Datasheet MJW16206 Datasheet (Motorola)

Page 1
1
Motorola Bipolar Power Transistor Device Data
SCANSWITCH
NPN Bipolar Power Deflection Transistors For High and Very High Resolution CRT Monitors
The MJF16206 and the MJW16206 are state–of–the–art SWITCHMODE bipolar power transistors. They are specifically designed for use in horizontal deflection circuits for high and very high resolution, monochrome and color CRT monitors.
1200 Volt V
CES
Breakdown Capability
Typical Dynamic Desaturation Specified (New Turn–Off Characteristic)
Maximum Repetitive Emitter–Base Avalanche Energy Specified (Industry First)
High Current Capability: Performance Specified at 6.5 Amps
Continuous Rating — 12 Amps Max Pulsed Rating — 15 Amps Max
Isolated MJF16206 is UL Recognized
Fast Switching: 100 ns Inductive Fall Time (Typ)
1000 ns Inductive Storage Time (Typ)
Low Saturation Voltage
0.25 Volts (Typ) at 6.5 Amps Collector Current
High Emitter–Base Breakdown Capability For High Voltage Off Drive Circuits —
8.0 V (Min)
MAXIMUM RATINGS
Rating
Symbol
Value
ÎÎÎ
ÎÎÎ
ÎÎÎ
Unit
Collector–Emitter Breakdown Voltage
V
CES
1200
ÎÎÎ
ÎÎÎ
ÎÎÎ
Vdc
Collector–Emitter Sustaining Voltage
V
CEO(sus)
500
ÎÎÎ
ÎÎÎ
ÎÎÎ
Vdc
Emitter–Base Voltage
V
EBO
8.0
ÎÎÎ
ÎÎÎ
ÎÎÎ
Vdc
Isolation Voltage (RMS for 1 sec., TA = 25_C, Figure 19 Relative Humidity v 30%) Figure 20
V
ISOL
— —
ÎÎÎ
ÎÎÎ
ÎÎÎ
ÎÎÎ
V
rms
Collector Current — Continuous
Collector Current — Pulsed (1)
I
C
I
CM
12 15
ÎÎÎ
ÎÎÎ
ÎÎÎ
ÎÎÎ
Adc
Base Current — Continuous
Base Current — Pulsed (1)
I
B
I
BM
5.0 10
ÎÎÎ
ÎÎÎ
ÎÎÎ
Adc
Repetitive Emitter–Base Avalanche Energy
W
(BER)
0.2
ÎÎÎ
ÎÎÎ
ÎÎÎ
mjoules
Total Power Dissipation @ TC = 25_C
Total Power Dissipation @ TC = 100_C
Derated above 25_C
P
D
150
39
1.49
ÎÎÎ
ÎÎÎ
ÎÎÎ
ÎÎÎ
ÎÎÎ
Watts
W/_C
Operating and Storage Temperature
TJ, T
stg
–55 to +150
ÎÎÎ
ÎÎÎ
ÎÎÎ
_
C
THERMAL CHARACTERISTICS
Characteristic
Symbol
Max
ÎÎÎ
ÎÎÎ
ÎÎÎ
Unit
Thermal Resistance — Junction to Case
R
θJC
0.67
ÎÎÎ
ÎÎÎ
ÎÎÎ
_
C/W
Lead Temperature for Soldering Purposes 1/8
from the Case for 5 seconds
T
L
260
ÎÎÎ
ÎÎÎ
ÎÎÎ
ÎÎÎ
_
C
(1) Pulse Test: Pulse Width = 5.0 ms, Duty Cycle v 10%.
SCANSWITCH is a trademark of Motorola Inc.
