Datasheet MCP8025, MCP8026 Datasheet

MCP8025/6

3-Phase Brushless DC (BLDC) Motor Gate Driver with Power Module, Sleep Mode, LIN Transceiver

Features

• AEC-Q100 Grade 0 Qualified
• Quiescent Current:
- Sleep Mode: 5 µA Typical
- Standby Mode: < 200 µA
• LIN Transceiver Interface (MCP8025):
2.2, and SAE J2602
- Supports baud rates up to 20K baud
- Internal pull-up resistor and diode
- Protected against ground shorts
- Protected against loss of ground
- Automatic thermal shutdown
- LIN Bus dominant timeout
• Three Half-Bridge Drivers Configured to Drive External High-Side NMOS and Low-Side NMOS MOSFETs:
- Independent input control for high-side
NMOS and low-side NMOS MOSFETs
- Peak output current: 0.5A @ 12V
- Shoot-through protection
- Overcurrent and short circuit protection
• Adjustable Output Buck Regulator (750 mW)
• Fixed Output Linear Regulators:
- 5V@30mA
-12V@30mA
• Operational Amplifiers:
- one in MCP8025
- three in MCP8026
• Overcurrent Comparator with DAC Reference
• Phase Comparator With Multiplexer (MCP8025)
• Neutral Simulator (MCP8025)
• Level Translators (MCP8026)
• Input Voltage Range: 6V – 40V
• Operational Voltage Range:
-6V–19V (MCP8025)
-6V–28V (MCP8026)
• Buck Regulator Undervoltage Lockout: 4.0V
• Undervoltage Lockout (UVLO): 5.5V (except Buck)
• Overvoltage Lockout (OVLO)
-20V (MCP8025)
-32V (MCP8026)
• Transient (100 ms) Voltage Tolerance: 48V
• Extended Temperature Range (T
• Thermal Shutdown
): -40 to +150°C
A

Applications

• Automotive Fuel, Water, Ventilation Motors
• Home Appliances
• Permanent Magnet Synchronous Motor (PMSM) Control
• Hobby Aircraft, Boats, Vehicles

Description

The MCP8025/6 devices are 3-phase brushless DC (BLDC) power modules containing three integrated half-bridge drivers capable of driving three external NMOS/NMOS transistor pairs. The three half-bridge drivers are capable of delivering a peak output current of 0.5A at 12V for driving high-side and low-side NMOS MOSFET transistors. The drivers have shoot-through, overcurrent and short-circuit protection. A Sleep Mode has been added to achieve a typical “key-off” quiescent current of 5 µA.
The MCP8025 device integrates a comparator, a buck voltage regulator, two LDO regulators, power monitoring comparators, an overtemperature sensor, a LIN transceiver, a zero-crossing detector, a neutral simulator and an operational amplifier for motor current monitoring. The phase comparator and multiplexer allow for hardware commutation detection. The neutral simulator allows commutation detection without a neutral tap in the motor. The buck converter is capable of delivering 750 mW of power for powering a companion microcontroller. The buck regulator may be disabled if not used. The on-board 5V and 12V low­dropout voltage regulators are capable of delivering 30 mA of current.
The MCP8026 replaces the LIN transceiver, neutral simulator and zero-crossing detector in MCP8025 with two level shifters and two additional op amps.
The MCP8025/6 operation is specified over a temperature range of -40°C to +150°C.
Package options include 40-lead 5x5 QFN and 48-lead 7x7 TQFP with Exposed Pad (EP).
2014 Microchip Technology Inc. DS20005339A-page 1
MCP8025/6
5mm x 5mm QFN-40
7mm x 7mm TQFP-48
+
EP 41
EP 49
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
171819
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
1
2
3
4
5
6
7
8
9
10
11
12
131415
16
171819
20
21
222324
36
35
34
33
32
31
30
29
28
27
26
25
484746
45
444342
41
40
393837
PWM2H
PWM1L
PWM1H
CE
LIN_BUS
RX
TX
FAULTn
/TXE
MUX1
MUX2
+12V V
BA
V
BB
V
BC
PHA
PHB
PHC HSA
HSB
HSC
ZC_OUT
COMP_REF
ILIMIT_OUT
I_OUT1
I_SENSE1-
I_SENSE1+
P
GND
LSA
LSB
LSC
PWM2L
PWM3H
PWM3L
DE2
CAP1
CAP2
+5VFBVDDLX
PWM2H
PWM1L
PWM1H
CE
LIN_BUS
RX
TX
FAULTn
/TXE
MUX1
MUX2
NC
NC
P
GND
ZC_OUT
COMP_REF
ILIMIT_OUT
I_OUT1
I_SENSE1-
I_SENSE1+
P
GND
LSA
LSB
LSC
P
GND
P
GND
+12V V
BA
V
BB
V
BC
PHA
PHB
PHC HSA
HSB
HSC
P
GND
P
GND
PWM2L
PWM3H
PWM3L
DE2
CAP1
CAP2
+5V
FB
VDDLX
V
DD

Package Types – MCP8025

DS20005339A-page 2 2014 Microchip Technology Inc.

Package Types – MCP8026

5mm x 5mm QFN-40
7mm x 7mm TQFP-48
EP 41
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
171819
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
PWM2H
PWM1L
PWM1H
CE
HV_IN1
LV_O UT1
IOUT3 ISENSE3-
ISENSE3+
IOUT2
+12V V
BA
V
BB
V
BC
PHA
PHB
PHC HSA
HSB
HSC
ISENSE2-
ISENSE2+
ILIMIT_OUT
I_OUT1
I_SENSE1-
I_SENSE1+
P
GND
LSA
LSB
LSC
PWM2L
PWM3H
PWM3L
DE2
CAP1
CAP2
+5V
FB
VDDLX
+
EP 49
1
2
3
4
5
6
7
8
9
10
11
12
131415
16
171819
20
21
222324
36
35
34
33
32
31
30
29
28
27
26
25
484746
45
444342
41
40
393837
PWM2H
PWM1L
PWM1H
CE
HV_IN1
LV_OUT1
IOUT3
ISENSE3-
ISENSE3+
IOUT2
LV_OUT2
HV_IN2
P
GND
ISENSE2-
ISENSE2+
ILIMIT_OUT
I_OUT1
I_SENSE1-
I_SENSE1+
P
GND
LSA
LSB
LSC
P
GND
P
GND
+12V V
BA
V
BB
V
BC
PHA
PHB
PHC HSA
HSB
HSC
P
GND
P
GND
PWM2L
PWM3H
PWM3L
DE2
CAP1
CAP2
+5V
FB
VDDLX
V
DD
MCP8025/6
2014 Microchip Technology Inc. DS20005339A-page 3
LIN
XCVR
CE
FAULTn/TXE
RX
TX
PWM1H
PWM1L
PWM2H
PWM2L
PWM3H
PWM3L
LIN_BUS
MUX
+
-
PHA PHB PHC
PGND
ZC_OUT
COMP_REF
NEUTRAL_SIM
MUX1 MUX2
MOTOR CONTROL UNIT
COMMUNICATION PORT BIAS GENERATOR
+12V
HSA
HSB
HSC
LSA
LSB
LSC
VBA VBB VBC
GATE
CONTROL
LOGIC
I
I
I
I
I
I
I
I
I
O
O
O
O
O
O
O
VDD
I_OUT1
+
-
+
-
ILIMIT_OUT
I_SENSE1+
I_SENSE1-
DRIVER
FAULT
VDD
I
I
I/O
I/O
O
I
I
I
I
IO
PHASE DETECT
ILIMIT_REF
LDO
BUCK SMPS
SUPERVISOR
LDO
CHARGE PUMP
DE2
VDD
+5V
LX FB
+12V
CAP2
CAP1
SIM Select
MCP8025/6

Functional Block Diagram – MCP8025

DS20005339A-page 4 2014 Microchip Technology Inc.
GATE
CONTROL
LOGIC
CE
PWM1H
PWM1L
PWM2H
PWM2L
PWM3H
PWM3L
HV_IN1
I_OUT1
+
-
+
-
PHA PHB PHC
PGND
ILIMIT_OUT
MOTOR CONTROL UNIT
COMMUNICATION PORT BIAS GENERATOR
+12V
HSA
HSB
HSC
I_SENSE1+
LSA
LSB
LSC
I_SENSE1-
VBA VBB VBC
LV_OUT1
LEVEL
TRANSLATOR
VDD
+
-
+
-
I_SENSE2+
I_SENSE2-
I_SENSE3+
I_SENSE3-
I_OUT2
I_OUT3
DRIVER
FAULT
I
I
I
I
I
I
I
I
I
I
I
O
O
O
O
O
O
O
O
LDO
BUCK SMPS
SUPERVISOR
LDO
CHARGE PUMP
DE2
VDD
+5V
LX FB
+12V
CAP2
CAP1
ILIMIT_REF
HV_IN2
LV_OUT2
O
I

Functional Block Diagram – MCP8026

MCP8025/6
2014 Microchip Technology Inc. DS20005339A-page 5
DS20005339A-page 6 2014 Microchip Technology Inc.
LIN
XCVR
CE
FAULTn/TXE
RX TX
PWM1H
PWM1L
PWM2H
PWM2L
PWM3H
PWM3L
LIN_BUS
MUX
+
-
PHA PHB PHC
PGND
ZC_OUT
COMP_REF
NEUTRAL_SIM
DE2
MUX1 MUX2
MOTOR CONTROL UNIT
COMMUNICATION PORT BIAS GENERATOR
LDO
BUCK SMPS
SUPERVISOR
VDD
LDO
+5V
LX FB
+12V
+12V
HSA
HSB
HSC
LSA
LSB
LSC
VBA VBB VBC
GATE
CONTROL
LOGIC
I
I
I
I
I
I
I
I
I
O
O
O
O
O
O
O
VDD
I_OUT1
+
-
+
-
ILIMIT_OUT
I_SENSE1+
I_SENSE1-
DRIVER
FAULT
VDD
I
I
I/O
I/O
O
I
I
I
I
IO
CAP1
CHARGE PUMP
CB
A
+ _
E
VADJ
PHASE DETECT
+12V
ILIMIT_REF
CAP2
100 nF
Ceramic
SIM Select

Typical Application Circuit – MCP8025

MCP8025/6
2014 Microchip Technology Inc. DS20005339A-page 7
'!4%
#/.42/,
,/')#
#%
07-(
07-,
07-(
07-,
07-(
07-,
(6?).
)?/54
0(! 0(" 0(#
0'.$
-/4/2#/.42/,5.)4
#/--5.)#!4)/.0/24
6
(3!
(3"
(3#
)?3%.3%
,3!
,3"
,3#
)?3%.3%
6"! 6"" 6"#
,6?/54
,%6%,
42!.3,!4/2
6$$
)?3%.3%
)?3%.3%
)?3%.3%
)?3%.3%
)?/54
)?/54
$2)6%2
&!5,4
)
)
)
)
)
)
)
)
)
)
)
/
/
/
/
/
/
/
/
#"
!
 ?
%
6
$%
")!3'%.%2!4/2
,$/
"5#+3-03
350%26)3/2
6$$
,$/
6
,8 &"
6
#!0
#(!2'%05-0
6!$*
ILIMIT_REF
#!0
(6?).
,6?/54
/
)
N&
#ERAMIC
),)-)4?/54

Typical Application Circuit – MCP8026

MCP8025/6
MCP8025/6
NOTES:
DS20005339A-page 8 2014 Microchip Technology Inc.
MCP8025/6

1.0 ELECTRICAL CHARACTERISTICS

† Notice: Stresses above those listed under “Maximum
Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device at those or any other conditions above those

Absolute Maximum Ratings †

Input Voltage, VDD.............................(GND – 0.3V) to +46.0V
Input Voltage, < 100 ms Transient ...............................+48.0V
Internal Power Dissipation ...........................Internally-Limited
Operating Ambient Temperature Range .......-40°C to +150°C
Operating Junction Temperature (Note 2) ....-40°C to +160°C
Transient Junction Temperature (Note 1)...................+170°C
Storage Temperature (Note 2)......................-55°C to +150°C
Digital I/O .......................................................... -0.3V to 5.5V
LV Analog I/O.................................................... -0.3V to 5.5V
VBx ..................................................(GND – 0.3V) to +46.0V
PHx, HSx .........................................(GND – 5.5V) to +46.0V
ESD and Latch-Up Protection:
, LIN_BUS/HV_IN1  8 kV HBM and  750V CDM
V
DD
All other pins ..................... 2 kV HBM and 750V CDM
Latch-up protection – all pins .............................. > 100 mA
indicated in the operational listings of this specification is not implied. Exposure to maximum rating conditions for extended periods may affect device reliability.
Note 1: Transient junction temperatures should not
2: The maximum allowable power dissipation

