Datasheet MCM72PB8ML3.5, MCM72FB8ML8, MCM72FB8ML8R, MCM72FB8ML7.5R, MCM72PB8ML4R Datasheet (Motorola)

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Page 1
MOTOROLA
SEMICONDUCTOR TECHNICAL DATA
Advance Information
256K x 72 Bit BurstRAM
Order this document
by MCM72FB8ML/D
MCM72FB8ML MCM72PB8ML
Multichip Module
Addresses (SA), data inputs (DQx), and all control signals except output enable (G edge–triggered noninverting registers.
addresses can be generated internally (burst sequence operates in linear or interleaved mode dependent upon the state of LBO address advance (ADV
clock (K) input. This feature eliminates complex off–chip write pulse generation and provides increased timing flexibility for incoming signals.
nous write enable (SW to all bytes. The eight bytes are designated as “a” through “h”. SBa SBb are asserted with SW. All bytes are written if either SGW is asserted or if all SBx and SW are asserted.
For read cycles, pipelined SRAMs output data is temporarily stored by an edge– triggered output register and then released to the output buffers at the next rising edge of clock (K). Flow–through SRAMs allow output to simply flow freely from the memory array.
operate on a separate 2.5 V or 3.3 V power supply. All inputs and outputs are JEDEC standard JESD8–5 compatible.
3.3 V + 10%, – 5% Core Power Supply , 2.5 V or 3.3 V I/O Supply
ADSP
Option for Pipeline or Flow–Through (Speeds Guaranteed When Module is
Selectable Burst Sequencing Order (Linear/Interleaved)
Single–Cycle Deselect Timing
Internally Self–Timed Write Cycle
Byte Write and Global Write Control
JEDEC BGA Pin Assignment
) and linear burst order (LBO) are clock (K) controlled through positive–
Bursts can be initiated with either ADSP
) input pin.
Write cycles are internally self–timed and are initiated by the rising edge of the
Synchronous byte write (SBx
) are provided to allow writes to either individual bytes or
controls DQb, etc. Individual bytes are written if the selected byte writes SBx
The module can be configured as either a pipelined or flow–through SRAM.
The multichip module operates from a 3.3 V core power supply and all outputs
, ADSC, and ADV Burst Control Pins
Purchased by Appropriate Part Number)
), synchronous global write (SGW), and synchro-
or ADSC input pins. Subsequent burst
) and controlled by the burst
controls DQa,
MULTICHIP MODULE
PIN A1 INDICA TION
(corner without
fiducial)
PIN A1 INDICA TION
(corner with
fiducial)
PBGA
CASE 1103B–01
TOP VIEW
BOTTOM VIEW
(Drawings Not to Scale)
The PowerPC name is a trademark of IBM Corp., used under license therefrom.
This document contains information on a new product. Specifications and information herein are subject to change without notice.
REV 1 7/30/97
Motorola, Inc. 1997
MOTOROLA FAST SRAM
MCM72FB8ML MCM72PB8ML
1
Page 2
256K X 72 FOUR–CHIP MODULE BLOCK DIAGRAM
SA2 – SA17
SA0 SA1
ADSP ADSC
ADV
K
G SE1 SE2 SE3
LBO
SW
SGW
FT
18
MCM69P/F819DC*
SA2 – SA17 SA0 SA1 ADSP ADSC ADV K G SE1 SE2 SE3 LBO SW SGW
FT
SA2 – SA17 SA0
SA1 ADSP ADSC ADV K G SE1 SE2 SE3 LBO SW SGW FT
SA2 – SA17 SA0
SA1 ADSP ADSC ADV K G SE1 SE2 SE3 LBO SW
SGW FT
DQ0 – DQ8
DQ9 – DQ17
MCM69P/F819DC*
DQ0 – DQ8
DQ9 – DQ17
MCM69P/F819DC*
DQ0 – DQ8
DQ9 – DQ17
LW
UW
LW
UW
LW
UW
SBa
SBb
SBc
SBd
SBe
SBf
9
DQa
9
DQb
9
DQc
9
DQd
9
DQe
9
DQf
* Motorola TrueDie devices.