MOTOROLA
SEMICONDUCTOR TECHNICAL DATA
Order this document
by MJW16206/D
Motorola, Inc. 1995
MJW16206
POWER TRANSISTORS
12 AMPERES
1200 VOLTS — V
CES
50 and 150 WATTS
CASE 340F–02
TO–247AE
REV 2
Page 2
MJW16206
2
Motorola Bipolar Power Transistor Device Data
ELECTRICAL CHARACTERISTICS (T
C
= 25_C unless otherwise noted)
Characteristic
Symbol
Min
Typ
Max
ÎÎÎ
ÎÎÎ
ÎÎÎ
Unit
OFF CHARACTERISTICS (1)
Collector Cutoff Current
(VCE = 1200 Vdc, VBE = 0 V) (VCE = 850 Vdc, VBE = 0 V)
I
CES
— —
— —
250
25
ÎÎÎ
ÎÎÎ
ÎÎÎ
ÎÎÎ
ÎÎÎ
µAdc
Emitter–Base Leakage
(VEB = 8.0 Vdc, IC = 0)
I
EBO
25
ÎÎÎ
ÎÎÎ
ÎÎÎ
µAdc
Collector–Emitter Sustaining Voltage (Figure 10)
(IC = 10 mAdc, IB = 0)
V
CEO(sus)
500
ÎÎÎ
ÎÎÎ
ÎÎÎ
ÎÎÎ
Vdc
Emitter–Base Breakdown Voltage
(IE = 1.0 mA, IC = 0)
V
(BR)EBO
8.0
11
ÎÎÎ
ÎÎÎ
ÎÎÎ
ÎÎÎ
Vdc
ON CHARACTERISTICS (1)
Collector–Emitter Saturation Voltage
(IC = 3.0 Adc, IB = 400 mAdc) (IC = 6.5 Adc, IB = 1.5 Adc)
V
CE(sat)
— —
0.15
0.25
1.0
1.0
ÎÎÎ
ÎÎÎ
ÎÎÎ
ÎÎÎ
Vdc
Base–Emitter Saturation Voltage
(IC = 6.5 Adc, IB = 1.5 Adc)
V
BE(sat)
0.9
1.5
ÎÎÎ
ÎÎÎ
ÎÎÎ
ÎÎÎ
Vdc
DC Current Gain
(IC = 1.0 Adc, VCE = 5.0 Vdc) (IC = 10 Adc, VCE = 5.0 Vdc) (IC = 12 Adc, VCE = 5.0 Vdc)
h
FE
5.0
3.0
24
8.0
6.0
— 13 —
ÎÎÎ
ÎÎÎ
ÎÎÎ
ÎÎÎ
ÎÎÎ
DYNAMIC CHARACTERISTICS
Dynamic Desaturation Interval (Figure 15)
(IC = 6.5 Adc, IB = 1.5 Adc, LB = 0.5 µH)
t
ds
250
ÎÎÎ
ÎÎÎ
ÎÎÎ
ÎÎÎ
ns
Emitter–Base Avalanche Turn–off Energy (Figure 15)
(t = 500 ns, RBE = 22 )
EB
(off)
30
ÎÎÎ
ÎÎÎ
ÎÎÎ
µjoules
Output Capacitance
(VCE = 10 Vdc, IE = 0, f
test
= 100 kHz)
C
ob
180
350
ÎÎÎ
ÎÎÎ
ÎÎÎ
ÎÎÎ
pF
Gain Bandwidth Product
(VCE = 10 Vdc, IC = 0.5 A, f
test
= 1.0 MHz)
f
T
3.0
ÎÎÎ
ÎÎÎ
ÎÎÎ
ÎÎÎ
MHz
Collector–Heatsink Capacitance — MJF16206 Isolated Package
(Mounted on a 1 x 2 x 1/16 Copper Heatsink, VCE = 0, f
test
= 100 kHz)
C
c–hs
17
ÎÎÎ
ÎÎÎ
ÎÎÎ
ÎÎÎ
pF
SWITCHING CHARACTERISTICS
Inductive Load (Figure 15) (IC = 6.5 A, IB = 1.5 A)
Storage Fall Time
t
sv t
fi
— —
1000
100
2250
250
ÎÎÎ
ÎÎÎ
ÎÎÎ
ÎÎÎ
ns
(1) Pulse Test: Pulse Width = 300 µs, Duty Cycle v 2.0%.