AC/DC CHARACTERISTICS

Electrical Specifications: Unless otherwise noted, T
Parameters Symbol Min. Typ. Max. Units Conditions
POWER SUPPLY INPUT
Input Operating Voltage V
Transient Maximum Voltage V
Input Current (MCP8025)V
Input Current (MCP8026)V
Digital Input/Output DIGITAL
Digital Open-Drain Drive
DD
DDmax
DD
DD
DIGITAL
I/O
IOL
Streng th
Note 1: 1000 hour cumulative maximum for ROM data retention (typical).
2: Limits are by design, not production tested.
= -40°C to +150°C, typical values are for +25°C, VDD=13V.
J
6.0 19.0 V Operating (MCP8025)
6.0 28.0 Operating (MCP8026)
6.0 40.0 Shutdown
4.0 32.0 Buck Operating Range
48.0 V < 100 ms
———µAVDD>13V
5 15 Sleep Mode
175 Standby, CE = 0V, T
175 Standby, CE = 0V, TJ= +25°C
195 300 Standby, CE = 0V, T
—940— Active, CE>V
—1150— Active, VDD=6V, TJ=+25°C
———µAVDD>13V
5 15 Sleep Mode
120 Standby, CE = 0V, T
120 Standby, CE = 0V, TJ= +25°C
144 300 Standby, CE = 0V, T
—950— Active, CE>V
1090 Active, VDD=6V, TJ=+25°C
0—5.5V
—1—mAVDS<50mV
exceed one second in duration. Sustained junction temperatures above 170°C may impact the device reliability.
is a function of ambient temperature, the maximum allowable junction temperature and the thermal resistance from junction to air (i.e., T
, TJ, JA). Exceeding the maxi-
A
mum allowable power dissipation may cause the device operating junction tem­perature to exceed the maximum 160°C rating. Sustained junction temperatures above 150°C can impact the device reliabil­ity and ROM data retention.
=-45°C
J
= +150°C
J
DIG_HI_TH
=-45°C
J
= +150°C
J
DIG_HI_TH
2014 Microchip Technology Inc. DS20005339A-page 9
MCP8025/6
AC/DC CHARACTERISTICS (CONTINUED)
Electrical Specifications: Unless otherwise noted, T
Parameters Symbol Min. Typ. Max. Units Conditions
Digital Input Rising Threshold V
Digital Input Falling Threshold V
Digital Input Hysteresis V
Digital Input Current I
Analog Low-Voltage Input ANALOG
Analog Low-Voltage Output
DIG_HI_TH
DIG_LO_TH
DIG_HYS
DIG
ANALOG
VIN
VOUT
BIAS GENERATOR +12V Regulated Charge Pump
Charge Pump Current I
Charge Pump Start CP
Charge Pump Stop CP
Charge Pump Frequency
CP
CP
START
STOP
FSW
(50% charging/ 50% discharging)
Charge Pump Switch
CP
RDSON
Resistance
Output Voltage V
Output Voltage Tolerance |TOLV
Output Current I
Output Current Limit I
Output Voltage Temperature
TCV
OUT12
OUT12
OUT
LIMIT
OUT12
|— — 4.0 %I
Coefficient Line Regulation |V
(V
OUT
Load Regulation |V
Power Supply Rejection
/
OUT
x VDD)|
OUT/VOUT
|— 0.2 0.5 %I
PSRR 60 dB f = 1 kHz, I
Ratio
+5V Linear Regulator
Output Voltage V
Output Voltage Tolerance |TOLV
Output Current I
Output Current Limit I
Output Voltage Temperature
|TCV
OUT5
|— — 4.0 %
OUT5
OUT
LIMIT
|—50—ppm/°C
OUT5
Coefficient Line Regulation |V
(V
OUT
Load Regulation |V
/
OUT
x VDD)|
OUT/VOUT
|— 0.2 0.5 %I
Note 1: 1000 hour cumulative maximum for ROM data retention (typical).
2: Limits are by design, not production tested.
= -40°C to +150°C, typical values are for +25°C, VDD= 13V.
J
1.26 V
——0.54V
—500—mV
—3010AV
—0.2— V
0 5.5 V Excludes LIN and high-voltage
0—V
OUT5
20 mA VDD=9.0V
11.0 11.5 V VDD falling
12.0 12.5 V VDD rising
76.80 kHz VDD=9.0V
—0— V
—14— RDSON sum of high side and
—12— VVDD 7.5V, C
—9— V
30 mA Average current
40 50 mA Average current
—50—ppm/°C
—0.10.5%/V13V<V
—5—VVDD=V
30 mA Average current
40 50 mA Average current
—0.10.5%/V6V<V
=3.0V
DIG
=0V
DIG
pins
V Excludes LIN and high-voltage
pins
= 13V (stopped)
DD
low side
=100nF,
DD
OUT5
DD
PUMP
PUMP
< 19V,
=10mA
OUT
+1V,
<19V, I
= 260 nF,
=20mA
OUT
=20mA
I
OUT
=5.1V, C
DD
=15mA
I
OUT
=1mA
OUT
=20mA
I
OUT
= 0.1 mA to 15 mA
OUT
=1mA
I
OUT
= 0.1 mA to 15 mA
OUT
DS20005339A-page 10 2014 Microchip Technology Inc.
MCP8025/6
AC/DC CHARACTERISTICS (CONTINUED)
Electrical Specifications: Unless otherwise noted, T
Parameters Symbol Min. Typ. Max. Units Conditions
Dropout Voltage VDD–V
Power Supply Rejection
OUT5
PSRR 60 dB f = 1 kHz, I
Ratio
Buck Regulator
Feedback Voltage V
FB
Feedback Voltage Tolerance TOLVFB ——5.0%IFB=1µA
Feedback Voltage Line Regulation
Feedback Voltage Load
V
V
V
)/
FB/VFB
|
DD
|—0.10.5%I
FB/VFB
Regulation
Feedback Input Bias Current I
Feedback Voltage
FB
V
BUCK_DIS
To Shutdown Buck Regulator
Switching Frequency f
Duty Cycle Range DC
PMOS Switch On Resistance R
PMOS Switch Current Limit I
Ground Current –
SW
MAX
DSON
P(MAX)
I
GND
PWM Mode
Quiescent Current –
I
Q
PFM Mode
Output Voltage Adjust Range V
Output Current I
Output Power P
OUT
OUT
OUT
V oltage Supervisor
Buck Input Undervoltage
UVLO
BK_STRT
Lockout – Start-Up
Buck Input Undervoltage
UVLO
BK_STOP
Lockout – Shutdown
Buck Input Undervoltage
UVLO
BK_HYS
Lockout Hysteresis
5V LDO Undervoltage Fault
UVLO
5VLDO_INACT
Inactive
5V LDO Undervoltage Fault
UVLO
5VLDO_ACT
Active
5V LDO Undervoltage Fault
UVLO
5VLDO_HYS
Hysteresis
Input Undervoltage Lockout –
UVLO
STRT
Start -Up
Input Undervoltage Lockout -
UVLO
STOP
Shutdown
Note 1: 1000 hour cumulative maximum for ROM data retention (typical).
2: Limits are by design, not production tested.
= -40°C to +150°C, typical values are for +25°C, VDD=13V.
J
—180350mVI
OUT
=20mA, measurement taken when output voltage drops 2% from no-load value.
1.19 1.25 1.31 V
—0.10.5%/VV
= 6V to 28V
DD
= 5 mA to 150 mA
OUT
-100 +100 nA Sink/Source
2.5 5.5 V VDD>6V
—461—kHz
3—96%
—0.6— TJ=25°C
—2.5— A
1.5 2.5 mA Switching
—15020AI
OUT
=0mA
2.0 5.0 V
150 mA 5V, VDD–V
250 3V, VDD–V
—750—mWP=I
OUTxVOUT
—4.34.5 VVDD rising
3.8 4.0 V VDD falling
—0.3— V
—4.5— VV
—4.0— VV
OUT5
OUT5
rising
falling
—0.5— V
—6.06.25VVDD rising
5.1 5.5 V VDD falling
OUT
OUT
OUT
=10mA
>0.5V
> 0.5V
2014 Microchip Technology Inc. DS20005339A-page 11
MCP8025/6
AC/DC CHARACTERISTICS (CONTINUED)
Electrical Specifications: Unless otherwise noted, T
Parameters Symbol Min. Typ. Max. Units Conditions
Input Undervoltage Lockout
UVLO
HYS
Hysteresis
Input Overvoltage Lockout –
DOVLO
STOP
Driver Disabled (MCP8025)
Input Overvoltage Lockout –
DOVLO
STRT
Driver Enabled (MCP8025)
Input Overvoltage Lockout
DOVLO
HYS
Hysteresis (MCP8025)
Input Overvoltage Lockout –
AOVLO
STOP
All Functions Disabled
Input Overvoltage Lockout –
AOVLO
STRT
All Functions Enabled
Input Overvoltage Lockout
AOVLO
HYS
Hysteresis
Temperature Supervisor
Thermal Warning
T
WARN
Temperature Thermal Warning Hysteresis T
Thermal Shutdown
WARN
T
SD
Temperature
Thermal Shutdown
T
SD
Hysteresis
MOTOR CONTROL UNIT Output Drivers
PWMH/L Input Pull Down R
Output Driver Source Current I
Output Driver Sink Current I
Output Driver Source
PULLDN
SOURCE
SINK
R
DSON
Resistance
Output Driver Sink
R
DSON
Resistance
Output Driver Blanking t
Output Driver UVLO
BLANK
D
UVLO
Threshold
Output Driver UVLO
t
DUVLO
Minimum Duration
Output Driver HS Drive
V
HS
Voltage
Output Driver LS Drive
V
LS
Voltage
Output Driver Bootstrap
V
BOOTSTRAP
Voltage
Note 1: 1000 hour cumulative maximum for ROM data retention (typical).
2: Limits are by design, not production tested.
= -40°C to +150°C, typical values are for +25°C, VDD= 13V.
J
0.20 0.45 0.70 V
20.0 20.5 V VDD rising
18.75 19.5 V VDD falling
0.15 0.5 0.75 V
32.0 33.0 V VDD rising
29.0 30.0 V VDD falling
1.0 2.0 3.0 V
—72—%TSDRising temperature (115°C)
15 °C Falling temperature
160 170 °C Rising temperature
25 °C Falling temperature
—47—k
0.3 A VDD= 12V, HS[A:C], LS[A:C]
0.3 A VDD= 12V, HS[A:C], LS[A:C]
—17— I
—17— I
500 4000 ns Configurable
7.2 8.0 V Config Register 0 bit 3 = 0
t
BLANK
+700
—t
BLANK
+1400
8.0 12 13.5 V With respect to the Phase pin
-5.5 With respect to ground
8.0 12 13.5 V With respect to ground
V With respect to ground
44 Continuous
48 < 100 ms
=10mA, VDD= 12V,
OUT
HS[A:C], LS[A:C]
=10mA, VDD= 12V,
OUT
HS[A:C], LS[A:C]
ns Fault latched after t
DUVLO
DS20005339A-page 12 2014 Microchip Technology Inc.
AC/DC CHARACTERISTICS (CONTINUED)
Electrical Specifications: Unless otherwise noted, T
Parameters Symbol Min. Typ. Max. Units Conditions
Output Driver Phase Pin
V
PHASE
Voltage
Output Driver Short Circuit
D
SC_THR
Protection Threshold
High Side (VDD–V Low Side (V
PHx–PGND
Output Driver Short Circuit
PHx
)
)
T
SC_DLY
Detected Propagation Delay
Output Driver OVLO Turn-Off
T
OVLO_DLY
Delay
Power-Up or Sleep to
t
POWER
Standby
Standby to Motor Operational t
Fault to Driver Output
MOTOR
T
FAULT_ OFF
Turn-Off
CE Low to Driver Output
T
DEL_OFF
Turn-Off
CE Low to Standby State t
CE Low to Sleep State t
CE Fault Clearing Pulse t
STANDBY
SLEEP
FAULT_CLR
Current Sense Amplifier
Input Offset Voltage V
Input Offset Temperature Drift V
Input Bias Current I
Common Mode Input Range V
OS
CMR
OS
B
/T
A
Note 1: 1000 hour cumulative maximum for ROM data retention (typical).
2: Limits are by design, not production tested.
= -40°C to +150°C, typical values are for +25°C, VDD=13V.
J
V With respect to ground
-5.5 44 Continuous
-5.5 48 < 100 ms
V Set In Register CFG0 —0.250— 00 (Default) —0.500— 01 —0.750— 10 —1.000— 11
———nsC
430 Detection after blanking
10 Detection during blanking,
3 5 µs Detection synchronized with
ms CE High-Low-High
—10— MCP8025 —5— MCP8026
5 µs CE High-Low-High
5 ms Standby state to Operational
10 ms Standby state to Operational
———µsC
1 UVLO, OCP faults
10 All other faults
—100250nsC
1 ms Time after CE = Low,
1 ms Time after CE = Low,
1 900 µs CE High-Low-High Transition
-3.0 +3.0 mV VCM=0V
—±2.0—µV/°CVCM=0V
-1 +1 µA
-0.3 3.5 V
MCP8025/6
= 1000 pF, VDD=12V
LOAD
value is delay after blanking
internal clock (Note 2)
Transition < 100 µs (Fault Clearing)
Transition < 0.9 ms (Fault Clearing)
state (MCP8025, Note 2)
state (MCP8026, Note 2)
= 1000 pF, VDD=12V,
LOAD
time after fault occurs.
= 1000 pF, VDD=12V,
LOAD
Time after CE = Low (Note 2)
SLEEP Bit = 0
SLEEP Bit = 1
Time (Note 2)
= -40°C to +150°C
T
A
2014 Microchip Technology Inc. DS20005339A-page 13
MCP8025/6
AC/DC CHARACTERISTICS (CONTINUED)
Electrical Specifications: Unless otherwise noted, T
Parameters Symbol Min. Typ. Max. Units Conditions
Common Mode Rejection
CMRR 80 dB Freq = 1 kHz, I
Ratio
Maximum Output Voltage
, V
V
OL
OH
Swing
Slew Rate SR ±7 V/µs Symmetrical
Gain Bandwidth Product GBWP 10.0 MHz
Current Comparator
CC
HYS
Hysteresis
Current Comparator
V
CC_CMR
Common Mode Input Range
Current Limit DAC
Resolution 8 Bits
Output Voltage Range V
Output Voltage V
Input to Output Delay T
, V
OL
DAC
DELAY
OH
Integral Nonlinearity INL -0.5 +0.5 %FSR %Full Scale Range, Note 2 Differential Nonlinearity DNL -50 +50 %LSB %LSB, Note 2
ILIMIT_OUT
Sink Current
IL
OUT
(Open-Drain)
ZC Back EMF Sampler Comparator (MCP8025)
Maximum Output Voltage Swing
Reference Input Impedance ZC
Input to Output Delay ZC
Voltage Divider RC Time
ZCVOL,
ZCV
OH
ZREF
DELAY
ZC
TRC
Constant
ZC Output Pull-Up Range ZC
ZC Output Sink Current
RPULLUP
ZC
IOL
(Open-Drain)
Back EMF Sampler Phase Multiplexer (MCP8025)
MUX[1:2] Input Pull Down R
Transition Time t
Delay from MUX Select to ZC
PULLDN
MUX
TRAN
DELAY
Out
Phase Filter Capacitors C
PHASE
COMMUNICATION PORTS Standard LIN (MCP8025) Microcontroller Interface
TX Input Pull-Up Resistor R
PUTXD
Note 1: 1000 hour cumulative maximum for ROM data retention (typical).
2: Limits are by design, not production tested.
= -40°C to +150°C, typical values are for +25°C, VDD= 13V.
J
OUT
0.05 4.5 V I
OUT
= 200 µA
—10—mV
1.0 4.5 V
0.991 4.503 V I
OUT
=1mA
——— VCFG1 Code x
13.77 mV/bit + 0.991V
0.991 Code 00H
1.872 Code 40H
4.503 Code FFH
—50—µs
—1—mAV
0.05 - 5.0 V I
ILIMIT_OUT
OUT
50 mV
=1mA
—83—k
—-500nsV
IN_STEP
=500mV, Note 2
—100— ns
3.3 10 k —1—mAVout 50 mV
—47—k —150250nsNote 2
—210— ns
1.5 pF MUX input to ground
—48 - k Pull up to 5V
=10µA
DS20005339A-page 14 2014 Microchip Technology Inc.
AC/DC CHARACTERISTICS (CONTINUED)
Electrical Specifications: Unless otherwise noted, T
Parameters Symbol Min. Typ. Max. Units Conditions
Bus Interface
LIN Bus High-Level Input
V
HI
Voltage
LIN Bus Low-Level Input
V
LO
Voltage
LIN Bus Input Hysteresis V
LIN Bus Low-Level Output
HYS
I
OL
Current
LIN Bus Input Pull-Up Current I
LIN Bus Short Circuit Current Limit
LIN Bus Low-Level Output
PU
I
SC
V
OL
Voltage
LIN Bus Input Leakage Current (at receiver during
I
BUS_PAS_DOM
dominant bus level)
LIN Bus Input Leakage Current (at receiver during recessive bus level)
I
BUS_PAS_REC
LIN Bus Input Leakage Current (disconnected from
I
BUS_NO_GND
ground)
LIN Bus Input Leakage
I
BUS_NO_BAT
Current (disconnected from V
)
DD
Receiver Center Voltage V
LIN Bus Slave Pull-Up
BUS_CNT
R
PULLUP
Resistance
LIN Dominant State Timeout t
Propagation Delay T
Symmetry T
DOM_TOUT
RX_PD
RX_SYM
V oltage Level Translators (MCP8026)
High Voltage Input Range V
Low Voltage Output Range V
IN
OUT
Input Pull-Up Resistor RPU 30 k
High-Level Input Voltage V
Low-Level Input Voltage V
Input Hysteresis V
Propagation Delay T
IH
IL
HYS
LV_ OUT
Note 1: 1000 hour cumulative maximum for ROM data retention (typical).
2: Limits are by design, not production tested.
= -40°C to +150°C, typical values are for +25°C, VDD=13V.
J
0.6 x V
DD
V Recessive state
——0.4x
V
DD
0.175 x
V
DD
7.3 mA VO=0.2xVDD, VDD=8V
16.5 VO=0.2xVDD, VDD= 18V
30.6 V
5—18A
50 200 mA
——0.2x
V
DD
-1 mA Driver OFF,
12 20 µA Driver OFF,
-1 1 mA GND = VDD=12V,
——1AVDD=0V,
0.475 x V
DD
0.5 x V
DD
0.525 x V
DD
20K 30K 47K
—25—ms
3.0 6.0 µs Propagation delay of receiver
-2 +2 µs Symmetry of receiver
0—VDDV
0—5.0VV
0.60 V
——0.40VDDVDD=15V
——0.30V
—3.06.sNote 2
MCP8025/6
VDominant state
VVHI–V
V
VV
DDVDD
DD
LO
=0.251xVDD, VDD= 18V
O
=0V, VDD=12V
V
BUS
V
V
BUS
7V < V 7V < V
0V < V
0V < V
BUS _CNT
DD
< 19V
BUS
<19V
DD
< 19V
BUS
< 19V
BUS
=(VHI–VLO)/2
propagation delay rising edge w.r.t.falling edge
=15V
2014 Microchip Technology Inc. DS20005339A-page 15
MCP8025/6
AC/DC CHARACTERISTICS (CONTINUED)
Electrical Specifications: Unless otherwise noted, T
Parameters Symbol Min. Typ. Max. Units Conditions
Maximum Communication
F
MAX
Frequency
Low-Voltage Output Sink
I
OL
Current (Open-Drain)
DE2 Communications
Baud Rate BAUD 9600 BPS
Power-Up Delay PU_DELAY 1 ms Time from rising V
DE2 Sink Current DE2
DE2 Message Response
DE2
iSINK
RSP
Time
DE2 Host Wait Time DE2
DE2 Message Receive
DE2
WAIT
RCVTOUT
Timeout
INTERNAL ROM (READ-ONLY MEMORY) DATA RETENTION
Cell High Temperature
HTOL 1000 Hours T
Operating Life
Cell Operating Life 10 Years T
Note 1: 1000 hour cumulative maximum for ROM data retention (typical).
2: Limits are by design, not production tested.
= -40°C to +150°C, typical values are for +25°C, VDD= 13V.
J
——20kHzNote 2
—1—mAV
OUT
50 mV
to DE2 active
1——mAV
50 mV, Note 2
DE2
0 µs Time from last received Stop bit
to Response Start bit, Note 2
3.125 ms Minimum Time For Host To Wait For Response. Three packets based on 9600 BAUD,
Note 2
5 ms Time between message bytes
= 150°C (Note 1)
J
= 85°C
J
DD
6V

TEMPERATURE SPECIFICATIONS

Parameters Sym. Min. Typ. Max. Units Conditions
Temperature Ranges (Note 1)
Specified Temperature Range T
Operating Temperature Range T
Storage Temperature Range T
A
A
T
J
A
Package Thermal ResistanceS
Thermal Resistance, 5 mm x 5 mm 40L-QFN
Thermal Resistance, 7 mm x 7 mm 48L-TQFP with Exposed Pad
JA
JC
JA
JC
Note 1: The maximum allowable power dissipation is a function of ambient temperature, the maximum allowable
junction temperature and the thermal resistance from junction to air (i.e., T maximum allowable power dissipation will cause the device operating junction temperature to exceed the maximum 160°C rating. Sustained junction temperatures above 160°C can impact the device reliability.
2: 1000 hour cumulative maximum for ROM data retention (typical).
-40 +150 °C
-40 +150 °C
-40 +160 °C
-55 +150 °C (Note 2)
37 °C/W 4-Layer JC51-5 standard board,
—6.9—
natural convection
—30—°C/W
—15—
, TJ, JA). Exceeding the
A
DS20005339A-page 16 2014 Microchip Technology Inc.
MCP8025/6

ESD, SUSCEPTIBILITY, SURGE AND LATCH-UP TESTING

Parameter Standard and Test Condition Value
Input voltage surges ISO 16750-2 28V for 1 minute,
45V for 0.5 seconds
ESD according to IBEE LIN EMC – Pins LIN_BUS, V
ESD HBM with 1.5 k/100 pF CEI/IEC 60749-26: 2006
ESD HBM with 1.5 k/100 pF – Pins LIN_BUS, V P
GND
ESD CDM (Charged Device Model, field-induced method – replaces machine-model method)
Latch-Up Susceptibility AEC Q100-004, 150°C > 100 mA
(HMM)
DD
, HV_IN1 against
DD
Test specification 1.0 following IEC 61000-4.2
AEC-Q100-002-Ref E JEDEC JS-001-2012
CEI/IEC 60749-26: 2006 AEC-Q100-002-Ref E JEDEC JS-001-2012
ESD-STM5.3.1-1999 ± 750V all pins
±8kV
±2kV
±8kV
2014 Microchip Technology Inc. DS20005339A-page 17
MCP8025/6
NOTES:
DS20005339A-page 18 2014 Microchip Technology Inc.
MCP8025/6
-0.010
-0.008
-0.006
-0.004
-0.002
0.000
0.002
0.004
0.006
0.008
0.010
-45 -20 5 30 55 80 105 130
155
V
OUT
= 5V
V
OUT
= 12V
0.00
0.05
0.10
0.15
0.20
0.25
0.30
0.35
-45 -20 5 30 55 80 105 130
155
Load Regulation (%)
V
OUT
= 5V
V
OUT
= 12V
012345678910
iLIMIT_OUT
DE2
0 5 10 15 20 25 30 35 40 45 50
HSA
V
BA
20 15 10
5 0
25 20 15 10
5 0
VDD= 6V
100
105
110
115
120
125
130
135
140
145
150
7 1013161922252831
Current (mA)
5V LDO
12V LDO
-40
-20
0
20
40
60
80
100
120
140
0
3
6
9
12
15
18
0 20406080100
V
IN
(V)
VIN= 14V
VIN= 15V
V
OUT
(AC)
CIN= C
OUT
= 10 µF
I
OUT
= 20 mA

2.0 TYPICAL PERFORMANCE CURVES

Note: The graphs and tables provided following this note are a statistical summary based on a limited number of
samples and are provided for informational purposes only. The performance characteristics listed herein are not tested or guaranteed. In some graphs or tables, the data presented may be outside the specified operating range (e.g., outside specified power supply range) and therefore outside the warranted range.
Note: Unless otherwise indicated, T
= +25°C; Junction Temperature (TJ) is approximated by soaking the device under
A
test to an ambient temperature equal to the desired junction temperature. The test time is small enough such that the rise in Junction temperature over the Ambient temperature is not significant.
Volts (V)
Line Regulation (%/V)
Temperature (°C)

FIGURE 2-1: LDO Line Regulation vs. Temperature.

FIGURE 2-4: Bootstrap Voltage @ 92% Duty Cycle.

Time (µs)
Temperature (°C)

FIGURE 2-2: LDO Load Regulation vs. Temperature.

FIGURE 2-3: I Message Delay.
2014 Microchip Technology Inc. DS20005339A-page 19
Time (µs)
LIMIT_OUT
Low to DE2
Voltage (V)

FIGURE 2-5: LDO Short Cir cuit Cur rent vs. Input Voltage.