MCM72FB8ML MCM72PB8ML 2
MCM69P/F819DC*
SA2 – SA17 SA0
SA1 ADSP ADSC ADV K G
SE1 SE2 SE3
LBO SW SGW
FT
DQ0 – DQ8
DQ9 – DQ17
LW
UW
SBg
9
DQg
SBh
9
DQh
MOTOROLA FAST SRAM
Page 3
PIN ASSIGNMENT
109876511
A
DQe SA
DQe SA SA SE1
B
DQe DQe SA SA
C D E
F G
H J
K L M N P
R T U V W
DQe SE2 V
DQe DQe DQe V
DQfDQe
DQf DQf V
DQfDQf
DQf
DQf V DQfDQf
SBf
SBg NC VSSV DQgDQg
DQg DQg V
DQgDQg
DQg DQg V
DQh K
DQg
DQh V
DQh
DQh
DQh V
DQh NC SA SA0NCSA
DQh DQh NC
V
DDQVDD
V
V
DDQ
DDQVDD
V
V
DDQ
DDQVSS
V
SBe
V
SBh
V
DDQ
V
V
DDQ DDQVDD
V
V
DDQ DDQ
LBO
V
NCDQh
SA
G
SA
SGW
ADV ADSC ADSP
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
NC
SW
SA1
V
DDQ
DDQ
V
SS
V
SS
DD
V
SS
V
SS
DD
V
SS
V
SS
SS
SS
V
SS
SS
V
SS
SS
V
SS
DD
V
SS
V
SS
DD
V
V
DD
SS
V
DDQ
DDQ
SA
NC
NC
SA DQd
SA DQd
SA
DDQ V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
DDQ
SA
SA
SE3
V
DDQ V
V
DD
DDQ
V
DD
DDQ
V
V
DD
DDQ
V
DD
DDQ
V
V
DDQ
SS
V
SS
VSSNC SBb V
SS
V
V
DDQ
SS
V
DDQ
DD
V
V
DDQ
DD
V
V
DD
DDQ
V
V
DD
DDQ
FT
V
DDQ
SA
NC DQa
NCNC DQa
141312 15
DQd
DQd DQd DQcV DQc DQcV DQc
DQcSBd
DQbSBa DQb DQbV DQb DQa DQa DQa
DQa
DQd DQd DQd DQd DQc DQc DQc DQc
SBc DQb DQb DQb DQb DQb DQa DQa DQa
256K X 72 JEDEC FOUR–CHIP MODULE
TOP VIEW
209 BUMP PBGA
Not to Scale
MOTOROLA FAST SRAM
MCM72FB8ML MCM72PB8ML
3
Page 4
PIN DESCRIPTIONS
Pin Locations Symbol
E10 ADSC Input Synchronous Address Status Controller: Active low, interrupts any
F10 ADSP Input Synchronous Address Status Processor: Active low, interrupts any
D10 ADV Input Synchronous Address Advance: Increments address count in
(a) R14, T14, T15, U14, U15, V14, V15,
W14, W15
(b) L14, L15, M14, M15, N14, N15, P14,
P15, R15
(c) E14, F14, F15, G14, G15, H14, H15,
J14, J15
(d) A14, A15, B14, B15, C14, C15, D14,
D15, E15 (e) A5, A6, B5, B6, C5, C6, D5, D6, E5 (f) E6, F5, F6, G5, G6, H5, H6, J5, J6 (g) L5, L6, M5, M6, N5, N6, P5, P6, R5 (h) R6, T5, T6, U5, U6, V5, V6, W5, W6
U13 FT Input Flow–Through Input: This pin must remain in steady state (this
B10 G Input Asynchronous Output Enable. R10 K Input Clock: This signal registers the address, data in, and all control
U7 LBO Input Linear Burst Order Input: This pin must remain in steady state (this
U10, V10 SA1, SA0 Input Synchronous Address Inputs: These pins must be wired to the two
A7, A8, A9, A11, A12, A13, B7, B8, B9,
B11, B12, B13, V8, V9, V11, V12
L13, K14, K15, J13, J7, K5, K6, L7
(a) (b) (c) (d) (e) (f) (g) (h)
A10 SE1 Input Synchronous Chip Enable: Active low to enable chip.
C7 SE2 Input Synchronous Chip Enable: Active high for depth expansion. C13 SE3 Input Synchronous Chip Enable: Active low for depth expansion. C10 SGW Input Synchronous Global Write: This signal writes all bytes regardless of
T10 SW Input Synchronous Write: This signal writes only those bytes that have
D8, D12, E8, E12, F8, F12, G8,
G12, N8, N12, P8, P12, R8, R12, T8, T12
C8, C9, C11, C12, D7, D13, E7,
E13, F7, F13, G7, G13, H7, H13,
M7, M13, N7, N13, P7, P13, R7, R13, T7, T13, U8, U9, U11, U12
Type Description
ongoing burst and latches a new external address. Used to initiate READ, WRITE, or chip deselect cycle.
ongoing burst and latches a new external address. Used to initiate READ, WRITE, or chip deselect cycle (exception — chip deselect does not occur when ADSP
accordance with counter type selected (linear/interleaved).
