Datasheet MCM63F733ATQ11, MCM63F733ATQ11R, MCM63F733ATQ10R, MCM63F733ATQ10 Datasheet (Motorola)

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MOTOROLA
SEMICONDUCTOR TECHNICAL DATA
Order this document
by MCM63F733A/D
Advance Information
128K x 32 Bit Flow–Through BurstRAM Synchronous Fast Static RAM
The MCM63F733A is a 4M–bit synchronous fast static RAM designed to pro­vide a burstable, high performance, secondary cache for the PowerPC and other high performance microprocessors. It is organized as 128K words of 32 bits each, fabricated with high performance silicon gate CMOS technology. This device integrates input registers, a 2–bit address counter , and high speed SRAM onto a single monolithic circuit for reduced parts count in cache data RAM applications. Synchronous design allows precise cycle control with the use of an external clock (K). CMOS circuitry reduces the overall power con­sumption of the integrated functions for greater reliability.
Addresses (SA), data inputs (DQx), and all control signals except output enable (G positive–edge–triggered noninverting registers.
Bursts can be initiated with either ADSP addresses can be generated internally by the MCM63F733A (burst sequence operates in linear or interleaved mode dependent upon state of LBO trolled by the burst address advance (ADV
Write cycles are internally self–timed and are initiated by the rising edge of the clock (K) input. This feature eliminates complex off–chip write pulse generation and provides increased timing flexibility for incoming signals.
Synchronous byte write (SBx nous write enable (SW to all bytes. The four bytes are designated as “a”, “b”, “c”, and “d”. SBa DQa, SBb writes SBx or if all SBx
For read cycles, a flow–through SRAM allows output data to simply flow freely from the memory array .
The MCM63F733A operates from a 3.3 V core power supply and all outputs operate on a 2.5 V or 3.3 V power supply. All inputs and outputs are JEDEC Standard JESD8–5 compatible.
MCM63F733A–10 = 10 ns Access/13 ns Cycle (75 MHz)
3.3 V + 10%/– 5% Core, Power Supply , 2.5 V or 3.3 V I/O Supply
ADSP
Selectable Burst Sequencing Order (Linear/Interleaved)
Internally Self–Timed Write Cycle
Byte Write and Global Write Control
Single–Cycle Deselect
Sleep Mode (ZZ)
100–Pin TQFP Package
) and Linear Burst Order (LBO) are clock (K) controlled through
or ADSC input pins. Subsequent burst
) and con-
) input pin.
), synchronous global write (SGW), and synchro-
) are provided to allow writes to either individual bytes or
controls controls DQb, etc. Individual bytes are written if the selected byte are asserted with SW. All bytes are written if either SGW is asserted
and SW are asserted.
MCM63F733A–11 = 11 ns Access/15 ns Cycle (66 MHz)
, ADSC, and ADV Burst Control Pins
MCM63F733A
TQ PACKAGE
TQFP
CASE 983A–01
The PowerPC name is a trademark of IBM Corp., used under license therefrom.
This document contains information on a new product. Specifications and information herein are subject to change without notice.