(mV)
OUT
V
Time (µs)
FIGURE 2-6: 5V LDO Dynamic Linestep – Rising V
DD
.
MCP8025/6
-40
-20
0
20
40
60
80
100
120
140
0
3
6
9
12
15
18
0 20406080100
V
IN
(V)
VIN= 15V
VIN= 14V
V
OUT
(AC)
CIN= C
OUT
= 10 µF
I
OUT
= 20 mA
-40
-20
0
20
40
60
80
100
120
140
0
3
6
9
12
15
18
0 20406080100
IN
VIN= 14V
VIN= 15V
V
OUT
(AC)
CIN= C
OUT
= 10 µF
I
OUT
= 20 mA
-40
-20
0
20
40
60
80
10
11
12
13
14
15
16
0 20406080100
IN
VIN= 15V
VIN= 14V
V
OUT
(AC)
CIN= C
OUT
= 10 µF
I
OUT
= 20 mA
-100
-80
-60
-40
-20
0
20
40
60
80
100
0.0 0.5 1.0 1.5 2.0 2.5
OUT
VIN= 14V V
OUT
= 5V
C
IN
= C
OUT
= 10 µF
I
OUT
= 1 mA to 20 mA Pulse
20 mA
1 mA
-100
-80
-60
-40
-20
0
20
40
60
80
100
0.0 0.5 1.0 1.5 2.0 2.5
V
OUT
AC (mV)
1 mA
VIN= 14V V
OUT
= 12V
C
IN
= C
OUT
= 10 µF
I
OUT
= 1 mA to 20 mA Pulse
20 mA
7.0
8.0
9.0
10.0
11.0
12.0
13.0
14.0
6 101418222630
V
OUT
(V)
V
OUT
= 12V
C
IN
= C
OUT
= 10 µF
I
OUT
= 20 mA
Charge Pump
Switch Point
Note: Unless otherwise indicated, T
= +25°C; Junction Temperature (TJ) is approximated by soaking the device under
A
test to an ambient temperature equal to the desired junction temperature. The test time is small enough such that the rise in Junction temperature over the Ambient temperature is not significant.
(mV)
OUT
V
Time (µs)
FIGURE 2-7: 5V LDO Dynamic Linestep – Falling V
(V)
V
DD
.
(mV)
OUT
V
AC (mV)
V
Time (ms)

FIGURE 2-10: 5V LDO Dynamic Loadstep.

Time (µs)
FIGURE 2-8: 12V LDO Dynamic Linestep – Rising V
(V)
V
DD
.
Time (µs)
FIGURE 2-9: 12V LDO Dynamic Linestep – Falling V
DS20005339A-page 20 2014 Microchip Technology Inc.
.
DD
(mV)
OUT
V
Time (ms)

FIGURE 2-11: 12V LDO Dynamic Loadstep.

VIN(V)

FIGURE 2-12: 12V LDO Output Voltage vs. Rising Input Voltage.

MCP8025/6
0
200
400
600
800
1000
-45 -20 5 30 55 80 105 130 155
CE Low
CE High
0
200
400
600
800
1000
1200
-45 -20 5 30 55 80 105 130 155
CE Low
CE High
0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0
Dead Time
PWMxH
PWMxL
Dead Time
10
12
14
16
18
20
22
24
-45 -20 5 30 55 80 105 130 155
R
DSON
(
Ω
)
Low-Side
Note: Unless otherwise indicated, T
= +25°C; Junction Temperature (TJ) is approximated by soaking the device under
A
test to an ambient temperature equal to the desired junction temperature. The test time is small enough such that the rise in Junction temperature over the Ambient temperature is not significant.
1200
High-Side
Quiescent Current (µA)
Temperature (°C)

FIGURE 2-13: Quiescent Current vs. Temperature (MCP8025).

FIGURE 2-16: Driver R Temperature.
Temperature(°C)
DSON
vs.
Quiescent Current (µA)
Temperature (°C)

FIGURE 2-14: Quiescent Current vs. Temperature (MCP8026).

Time (µs)

FIGURE 2-15: 500 ns PWM Dead Time Injection.

2014 Microchip Technology Inc. DS20005339A-page 21
MCP8025/6
NOTES:
DS20005339A-page 22 2014 Microchip Technology Inc.
MCP8025/6

3.0 PIN DESCRIPTIONS

The descriptions of the pins are listed in Tables 3-1 and 3-2.

T ABLE 3-1: MCP8025 – PIN FUNCTION TABLE

QFN TQFP Symbol I/O Description
2 1 PWM1L I Digital input, phase A low-side control, 47 k pull down 3 2 PWM1H I Digital input, phase A high-side control, 47 k pull down 4 3 CE I Digital input, device enable, 47 k pull down
4 NC No connection
5 NC No connection
5 6 LIN_BUS I/O LIN Bus physical layer
—7 P
6 8 RX O LIN Bus receive data, open-drain
7 9 TX I LIN Bus transmit data
810FAULTn 9 11 MUX1 I Digital input Back EMF sampler phase multiplexer control, 47 k pull down
10 12 MUX2 I Digital input Back EMF sampler phase multiplexer control, 47 k pull down
11 13 ZC_OUT O Back EMF sampler comparator output, open-drain
12 14 COMP_REF I Back EMF sampler comparator reference
13 15 ILIMIT_OUT
14 16 I_OUT1 O Motor current sense amplifier output
15 17 ISENSE1- I Motor current sense amplifier inverting input
16 18 ISENSE1+ I Motor current sense amplifier non-inverting input
17 19,20 P
18 21 LSA O Phase A low-side N-channel MOSFET driver, active high
19 22 LSB O Phase B low-side N-channel MOSFET driver, active high
20 23 LSC O Phase C low-side N-channel MOSFET driver, active high
—24 P
21 25 HSC O Phase C high-side N-channel MOSFET driver, active high
22 26 HSB O Phase B high-side N-channel MOSFET driver, active high
23 27 HSA O Phase A high-side N-channel MOSFET driver, active high
24 28 PHC I/O Phase C high-side MOSFET driver reference, Back EMF sense input
25 29 PHB I/O Phase B high-side MOSFET driver reference, Back EMF sense input
26 30 PHA I/O Phase A high-side MOSFET driver reference, Back EMF sense input
27 31 V
28 32 V
29 33 V
30 34 +12V Power Analog circuitry and low-side gate drive bias
35, 36 P
31 37 LX Power Buck regulator switch node, external inductor connection
32 38, 39 V
33 40 FB I Buck regulator feedback node
34 41 +5V Power Internal circuitry bias
35 42 CAP2 Power Charge pump flying capacitor input
36 43 CAP1 Power Charge pump flying capacitor input
37 44 DE2 O Voltage and temperature supervisor output, open-drain 38 45 PWM3L I Digital input, phase C low-side control, 47 k pull down 39 46 PWM3H I Digital input, phase C high-side control, 47 k pull down 40 47 PWM2L I Digital input, phase B low-side control, 47 k pull down
1 48 PWM2H I Digital input, phase B high-side control, 47 k pull down
EP EP P
GND
/TXE I/O LIN transceiver fault and transmit enable
GND
GND
BC
BB
BA
GND
DD
GND
Power Power 0V reference
O Current limit comparator, MOSFET driver fault output, open-drain
Power Power 0V reference
Power Power 0V reference
Power Phase C high-side MOSFET driver bias
Power Phase B high-side MOSFET driver bias
Power Phase A high-side MOSFET driver bias
Power Power 0V reference
Power Input Supply
Power Exposed Pad. Connect to Power 0V reference.
2014 Microchip Technology Inc. DS20005339A-page 23
MCP8025/6

TABLE 3-2: MCP8026 – PIN FUNCTION TABLE

QFN TQFP Symbol I/O Description
2 1 PWM1L I Digital input, phase A low-side control, 47 k pull down 3 2 PWM1H I Digital input, phase A high-side control, 47 k pull down 4 3 CE I Digital input, device enable, 47 k pull down
4 LV_OUT2 O Level Translator 2 logic level translated output, open-drain — 5 HV_IN2 I Level Translator 2 high-voltage input, 30 k configurable pull up
5 6 HV_IN1 I Level Translator 1 high-voltage input, 30 k configurable pull up
—7 P
6 8 LV_OUT1 O Level Translator 1 logic level translated output, open-drain
7 9 I_OUT3 O Motor phase current sense amplifier 3 output
8 10 ISENSE3- I Motor phase current sense amplifier 3 inverting input
9 11 ISENSE3+ I Motor phase current sense amplifier 3 non-inverting input
10 12 I_OUT2 O Motor phase current sense amplifier 2 output
11 13 ISENSE2- I Motor phase current sense amplifier 2 inverting input
12 14 ISENSE2+ I Motor phase current sense amplifier 2 non-inverting input
13 15 ILIMIT_OUT
14 16 I_OUT1 O Motor current sense amplifier 1 output
15 17 ISENSE1- I Motor current sense amplifier 1 inverting input
16 18 ISENSE1+ I Motor current sense amplifier 1 non-inverting input
17 19,20 P
18 21 LSA O Phase A low-side N-Channel MOSFET driver, active high
19 22 LSB O Phase B low-side N-Channel MOSFET driver, active high
20 23 LSC O Phase C low-side N-Channel MOSFET driver, active high
—24 P
21 25 HSC O Phase C high-side N-Channel MOSFET driver, active high
22 26 HSB O Phase B high-side N-Channel MOSFET driver, active high
23 27 HSA O Phase A high-side N-Channel MOSFET driver, active high
24 28 PHC I/O Phase C high-side MOSFET driver reference, back EMF sense input
25 29 PHB I/O Phase B high-side MOSFET driver reference, back EMF sense input
26 30 PHA I/O Phase A high-side MOSFET driver reference, back EMF sense input
27 31 V
28 32 V
29 33 V
30 34 +12V Power Analog circuitry and low-side gate drive bias
35,36 P
31 37 LX Power Buck regulator switch node, external inductor connection
32 38, 39 V
33 40 FB I Buck regulator feedback node
34 41 +5V Power Internal circuitry bias
35 42 CAP2 Power Charge pump flying capacitor input
36 43 CAP1 Power Charge pump flying capacitor input
37 44 DE2 O Voltage and temperature supervisor output, open-drain 38 45 PWM3L I Digital input, phase C low-side control, 47 k pull down 39 46 PWM3H I Digital input, phase C high-side control, 47 k pull down 40 47 PWM2L I Digital input, phase B low-side control, 47 k pull down
1 48 PWM2H I Digital input, phase B high-side control, 47 k pull down
EP EP P
GND
GND
GND
BC
BB
BA
GND
DD
GND
Power Power 0V reference
O Current limit comparator, MOSFET driver fault output, open-drain
Power Power 0V reference
Power Power 0V reference
Power Phase C high-side MOSFET driver bias
Power Phase B high-side MOSFET driver bias
Power Phase A high-side MOSFET driver bias
Power Power 0V reference
Power Input supply
Power Exposed Pad. Connect to Power 0V reference.
DS20005339A-page 24 2014 Microchip Technology Inc.
MCP8025/6

3.1 Low-Side PWM Inputs (PWM1L, PWM2L, PWM3L)

Digital PWM inputs for low-side driver control. Each input has a 47 k pull down to ground. The PWM signals may contain dead-time timing or the system may use configuration register 2 to set the dead time.

3.2 High-Side PWM Inputs (PWM1H, PWM2H, PWM3H)

Digital PWM inputs for high-side driver control. Each input has a 47 k pull down to ground. The PWM signals may contain dead-time timing or the system may use the configuration register 2 to set the dead time.

3.3 No Connect (NC)

Reserved. Do not connect.

3.4 Chip Enable Input (CE)

Chip Enable input used to enable/disable the output driver and on-board functions. When CE is high, all device functions are enabled. When CE is low, the device operates in Standby or Sleep mode. When Standby mode is active, the current amplifiers and the 12V LDO are disabled. The buck regulator, the DE2 pin, the voltage and temperature sensor functions are not affected. The 5V LDO is disabled on the MCP8026 The H-bridge driver outputs are all set to a low state within 100 ns of CE = 0. The device transitions to Standby or Sleep mode 1 ms after CE = 0.
The CE pin may be used to clear any hardware faults. When a fault occurs, the CE input may be used to clear the fault by setting the pin low and then high again. The fault is cleared by the rising edge of the CE signal if the hardware fault is no longer active.
The CE pin is used to enable Sleep mode when the SLEEP bit in the CFG0 configuration register is set to 1. CE must be low for a minimum of 1 ms before the transition to Standby or Sleep mode occurs. This allows time for CE to be toggled to clear any faults without going into Sleep mode.
The CE pin is used to awaken the device from the Sleep mode state. To awaken the device from a Sleep mode state, the CE pin must be set low for a minimum of 250 μs. The device will then wake up with the next rising edge of the CE pin.
The CE pin has an internal 47 k pull down.

3.5 Level Translators (HV_IN1, HV_IN2, LV_OUT1, LV_OUT2)

Unidirectional digital level translators. These pins translate digital input signal on the HV_INx pin to a low-level digital output signal on the LV_OUTx pin. The HV_INx pins have internal 30 k pull ups to V are controlled by bit PU30K in the CFG0 configuration register. The PU30K bit is only sampled during CE = 0.
The HV_IN1 pin has higher ESD protection than the HV_IN2 pin. The higher ESD protection makes the HV_IN1 pin better suited for connection to external switches.
LV_OUT1 and LV_OUT2 are open-drain outputs. An external pull-up resistor to the low-voltage logic supply is required.
The HV_IN1 pin may be used to awaken the device from the Sleep mode state. The MCP8026 will awaken on the rising edge of the pin after detecting a low state lasting > 250 µs on the pin.
DD
that

3.6 LIN Transceiver Bus (LIN_BUS)

The bidirectional LIN_BUS interface pin connects to the LIN Bus network. The LIN_BUS driver is controlled by the TX pin. The driver is an open-drain output. The MCP8025 device contains a LIN Bus 30 k pull-up resistor that may be enabled or disabled by setting the PU30K bit in the CFG0 configuration register. The pull up may only be changed while in Standby mode. During normal operation, the 30 k pull up is always enabled. In Sleep mode, the 30 k pull up is always disabled.
The LIN bus may be used to awaken the device from the Sleep mode state. When a LIN wake-up event is detected on the LIN_BUS pin, the device will wake up. The MCP8025 will awaken on the rising edge of the bus after detecting a dominant state lasting > 150 µs on the bus. The LIN Bus master must provide the dominant state for > 250 µs to meet the LIN 2.2A specifications.
3.7 Power Ground (P
GND
),
Exposed Pad (EP)
Device ground. The PCB ground traces should be short and wide and should form a STAR pattern to the power source. The Exposed Pad (EP) must be soldered to the PCB. The PCB area below the EP should be a copper pour with thermal vias to help transfer heat away from the device.

3.8 LIN Transceiver Received Data Output (RX)

The RX output pin follows the state of the LIN_BUS pin. The data received from the LIN bus is output on the RX pin for connection to a host MCU.
The RX pin is an open-drain output.
2014 Microchip Technology Inc. DS20005339A-page 25
MCP8025/6

3.9 LIN Transceiver Transmit Data Input (TX)

The TX input pin is used to send data to the LIN Bus. The LIN_BUS pin is low (dominant) when TXD is low and high (recessive) when TXD is high. Data to be transmitted from a host MCU is sent to the LIN bus via the TX pin.
3.10 LIN Transceiver Fault/ Transmit Enable (FAULTn
Fault Detect output and Transmitter Enable input bidirectional pin. The FAULTn low whenever a LIN fault occurs. There is a resistor between the internal fault signal and the FAULTn pin to allow the pin to be externally driven high after a fault has occurred. The FAULTn/TXE pin must be pulsed high to start a transmit. If there is no fault present when the pin is pulsed, the FAULTn/TXE pin will latch and be driven high by an internal 100 k impedance. The FAULTn monitored for faults.
No external pull up is needed. The microcontroller pin controlling the FAULTn between output and input modes.
/TXE pin must be able to switch
/TXE pin will be driven
/TXE pin may then be
/TXE)
/TXE

3.11 Zero-Crossing Multiplexer Inputs (MUX1, MUX2 )

The MUX1 and MUX2 multiplexer inputs select the desired phase winding to be used as the zero-crossing Back EMF phase reference. The output of the multiplexer connects to one input of the zero-crossing comparator. The other zero-crossing comparator input connects to the neutral voltage. The MUX1 and MUX2 inputs must be driven by the host processor synchronously with the motor commutation.
3.14 Current Limit and Driver Fault Output (ILIMIT_OUT
Dual purpose output pin. The open-drain output goes low when the current sensed by current sense amplifier 1 exceeds the value set by the internal current reference DAC. The DAC has an offset of 0.991V (typical) which represents the zero current flow.
The open-drain output will also go low while a fault is active. Ta b le 4 - 1 shows the faults that cause the ILIMIT_OUT
The ILIMIT_OUT while maintaining less than a 50 mV drop across the output.
pin to go low.
pin is able to sink 1 mA of current
)

3.15 Operational Amplifier Outputs (I_OUT1, I_OUT2, I_OUT3)

Current sense amplifier outputs. May be used with feedback resistors to set the current sense gain. The amplifiers are disabled when CE = 0.

3.16 Operational Amplifier Inputs (ISENSE1 +/-, ISENSE2 +/-, ISENSE3 +/-)

Current sense amplifier inverting and non-inverting inputs. Used in conjunction with the I_OUTn pin to set the current sense gain. The amplifiers are disabled when CE = 0.

3.17 Low-Side N-Channel MOSFET Driver Outputs (LSA, LSB, LSC)

Low-side N-channel MOSFET drive signal. Connect to the gate of the external MOSFETs. A low-impedance resistor may be used between these pins and the MOSFET gates to limit current and slew rate.

3.12 Zero-Crossing Detector Output (ZC_OUT)

The ZC_OUT output pin is the output of the zero-crossing comparator. When the phase voltage selected by the multiplexer inputs crosses the neutral voltage, the zero-crossing detector will change the output state.
The ZC_OUT output is an open-drain output.

3.18 High-Side N-Channel MOSFET Driver Outputs (HSA, HSB, HSC)

High-side N-channel MOSFET drive signal. Connect to the gate of the external MOSFETs. A low-impedance resistor may be used between these pins and the MOSFET gates to limit current and slew rate.

3.19 Driver Phase Inputs (PHA, PHB, PHC)

3.13 Neutral Voltage Reference Input (COMP_REF)

The COMP_REF input pin is used to connect to the neutral point of a motor if the neutral point is available. The COMP_REF input may be selected via a configuration register as the neutral voltage reference used by the zero-crossing comparator.
DS20005339A-page 26 2014 Microchip Technology Inc.
Phase signals from motor. These signals provide high-side N-channel MOSFET driver reference and Back EMF sense input. The phase signals are also used with the bootstrap capacitors to provide high-side gate drive via the V
inputs.
Bx
MCP8025/6
3.20 Driver Bootstrap Inputs (V
, VBB, VBC)
BA
High-side MOSFET driver bias. Connect these pins between the bootstrap charge pump diode cathode and the bootstrap charge pump capacitor. The 12V LDO output is used to provide 12V at the diode anodes. The phase signals are connected to the other side of the bootstrap charge pump capacitors. The bootstrap capacitors charge to 12V when the phase signals are pulled low by the low-side drivers. When the low-side drivers turn off and the high-side drivers turn on, the phase signal is pulled to V voltage to rise to V
DD
+12V.
, causing the bootstrap
DD

3.21 12V LDO (+12V)

+12-volt Low Dropout (LDO) voltage regulator output. The +12V LDO may be used to power external devices such as Hall-effect sensors or amplifiers. The LDO requires an output capacitor for stability. The positive side of the output capacitor should be physically located as close to the +12V pin as is practical. For most applications, 4.7 µF of capacitance will ensure stable operation of the LDO circuit. The +12V LDO is supplied by the internal charge pump when the charge pump is active. When the charge pump is inactive, the +12V LDO is supplied by V
The type of capacitor used can be ceramic, tantalum or aluminum electrolytic. The low ESR characteristics of the ceramic will yield better noise and PSRR performance at high frequency.
DD
.

3.22 Buck Regulator Switch Output (LX)

Buck regulator switch node external inductor connection. Connect this pin to the external inductor chosen for the buck regulator.