DQx I/O Synchronous Data I/O: “x” refers to the byte being read or written
SA2 – SA17 Input Synchronous Address Inputs: These inputs are registered and must
SBx Input Synchronous Byte Write Inputs: “x” refers to the byte being written
V
V
DDQ
DD
Supply Core Power Supply.
Supply I/O Power Supply.
(byte a, b, c, d, e, f, g, h).
signal is not registered or latched). It must be tied high or low. Low — flow–through mode. High — pipeline mode.
signals except G
signal not registered or latched). It must be tied high or low. Low — linear burst counter (68K/PowerPC). High — interleaved burst counter (486/i960/Pentium).
LSBs of the address bus for proper burst operation. These inputs are registered and must meet setup and hold times.
meet setup and hold times.
(byte a, b, c, d, e, f, g, h). SGW
Negated high–blocks ADSP asserted.
the status of the SBx are being used, tie this pin high.
been selected using the byte write SBx signals SBx
, LBO, and FT.
are being used, tie this pin low.
is asserted and SE1 is high).
overrides SBx.
or deselects chip when ADSC is
and SW signals. If only byte write signals SBx
pins. If only byte write
MCM72FB8ML MCM72PB8ML 4
MOTOROLA FAST SRAM
Page 5
PIN DESCRIPTIONS (continued)
Pin Locations Symbol Type Description
D9, D11, E9, E11, F9, F11, G9 – G11,
H8 – H12, J8 – J12, K8 – K12, L8 – L12,
M8 – M12, N9 – N11, P9, P11, R9, R11,
T9, T11
K7, K13, P10, V7, V13, W7 – W13 NC No Connection: There is no connection to the chip.
V
SS
Supply Ground.
TRUTH TABLE (See Notes 1 through 5)
Address
Next Cycle
Deselect None 1 X X X 0 X X High–Z X Deselect None 0 X 1 0 X X X High–Z X Deselect None 0 0 X 0 X X X High–Z X Deselect None X X 1 1 0 X X High–Z X Deselect None X 0 X 1 0 X X High–Z X Begin Read External 0 1 0 0 X X X High–Z X Begin Read External 0 1 0 1 0 X X High–Z READ Continue Read Next X X X 1 1 0 1 High–Z READ Continue Read Next X X X 1 1 0 0 DQ READ Continue Read Next 1 X X X 1 0 1 High–Z READ Continue Read Next 1 X X X 1 0 0 DQ READ Suspend Read Current X X X 1 1 1 1 High–Z READ Suspend Read Current X X X 1 1 1 0 DQ READ Suspend Read Current 1 X X X 1 1 1 High–Z READ Suspend Read Current 1 X X X 1 1 0 DQ READ Begin Write External 0 1 0 1 0 X X High–Z WRITE Continue Write Next X X X 1 1 0 X High–Z WRITE Continue Write Next 1 X X X 1 0 X High–Z WRITE Suspend Write Current X X X 1 1 1 X High–Z WRITE Suspend Write Current 1 X X X 1 1 X High–Z WRITE
NOTES:
1. X = Don’t Care. 1 = logic high. 0 = logic low.
2. Write is defined as either 1) any SBx
3. G
is an asynchronous signal and is not sampled by the clock K. G drives the bus immediately (t
4. On write cycles that follow read cycles, G also remain negated at the completion of the write cycle to ensure proper write data hold times.
5. This read assumes the RAM was previously deselected.
Used
SE1 SE2 SE3 ADSP ADSC ADV G
and SW low or 2) SGW is low.
must be negated prior to the start of the write cycle to ensure proper write data setup times. G must
GLQX
3
DQx Write 2,
) following G going low.
