The MCM8A10 is an 8M bit static random access memory module organized
as 1,048,576 words of 8 bits. The module is offered in a 72–lead single in–line
memory module (SIMM). Eight MCM6227B fast static RAMs, packaged in
28–lead SOJ packages are mounted on a printed circuit board along with eight
decoupling capacitors.
The MCM6227B is organized as 1,048,576 words of 1 bit. Static design eliminates the need for external clocks or timing strobes, while CMOS circuitry reduces power consumption and provides for greater reliability .
The MCM8A10 is equipped with a chip enable (E
enable (W0
– W7) inputs, allowing for greater system flexibility .
• Single 5 V ± 5% Power Supply
• Fast Access Times: 15 ns
• Three–State Outputs
• Fully TTL Compatible
• High Board Density SIMM Package
• Bit Operation: Eight Separate Write Enables, One for Each Bit
• High Quality Six–Layer FR4 PWB with Separate Internal Power and
Power Supply Voltage Relative to V
Voltage Relative to VSS for Any Pin
Except V
Output CurrentI
Power DissipationP
Temperature Under BiasT
Operating TemperatureT
Storage TemperatureT
NOTE: Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are
CC
exceeded. Functional operation should be restricted to RECOMMENDED OPERATING CONDITIONS. Exposure to higher than recommended voltages for
extended periods of time could affect device reliability.
SS
V
CC
Vin, V
out
bias
stg
– 0.5 to 7.0V
– 0.5 to VCC + 0.5V
out
± 20
D
A
8.8W
– 10 to + 85°C
0 to + 70°C
– 55 to + 150°C
mA
This device contains circuitry to protect the
inputs against damage due to high static voltages or electric fields; however, it is advised
that normal precautions be taken to avoid
application of any voltage higher than maximum rated voltages to these high–impedance
circuits.
This CMOS memory circuit has been
designed to meet the dc and ac specifications
shown in the tables, after thermal equilibrium
has been established. The circuit is in a test
socket or mounted on a printed circuit board
and transverse air flow of at least 500 linear feet
per minute is maintained.
DC OPERA TING CONDITIONS AND CHARACTERISTICS
(VCC = 5.0 V ± 5%, TA = 0 to 70°C, Unless Otherwise Noted)
RECOMMENDED OPERATING CONDITIONS
ParameterSymbolMinMaxUnit
Supply Voltage (Operating Voltage Range)V
Input High VoltageV
Input Low VoltageV
*VIL (min) = – 0.5 V dc; VIL (min) = – 2.0 V ac (pulse width ≤ 20 ns).
**VIH (max) = VCC + 0.3 V dc; VIH (max) = VCC + 2 V ac (pulse width ≤ 20 ns).
DC CHARACTERISTICS AND SUPPLY CURRENTS
ParameterSymbolMinMaxUnit
Input Leakage Current (All Inputs, Vin = 0 to VCC)I
Output Leakage Current (E = VIH, V
AC Active Supply Current (I
AC Standby Current (VCC = max, E = VIH, f ≤ f
CMOS Standby Current (E ≥ VCC – 0.2 V, Vin ≤ VSS + 0.2 V or ≥ VCC – 0.2 V,
VCC = max, f = 0 MHz)
Output Low Voltage (IOL = + 8.0 mA)V
Output High Voltage (IOH = – 4.0 mA)V
out
= 0 to VCC)I
out
= 0 mA, VCC = max)I
)I
max
CC
IH
IL
lkg(I)
lkg(O)
CCA
SB1
I
SB2
OL
OH
4.755.25V
2.2VCC +0.3**V
– 0.5*0.8V
—± 1µA
—± 1µA
—920mA
—320mA
—40mA
—0.4V
2.4—V
CAPACITANCE (f = 1.0 MHz, dV = 3.0 V, T
Characteristic
Input Capacitance Address Inputs
Input and Output CapacitanceD, QCin, C
= 25°C, Periodically Sampled Rather Than 100% Tested)
A
SymbolTypMaxUnit
E
W
MOTOROLA FAST SRAM
C
in
out
42
50
10
1013pF
58
74
13
pF
MCM8A10
3
Page 4
AC OPERA TING CONDITIONS AND CHARACTERISTICS
(VCC = 5.0 V ± 5%, TA = 0 to + 70°C, Unless Otherwise Noted)
Read Cycle Timet
Address Access Timet
Enable Access Timet
Output Hold from Address Changet
Enable Low to Output Activet
Enable High to Output High–Zt
NOTES:
1. W
is high for read cycle.