Page 3
MJW16206
3
Motorola Bipolar Power Transistor Device Data
V
CE
, COLLECTOR–EMITTER VOLTAGE (VOLTS)
V
BE
, BASE–EMITTER VOLTAGE (VOLTS)
V
CE
, COLLECTOR–EMITTER VOLTAGE (VOLTS)
1
0.70.3
Figure 1. Typical DC Current Gain
IC, COLLECTOR CURRENT (AMPS)
0.2 2 10
100
h
FE
, DC CURRENT GAIN
1 53
30
7
0.5
TJ = 100°C
25°C
–55°C
7
10
3
1
50
VCE = 5 V
IC, COLLECTOR CURRENT (AMPS)
Figure 2. Typical Collector–Emitter
Saturation Voltage
0.5
3
0.2
5
0.05
1
0.1
0.07
0.3
2
0.7
0.5 32 50.7 1
10 20
TJ = 25°C TJ = 100
°
C
IC/IB1 = 10
0.3
7
10
70
Figure 3. Typical Collector Saturation Region
IB, BASE CURRENT (AMPS)
0.7
0.1 5
0.3
8 A
0.05 2
4 A 6.5 AIC = 2 A
0.07 0.1
0.2 0.5
5
Figure 4. Typical Base–Emitter
Saturation Voltage
0.30.2 0.5
5
0.7
0.1
0.7 201 10
10
2
TJ = 25°C
2 3 5 7
IC, COLLECTOR CURRENT (AMPS)
TC = 25°C f = 1 MHz
0.3
Figure 5. Typical Capacitance
10K
VR, REVERSE VOLTAGE (VOLTS)
C
ib
0.1
1K
100
10
1 10 100 1K
2K
200
20
3K
300
5K
500
50
0.3 2 30 300200.5 5 50 500
f
T
, TRANSITION FREQUENCY (MHz)
IC, COLLECTOR CURRENT (AMPS)
Figure 6. Typical Transition Frequency
f
(test)
= 1 MHz
TC = 25
°
C
VCE = 10 V
0.1 0.3 0.7 2 5 107
10
0.7
0.2
3
0.1
0.5
5
2
0.5
0.07
0.2
3
7
2
1
3
IC/IB1 = 5 to 10
7
1
0.2
3
0.5
30
0.2 3 200
1
0.3
7
20
5
2
0.3 20
0.7
5
0.2
10 A
TJ = 25°C TJ = 100
°
C
0.2 0.5 1 3
7K
700
70
7
C, CAPACITANCE (pF)
C
ob
Page 4
MJW16206
4
Motorola Bipolar Power Transistor Device Data
I
C
, COLLECTOR CURRENT (AMPS)
VCE, COLLECTOR–EMITTER VOLTAGE (VOLTS)
Figure 7. Maximum Forward Biased
Safe Operating Area
2
10
1
0.02 500
WIREBOND LIMIT THERMAL LIMIT SECONDARY BREAKDOWN LIMIT
I
C
, COLLECTOR CURRENT (AMPS)
0.1
1K20 300
3
0.3
0.2
dc
5 ms
10 µs
2
5
0.5
50
0
400 1.2K
IC/IB1 ≥ 5 TJ
100°C
V
BE(off)
= 5 V
0
VCE, COLLECTOR–EMITTER VOLTAGE (VOLTS)
800
0 V
Figure 8. Maximum Reverse Bias
Safe Operating Area
12
20
8
4
600 1K
0.03
30
0.05
20
1005 10 20030
MJW16206
16
1 3
II*
100
ns
*REGION II — EXPANDED FBSOA USING MUR8100E, ULTRAFAST RECTIFIER (SEE FIGURE 12)
200
2 V
SAFE OPERATING AREA INFORMATION
FORWARD BIAS
There are two limitations on the power handling ability of a transistor: average junction temperature and second break­down. Safe operating area curves indicate IC – VCE limits of the transistor that must be observed for reliable operation; i.e., the transistor must not be subjected to greater dissipa­tion than the curves indicate.