4
5
5
LINEAR BURST ADDRESS TABLE (LBO = V
1st Address (External) 2nd Address (Internal) 3rd Address (Internal) 4th Address (Internal)
X . . . X00 X . . . X01 X . . . X10 X . . . X11 X . . . X01 X . . . X10 X . . . X11 X . . . X00 X . . . X10 X . . . X1 1 X . . . X00 X . . . X01 X . . . X11 X . . . X00 X . . . X01 X . . . X10
INTERLEAVED BURST ADDRESS TABLE (LBO = V
1st Address (External)
X . . . X00 X . . . X01 X . . . X10 X . . . X11 X . . . X01 X . . . X00 X . . . X11 X . . . X10 X . . . X10 X . . . X1 1 X . . . X00 X . . . X01 X . . . X11 X . . . X10 X . . . X01 X . . . X00
2nd Address (Internal) 3rd Address (Internal) 4th Address (Internal)
MOTOROLA FAST SRAM
SS
)
)
DD
MCM72FB8ML MCM72PB8ML
5
Page 6
WRITE TRUTH TABLE
Cycle Type SGW SW SBa SBb SBc SBd SBe SBf SBg SBh
Read H H X X X X X X X X Read H L L H H H H H H H Write Byte a H L L H H H H H H H Write Byte b H L H L H H H H H H Write Byte c H L H H L H H H H H Write Byte d H L H H H L H H H H Write Byte e H L H H H H L H H H Write Byte f H L H H H H H L H H Write Byte g H L H H H H H H L H Write Byte h H L H H H H H H H L Write All Bytes H L L L L L L L L L Write All Bytes L X X X X X X X X X
ABSOLUTE MAXIMUM RATINGS (See Note 1)
Rating Symbol Value Unit Notes
Power Supply Voltage V I/O Supply Voltage V Input Voltage Relative to VSS for
Any Pin Except V Input Voltage (Three–State I/O) V
Output Current (per I/O) I Package Power Dissipation P Ambient Temperature T Die Temperature T Temperature Under Bias T Storage Temperature T
NOTES:
1. Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are exceeded. Functional operation should be restricted to RECOMMENDED OPER­ATING CONDITIONS. Exposure to higher than recommended voltages for extended periods of time could affect device reliability.
2. This is a steady–state DC parameter that is in effect after the power supply has achieved its nominal operating level. Power sequencing is not necessary.
3. Power dissipation capability is dependent upon package characteristics and use en­vironment. See Package Thermal Characteristics.
DD
DD
DDQ
Vin, V
out
bias
stg
VSS – 0.5 to + 4.6 V VSS – 0.5 to V
out
IT
D A
J
VSS – 0.5 to
VDD + 0.5
VSS – 0.5 to
V
DDQ
0 to 70 °C
– 10 to 85 °C
– 55 to 125 °C
V 2
DD
V 2
+ 0.5
± 20 mA
6.4 W 3
110 °C 3
V 2
This device contains circuitry to protect the inputs against damage due to high static volt­ages or electric fields; however, it is advised that normal precautions be taken to avoid application of any voltage higher than maxi­mum rated voltages to this high–impedance circuit.
PACKAGE THERMAL CHARACTERISTICS
Thermal Resistance Symbol Max Unit Notes
Junction to Ambient (@ 200 lfm) Single–Layer Board
Four–Layer Board Junction to Board (Bottom) R Junction to Case (Top) R
NOTES:
1. Junction temperature is a function of on–chip power dissipation, package thermal resistance, mounting site (board) temperature, ambient temperature, air flow, board population, and board thermal resistance.
2. Per SEMI G38–87.
3. Indicates the average thermal resistance between the die and the printed circuit board.
4. Indicates the average thermal resistance between the die and the case top surface via the cold plate method (MIL SPEC–883 Method 1012.1).
