16C15
C22C21
RF
INPUT
Z1Z2Z4Z5Z6
C1
Z11.023″ x 0.082″ Microstrip
Z20.398″ x 0.082″ Microstrip
Z30.203″ x 0.082″ Microstrip
Z40.074″ x 0.082″ Microstrip
Z50.630″ x 0.084″ Microstrip
Z60.557″ x 1.030″ x 0.237″ Microstrip Taper
Z70.103″ x 1.030″ Microstrip
Z81.280″ x 0.046″ Microstrip
C2
Z3
C3
+
C10
Z11
DUT
C4
C11 C12
B2
R4
Z8
Z7
Z9
C13
Z13Z14
Z10Z15
Z12
C26C27C32C33
C25
Z91.280″ x 0.046″ Microstrip
Z100.090″ x 1.055″ Microstrip
Z111.125″ x 0.068″ Microstrip
Z121.125″ x 0.068″ Microstrip
Z130.505″ x 1.055″ Microstrip
Z140.898″ x 0.105″ Microstrip
Z151.133″ x 0.082″ Microstrip
PCBArlon GX0300-55-22, 0.03″, ε
C24
C29C28C31C30
Figure 1. MRF5S19150HR3(SR3) Test Circuit Schematic
RF
OUTPUT
++
++
= 2.55
r
Table 5. MRF5S19150HR3(SR3) Test Circuit Component Designations and Values
Freescale has begun the transition of marking Printed Circuit Boards (PCBs) with the Freescale Semiconductor
signature/logo. PCBs may have either Motorola or Freescale markings during the transition period. These changes will have
no impact on form, fit or function of the current product.
C24
C32 C33
C30 C31
Figure 2. MRF5S19150HR3(SR3) Test Circuit Component Layout
1.228 MHz Channel Bandwidth
Peak/Avg. = 9.8 dB @ 0.01% Probability (CCDF)
19201940196019802000
Figure 3. 2- Carrier N - CDMA Broadband Performance
VDD = 28 Vdc
f1 = 1958.75 MHz, f2 = 1961.25 MHz
Two−Tone Measurement, 2.5 MHz Tone Spacing
10
P
, OUTPUT POWER (WATTS) PEP
out
Output Power
= 32 W (Avg.), IDQ = 1400 mA
out
f, FREQUENCY (MHz)
100
−15
VDD = 28 Vdc
−20
f1 = 1958.75 MHz, f2 = 1961.25 MHz
Two−Tone Measurement, 2.5 MHz Tone Spacing
−25
−30
−35
−40
IMD, THIRD ORDER
INTERMODULATION DISTORTION (dBc)
700 mA
−45
−50
−55
1
Figure 5. Third Order Intermodulation versus
40
, DRAIN
D
η
EFFICIENCY (%)
−10
−20
−30
−40
−50
IM3 (dBc), ACPR (dBc)
−55
2020
P
−60
1700 mA
1050 mA
10
, OUTPUT POWER (WATTS) PEP
out
Output Power
INPUT RETURN LOSS (dB)IRL,
IDQ = 2100 mA
1400 mA
100
−20
−25
−30
3rd Order
−35
−40
5th Order
−45
7th Order
−50
INTERMODULATION DISTORTION (dBc)IMD,
−55
−60
VDD = 28 Vdc, P
Two−Tone Measurements, Center Frequency = 1960 MHz
0.1
= 150 W (PEP), IDQ = 1400 mA
out
1
TWO−TONE SPACING (MHz)
Figure 6. Intermodulation Distortion Products
versus Tone Spacing
RF Device Data
Freescale Semiconductor
59
58
57
56
55
P1dB = 53.01 dBm (199.99 W)
54
53
, OUTPUT POWER (dBm)
52
out
P
51
50
49
10
35
P3dB = 53.71 dBm (234.96 W)
VDD = 28 Vdc, IDQ = 1400 mA
Pulsed CW, 8 µsec (on), 1 msec (off)
Center Frequency = 1960 MHz
, INPUT POWER (dBm)
P
in
45
444342414039383736
Figure 7. Pulse CW Output Power versus
Input Power
MRF5S19150HR3 MRF5S19150HSR3
5
Page 6
TYPICAL CHARACTERISTICS
−10
−20
−30
−40
45
VDD = 28 Vdc, IDQ = 1400 mA
40−30
f1 = 1958.75 MHz, f2 = 1961.25 MHz
2 x N−CDMA, 2.5 MHz @ 1.2288 MHz Bandwidth
35−35
Peak/Avg. = 9.8 dB @ 0.01% Probability (CCDF)
IM3
η
−25
D
30−40
, POWER GAIN (dB)
25−45
ps
20−50
15−55
10−60
ACPR
G
ps
IM3 (dBc), ACPR (dBc)
5−65
0
, DRAIN EFFICIENCY (%), G
D
η
1
, OUTPUT POWER (WATTS) AVG., N−CDMA
P
out
10
−70
Figure 8. 2- Carrier N - CDMA ACPR, IM3, Power
Gain, Drain Efficiency versus Output Power
0
1.2288 MHz
Channel BW
−IM3 @
1.2288 MHz
Integrated BW
+IM3 @
1.2288 MHz
Integrated BW
9
10
)
2
8
10
−50
(dB)
−60
−70
−80
−90
−100
−ACPR @ 30 kHz
Integrated BW
+ACPR @ 30 kHz
Integrated BW
f, FREQUENCY (MHz)
Figure 9. 2- Carrier N - CDMA Spectrum
61.54.530−1.5−3−4.5−6−7.57.5
7
10
MTTF FACTOR (HOURS X AMPS
6
10
100
120140160180200
TJ, JUNCTION TEMPERATURE (°C)
This above graph displays calculated MTTF in hours x ampere
2
drain current. Life tests at elevated temperatures have correlated to
better than ±10% of the theoretical prediction for metal failure. Divide
MTTF factor by I
2
for MTTF in a particular application.
