3-Phase Brushless DC (BLDC) Motor Gate Driver
with Power Module, Sleep Mode, LIN Transceiver
Features
• AEC-Q100 Grade 0 Qualified
• Quiescent Current:
- Sleep Mode: 5 µA Typical
- Standby Mode: < 200 µA
• LIN Transceiver Interface (MCP8025):
- Compliant with LIN Bus Specifications 1.3,
2.2, and SAE J2602
- Supports baud rates up to 20K baud
- Internal pull-up resistor and diode
- Protected against ground shorts
- Protected against loss of ground
- Automatic thermal shutdown
- LIN Bus dominant timeout
• Three Half-Bridge Drivers Configured to Drive
External High-Side NMOS and Low-Side NMOS
MOSFETs:
- Independent input control for high-side
NMOS and low-side NMOS MOSFETs
- Peak output current: 0.5A @ 12V
- Shoot-through protection
- Overcurrent and short circuit protection
• Adjustable Output Buck Regulator (750 mW)
• Fixed Output Linear Regulators:
- 5V@30mA
-12V@30mA
• Operational Amplifiers:
- one in MCP8025
- three in MCP8026
• Overcurrent Comparator with DAC Reference
• Phase Comparator With Multiplexer (MCP8025)
• Neutral Simulator (MCP8025)
• Level Translators (MCP8026)
• Input Voltage Range: 6V – 40V
• Operational Voltage Range:
-6V–19V (MCP8025)
-6V–28V (MCP8026)
• Buck Regulator Undervoltage Lockout: 4.0V
• Undervoltage Lockout (UVLO): 5.5V (except Buck)
• Overvoltage Lockout (OVLO)
-20V (MCP8025)
-32V (MCP8026)
• Transient (100 ms) Voltage Tolerance: 48V
• Extended Temperature Range (T
• Thermal Shutdown
): -40 to +150°C
A
Applications
• Automotive Fuel, Water, Ventilation Motors
• Home Appliances
• Permanent Magnet Synchronous Motor (PMSM)
Control
• Hobby Aircraft, Boats, Vehicles
Description
The MCP8025/6 devices are 3-phase brushless DC
(BLDC) power modules containing three integrated
half-bridge drivers capable of driving three external
NMOS/NMOS transistor pairs. The three half-bridge
drivers are capable of delivering a peak output current
of 0.5A at 12V for driving high-side and low-side NMOS
MOSFET transistors. The drivers have shoot-through,
overcurrent and short-circuit protection. A Sleep Mode
has been added to achieve a typical “key-off” quiescent
current of 5 µA.
The MCP8025 device integrates a comparator, a buck
voltage regulator, two LDO regulators, power
monitoring comparators, an overtemperature sensor, a
LIN transceiver, a zero-crossing detector, a neutral
simulator and an operational amplifier for motor current
monitoring. The phase comparator and multiplexer
allow for hardware commutation detection. The neutral
simulator allows commutation detection without a
neutral tap in the motor. The buck converter is capable
of delivering 750 mW of power for powering a
companion microcontroller. The buck regulator may be
disabled if not used. The on-board 5V and 12V lowdropout voltage regulators are capable of delivering
30 mA of current.
The MCP8026 replaces the LIN transceiver, neutral
simulator and zero-crossing detector in MCP8025 with
two level shifters and two additional op amps.
The MCP8025/6 operation is specified over a
temperature range of -40°C to +150°C.
Package options include 40-lead 5x5 QFN and 48-lead
7x7 TQFP with Exposed Pad (EP).
DS20005339A-page 8 2014 Microchip Technology Inc.
MCP8025/6
1.0ELECTRICAL
CHARACTERISTICS
† Notice: Stresses above those listed under “Maximum
Ratings” may cause permanent damage to the device.
This is a stress rating only and functional operation of
the device at those or any other conditions above those
Absolute Maximum Ratings †
Input Voltage, VDD.............................(GND – 0.3V) to +46.0V
Input Voltage, < 100 ms Transient ...............................+48.0V
Internal Power Dissipation ...........................Internally-Limited
Operating Ambient Temperature Range .......-40°C to +150°C
Operating Junction Temperature (Note 2) ....-40°C to +160°C
Transient Junction Temperature (Note 1)...................+170°C
Storage Temperature (Note 2)......................-55°C to +150°C
Digital I/O .......................................................... -0.3V to 5.5V
LV Analog I/O.................................................... -0.3V to 5.5V
VBx ..................................................(GND – 0.3V) to +46.0V
PHx, HSx .........................................(GND – 5.5V) to +46.0V
ESD and Latch-Up Protection:
, LIN_BUS/HV_IN1 8 kV HBM and 750V CDM
V
DD
All other pins ..................... 2 kV HBM and 750V CDM
Latch-up protection – all pins .............................. > 100 mA
indicated in the operational listings of this specification
is not implied. Exposure to maximum rating conditions
for extended periods may affect device reliability.