REV 2 3/20/98
Motorola, Inc. 1998
MOTOROLA FAST SRAM
MCM63F733A
1
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LBO
ADV
K ADSC ADSP
SA SA1 SA0
SGW
FUNCTIONAL BLOCK DIAGRAM
K2
ADDRESS
REGISTER
17
BURST
COUNTER
CLR
2
15
2
17
128K x 32 ARRAY
SW
SBa
SBb
SBc
SBd
SE1 SE2
SE3
WRITE
REGISTER
a
WRITE
REGISTER
b
WRITE
REGISTER
c
WRITE
REGISTER
d
K2
ENABLE
REGISTER
4
DATA–IN
REGISTER
K
32
32
G
MCM63F733A 2
DQa – DQd
MOTOROLA FAST SRAM
Page 3
PIN ASSIGNMENT
V
DDQ
V
DDQ
V
DQd
V
DDQ
DQd DQd DQd DQd
V
DDQ
DQd DQd
NC DQc DQc
V
SS DQc DQc
DQc DQc V
SS DQc
DQc
NC DD
NC
V
SS DQd
V
SS
V
SS
NC
1 2 3 4 5 6 7
8 9
10 11 12 13 14 15 16 17 18 19 20
21 22 23 24 25 26 27 28 29 30
31 3233
SASASE1
DD
SE2
SBc
SBa
SBb
SBd
94 93979695 89889291 90 86858710099 98 81828384
3738343536 42433940 41 454644
SE3
K
VSSV
SW
SGW
G
ADSP
ADSC
ADV
SA
SA
NC
80 79
DQb
78
DQb V
77
DDQ
V
76
SS
DQb
75
DQb
74
DQb
73
DQb
72
V
71
SS
V
70
DDQ
DQb
69
DQb
68
V
67
SS
NC
66
V
65
DD
ZZ
64
DQa
63
DQa
62
V
61
DDQ
V
60
SS
DQa
59
DQa
58 57
DQa
56
DQa V
55
SS
V
54
DDQ
DQa
53
DQa
52
NC
51
50494847
SASASA
LBO
SA
SA1
SA0
NC
NC
V
SS
DD
V
NC
NC
SASASA
SA
SA
SA
SA
MOTOROLA FAST SRAM
MCM63F733A
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PIN DESCRIPTIONS
Pin Locations Symbol
85 ADSC Input Synchronous Address Status Controller: Active low, interrupts any
84 ADSP Input Synchronous Address Status Processor: Active low, interrupts any
83 ADV Input Synchronous Address Advance: Increments address count in
(a) 51, 52, 53, 56, 57, 58, 59, 62, 63 (b) 68, 69, 72, 73, 74, 75, 78, 79, 80 (c) 1, 2, 3, 6, 7, 8, 9, 12, 13 (d) 18, 19, 22, 23, 24, 25, 28, 29, 30
86 G Input Asynchronous Output Enable Input. 89 K Input Clock: This signal registers the address, data in, and all control signals
31 LBO Input Linear Burst Order Input: This pin may be left floating; it will default as
32, 33, 34, 35, 44, 45, 46,
47, 48, 49, 50, 81, 82, 99, 100
36, 37 SA1, SA0 Input Synchronous Address Inputs: These pins must be wired to the two
93, 94, 95, 96
(a) (b) (c) (d)
98 SE1 Input Synchronous Chip Enable: Active low to enable chip.
97 SE2 Input Synchronous Chip Enable: Active high for depth expansion. 92 SE3 Input Synchronous Chip Enable: Active low for depth expansion. 88 SGW Input Synchronous Global Write: This signal writes all bytes regardless of the
87 SW Input Synchronous Write: This signal writes only those bytes that have been
64 ZZ Input Sleep Mode: This active high asynchronous signal places the RAM into
15, 41, 65, 91 V
4, 11, 20, 27, 54, 61, 70, 77 V
5, 10, 17, 21, 26, 40,
55, 60, 67, 71, 76, 90
14, 16, 38, 39, 42, 43, 66 NC No Connection: There is no connection to the chip.
Type Description
ongoing burst and latches a new external address. Used to initiate a READ, WRITE, or chip deselect.
ongoing burst and latches a new external address. Used to initiate a new READ, WRITE, or chip deselect (exception — chip deselect does not occur when ADSP
accordance with counter type selected (linear/interleaved).
DQx I/O Synchronous Data I/O: “x” refers to the byte being read or written
SA Input Synchronous Address Inputs: These inputs are registered and must
SBx Input Synchronous Byte Write Inputs: “x” refers to the byte being written
DD
DDQ
V
SS
Supply Core Power Supply. Supply I/O Power Supply. Supply Ground.
(byte a, b, c, d).
except G
interleaved. Low — linear burst counter (68K/PowerPC). High — interleaved burst counter (486/i960/Pentium).
meet setup and hold times.
