128K x 36 and 256K x 18 Bit
Flow–Through ZBT RAM
Synchronous Fast Static RAM
Order this document
by MCM63Z737/D
MCM63Z737
MCM63Z819
The ZBT RAM is a 4M–bit synchronous fast static RAM designed to provide
zero bus turnaround. The ZBT RAM allows 100% use of bus cycles during
back–to–back read/write and write/read cycles. The MCM63Z737 is organized
as 128K words of 36 bits each and the MCM63Z819 is organized as 256K words
of 18 bits each, fabricated with high performance silicon gate CMOS technology .
This device integrates input registers, a 2–bit address counter, and high speed
SRAM onto a single monolithic circuit for reduced parts count in communication
applications. Synchronous design allows precise cycle control with the use of an
external clock (CK). CMOS circuitry reduces the overall power consumption of
the integrated functions for greater reliability .
Addresses (SA), data inputs (DQ), and all control signals except output enable
) and linear burst order (LBO) are clock (CK) controlled through positive–
(G
edge–triggered noninverting registers.
Write cycles are internally self–timed and are initiated by the rising edge of the
clock (CK) input. This feature eliminates complex off–chip write pulse generation
and provides increased timing flexibility for incoming signals.
For read cycles, a flow–through SRAM allows output data to simply flow freely
from the memory array .
• Selectable Burst Sequencing Order (Linear/Interleaved)
• Internally Self–Timed Write Cycle
• Single–Cycle Deselect
• Byte Write Control
• ADV Controlled Burst
• 100–Pin TQFP Package
TQ PACKAGE
TQFP
CASE 983A–01
ZBT and Zero Bus Turnaround are trademarks of Integrated Device Technology, Inc., and the architecture is supported by
Micron Technology, Inc. and Motorola, Inc.
This document contains information on a new product. Specifications and information herein are subject to change without notice.
86GInputAsynchronous Output Enable.
31LBOInputLinear Burst Order Input: This pin must remain in steady state (this
32, 33, 34, 35, 44, 45, 46,
47, 48, 49, 50, 81, 82, 99, 100
36, 37SA0, SA1InputSynchronous Burst Address Inputs: The two LSB’s of the address field.
93, 94, 95, 96
(a) (b) (c) (d)
98SE1InputSynchronous Chip Enable: Active low to enable chip.
97SE2InputSynchronous Chip Enable: Active high for depth expansion.
92SE3InputSynchronous Chip Enable: Active low for depth expansion.
88SWInputSynchronous Write: This signal writes only those bytes that have been
15, 16, 41, 65, 91V
4, 11, 20, 27, 54, 61, 70, 77V
5, 10, 14, 17, 21, 26, 40,
55, 60, 64, 66, 67, 71, 76, 90
38, 39, 42, 43, 83, 84NC—No Connection: There is no connection to the chip.
TypeDescription
low. RAM uses internally generated burst addresses when high.
except G
DQxI/OSynchronous Data I/O: “x” refers to the byte being read or written
SAInputSynchronous Address Inputs: These inputs are registered and must
SBxInputSynchronous Byte Write Inputs: Enables write to byte “x”
DD
DDQ
V
SS
Supply Core Power Supply.
Supply I/O Power Supply.
Supply Ground.
(byte a, b, c, d).
signal not registered or latched). It must be tied high or low.
Low – linear burst counter.
High – interleaved burst counter.
meet setup and hold times.
These pins must preset the burst address counter values. These inputs
are registered and must meet setup and hold times.
(byte a, b, c, d) in conjunction with SW
selected using the byte write SBx
and LBO.
. Has no effect on read cycles.
pins.
MCM63Z737DMCM63Z819
4
MOTOROLA FAST SRAM
Page 5
MCM63Z819 PIN DESCRIPTIONS
Pin LocationsSymbolTypeDescription
85ADVInputSynchronous Load/Advance: Loads a new address into counter when
89CKInputClock: This signal registers the address, data in, and all control signals
87CKEInputClock Enable: Disables the CK input when CKE is high.
86GInputAsynchronous Output Enable.
31LBOInputLinear Burst Order Input: This pin must remain in steady state (this
32, 33, 34, 35, 44, 45, 46,
47, 48, 49, 50, 80, 81, 82, 99, 100
36, 37SA0, SA1InputSynchronous Burst Address Inputs: The two LSB’s of the address field.
