Datasheet MCP8025, MCP8026 Datasheet

MCP8025/6

3-Phase Brushless DC (BLDC) Motor Gate Driver with Power Module, Sleep Mode, LIN Transceiver

Features

• AEC-Q100 Grade 0 Qualified
• Quiescent Current:
- Sleep Mode: 5 µA Typical
- Standby Mode: < 200 µA
• LIN Transceiver Interface (MCP8025):
2.2, and SAE J2602
- Supports baud rates up to 20K baud
- Internal pull-up resistor and diode
- Protected against ground shorts
- Protected against loss of ground
- Automatic thermal shutdown
- LIN Bus dominant timeout
• Three Half-Bridge Drivers Configured to Drive External High-Side NMOS and Low-Side NMOS MOSFETs:
- Independent input control for high-side
NMOS and low-side NMOS MOSFETs
- Peak output current: 0.5A @ 12V
- Shoot-through protection
- Overcurrent and short circuit protection
• Adjustable Output Buck Regulator (750 mW)
• Fixed Output Linear Regulators:
- 5V@30mA
-12V@30mA
• Operational Amplifiers:
- one in MCP8025
- three in MCP8026
• Overcurrent Comparator with DAC Reference
• Phase Comparator With Multiplexer (MCP8025)
• Neutral Simulator (MCP8025)
• Level Translators (MCP8026)
• Input Voltage Range: 6V – 40V
• Operational Voltage Range:
-6V–19V (MCP8025)
-6V–28V (MCP8026)
• Buck Regulator Undervoltage Lockout: 4.0V
• Undervoltage Lockout (UVLO): 5.5V (except Buck)
• Overvoltage Lockout (OVLO)
-20V (MCP8025)
-32V (MCP8026)
• Transient (100 ms) Voltage Tolerance: 48V
• Extended Temperature Range (T
• Thermal Shutdown
): -40 to +150°C
A

Applications

• Automotive Fuel, Water, Ventilation Motors
• Home Appliances
• Permanent Magnet Synchronous Motor (PMSM) Control
• Hobby Aircraft, Boats, Vehicles

Description

The MCP8025/6 devices are 3-phase brushless DC (BLDC) power modules containing three integrated half-bridge drivers capable of driving three external NMOS/NMOS transistor pairs. The three half-bridge drivers are capable of delivering a peak output current of 0.5A at 12V for driving high-side and low-side NMOS MOSFET transistors. The drivers have shoot-through, overcurrent and short-circuit protection. A Sleep Mode has been added to achieve a typical “key-off” quiescent current of 5 µA.
The MCP8025 device integrates a comparator, a buck voltage regulator, two LDO regulators, power monitoring comparators, an overtemperature sensor, a LIN transceiver, a zero-crossing detector, a neutral simulator and an operational amplifier for motor current monitoring. The phase comparator and multiplexer allow for hardware commutation detection. The neutral simulator allows commutation detection without a neutral tap in the motor. The buck converter is capable of delivering 750 mW of power for powering a companion microcontroller. The buck regulator may be disabled if not used. The on-board 5V and 12V low­dropout voltage regulators are capable of delivering 30 mA of current.
The MCP8026 replaces the LIN transceiver, neutral simulator and zero-crossing detector in MCP8025 with two level shifters and two additional op amps.
The MCP8025/6 operation is specified over a temperature range of -40°C to +150°C.
Package options include 40-lead 5x5 QFN and 48-lead 7x7 TQFP with Exposed Pad (EP).
2014 Microchip Technology Inc. DS20005339A-page 1
MCP8025/6
5mm x 5mm QFN-40
7mm x 7mm TQFP-48
+
EP 41
EP 49
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
171819
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
1
2
3
4
5
6
7
8
9
10
11
12
131415
16
171819
20
21
222324
36
35
34
33
32
31
30
29
28
27
26
25
484746
45
444342
41
40
393837
PWM2H
PWM1L
PWM1H
CE
LIN_BUS
RX
TX
FAULTn
/TXE
MUX1
MUX2
+12V V
BA
V
BB
V
BC
PHA
PHB
PHC HSA
HSB
HSC
ZC_OUT
COMP_REF
ILIMIT_OUT
I_OUT1
I_SENSE1-
I_SENSE1+
P
GND
LSA
LSB
LSC
PWM2L
PWM3H
PWM3L
DE2
CAP1
CAP2
+5VFBVDDLX
PWM2H
PWM1L
PWM1H
CE
LIN_BUS
RX
TX
FAULTn
/TXE
MUX1
MUX2
NC
NC
P
GND
ZC_OUT
COMP_REF
ILIMIT_OUT
I_OUT1
I_SENSE1-
I_SENSE1+
P
GND
LSA
LSB
LSC
P
GND
P
GND
+12V V
BA
V
BB
V
BC
PHA
PHB
PHC HSA
HSB
HSC
P
GND
P
GND
PWM2L
PWM3H
PWM3L
DE2
CAP1
CAP2
+5V
FB
VDDLX
V
DD

Package Types – MCP8025

DS20005339A-page 2 2014 Microchip Technology Inc.