MCM72FB8ML MCM72PB8ML
R
θJA
θJB θJC
19 13
10 °C/W 3
0.3 °C/W 4
°C/W 1, 2
MOTOROLA FAST SRAM
6
Page 7
DC OPERA TING CONDITIONS AND CHARACTERISTICS
(VDD = 3.3 V + 10%, – 5%, TA = 0 to 70°C, Unless Otherwise Noted)
RECOMMENDED OPERATING CONDITIONS: 2.5 V I/O SUPPLY
Parameter
Supply Voltage V I/O Supply Voltage V Input Low Voltage V Input High Voltage V Input High Voltage I/O Pins V
(Voltages Referenced to VSS = 0 V)
Symbol Min Typ Max Unit
DD
DDQ
IL
IH
IH2
3.135 3.3 3.465 V
2.375 2.5 2.9 V – 0.3 0.7 V
1.7 VDD + 0.3 V
1.7 V
RECOMMENDED OPERATING CONDITIONS: 3.3 V I/O SUPPLY (Voltages Referenced to V
Parameter Symbol Min Typ Max Unit
Supply Voltage V I/O Supply Voltage V Input Low Voltage V Input High Voltage V Input High Voltage I/O Pins V
V
IH
V
SS
DD
DDQ
IL
IH
IH2
3.135 3.3 3.465 V
3.135 3.3 V – 0.5 0.8 V
2 VDD + 0.5 V 2 V
SS
= 0 V)
+ 0.3 V
DDQ
DD
+ 0.5 V
DDQ
V
VSS – 1.0 V
20% t
KHKH
Figure 1. Undershoot Voltage
(MIN)
MOTOROLA FAST SRAM
MCM72FB8ML MCM72PB8ML
7
Page 8
DC CHARACTERISTICS AND SUPPLY CURRENTS
Parameter Symbol Min Typ Max Unit Notes
Input Leakage Current (0 V Vin VDD) I Output Leakage Current (0 V Vin V AC Supply Current (Device Selected,
All Outputs Open, Freq = Max, VDD = Max, V Includes Supply Current from Both VDD and V
CMOS Standby Supply Current (Device Deselected, Freq = 0, VDD = Max, V
TTL Standby Supply Current (Device Deselected, Freq = 0, VDD = Max, V
Clock Running (Device Deselected, Freq = Max, VDD = Max, V CMOS Levels)
Static Clock Running (Device Deselected, Freq = Max, VDD = Max, V
Output Low Voltage (IOL = 2 mA) V Output High Voltage (IOH = – 2 mA) V Output Low Voltage (IOL = 8 mA) V Output High Voltage (IOH = – 4 mA) V
NOTES:
1. Reference AC Operating Conditions and Characteristics for input and timing.
2. All addresses transition simultaneously low (LSB) then high (MSB).
3. Data states are all zero.
4. Device is deselected as defined by the Truth Table.
5. CMOS levels for I/O’s are VIT VSS + 0.2 V or V
6. TTL levels for I/O’s are VIT VIL or V
= Max, All Inputs Static at CMOS Levels)
DDQ
= Max, All Inputs Static at TTL Levels)
DDQ
= Max, All Inputs Toggling at
DDQ
= Max, All Inputs Static at TTL Levels)
DDQ
) I
DDQ
= Max)
DDQ
DDQ
= 2.5 V V
DDQ
= 2.5 V V
DDQ
= 3.3 V V
DDQ
= 3.3 V V
DDQ
DDQ
. TTL levels for other inputs are Vin VIL or VIH.
IH2
lkg(O) I
– 0.2 V. CMOS levels for other inputs are Vin VSS + 0.2 V or VDD – 0.2 V.
lkg(I)
DDA
I
SB2
I
SB3
I
SB4
I
SB5
OL1
OH1
OL2
OH2
± 1 µA — ± 1 µA — 1700 mA 1, 2, 3
TBD mA 4. 5
TBD mA 4, 6
TBD mA 4. 5
TBD mA 4, 6
0.7 V
1.7 V — 0.4 V
2.4 V
CAPACITANCE (f = 1.0 MHz, dV = 3.0 V, T
Parameter Symbol Min Typ Max Unit
Input Capacitance C Input/Output Capacitance C
= 0 to 70°C, Periodically Sampled Rather Than 100% Tested)
A
in
I/O
16 pF — 5 pF
MCM72FB8ML MCM72PB8ML 8
MOTOROLA FAST SRAM
Page 9
AC OPERA TING CONDITIONS AND CHARACTERISTICS
(VDD = 3.3 V + 10%, – 5%, TA = 0 to 70°C, Unless Otherwise Noted)
Input Timing Measurement Reference Level 1.25 V. . . . . . . . . . . . . .
Input Pulse Levels 0 to 2.5 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input Rise/Fall Time (See Figure 3) 1.0 V/ns (20 to 80%). . . . . . . . .
Output Timing Reference Level 1.25 V. . . . . . . . . . . . . . . . . . . . . . . . .
Output Load See Figure 2 Unless Otherwise Noted. . . . . . . . . . . . . .