93, 94
(a) (b)
98SE1InputSynchronous Chip Enable: Active low to enable chip.
97SE2InputSynchronous Chip Enable: Active high for depth expansion.
92SE3InputSynchronous Chip Enable: Active low for depth expansion.
88SWInputSynchronous Write: This signal writes only those bytes that have been
15, 16, 41, 65, 91V
4, 11, 20, 27, 54, 61, 70, 77V
5, 10, 14, 17, 21, 26, 40,
55, 60, 64, 66, 67, 71, 76, 90
1, 2, 3, 6, 7, 25, 28, 29, 30, 38,
39, 42, 43, 51, 52, 53, 56, 57,
75, 78, 79, 83, 84, 95, 96
low. RAM uses internally generated burst addresses when high.
except G
DQxI/OSynchronous Data I/O: “x” refers to the byte being read or written
SAInputSynchronous Address Inputs: These inputs are registered and must
SBxInputSynchronous Byte Write Inputs: Enables write to byte “x”
DD
DDQ
V
SS
NC—No Connection: There is no connection to the chip.
Supply Core Power Supply.
Supply I/O Power Supply.
Supply Ground.
(byte a, b).
signal not registered or latched). It must be tied high or low.
Low – linear burst counter.
High – interleaved burst counter.
meet setup and hold times.
These pins must preset the burst address counter values. These inputs
are registered and must meet setup and hold times.
(byte a, b) in conjunction with SW
selected using the byte write SBx
and LBO.
. Has no effect on read cycles.
pins.
MOTOROLA FAST SRAM
MCM63Z737DMCM63Z819
5
Page 6
TRUTH TABLE
SA0 –
CKCKEESWSBxADV
L–H1XXXXXHoldH1, 2
L–H0FalseXX0XDeselectD1, 2
L–H0True0V0VLoad Address, New WriteW1, 2, 3, 4, 5
L–H0True1X0VLoad Address, New ReadR1, 2
L–H0XX
NOTES:
1. X = don‘t care, 1 = logic high, 0 = logic low, V = valid signal, according to AC Operating Conditions and Characteristics.
2. E = true if SE1
3. Byte write enables, SBx
4. No control inputs except CKE
5. A write with SBx
6. A burst write with SBx
7. ADV controls whether the RAM enters burst mode. If the previous cycle was a write, then ADV = 1 results in a burst write. If the previous
cycle is a read, then ADV = 1 results in a burst read. ADV = 1 will also continue a deselect cycle.
and SE3 = 0, and SE2 = 1.
, are evaluated only as new write addresses are loaded.
, SBx, and ADV are recognized in a clock cycle where ADV is sampled high.
not valid does load addresses.
not valid does increment address.
V (W)
X (R, D)Continue
1X
SAx
Next Operation
Burst
Input Command
Code
B1, 2, 4,
Notes
WRITE TRUTH TABLE
SBc
Cycle TypeSWSBaSBb
ReadHXXXX
Write Byte aLLHHH
Write Byte bLHLHH
Write Byte c (See Note 1)LHHLH
Write Byte d (See Note 1)LHHHL
Write All BytesLLLLL
INPUT COMMAND CODE AND STATE NAME DEFINITION DIAGRAM
DBW BRBH
DESELECT
CONTINUE
DESELECT
NEW WRITE
BURST
WRITE
NEW READ
BURST
READ
HOLD
FALSEE
SA0 – SAxVALIDVALID
ADV
SW
SBX
NOTE: Cycles are named for their control inputs, not for data I/O state.
TRUETRUE
VALIDVALID
MOTOROLA FAST SRAM
MCM63Z737DMCM63Z819
7
Page 8
B
B
BURST
READ
D
R
W
R
BURST
WRITE
D
W
KEY:
CURRENT
STATE (n)
D
TRANSITION
ƒ
INPUT
COMMAND
CODE
R
STATE (n + 1)
B
NEW
READ
NEXT
W
B
R
DESELECT
D
NOTES:
1. Input command codes (D, W, R, and B) represent control pin inputs
as indicated in the Truth Table.
2. Hold (i.e., CKE
CKE
= 1 blocks clock input and therefore, blocks any state change.