Package Types – MCP8026

5mm x 5mm QFN-40
7mm x 7mm TQFP-48
EP 41
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
171819
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
PWM2H
PWM1L
PWM1H
CE
HV_IN1
LV_O UT1
IOUT3 ISENSE3-
ISENSE3+
IOUT2
+12V V
BA
V
BB
V
BC
PHA
PHB
PHC HSA
HSB
HSC
ISENSE2-
ISENSE2+
ILIMIT_OUT
I_OUT1
I_SENSE1-
I_SENSE1+
P
GND
LSA
LSB
LSC
PWM2L
PWM3H
PWM3L
DE2
CAP1
CAP2
+5V
FB
VDDLX
+
EP 49
1
2
3
4
5
6
7
8
9
10
11
12
131415
16
171819
20
21
222324
36
35
34
33
32
31
30
29
28
27
26
25
484746
45
444342
41
40
393837
PWM2H
PWM1L
PWM1H
CE
HV_IN1
LV_OUT1
IOUT3
ISENSE3-
ISENSE3+
IOUT2
LV_OUT2
HV_IN2
P
GND
ISENSE2-
ISENSE2+
ILIMIT_OUT
I_OUT1
I_SENSE1-
I_SENSE1+
P
GND
LSA
LSB
LSC
P
GND
P
GND
+12V V
BA
V
BB
V
BC
PHA
PHB
PHC HSA
HSB
HSC
P
GND
P
GND
PWM2L
PWM3H
PWM3L
DE2
CAP1
CAP2
+5V
FB
VDDLX
V
DD
MCP8025/6
2014 Microchip Technology Inc. DS20005339A-page 3
LIN
XCVR
CE
FAULTn/TXE
RX
TX
PWM1H
PWM1L
PWM2H
PWM2L
PWM3H
PWM3L
LIN_BUS
MUX
+
-
PHA PHB PHC
PGND
ZC_OUT
COMP_REF
NEUTRAL_SIM
MUX1 MUX2
MOTOR CONTROL UNIT
COMMUNICATION PORT BIAS GENERATOR
+12V
HSA
HSB
HSC
LSA
LSB
LSC
VBA VBB VBC
GATE
CONTROL
LOGIC
I
I
I
I
I
I
I
I
I
O
O
O
O
O
O
O
VDD
I_OUT1
+
-
+
-
ILIMIT_OUT
I_SENSE1+
I_SENSE1-
DRIVER
FAULT
VDD
I
I
I/O
I/O
O
I
I
I
I
IO
PHASE DETECT
ILIMIT_REF
LDO
BUCK SMPS
SUPERVISOR
LDO
CHARGE PUMP
DE2
VDD
+5V
LX FB
+12V
CAP2
CAP1
SIM Select
MCP8025/6

Functional Block Diagram – MCP8025

DS20005339A-page 4 2014 Microchip Technology Inc.
GATE
CONTROL
LOGIC
CE
PWM1H
PWM1L
PWM2H
PWM2L
PWM3H
PWM3L
HV_IN1
I_OUT1
+
-
+
-
PHA PHB PHC
PGND
ILIMIT_OUT
MOTOR CONTROL UNIT
COMMUNICATION PORT BIAS GENERATOR
+12V
HSA
HSB
HSC
I_SENSE1+
LSA
LSB
LSC
I_SENSE1-
VBA VBB VBC
LV_OUT1
LEVEL
TRANSLATOR
VDD
+
-
+
-
I_SENSE2+
I_SENSE2-
I_SENSE3+
I_SENSE3-
I_OUT2
I_OUT3
DRIVER
FAULT
I
I
I
I
I
I
I
I
I
I
I
O
O
O
O
O
O
O
O
LDO
BUCK SMPS
SUPERVISOR
LDO
CHARGE PUMP
DE2
VDD
+5V
LX FB
+12V
CAP2
CAP1
ILIMIT_REF
HV_IN2
LV_OUT2
O
I

Functional Block Diagram – MCP8026

MCP8025/6
2014 Microchip Technology Inc. DS20005339A-page 5
DS20005339A-page 6 2014 Microchip Technology Inc.
LIN
XCVR
CE
FAULTn/TXE
RX TX
PWM1H
PWM1L
PWM2H
PWM2L
PWM3H
PWM3L
LIN_BUS
MUX
+
-
PHA PHB PHC
PGND
ZC_OUT
COMP_REF
NEUTRAL_SIM
DE2
MUX1 MUX2
MOTOR CONTROL UNIT
COMMUNICATION PORT BIAS GENERATOR
LDO
BUCK SMPS
SUPERVISOR
VDD
LDO
+5V
LX FB
+12V
+12V
HSA
HSB
HSC
LSA
LSB
LSC
VBA VBB VBC
GATE
CONTROL
LOGIC
I
I
I
I
I
I
I
I
I
O
O
O
O
O
O
O
VDD
I_OUT1
+
-
+
-
ILIMIT_OUT
I_SENSE1+
I_SENSE1-
DRIVER
FAULT
VDD
I
I
I/O
I/O
O
I
I
I
I
IO
CAP1
CHARGE PUMP
CB
A
+ _
E
VADJ
PHASE DETECT
+12V
ILIMIT_REF
CAP2
100 nF
Ceramic
SIM Select

Typical Application Circuit – MCP8025

MCP8025/6
2014 Microchip Technology Inc. DS20005339A-page 7
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Typical Application Circuit – MCP8026

