Datasheet MCM8A10SG15 Datasheet (Motorola)

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MOTOROLA
SEMICONDUCTOR TECHNICAL DATA
Advance Information
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by MCM8A10/D
MCM8A10
1M x 8 Bit Fast Static RAM Module
The MCM8A10 is an 8M bit static random access memory module organized as 1,048,576 words of 8 bits. The module is offered in a 72–lead single in–line memory module (SIMM). Eight MCM6227B fast static RAMs, packaged in 28–lead SOJ packages are mounted on a printed circuit board along with eight decoupling capacitors.
The MCM6227B is organized as 1,048,576 words of 1 bit. Static design elimi­nates the need for external clocks or timing strobes, while CMOS circuitry re­duces power consumption and provides for greater reliability .
The MCM8A10 is equipped with a chip enable (E enable (W0
– W7) inputs, allowing for greater system flexibility .
Single 5 V ± 5% Power Supply
Fast Access Times: 15 ns
Three–State Outputs
Fully TTL Compatible
High Board Density SIMM Package
Bit Operation: Eight Separate Write Enables, One for Each Bit
High Quality Six–Layer FR4 PWB with Separate Internal Power and
Ground Planes
) and eight separate write
PIN ASSIGNMENT
TOP VIEW
72-LEAD SIMM – CASE TBD
A0
11 13 15 17 19 21 23
25 27 29 31 33 35
1 3
5 7 9
A2 V
CC
A4 A6 V
SS
A8 Q0 W0 V
CC
D1 A10
V
SS
DAISY Q2 W2
V
CC
D3
A1
V
SS
A3
A5
A7
V
CC
A9
D0
V
SS
W1
Q1
A11
V
CC
DAISY
D2
V
SS
W3
Q3
2 4 6 8 10 12 14 16 18 20 22 24 26 28 30 32 34 36
PD1 38
V
PIN NAMES
A0 – A19 Address Inputs. . . . . . . . . . . . . . . . . . . . . . . . . . . . .
W0
– W7 Write Enables. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
E
D0 – D7 Data Inputs. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Q0 – Q7 Data Outputs. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
PD0 – PD2 Package Density. . . . . . . . . . . . . . . . . . . . . . . . .
DAISY Pins Single Net. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
V
CC
V
SS
For proper operation of the device, VSS must be connected to ground.
This document contains information on a new product. Specifications and information herein are subject to change without notice.
Chip Enable. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
+ 5 V Power Supply. . . . . . . . . . . . . . . . . . . . . . . . . . . .
Ground. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
CC
Q4
W4
V
CC
D5 A21 A19
V
CC
A17 A15
V
SS A13
Q6
W6
V
CC
D7E70
40 42 44 46 48 50 52 54 56
58 60 62 64 66 68
72
37 39
41 43 45
47 49 51 53 55 57 59 61 63 65 67 69 71
PD0 V
SS
PD2 D4 V
SS W5 Q5 A20
V
SS A18
A16 A14 V
CC A12
D6 V
SS W7
Q7
10/30/96
Motorola, Inc. 1996
MOTOROLA FAST SRAM
MCM8A10
1
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FUNCTIONAL BLOCK DIAGRAM
1M x 8 MEMORY MODULE
A0 – A19
E
W0
D0 Q0
D4 Q4
PD0 — Open PD1 — V PD2 — Open
SS
A0 – A19 E W D Q
1M x 1
A0 – A19 E WW4 D Q
1M x 1
D1
Q1
D5 Q5
A0 – A19 E WW1 D Q
1M x 1
A0 – A19 E WW5 D Q
1M x 1
D2
Q2
D6 Q6
A0 – A19 E WW2 D Q
1M x 1
A0 – A19 E WW6 D Q
1M x 1
D3
Q3
D7 Q7
A0 – A19 E WW3 D Q
1M x 1
A0 – A19 E WW7 D Q
1M x 1
MCM8A10 2
MOTOROLA FAST SRAM
Page 3
TRUTH TABLE
E W Mode I/O Pin Cycle Current
H X Not Selected High–Z I L H Read D L L Write High–Z Write I
NOTE: H = High, L = Low, X = Don’t Care
out
Read I
SB1
, I
CCA CCA
SB2
ABSOLUTE MAXIMUM RATINGS (See Note)
Rating Symbol Value Unit
Power Supply Voltage Relative to V Voltage Relative to VSS for Any Pin
Except V
Output Current I Power Dissipation P
Temperature Under Bias T Operating Temperature T Storage Temperature T
NOTE: Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are
CC
exceeded. Functional operation should be restricted to RECOMMENDED OPER­ATING CONDITIONS. Exposure to higher than recommended voltages for extended periods of time could affect device reliability.