Figure 1. ZBT RAM State Diagram
B
R
W
sampled high) is not shown simply because
NEW
WRITE
D
W
STATE
CK
COMMAND
CODE
DQ
nn + 1n + 2n + 3
ƒ
CURRENT
STATE
NEXT
STATE
Figure 2. State Definitions for ZBT RAM State Diagram
MCM63Z737DMCM63Z819
8
MOTOROLA FAST SRAM
Page 9
KEY:
CURRENT
STATE (n)
ƒ
INPUT
COMMAND
CODE
R
B
DATA OUT
(Q VALID)
D
W
B
R
NEXT STATE
n + 1
D
HIGH–Z
W
D
W
HIGH–Z
(DATA IN)
R
NOTES:
1. Input command codes (D, W, R, and B) represent control
pin inputs as indicated in the Truth Table.
2. Hold (i.e., CKE
cause CKE
any state change.
sampled high) is not shown simply be-
= 1 blocks clock input and therefore, blocks
B
STATE
CK
COMMAND
CODE
DQ
Figure 3. Data I/O State Diagram
nn + 1n + 2n + 3
ƒ
CURRENT
STATE
NEXT
STATE
Figure 4. State Definitions for ZBT RAM State Diagram
MOTOROLA FAST SRAM
MCM63Z737DMCM63Z819
9
Page 10
ABSOLUTE MAXIMUM RATINGS (See Note 1)
RatingSymbolValueUnit Notes
Power Supply VoltageV
I/O Supply VoltageV
Input Voltage Relative to VSS for
Any Pin Except V
Input Voltage (Three State I/O)V
Output Current (per I/O)I
Package Power DissipationP
Temperature Under BiasT
Storage TemperatureT
NOTES:
1. Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are
exceeded. Functional operation should be restricted to RECOMMENDED
OPERATING CONDITIONS. Exposure to higher than recommended voltages for
extended periods of time could affect device reliability.
2. This is a steady–state DC parameter that is in effect after the power supply has
achieved its nominal operating level. Power sequencing is not necessary.
3. Power dissipation capability is dependent upon package characteristics and use
environment. See Package Thermal Characteristics.
DD
DD
DDQ
Vin, V
out
bias
stg
out
IT
D
– 0.5 to + 4.6V
VSS – 0.5 to V
– 0.5 to VDD + 0.5V2
VSS – 0.5 to
V
DDQ
– 10 to 85°C
– 55 to 125°C
DD
+ 0.5
± 20mA
1.3W3
V2
V2
This device contains circuitry to protect the
inputs against damage due to high static voltages or electric fields; however, it is advised
that normal precautions be taken to avoid
application of any voltage higher than maximum rated voltages to this high–impedance
circuit.
PACKAGE THERMAL CHARACTERISTICS
Thermal ResistanceSymbolMaxUnitNotes
Junction to Ambient (@ 200 lfm)Single–Layer Board
Four–Layer Board
Junction to Board (Bottom)R
Junction to Case (Top)R
NOTES:
1. Junction temperature is a function of on–chip power dissipation, package thermal resistance, mounting site (board) temperature, ambient
temperature, air flow, board population, and board thermal resistance.
2. Per SEMI G38–87.
3. Indicates the average thermal resistance between the die and the printed circuit board.
4. Indicates the average thermal resistance between the die and the case top surface via the cold plate method (MIL SPEC–883
Method 1012.1).
R
θJA
θJB
θJC
40
25
17°C/W3
9°C/W4
°C/W1, 2
MCM63Z737DMCM63Z819
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MOTOROLA FAST SRAM
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DC OPERA TING CONDITIONS AND CHARACTERISTICS
(VDD = 3.3 V ± 5%, TA = 0 to 70°C Unless Otherwise Noted)
RECOMMENDED OPERATING CONDITIONS
ParameterSymbolMinTypMaxUnit
Supply VoltageV
I/O Supply VoltageV
Ambient TemperatureT
Input Low VoltageV
Input High VoltageV
Input High Voltage I/O PinsV
*VDD and V
are shorted together on the device and must be supplied with identical voltage levels.