MCP8025/6
MCP8025/6
NOTES:
DS20005339A-page 8 2014 Microchip Technology Inc.
MCP8025/6

1.0 ELECTRICAL CHARACTERISTICS

† Notice: Stresses above those listed under “Maximum
Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device at those or any other conditions above those

Absolute Maximum Ratings †

Input Voltage, VDD.............................(GND – 0.3V) to +46.0V
Input Voltage, < 100 ms Transient ...............................+48.0V
Internal Power Dissipation ...........................Internally-Limited
Operating Ambient Temperature Range .......-40°C to +150°C
Operating Junction Temperature (Note 2) ....-40°C to +160°C
Transient Junction Temperature (Note 1)...................+170°C
Storage Temperature (Note 2)......................-55°C to +150°C
Digital I/O .......................................................... -0.3V to 5.5V
LV Analog I/O.................................................... -0.3V to 5.5V
VBx ..................................................(GND – 0.3V) to +46.0V
PHx, HSx .........................................(GND – 5.5V) to +46.0V
ESD and Latch-Up Protection:
, LIN_BUS/HV_IN1  8 kV HBM and  750V CDM
V
DD
All other pins ..................... 2 kV HBM and 750V CDM
Latch-up protection – all pins .............................. > 100 mA
indicated in the operational listings of this specification is not implied. Exposure to maximum rating conditions for extended periods may affect device reliability.
Note 1: Transient junction temperatures should not
2: The maximum allowable power dissipation