The data of Figure 7 is based on TC = 25_C; T
J(pk)
is variable depending on power level. Second breakdown pulse limits are valid for duty cycles to 10% but must be derated when TC 25_C. Second breakdown limitations do not der­ate the same as thermal limitations. Allowable current at the voltages shown on Figure 7 may be found at any case tem­perature by using the appropriate curve on Figure 9.
At high case temperatures, thermal limitations will reduce the power that can be handled to values less than the limita­tions imposed by second breakdown.
TC, CASE TEMPERATURE (°C)
0
50 125 150
60
POWER RATING FACTOR (%)
SECOND BREAKDOWN
DERATING
100
80
40
20
75 100
THERMAL
DERATING
25
Figure 9. Power Derating
10
70
90
50
30
REVERSE BIAS
Inductive loads, in most cases, require the emitter–to– base junction be reversed biased because high voltage and high current must be sustained simultaneously during turn– off. Under these conditions, the collector voltage must be held to a safe level at or below a specific value of collector current. This can be accomplished by several means such as
active clamping, RC snubbing, load line shaping, etc. The safe level for these devices is specified as Reverse Biased Safe Operating Area and represents t he voltage–current condition allowable during reverse biased turn–off. This rat­ing is verified under clamped conditions so that the device is never subjected to an avalanche mode. Figure 8 gives the RBSOA characteristics.
Page 5
MJW16206
5
Motorola Bipolar Power Transistor Device Data
H.P. 214
OR EQUIV.
P.G.
0
–35 V
50
500
1
µ
F
100
–V
2N5337
2N6191
+V
11 V
100
0.02
µ
F
20
10
µ
F
0.02
µ
F
+ –
R
B1
R
B2
A A
50
T
1
+V
0 V
–V
*I
B
*I
C
T.U.T.
L
MR856
V
clamp
V
CC
I
C
V
CE
I
B
I
B1
I
B2
I
C(pk)
V
CE(pk)
T1[
L
coil(ICpk
)
V
CC
Note: Adjust –V to obtain desired V
BE(off)
at Point A.
T1 adjusted to obtain I
C(pk)
V
(BR)CEO
L = 10 mH RB2 = VCC = 20 Volts
RBSOA
L = 200 µH RB2 = 0 VCC = 20 Volts RB1 selected for desired I
B1
*Tektronix P–6042 or Equivalent
Figure 10. RBSOA/V
(BR)CEO(sus)
Test Circuit
+ –
t, TIME (ms)
0.01 1 100.1
1
0.2
0.1
0.05
r(t), TRANSIENT THERMAL
R
θ
JC
(t) = r(t) R
θ
JC
R
θ
JC
= 0.67
°
C/W MAX D CURVES APPLY FOR POWER PULSE TRAIN SHOWN READ TIME AT t
1
T
J(pk)
– TC = P
(pk)
R
θ
JC
(t)
P
(pk)
t
1
t
2
DUTY CYCLE, D = t1/t
2
SINGLE PULSE
RESISTANCE (NORMALIZED)
Figure 11. Thermal Response
0.5
D = 0.5
100 1K 10K
0.2
0.1
Figure 12. Switching Safe Operating Area
+15
1
µ
F
100
150
+10
50
500 µF
V
Off
150
MJE210
MUR105
MTP8P10
MPF930
MPF930
100
µ
F
10
µ
F
MUR8100
VCE (1000 V MAX)
10 mH
T.U.T.
R
B2
R
B1
MUR1100
MUR105
MTP12N10
MTP8P10
Note: Test Circuit for Ultrafast FBSOA
Note: RB2 = 0 and V
Off
= –5 Volts
1 µF
Page 6
MJW16206
6
Motorola Bipolar Power Transistor Device Data
DYNAMIC DESATURATION
DYNAMIC DESATURATION
The SCANSWITCH series of bipolar power transistors are specifically designed to meet the unique requirements of hor­izontal deflection circuits in computer monitor applications. Historically, deflection transistor design was focused on mini­mizing collector current fall time. While fall time is a valid figure of merit, a more important indicator of circuit perfor­mance as scan rates are increased is a new characteristic, “dynamic desaturation.” In order to assure a linear collector current ramp, the output transistor must remain in hard satu­ration during storage time and exhibit a rapid turn–off transi­tion. A sluggish transition results in serious consequences.