LSBs of the address bus for proper burst operation. These inputs are registered and must meet setup and hold times.
(byte a, b, c, d). SGW
Negated high — blocks ADSP asserted.
status of the SBx being used, tie this pin high.
selected using the byte write SBx are being used, tie this pin low.
the lowest power mode. The ZZ pin disables the RAMs internal clock when placed in this mode. When ZZ is negated, the RAM remains in low power mode until it is commanded to READ or WRITE. Data integrity is maintained upon returning to normal operation.
, LBO, and ZZ.
is asserted and SE1 is high).
overrides SBx.
or deselects chip when ADSC is
and SW signals. If only byte write signals SBx are
pins. If only byte write signals SBx
MCM63F733A 4
MOTOROLA FAST SRAM
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TRUTH TABLE (See Notes 1 through 5)
Address
Next Cycle
Deselect None 1 X X X 0 X X High–Z X Deselect None 0 X 1 0 X X X High–Z X Deselect None 0 0 X 0 X X X High–Z X Deselect None X X 1 1 0 X X High–Z X Deselect None X 0 X 1 0 X X High–Z X Begin Read External 0 1 0 0 X X X High–Z X Begin Read External 0 1 0 1 0 X X High–Z READ Continue Read Next X X X 1 1 0 1 High–Z READ Continue Read Next X X X 1 1 0 0 DQ READ Continue Read Next 1 X X X 1 0 1 High–Z READ Continue Read Next 1 X X X 1 0 0 DQ READ Suspend Read Current X X X 1 1 1 1 High–Z READ Suspend Read Current X X X 1 1 1 0 DQ READ Suspend Read Current 1 X X X 1 1 1 High–Z READ Suspend Read Current 1 X X X 1 1 0 DQ READ Begin Write External 0 1 0 1 0 X X High–Z WRITE Continue Write Next X X X 1 1 0 X High–Z WRITE Continue Write Next 1 X X X 1 0 X High–Z WRITE Suspend Write Current X X X 1 1 1 X High–Z WRITE Suspend Write Current 1 X X X 1 1 X High–Z WRITE
NOTES:
1. X = Don’t Care. 1 = logic high. 0 = logic low.
2. Write is defined as either 1) any SBx
3. G
is an asynchronous signal and is not sampled by the clock K. G drives the bus immediately (t
4. On write cycles that follow read cycles, G G
must also remain negated at the completion of the write cycle to ensure proper write data hold times.
Used
SE1 SE2 SE3 ADSP ADSC ADV G
and SW low, or 2) SGW is low.
must be negated prior to the start of the write cycle to ensure proper write data setup times.
3
DQx Write 2,
) following G going low.
GLQX
4
ASYNCHRONOUS TRUTH TABLE
Operation ZZ G I/O Status
Read L L Data Out (DQx) Read L H High–Z Write L X High–Z
Deselected L X High–Z
Selected H X High–Z
LINEAR BURST ADDRESS TABLE (LBO = V
1st Address (External)
X . . . X00 X . . . X01 X . . . X10 X . . . X11 X . . . X01 X . . . X10 X . . . X11 X . . . X00 X . . . X10 X . . . X11 X . . . X00 X . . . X01 X . . . X11 X . . . X00 X . . . X01 X . . . X10
2nd Address (Internal) 3rd Address (Internal) 4th Address (Internal)
SS
)
MOTOROLA FAST SRAM
MCM63F733A
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INTERLEAVED BURST ADDRESS TABLE (LBO = V
1st Address (External) 2nd Address (Internal) 3rd Address (Internal) 4th Address (Internal)
X . . . X00 X . . . X01 X . . . X10 X . . . X11 X . . . X01 X . . . X00 X . . . X11 X . . . X10 X . . . X10 X . . . X11 X . . . X00 X . . . X01 X . . . X11 X . . . X10 X . . . X01 X . . . X00
DD
)
WRITE TRUTH TABLE
Cycle Type SGW SW SBa SBb SBc SBd
Read H H X X X X Read H L H H H H Write Byte a H L L H H H Write Byte b H L H L H H Write Byte c H L H H L H Write Byte d H L H H H L Write All Bytes H L L L L L Write All Bytes L X X X X X
ABSOLUTE MAXIMUM RATINGS (See Note 1)
Rating Symbol Value Unit Notes
Power Supply Voltage V I/O Supply Voltage V Input Voltage Relative to VSS for
Any Pin Except V Input Voltage (Three–State I/O) V Output Current (per I/O) I Package Power Dissipation P Temperature Under Bias T Storage Temperature T
NOTES:
1. Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are exceeded. Functional operation should be restricted to RECOMMENDED OPER­ATING CONDITIONS. Exposure to higher than recommended voltages for extended periods of time could affect device reliability.