AC/DC CHARACTERISTICS

Electrical Specifications: Unless otherwise noted, T
Parameters Symbol Min. Typ. Max. Units Conditions
POWER SUPPLY INPUT
Input Operating Voltage V
Transient Maximum Voltage V
Input Current (MCP8025)V
Input Current (MCP8026)V
Digital Input/Output DIGITAL
Digital Open-Drain Drive
DD
DDmax
DD
DD
DIGITAL
I/O
IOL
Streng th
Note 1: 1000 hour cumulative maximum for ROM data retention (typical).
2: Limits are by design, not production tested.
= -40°C to +150°C, typical values are for +25°C, VDD=13V.
J
6.0 19.0 V Operating (MCP8025)
6.0 28.0 Operating (MCP8026)
6.0 40.0 Shutdown
4.0 32.0 Buck Operating Range
48.0 V < 100 ms
———µAVDD>13V
5 15 Sleep Mode
175 Standby, CE = 0V, T
175 Standby, CE = 0V, TJ= +25°C
195 300 Standby, CE = 0V, T
—940— Active, CE>V
—1150— Active, VDD=6V, TJ=+25°C
———µAVDD>13V
5 15 Sleep Mode
120 Standby, CE = 0V, T
120 Standby, CE = 0V, TJ= +25°C
144 300 Standby, CE = 0V, T
—950— Active, CE>V
1090 Active, VDD=6V, TJ=+25°C
0—5.5V
—1—mAVDS<50mV
exceed one second in duration. Sustained junction temperatures above 170°C may impact the device reliability.
is a function of ambient temperature, the maximum allowable junction temperature and the thermal resistance from junction to air (i.e., T
, TJ, JA). Exceeding the maxi-
A
mum allowable power dissipation may cause the device operating junction tem­perature to exceed the maximum 160°C rating. Sustained junction temperatures above 150°C can impact the device reliabil­ity and ROM data retention.
=-45°C
J
= +150°C
J
DIG_HI_TH
=-45°C
J
= +150°C
J
DIG_HI_TH
2014 Microchip Technology Inc. DS20005339A-page 9
MCP8025/6
AC/DC CHARACTERISTICS (CONTINUED)
Electrical Specifications: Unless otherwise noted, T
Parameters Symbol Min. Typ. Max. Units Conditions
Digital Input Rising Threshold V
Digital Input Falling Threshold V
Digital Input Hysteresis V
Digital Input Current I
Analog Low-Voltage Input ANALOG
Analog Low-Voltage Output
DIG_HI_TH
DIG_LO_TH
DIG_HYS
DIG
ANALOG
VIN
VOUT
BIAS GENERATOR +12V Regulated Charge Pump
Charge Pump Current I
Charge Pump Start CP
Charge Pump Stop CP
Charge Pump Frequency
CP
CP
START
STOP
FSW
(50% charging/ 50% discharging)
Charge Pump Switch
CP
RDSON
Resistance
Output Voltage V
Output Voltage Tolerance |TOLV
Output Current I
Output Current Limit I
Output Voltage Temperature
TCV
OUT12
OUT12
OUT
LIMIT
OUT12
|— — 4.0 %I
Coefficient Line Regulation |V
(V
OUT
Load Regulation |V
Power Supply Rejection
/
OUT
x VDD)|
OUT/VOUT
|— 0.2 0.5 %I
PSRR 60 dB f = 1 kHz, I
Ratio
+5V Linear Regulator
Output Voltage V
Output Voltage Tolerance |TOLV
Output Current I
Output Current Limit I
Output Voltage Temperature
|TCV
OUT5
|— — 4.0 %
OUT5
OUT
LIMIT
|—50—ppm/°C
OUT5
Coefficient Line Regulation |V
(V
OUT
Load Regulation |V
/
OUT
x VDD)|
OUT/VOUT
|— 0.2 0.5 %I
Note 1: 1000 hour cumulative maximum for ROM data retention (typical).
2: Limits are by design, not production tested.
= -40°C to +150°C, typical values are for +25°C, VDD= 13V.
J
1.26 V
——0.54V
—500—mV
—3010AV
—0.2— V
0 5.5 V Excludes LIN and high-voltage
0—V
OUT5
20 mA VDD=9.0V
11.0 11.5 V VDD falling
12.0 12.5 V VDD rising
76.80 kHz VDD=9.0V
—0— V
—14— RDSON sum of high side and
—12— VVDD 7.5V, C
—9— V
30 mA Average current
40 50 mA Average current
—50—ppm/°C
—0.10.5%/V13V<V
—5—VVDD=V
30 mA Average current
40 50 mA Average current
—0.10.5%/V6V<V
=3.0V
DIG
=0V
DIG
pins
V Excludes LIN and high-voltage
pins
= 13V (stopped)
DD
low side
=100nF,
DD
OUT5
DD
PUMP
PUMP
< 19V,
=10mA
OUT
+1V,
<19V, I
= 260 nF,
=20mA
OUT
=20mA
I
OUT
=5.1V, C
DD
=15mA
I
OUT
=1mA
OUT
=20mA
I
OUT
= 0.1 mA to 15 mA
OUT
=1mA
I
OUT
= 0.1 mA to 15 mA
OUT
DS20005339A-page 10 2014 Microchip Technology Inc.
MCP8025/6
AC/DC CHARACTERISTICS (CONTINUED)
Electrical Specifications: Unless otherwise noted, T
Parameters Symbol Min. Typ. Max. Units Conditions
Dropout Voltage VDD–V
Power Supply Rejection
OUT5
PSRR 60 dB f = 1 kHz, I
Ratio
Buck Regulator
Feedback Voltage V
FB
Feedback Voltage Tolerance TOLVFB ——5.0%IFB=1µA
Feedback Voltage Line Regulation
Feedback Voltage Load
V
V
V
)/
FB/VFB
|
DD
|—0.10.5%I
FB/VFB
Regulation
Feedback Input Bias Current I
Feedback Voltage
FB
V
BUCK_DIS
To Shutdown Buck Regulator
Switching Frequency f
Duty Cycle Range DC
PMOS Switch On Resistance R
PMOS Switch Current Limit I
Ground Current –
SW
MAX
DSON
P(MAX)
I
GND
PWM Mode
Quiescent Current –
I
Q
PFM Mode
Output Voltage Adjust Range V
Output Current I
Output Power P
OUT
OUT
OUT
V oltage Supervisor
Buck Input Undervoltage
UVLO
BK_STRT
Lockout – Start-Up
Buck Input Undervoltage
UVLO
BK_STOP
Lockout – Shutdown
Buck Input Undervoltage
UVLO
BK_HYS
Lockout Hysteresis
5V LDO Undervoltage Fault
UVLO
5VLDO_INACT
Inactive
5V LDO Undervoltage Fault
UVLO
5VLDO_ACT
Active
5V LDO Undervoltage Fault
UVLO
5VLDO_HYS
Hysteresis
Input Undervoltage Lockout –
UVLO
STRT
Start -Up
Input Undervoltage Lockout -
UVLO