READ/WRITE CYCLE TIMING (See Notes 1 and 2)
Pipeline
MCM72PB8ML3.5
166 MHz
Parameter Symbol
Cycle Time t Clock High Pulse Width t Clock Low Pulse Width t Clock Access Time t Output Enable to Output
Valid Clock High to Output Active t Clock High to Output
Change Output Enable to Output
Active Output Disable to Q High–Z t Clock High to Q High–Z t Setup Times: Address
Hold Times: Address
NOTES:
ADSP
, ADSC, ADV
Data In
Write
Chip Enable
ADSP
, ADSC, ADV
Data In
Write
Chip Enable
1. Write is defined as either any SBx or ADSC is asserted.
2. All read and write cycle timings are referenced from K or G
3. In order to reduce test correlation issues and to reduce the effects of application specific input edge rate variations on correlation between data sheet parameters and actual system performance, FSRAM AC parametric specifications are always specified at V design exercises, it is desirable to evaluate timing using other reference levels. Since the maximum test input edge rate is known and is given in the AC Test Conditions section of the data sheet as 1 V/ns, one can easily interpolate timing values to other reference levels.
4. This parameter is sampled and not 100% tested.
5. Measured at
± 200 mV from steady state.
KHKH
KHKL KLKH
KHQV
t
GLQV
KHQX1
t
KHQX2
t
GLQX
GHQZ KHQZ
t
ADKH
t
ADSKH t
DVKH
t
WVKH
t
EVKH
t
KHAX
t
KHADSX
t
KHDX
t
KHWX
t
KHEX
Min Max Min Max Min Max Min Max
6 7.5 8.5 10 ns
2.4 3 3.4 4 ns 3
2.4 3 3.4 4 ns 3 — 3.5 4 7.5 8 ns — 3.5 3.8 3.5 3.5 ns
0 0 0 0 ns 4, 5
1.5 1.5 2 2 ns 4
0 0 0 0 ns 4, 5
3.5 3.8 3.5 3.5 ns 4, 5
1.5 6 1.5 7.5 2 3.5 2 3.5 ns 4, 5
1.5 1.5 2 2 ns
0.5 0.5 0.5 0.5 ns
and SW low or SGW is low. Chip Enable is defined as SE1 low , SE2 high, and SE3 low whenever ADSP
Pipeline
MCM72PB8ML4
133 MHz
.
Flow–Through
MCM72FB8ML7.5
117 MHz
Flow–Through
MCM72FB8ML8
100 MHz
Unit Notes
/2. In some
DDQ
MOTOROLA FAST SRAM
OUTPUT
Z0 = 50
1.25 V
Figure 2. AC Test Load
RL = 50
MCM72FB8ML MCM72PB8ML
9
Page 10
OUTPUT LOAD
OUTPUT BUFFER
UNLOADED RISE AND FALL TIME MEASUREMENT
INPUT
WAVEFORM
OUTPUT
WAVEFORM
NOTES:
1. Input waveform has a slew rate of 1 V/ns.
2. Rise time tr is measured from 0.5 to 2.0 V unloaded.
3. Fall time tf is measured from 2.0 to 0.5 V unloaded.
0.5
2.0
2.0
0.5 0.5
t
r
TEST POINT
Figure 3. Unloaded Rise and Fall Time Characterization
2.0
0.5
2.0
t
f
MCM72FB8ML MCM72PB8ML 10
MOTOROLA FAST SRAM
Page 11
VOLTAGE (V)
– 0.5
0
0.8
1.25
1.5
2.3
2.7
2.9
PULL–UP
I (mA) MIN I (mA) MAX
– 38 – 38 – 38 – 26
– 20
0 0 0
– 105 – 105 – 105
– 83 – 70
– 30 – 10
0
(a) Pull–Up for 2.5 V I/O Supply
2.9
2.5
2.3
2.1
1.25
VOLTAGE (V)
0.8
0
0 – 38 – 105
CURRENT (mA)
3.6
VOLTAGE (V)
– 0.5
0
1.4
1.65
2.0
3.135
3.6
VOLTAGE (V)
– 0.5
0
0.4
0.8
1.25
1.6
2.8
3.2
3.4
PULL–UP
I (mA) MIN I (mA) MAX
– 50 – 50 – 50 – 46 – 35
0 0
PULL–DOWN
I (mA) MIN I (mA) MAX
0 0
10 20
31 40 40 40 40
– 150 – 150 – 150 – 130 – 101
– 25
0
0 0
20 40
63 80 80 80 80
3.135
2.8
1.65
VOLTAGE (V)
1.4
0
0
(b) Pull–Up for 3.3 V I/O Supply
V
DD
1.6
1.25
VOLTAGE (V)
0.3
0
040 80
(c) Pull–Down
– 50
CURRENT (mA)
CURRENT (mA)
– 150– 100
MOTOROLA FAST SRAM
Figure 4. T ypical Output Buffer Characteristics
MCM72FB8ML MCM72PB8ML
11
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KHQV
t
GLQX
t
BURST WRITE
CD
SE2, SE3
IGNORED
ADSP, SA
KLKH
t
MCM72PB8ML PIPELINE READ/WRITE CYCLES
KHKL
t
KHKH
t
AB
BURST WRAPS AROUND
KHQV
t
Q(B) D(C) D(C+1) D(C+2) D(C+3) Q(D)
t
Q(B+2) Q(B+3)
Q(B) Q(B+1)
t
Q(A)Q(n)
t
GHQZ
BURST READSINGLE READ
KHQX2
KHQX1
K
SA
MCM72FB8ML MCM72PB8ML 12
ADSP
ADSC
ADV
SE1
DESELECTED SINGLE READ
KHQZ
E
W
G
t
DQx
W low = SGW low and/or SW and SBx low.
