128K x 32 Bit Flow–Through
BurstRAM Synchronous
Fast Static RAM
The MCM63F733A is a 4M–bit synchronous fast static RAM designed to provide a burstable, high performance, secondary cache for the PowerPC and
other high performance microprocessors. It is organized as 128K words of 32
bits each, fabricated with high performance silicon gate CMOS technology.
This device integrates input registers, a 2–bit address counter , and high speed
SRAM onto a single monolithic circuit for reduced parts count in cache data
RAM applications. Synchronous design allows precise cycle control with the
use of an external clock (K). CMOS circuitry reduces the overall power consumption of the integrated functions for greater reliability.
Addresses (SA), data inputs (DQx), and all control signals except output
enable (G
positive–edge–triggered noninverting registers.
Bursts can be initiated with either ADSP
addresses can be generated internally by the MCM63F733A (burst sequence
operates in linear or interleaved mode dependent upon state of LBO
trolled by the burst address advance (ADV
Write cycles are internally self–timed and are initiated by the rising edge of the
clock (K) input. This feature eliminates complex off–chip write pulse generation
and provides increased timing flexibility for incoming signals.
Synchronous byte write (SBx
nous write enable (SW
to all bytes. The four bytes are designated as “a”, “b”, “c”, and “d”. SBa
DQa, SBb
writes SBx
or if all SBx
For read cycles, a flow–through SRAM allows output data to simply flow freely
from the memory array .
The MCM63F733A operates from a 3.3 V core power supply and all outputs
operate on a 2.5 V or 3.3 V power supply. All inputs and outputs are JEDEC
Standard JESD8–5 compatible.
86GInputAsynchronous Output Enable Input.
89KInputClock: This signal registers the address, data in, and all control signals
31LBOInputLinear Burst Order Input: This pin may be left floating; it will default as
32, 33, 34, 35, 44, 45, 46,
47, 48, 49, 50, 81, 82, 99, 100
36, 37SA1, SA0InputSynchronous Address Inputs: These pins must be wired to the two
93, 94, 95, 96
(a) (b) (c) (d)
98SE1InputSynchronous Chip Enable: Active low to enable chip.
97SE2InputSynchronous Chip Enable: Active high for depth expansion.
92SE3InputSynchronous Chip Enable: Active low for depth expansion.
88SGWInputSynchronous Global Write: This signal writes all bytes regardless of the
87SWInputSynchronous Write: This signal writes only those bytes that have been
64ZZInputSleep Mode: This active high asynchronous signal places the RAM into
15, 41, 65, 91V
4, 11, 20, 27, 54, 61, 70, 77V
5, 10, 17, 21, 26, 40,
55, 60, 67, 71, 76, 90
14, 16, 38, 39, 42, 43, 66NC—No Connection: There is no connection to the chip.
TypeDescription
ongoing burst and latches a new external address. Used to initiate a
READ, WRITE, or chip deselect.
ongoing burst and latches a new external address. Used to initiate a
new READ, WRITE, or chip deselect (exception — chip deselect does
not occur when ADSP
accordance with counter type selected (linear/interleaved).
DQxI/OSynchronous Data I/O: “x” refers to the byte being read or written
SAInputSynchronous Address Inputs: These inputs are registered and must
SBxInputSynchronous Byte Write Inputs: “x” refers to the byte being written
DD
DDQ
V
SS
Supply Core Power Supply.
Supply I/O Power Supply.
Supply Ground.
(byte a, b, c, d).
except G
interleaved.
Low — linear burst counter (68K/PowerPC).
High — interleaved burst counter (486/i960/Pentium).
meet setup and hold times.
LSBs of the address bus for proper burst operation. These inputs are
registered and must meet setup and hold times.
(byte a, b, c, d). SGW
Negated high — blocks ADSP
asserted.
status of the SBx
being used, tie this pin high.
selected using the byte write SBx
are being used, tie this pin low.
the lowest power mode. The ZZ pin disables the RAMs internal clock
when placed in this mode. When ZZ is negated, the RAM remains in
low power mode until it is commanded to READ or WRITE. Data
integrity is maintained upon returning to normal operation.