3.23 Power Supply Input (VDD)

3.24 Buck Regulator Feedback Input (FB)

Buck regulator feedback node that is compared to an internal 1.25V reference voltage. Connect this pin to a resistor divider that sets the buck regulator output voltage. Connecting this pin to a separate +2.5V to +5.5V supply will disable the buck regulator. The FB pin should not be connected to the +5V LDO to disable the buck because the +5V LDO starts after the buck in the internal state machine. The lack of voltage at the FB pin would cause a buck UVLO fault.

3.25 5V LDO (+5V)

+5-volt Low Dropout (LDO) voltage regulator output. The +5V LDO may be used to power external devices, such as Hall-effect sensors or amplifiers. The +5V LDO is disabled on the MCP8026 when CE = 0. The internal state machine starts the buck regulator before the +5V LDO, so the +5V LDO should not be connected to the buck FB pin to disable the buck regulator. A buck UVLO fault will occur if the +5V LDO is used to disable the buck regulator. The LDO requires an output capacitor for stability. The positive side of the output capacitor should be physically located as close to the +5V pin as is practical. For most applications, 4.7 µF of capacitance will ensure stable operation of the LDO circuit.
The type of capacitor used can be ceramic, tantalum or aluminum electrolytic. The low ESR characteristics of the ceramic will yield better noise and PSRR performance at high frequency.

3.26 Charge Pump Flying Capacitor (CAP1, CAP2)

Charge pump flying capacitor connections. Connect the charge pump capacitor across these two pins. The charge pump flying capacitor supplies the power for the 12V LDO when the charge pump is active.
Connect VDD to the main supply voltage. This voltage should be the same as the motor voltage. The driver overcurrent and overvoltage shutdown features are relative to the V separate from the motor voltage, the overcurrent and overvoltage protection features may not be available.
The V operating limits of the device. Connect a bulk capacitor close to this pin for good loadstep performance and transient protection.
The type of capacitor used can be ceramic, tantalum or aluminum electrolytic. The low ESR characteristics of the ceramic will yield better noise and PSRR performance at high frequency.
2014 Microchip Technology Inc. DS20005339A-page 27
voltage must not exceed the maximum
DD
pin. When the VDD voltage is
DD

3.27 Communications Port (DE2)

Open-drain communication node. The DE2 communication is a half-duplex, 9600 baud, 8-bit, no parity communication link. The open-drain DE2 pin must be pulled high by an external pull-up resistor. The pin has a minimum drive capability of 1 mA resulting in
of 50 mV when driven low.
a V
DE2
MCP8025/6
NOTES:
DS20005339A-page 28 2014 Microchip Technology Inc.
MCP8025/6
OUTPUT
CONTROL
LOGIC
VIN
+
-
LX
FB
+
-
Q1
CURRENT_REF
VDD-12V
BANDGAP
REFERENCE
+
-

4.0 DETAILED DESCRIPTION

4.1 Bias Generator

The internal bias generator controls three voltage rails. Two fixed-output low-dropout linear regulators, an adjustable buck switch-mode power converter and an unregulated charge pump are controlled through the bias generator. In addition, the bias generator performs supervisory functions.
4.1.1 +12V LOW-DROPOUT LINEAR REGULATOR (LDO)
The +12V rail is used for bias of the 3-phase power MOSFET bridge.
The regulator is capable of supplying 30 mA of external load current. The regulator has a minimum overcurrent limit of 40 mA.
When operating at a supply voltage (V range of +12V to +12.7V, the +12V charge pump will be off and the +12V source will be the VDD supply voltage. The +12V output may be lower than +12V while operating in the V
range of +12V to +12.7V due to
DD
the dropout voltage of the regulator.
The low-dropout regulators require an output capacitor connected from V
to GND to stabilize the internal
OUT
control loop. A minimum of 4.7 µF ceramic output capacitance is required for the 12V LDO.
The +12V LDO is disabled when the Chip Enable (CE) pin is not active.
Table 4-1 shows the faults that will also disable the
+12V LDO.
4.1.2 +5V LOW-DROPOUT LINEAR REGULATOR (LDO)
The +5V LDO is used for bias of an external microcontroller, the internal current sense amplifier and the gate control logic.
The +5V LDO is capable of supplying 30 mA of external load current. The regulator has a minimum overcurrent limit of 40 mA. If additional external current is required, the buck switch-mode power converter should be utilized.
A minimum of 4.7 µF ceramic output capacitance is required for the 5V LDO.
The +5V LDO is disabled when the system is in Sleep mode. The +5V LDO is enabled in the MCP8025 and disabled in the MCP8026 when in standby mode.
Table 4-1 shows the faults that will also disable the +5V
LDO.
4.1.3 BUCK SWITCH MODE POWER SUPPLY (SMPS)
The SMPS is a high-efficiency, fixed-frequency, step-down DC-DC converter. The SMPS provides all the active functions for local DC-DC conversion with fast transient response and accurate regulation.
) that is in the
DD
During normal operation of the buck power stage, Q1 is repeatedly switched on and off with the on and off times governed by the control circuit. This switching action causes a train of pulses at the LX node which are filtered by the L/C output filter to produce a DC output voltage, V
. Figure 4-1 depicts the functional block
O
diagram of the SMPS.

FIGURE 4-1: SMPS Functional Block Diagram.

The SMPS is designed to operate in Discontinuous Conduction Mode (DCM) with Voltage mode control and current-limit protection. The SMPS is capable of supplying 750 mW of power to an external load at a fixed switching frequency of 460 kHz with an input voltage of 6V. The output of the SMPS is power-limited. For a programmed output voltage of 3V, the SMPS will be capable of supplying 250 mA to an external load. An external diode is required between the LX pin and ground. The diode will be required to handle the inductor current when the switch is off. The diode is external to the device to reduce substrate currents and power dissipation caused by the switcher. The external diode carries the current during the switch-off time, eliminating the current path back through the device.
2014 Microchip Technology Inc. DS20005339A-page 29
MCP8025/6
L
MAX
VO1
V
O
V
IN
--------


T
2I
OCRIT
----------------------------------------------
The SMPS enters Pulse Frequency Modulation (PFM) mode at light loads, improving efficiency at the expense of higher output voltage ripple. The PFM circuitry provides a means to disable the SMPS as well. If the SMPS is not utilized in the application, connecting the feedback pin (FB) to an external supply (2.5V to 5.5V) will force the SMPS to a shutdown state.
The maximum inductor value for operation in Discontinuous Conduction mode can be determined by using Equation 4-1.
EQUATION 4-1: L
Using the L
inductor value calculated using
MAX
SIMPLIFIED
MAX
Equation 4-1 will ensure Discontinuous Conduction
mode operation for output load currents below the critical current level, I
. For example, with an
O(CRIT)
output voltage of +5V, a standard inductor value of
4.7 µH will ensure Discontinuous Conduction mode operation with an input voltage of 6V, a switching frequency of 468 kHz and a critical load current of 150 mA.
The output voltage is set by using a resistor divider network. The resistor divider is connected between the inductor output and ground. The divider common point is connected to the FB pin which is then compared to an internal 1.25V reference voltage.
The buck regulator will set the BIOCPW bit in the STAT0 register and send a STATUS_0 message to the host whenever the input switching current exceeds 2.5A peak (typical). The bit will be cleared when the peak input switching current drops back below the 2.5A (typical) limit. This is a warning bit only, no action is taken to shut down the buck operation. The overcurrent limit will shorten the buck duty cycle and therefore limit the maximum power out of the buck regulator.
The buck regulator will set the BUVLOW bit in the STAT0 register and send a STATUS_0 message to the host whenever the output voltage drops below 90% of the rated output voltage. The bit will be cleared when the output voltage returns to 94% of the rated value.
If the buck regulator output voltage falls below 80% of rated output voltage, the device will shut down with a Buck Undervoltage Lockout Fault. The BUVLOF bit in the STAT0 register will be set and a STATUS_0 message will be sent to the host. The ILIMIT_OUT signal will transition low to indicate the fault.
The Voltage Supervisor is designed to shut down the buck regulator when V
rises above AOVLO
DD
STOP
When shutting down the buck regulator is not desirable, the user should add a voltage suppression device to the V rising above AOVLO
input in order to prevent VDD from
DD
STOP
.
The Voltage Supervisor is also designed to shut down the buck regulator when V UVLO
BK_STOP
.
falls below
DD
The device will set the BUVLOF bit in the STAT0 register and send a STATUS_0 message to the host when the buck input voltage drops below UVLO
BK_STOP
.
Table 4-1 shows the faults that will disable the buck
regulator.
4.1.4 CHARGE PUMP
An unregulated charge pump is utilized to boost the input to the +12V LDO during low input conditions. When the input bias to the device (VDD) drops below CP activated, 2 x V
, the charge pump is activated. When
START
is presented to the input of the +12V
DD
LDO, which maintains a minimum of +10V at its output.
The typical charge pump flying capacitor is a 0.1 µF to
1.0 µF ceramic capacitor.
4.1.5 SUPERVISOR
The bias generator incorporates a voltage supervisor and a temperature supervisor.
4.1.5.1 Brown Out - Configuration Lost
When the device first powers up or when VDD drops below 3.8V, the brown-out reset warning flag bit (BORW) in the STAT1 register will be set. The bit is only a warning indicating that the contents of the configura­tion registers may have been compromised by a low supply voltage condition. The host processor should send new configuration information to the device.
4.1.5.2 Voltage Supervisor
The voltage supervisor protects the device, the external power MOSFETs and the external microcontroller from damage caused by overvoltage or undervoltage of the input supply, V
In the event of an undervoltage condition
< +5.5V) or an overvoltage condition of the
(V
DD
MCP8025 device (V
> +20V), the motor drivers are
DD
switched off. The bias generator, the communication port and the remainder of the motor control unit remain active. The failure state is flagged on the DE2 pin with a status message. In extreme overvoltage conditions
> +32V), all functions are turned off.
(V
DD
In the event of a severe undervoltage condition
< +4.0V), the buck regulator will be disabled. If
(V
DD
the set point of the buck regulator output voltage is above the buck undervoltage lockout value, the buck output voltage will decrease as V
.
4.1.5.3 Temperature Supervisor
An integrated temperature sensor self-protects the device circuitry. If the temperature rises above the overtemperature shutdown threshold, all functions are
.
DD
decreases.
DD
DS20005339A-page 30 2014 Microchip Technology Inc.
MCP8025/6
turned off. Active operation resumes when the temperature has cooled down below a set hysteresis value and the fault has been cleared by toggling CE.
It is desirable to signal the microcontroller with a warning message before the overtemperature threshold is reached. When the Thermal Warning Temperature set point is exceeded, a warning message will be sent to the host microcontroller. The
microcontroller should take appropriate actions to reduce the temperature rise. The method to signal the microcontroller is through the DE2 pin.
4.1.5.4 Internal Function Block Status
Table 4-1 shows the effects of the CE pin, the faults and
the Sleep bit upon the functional status of the internal blocks of the MCP8025/6.

TABLE 4-1: INTERNAL FUNCTION BLOCK STATUS

System State Fault Conditions
Sleep CE = 0, SLEEP = 1 ——W——— —
Standby
CE = 0, SLEEP = 0 AAR——A A
(MCP8025)
Standby
CE = 0, SLEEP = 0 —A A——A A
(MCP8026)
Operating CE = 1, I
Faults
CE = 1,
LIMIT_OUT = 0
I
Driver OTP T
VDD UVLO VIN 5.5V — A ——— A A
Buck Input UVLO VIN 4V ————— A A
Buck Output Brownout V
5V LDO UVLO V
BUCK
LIMIT_OUT = 1 AAAAAA A
>160°C ————— A A
J
< 80% (Brownout) A — — — A A
4V A A R A A A
OUT5
Driver OVLO (MCP8025) VIN 20V AAAA—A A
32V ————— A A
IN
<8V, V
<8V AAAA—A A
LS[A:C]
>EXTOC<1:0> settingAAAA—A A
Input>2.5A Peak AAAAAA A
<90% AAAAAA A
V
BUCK
>72% T
J
SD_MIN
Warnings
CE = 1,
LIMIT_OUT = 1
I
System OVLO V
MOSFET UVLO V
MOSFET OCP V
Buck OCP I
HS[A:C]
Drain-Source
BUCK
Buck Output
Undervoltage
Driver Temperature T
(115°C for 160°C Driver OTP)
Config Lost (BORW) Set at initial power-up
or when V
<UVLO
DD
BK_STOP
Legend: “A” = ACTIVE (ON), “—” = INACTIVE (OFF), “W” = WAKEUP (from Sleep), “R” = RECEIVER ONLY
OCP = Overcurrent Protection OTP = Overtemperature Protection UVLO = Undervoltage Lockout OVLO = Overvoltage Lockout
Buck
5V LDO
12V LDO
Motor Drivers
LIN, HV_IN1, HV_IN2
AAAAAA A
AAAAAA A
DE2
Internal
UVLO, OVLO, OTP
2014 Microchip Technology Inc. DS20005339A-page 31
MCP8025/6
NEUTRAL
AB
C++
3
--------------------------------------- -=

4.2 Motor Control Unit

The motor control unit is comprised of the following:
• External drive for a 3-phase bridge with NMOS/NMOS MOSFET pairs
• Back EMF sampler with phase multiplexer and
neutral simulator (MCP8025)
• Motor current sense amplifier and comparator
• Two additional current sense amplifiers
(MCP8026)
4.2.1 MOTOR CURRENT SENSE
CIRCUITRY
The internal motor current sense circuitry consists of an operational amplifier and a comparator. The amplifier output is presented to the inverting comparator input and as an output to the microcontroller. The non-inverting comparator input is connected to an internally programmable 8-bit DAC. A selectable motor current limit threshold may be set with a SET_ILIMIT message from the host to the MCP8025/6 via the DE2 communication link. The DACREF<7:0> bits in the CFG1 register contain the DAC current reference value. The dual-purpose ILIMIT_OUT current limit output as well as system fault outputs. The 8-bit DAC is powered by the 5V supply. The DAC output voltage ranges from 0.991V to 4.503V. The DAC has a bit value of (4.503V – 0.991V)/(2
1) = 13.77 mV/bit. A DAC input of 00H yields a DAC output voltage of 0.991V. The default power-up DAC value is 40H (1.872V). The DAC uses a 100 kHz filter. Input code to output voltage delay is approximately five time constants ~= 50 µs. The desired current sense gain is established with an external resistor network.
Note: The motor current limit comparator output
is internally ‘OR’d with the DRIVER FAULT output of the driver logic block. The microcontroller should monitor the comparator output and take appropriate actions. The motor current limit comparator circuitry does not disable the motor drivers when an overcurrent situation occurs. Only one current limit comparator is provided. The MCP8026 provides three current sense amplifiers which can be used for implementation of advanced control algorithms, such as Field-Oriented Control (FOC).
The comparator output may be employed as a current limit. Alternatively, the current sense output can be employed in a chop-chop PWM speed loop for any situations where the motor is being accelerated, either positively or negatively. An analog chop-chop speed loop can be implemented by hysteretic control or fixed off-time of the motor current. This makes for a very robust controller, as the motor current is always in instantaneous control.
pin handles the
8
A sense resistor in series with the bridge ground return provides a current signal for both feedback and current limiting. This resistor should be non-inductive to minimize ringing from high di/dt. Any inductance in the power circuit represents potential problems in the form of additional voltage stress and ringing, as well as increasing switching times. While impractical to eliminate, careful layout and bypassing will minimize these effects. The output stage should be as compact as heat sinking will allow, with wide, short traces carrying all pulsed currents. Each half-bridge should be separately bypassed with a low ESR/ESL capacitor, decoupling it from the rest of the circuit. Some layouts will allow the input filter capacitor to be split into three smaller values and serve double duty as the half-bridge bypass capacitors.
Note: With a chop-chop control, motor current
always flows through the sense resistor. When the PWM is off, however, the flyback diodes or synchronous rectifiers conduct, causing the current to reverse polarity through the sense resistor.
The current sense resistor is chosen to establish the peak current limit threshold, which is typically set 20% higher than the maximum current command level to provide overcurrent protection during abnormal
conditions. Under normal circumstances with a properly compensated current loop, peak current limit will not be exercised.
The current sense operational amplifier is disabled when CE = 0.
4.2.2 BACK EMF SAMPLER WITH PHASE MULTIPLEXER AND NEUTRAL
SIMULATOR (MCP8025)
The commutation loop of a BLDC motor control is a phase locked loop (PLL), which locks to the rotor’s position. Note that this inner loop does not attempt to modify the position of the rotor, but modifies the commutation times to match whatever position the rotor has. An outer speed loop changes the rotor velocity and the commutation loop locks to the rotor’s position to commutate the phases at the correct times.
The back EMF sensor consists of the motor, a back EMF sampler, a phase multiplexer and a neutral simulator.
The back EMF sampler takes the motor phase voltages and calculates the neutral point of the motor by using
Equation 4-2.

EQUATION 4-2: NEUTRAL POINT

DS20005339A-page 32 2014 Microchip Technology Inc.
MCP8025/6
This allows the microcontroller to compare the back EMF signal to the motor’s neutral point without the need to bring out an extra wire on a WYE wound motor. For DELTA wound motors, there is no physical neutral to bring out, so this reference point must be calculated in any case.
The back EMF sampler measures the motor phase that is not driven, i.e. if LSA and HSB are on, then phase A is driven low, phase B is driven high and phase C is sampled. The sampled phase provides a back EMF signal that is compared against the neutral of the motor. The sampler is controlled by the microcontroller via the MUX1 and MUX2 input signals.
When the BEMF signal crosses the neutral point, the zero-crossing detector will switch the ZC_OUT signal. The host controller may use this signal as a 30 degrees-before-commutation reference point. The host controller must commutate the system after 30 degrees of electrical rotation have occurred. Different motor control scenarios may increase or decrease the commutation point by a few degrees.
Internal filtering capacitors are connected after the phase voltage dividers to help eliminate transients during the zero-crossing detection.