2. This is a steady–state DC parameter that is in effect after the power supply has achieved its nominal operating level. Power sequencing is not necessary.
3. Power dissipation capability is dependent upon package characteristics and use environment. See Package Thermal Characteristics.
DD
DD
DDQ
Vin, V
out
bias
stg
out
IT
D
– 0.5 to + 4.6 V
VSS – 0.5 to V
– 0.5 to VDD + 0.5 V 2
– 0.5 to V
– 10 to + 85 °C
– 55 to + 125 °C
DD
+ 0.5 V 2
DDQ
± 20 mA
1.2 W 3
V 2
This device contains circuitry to protect the inputs against damage due to high static volt­ages or electric fields; however, it is advised that normal precautions be taken to avoid application of any voltage higher than maxi­mum rated voltages to this high–impedance circuit.
PACKAGE THERMAL CHARACTERISTICS
Rating Symbol Max Unit Notes
Junction to Ambient (@ 200 lfm) Single–Layer Board
Four–Layer Board Junction to Board (Bottom) R Junction to Case (Top) R
NOTES:
1. Junction temperature is a function of on–chip power dissipation, package thermal resistance, mounting site (board) temperature, ambient temperature, air flow, board population, and board thermal resistance.
2. Per SEMI G38–87.
3. Indicates the average thermal resistance between the die and the printed circuit board.
4. Indicates the average thermal resistance between the die and the case top surface via the cold plate method (MIL SPEC–883 Method 1012.1).
MCM63F733A
R
θJA
θJB θJC
40 25
17 °C/W 3
9 °C/W 4
°C/W 1, 2
MOTOROLA FAST SRAM
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DC OPERA TING CONDITIONS AND CHARACTERISTICS
(VDD = 3.3 V + 10%, – 5%, TA = 0 to 70°C, Unless Otherwise Noted)
RECOMMENDED OPERATING CONDITIONS: 2.5 V I/O Supply
Parameter Symbol Min Typ Max Unit
Supply Voltage V I/O Supply Voltage V Input Low Voltage V Input High Voltage V Input High Voltage (I/O Pins) V Output Low Voltage (IOL = 2 mA) V Output High Voltage (IOH = – 2 mA) V
(Voltages Referenced to VSS = 0 V)
DD
DDQ
IL
IH IH2 OL OH
3.135 3.3 3.6 V
2.375 2.5 2.9 V – 0.3 0.7 V
1.7 VDD + 0.3 V
1.7 V — 0.7 V
1.7 V
RECOMMENDED OPERATING CONDITIONS: 3.3 V I/O Supply (Voltages Referenced to V
Parameter Symbol Min Typ Max Unit
Supply Voltage V I/O Supply Voltage V Input Low Voltage V Input High Voltage V Input High Voltage (I/O Pins) V Output Low Voltage (IOL = 8 mA) V Output High Voltage (IOH = – 4 mA) V
DD
DDQ
IL
IH IH2 OL OH
3.135 3.3 3.6 V
3.135 3.3 V – 0.5 0.8 V
2 VDD + 0.5 V 2 V
0.4 V
2.4 V
SS
= 0 V)
+ 0.3 V
DDQ
DD
+ 0.5 V
DDQ
V
V
SS
VSS – 1.0 V
V
IH
Figure 1. Undershoot Voltage
20% t
KHKH
(MIN)