NOTE: E low = SE2 high and SE3 low.
MOTOROLA FAST SRAM
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Q(B) D(C) D(C+1) D(C+2) D(C+3) Q(D)
GLQX
t
SE2, SE3
ADSP, SA
GHQZ
t
BURST WRITE
IGNORED
GLQV
t
CD
KLKH
t
MCM72FB8ML FLOW–THROUGH READ/WRITE CYCLES
KHKL
t
KHKH
t
K
AB
SA
ADSP
ADSC
ADV
SE1
Q(B+2) Q(B+3)
BURST WRAPS AROUND
KHQX2
Q(B) Q(B+1)
t
KHQV
t
E
W
G
Q(A)Q(n)
DQx
KHQX1
t
KHQZ
t
BURST READSINGLE READ
DESELECTED SINGLE READ
W low = SGW low and/or SW and SBx low.
NOTE: E low = SE2 high and SE3 low.
MOTOROLA FAST SRAM
MCM72FB8ML MCM72PB8ML
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APPLICATION INFORMATION
STOP CLOCK OPERATION
In the stop clock mode of operation, the SRAM will hold all state and data values even though the clock is not running (full static operation). The SRAM design allows the clock to start with ADSP
and ADSC, and stops the clock after the last
write data is latched, or the last read data is driven out.
When starting and stopping the clock, the AC clock timing and parametrics must be strictly maintained. For example,
MCM72PB8ML PIPELINE STOP CLOCK WITH READ TIMING
K
ADSP
ADDRESS
A1 A2
clock pulse width and edge rates must be guaranteed when starting and stopping the clocks.
To achieve the lowest power operation for all three stop
clock modes, stop read, stop write, and stop deselect:
1. Force the clock to a low state.
2. Force the control signals to an inactive state (this guar­antees any potential source of noise on the clock input will not start an unplanned on activity).
3. Force the address inputs to a low state.
ADV
DQx
ADSP
(INITIATES
BURST READ)
NOTE: For lowest possible power consumption during stop clock, the addresses should be driven to a low state (VIL).
Best results are obtained if VIL < 0.2 V.
CLOCK STOP
(CONTINUE
BURST READ)
WAKE UP ADSP
(INITIATES BURST READ)
Q(A1 + 1) Q(A2)Q(A1)
MCM72FB8ML MCM72PB8ML 14
MOTOROLA FAST SRAM
Page 15
ADSP
MCM72FB8ML FLOW–THROUGH STOP CLOCK WITH READ TIMING
K
ADDRESS
ADV
DQx
NOTE: For lowest possible power consumption during stop clock, the addresses should be driven to a low state (VIL).
Best results are obtained if VIL < 0.2 V.
A1 A2
Q(A1)
ADSP
(INITIATES
BURST READ)
CLOCK STOP
(CONTINUE
BURST READ)
Q(A2)Q(A1 + 1)
WAKE UP ADSP
(INITIATES BURST READ)
MOTOROLA FAST SRAM
MCM72FB8ML MCM72PB8ML
15
Page 16
K
ADSC
STOP CLOCK WITH WRITE TIMING
ADDRESS
WRITE
ADV
DQx
NOTE: While the clock is stopped, DATA IN must be fixed in a high (VIH) or low (VIL) state to reduce the DC current of the
input buffers. For lowest power operation, all data and address lines should be held in a low (VIL) state and control lines held in an inactive state.