STOP
Shutdown
Note 1: 1000 hour cumulative maximum for ROM data retention (typical).
2: Limits are by design, not production tested.
= -40°C to +150°C, typical values are for +25°C, VDD=13V.
J
—180350mVI
OUT
=20mA, measurement taken when output voltage drops 2% from no-load value.
1.19 1.25 1.31 V
—0.10.5%/VV
= 6V to 28V
DD
= 5 mA to 150 mA
OUT
-100 +100 nA Sink/Source
2.5 5.5 V VDD>6V
—461—kHz
3—96%
—0.6— TJ=25°C
—2.5— A
1.5 2.5 mA Switching
—15020AI
OUT
=0mA
2.0 5.0 V
150 mA 5V, VDD–V
250 3V, VDD–V
—750—mWP=I
OUTxVOUT
—4.34.5 VVDD rising
3.8 4.0 V VDD falling
—0.3— V
—4.5— VV
—4.0— VV
OUT5
OUT5
rising
falling
—0.5— V
—6.06.25VVDD rising
5.1 5.5 V VDD falling
OUT
OUT
OUT
=10mA
>0.5V
> 0.5V
2014 Microchip Technology Inc. DS20005339A-page 11
MCP8025/6
AC/DC CHARACTERISTICS (CONTINUED)
Electrical Specifications: Unless otherwise noted, T
Parameters Symbol Min. Typ. Max. Units Conditions
Input Undervoltage Lockout
UVLO
HYS
Hysteresis
Input Overvoltage Lockout –
DOVLO
STOP
Driver Disabled (MCP8025)
Input Overvoltage Lockout –
DOVLO
STRT
Driver Enabled (MCP8025)
Input Overvoltage Lockout
DOVLO
HYS
Hysteresis (MCP8025)
Input Overvoltage Lockout –
AOVLO
STOP
All Functions Disabled
Input Overvoltage Lockout –
AOVLO
STRT
All Functions Enabled
Input Overvoltage Lockout
AOVLO
HYS
Hysteresis
Temperature Supervisor
Thermal Warning
T
WARN
Temperature Thermal Warning Hysteresis T
Thermal Shutdown
WARN
T
SD
Temperature
Thermal Shutdown
T
SD
Hysteresis
MOTOR CONTROL UNIT Output Drivers
PWMH/L Input Pull Down R
Output Driver Source Current I
Output Driver Sink Current I
Output Driver Source
PULLDN
SOURCE
SINK
R
DSON
Resistance
Output Driver Sink
R
DSON
Resistance
Output Driver Blanking t
Output Driver UVLO
BLANK
D
UVLO
Threshold
Output Driver UVLO
t
DUVLO
Minimum Duration
Output Driver HS Drive
V
HS
Voltage
Output Driver LS Drive
V
LS
Voltage
Output Driver Bootstrap
V
BOOTSTRAP
Voltage
Note 1: 1000 hour cumulative maximum for ROM data retention (typical).
2: Limits are by design, not production tested.
= -40°C to +150°C, typical values are for +25°C, VDD= 13V.
J
0.20 0.45 0.70 V
20.0 20.5 V VDD rising
18.75 19.5 V VDD falling
0.15 0.5 0.75 V
32.0 33.0 V VDD rising
29.0 30.0 V VDD falling
1.0 2.0 3.0 V
—72—%TSDRising temperature (115°C)
15 °C Falling temperature
160 170 °C Rising temperature
25 °C Falling temperature
—47—k
0.3 A VDD= 12V, HS[A:C], LS[A:C]
0.3 A VDD= 12V, HS[A:C], LS[A:C]
—17— I
—17— I
500 4000 ns Configurable
7.2 8.0 V Config Register 0 bit 3 = 0
t
BLANK
+700
—t
BLANK
+1400
8.0 12 13.5 V With respect to the Phase pin
-5.5 With respect to ground
8.0 12 13.5 V With respect to ground
V With respect to ground
44 Continuous
48 < 100 ms
=10mA, VDD= 12V,
OUT
HS[A:C], LS[A:C]
=10mA, VDD= 12V,
OUT
HS[A:C], LS[A:C]
ns Fault latched after t
DUVLO
DS20005339A-page 12 2014 Microchip Technology Inc.
AC/DC CHARACTERISTICS (CONTINUED)
Electrical Specifications: Unless otherwise noted, T
Parameters Symbol Min. Typ. Max. Units Conditions
Output Driver Phase Pin
V
PHASE
Voltage
Output Driver Short Circuit
D
SC_THR
Protection Threshold
High Side (VDD–V Low Side (V
PHx–PGND
Output Driver Short Circuit
PHx
)
)
T
SC_DLY
Detected Propagation Delay
Output Driver OVLO Turn-Off
T
OVLO_DLY
Delay
Power-Up or Sleep to
t
POWER
Standby
Standby to Motor Operational t
Fault to Driver Output
MOTOR
T
FAULT_ OFF
Turn-Off
CE Low to Driver Output
T
DEL_OFF
Turn-Off
CE Low to Standby State t
CE Low to Sleep State t
CE Fault Clearing Pulse t
STANDBY
SLEEP
FAULT_CLR
Current Sense Amplifier
Input Offset Voltage V
Input Offset Temperature Drift V
Input Bias Current I
Common Mode Input Range V
OS
CMR
OS
B
/T
A
Note 1: 1000 hour cumulative maximum for ROM data retention (typical).
2: Limits are by design, not production tested.
= -40°C to +150°C, typical values are for +25°C, VDD=13V.
J
V With respect to ground
-5.5 44 Continuous
-5.5 48 < 100 ms
V Set In Register CFG0 —0.250— 00 (Default) —0.500— 01 —0.750— 10 —1.000— 11
———nsC
430 Detection after blanking
10 Detection during blanking,
3 5 µs Detection synchronized with
ms CE High-Low-High
—10— MCP8025 —5— MCP8026
5 µs CE High-Low-High
5 ms Standby state to Operational
10 ms Standby state to Operational
———µsC
1 UVLO, OCP faults
10 All other faults
—100250nsC
1 ms Time after CE = Low,
1 ms Time after CE = Low,
1 900 µs CE High-Low-High Transition
-3.0 +3.0 mV VCM=0V
—±2.0—µV/°CVCM=0V
-1 +1 µA
-0.3 3.5 V
MCP8025/6
= 1000 pF, VDD=12V
LOAD
value is delay after blanking
internal clock (Note 2)
Transition < 100 µs (Fault Clearing)
Transition < 0.9 ms (Fault Clearing)
state (MCP8025, Note 2)
state (MCP8026, Note 2)
= 1000 pF, VDD=12V,
LOAD
time after fault occurs.
= 1000 pF, VDD=12V,
LOAD
Time after CE = Low (Note 2)
SLEEP Bit = 0
SLEEP Bit = 1
Time (Note 2)
= -40°C to +150°C
T
A
2014 Microchip Technology Inc. DS20005339A-page 13
MCP8025/6
AC/DC CHARACTERISTICS (CONTINUED)