MOTOROLA FAST SRAM
MCM63F733A
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SUPPLY CURRENTS
Parameter Symbol Min Typ Max Unit Notes
Input Leakage Current (0 V Vin VDD) I Output Leakage Current (0 V Vin V AC Supply Current (Device Selected, MCM63F733A–10
All Outputs Open, Freq = Max) MCM63F733A–11 Includes VDD Only
CMOS Standby Supply Current (Device Deselected, Freq = 0, VDD = Max, All Inputs Static at CMOS Levels)
Sleep Mode Supply Current (Sleep Mode, Freq = Max, VDD = Max, All Other Inputs Static at CMOS Levels, ZZ VDD – 0.2 V)
TTL Standby Supply Current (Device Deselected, Freq = 0, VDD = Max, All Inputs Static at TTL Levels)
Clock Running (Device Deselected, MCM63F733A–10 Freq = Max, VDD = Max, All Inputs MCM63F733A–11 Toggling at CMOS Levels)
Static Clock Running (Device Deselected, MCM63F733A–10 Freq = Max, VDD = Max, All Inputs MCM63F733A–11 Static at TTL Levels)
NOTES:
1. LBO
pin has an internal pullup and will exhibit leakage currents of ± 5 µA.
2. ZZ pin has an internal pulldown and will exhibit leakage currents of ± 5 µA.
3. Reference AC Operating Conditions and Characteristics for input and timing.
4. All addresses transition simultaneously low (LSB) then high (MSB).
5. Data states are all zero.
6. Device is deselected as defined by the Truth Table.
7. Device in Sleep Mode as defined by the Asynchronous Truth Table.
8. CMOS levels for I/Os are VIT VSS + 0.2 V or V
9. TTL levels for I/Os are VIT VIL or V
) I
DDQ
DDQ
. TTL levels for other inputs are Vin VIL or VIH.
IH2
lkg(O) I
– 0.2 V. CMOS levels for other inputs are Vin VSS + 0.2 V or VDD – 0.2 V.
lkg(I)
DDA
I
SB2
I
ZZ
I
SB3
I
SB4
I
SB5
± 1 µA 1, 2 — ± 1 µA — TBD mA 3, 4, 5
TBD mA 6, 8
2 mA 2, 7, 8
TBD mA 6, 9
TBD mA 3, 4,
5, 6, 8
TBD mA 6, 9
CAPACITANCE (f = 1.0 MHz, dV = 3.0 V, T
Parameter Symbol Min Typ Max Unit
Input Capacitance C Input/Output Capacitance C
= 0 to 70°C, Periodically Sampled Rather Than 100% Tested)
A
I/O
in
4 5 pF — 7 8 pF
MCM63F733A 8
MOTOROLA FAST SRAM
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AC OPERA TING CONDITIONS AND CHARACTERISTICS
(VDD = 3.3 V + 10%, – 5%, TA = 0 to 70°C, Unless Otherwise Noted)
Input Timing Measurement Reference Level 1.25 V. . . . . . . . . . . . . .
Input Pulse Levels 0 to 2.5 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input Rise/Fall Time 1.0 V/ns (20 to 80%). . . . . . . . . . . . . . . . . . . . . .
Output Timing Reference Level 1.25 V. . . . . . . . . . . . . . . . . . . . . . . . .
Output Load See Figure 2 Unless Otherwise Noted. . . . . . . . . . . . . .