T ABLE 4-2: PHASE SAMPLER

MUX
Phase Sampled
MUX2 MUX1
0 0 PHASE A
0 1 PHASE B
1 0 PHASE C
1 1 PHASE C
The neutral simulator may be disabled when access to the motor winding neutral point is available. When disabling the neutral simulator, the motor neutral is connected directly to the COMP_REF pin. The actual motor neutral is then used for zero-crossing detection. The neutral simulator may be disabled via DE2 communications.
4.2.3 MOTOR CONTROL
The commutation loop of a BLDC motor control is a phase lock loop (PLL) which locks to the rotor’s position. Note that this inner loop does not attempt to modify the position of the rotor, but modifies the commutation times to match whatever position the rotor has. An outer speed loop changes the rotor velocity and the commutation loop locks to the rotor’s position to commutate the phases at the correct times.
4.2.3.1 Sensorless Motor Control
Many control algorithms can be implemented with the MCP8025/6 in conjunction with a microcontroller. The following discussion provides a starting point for implementing the MCP8025 or MCP8026 in a sensorless control application of a 3-phase motor. The motor is driven by energizing two windings at a time and sequencing the windings in a six-step-per-electrical-revolution method. This method leaves one winding unenergized at all times and the voltage (Back EMF or BEMF) on that unenergized winding can be monitored to determine the rotor position.
4.2.3.2 Start-Up Sequence
When the motor being driven is at rest, the BEMF voltage is equal to zero. The motor needs to be rotating for the BEMF sensor to lock onto the rotor position and commutate the motor. The recommended start-up sequence is to bring the rotor from rest up to a speed fast enough to allow BEMF sensing. Motor operation is comprised of five modes: Disabled mode, Bootstrap mode, Lock or Align mode, Ramp mode and Run mode. Refer to the commutation state machine in
Table 4-3. The order in which the microcontroller steps
through the commutation state machine determines the direction the motor rotates.
Disabled Mode (CE = 0)
When the driver is disabled (CE = 0), all of the MOSFET driver outputs are set low.
Bootstrap Mode
The high-side driver obtains the high-side biasing voltage from the 12V LDO, the bootstrap diode and the bootstrap capacitor. The bootstrap capacitors must first be charged before the high-side drives may be used. The bootstrap capacitors are all charged by activating all three low-side drivers. The active low-side drivers pull their respective phase nodes low, charging the bootstrap capacitors to the 12V LDO voltage. The three low-side drivers should be active for at least 1.2 ms per 1 µf of bootstrap capacitance. This assumes a 12V voltage change and 30 mA (10 mA per phase) of current coming from the 12V LDO.
Lock Mode
Before the motor can be started, the rotor should be in a known position. In Lock mode, the microcontroller drives phase B low and phases A and C high. This aligns the rotor 30 electrical degrees before the center of the first commutation state. Lock mode must last long enough to allow the motor and its load to settle into this position.
2014 Microchip Technology Inc. DS20005339A-page 33
MCP8025/6
Ramp Mode
At the end of the Lock mode, Ramp mode is entered. In Ramp mode, the microcontroller steps through the commutation state machine, increasing linearly, until a minimum speed is reached. Ramp mode is an open-loop commutation. No knowledge of the rotor position is used.
Run Mode
At the end of Ramp mode, Run mode is entered. In Run mode, the back EMF sensor is enabled and commutation is now under the control of the phase lock loop. Motor speed can be regulated by an outer speed control loop.

TABLE 4-3: COMMUTATION STATE MACHINE

State
HSA HSB HSC LSA LSB LSC
CE = 0 OFF OFF OFF OFF OFF OFF N/A
BOOTSTRAP OFF OFF OFF ON ON ON N/A
LOCK ON OFF ON OFF ON OFF N/A
1 ON OFF OFF OFF OFF ON Phase B 2 OFF ON OFF OFF OFF ON Phase A 3 OFF ON OFF ON OFF OFF Phase C 4 OFF OFF ON ON OFF OFF Phase B 5 OFF OFF ON OFF ON OFF Phase A 6 ON OFF OFF OFF ON OFF Phase C
4.2.3.3 PWM Speed Control
The inner commutation loop is a phase-lock loop, which locks to the rotor’s position. This inner loop does not attempt to modify the position of the rotor, but modifies the commutation times to match whatever position the rotor has. The outer speed loop changes the rotor velocity and the inner commutation loop locks to the rotor’s position to commutate the phase at the correct times.
The outer speed loop pulse width modulates the motor drive inverter to produce the desired wave shape and voltage at the motor. The inductance of the motor then integrates this pulse-width modulation (PWM) pattern to produce the desired average current, thus controlling the desired torque and speed of the motor. For a trapezoidal BLDC motor drive with six-step commutation, the PWM is used to generate the average voltage to produce the desired motor current and motor speed.
There are two basic methods to pulse-width modulate the inverter switches. The first method returns the reactive energy in the motor inductance to the source by reversing the voltage on the motor winding during the current decay period. This method is referred to as fast decay or chop-chop. The second method circulates the reactive current in the motor with minimal voltage applied to the inductance. This method is referred to as slow decay or chop-coast.
Outputs
The preferred control method employs a chop-chop PWM for any situation where the motor is being accelerated, either positively or negatively. For improved efficiency, chop-coast PWM is employed during steady-state conditions. The chop-chop speed loop is implemented by hysteretic control, fixed off-time control or average current mode control of the motor current. This makes for a very robust controller, as the motor current is always in instantaneous control.
The motor speed presented to the chop-chop loop is reduced by approximately 9%. A fixed-frequency PWM that only modulates the high-side switches implements the chop-coast loop. The chop-coast loop is presented with the full motor speed, so, if it is able to control the speed, the chop-chop loop will never be satisfied and will remain saturated. The chop-chop remains able to assume full control if the motor torque is exceeded, either through a load change or a change in speed that produces acceleration torque. The chop-coast loop will remain saturated, with the chop-chop loop in full control, during start-up and acceleration to full speed. The bandwidth of the chop-coast loop is set to be slower than the chop-chop loop so that any transients will be handled by the chop-chop loop and the chop-coast loop will only be active in steady-state operation.
BEMF Phase
DS20005339A-page 34 2014 Microchip Technology Inc.
MCP8025/6
4.2.4 EXTERNAL DRIVE FOR A 3-PHASE BRIDGE WITH NMOS/NMOS MOSFET PAIRS
Each motor phase is driven with external NMOS/NMOS MOSFET pairs. These are controlled by a low-side and a high-side gate driver. The gate drivers are controlled directly by the digital input pins PWM[1:3]H/L. A logic high turns the associated gate driver ON and a logic low turns the associated gate driver OFF. The PWM[1:3]H/L digital inputs are equipped with internal pull-down resistors.
The low-side gate drivers are biased by the +12V LDO output, referenced to ground. The high-side gate drivers are a floating drive biased by a bootstrap capacitor circuit. The bootstrap capacitor is charged by the +12V LDO whenever the accompanying low-side MOSFET is turned on.
The high-side and low-side driver outputs all go to a low state whenever there is a fault or when CE = 0, regardless of the PWM[1:3]H/L inputs.
4.2.4.1 MOSFET Driver External Protection
Features
Each driver is equipped with Undervoltage Lockout (UVLO) and short circuit protection features.
4.2.4.1.1 MOSFET Driver Undervoltage Lockout
(UVLO)
The MOSFET UVLO fault detection monitors the available voltage used to drive the external MOSFET gates. The fault detection is only active while the driver is actively driving the external MOSFET gate. Anytime the driver bias voltage is below the Driver Undervoltage Lockout (D one specified by the t not turn ON when commanded ON. A driver fault will be indicated to the host microcontroller on the ILIMIT_OUT communication Status_1 message. This is a latched fault. Clearing the fault requires either removal of device power or disabling and re-enabling the device via the device enable input (CE). The EXTUVLO bit in the CFG0 register is used to enable or disable the Driver Undervoltage Lockout feature. This protection feature prevents the external MOSFETs from being controlled with a gate voltage not suitable to fully enhance the device.
) threshold for a period longer than the
UVLO
open-drain output pin and also via a DE2
parameter, the driver will
DUVLO
4.2.4.1.2 External MOSFET Short Circuit Current
Short circuit protection monitors the voltage across the external MOSFETs during an ON condition. The high-side driver voltage is measured from V PH[1:3]. The low-side driver voltage is measured from PH[1:3] to ground. If the voltage rises above a user-configurable threshold after the external MOSFET gate voltage has been driven high, all drivers will be turned OFF. A driver fault will be indicated to the host microcontroller on the open-drain ILIMIT_OUT pin and also via a DE2 communication Status_1 message. This is a latched fault. Clearing the fault requires either removal of device power or disabling and re-enabling the device via the device enable input (CE). This protection feature helps detect internal motor failures such as winding to case shorts.
Note: The driver short circuit protection is
dependent on application parameters. A configuration message is provided for a set number of threshold levels. The MOSFET Driver UVLO and short circuit protection features have the option to be disabled.
The short circuit voltage may be set via a DE2 Set_Cfg_0 message. The EXTOC<1:0> bits in the CFG0 register are used to select the voltage level for the short circuit comparison. If the voltage across the MOSFET drain-source terminals exceeds the selected voltage level when the MOSFET is active, a fault will be triggered. The selectable voltage levels are 250 mV, 500 mV, 750 mV and 1000 mV. The EXTSC bit in the CFG0 register is used to enable or disable the MOSFET driver short circuit detection.
4.2.4.1.3 Fault Pin Output (ILIMIT_OUT
The dual purpose ILIMIT_OUT pin is used as a fault indicator and as an overcurrent indicator when used with the internal DAC. The pin is capable of sinking a minimum of 1 mA of current while maintaining less than 50 mV of voltage across the output. An external pull-up resistor to the logic supply is required.
The open-drain ILIMIT_OUT fault occurs. Table 4-4 lists the faults that activate the ILIMIT_OUT signal. Warnings do not activate the ILIMIT_OUT
signal. Table 4-5 lists the warnings.
pin transitions low when a
)
to
DD
output
2014 Microchip Technology Inc. DS20005339A-page 35
MCP8025/6

TABLE 4-4: ILIMIT_OUT FAULTS

Fault DE2 Register
Overtemperature 0x85 0x02
Device Input Undervoltage 0x85 0x04
Driver Input Overvoltage 0x85 0x08
Device Input Overvoltage 0x85 0x10
Buck Regulator Output Undervoltage 0x85 0x80
External MOSFET Undervoltage Lockout
External MOSFET Overcurrent Detection
5V LDO Undervoltage Lockout 0x86 0x20
0x86 0x04
0x86 0x08

TABLE 4-5: WARNINGS

Fault DE2 Register
Temperature Warning 0x85 0x01
Buck Regulator Overcurrent 0x85 0x20
Buck Regulator Undervoltage 0x85 0x40
Brownout – Configuration Lost 0x86 0x10
4.2.4.2 Gate Control Logic
The gate control logic provides level shifting of the digital inputs, polarity control and cross conduction protection.
4.2.4.2.1 Cross Conduction Protection
Logic prevents switching ON one power MOSFET while the opposite one in the same half-bridge is already switched ON. If both MOSFETs in the same half-bridge are commanded ON simultaneously by the digital inputs, both will be turned OFF.
4.2.4.2.2 Programmable Dead Time
The gate control logic employs a break-before-make dead-time delay that is programmable. A configuration message is provided to configure the driver dead time. The programmable dead times range from 250 ns to 2000 ns (default) in 250 ns increments. The dead time allows the PWM inputs to be direct inversions of each other and still allow proper motor operation. The dead time internally modifies the PWMH/L gate drive timing to prevent cross conduction. The DRVDT<2:0> bits in the CFG2 register are used to set the dead time value.
4.2.4.2.3 Programmable Blanking Time
A configuration message is provided to configure the driver current limit blanking time. The blanking time allows the system to ignore any current spikes that may occur when switching the driver outputs. The allowable blanking times are 500 ns, 1 µs, 2 µs and 4 µs (default). The blanking time will start after the dead time circuitry has timed out. The DRVBT<1:0> bits in the CFG2 register are used to set the blanking time value.
The blanking time affects the driver undervoltage lockout. The driver undervoltage lockout latches the external MOSFET undervoltage lockout fault if the undervoltage condition lasts longer than the time specified by the t parameter takes into account the blanking time if blanking is in progress.
parameter. The t
DUVLO
DUVLO

4.3 Chip Enable (CE)

The Chip Enable (CE) pin allows the device to be disabled by external control. The Chip Enable pin has four modes of operation.
4.3.1 FAULT CLEARING STATE
The CE pin is used to clear any faults and re-enable the driver. After toggling the CE pin low to high, the system requires a minimum time period to re-enable and start up all the driver blocks. The start-up time is approximately 35 μs. The maximum pulse time for the high-low-high transition to clear faults should be less than 1 ms. If the high-low-high transition is longer than 1 ms, the device will start up from the Standby state.
Any fault status bits that are set will be cleared by the low-to-high transition of the CE pin if, and only if, the fault condition has ceased to exist. If the fault condition still exists, the active fault status bit will remain active. No additional fault messages will be sent for a fault that remains active.
4.3.2 WAKE FROM SLEEP MODE
The CE pin is also used to awaken the device from the Sleep mode state. To wake the device from a Sleep mode state, the CE pin must be set low for a minimum of 250 μs. The device will then wake up with the next rising edge of the CE pin.
The LIN bus may be used to wake the device from the Sleep mode state. When a LIN wake-up event is detected on the LIN_BUS pin, the device will wake up. The MCP8025 will wake up on the rising edge of the bus after detecting a dominate state lasting > 150 µs on the bus. The LIN Bus master must provide the dominate state for > 250 µs to meet the LIN 2.2A specifications.
The HV_IN1 pin may be used to wake the device from the Sleep mode state. The MCP8026 will wake up on the rising edge of the pin after detecting a low state lasting > 250 µs on the pin.
DS20005339A-page 36 2014 Microchip Technology Inc.
MCP8025/6
4.3.3 STANDBY STATE
Standby state is entered when the CE pin goes low for longer than 1 ms and the Sleep configuration bit is inactive. When Standby mode is entered, the following subsystems are disabled:
• high-side gate drives (HSA, HSB, HSC), forced
low
• low-side gate drives (LSA, LSB, LSC), forced low
•12V LDO
•5V LDO (MCP8026)
• the 30 k pull-up resistor connected to the level
translator is switched out of the circuit to minimize
current consumption (configurable) (MCP8026)
• the 30 k pull-up resistor connected to the LIN
Bus is switched out of the circuit to minimize
current consumption (configurable) (MCP8025)
The buck regulator stays enabled. The DE2 communication port remains active but the port may only respond to commands. When CE is inactive, the DE2 port is prevented from initiating communications in order to conserve power.
The total current consumption of the device when CE is inactive (device disabled) stays within the Standby mode input quiescent current limits specified in the
AC/DC Characteristics table.
4.3.4 SLEEP MODE
Sleep mode is entered when both a SLEEP command is sent to the device via DE2 communication and the CE pin is low. The two conditions may occur in any order. The transition to Sleep mode occurs after the last of the two conditions occurs and the t has elapsed. The SLEEP bit in the CFG0 configuration register indicates when the device should transition to a low-power mode. The device will operate normally until the CE pin is transitioned low by an external device. At that point in time, the SLEEP bit value determines whether the device transitions to Standby mode or low-power Sleep mode. The quiescent current during Sleep mode will typically be 5 μA. When Sleep mode is activated, most functions will be shut off, including the buck regulator. Only the power-on reset monitor, the voltage translators and the minimal state machine will remain active to detect a wake-up event. This indicates that the host processor will be shut down if the host is using the buck regulator for power. The device will stay in the low-power Sleep mode until either of the following conditions is met:
• The CE pin is toggled low for a minimum of 250 μs
and then transitioned high.
• The LIN_BUS pin receives a LIN wake-up event.
The wake-up event must last at least 250 µs, per LIN
Standard 2.2A. (MCP8025)
• The HV_IN1 pin transitions high after being in a low
state lasting longer than 250 µs. (MCP8026)
SLEEP
delay time
The MCP8025/6 devices are not required to retain configuration data while in Sleep mode. Sleep mode will set the BORW bit. When exiting Sleep mode, the host should send a new configuration message to configure the device if the default configuration values are not desired. The same configuration sequence used during power-up may be used when exiting Sleep mode. Sleep mode will not be entered if there is a fault active that will affect the buck regulator output voltage. This prevents a transition to Sleep mode when the host is powered by the buck regulator and the regulator is in an unreliable state.

4.4 Communication Ports

The communication ports provide a means of communicating to the host system.
4.4.1 LIN BUS TRANSCEIVER (MCP8025)
The MCP8025 provides a physical interface between a microcontroller and a LIN half-duplex bus. It is intended for automotive and industrial applications with serial bus speeds up to 20 kilobaud. The MCP8025 provides a half-duplex, bidirectional communication interface between a microcontroller and the serial network bus. This device will translate the CMOS/TTL logic levels to LIN level logic and vice versa.
The LIN Bus transceiver circuit provides a LIN Bus-compliant interface between the LIN Bus and a LIN-capable UART on an external microcontroller. The LIN Bus transceiver is load dump protected and conforms to LIN 2.1.
4.4.1.1 LIN Wake-Up
A LIN wake-up event may be used to wake up the MCP8025 from Sleep mode. The MCP8025 will wake up on the rising edge of the LIN bus after detecting a dominate state lasting > 150 µs on the LIN_BUS pin. The LIN Bus master must provide the dominate state for > 250 µs to meet the LIN 2.2A and SAE J2602.
4.4.1.2 FAULT/TXE (MCP8025)
The FAULT/TXE pin is a bidirectional open-drain output pin. The state of the pin is defined in Tab le 4- 6. Whenever the FAULT transmitter is off. The transmitter may be re-enabled whenever the FAULT/TXE signal returns high, either by removing the internal fault condition or by the host returning the FAULT
The FAULT between the TX input and the LIN_BUS level. This may be used to detect a bus contention.
/TXE will go low when there is a mismatch
/TXE signal is low, the LIN
/TXE high.
2014 Microchip Technology Inc. DS20005339A-page 37
MCP8025/6
The FAULT/TXE pin will go low whenever the internal circuits have detected a short circuit and have disabled the LIN_BUS output driver. The MCP8025 limits the transmitter current to less than 200 mA when a short circuit is detected. If the host MCU is driving the
/TXE pin high, then the transmitter will remain
FAU LT enabled and the fault condition will be overruled. If the host MCU is driving the pin low or is in Hi-Z mode, the MCP8025 will drive the pin low and will disable the LIN transmitter.
4.4.1.3 LIN Dominant State Timeout
The MCP8025 has an additional LIN feature, LIN Dominant State Timeout, that is not in the current LIN
2.0 specification. If the LIN TX pin is externally held low for more than the time specified by t MCP8025 will disable the LIN transmitter. The
/TXE pin will go low, indicating a LIN Dominant
FAULT State Timeout fault. Forcing the FAULT will not re-enable the transmitter. The transmitter will stay disabled until the TX pin is set high again. This prevents the LIN transceiver from inadvertently locking up the bus.