Electrical Specifications: Unless otherwise noted, T
Parameters Symbol Min. Typ. Max. Units Conditions
Common Mode Rejection
CMRR 80 dB Freq = 1 kHz, I
Ratio
Maximum Output Voltage
, V
V
OL
OH
Swing
Slew Rate SR ±7 V/µs Symmetrical
Gain Bandwidth Product GBWP 10.0 MHz
Current Comparator
CC
HYS
Hysteresis
Current Comparator
V
CC_CMR
Common Mode Input Range
Current Limit DAC
Resolution 8 Bits
Output Voltage Range V
Output Voltage V
Input to Output Delay T
, V
OL
DAC
DELAY
OH
Integral Nonlinearity INL -0.5 +0.5 %FSR %Full Scale Range, Note 2 Differential Nonlinearity DNL -50 +50 %LSB %LSB, Note 2
ILIMIT_OUT
Sink Current
IL
OUT
(Open-Drain)
ZC Back EMF Sampler Comparator (MCP8025)
Maximum Output Voltage Swing
Reference Input Impedance ZC
Input to Output Delay ZC
Voltage Divider RC Time
ZCVOL,
ZCV
OH
ZREF
DELAY
ZC
TRC
Constant
ZC Output Pull-Up Range ZC
ZC Output Sink Current
RPULLUP
ZC
IOL
(Open-Drain)
Back EMF Sampler Phase Multiplexer (MCP8025)
MUX[1:2] Input Pull Down R
Transition Time t
Delay from MUX Select to ZC
PULLDN
MUX
TRAN
DELAY
Out
Phase Filter Capacitors C
PHASE
COMMUNICATION PORTS Standard LIN (MCP8025) Microcontroller Interface
TX Input Pull-Up Resistor R
PUTXD
Note 1: 1000 hour cumulative maximum for ROM data retention (typical).
2: Limits are by design, not production tested.
= -40°C to +150°C, typical values are for +25°C, VDD= 13V.
J
OUT
0.05 4.5 V I
OUT
= 200 µA
—10—mV
1.0 4.5 V
0.991 4.503 V I
OUT
=1mA
——— VCFG1 Code x
13.77 mV/bit + 0.991V
0.991 Code 00H
1.872 Code 40H
4.503 Code FFH
—50—µs
—1—mAV
0.05 - 5.0 V I
ILIMIT_OUT
OUT
50 mV
=1mA
—83—k
—-500nsV
IN_STEP
=500mV, Note 2
—100— ns
3.3 10 k —1—mAVout 50 mV
—47—k —150250nsNote 2
—210— ns
1.5 pF MUX input to ground
—48 - k Pull up to 5V
=10µA
DS20005339A-page 14 2014 Microchip Technology Inc.
AC/DC CHARACTERISTICS (CONTINUED)
Electrical Specifications: Unless otherwise noted, T
Parameters Symbol Min. Typ. Max. Units Conditions
Bus Interface
LIN Bus High-Level Input
V
HI
Voltage
LIN Bus Low-Level Input
V
LO
Voltage
LIN Bus Input Hysteresis V
LIN Bus Low-Level Output
HYS
I
OL
Current
LIN Bus Input Pull-Up Current I
LIN Bus Short Circuit Current Limit
LIN Bus Low-Level Output
PU
I
SC
V
OL
Voltage
LIN Bus Input Leakage Current (at receiver during
I
BUS_PAS_DOM
dominant bus level)
LIN Bus Input Leakage Current (at receiver during recessive bus level)
I
BUS_PAS_REC
LIN Bus Input Leakage Current (disconnected from
I
BUS_NO_GND
ground)
LIN Bus Input Leakage
I
BUS_NO_BAT
Current (disconnected from V
)
DD
Receiver Center Voltage V
LIN Bus Slave Pull-Up
BUS_CNT
R
PULLUP
Resistance
LIN Dominant State Timeout t
Propagation Delay T
Symmetry T
DOM_TOUT
RX_PD
RX_SYM
V oltage Level Translators (MCP8026)
High Voltage Input Range V
Low Voltage Output Range V
IN
OUT
Input Pull-Up Resistor RPU 30 k
High-Level Input Voltage V
Low-Level Input Voltage V
Input Hysteresis V
Propagation Delay T
IH
IL
HYS
LV_ OUT
Note 1: 1000 hour cumulative maximum for ROM data retention (typical).
2: Limits are by design, not production tested.
= -40°C to +150°C, typical values are for +25°C, VDD=13V.
J
0.6 x V
DD
V Recessive state
——0.4x
V
DD
0.175 x
V
DD
7.3 mA VO=0.2xVDD, VDD=8V
16.5 VO=0.2xVDD, VDD= 18V
30.6 V
5—18A
50 200 mA
——0.2x
V
DD
-1 mA Driver OFF,
12 20 µA Driver OFF,
-1 1 mA GND = VDD=12V,
——1AVDD=0V,
0.475 x V
DD
0.5 x V
DD
0.525 x V
DD
20K 30K 47K
—25—ms
3.0 6.0 µs Propagation delay of receiver
-2 +2 µs Symmetry of receiver
0—VDDV
0—5.0VV
0.60 V
——0.40VDDVDD=15V
——0.30V
—3.06.sNote 2
MCP8025/6
VDominant state
VVHI–V
V
VV
DDVDD
DD
LO
=0.251xVDD, VDD= 18V
O
=0V, VDD=12V
V
BUS
V
V
BUS
7V < V 7V < V
0V < V
0V < V
BUS _CNT
DD
< 19V
BUS
<19V
DD
< 19V
BUS
< 19V
BUS
=(VHI–VLO)/2
propagation delay rising edge w.r.t.falling edge
=15V
2014 Microchip Technology Inc. DS20005339A-page 15
MCP8025/6
AC/DC CHARACTERISTICS (CONTINUED)
Electrical Specifications: Unless otherwise noted, T
Parameters Symbol Min. Typ. Max. Units Conditions
Maximum Communication
F
MAX
Frequency
Low-Voltage Output Sink
I
OL
Current (Open-Drain)
DE2 Communications
Baud Rate BAUD 9600 BPS
Power-Up Delay PU_DELAY 1 ms Time from rising V
DE2 Sink Current DE2
DE2 Message Response
DE2
iSINK
RSP
Time
DE2 Host Wait Time DE2
DE2 Message Receive
DE2
WAIT
RCVTOUT
Timeout
INTERNAL ROM (READ-ONLY MEMORY) DATA RETENTION
Cell High Temperature
HTOL 1000 Hours T
Operating Life
Cell Operating Life 10 Years T
Note 1: 1000 hour cumulative maximum for ROM data retention (typical).
2: Limits are by design, not production tested.
= -40°C to +150°C, typical values are for +25°C, VDD= 13V.
J
——20kHzNote 2
—1—mAV
OUT
50 mV
to DE2 active
1——mAV
50 mV, Note 2
DE2
0 µs Time from last received Stop bit
to Response Start bit, Note 2
3.125 ms Minimum Time For Host To Wait For Response. Three packets based on 9600 BAUD,
Note 2
5 ms Time between message bytes
= 150°C (Note 1)
J
= 85°C
J
DD
6V