SS
V
CC
Vin, V
out
bias
stg
– 0.5 to 7.0 V
– 0.5 to VCC + 0.5 V
out
± 20
D
A
8.8 W
– 10 to + 85 °C
0 to + 70 °C
– 55 to + 150 °C
mA
This device contains circuitry to protect the inputs against damage due to high static volt­ages or electric fields; however, it is advised that normal precautions be taken to avoid application of any voltage higher than maxi­mum rated voltages to these high–impedance circuits.
This CMOS memory circuit has been designed to meet the dc and ac specifications shown in the tables, after thermal equilibrium has been established. The circuit is in a test socket or mounted on a printed circuit board and transverse air flow of at least 500 linear feet per minute is maintained.
DC OPERA TING CONDITIONS AND CHARACTERISTICS
(VCC = 5.0 V ± 5%, TA = 0 to 70°C, Unless Otherwise Noted)
RECOMMENDED OPERATING CONDITIONS
Parameter Symbol Min Max Unit
Supply Voltage (Operating Voltage Range) V Input High Voltage V Input Low Voltage V
*VIL (min) = – 0.5 V dc; VIL (min) = – 2.0 V ac (pulse width 20 ns).
**VIH (max) = VCC + 0.3 V dc; VIH (max) = VCC + 2 V ac (pulse width 20 ns).
DC CHARACTERISTICS AND SUPPLY CURRENTS
Parameter Symbol Min Max Unit
Input Leakage Current (All Inputs, Vin = 0 to VCC) I Output Leakage Current (E = VIH, V AC Active Supply Current (I AC Standby Current (VCC = max, E = VIH, f f CMOS Standby Current (E VCC – 0.2 V, Vin VSS + 0.2 V or VCC – 0.2 V,
VCC = max, f = 0 MHz) Output Low Voltage (IOL = + 8.0 mA) V Output High Voltage (IOH = – 4.0 mA) V
out
= 0 to VCC) I
out
= 0 mA, VCC = max) I
) I
max
CC
IH
IL
lkg(I)
lkg(O)
CCA
SB1
I
SB2
OL OH
4.75 5.25 V
2.2 VCC +0.3** V
– 0.5* 0.8 V
± 1 µA — ± 1 µA — 920 mA — 320 mA — 40 mA
0.4 V
2.4 V
CAPACITANCE (f = 1.0 MHz, dV = 3.0 V, T
Characteristic
Input Capacitance Address Inputs
Input and Output Capacitance D, Q Cin, C
= 25°C, Periodically Sampled Rather Than 100% Tested)
A
Symbol Typ Max Unit
E
W
MOTOROLA FAST SRAM
C
in
out
42 50 10
10 13 pF
58 74 13
pF
MCM8A10
3
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AC OPERA TING CONDITIONS AND CHARACTERISTICS
(VCC = 5.0 V ± 5%, TA = 0 to + 70°C, Unless Otherwise Noted)
Input Pulse Levels 0 to 3.0 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input Rise/Fall Time 2 ns. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input Timing Measurement Reference Level 1.5 V. . . . . . . . . . . . . . .
Output Timing Measurement Reference Level 1.5 V. . . . . . . . . . . . .
Output Load See Figure 1a. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
READ CYCLE TIMING (See Notes 1 and 2)
MCM8A10–15
Parameter Symbol
Read Cycle Time t Address Access Time t Enable Access Time t Output Hold from Address Change t Enable Low to Output Active t Enable High to Output High–Z t
NOTES:
1. W
is high for read cycle.
2. Product sensitivities to noise require proper grounding and decoupling of power supplies as well as minimization or elimination of bus contention conditions during read and write cycles.
3. All timings are referenced from the last valid address to the first transitioning address.
4. Addresses valid prior to or coincident with E
5. At any given voltage and temperature, t
6. Transition is measured ± 500 mV from steady–state voltage with load of Figure 1b.
7. This parameter is sampled and not 100% tested.
8. Device is continuously selected (E
VIL).
going low.
max is less than t
EHQZ
min, both for a given device and from device to device.
ELQX
AVAV AVQV ELQV AXQX ELQX EHQZ
Min Max
15 ns 2, 3 — 15 ns — 15 ns 4
5 ns 5 ns 5, 6, 7 0 6 ns 5, 6, 7
Unit Notes
OUTPUT
RL = 50
OUTPUT
Z0 = 50
VL = 1.5 V
255
(a) (b)
Figure 1. AC Test Loads
+ 5 V
480
5 pF
The table of timing values shows either a minimum or a maximum limit for each param­eter. Input requirements are specified from the external system point of view. Thus, ad­dress setup time is shown as a minimum since the system must supply at least that much time. On the other hand, responses from the memory are specified from the de­vice point of view. Thus, the access time is shown as a maximum since the device never provides data later than that time.