As the saturation voltage of the output transistor increases, the voltage across the yoke drops. Roll off in the collector current ramp results in improper beam deflection and distor­tion of the image at the right edge of the screen. Design changes have been made in the structure of the SCANS­WITCH series of devices which minimize the dynamic desa­turation interval. Dynamic desaturation has been defined in terms of the time required for the VCE to rise from 1.0 to
5.0 volts (Figures 13 and 14) and typical performance at opti­mized drive conditions has been specified. Optimization of device structure results in a linear collector Current ramp, ex­cellent turn–off switching performance, and significantly low­er overall power dissipation.
Figure 13. Deflection Simulator Switching
Waveforms From Circuit in Figure 15
I
C
0% I
B
V
CE
t
sv
VCE = 20 V
t
fi
10% I
C(pk)
Figure 14. Definition of Dynamic
Desaturation Measurement
TIME (ns)
V
CE
DYNAMIC DESATURATION TIME IS MEASURED FROM VCE = 1 V TO VCE = 5 V
t
ds
1
4
COLLECTOR-EMITTER VOLTAGE (VOLTS)
5
0
3
2
0
0
90% I
C(pk)
Page 7
MJW16206
7
Motorola Bipolar Power Transistor Device Data
EMITTER–BASE TURN–OFF ENERGY
Typical techniques for driving horizontal outputs rely on a pulse transformer to supply forward base current, and a turn–off network that includes a series base inductor to limit the rate of transition from forward to reverse drive. An alter­nate d rive scheme h as been used t o characterize the SCANSWITCH series of devices (see Figure 15). This circuit produces a ramp of base drive, eliminating the heavy over­drive at the beginning of the collector current ramp and underdrive just prior to turnoff produced by typical drive strat­egies. This high performance drive has two additional impor-
tant advantages. First, the configuration of T1 allows LB to be placed outside the path of forward base current making it un­necessary to expend energy to reverse current flow as in a series base inductor. Second, there is no base resistor to lim­it forward base current and hence no power loss associated with setting the value of the forward base current. The pro­cess of generating the ramp stores rather than dissipates en­ergy. Tailoring the amount of e nergy stored in T1 to the amount of energy , EB
(off)
, that is required to turn–off the out­put transistor results in essentially lossless operation. [Note: B+ and the primary inductance of T1 (LP) are chosen such that 1/2 LP I
b
2
= EB
(off)
].
+24 V
C1 100
µ
F
+
U2 MC7812
V
I
V
O
R13
1K
R3
250
7
V
CC
OUT
R12 470 1 W
GND
R14 150
C7 110 pF
Q2 MJ11016
(IB)
R16
430
R1 1K
R51K(IC)
Q5 MJ11016
C6
100
µ
F
+
L
Y
C
Y
V
CE
R4
22
D2 SCANSWITCH DAMPER DIODE
L
B
T
1
D1 MUR110
U1 MC1391P
6
1
2
8
R6 1K
OSC
GND
%
C4
0.005
R7
2.7K
R8
9.1KR9470
C2 10
µ
F
+
MDC1000A
Q6 2N5401
C3 10
µ
F
+
3.9 V
Q3 MTP3055E
R17
120
R15 10K
C5
0.1
Q4 SCANSWITCH HORIZ OUTPUT TRANSISTOR
Figure 15. High Resolution Deflection Application Simulator
T1: FERROXCUBE POT CORE #1811P3C8
T1: PRIMARY SEC. TURNS RATIO = 13:4 T1: GAPPED FOR LP = 30 µH
LB = 0.5 µH CY = 0.01
µ
F
LY = 13
µ
H
Page 8
MJW16206
8
Motorola Bipolar Power Transistor Device Data
ts and t
f
+15
150
100
100 µF
MTP8P10
MPF930
MPF930
MUR105
MJE210
150
500 µF
V
off
50
+10 V
MTP12N10
MTP8P10
R
B1
A
1
µ
F
1
µ
F
T.U.T.