TABLE 4-6: FAULT/TXE TRUTH TABLE

FAULT/TXE
TX
In
LH V
LH V
HH V
HL GNDHi-Z, HHOK, data is being received from the LIN_Bus LL GNDHi-Z, HHOK
L L GND
xx V
Legend:x = don’t care Note 1: The FAULT
RX
Out
reporting during bus propagation delays.
LIN_BUS
I/O
DD
DD
DD
V
DD
/TXE is valid approximately 25 µs after the TXD falling edge. This helps eliminate false fault
External
Input
Hi-Z L FAULT, TX driven low, LIN_BUS shorted to V
HLFAULT, Overridden by CPU driving FAULT/TXE high
Hi-Z, H H OK
Hi-Z, H L FAULT, if TX is low longer than t
DD
LxNO FAULT, the CPU is commanding the transceiver to
Driven Output
Definition
DOM_TOUT
turn off the transmitter driver
DOM_TOUT
/TXE pin high
DD
, the
(Note 1)
4.4.2 LEVEL TRANSLATOR (MCP8026)
The level translators are an interface between the companion microcontroller’s logic levels and the input voltage levels from the system. Automotive applications typically drive the inputs from the Engine Control Unit (ECU) and the ignition key on/off signals. The level translators are unidirectional translators. Signals on the high-voltage input are translated to low-voltage signals on the low-voltage outputs. The high-voltage HV_IN[1:2] inputs have a configurable 30 k pull up. The pull up is configured via a SET_CFG_0 message. The PU30K bit in the CFG0 register controls the state of the pull up. The bit may only be changed when the CE pin is active. The low-voltage LV_OUT[1:2] outputs are open-drain outputs. The outputs are capable of sinking a minimum of 1 mA of current while maintaining less than 50 mV at the output.
The HV_IN1 translator is also used to wake up the device from the Sleep mode whenever the HV_IN1 input is transitioned to a low level for a minimum of 250 µs followed by a transition to the high voltage level.
Note: The TQFP package has two level
translators. The second level translator typically interfaces to an Ignition Key on/off signal.
DS20005339A-page 38 2014 Microchip Technology Inc.
MCP8025/6
4.4.3 DE2 COMMUNICATIONS PORT
A half-duplex 9600 baud UART interface is available to communicate with an external host. The port is used to configure the MCP8025/6 and also for status and fault messages. The DE2 communication port is described
in detail in Section 4.4.3.1 “Communication
Interface”.
4.4.3.1 Communication Interface
A single-wire, half-duplex, 9600 baud, 8-bit bidirectional communication interface is implemented using the open-drain DE2 pin. The interface consists of eight data bits, one Stop bit and one Start bit. The implementation of the interface is described in the following sections.
The DE2 interface is an open-drain interface. The open-drain output is capable of sinking a minimum of 1 mA of current while maintaining less than 50 mV at the output.
A 5 k resistor should typically be used between the host transmit pin and the MCP8025/6 DE2 pin to allow the MCP8025/6 to drive the DE2 line when the host TX pin is at an idle high level.
The DE2 communication is active when CE = 0 with the constraint that the MCP8025/6 devices will not initiate any messages. The host processor may initiate messages regardless of the state of the CE pin when the device is not in Sleep mode. The MCP8025/6 devices will respond to host commands when the CE pin is low. The time from receiving the last bit of a command message to sending the first bit of the response message ranges from DE2 corresponding to 0 µs to 3.125 ms.
RSP
to DE2
WAIT
4.4.3.3 Packet Timing
While no data is being transmitted, a logic ‘1’ must be placed on the open-drain DE2 line by an external pull-up resistor. A data packet is composed of one Start bit, which is always a logic ‘0’, followed by eight data bits and a Stop bit. The Stop bit must always be a logic ‘1’. It takes 10 bits to transmit a byte of data.
The device detects the Start bit by detecting the transition from logic 1 to logic 0 (note that, while the data line is idle, the logic level is high). Once the Start bit is detected, the next data bit’s “center” can be assured to be 24 ticks minus 2 (worst case synchronizer uncertainty) later. From then on, every
next data bit center is 16 clock ticks later. Figure 4-3
illustrates this point.
4.4.3.4 Message Handling
The driver will not transition to Standby mode or Sleep mode while a message is being received. If a message arrives before the CE = 0 to Standby (or Sleep) mode transition delay, t driver will wait until the on-going message is completed before changing modes.
STANDBY
(or t
), times out, the
SLEEP
4.4.3.2 Packet Format
Every internal status change will provide a communication to the microcontroller. The interface uses a standard UART baud rate of 9600 bits per second.
In the DE2 protocol, the transmitter and the receiver do not share a clock signal. A clock signal does not emanate from one transmitter to the other receiver. Due to this reason, the protocol is asynchronous. The protocol uses only one line to communicate, so the transmit/receive packet must be done in Half-Duplex mode. A new transmit message is allowed only when a complete packet has been transmitted.
The host must listen to the DE2 line in order to check for contentions. In case of contention, the host must release the line and wait for at least three packet-length times before initiating a new transfer.
Figure 4-2 illustrates a basic DE2 data packet.
2014 Microchip Technology Inc. DS20005339A-page 39
MCP8025/6
STOP
STARTDE2
Message Format
B
0
B
1
B
2
B
3
B
4
B
5
B
6
B
7
STOP
START
B
0
B
1
B
2
B
3
B
4
B
5
B
6
B
7
T
START
= 1.5T – uncertainty on start
Detection (worse case: 2x T
S
)
T
S
= T/16 (oversampled bit-cell period)
Receiver samples the incoming data
using x16 baud rate clock
Sample incoming data at the bit-cell center
T
S
T
START
T
T = 1/Baud Rate (bit-cell period)
Detect start bit by sensing transition from logic 1 to logic 0
worst

FIGURE 4-2: DE2 Packet Format.

FIGURE 4-3: DE2 Packet Timing.

4.4.4 MESSAGING INTERFACE
A command byte will always have the most significant bit 7 (msb) set to ‘1’. Bits 6 and 5 are reserved for future use and should be set to ‘0’. Bits 4 – 0 are used for commands. That allows for 32 possible commands.
4.4.4.1 Host to MCP8025/6
Messages sent from the host to the MCP8025/6 devices consist of either one or two eight-bit bytes. The first byte transmitted is the command byte. The second byte transmitted, if required, is the data for the command.
If a multi-byte command is sent to the MCP8025/6 devices and no second byte is received by the MCP8025/6 devices, then a “Command Not Acknowledged” message will be sent back to the host after a 5 ms timeout period.
4.4.4.2 MCP8025/6 to Host
A solicited response byte from the MCP8025/6 devices will always echo the command byte with bit 7 set to ‘0’ (Response) and with bit 6 set to ‘1’ for Acknowledged (ACK) or ‘0’ for Not Acknowledged (NACK). The second byte, if required, will be the data for the host command. Any command that causes an error or is not supported will receive a NACK response.
The MCP8025/6 devices may send unsolicited command messages to the host controller. No message to the host controller requires a response from the host controller.
DS20005339A-page 40 2014 Microchip Technology Inc.
MCP8025/6
4.4.5 MESSAGES
4.4.5.1
There is a SET_CFG_0 message that is sent by the host to the MCP8025/6 devices to configure the devices. The SET_CFG_0 message may be sent to the device at any time. The host is responsible for making sure the system is in a state that will not be compromised by sending the SET_CFG_0 message. The SET_CFG_0 message format is indicated in
Table 4-7. The response is indicated in Table 4-8.
SET_CFG_0
4.4.5.2 GET_CFG_0
There is a GET_CFG_0 message that is sent by the host to the MCP8025/6 devices to retrieve the device configuration register. The GET_CFG_0 message format is indicated in Tab le 4- 7. The response is indicated in Tab le 4- 8.
4.4.5.3 STATUS_0 and STATUS_1
There are STATUS_0 and STATUS_1 messages that are sent by the host to the MCP8025/6 devices to retrieve the device STAT0 or STAT1 register. Unsolicited STATUS_0 and STATUS_1 messages may also be sent to the host by the MCP8025/6 devices to inform the host of status changes. The unsolicited STATUS_0 and STATUS_1 messages will only be sent when a status bit changes to an active state. STATUS_0 and STATUS_1 message format is indicated in Tab le 4 -7 . The response is indicated in
Table 4-8.
When a STATUS_0 or STATUS_1 message is sent to the host in response to a new fault becoming active, the fault bit will be cleared either by the host issuing a STATUS_0 or STATUS_1 request message or by the host toggling the CE pin low then high. The fault bit will stay active and not be cleared if the fault condition still exists at the time the host attempted to clear the fault.
The BORW bit in the STAT1 register will be set every time the device restarts due to a brown-out event, a Sleep mode wake-up or a normal power-up. When the bit is set, a single unsolicited message will be sent to the host indicating a voltage brown-out or power-up has taken place and that the configuration data may have been lost. The flag is reset by a “Status 1 Ack” (01000110 (46H)) from the device in response to a Host Status Request command.
The
4.4.5.5 GET_CFG_1
There is a GET_CFG_1 message that is sent by the host to the MCP8025/6 devices to retrieve the motor current limit reference DAC configuration register. The GET_CFG_1 message format is indicated in Tab le 4 -7 . The response is indicated in Ta bl e 4 -8 .
4.4.5.6 SET_CFG_2
There is a SET_CFG_2 message that is sent by the host to the MCP8025/6 devices to configure the driver current limit blanking time. The SET_CFG_2 message may be sent to the device at any time. The host is responsible for making sure the system is in a state that will not be compromised by sending the SET_CFG_2 message. The SET_CFG_2 message format is indicated in Tab le 4 -7 . The response is indicated in
Table 4-8.
4.4.5.7 GET_CFG_2
There is a GET_CFG_2 message that is sent by the host to the MCP8025/6 devices to retrieve the device Configuration Register 2. The GET_CFG_2 message format is indicated in Tab le 4 -7 . The response is indicated in Ta bl e 4 -8 .
4.4.5.4 SET_CFG_1
There is a SET_CFG_1 message that is sent by the host to the MCP8025/6 devices to configure the motor current limit reference DAC. The SET_CFG_1 message may be sent to the device at any time. The host is responsible for making sure the system is in a state that will not be compromised by sending the SET_CFG_1 message. The SET_CFG_1 message format is indicated in Tab le 4 -7 . The response is indicated in
Table 4-8.
2014 Microchip Technology Inc. DS20005339A-page 41
MCP8025/6

TABLE 4-7: DE2 COMMUNICATION COMMANDS TO MCP8025/6 FROM HOST

Command Byte Bit Value Description
SET_CFG_0
GET_CFG_0 1 10000010 (82H) Get Configuration Register 0 SET_CFG_1 1 10000011 (83H) Set Configuration Register 1
GET_CFG_1 1 10000100 (84H) Get Configuration Register 1
STATUS_0 1 10000101 (85H) Get Status Register 0 STATUS_1 1 10000110 (86H) Get Status Register 1
SET_CFG_2 1 10000111 (87H) Set Configuration register 2
GET_CFG_2 1 10001000 (88H) Get Configuration Register 2
1 10000001b (81H) Set Configuration Register 0
27
6
5 0 System Enters Standby Mode when CE = 0
4
3
2
1:0
2 7:0 00H – FFH Select DAC Current Reference value.
27:5
4:2
1:0
0 Reserved
-- (Always ‘0’ in SLEEP mode) 0 Enable Disconnect of 30 k LIN Bus/Level Translator Pull Up when
CE =
0 (Default)
1 Disable Disconnect of 30 k LIN Bus/Level Translator Pull Up when
CE =
0
1
0 Disable Internal Neutral Simulator (Start-Up Default) 1 Enable Internal Neutral Simulator 0 Enable MOSFET Undervoltage Lockout (Start-Up Default) 1 Disable MOSFET Undervoltage Lockout 0 Enable External MOSFET Short Circuit Detection (Start-Up Default) 1 Disable External MOSFET Short Circuit Detection
00 Set External MOSFET Overcurrent Limit to 0.250V (Start-Up Default) 01 Set External MOSFET Overcurrent Limit to 0.500V 10 Set External MOSFET Overcurrent Limit to 0.750V 11 Set External MOSFET Overcurrent Limit to 1.000V
00H Reserved
Driver Dead Time (for PWMH/PWML inputs)
000 2000 ns (Default) 001 1750 ns 010 1500 ns 011 1250 ns 100 1000 ns 101 750 ns 110 500 ns 111 250 ns
Driver Blanking Time (Ignore Switching Current Spikes)
00 4 µs (Default) 01 2µs 10 1µs 11 500 ns
System Enters Sleep Mode when CE = 0, 30 k LIN Bus/Level Translator Pull Up Disconnect Always Enabled
DAC Motor Current Limit Reference Voltage
(4.503V – 0.991V)/255 = 13.77 mV/bit 00H = 0.991V 40H = 1.872V (40H x 0.1377 mV/bit + 0.991V) (Start-Up Default) FFH = 4.503V (FFH x 0.1377 mV/bit + 0.991V)
Get DAC Motor Current Limit Reference Voltage
DS20005339A-page 42 2014 Microchip Technology Inc.
MCP8025/6
TABLE 4-8: DE2 COMMUNICATION MESSAGES FROM MCP8025/6 TO HOST
MESSAGE BYTE BIT VALUE DESCRIPTION
SET_CFG_0 17:000000001 (01H) Set Configuration Register 0 Not Acknowledged (Response)
01000001 (41H) Set Configuration Register 0 Acknowledged (Response)
27 0 Reserved
6 Ignored in SLEEP mode
0 Enable Disconnect of 30K LIN Bus/Level Translator Pull Up when
CE = 0 (Default)
1 Disable Disconnect of 30K LIN Bus/Level Translator Pull Up when
CE = 0
5 0 System Enters Standby Mode when CE = 0
1 System Enters Sleep Mode when CE = 0, 30k LIN Bus/Level
Translator Pull Up Disconnect Always Enabled
4 0 Internal Neutral Simulator Disabled (Start-Up Default)
1 Internal Neutral Simulator Enabled
3 0 Undervoltage Lockout Enabled (Default)
1 Undervoltage Lockout Disabled
2 0 External MOSFET Overcurrent Detection Enabled (Default)
1 External MOSFET Overcurrent Detection Disabled
1:0 00 0.250V External MOSFET Overcurrent Limit (Default)
01 0.500V External MOSFET Overcurrent Limit 10 0.750V External MOSFET Overcurrent Limit 11 1.000V External MOSFET Overcurrent Limit
GET_CFG_0 17:000000010 (02H) Get Configuration Register 0 Response Not Acknowledged (Response)
01000010 (42H) Get Configuration Register 0 Response Acknowledged (Response)
27 0 Reserved
6 -- Ignored in SLEEP mode
0 Enable Disconnect of 30K LIN Bus/Level Translator Pull Up when
CE = 0 (Default)
1 Disable Disconnect of 30K LIN Bus/Level Translator Pull Up when
CE = 0
5 0 System Enters Standby Mode when CE = 0
1 System Enters Sleep Mode when CE = 0, 30k LIN Bus/Level
Translator Pull Up Disconnect Always Enabled.
4 0 Internal Neutral Simulator Disabled (Start-Up Default)
1 Internal Neutral Simulator Enabled
3 0 Undervoltage Lockout Enabled
1 Undervoltage Lockout Disabled
2 0 External MOSFET Overcurrent Detection Enabled
1 External MOSFET Overcurrent Detection Disabled
1:0
00 0.250V External MOSFET Overcurrent Limit 01 0.500V External MOSFET Overcurrent Limit 10 0.750V External MOSFET Overcurrent Limit 11 1.000V External MOSFET Overcurrent Limit
2014 Microchip Technology Inc. DS20005339A-page 43
MCP8025/6
TABLE 4-8: DE2 COMMUNICATION MESSAGES FROM MCP8025/6 TO HOST (CONTINUED)
MESSAGE BYTE BIT VALUE DESCRIPTION
SET_CFG_1 1 00000011 (03H) Set DAC Motor Current Limit Reference Voltage Not Acknowledged
(Response)
01000011 (43H) Set DAC Motor Current Limit Reference Voltage Acknowledged
(Response)
2 7:0 00H – FFH Current DAC Current Reference Value: 13.77 mV/bit + 0.991V
GET_CFG_1 1 00000100 (04H) Get DAC Motor Current Limit Reference Voltage Not Acknowledged
(Response)
01000100 (44H) Get DAC Motor Current Limit Reference Voltage Acknowledged
(Response)
2 7:0 00H – FFH Current DAC Current Reference Value: 13.77 mV/bit + 0.991V
STATUS_0 17:000000101 (05H) Status Register 0 Response Not Acknowledged (Response)
01000101 (45H) Status Register 0 Response Acknowledged (Response) 10000101 (85H) Status Register 0 Command to Host (Unsolicited)
27:0 00000000 Normal Operation
00000001 Temperature Warning (T 00000010 Overtemperature (TJ> 160°C) 00000100 Input Undervoltage (VDD<5.5V) 00001000 Driver Input Overvoltage (20V < V 00010000 Input Overvoltage (VDD> 32V) 00100000 Buck Regulator Overcurrent 01000000 Buck Regulator Output Undervoltage Warning 10000000 Buck Regulator Output Undervoltage (< 80%, Brown-Out Error)
STATUS_1 17:000000110 (06H) Status Register 1 Response Not Acknowledged (Response)
01000110 (46H) Status Register 1 Response Acknowledged (Response) 10000110 (86H) Status Register 1 Command to Host (Unsolicited)
27:0 00000000 Normal Operation
00000001 Reserved 00000010 Reserved 00000100 External MOSFET Undervoltage Lockout (UVLO) 00001000 External MOSFET Overcurrent Detection 00010000 Brown-Out Reset – Config Lost (Start-Up Default = 1) 00100000 5V LDO Undervoltage Lockout (UVLO) 01000000 Reserved 10000000 Reserved
> 72% T
J
DDH
= 115°C) (Default)
SD_MIN
< 32V)
DS20005339A-page 44 2014 Microchip Technology Inc.
MCP8025/6
TABLE 4-8: DE2 COMMUNICATION MESSAGES FROM MCP8025/6 TO HOST (CONTINUED)
MESSAGE BYTE BIT VALUE DESCRIPTION
SET_CFG_2 1 00000111 (07H) Set Configuration Register 2 Not Acknowledged (Response)
01000111 (47H) Set Configuration Register 2 Acknowledged (Response)
27:5 00H Reserved
4:2 Driver Dead Time (for PWMH/PWML inputs)
000 2000 ns (Default) 001 1750 ns 010 1500 ns 011 1250 ns 100 1000 ns 101 750 ns 110 500 ns 111 250 ns
1:0 Driver Blanking Time (Ignore Switching Current Spikes)
00 4µs (Default) 01 2µs 10 1µs 11 500 ns
GET_CFG_2 1 00001000 (08H) Get Configuration Register 2 Response Not Acknowledged (Response)
01001000 (48H) Get Configuration Register 2 Response Acknowledged (Response)
27:5 00H Reserved
4:2 --- Driver Dead Time (for PWMH/PWML inputs)
000 2000 ns (Default) 001 1750 ns 010 1500 ns 011 1250 ns 100 1000 ns 101 750 ns 110 500 ns 111 250 ns
1:0 Driver Blanking Time (Ignore Switching Current Spikes)
00 4µs (Default) 01 2µs 10 1µs 11 500 ns
2014 Microchip Technology Inc. DS20005339A-page 45
MCP8025/6