, LBO, and ZZ.
is asserted and SE1 is high).
overrides SBx.
or deselects chip when ADSC is
and SW signals. If only byte write signals SBx are
ReadHHXXXX
ReadHLHHHH
Write Byte aHLLHHH
Write Byte bHLHLHH
Write Byte cHLHHLH
Write Byte dHLHHHL
Write All BytesHLLLLL
Write All BytesLXXXXX
ABSOLUTE MAXIMUM RATINGS (See Note 1)
RatingSymbolValueUnit Notes
Power Supply VoltageV
I/O Supply VoltageV
Input Voltage Relative to VSS for
Any Pin Except V
Input Voltage (Three–State I/O)V
Output Current (per I/O)I
Package Power DissipationP
Temperature Under BiasT
Storage TemperatureT
NOTES:
1. Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are
exceeded. Functional operation should be restricted to RECOMMENDED OPERATING CONDITIONS. Exposure to higher than recommended voltages for extended
periods of time could affect device reliability.
2. This is a steady–state DC parameter that is in effect after the power supply has
achieved its nominal operating level. Power sequencing is not necessary.
3. Power dissipation capability is dependent upon package characteristics and use
environment. See Package Thermal Characteristics.
DD
DD
DDQ
Vin, V
out
bias
stg
out
IT
D
– 0.5 to + 4.6V
VSS – 0.5 to V
– 0.5 to VDD + 0.5V2
– 0.5 to V
– 10 to + 85°C
– 55 to + 125°C
DD
+ 0.5V2
DDQ
± 20mA
1.2W3
V2
This device contains circuitry to protect the
inputs against damage due to high static voltages or electric fields; however, it is advised
that normal precautions be taken to avoid
application of any voltage higher than maximum rated voltages to this high–impedance
circuit.
PACKAGE THERMAL CHARACTERISTICS
RatingSymbolMaxUnitNotes
Junction to Ambient (@ 200 lfm)Single–Layer Board
Four–Layer Board
Junction to Board (Bottom)R
Junction to Case (Top)R
NOTES:
1. Junction temperature is a function of on–chip power dissipation, package thermal resistance, mounting site (board) temperature, ambient
temperature, air flow, board population, and board thermal resistance.
2. Per SEMI G38–87.
3. Indicates the average thermal resistance between the die and the printed circuit board.
4. Indicates the average thermal resistance between the die and the case top surface via the cold plate method (MIL SPEC–883
Method 1012.1).
MCM63F733A
R
θJA
θJB
θJC
40
25
17°C/W3
9°C/W4
°C/W1, 2
MOTOROLA FAST SRAM
6
Page 7
DC OPERA TING CONDITIONS AND CHARACTERISTICS
(VDD = 3.3 V + 10%, – 5%, TA = 0 to 70°C, Unless Otherwise Noted)
RECOMMENDED OPERATING CONDITIONS: 2.5 V I/O Supply
ParameterSymbolMinTypMaxUnit
Supply VoltageV
I/O Supply VoltageV
Input Low VoltageV
Input High VoltageV
Input High Voltage (I/O Pins)V
Output Low Voltage (IOL = 2 mA)V
Output High Voltage (IOH = – 2 mA)V
(Voltages Referenced to VSS = 0 V)
DD
DDQ
IL
IH
IH2
OL
OH
3.1353.33.6V
2.3752.52.9V
– 0.3—0.7V
1.7—VDD + 0.3V
1.7—V
——0.7V
1.7——V
RECOMMENDED OPERATING CONDITIONS: 3.3 V I/O Supply (Voltages Referenced to V
ParameterSymbolMinTypMaxUnit
Supply VoltageV
I/O Supply VoltageV
Input Low VoltageV
Input High VoltageV
Input High Voltage (I/O Pins)V
Output Low Voltage (IOL = 8 mA)V
Output High Voltage (IOH = – 4 mA)V
DD
DDQ
IL
IH
IH2
OL
OH
3.1353.33.6V
3.1353.3V
– 0.5—0.8V
2—VDD + 0.5V
2—V
——0.4V
2.4——V
SS
= 0 V)
+ 0.3V
DDQ
DD
+ 0.5V
DDQ
V
V
SS
VSS – 1.0 V
V
IH
Figure 1. Undershoot Voltage
20% t
KHKH
(MIN)
MOTOROLA FAST SRAM
MCM63F733A
7
Page 8
SUPPLY CURRENTS
ParameterSymbolMinTypMaxUnitNotes
Input Leakage Current (0 V ≤ Vin ≤ VDD)I
Output Leakage Current (0 V ≤ Vin ≤ V
AC Supply Current (Device Selected,MCM63F733A–10
All Outputs Open, Freq = Max)MCM63F733A–11
Includes VDD Only
CMOS Standby Supply Current (Device Deselected, Freq = 0,
VDD = Max, All Inputs Static at CMOS Levels)
Sleep Mode Supply Current (Sleep Mode, Freq = Max,
VDD = Max, All Other Inputs Static at CMOS Levels,
ZZ ≥ VDD – 0.2 V)
TTL Standby Supply Current (Device Deselected, Freq = 0,
VDD = Max, All Inputs Static at TTL Levels)
Clock Running (Device Deselected, MCM63F733A–10
Freq = Max, VDD = Max, All Inputs MCM63F733A–11
Toggling at CMOS Levels)
Static Clock Running (Device Deselected,MCM63F733A–10
Freq = Max, VDD = Max, All Inputs MCM63F733A–11
Static at TTL Levels)
NOTES:
1. LBO
pin has an internal pullup and will exhibit leakage currents of ± 5 µA.