2. Product sensitivities to noise require proper grounding and decoupling of power supplies as well as minimization or elimination of bus
contention conditions during read and write cycles.
3. All timings are referenced from the last valid address to the first transitioning address.
4. Addresses valid prior to or coincident with E
5. At any given voltage and temperature, t
6. Transition is measured ± 500 mV from steady–state voltage with load of Figure 1b.
7. This parameter is sampled and not 100% tested.
8. Device is continuously selected (E
≤ VIL).
going low.
max is less than t
EHQZ
min, both for a given device and from device to device.
ELQX
AVAV
AVQV
ELQV
AXQX
ELQX
EHQZ
MinMax
15—ns2, 3
—15ns
—15ns4
5—ns
5—ns5, 6, 7
06ns5, 6, 7
UnitNotes
OUTPUT
RL = 50
Ω
OUTPUT
Z0 = 50
Ω
VL = 1.5 V
255
(a)(b)
Figure 1. AC Test Loads
+ 5 V
480
Ω
Ω
5 pF
The table of timing values shows either a
minimum or a maximum limit for each parameter. Input requirements are specified from
the external system point of view. Thus, address setup time is shown as a minimum
since the system must supply at least that
much time. On the other hand, responses
from the memory are specified from the device point of view. Thus, the access time is
shown as a maximum since the device never
provides data later than that time.
TIMING LIMITS
MCM8A10
4
MOTOROLA FAST SRAM
Page 5
A (ADDRESS)
READ CYCLE 1 (See Notes 1, 2, and 8)
t
AVAV
t
AXQX
Q (DATA OUT)
A (ADDRESS)
E
(CHIP ENABLE)
Q (DATA OUT)
I
SUPPLY CURRENT
CC
I
SB
HIGH–Z
t
AVQV
READ CYCLE 2 (See Note 4)
t
AVAV
t
ELQV
t
ELQX
t
AVQV
t
ELICCH
DATA VALID
DATA VALIDPREVIOUS DATA VALID
t
EHQZ
t
EHICCL
MOTOROLA FAST SRAM
MCM8A10
5
Page 6
WRITE CYCLE 1 (W Controlled, See Notes 1 and 2)
MCM8A10–15
ParameterSymbol
Write Cycle Timet
Address Setup Timet
Address Valid to End of W ritet
Write Pulse Widtht
Data Valid to End of W ritet
Data Hold TImet
Write Low to Data High–Zt
Write High to Output Activet
Write Recovery Timet
NOTES:
1. A write occurs during the overlap of E
2. Product sensitivities to noise require proper grounding and decoupling of power supplies as well as minimization or elimination of bus
contention conditions during read and write cycles.
3. All timings are referenced from the last valid address to the first transitioning address.
4. Transition is measured ± 500 mV from steady–state voltage with load of Figure 1b.
5. This parameter is sampled and not 100% tested.
6. At any given voltage and temperature, t
low and W low.
max is less than t
WLQZ
min both for a given device and from device to device.
WHQX
AVAV
AVWL
AVWH
WLWH,
t
WLEH
DVWH
WHDX
WLQZ
WHQX
WHAX
MinMax
15—ns3
0—ns
12—ns
12—ns
7—ns
0—ns
06ns4, 5, 6
5—ns4, 5, 6
0—ns
UnitNotes
A (ADDRESS)
(CHIP ENABLE)
E
W
(WRITE ENABLE)
D (DATA IN)
Q (DATA OUT)
WRITE CYCLE 1 (W Controlled See Notes 1 and 2)
t
AVAV
t
AVWH
t
WLWH
t
WLEH
t
AVWL
t
WLQZ
HIGH–ZHIGH–Z
t
DVWH
DATA VALID
t
WHAX
t
WHDX
t
WHQX
MCM8A10
6
MOTOROLA FAST SRAM
Page 7
WRITE CYCLE 2 (E Controlled, See Notes 1 and 2)
MCM8A10–15
ParameterSymbol
Write Cycle Timet
Address Setup Timet
Address Valid to End of W ritet
Enable to End of Writet
Write Pulse Widtht
Data Valid to End of W ritet
Data Hold Timet
Write Recovery Timet
NOTES:
1. A write occurs during the overlap of E
2. Product sensitivities to noise require proper grounding and decoupling of power supplies as well as minimization or elimination of bus
contention conditions during read and write cycles.
3. All timings are referenced from the last valid address to the first transitioning address.
4. If E
goes low coincident with or after W goes low, the output will remain in a high–impedance state.
5. If E
goes high coincident with or before W goes high, the output will remain in a high–impedance state.
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