READ/WRITE CYCLE TIMING (See Notes 1 through 4)
MCM63F733A–10
75 MHz
Parameter Symbol
Cycle Time t Clock High Pulse Width t Clock Low Pulse Width t Clock Access Time t Output Enable to Output Valid t Clock High to Output Active t Clock High to Output Change t Output Enable to Output Active t Output Disable to Q High–Z t Clock High to Q High–Z t Setup Times: Address
Hold Times: Address
Sleep Mode Standby t
Sleep Mode Recovery t
Sleep Mode High to Q High–Z t
NOTES:
1. Write is defined as either any SBx or ADSC is asserted.
2. All read and write cycle timings are referenced from K or G
3. G
is a don’t care after write cycle begins. To prevent bus contention, G should be negated prior to start of write cycle.
4. In order to reduce test correlation issues and to reduce the effects of application specific input edge rate variations on correlation between data sheet parameters and actual system performance, FSRAM AC parametric specifications are always specified at V design exercises, it is desirable to evaluate timing using other reference levels. Since the maximum test input edge rate is known and is given in the AC Test Conditions section of the data sheet as 1 V/ns, one can easily interpolate timing values to other reference levels.
5. This parameter is sampled and not 100% tested.
6. Measured at
± 200 mV from steady state.
ADSP
, ADSC, ADV
Data In
Write
Chip Enable
ADSP
, ADSC, ADV
Data In
Write
Chip Enable
and SW low or SGW is low. Chip Enable is defined as SE1 low , SE2 high, and SE3 low whenever ADSP
KHKH
KHKL
KLKH KHQV GLQV
KHQX1 KHQX2
GLQX GHQZ KHQZ
t
ADKH
t
ADSKH t
DVKH
t
WVKH
t
EVKH
t
KHAX
t
KHADSX
t
KHDX
t
KHWX
t
KHEX
ZZS
ZZREC
ZZQZ
.
Min Max Min Max
13 15 ns
5.2 6 ns
5.2 6 ns — 10 11 ns — 3.8 3.8 ns
0 0 ns 5, 6
1.5 1.5 ns 6
0 0 ns 5, 6
3.8 3.8 ns 5, 6
1.5 3.8 1.5 3.8 ns 5, 6
2 2 ns
0.5 0.5 ns
2 x
2 x
t
KHKH
15 15 ns
t
KHKH
2 x
MCM63F733A–1 1
66 MHz
2 x
t
KHKH
t
KHKH
Unit Notes
ns
ns
DDQ
/2. In some
MOTOROLA FAST SRAM
MCM63F733A
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OUTPUT
OUTPUT
C
L
Z0 = 50
1.25 V
Figure 2. AC Test Load
2400 2200
2000 1800
1600 1400
1200 1000
800
CLOCK ACCESS TIME DELA Y (ps)
600 400 200
0
RL = 50
LUMPED CAP ACITANCE, CL (pF)
100806040200
Figure 3. Lumped Capacitive Load and T ypical Derating Curve
MCM63F733A 10
MOTOROLA FAST SRAM
Page 11
VOLTAGE (V)
– 0.5
0
0.8
1.25
1.5
2.3
2.7
2.9
VOLTAGE (V)
– 0.5
0
1.4
1.65
2.0
3.135
3.6
PULL–UP
I (mA) MIN I (mA) MAX
– 38 – 38 – 38 – 30
– 27
0 0 0
PULL–UP
I (mA) MIN I (mA) MAX
– 40 – 40 – 40 – 37 – 28
0 0
– 105 – 105 – 105
– 83 – 75
– 40 – 15
0
– 120 – 120 – 120 – 108
– 81 – 20
0
(a) Pull–Up for V
(b) Pull–Up: V
2.9
2.5
2.3
1.25
VOLTAGE (V)
0.8
DDQ
3.6
3.135
2.8
1.65
VOLTAGE (V)
1.4
DDQ
0
0 – 40 – 105
CURRENT (mA)
= 2.5 V
0
0
– 40
CURRENT (mA)
= 3.3 V
– 120– 80
PULL–DOWN
VOLTAGE (V)
– 0.5
0
0.4
0.8
1.25
1.6
2.8
3.2
3.4
I (mA) MIN I (mA) MAX
MOTOROLA FAST SRAM
0
0 10 20 31 40 40 40 40
V
DD
0
0 20 40 63 80 80 80 80
1.6
1.25
VOLTAGE (V)
0.3
0
040 80
(c) Pull–Down
Figure 4. T ypical Output Buffer Characteristics
CURRENT (mA)
MCM63F733A
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CD
READ/WRITE CYCLES
GLQV
t
Q(B) D(C) D(C+1) D(C+2) D(C+3) Q(D)
GLQX
t
SE2, SE3
ADSP, SA
GHQZ
t
BURST WRITE
IGNORED
KLKH
t
KHKL
t
KHKH
t
Q(B+2) Q(B+3)
BURST WRAPS AROUND
KHQX2
Q(B) Q(B+1)
t
KHQV
t
AB
K
SA
ADSP
ADSC
ADV
SE1
E
W
G
Q(A)Q(n)
DQx
KHQX1
t
KHQZ
t
BURST READSINGLE READ
DESELECTED SINGLE READ
W low = SGW low and/or SW and SBx low.