TIMING LIMITS
MCM8A10 4
MOTOROLA FAST SRAM
Page 5
A (ADDRESS)
READ CYCLE 1 (See Notes 1, 2, and 8)
t
AVAV
t
AXQX
Q (DATA OUT)
A (ADDRESS)
E
(CHIP ENABLE)
Q (DATA OUT)
I
SUPPLY CURRENT
CC
I
SB
HIGH–Z
t
AVQV
READ CYCLE 2 (See Note 4)
t
AVAV
t
ELQV
t
ELQX
t
AVQV
t
ELICCH
DATA VALID
DATA VALIDPREVIOUS DATA VALID
t
EHQZ
t
EHICCL
MOTOROLA FAST SRAM
MCM8A10
5
Page 6
WRITE CYCLE 1 (W Controlled, See Notes 1 and 2)
MCM8A10–15
Parameter Symbol
Write Cycle Time t Address Setup Time t Address Valid to End of W rite t Write Pulse Width t
Data Valid to End of W rite t Data Hold TIme t Write Low to Data High–Z t Write High to Output Active t Write Recovery Time t
NOTES:
1. A write occurs during the overlap of E
2. Product sensitivities to noise require proper grounding and decoupling of power supplies as well as minimization or elimination of bus contention conditions during read and write cycles.
3. All timings are referenced from the last valid address to the first transitioning address.
4. Transition is measured ± 500 mV from steady–state voltage with load of Figure 1b.
5. This parameter is sampled and not 100% tested.
6. At any given voltage and temperature, t
low and W low.
max is less than t
WLQZ
min both for a given device and from device to device.
WHQX
AVAV
AVWL
AVWH
WLWH, t
WLEH DVWH WHDX
WLQZ WHQX WHAX
Min Max
15 ns 3
0 ns 12 ns 12 ns
7 ns
0 ns
0 6 ns 4, 5, 6
5 ns 4, 5, 6
0 ns
Unit Notes
A (ADDRESS)
(CHIP ENABLE)
E
W
(WRITE ENABLE)
D (DATA IN)
Q (DATA OUT)
WRITE CYCLE 1 (W Controlled See Notes 1 and 2)
t
AVAV
t
AVWH
t
WLWH
t
WLEH
t
AVWL
t
WLQZ
HIGH–Z HIGH–Z
t
DVWH
DATA VALID
t
WHAX
t
WHDX
t
WHQX
MCM8A10 6
MOTOROLA FAST SRAM
Page 7
WRITE CYCLE 2 (E Controlled, See Notes 1 and 2)
MCM8A10–15
Parameter Symbol
Write Cycle Time t Address Setup Time t Address Valid to End of W rite t Enable to End of Write t
Write Pulse Width t Data Valid to End of W rite t Data Hold Time t Write Recovery Time t
NOTES:
1. A write occurs during the overlap of E
2. Product sensitivities to noise require proper grounding and decoupling of power supplies as well as minimization or elimination of bus contention conditions during read and write cycles.
3. All timings are referenced from the last valid address to the first transitioning address.
4. If E
goes low coincident with or after W goes low, the output will remain in a high–impedance state.
5. If E
goes high coincident with or before W goes high, the output will remain in a high–impedance state.
low and W low.
AVAV AVEL
AVEH
ELEH,
t
ELWH WLEH DVEH EHDX
EHAX
Min Max
15 ns 3
0 ns 12 ns 10 ns 4, 5
12 ns
7 ns
0 ns
0 ns
Unit Notes
WRITE CYCLE 2 (E Controlled See Notes 1 and 2)
A (ADDRESS)
E
(CHIP ENABLE)
W (WRITE ENABLE)
D (DATA IN)
Q (DATA OUT)
t
AVEH
t
AVEL
HIGH–Z
ORDERING INFORMATION
(Order by Full Part Number)
MCM 8A10 XX XX
t
AVAV
t
WLEH
t
ELEH
t
ELWH
t
DVEH
DATA VALID
t
EHDX
t
EHAX
Part Number
MOTOROLA FAST SRAM
Speed (15 = 15 ns)Motorola Memory Prefix Package (SG = Gold Pad SIMM)
Full Part Number — MCM8A10SG15
MCM8A10
7
Page 8
P ACKAGE DIMENSIONS
72–LEAD SIMM
CASE TBD
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MCM8A10 8
MOTOROLA FAST SRAM
*MCM8A10/D*
MCM8A10/D
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