TEMPERATURE SPECIFICATIONS

Parameters Sym. Min. Typ. Max. Units Conditions
Temperature Ranges (Note 1)
Specified Temperature Range T
Operating Temperature Range T
Storage Temperature Range T
A
A
T
J
A
Package Thermal ResistanceS
Thermal Resistance, 5 mm x 5 mm 40L-QFN
Thermal Resistance, 7 mm x 7 mm 48L-TQFP with Exposed Pad
JA
JC
JA
JC
Note 1: The maximum allowable power dissipation is a function of ambient temperature, the maximum allowable
junction temperature and the thermal resistance from junction to air (i.e., T maximum allowable power dissipation will cause the device operating junction temperature to exceed the maximum 160°C rating. Sustained junction temperatures above 160°C can impact the device reliability.
2: 1000 hour cumulative maximum for ROM data retention (typical).
-40 +150 °C
-40 +150 °C
-40 +160 °C
-55 +150 °C (Note 2)
37 °C/W 4-Layer JC51-5 standard board,
—6.9—
natural convection
—30—°C/W
—15—
, TJ, JA). Exceeding the
A
DS20005339A-page 16 2014 Microchip Technology Inc.
MCP8025/6

ESD, SUSCEPTIBILITY, SURGE AND LATCH-UP TESTING

Parameter Standard and Test Condition Value
Input voltage surges ISO 16750-2 28V for 1 minute,
45V for 0.5 seconds
ESD according to IBEE LIN EMC – Pins LIN_BUS, V
ESD HBM with 1.5 k/100 pF CEI/IEC 60749-26: 2006
ESD HBM with 1.5 k/100 pF – Pins LIN_BUS, V P
GND
ESD CDM (Charged Device Model, field-induced method – replaces machine-model method)
Latch-Up Susceptibility AEC Q100-004, 150°C > 100 mA
(HMM)
DD
, HV_IN1 against
DD
Test specification 1.0 following IEC 61000-4.2
AEC-Q100-002-Ref E JEDEC JS-001-2012
CEI/IEC 60749-26: 2006 AEC-Q100-002-Ref E JEDEC JS-001-2012
ESD-STM5.3.1-1999 ± 750V all pins
±8kV
±2kV
±8kV
2014 Microchip Technology Inc. DS20005339A-page 17
MCP8025/6
NOTES:
DS20005339A-page 18 2014 Microchip Technology Inc.
MCP8025/6
-0.010
-0.008
-0.006
-0.004
-0.002
0.000
0.002
0.004
0.006
0.008
0.010
-45 -20 5 30 55 80 105 130
155
V
OUT
= 5V
V
OUT
= 12V
0.00
0.05
0.10
0.15
0.20
0.25
0.30
0.35
-45 -20 5 30 55 80 105 130
155
Load Regulation (%)
V
OUT
= 5V
V
OUT
= 12V
012345678910
iLIMIT_OUT
DE2
0 5 10 15 20 25 30 35 40 45 50
HSA
V
BA
20 15 10
5 0
25 20 15 10
5 0
VDD= 6V
100
105
110
115
120
125
130
135
140
145
150
7 1013161922252831
Current (mA)
5V LDO
12V LDO
-40
-20
0
20
40
60
80
100
120
140
0
3
6
9
12
15
18
0 20406080100
V
IN
(V)
VIN= 14V
VIN= 15V
V
OUT
(AC)
CIN= C
OUT
= 10 µF
I
OUT
= 20 mA

2.0 TYPICAL PERFORMANCE CURVES

Note: The graphs and tables provided following this note are a statistical summary based on a limited number of
samples and are provided for informational purposes only. The performance characteristics listed herein are not tested or guaranteed. In some graphs or tables, the data presented may be outside the specified operating range (e.g., outside specified power supply range) and therefore outside the warranted range.
Note: Unless otherwise indicated, T
= +25°C; Junction Temperature (TJ) is approximated by soaking the device under
A
test to an ambient temperature equal to the desired junction temperature. The test time is small enough such that the rise in Junction temperature over the Ambient temperature is not significant.
Volts (V)
Line Regulation (%/V)
Temperature (°C)

FIGURE 2-1: LDO Line Regulation vs. Temperature.