Note 1: Transient junction temperatures should not
2: The maximum allowable power dissipation
AC/DC CHARACTERISTICS
Electrical Specifications: Unless otherwise noted, T
ParametersSymbolMin.Typ.Max.UnitsConditions
POWER SUPPLY INPUT
Input Operating VoltageV
Transient Maximum VoltageV
Input Current (MCP8025)V
Input Current (MCP8026)V
Digital Input/OutputDIGITAL
Digital Open-Drain Drive
DD
DDmax
DD
DD
DIGITAL
I/O
IOL
Streng th
Note 1:1000 hour cumulative maximum for ROM data retention (typical).
2:Limits are by design, not production tested.
= -40°C to +150°C, typical values are for +25°C, VDD=13V.
J
6.0—19.0VOperating (MCP8025)
6.0—28.0Operating (MCP8026)
6.0—40.0Shutdown
4.0—32.0Buck Operating Range
——48.0V< 100 ms
———µAVDD>13V
—515Sleep Mode
—175—Standby, CE = 0V, T
—175—Standby, CE = 0V, TJ= +25°C
—195300Standby, CE = 0V, T
—940—Active, CE>V
—1150—Active, VDD=6V, TJ=+25°C
———µAVDD>13V
—515Sleep Mode
—120—Standby, CE = 0V, T
—120—Standby, CE = 0V, TJ= +25°C
—144300Standby, CE = 0V, T
—950—Active, CE>V
—1090—Active, VDD=6V, TJ=+25°C
0—5.5V
—1—mAVDS<50mV
exceed one second in duration. Sustained
junction temperatures above 170°C may
impact the device reliability.
is a function of ambient temperature, the
maximum allowable junction temperature
and the thermal resistance from junction to
air (i.e., T
, TJ, JA). Exceeding the maxi-
A
mum allowable power dissipation may
cause the device operating junction temperature to exceed the maximum 160°C
rating. Sustained junction temperatures
above 150°C can impact the device reliability and ROM data retention.
Electrical Specifications: Unless otherwise noted, T
ParametersSymbolMin.Typ.Max.UnitsConditions
Maximum Communication
F
MAX
Frequency
Low-Voltage Output Sink
I
OL
Current (Open-Drain)
DE2 Communications
Baud RateBAUD—9600—BPS
Power-Up DelayPU_DELAY—1—msTime from rising V
DE2 Sink CurrentDE2
DE2 Message Response
DE2
iSINK
RSP
Time
DE2 Host Wait TimeDE2
DE2 Message Receive
DE2
WAIT
RCVTOUT
Timeout
INTERNAL ROM (READ-ONLY MEMORY) DATA RETENTION
Cell High Temperature
HTOL—1000—Hours T
Operating Life
Cell Operating Life—10—Years T
Note 1:1000 hour cumulative maximum for ROM data retention (typical).
2:Limits are by design, not production tested.
= -40°C to +150°C, typical values are for +25°C, VDD= 13V.
J
——20kHzNote 2
—1—mAV
OUT
50 mV
to DE2 active
1——mAV
50 mV, Note 2
DE2
0µsTime from last received Stop bit
to Response Start bit, Note 2
3.125——msMinimum Time For Host
To Wait For Response. Three
packets based on 9600 BAUD,
Note 2
—5—msTime between message bytes
= 150°C (Note 1)
J
= 85°C
J
DD
6V
TEMPERATURE SPECIFICATIONS
ParametersSym.Min.Typ.Max.UnitsConditions
Temperature Ranges (Note 1)
Specified Temperature RangeT
Operating Temperature RangeT
Storage Temperature RangeT
A
A
T
J
A
Package Thermal ResistanceS
Thermal Resistance, 5 mm x 5 mm
40L-QFN
Thermal Resistance, 7 mm x 7 mm
48L-TQFP with Exposed Pad
JA
JC
JA
JC
Note 1:The maximum allowable power dissipation is a function of ambient temperature, the maximum allowable
junction temperature and the thermal resistance from junction to air (i.e., T
maximum allowable power dissipation will cause the device operating junction temperature to exceed the
maximum 160°C rating. Sustained junction temperatures above 160°C can impact the device reliability.
2:1000 hour cumulative maximum for ROM data retention (typical).
-40+150°C
-40+150°C
-40+160°C
-55+150°C(Note 2)
—37—°C/W 4-Layer JC51-5 standard board,
—6.9—
natural convection
—30—°C/W
—15—
, TJ, JA). Exceeding the
A
DS20005339A-page 16 2014 Microchip Technology Inc.
DS20005339A-page 18 2014 Microchip Technology Inc.