DDQ
V
SS
VSS – 1.0 V
(Voltages Referenced to VSS = 0 V)
V
IH
Figure 5. Undershoot Voltage
DD
*3.1353.3V
DDQ
A
IL
IH
IH2
20% t
3.1353.33.465V
0—70°C
– 0.3—0.8V
2—VDD + 0.3V
2—V
(MIN)
KHKH
DD
+ 0.3V
DDQ
V
DC CHARACTERISTICS AND SUPPLY CURRENTS
ParameterSymbolMinTypMaxUnitNotes
Input Leakage Current (0 V ≤ Vin ≤ VDD)I
Output Leakage Current (0 V ≤ Vin ≤ V
AC Supply Current (Device Selected, All Outputs Open,
Freq = Max) Includes Supply Current for Both VDD and V
Hold Supply Current (Device Selected, Freq = Max,
VDD = Max, V
All Inputs Static at CMOS Levels)
CMOS Standby Supply Current (Device Deselected, Freq = 0,
VDD = Max, V
TTL Standby Supply Current (Device Deselected, Freq = 0,
VDD = Max, V
Output Low Voltage (IOL = 8 mA)V
Output High Voltage (IOH = – 8 mA)V
NOTES:
1. LBO
has an internal pullup and will exhibit leakage currents of ± 5 µA.
2. Reference AC Operating Conditions and Characteristics for Input and Timing.
3. All addresses transition simultaneously low (LSB) then high (MSB).
4. Data states are all zero.
5. Device in deselected mode as defined by the Truth Table.
6. CMOS levels for I/O’s are VIT ≤ VSS + 0.2 V or ≥ V
7. TTL levels for I/O’s are VIT ≤ VIL or ≥ V
= Max, CKE
DDQ
= Max, All Inputs Static at CMOS Levels)
DDQ
= Max, All Inputs Static at TTL Levels)
DDQ
≥ VDD – 0.2 V,
)I
DDQ
DDQ
DDQ
. TTL levels for other inputs are Vin ≤ VIL or ≥ VIH.
IH2
– 0.2 V. CMOS levels for other inputs are Vin ≤ VSS + 0.2 V or ≥ VDD – 0.2 V.
lkg(I)
lkg(O)
I
DDA
I
DD1
I
SB2
I
SB3
OL
OH
——± 1µA1
——± 1µA
——300mA2, 3, 4
——15mA6
——5mA5, 6
——25mA5, 7
——0.4V
2.4——V
CAPACITANCE (f = 1.0 MHz, dV = 3.0 V, T
Parameter
Input CapacitanceC
Input/Output CapacitanceC
= 0 to 70°C, Periodically Sampled Rather Than 100% Tested)
A
MOTOROLA FAST SRAM
SymbolMinTypMaxUnit
in
I/O
—45pF
—78pF
MCM63Z737DMCM63Z819
11
Page 12
AC OPERA TING CONDITIONS AND CHARACTERISTICS
(VDD = 3.3 V ± 5%, TA = 0 to 70°C Unless Otherwise Noted)
Cycle Timet
Clock High Pulse Widtht
Clock Low Pulse Widtht
Clock Access Timet
Output Enable to Output Validt
Clock High to Output Activet
Output Hold Timet
Output Enable to Output Activet
Output Disable to Q High–Zt
Clock High to Q High–Zt
Setup Times:Address
Clock Enable
Hold Times: Address
Clock Enable
NOTES:
1. Write is defined as any SBx
2. All read and write cycle timings are referenced from CK or G
3. In order to reduce test correlation issues and to reduce the effects of application specific input edge rate variations on correlation between
data sheet parameters and actual system performance, FSRAM AC parametric specifications are always specified at V
design exercises, it is desirable to evaluate timing using other reference levels. Since the maximum test input edge rate is known and is
given in the AC Test Conditions section of the data sheet as 1 V/ns, one can easily interpolate timing values to other reference levels.
4. This parameter is sampled and not 100% tested.
5. Measured at
± 200 mV from steady state.
and SW low. Chip enable is defined as SE1 low, SE2 high, and SE3 low whenever ADV is low.
ADV
Data In
Write
Chip Enable
ADV
Data In
Write
Chip Enable
KHKH
KHKL
KLKH
KHQV
GLQV
KHQX1
KHQX
GLQX
GHQZ
KHQZ
t
ADKH
t
LVKH
t
DVKH
t
WVKH
t
EVKH
t
CVKH
t
KHAX
t
KHLX
t
KHDX
t
KHWX
t
KHEX
t
KHCX
MinMaxMinMax
15—20—ns
6—8—ns3
6—8—ns3
—11—15ns
—6—7ns
1.5—1.5—ns4, 5
1.5—1.5—ns4
0—0—ns4, 5
—4.5—5ns4, 5
1.54.51.55ns4, 5
2.5
2.5
2
2.5
2.5
2.5
0.5
0.5
0.5
0.5
0.5
0.5
.