FIGURE 2-4: Bootstrap Voltage @ 92% Duty Cycle.

Time (µs)
Temperature (°C)

FIGURE 2-2: LDO Load Regulation vs. Temperature.

FIGURE 2-3: I Message Delay.
2014 Microchip Technology Inc. DS20005339A-page 19
Time (µs)
LIMIT_OUT
Low to DE2
Voltage (V)

FIGURE 2-5: LDO Short Cir cuit Cur rent vs. Input Voltage.

(mV)
OUT
V
Time (µs)
FIGURE 2-6: 5V LDO Dynamic Linestep – Rising V
DD
.
MCP8025/6
-40
-20
0
20
40
60
80
100
120
140
0
3
6
9
12
15
18
0 20406080100
V
IN
(V)
VIN= 15V
VIN= 14V
V
OUT
(AC)
CIN= C
OUT
= 10 µF
I
OUT
= 20 mA
-40
-20
0
20
40
60
80
100
120
140
0
3
6
9
12
15
18
0 20406080100
IN
VIN= 14V
VIN= 15V
V
OUT
(AC)
CIN= C
OUT
= 10 µF
I
OUT
= 20 mA
-40
-20
0
20
40
60
80
10
11
12
13
14
15
16
0 20406080100
IN
VIN= 15V
VIN= 14V
V
OUT
(AC)
CIN= C
OUT
= 10 µF
I
OUT
= 20 mA
-100
-80
-60
-40
-20
0
20
40
60
80
100
0.0 0.5 1.0 1.5 2.0 2.5
OUT
VIN= 14V V
OUT
= 5V
C
IN
= C
OUT
= 10 µF
I
OUT
= 1 mA to 20 mA Pulse
20 mA
1 mA
-100
-80
-60
-40
-20
0
20
40
60
80
100
0.0 0.5 1.0 1.5 2.0 2.5
V
OUT
AC (mV)
1 mA
VIN= 14V V
OUT
= 12V
C
IN
= C
OUT
= 10 µF
I
OUT
= 1 mA to 20 mA Pulse
20 mA
7.0
8.0
9.0
10.0
11.0
12.0
13.0
14.0
6 101418222630
V
OUT
(V)
V
OUT
= 12V
C
IN
= C
OUT
= 10 µF
I
OUT
= 20 mA
Charge Pump
Switch Point
Note: Unless otherwise indicated, T
= +25°C; Junction Temperature (TJ) is approximated by soaking the device under
A
test to an ambient temperature equal to the desired junction temperature. The test time is small enough such that the rise in Junction temperature over the Ambient temperature is not significant.
(mV)
OUT
V
Time (µs)
FIGURE 2-7: 5V LDO Dynamic Linestep – Falling V
(V)
V
DD
.
(mV)
OUT
V
AC (mV)
V
Time (ms)

FIGURE 2-10: 5V LDO Dynamic Loadstep.

Time (µs)
FIGURE 2-8: 12V LDO Dynamic Linestep – Rising V
(V)
V
DD
.
Time (µs)
FIGURE 2-9: 12V LDO Dynamic Linestep – Falling V
DS20005339A-page 20 2014 Microchip Technology Inc.
.
DD
(mV)
OUT
V
Time (ms)

FIGURE 2-11: 12V LDO Dynamic Loadstep.

VIN(V)

FIGURE 2-12: 12V LDO Output Voltage vs. Rising Input Voltage.

MCP8025/6
0
200
400
600
800
1000
-45 -20 5 30 55 80 105 130 155
CE Low
CE High
0
200
400
600
800
1000
1200
-45 -20 5 30 55 80 105 130 155
CE Low
CE High
0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0
Dead Time
PWMxH
PWMxL
Dead Time
10
12
14
16
18
20
22
24
-45 -20 5 30 55 80 105 130 155
R
DSON
(
Ω
)
Low-Side
Note: Unless otherwise indicated, T
= +25°C; Junction Temperature (TJ) is approximated by soaking the device under
A
test to an ambient temperature equal to the desired junction temperature. The test time is small enough such that the rise in Junction temperature over the Ambient temperature is not significant.
1200
High-Side
Quiescent Current (µA)
Temperature (°C)

FIGURE 2-13: Quiescent Current vs. Temperature (MCP8025).

FIGURE 2-16: Driver R Temperature.
Temperature(°C)
DSON
vs.
Quiescent Current (µA)
Temperature (°C)

FIGURE 2-14: Quiescent Current vs. Temperature (MCP8026).

Time (µs)

FIGURE 2-15: 500 ns PWM Dead Time Injection.

2014 Microchip Technology Inc. DS20005339A-page 21
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