MCP8025/6
-0.010
-0.008
-0.006
-0.004
-0.002
0.000
0.002
0.004
0.006
0.008
0.010
-45 -205305580 105 130
155
V
OUT
= 5V
V
OUT
= 12V
0.00
0.05
0.10
0.15
0.20
0.25
0.30
0.35
-45 -205305580 105 130
155
Load Regulation (%)
V
OUT
= 5V
V
OUT
= 12V
012345678910
iLIMIT_OUT
DE2
0510 15 20 25 30 35 40 45 50
HSA
V
BA
20
15
10
5
0
25
20
15
10
5
0
VDD= 6V
100
105
110
115
120
125
130
135
140
145
150
7 1013161922252831
Current (mA)
5V LDO
12V LDO
-40
-20
0
20
40
60
80
100
120
140
0
3
6
9
12
15
18
0 20406080100
V
IN
(V)
VIN= 14V
VIN= 15V
V
OUT
(AC)
CIN= C
OUT
= 10 µF
I
OUT
= 20 mA
2.0TYPICAL PERFORMANCE CURVES
Note:The graphs and tables provided following this note are a statistical summary based on a limited number of
samples and are provided for informational purposes only. The performance characteristics listed herein
are not tested or guaranteed. In some graphs or tables, the data presented may be outside the specified
operating range (e.g., outside specified power supply range) and therefore outside the warranted range.
Note: Unless otherwise indicated, T
= +25°C; Junction Temperature (TJ) is approximated by soaking the device under
A
test to an ambient temperature equal to the desired junction temperature. The test time is small enough such that the
rise in Junction temperature over the Ambient temperature is not significant.
FIGURE 2-5:LDO Short Cir cuit Cur rent
vs. Input Voltage.
(mV)
OUT
V
Time (µs)
FIGURE 2-6:5V LDO Dynamic Linestep –
Rising V
DD
.
MCP8025/6
-40
-20
0
20
40
60
80
100
120
140
0
3
6
9
12
15
18
0 20406080100
V
IN
(V)
VIN= 15V
VIN= 14V
V
OUT
(AC)
CIN= C
OUT
= 10 µF
I
OUT
= 20 mA
-40
-20
0
20
40
60
80
100
120
140
0
3
6
9
12
15
18
0 20406080100
IN
VIN= 14V
VIN= 15V
V
OUT
(AC)
CIN= C
OUT
= 10 µF
I
OUT
= 20 mA
-40
-20
0
20
40
60
80
10
11
12
13
14
15
16
0 20406080100
IN
VIN= 15V
VIN= 14V
V
OUT
(AC)
CIN= C
OUT
= 10 µF
I
OUT
= 20 mA
-100
-80
-60
-40
-20
0
20
40
60
80
100
0.00.51.01.52.02.5
OUT
VIN= 14V
V
OUT
= 5V
C
IN
= C
OUT
= 10 µF
I
OUT
= 1 mA to 20 mA Pulse
20 mA
1 mA
-100
-80
-60
-40
-20
0
20
40
60
80
100
0.00.51.01.52.02.5
V
OUT
AC (mV)
1 mA
VIN= 14V
V
OUT
= 12V
C
IN
= C
OUT
= 10 µF
I
OUT
= 1 mA to 20 mA Pulse
20 mA
7.0
8.0
9.0
10.0
11.0
12.0
13.0
14.0
6 101418222630
V
OUT
(V)
V
OUT
= 12V
C
IN
= C
OUT
= 10 µF
I
OUT
= 20 mA
Charge Pump
Switch Point
Note: Unless otherwise indicated, T
= +25°C; Junction Temperature (TJ) is approximated by soaking the device under
A
test to an ambient temperature equal to the desired junction temperature. The test time is small enough such that the
rise in Junction temperature over the Ambient temperature is not significant.
(mV)
OUT
V
Time (µs)
FIGURE 2-7:5V LDO Dynamic Linestep –
Falling V
(V)
V
DD
.
(mV)
OUT
V
AC (mV)
V
Time (ms)
FIGURE 2-10:5V LDO Dynamic Loadstep.
Time (µs)
FIGURE 2-8:12V LDO Dynamic Linestep
– Rising V
(V)
V
DD
.
Time (µs)
FIGURE 2-9:12V LDO Dynamic Linestep
– Falling V
DS20005339A-page 20 2014 Microchip Technology Inc.
.
DD
(mV)
OUT
V
Time (ms)
FIGURE 2-11:12V LDO Dynamic
Loadstep.
VIN(V)
FIGURE 2-12:12V LDO Output Voltage vs.
Rising Input Voltage.
MCP8025/6
0
200
400
600
800
1000
-45 -205305580 105 130 155
CE Low
CE High
0
200
400
600
800
1000
1200
-45 -205305580105 130 155
CE Low
CE High
0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0
Dead Time
PWMxH
PWMxL
Dead Time
10
12
14
16
18
20
22
24
-45-205305580105 130 155
R
DSON
(
Ω
)
Low-Side
Note: Unless otherwise indicated, T
= +25°C; Junction Temperature (TJ) is approximated by soaking the device under
A
test to an ambient temperature equal to the desired junction temperature. The test time is small enough such that the
rise in Junction temperature over the Ambient temperature is not significant.
1200
High-Side
Quiescent Current (µA)
Temperature (°C)
FIGURE 2-13:Quiescent Current vs.
Temperature (MCP8025).
FIGURE 2-16:Driver R
Temperature.
Temperature(°C)
DSON
vs.
Quiescent Current (µA)
Temperature (°C)
FIGURE 2-14:Quiescent Current vs.
Temperature (MCP8026).