4.5 Register Definitions

REGISTER 4-1: CFG0: CONFIGURATION REGISTER 0
U-0 R/W-0 R/W-0 R/W-0 R/W-0 R/W-0 R/W-0 R/W-0
PU30K SLEEP NEUSIM EXTUVLO EXTSC EXTOC1 EXTOC0
bit 7 bit 0
Legend:
R = Readable bit W = Writable bit U = Unimplemented bit, read as ‘0’
-n = Value at POR ‘1’ = Bit is set ‘0’ = Bit is cleared x = Bit is unknown
bit 7 Unimplemented: Read as ‘0’ bit 6 PU30K: 30K LIN/Level Translator Pull Up
1 = Disable disconnect of 30K pull up when CE = 0. 0 = Enable disconnect of 30K pull up when CE = 0.
bit 5 SLEEP: Sleep Mode bit
1 = System enters Sleep Mode when CE = 0. Disconnect of 30K LIN/Level Translator pull up always
enabled.
0 = System enters Standby Mode when CE = 0.
bit 4 NEUSIM: Neutral Simulator
1 = Enable internal neutral simulator 0 = Disable internal neutral simulator
bit 3 EXTUVLO: External MOSFET Undervoltage Lockout
1 =Disable 0 = Enable
bit 2 EXTSC: External MOSFET Short Circuit Detection
1 =Disable 0 = Enable
bit 1-0 EXTOC<1:0>: External MOSFET Overcurrent Limit Value
00 =Overcurrent limit set to 0.250V 01 =Overcurrent limit set to 0.500V 10 =Overcurrent limit set to 0.750V 11 =Overcurrent limit set to 1.000V
Note 1: Bit may only be changed while in Standby mode.
(1)
DS20005339A-page 46 2014 Microchip Technology Inc.
MCP8025/6
REGISTER 4-2: CFG1: CONFIGURATION REGISTER 1
R/W-0 R/W-1 R/W-0 R/W-0 R/W-0 R/W-0 R/W-0 R/W-0
DACREF7 DACREF6 DACREF5 DACREF4 DACREF3 DACREF2 DACREF1 DACREF0
bit 7 bit 0
Legend:
R = Readable bit W = Writable bit U = Unimplemented bit, read as ‘0’
-n = Value at POR ‘1’ = Bit is set ‘0’ = Bit is cleared x = Bit is unknown
bit 7-0 DACREF<7:0>: DAC Current Reference Value
(4.503V – 0.991V)/255 = 13.77 mV/bit 00H =0.991V 40H =1.872V (40H x 0.1377 mV/bit + 0.991V) FFH =4.503V (FFH x 0.1377 mV/bit + 0.991V)
REGISTER 4-3: CFG2: CONFIGURATION REGISTER 2
U-0 U-0 U-0 R/W-0 R/W-0 R/W-0 R/W-0 R/W-0
DRVDT2 DRVDT1 DRVDT0 DRVBL1 DRVBL0
bit 7 bit 0
Legend:
R = Readable bit W = Writable bit U = Unimplemented bit, read as ‘0’
-n = Value at POR ‘1’ = Bit is set ‘0’ = Bit is cleared x = Bit is unknown
bit 7-5 Unimplemented: Read as ‘0’ bit 4-2 DRVDT<2:0>: Driver Dead Time Selection bits
000 =2000 ns 001 =1750 ns 010 =1500 ns 011 =1250 ns 100 =1000 ns 101 =750 ns 110 =500 ns 111 =250 ns
bit 1-0 DRVB<1:0>: Driver Blanking Time Selection bits
00 =4000 ns 01 =2000 ns 10 =1000 ns 11 =500 ns
2014 Microchip Technology Inc. DS20005339A-page 47
MCP8025/6
REGISTER 4-4: STAT0: STATUS REGISTER 0
R-0 R-0 R-0 R-0 R-0 R-0 R-0 R-0
BUVLOF BUVLOW BIOCPW OVLOF DOVLOF UVLOF OTPF OTPW
bit 7 bit 0
Legend:
R = Readable bit W = Writable bit U = Unimplemented bit, read as ‘0’
-n = Value at POR ‘1’ = Bit is set ‘0’ = Bit is cleared x = Bit is unknown
bit 7 BUVLOF: Buck Undervoltage Lockout Fault
1 = Buck output voltage is below 80% of expected value 0 = Buck output voltage is above 80% of expected value
bit 6 BUVLOW: Buck Undervoltage Lockout Warning
1 = Buck output voltage is below 90% of expected value 0 = Buck output voltage is above 90% of expected value
bit 5 BIOCPW: Buck Input Overcurrent Protection Warning
1 = Buck input current is above 2A peak 0 = Buck input current is below 2A peak
bit 4 OVLOF: Input Overvoltage Lockout Fault
1 =V 0 =V
bit 3 DOVLOF: Driver Input Overvoltage Lockout Fault (MCP8025 only, MCP8026 = 0)
1 = 20V < V 0 =VDD< 20V
bit 2 UVLOF: Input Undervoltage Fault
1 =VDD Input Voltage < 5.5V 0 =V
bit 1 OTPF: Overtemperature Protection Fault
1 = Device junction temperature is > 160°C 0 = Device junction temperature is < 160°C
bit 0 OTPW: Overtemperature Protection Warning
1 = Device junction temperature is > 115°C 0 = Device junction temperature is < 115°C
Input Voltage > 32V
DD
Input Voltage < 32V
DD
DDH
Input Voltage > 5.5V
DD
DS20005339A-page 48 2014 Microchip Technology Inc.
MCP8025/6
REGISTER 4-5: STAT1: STATUS REGISTER 1
U-0 U-0 R-0 R-1 R-0 R-0 U-0 U-0
UVLOF5V BORW XOCPF XUVLOF
bit 7 bit 0
Legend:
R = Readable bit W = Writable bit U = Unimplemented bit, read as ‘0’
-n = Value at POR ‘1’ = Bit is set ‘0’ = Bit is cleared x = Bit is unknown
bit 7-6 Unimplemented: Read as ‘0’ bit 5 UVLOF5V: 5V LDO Undervoltage Lockout
1 = 5V LDO output voltage < 4.0V 0 = 5V LDO output voltage > 4.0V
bit 4 BORW: Brown-Out Reset Warning, Configuration Lost
1 = Internal device reset has occurred since last configuration message 0 = No internal device reset has occurred since last configuration message
bit 3 XOCPF: External MOSFET Overcurrent Protection Fault
1 = External MOSFET VDS> CFG0<EXTOC> value 0 = External MOSFET V
bit 2 XUVLOF: External MOSFET Gate Drive Undervoltage Fault
1 =HSX Output Voltage < 8V 0 =HS
bit 1-0 Unimplemented: Read as ‘0 Note 1: Only valid when CFG0<EXTSC> = 1.
Output Voltage > 8V
X
< CFG0<EXTOC> value
DS
(1)
2014 Microchip Technology Inc. DS20005339A-page 49
MCP8025/6
NOTES:
DS20005339A-page 50 2014 Microchip Technology Inc.
MCP8025/6
Transfer
Charge

5.0 APPLICATION INFORMATION

5.1 Component Calculations

5.1.1 CHARGE PUMP CAPACITORS

FIGURE 5-1: Charge Pump.

Let:
I
=20mA
OUT
fCP= 75 kHz (charge/discharge in one cycle)
50% duty cycle
= 6V (worst case)
V
DDH
R
V
5.1.1.1 Flying Capacitor
The flying capacitor should be chosen to charge to a minimum of 95% (3) of V switching cycle.
3x=T
Choose a 180 nF capacitor.
=7.5 (R
DSON
V12P = 2 x V
C
ESR
DROP
T
CHG
t=T
RC = T
C=T
DDH
=20m (ceramic capacitors)
=100mV (V
=T
DCHG
CHG
/3
CHG
/3
CHG
/(R x 3)
CHG
), 3.5 (R
PMOS
NMOS
(ideal)
ripple)
OUT
= 0.5 x 1/75 kHz = 6.67 µs
within one half of a
DDH
C = 6.67 µs/([7.5+3.5 +0.02]x3)
C = 202 nF
)
For stability reasons, the +12V LDO and +5V LDO capacitors must be greater than 4.7 µF, so choose C 4.7 µF.
5.1.1.3 Charging Path (Flying Capacitor across CAP1 and CAP2)
V
=V
V
V
CAP
CAP
CAP
DDH
=6V (1–e
= 5.79V available for transfer
-T/
(1 – e
)
-[6.67 µs/([7.5+3.5 +20m]x180nF)]
5.1.1.4 Transfer Path (Flying and Output Capacitors)
V12P = V
DDH+VCAP–IOUT
V12P = 6V + 5.79V – (20 mA x 6.67 µs/180 nF)
V12P = 11.049V
x dt/C
5.1.1.5 Calculate the Flying Capacitor Voltage Drop in One Cycle while Supplying 20 mA
dV = I
dV = 20 mA x 6.67 µs/180 nF
dV = 0.741V @ 20 mA
The second and subsequent transfer cycles will have a higher voltage available for transfer, since the capacitor is not completely depleted with each cycle. V
CAP
V
DDH
repeats for each subsequent cycle, allowing a larger charge pump capacitor to be used if the system tolerates several charge transfers before requiring full-output voltage and current.
Repeating Section 5.1.1.3, Charging Path (Flying
Capacitor across CAP1 and CAP2) for the second
cycle (and subsequent by re-calculating for each new value of V
V
CAP
V
CAP
V
CAP
V
CAP
x dt/C
OUT
will then be V
–(V
=(V
= (5.79V – 0.741V) + (6V – (5.79V – 0.741V) x
= 5.049V + 0.951V x 0.96535
= 5.967V available for transfer on second cycle
– dV) times the RC constant. This
CAP
after each transfer):
CAP
–dV)+(V
CAP
-[6.67 µs/([7.5+3.5 +20m]x180nF)])
(1 – e
- dV after the first transfer, plus
CAP
DDH
–(V
–dV)) (1 – e
CAP
-T/t
)
)
5.1.1.2 Charge Pump Output Capacitor
Solve for the charge pump output capacitance, connected between V12P and ground, that will supply the 20 mA load for one switch cycle. The +12V LDO pin on the MCP8025/6 is the “V12P” pin referenced in the calculations.
C=I
C=I C = 20 mA x 13.3 µs/(0.1V + 20 mA x 20 m) C 2.65 µF
2014 Microchip Technology Inc. DS20005339A-page 51
x dt/dV
OUT
x13.3 µs/(V
OUT
DROP+IOUTxCESR
)
MCP8025/6
5.1.1.6 Charge Pump Results
The maximum charge pump flying capacitor value is 202 nF to maintain a 95% voltage transfer ratio on the first charge pump cycle. Larger capacitor values may be used but they will require more cycles to charge to maximum voltage. The minimum required output capacitor value is 2.65 µF to supply 20 mA for 13.3 µs with a 100 mV drop. A larger output capacitor may be used to cover losses due to capacitor tolerance over temperature, capacitor dielectric and PCB losses.
These are approximate calculations. The actual voltages may vary due to incomplete charging or discharging of capacitors per cycle due to load changes. The charge pump calculations assume the charge pump is able to charge up the external boot cap within a few cycles.
5.1.2 BOOTSTRAP CAPACITOR
The high-side driver bootstrap capacitor needs to power the high-side driver and gate for 1/3 of the motor electrical period for a 3-phase BLDC motor.
Let:
MOSFET driver current
PWM period
Minimum duty cycle
Maximum duty cycle
Minimum gate drive voltage
Total gate charge
Allowable VGS drop (V
Switch R
Driver internal bias current
Solve for the smallest capacitance that can supply:
- 130 nC of charge to the MOSFET gate
-1M Gate-Source resistor current
- Driver bias current and switching losses
Q
MOSFET
Q
RESISTOR
Q
DRIVER
Q
RESISTOR
Q
RESISTOR
Q
DRIVER
Q
DRIVER
=
130 nC
=
[(VGS/R) x TON]
=
(I
BIASxTON
=
T
49.5 µs (99% DC) for worst case
ON
=
(12V/1 M) x 49.5 µs
=
0.594 nC
=
20 µA x 49.5 µs
=
0.99 nC
Sum all of the energy requirements:
=
(Q
C
MOSFET+QRESISTOR+QDRIVER
C=(130 nC + 0.594 nC + 0.99 nC)/3V
=
43.86 nF
C
=300mA
= 50µs (20kHz)
=1% (500ns)
=99% (49.5µs)
=12V
V
IN
=8V (VGS)
= 130 nC (80A MOSFET)
=3V
)
DROP
=100m
DSON
=20µA (I
)
BIAS
)/V
)
DROP
Choose a bootstrap capacitor value that is larger than
43.86 nF.
5.1.3 BUCK SWITCHER
5.1.3.1 Calculate the Buck Inductor for Discontinuous Mode Operation
Let:
=
4.3V (worst case is BUVLO)
V
IN
=
V
I
3.3V
OUT
=
225 mA
OUT
=
468 kHz (TSW= 2.137 µs)
f
SW
Solve for maximum inductance value.
=
L
L
L
MAX
MAX
MAX
V
x(1–V
OUT
=
3.3V x (1 – 3.3V/4.3V) x 2.137 µs/(2 x 225 mA)
=
3.64 µH
OUT/VIN
)xTSW/(2 x I
OUT
)
Choose an inductor 3.64 µH to ensure Discontinuous Conduction mode.
Table 5-1 shows the various maximum inductance
values for a worst case input voltage of 6V and various output voltages.
5.1.3.2 Determine the Peak Switch Current for the Calculated Inductor
=
I
PEAK
I
PEAK
I
PEAK
(VS–VO)xDxT/L
=
(4.3V – 3.3V) x (3.3V/4.3V) x 2.137 µs/3.64 µH
=
450 mA
5.1.3.3 Setting the Buck Output Voltage
The buck output voltage is set by a resistor voltage divider from the inductor output to ground. The divider center tap is fed back to the MCP8025 FB pin. The FB pin is compared to an internal 1.25V reference voltage. When the FB pin voltage drops below the reference voltage, the buck duty cycle increases. When the FB pin rises above the reference voltage, the buck duty cycle decreases.
DS20005339A-page 52 2014 Microchip Technology Inc.
MCP8025/6
OUTPUT
CONTROL
LOGIC
VDD
+
-
LX
FB
+
-
Q1
CURRENT_REF
VDD-12V
BANDGAP
REFERENCE
+
-
R1
R2
C1
L1
D1 Schottky
Start with an R2 value of 10 k to 51 k to minimize current through the divider.
V

FIGURE 5-2: Typical Buck Application.

TABLE 5-1: MAXIMUM INDUCTANCE FOR BUCK DISCONTINUOUS MODE OPERATION

V
IN
(worst case)
4.3V (BUVLO) 3V 250 mA 4.3 µH
4.3V (BUVLO) 3.3V 225 mA 3.6 µH
6V 5.0V 150 mA 5.9 µH
V
OUT
= 1.25V x (R1 + R2) R2
BUCK
I
OUT
Maximum Inductance

5.2 Device Protection

5.2.1 MOSFET VOLTAGE SUPPRESSION
When a motor shaft is rotating and power is removed, the magnetism of the motor components will cause the motor to act like a generator. The current that was flowing into the motor will now flow out of the motor. As the motor magnetic field decays, the generator output will also decay. The voltage across the generator terminals will be proportional to the generator current and the circuit impedance of the generator circuit. If the power supply is part of the return path for the current and the power supply is disconnected, then the voltage at the generator terminals will increase until the current flows. This voltage increase must be handled externally to the driver. A voltage suppression device must be used to clamp the motor terminal voltage to a level that will not exceed the maximum motor operating voltage. A voltage suppressor should be connected from ground to each motor terminal. The PCB traces must be capable of carrying the motor current with minimum voltage and temperature rise.
An additional method is to inactivate the high-side drivers and to activate the low-side drivers. This allows current to flow through the low-side external MOSFETs and prevents the voltage increases at the power supply terminals. A pure hardware implementation may be done by connecting a bidirectional transzorb from the gate of each external low-side driver MOSFET to the drain of the same MOSFET. When the phase voltage rises above the transzorb standoff voltage, the transzorb will start to conduct, pulling up the gate of the low-side MOSFET. This turns on the MOSFET and creates a low-voltage current path for the motor windings to dissipate stored energy. The implementation is a failsafe mechanism in cases where the supply becomes disconnected or the controller shuts down due to a fault or command. The MCP8025/6 overvoltage lockout (OVLO) is 32V, so a 33V transzorb would be used. This allows the MCP8025/6 to shut down before the transzorb forces the low-side gates high, preventing the MCP8025/6 low-side drivers from sinking current if they are being driven low. The MCP8025 may use a lower voltage transzorb due to the fact that the MCP8025 driver overvoltage lockout (DOVLO) occurs at a lower voltage.
2014 Microchip Technology Inc. DS20005339A-page 53
MCP8025/6
5.2.2 BOOTSTRAP VOLTAGE SUPPRESSION
The pins which handle the highest voltage during motor operation are the bootstrap pins (V bootstrap pin voltage is typically 12V higher than the associated phase voltage. When the high-side MOSFET is conducting, the phase pin voltage is typically at V typically at V switch, current-induced voltage transients occur on the phase pins. Those induced voltages cause the bootstrap pin voltages to also increase. Depending on the magnitude of the phase pin voltage, the bootstrap pin voltage may exceed the safe operating voltage of the device. The current-induced transients may be reduced by slowing down the turn-on and turn-off times of the MOSFETs. The external MOSFETs may be slowed down by adding a 10 to 75 resistor in series with the gate drive. The high-side MOSFETs may also be slowed down by inserting a 25 resistor between each bootstrap pin and the associated bootstrap diode-capacitor junction. Another 25 to 50 resistor is then added between the gate drive and the MOSFET gate. This results in a high-side turn-on resistance of 25+ the series gate resistor. The high-side turn-off resistance only consists of the series gate resistance and will allow for a faster shutoff time.
36V transzorbs (40V breakdown voltage) should also be connected from each bootstrap pin (V This will ensure that the bootstrap voltage does not exceed the 46V absolute maximum voltage allowed on the pins. The resistors connected between the bootstrap pins and the bootstrap diode-capacitor junctions mentioned in the previous paragraph should also be used in order to limit the transzorb current and reduce the transzorb package size.
and the bootstrap pin voltage is
DD
+ 12V. When the phase MOSFETs
DD
). The
Bx
) to ground.
Bx
5.2.3 FLOATING GATE SUPPRESSION
The gate drive pins may float when the supply voltage is lost or an overvoltage situation shuts down the driver. When an overvoltage condition exists, the driver high-side and low-side outputs are high Z. Each external MOSFET that is connected to the gate driver should have a gate-to-source resistor to bleed off any charge that may accumulate due to the high Z state. This will help prevent inadvertent turn-on of the MOSFET.

5.3 Related Literature

• AN885, “Brushless DC (BLDC) Motor Fundamentals”, DS00885, Microchip Technology Inc., 2003
• AN1160, “Sensorless BLDC Control with Back-EMF Filtering Using a Majority Function”, DS01160, Microchip Technology Inc., 2008
• AN1078, “Sensorless Field Oriented Control of a PMSM”, DS01078, Microchip Technology Inc., 2010
DS20005339A-page 54 2014 Microchip Technology Inc.
2014 Microchip Technology Inc. DS20005339A-page 55
PHA PHB PHC
VDD
HSA
HSB
HSC
LSA
LSB
LSC
VBA VBB VBC
CB
A
+ _
+12V
R
R
R
R
R
R
R
R
R
S
S
S
R
R
R
R
R
R
Figure 5-3 shows the location of the overvoltage transzorbs, gate resistors, bootstrap resistors and gate-to-source resistors.

FIGURE 5-3: Overvoltage Protection.

MCP8025/6
MCP8025/6
NOTES:
DS20005339A-page 56 2014 Microchip Technology Inc.