—2.5
—0.5
MCM63Z737–15
MCM63Z819–15
50 MHz
2.5
2
2.5
2.5
2.5
0.5
0.5
0.5
0.5
0.5
UnitNotes
—ns
—ns
DDQ
/2. In some
MCM63Z737DMCM63Z819
12
OUTPUT
Z0 = 50
Ω
1.5 V
Figure 6. AC Test Load
RL = 50
Ω
MOTOROLA FAST SRAM
Page 13
CK
SA0 – SAx
SW
SBx
E
ADV
t
AVKH
t
WVKH
t
WVKH
t
EVKH
t
LVKH
t
KHKH
t
KHKL
t
KLKH
t
KHAX
t
KHWX
t
KHWX
t
KHEX
t
KHLX
t
CKE
DQ
DQ
DQ
G
CVKH
t
KHQX1
t
GLQX
t
GLQV
t
KHQV
t
DVKH
t
KHCX
D
Q
t
GHQZ
Q
t
KHDX
t
KHQX
Q
Figure 7. AC Timing Parameter Definitions
t
KHQZ
MOTOROLA FAST SRAM
MCM63Z737DMCM63Z819
13
Page 14
READ/WRITE CYCLES WITH HOLD AND DESELECT CYCLES
RHWRDWRD
D
Q(A0)D(B0)Q(C0)D(D0)Q(E0)D(F0)Q(G0)D(H0)Q(I0)
MCM63Z737DMCM63Z819
14
CK
ABCDEFG HIJ
ADDRESS
RWHRW
CODE
COMMAND
DQ
NOTE: Command code definitions are shown in Truth Table.
MOTOROLA FAST SRAM
Page 15
BBBB
R
Q(C0)Q(C1)Q(C2)Q(C3)Q(C0)
Q(B3)
MOTOROLA FAST SRAM
READ CYCLES (SINGLE, BURST, AND BURST WRAP–AROUND)
CK
ABC
ADDRESS
RRBBB
CODE
COMMAND
Q(A0)Q(B0)Q(B1)Q(B2)
DQ
NOTE: Command code definitions are shown in Truth Table.
MCM63Z737DMCM63Z819
15
Page 16
BBBB
D(C0)D(C1)D(C2)D(C3)D(C0)
WRITE CYCLES (SINGLE, BURST, AND BURST WRAP–AROUND)
CK
ABC
ADDRESS
W
WWBBB
CODE
COMMAND
D(B3)
D(B0)D(B1)D(B2)
D(A0)
DQ
NOTE: Command code definitions are shown in Truth Table.
MCM63Z737DMCM63Z819
16
MOTOROLA FAST SRAM
Page 17
Q(D0)Q(E0)
RR
BCD DE
READ, WRITE, READ COHERENCY WITH HOLD, AND DESELECT CYCLES
ABC
CK
ADDRESS
BDWH
R
RWRWB
CODE
COMMAND
Q(C0)Q(C1)D(D0)
D(C1)
Q(A0)D(B0)Q(B0)D(C0)
DQ
NOTE: Command code definitions are shown in Truth Table.
Motorola reserves the right to make changes without further notice to any products herein. Motorola makes no warranty , representation or guarantee regarding
the suitability of its products for any particular purpose, nor does Motorola assume any liability arising out of the application or use of any product or circuit, and
specifically disclaims any and all liability, including without limitation consequential or incidental damages. “T ypical” parameters which may be provided in Motorola
data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals”
must be validated for each customer application by customer’s technical experts. Motorola does not convey any license under its patent rights nor the rights of
others. Motorola products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other
applications intended to support or sustain life, or for any other application in which the failure of the Motorola product could create a situation where personal injury
or death may occur. Should Buyer purchase or use Motorola products for any such unintended or unauthorized application, Buyer shall indemnify and hold Motorola
and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees
arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that
Motorola was negligent regarding the design or manufacture of the part. Motorola and are registered trademarks of Motorola, Inc. Motorola, Inc. is an Equal
Opportunity/Affirmative Action Employer.
How to reach us:
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MCM63Z737DMCM63Z81920
◊
MOTOROLA FASTSRAM
MCM63Z737/D
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