NOTE: E low = SE2 high and SE3 low.
MCM63F733A 12
MOTOROLA FAST SRAM
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NORMAL OPERATION
NO READS OR
WRITES ALLOWEDIN SLEEP MODE
SLEEP MODE TIMING
ZZREC
t
ZZ
I
WRITES ALLOWEDNORMAL OPERATION
NO NEW READS OR
K
ADS
ADDR
ADV
ZZ
ZZS
t
I
DD
ZZ
E low = SE1 low, SE2 high, SE3 low.
ADS high = both ADSC, ADSP high.
I (max) specifications will not be met if inputs toggle.
NOTE: ADS low = ADSC low or ADSP low.
ZZQZ
t
E
W
G
DQ
MOTOROLA FAST SRAM
MCM63F733A
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APPLICATION INFORMATION
SLEEP MODE
A sleep mode feature, the ZZ pin, has been implemented on the MCM63F733A. It allows the system designer to place the RAM in the lowest possible power condition by asserting ZZ. The sleep mode timing diagram shows the different modes of operation: Normal Operation, No READ/WRITE Allowed, and Sleep Mode. Each mode has its own set of constraints and conditions that are allowed.
Normal Operation: All inputs must meet setup and hold times prior to sleep and t
ZZREC
nanoseconds after re­covering from sleep. Clock (K) must also meet cycle, high, and low times during these periods. Two cycles prior to sleep, initiation of either a read or write operation is not allowed.
No READ/WRITE: During the period of time just prior to
sleep and during recovery from sleep, the assertion of either
, ADSP, or any write signal is not allowed. If a write
ADSC operation occurs during these periods, the memory array may be corrupted. Validity of data out from the RAM can not be guaranteed immediately after ZZ is asserted (prior to being in sleep).
Sleep Mode: The RAM automatically deselects itself. The
RAM disconnects its internal clock buffer . The external clock
K
may continue to run without impacting the RAMs sleep cur­rent (IZZ). All inputs are allowed to toggle — the RAM will not be selected and perform any reads or writes. However, if inputs toggle, the IZZ (max) specification will not be met.
NON–BURST SYNCHRONOUS OPERATION
Although this BurstRAM has been designed for PowerPC — and other high end MPU–based systems, these SRAMs can be used in other high speed L2 cache or memory applications that do not require the burst address feature. Most L2 caches designed with a synchronous interface can make use of the MCM63F733A. The burst counter feature of the BurstRAM can be disabled, and the SRAM can be con­figured to act upon a continuous stream of addresses. See Figure 5.
CONTROL PIN TIE VALUES EXAMPLE
Non–Burst
Sync Non–Burst, Pipelined SRAM
NOTE: Although X is specified in the table as a don’t care, the pin
must be tied either high or low.