A1 A2
D(A1)DATA IN D(A1 + 1) D(A2)
ADSC
(INITIATES
BURST WRITE)
CLOCK STOP
(CONTINUE
BURST WRITE)
VIH OR VIL FIXED (SEE NOTE)
HIGH–Z
WAKE UP ADSC
(INITIATES BURST WRITE)
MCM72FB8ML MCM72PB8ML 16
MOTOROLA FAST SRAM
Page 17
K
ADSC
SE1
STOP CLOCK WITH DESELECT OPERATION TIMING
DATA IN
DQx
NOTES:
1. While the clock is stopped, DA T A IN must be fixed in a high (VIH) or low (VIL) state to reduce the DC current of the input buffers. For lowest power operation, all data and address lines should be held in a low (VIL) state and control lines held in an inactive state.
2. For best possible power savings, the data–in should be driven low.
DATA DATA
CONTINUE
BURST READ
CLOCK STOP
(DESELECTED)
VIH OR VIL FIXED (SEE NOTE 1)
HIGH–Z
WAKE UP
(DESELECTED)
MOTOROLA FAST SRAM
MCM72FB8ML MCM72PB8ML
17
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NON–BURST SYNCHRONOUS OPERATION
Although this BurstRAM has been designed for PowerPC– based and other high end MPU–based systems, these SRAMs can be used in other high speed L2 cache or memory applications that do not require the burst address feature. Most L2 caches designed with a synchronous inter­face can make use of the MCM72FB8ML or MCM72PB8ML.
CONTROL PIN TIE VALUES
Non–Burst ADSP ADSC ADV SE1 LBO
Sync Non–Burst, Pipelined SRAM
NOTE: Although X is specified in the table as a don’t care, the pin
must be tied either high or low.
(H VIH, L VIL)
H L H L X
The burst counter feature of the BurstRAM can be disabled, and the SRAM can be configured to act upon a continuous stream of addresses. See Figures 5 and 6.
K
ADDR A B CD EFGH
W
G
DQ
Q(B)Q(A)
Q(D)Q(C) D(E)
D(F) D(G) D(H)
WRITESREADS
Figure 5. Configured as Non–Burst Synchronous Flow–Through SRAM
K
ADDR A B CD EFGH
W
G
DQ
Figure 6. Configured as Non–Burst Synchronous Pipelined SRAM
MCM72FB8ML MCM72PB8ML 18
Q(B)Q(A)
Q(D)Q(C) D(F)D(E) D(H)D(G)
WRITESREADS
MOTOROLA FAST SRAM
Page 19
Motorola Memory Prefix
ORDERING INFORMATION
(Order by Full Part Number)
72FB8
MCM 72PB8 XX X X
Blank = Trays, R = Tape and Reel
Part Number
A1
CORNER
E
Speed for MCM72FB8 (7.5 = 7.5 ns, 8 = 8 ns) Speed for MCM72PB8 (3.5= 3.5 ns, 4 = 4 ns)
Package (ML = Multichip Module on Laminate)
Full Part Numbers — MCM72FB8ML7.5 MCM72FB8ML8
MCM72FB8ML7.5R MCM72FB8ML8R
MCM72PB8ML3.5 MCM72PB8ML4 MCM72PB8ML3.5R MCM72PB8ML4R
P ACKAGE DIMENSIONS
MULTICHIP MODULE
PBGA
CASE 1103B–01
2X
0.2
D
(E3)
C
A
209X
0.2 C
0.35 C
4X
NOTES:
1. DIMENSIONS AND TOLERANCING PER ASME
(E2)
2X
0.2
D1
B
(D3)(D2)
TOP VIEW
56 87 9 10 1 1 12 13 14 15
e
E1
209X
W
V
U
T
R
P N M
L K
J H G
F
E D C B A
b
M
0.30 CA
M
0.15 A
B
A
SIDE VIEW
Y14.5M, 1994.
2. DIMENSIONS IN MILLIMETERS.
3. DIMENSION b IS THE MAXIMUM SOLDER BALL DIAMETER MEASURED PARALLEL TO DATUM A.
4. DIMENSIONS D2, D3, E2, AND E3 ARE FOR INFORMATION ONLY.
MILLIMETERS
DIM MIN MAX
A 2.00 2.90 A1 0.50 0.70 A2 0.80 1.20
b 0.60 0.90
D 25.00 BSC D1 22.86 BSC D2 7.14 REF D3 14.05 REF
e 1.27 BSC
E 25.00 BSC E1 12.70 BSC E2 7.14 REF
A2
E3 14.05 REF
A1
BOTTOM VIEW
MOTOROLA FAST SRAM
MCM72FB8ML MCM72PB8ML
19
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MCM72FB8ML MCM72PB8ML 20
MOTOROLA FAST SRAM
MCM72FB8ML/D
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