*I
C
*I
B
A
R
L
V
CC
V
(off)
adjusted to give specified off drive
V
CC
250 V
I
C
6.5 A
I
B1
1.3 A
I
B2
Per Fig. 17 & 18
R
B1
7.7
R
L
38
Figure 16. Resistive Load Switching
3 10 202 5
5
IC, COLLECTOR CURRENT (AMPS)
t, TIME ( s)
µ
1
2
10
7
Figure 17. Typical Resistive Storage Time
0.5
3
7
1
0.7
t, TIME (ns)
1000
500
300
700
200
70
100
50
IC/IB = 5 TC = 25
°
C
IC, COLLECTOR CURRENT (AMPS)
IB2 = I
B1
IC/IB1 = 5 TC = 25
°
C
IB2 = 2 (IB1)
IB2 = I
B1
IB2 = 2 (IB1)
Figure 18. Typical Resistive Fall Time
3 10 202 5
7
1
Page 9
MJW16206
9
Motorola Bipolar Power Transistor Device Data
Figure 19. Screw or Clip Mounting Position
for Isolation Test Number 1
*Measurement made between leads and heatsink with all leads shorted together.
LEADS
HEATSINK
0.099” MIN
Figure 20. Screw or Clip Mounting Position
for Isolation Test Number 2
MOUNTED
FULLY ISOLATED
PACKAGE
LEADS
HEATSINK
MOUNTED
FULLY ISOLATED
PACKAGE
0.110” MIN
TEST CONDITIONS FOR ISOLATION TESTS*
4–40 SCREW
PLAIN WASHER
HEATSINK
COMPRESSION WASHER
NUT
CLIP
HEATSINK
Laboratory tests on a limited number of samples indicate, when using the screw and compression washer mounting technique, a screw torque of 6 to 8 in.lbs is sufficient to provide maximum power dissipation capability . The compression washer helps to maintain a con­stant pressure on the package over time and during large temperature excursions.
Destructive laboratory tests show that using a hex head 4-40 screw, without washers, and applying a torque in excess of 20 in.lbs will cause the plastic to crack around the mounting hole, resulting in a loss of isolation capability.
Additional tests on slotted 4-40 screws indicate that the screw slot fails between 15 to 20 in.lbs without adversely affecting the pack­age. However, in order to positively ensure the package integrity of the fully isolated device, Motorola does not recommend exceeding 10 in.lbs of mounting torque under any mounting conditions.
Figure 21. Typical Mounting Techniques*
MOUNTING INFORMATION**
**For more information about mounting power semiconductors see Application Note AN1040.
Page 10
MJW16206
10
Motorola Bipolar Power Transistor Device Data
PACKAGE DIMENSIONS
CASE 340F–03
TO–247AE
ISSUE E
DIMAMIN MAX MIN MAX
INCHES
20.40 20.90 0.803 0.823
MILLIMETERS
B 15.44 15.95 0.608 0.628 C 4.70 5.21 0.185 0.205 D 1.09 1.30 0.043 0.051 E 1.50 1.63 0.059 0.064 F 1.80 2.18 0.071 0.086 G 5.45 BSC 0.215 BSC H 2.56 2.87 0.101 0.113 J 0.48 0.68 0.019 0.027 K 15.57 16.08 0.613 0.633 L 7.26 7.50 0.286 0.295 P 3.10 3.38 0.122 0.133 Q 3.50 3.70 0.138 0.145 R 3.30 3.80 0.130 0.150 U 5.30 BSC 0.209 BSC V 3.05 3.40 0.120 0.134
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
STYLE 3:
PIN 1. BASE
2. COLLECTOR
3. EMITTER
4. COLLECTOR
R
P
A
K
V
F
D
G
U
L
E
0.25 (0.010)MT B
M
0.25 (0.010)MY Q
S
J
H
C
4
1 2 3
–T–
–B–
–Y–
–Q–
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MJW16206/D
*MJW16206/D*
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