D
Figure 10. MTTF Factor versus Junction Temperature
220
MRF5S19150HR3 MRF5S19150HSR3
6
RF Device Data
Freescale Semiconductor
Page 7
f = 1990 MHz
f = 1930 MHz
Z
load
f = 1930 MHz
f = 1990 MHz
MHz
Z
source
V
= 28 V, IDQ = 1400 mA, P
DD
f
Z
source
Ω
Zo = 10 Ω
= 32 W Avg.
out
Z
load
Ω
1930
1960
1990
Z
source
Z
load
Input
Matching
Network
= Test circuit impedance as measured from
= Test circuit impedance as measured
1.89 - j5.24
1.64 - j5.29
1.3 - j5.49
gate to ground.
from drain to ground.
Device
Under Test
Z
source
1.06 - j1.58
0.88 - j1.37
0.90 - j1.21
Z
load
Output
Matching
Network
Figure 11. Series Equivalent Source and Load Impedance
RF Device Data
Freescale Semiconductor
MRF5S19150HR3 MRF5S19150HSR3
7
Page 8
NOTES
MRF5S19150HR3 MRF5S19150HSR3
8
RF Device Data
Freescale Semiconductor
Page 9
NOTES
RF Device Data
Freescale Semiconductor
MRF5S19150HR3 MRF5S19150HSR3
9
Page 10
NOTES
MRF5S19150HR3 MRF5S19150HSR3
10
RF Device Data
Freescale Semiconductor
Page 11
PACKAGE DIMENSIONS
B
B
(FLANGE)
K
G
1
2
D
M
bbbB
M
bbbB
M
cccB
M
A
T
M
A
T
M
A
T
H
E
AA
(FLANGE)
3
M
(INSULATOR)
M
M
(LID)
N
M
Q
2X
M
bbbB
M
A
T
cccB
aaaB
M
M
A
T
M
A
T
R
M
S
M
(LID)
M
(INSULATOR)
M
C
F
SEATING
T
PLANE
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M−1994.
2. CONTROLLING DIMENSION: INCH.
3. DIMENSION H IS MEASURED 0.030 (0.762) AWAY
FROM PACKAGE BODY.
4. DELETED
DIM MINMAXMINMAX
A 1.335 1.345 33.91 34.16
B 0.535 0.54513.613.8
C 0.147 0.2003.735.08
D 0.495 0.505 12.57 12.83
E 0.035 0.0450.891.14
F 0.003 0.0060.080.15
G1.100 BSC27.94 BSC
H 0.057 0.0671.451.70
K 0.170 0.2104.325.33
M 0.872 0.888 22.15 22.55
N 0.871 0.889 19.30 22.60
Q.118.1383.003.51
R 0.515 0.525 13.10 13.30
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M−1994.
2. CONTROLLING DIMENSION: INCH.
3. DIMENSION H IS MEASURED 0.030 (0.762) AWAY
FROM PACKAGE BODY.
DIM MINMAXMINMAX
A 0.905 0.915 22.99 23.24
B 0.535 0.545 13.60 13.80
C 0.147 0.2003.735.08
D 0.495 0.505 12.57 12.83
E 0.035 0.0450.891.14
F 0.003 0.0060.080.15
H 0.057 0.0671.451.70
K 0.170 0.2104.325.33
M 0.872 0.888 22.15 22.55
N 0.871 0.889 19.30 22.60
R 0.515 0.525 13.10 13.30
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Freescalet and the Freescale logo are trademarks of Freescale Semiconductor, Inc.
All other product or service names are the property of their respective owners.
Freescale Semiconductor, Inc. 2004. All rights reserved.
MRF5S19150HR3 MRF5S19150HSR3
Document Number:
Rev. 1, 12/2004
MRF5S19150H
12
RF Device Data
Freescale Semiconductor
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