6.0 PACKAGING INFORMATION

40-Lead QFN (5x5x0.85 mm) Example
PIN 1 PIN 1
MCP8025
E/MP^^
1439256
Legend: XX...X Customer-specific information
Y Year code (last digit of calendar year) YY Year code (last 2 digits of calendar year) WW Week code (week of January 1 is week ‘01’) NNN Alphanumeric traceability code Pb-free JEDEC designator for Matte Tin (Sn)
* This package is Pb-free. The Pb-free JEDEC designator ( )
can be found on the outer packaging for this package.
Note: In the event the full Microchip part number cannot be marked on one line, it will
be carried over to the next line, thus limiting the number of available characters for customer-specific information.
3
e
MCP8026
HPT1439
256
48-Lead TQFP (7x7x1 mm) Example

6.1 Package Marking Information

MCP8025/6
3
e
3
e
2014 Microchip Technology Inc. DS20005339A-page 57
MCP8025/6
0.20 C
0.20 C
(DATUM B)
(DATUM A)
C
SEATING
PLANE
1 2
N
2X
TOP VIEW
SIDE VIEW
For the most current package drawings, please see the Microchip Packaging Specification located at http://www.microchip.com/packaging
Note:
NOTE 1
1
2
N
0.10 C A B
0.10 C A B
0.08
C
Microchip Technology Drawing C04-047-002A Sheet 1 of 2
40-Lead Plastic Quad Flat, No Lead Package (MP) - 5x5 mm Body [QFN]
D2
D
E
A
B
40X b
e
0.07 C A B
0.05 C
A
(A3)
With 3.7x3.7 mm Exposed Pad
E2
A1
0.10 C
K
L
2X
DS20005339A-page 58 2014 Microchip Technology Inc.
Microchip Technology Drawing C04-047-002A Sheet 2 of 2
For the most current package drawings, please see the Microchip Packaging Specification located at http://www.microchip.com/packaging
Note:
Number of Terminals
Overall Height
Terminal Width
Overall Width
Overall Length
Terminal Length
Exposed Pad Width
Exposed Pad Length
Terminal Thickness
Pitch
Standoff
Units
Dimension Limits
A1
A
b
D
E2
D2
A3
e
L
E
N
0.40 BSC
0.20 REF
0.30
0.15
0.80
0.00
0.20
5.00 BSC
0.40
3.70 BSC
3.70 BSC
0.85
0.02
5.00 BSC
MILLIMETERS
MIN
NOM
40
0.50
0.25
0.90
0.05
MAX
K-0.20 -
REF: Reference Dimension, usually without tolerance, for information purposes only.
BSC: Basic Dimension. Theoretically exact value shown without tolerances.
1.
2.
3.
Notes:
Pin 1 visual index feature may vary, but must be located within the hatched area. Package is saw singulated
Dimensioning and tolerancing per ASME Y14.5M
Terminal-to-Exposed-Pad
40-Lead Plastic Quad Flat, No Lead Package (MP) - 5x5 mm Body [QFN] With 3.7x3.7 mm Exposed Pad
MCP8025/6
2014 Microchip Technology Inc. DS20005339A-page 59
MCP8025/6
RECOMMENDED LAND PATTERN
For the most current package drawings, please see the Microchip Packaging Specification located at http://www.microchip.com/packaging
Note:
SILK SCREEN
Dimension Limits
Units
C1
Optional Center Pad Width
Contact Pad Spacing
Optional Center Pad Length
Contact Pitch
Y2
X2
3.80
3.80
MILLIMETERS
0.40 BSC
MIN
E
MAX
5.00
Contact Pad Length (X40)
Contact Pad Width (X40)
Y1
X1
0.80
0.20
BSC: Basic Dimension. Theoretically exact value shown without tolerances.
Notes:
1. Dimensioning and tolerancing per ASME Y14.5M
Microchip Technology Drawing C04-2047-002A
NOM
40-Lead Plastic Quad Flat, No Lead Package (MP) - 5x5 mm Body [QFN] With 3.7x3.7 mm Exposed Pad
E
C1
C2
Y2
X2
Y1
X1
C2Contact Pad Spacing 5.00
DS20005339A-page 60 2014 Microchip Technology Inc.
C
SEATING
PLANE
For the most current package drawings, please see the Microchip Packaging Specification located at http://www.microchip.com/packaging
Note:
NOTE 1
Microchip Technology Drawing C04-183A Sheet 1 of 2
48-Lead Thin Quad Flatpack (PT) - 7x7x1.0 mm Body [TQFP] With Exposed Pad
TOP VIEW
EE1
D
0.20
H A-B D
4X
D1/2
12
A
B
AA
D
D1
A1
A
H
0.10
C
0.08
C
SIDE VIEW
D2
E2
N
12
N
0.20 C A-B D
48X TIPS
0.20
H A-B D
4X
0.20
4X
E1/4
D1/4
A2
TOP VIEW
E1/2
e 48x b
0.08 C A-B D
e/2
MCP8025/6
2014 Microchip Technology Inc. DS20005339A-page 61
MCP8025/6
Microchip Technology Drawing C04-183A Sheet 2 of 2
For the most current package drawings, please see the Microchip Packaging Specification located at http://www.microchip.com/packaging
Note:
48-Lead Thin Quad Flatpack (PT) - 7x7x1.0 mm Body [TQFP] With Exposed Pad
H
L
(L1)
T
c
D
E
SECTION A-A
2.
1.
4. BSC: Basic Dimension. Theoretically exact value shown without tolerances. REF: Reference Dimension, usually without tolerance, for information purposes only.
3.
protrusions shall not exceed 0.25mm per side.
Mold Draft Angle Bottom
Molded Package Thickness
Dimension Limits
Mold Draft Angle Top
Notes:
Foot Length
Lead Width
Lead Thickness
Molded Package Length
Molded Package Width
Overall Length
Overall Width
Foot Angle
Footprint
Standoff
Overall Height
Lead Pitch
Number of Leads
12°
E
11° 13°
0.750.600.45L
12°
0.22
7.00 BSC
7.00 BSC
9.00 BSC
9.00 BSC
3.5°
1.00 REF
c
D
b
D1
E1
0.09
0.17 11°
D
E
I
L1
13°
0.27
0.16-
1.00
0.50 BSC
48
NOM
MILLIMETERS
A1 A2
A
e
0.05
0.95
-
Units
N
MIN
1.05
0.15
1.20
-
-
MAX
Chamfers at corners are optional; size may vary.
Pin 1 visual index feature may vary, but must be located within the hatched area.
Dimensioning and tolerancing per ASME Y14.5M
Dimensions D1 and E1 do not include mold flash or protrusions. Mold flash or
Exposed Pad Length
Exposed Pad Width
D2
E2 3.50 BSC
3.50 BSC
DS20005339A-page 62 2014 Microchip Technology Inc.
RECOMMENDED LAND PATTERN
For the most current package drawings, please see the Microchip Packaging Specification located at http://www.microchip.com/packaging
Note:
C2
Y2
X1
C1
X2
E
Y1
Dimension Limits
Units
C1
Optional Center Tab Width
Contact Pad Spacing Contact Pad Spacing
Optional Center Tab Length
Contact Pitch
C2
Y2
X2
3.50
3.50
MILLIMETERS
0.50 BSC
MIN
E
MAX
8.40
8.40
Contact Pad Length (X48)
Contact Pad Width (X48)
Y1
X1
1.50
0.30
BSC: Basic Dimension. Theoretically exact value shown without tolerances.
Notes:
1. Dimensioning and tolerancing per ASME Y14.5M
Microchip Technology Drawing No. C04-2183A
NOM
48-Lead Thin Quad Flatpack (PT) - 7x7x1.0 mm Body [TQFP] With Thermal Tab
MCP8025/6
2014 Microchip Technology Inc. DS20005339A-page 63
MCP8025/6
NOTES:
DS20005339A-page 64 2014 Microchip Technology Inc.

APPENDIX A: RE VISION HISTORY

Revision A (September 2014)
• Original Release of this Document.
MCP8025/6
2014 Microchip Technology Inc. DS20005339A-page 65
MCP8025/6
NOTES:
DS20005339A-page 66 2014 Microchip Technology Inc.

PRODUCT IDENTIFICATION SYSTEM

Device: MCP8025: 3-Phase Brushless DC (BLDC) Motor
Gate Driver with Power Module and LIN
MCP8025T: 3-Phase Brushless DC (BLDC) Motor
Gate Driver with Power Module and LIN (Tape and Reel)
MCP8026: 3-Phase Brushless DC (BLDC) Motor
Gate Driver with Power Module
MCP8026T: 3-Phase Brushless DC (BLDC) Motor
Gate Driver with Power Module (Tape and Reel)
Temperature Warning:
115 = 115°C
Temperature Range:
E = -40°C to +125°C (Extended) H = -40°C to +150°C (High)
Package: MP = Plastic Quad Flat, No Lead Package – 5x5 mm
Body with 3.5x3.5 mm Exposed Pad, 40-lead
PT = Thin Quad Flatpack – 7x7x1.0 mm Body with
Exposed Pad, 48-lead
Examples:
a) MCP8025-115E/MP: Extended temperature,
40LD 5x5 QFN package
b) MCP8025T-115E/MP: Tape and Reel,
Extended temperature, 40LD 5x5 QFN package
c) MCP8025-115H/MP: High temperature,
40LD 5x5 QFN package
d) MCP8025T-115H/MP: Tape and Reel,
High temperature, 40LD 5x5 QFN package
e) MCP8026-115E/MP: Extended temperature,
40LD 5x5 QFN package
f) MCP8026T-115E/MP: Tape and Reel,
Extended temperature, 40LD 5x5 QFN package
g) MCP8026-115H/MP: High temperature,
40LD 5x5 QFN package
h) MCP8026T-115H/MP: Tape and Reel,
High temperature, 40LD 5x5 QFN package
i) MCP8025-115E/PT: Extended temperature,
48LD TQFP-EP package
j) MCP8025T-115E/PT: Tape and Reel,
Extended temperature, 48LD TQFP-EP package
k) MCP8025-115H/PT: High temperature,
48LD TQFP-EP package
l) MCP8025T-115H/PT: Tape and Reel,
High Temperature, 48LD TQFP-EP package
m) MCP8026-115E/PT: Extended temperature,
48LD TQFP-EP package
n) MCP8026T-115E/PT: Tape and Reel,
Extended temperature, 48LD TQFP-EP package
o) MCP8026-115H/PT: High temperature,
48LD TQFP-EP package
p) MCP8026T-115H/PT: Tape and Reel,
High temperature, 48LD TQFP-EP package
PART NO. -X /XX
PackageTemperature
Device
X
Temperature
Range
Warning
Note 1: Tape and Reel identifier only appears in the
catalog part number description. This identi­fier is used for ordering purposes and is not printed on the device package. Check with your Microchip Sales Office for package availability with the Tape and Reel option.
To order or obtain information, e.g., on pricing or delivery, refer to the factory or the listed sales office.
MCP8025/6
2014 Microchip Technology Inc. DS20005339A-page 67
MCP8025/6
NOTES:
DS20005339A-page 68 2014 Microchip Technology Inc.
Note the following details of the code protection feature on Microchip devices:
YSTEM
CERTIFIED BY DNV
== ISO/TS 16949 ==
Microchip products meet the specification contained in their particular Microchip Data Sheet.
Microchip believes that its family of products is one of the most secure families of its kind on the market today, when used in the intended manner and under normal conditions.
There are dishonest and possibly illegal methods used to breach the code protection feature. All of these methods, to our knowledge, require using the Microchip products in a manner outside the operating specifications contained in Microchip’s Data Sheets. Most likely, the person doing so is engaged in theft of intellectual property.
Microchip is willing to work with the customer who is concerned about the integrity of their code.
Neither Microchip nor any other semiconductor manufacturer can guarantee the security of their code. Code protection does not mean that we are guaranteeing the product as “unbreakable.”
Code protection is constantly evolving. We at Microchip are committed to continuously improving the code protection features of our products. Attempts to break Microchip’s code protection feature may be a violation of the Digital Millennium Copyright Act. If such acts allow unauthorized access to your software or other copyrighted work, you may have a right to sue for relief under that Act.
Information contained in this publication regarding device applications and the like is provided only for your convenience and may be superseded by updates. It is your responsibility to ensure that your application meets with your specifications. MICROCHIP MAKES NO REPRESENTATIONS OR WARRANTIES OF ANY KIND WHETHER EXPRESS OR IMPLIED, WRITTEN OR ORAL, STATUTORY OR OTHERWISE, RELATED TO THE INFORMATION, INCLUDING BUT NOT LIMITED TO ITS CONDITION, QUALITY, PERFORMANCE, MERCHANTABILITY OR FITNESS FOR PURPOSE
. Microchip disclaims all liability
arising from this information and its use. Use of Microchip devices in life support and/or safety applications is entirely at the buyer’s risk, and the buyer agrees to defend, indemnify and hold harmless Microchip from any and all damages, claims, suits, or expenses resulting from such use. No licenses are conveyed, implicitly or otherwise, under any Microchip intellectual property rights.

Trademarks

The Microchip name and logo, the Microchip logo, dsPIC, FlashFlex, flexPWR, JukeBlox, K LANCheck, MediaLB, MOST, MOST logo, MPLAB, OptoLyzer, PIC, PICSTART, PIC
EELOQ, KEELOQ logo, Kleer,
32
logo, RightTouch, SpyNIC, SST, SST Logo, SuperFlash and UNI/O are registered trademarks of Microchip Technology Incorporated in the U.S.A. and other countries.
The Embedded Control Solutions Company and mTouch are registered trademarks of Microchip Technology Incorporated in the U.S.A.
Analog-for-the-Digital Age, BodyCom, chipKIT, chipKIT logo, CodeGuard, dsPICDEM, dsPICDEM.net, ECAN, In-Circuit Serial Programming, ICSP, Inter-Chip Connectivity, KleerNet, KleerNet logo, MiWi, MPASM, MPF, MPLAB Certified logo, MPLIB, MPLINK, MultiTRAK, NetDetach, Omniscient Code Generation, PICDEM, PICDEM.net, PICkit, PICtail, RightTouch logo, REAL ICE, SQI, Serial Quad I/O, Total Endurance, TSHARC, USBCheck, VariSense, ViewSpan, WiperLock, Wireless DNA, and ZENA are trademarks of Microchip Technology Incorporated in the U.S.A. and other countries.
SQTP is a service mark of Microchip Technology Incorporated in the U.S.A.
Silicon Storage Technology is a registered trademark of Microchip Technology Inc. in other countries.
GestIC is a registered trademarks of Microchip Technology Germany II GmbH & Co. KG, a subsidiary of Microchip Technology Inc., in other countries.
All other trademarks mentioned herein are property of their respective companies.
© 2014, Microchip Technology Incorporated, Printed in the U.S.A., All Rights Reserved.
ISBN: 978-1-63276-623-6
QUALITY MANAGEMENT S
2014 Microchip Technology Inc. DS20005339A-page 69
Microchip received ISO/TS-16949:2009 certification for its worldwide headquarters, design and wafer fabrication facilities in Chandler and Tempe, Arizona; Gresham, Oregon and design centers in California and India. The Company’s quality system processes and procedures are for its PIC devices, Serial EEPROMs, microperipherals, nonvolatile memory and analog products. In addition, Microchip’s quality system for the design and manufacture of development systems is ISO 9001:2000 certified.
®
MCUs and dsPIC® DSCs, KEELOQ
®
code hopping

Worldwide Sales and Service

AMERICAS
Corporate Office
2355 West Chandler Blvd. Chandler, AZ 85224-6199 Tel: 480-792-7200 Fax: 480-792-7277 Technical Support:
http://www.microchip.com/ support
Web Address:
www.microchip.com
Atlanta
Duluth, GA Tel: 678-957-9614 Fax: 678-957-1455
Austin, TX
Tel: 512-257-3370
Boston
Westborough, MA Tel: 774-760-0087 Fax: 774-760-0088
Chicago
Itasca, IL Tel: 630-285-0071 Fax: 630-285-0075
Cleveland
Independence, OH Tel: 216-447-0464 Fax: 216-447-0643
Dallas
Addison, TX Tel: 972-818-7423 Fax: 972-818-2924
Detroit
Novi, MI Tel: 248-848-4000
Houston, TX
Tel: 281-894-5983
Indianapolis
Noblesville, IN Tel: 317-773-8323 Fax: 317-773-5453
Los Angeles
Mission Viejo, CA Tel: 949-462-9523 Fax: 949-462-9608
New Yor k , NY
Tel: 631-435-6000
San Jose, CA
Tel: 408-735-9110
Canada - Toronto
Tel: 905-673-0699 Fax: 905-673-6509
ASIA/PACIFIC
Asia Pacific Office
Suites 3707-14, 37th Floor Tower 6, The Gateway Harbour City, Kowloon Hong Kong Tel: 852-2943-5100 Fax: 852-2401-3431
Australia - Sydney
Tel: 61-2-9868-6733 Fax: 61-2-9868-6755
China - Beijing
Tel: 86-10-8569-7000 Fax: 86-10-8528-2104
China - Chengdu
Tel: 86-28-8665-5511 Fax: 86-28-8665-7889
China - Chongqing
Tel: 86-23-8980-9588 Fax: 86-23-8980-9500
China - Hangzhou
Tel: 86-571-8792-8115 Fax: 86-571-8792-8116
China - Hong Kong SAR
Tel: 852-2943-5100 Fax: 852-2401-3431
China - Nanjing
Tel: 86-25-8473-2460 Fax: 86-25-8473-2470
China - Qingdao
Tel: 86-532-8502-7355 Fax: 86-532-8502-7205
China - Shanghai
Tel: 86-21-5407-5533 Fax: 86-21-5407-5066
China - Shenyang
Tel: 86-24-2334-2829 Fax: 86-24-2334-2393
China - Shenzhen
Tel: 86-755-8864-2200 Fax: 86-755-8203-1760
China - Wuhan
Tel: 86-27-5980-5300 Fax: 86-27-5980-5118
China - Xian
Tel: 86-29-8833-7252 Fax: 86-29-8833-7256
China - Xiamen
Tel: 86-592-2388138 Fax: 86-592-2388130
China - Zhuhai
Tel: 86-756-3210040 Fax: 86-756-3210049
ASIA/PACIFIC
India - Bangalore
Tel: 91-80-3090-4444 Fax: 91-80-3090-4123
India - New Delhi
Tel: 91-11-4160-8631 Fax: 91-11-4160-8632
India - Pune
Tel: 91-20-3019-1500
Japan - Osaka
Tel: 81-6-6152-7160 Fax: 81-6-6152-9310
Japan - Tokyo
Tel: 81-3-6880- 3770 Fax: 81-3-6880-3771
Korea - Daegu
Tel: 82-53-744-4301 Fax: 82-53-744-4302
Korea - Seoul
Tel: 82-2-554-7200 Fax: 82-2-558-5932 or 82-2-558-5934
Malaysia - Kuala Lumpur
Tel: 60-3-6201-9857 Fax: 60-3-6201-9859
Malaysia - Penang
Tel: 60-4-227-8870 Fax: 60-4-227-4068
Philippines - Manila
Tel: 63-2-634-9065 Fax: 63-2-634-9069
Singapore
Tel: 65-6334-8870 Fax: 65-6334-8850
Tai wan - Hsin Chu
Tel: 886-3-5778-366 Fax: 886-3-5770-955
Taiwan - Kaohsiung
Tel: 886-7-213-7830
Taiwan - Taipei
Tel: 886-2-2508-8600 Fax: 886-2-2508-0102
Thailand - Bangkok
Tel: 66-2-694-1351 Fax: 66-2-694-1350
EUROPE
Austria - Wels
Tel: 43-7242-2244-39 Fax: 43-7242-2244-393
Denmark - Copenhagen
Tel: 45-4450-2828 Fax: 45-4485-2829
France - Paris
Tel: 33-1-69-53-63-20 Fax: 33-1-69-30-90-79
Germany - Dusseldorf
Tel: 49-2129-3766400
Germany - Munich
Tel: 49-89-627-144-0 Fax: 49-89-627-144-44
Germany - Pforzheim
Tel: 49-7231-424750
Italy - Milan
Tel: 39-0331-742611 Fax: 39-0331-466781
Italy - Venice
Tel: 39-049-7625286
Netherlands - Drunen
Tel: 31-416-690399 Fax: 31-416-690340
Poland - Wars a w
Tel: 48-22-3325737
Spain - Madrid
Tel: 34-91-708-08-90 Fax: 34-91-708-08-91
Sweden - Stockholm
Tel: 46-8-5090-4654
UK - Wokingham
Tel: 44-118-921-5800 Fax: 44-118-921-5820
03/25/14
DS20005339A-page 70 2014 Microchip Technology Inc.
Loading...