ADSP ADSC ADV SE1 SE2 LBO
H L H L H X
(H VIH, L VIL)
ADDR A B CD EFGH
SE3
W
G
DQ
Q(B)Q(A)
Q(D)Q(C) D(E)
D(F)
D(G)
WRITESREADS
D(H)
Figure 5. Example Configuration as Non–Burst Synchronous SRAM
ORDERING INFORMATION
(Order by Full Part Number)
MCM 63F733A XX X X
Motorola Memory Prefix
Blank = Trays, R = Tape and Reel
Part Number
MCM63F733A 14
Speed (10 = 10 ns, 11 = 11 ns) Package (TQ = TQFP)
Full Part Numbers — MCM63F733ATQ10 MCM63F733ATQ11
MCM63F733ATQ10R MCM63F733ATQ11R
MOTOROLA FAST SRAM
Page 15
P ACKAGE DIMENSIONS
ÉÉÉ
4X
A–B0.20 (0.008) H
D
80 51
–D–
TQ PACKAGE
100–PIN TQFP
CASE 983A–01
2X 30 TIPS
C D
A–B0.20 (0.008)
e
e/2
–A–
–H– –C–
SEATING PLANE
0.05 (0.002)
81
100
S
2X 20 TIPS
A
A2
A1
D1/2
C D
S
R1
VIEW AB
D1
50
E/2
–B–
E1
E
E1/2
31
301
D/2
D
B B
VIEW Y
BASE
METAL
b1
c
b
0.13 (0.005) D
M
–X–
X=A, B, OR D
PLATING
c1
S
A–B
C
S
SECTION B–B
NOTES:
A–B0.20 (0.008)
q
2
q
3
0.10 (0.004)
C
VIEW AB
q
1
0.25 (0.010)
GAGE PLANE
R2
L2
L
q
L1
1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DATUM PLANE –H– IS LOCATED AT BOTTOM OF LEAD AND IS COINCIDENT WITH THE LEAD WHERE THE LEAD EXITS THE PLASTIC BODY AT THE BOTTOM OF THE PARTING LINE.
4. DATUMS –A–, –B– AND –D– TO BE DETERMINED AT DATUM PLANE –H–.
5. DIMENSIONS D AND E TO BE DETERMINED AT SEATING PLANE –C–.
6. DIMENSIONS D1 AND E1 DO NOT INCLUDE MOLD PROTRUSION. ALLOWABLE PROTRUSION IS 0.25 (0.010) PER SIDE. DIMENSIONS D1 AND B1 DO INCLUDE MOLD MISMATCH AND ARE DETERMINED AT DATUM PLANE –H–.
7. DIMENSION b DOES NOT INCLUDE DAMBAR PROTRUSION. DAMBAR PROTRUSION SHALL NOT CAUSE THE b DIMENSION TO EXCEED 0.45 (0.018).
_ _
_
INCHESMILLIMETERS
0.020 REF
_ _ _ _
_ _
_
DIM MIN MAX MIN MAX
A ––– 1.60 ––– 0.063 A1 0.05 0.15 0.002 0.006 A2 1.35 1.45 0.053 0.057
b 0.22 0.38 0.009 0.015
b1 0.22 0.33 0.009 0.013
c 0.09 0.20 0.004 0.008
c1 0.09 0.16 0.004 0.006
D 22.00 BSC 0.866 BSC D1 20.00 BSC 0.787 BSC
E 16.00 BSC 0.630 BSC
E1 14.00 BSC 0.551 BSC
e 0.65 BSC 0.026 BSC
L 0.45 0.75 0.018 0.030
L1 1.00 REF 0.039 REF L2 0.50 REF
S 0.20 ––– 0.008 ––– R1 0.08 ––– 0.003 ––– R2 0.08 0.20 0.003 0.008
q
0 7 0 7
_
q
0 ––– 0 –––
1
_
q
11 13 11 13
2
_
q
11 13 11 13
3
_
MOTOROLA FAST SRAM
MCM63F733A
15
Page 16
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MCM63F733A 16
MOTOROLA FAST SRAM
MCM63F733A/D
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