2. ZZ pin has an internal pulldown and will exhibit leakage currents of ± 5 µA.
3. Reference AC Operating Conditions and Characteristics for input and timing.
4. All addresses transition simultaneously low (LSB) then high (MSB).
5. Data states are all zero.
6. Device is deselected as defined by the Truth Table.
7. Device in Sleep Mode as defined by the Asynchronous Truth Table.
8. CMOS levels for I/Os are VIT ≤ VSS + 0.2 V or ≥ V
9. TTL levels for I/Os are VIT ≤ VIL or ≥ V
)I
DDQ
DDQ
. TTL levels for other inputs are Vin ≤ VIL or ≥ VIH.
IH2
lkg(O)
I
– 0.2 V. CMOS levels for other inputs are Vin ≤ VSS + 0.2 V or ≥ VDD – 0.2 V.
lkg(I)
DDA
I
SB2
I
ZZ
I
SB3
I
SB4
I
SB5
——± 1µA1, 2
——± 1µA
——TBDmA3, 4, 5
——TBDmA6, 8
——2mA2, 7, 8
——TBDmA6, 9
——TBDmA3, 4,
5, 6, 8
——TBDmA6, 9
CAPACITANCE (f = 1.0 MHz, dV = 3.0 V, T
ParameterSymbolMinTypMaxUnit
Input CapacitanceC
Input/Output CapacitanceC
= 0 to 70°C, Periodically Sampled Rather Than 100% Tested)
A
I/O
in
—45pF
—78pF
MCM63F733A
8
MOTOROLA FAST SRAM
Page 9
AC OPERA TING CONDITIONS AND CHARACTERISTICS
(VDD = 3.3 V + 10%, – 5%, TA = 0 to 70°C, Unless Otherwise Noted)
Cycle Timet
Clock High Pulse Widtht
Clock Low Pulse Widtht
Clock Access Timet
Output Enable to Output Validt
Clock High to Output Activet
Clock High to Output Changet
Output Enable to Output Activet
Output Disable to Q High–Zt
Clock High to Q High–Zt
Setup Times:Address
Hold Times: Address
Sleep Mode Standbyt
Sleep Mode Recoveryt
Sleep Mode High to Q High–Zt
NOTES:
1. Write is defined as either any SBx
or ADSC is asserted.
2. All read and write cycle timings are referenced from K or G
3. G
is a don’t care after write cycle begins. To prevent bus contention, G should be negated prior to start of write cycle.
4. In order to reduce test correlation issues and to reduce the effects of application specific input edge rate variations on correlation between
data sheet parameters and actual system performance, FSRAM AC parametric specifications are always specified at V
design exercises, it is desirable to evaluate timing using other reference levels. Since the maximum test input edge rate is known and is given
in the AC Test Conditions section of the data sheet as 1 V/ns, one can easily interpolate timing values to other reference levels.
5. This parameter is sampled and not 100% tested.
6. Measured at
± 200 mV from steady state.
ADSP
, ADSC, ADV
Data In
Write
Chip Enable
ADSP
, ADSC, ADV
Data In
Write
Chip Enable
and SW low or SGW is low. Chip Enable is defined as SE1 low , SE2 high, and SE3 low whenever ADSP
KHKH
KHKL
KLKH
KHQV
GLQV
KHQX1
KHQX2
GLQX
GHQZ
KHQZ
t
ADKH
t
ADSKH
t
DVKH
t
WVKH
t
EVKH
t
KHAX
t
KHADSX
t
KHDX
t
KHWX
t
KHEX
ZZS
ZZREC
ZZQZ
.
MinMaxMinMax
13—15—ns
5.2—6—ns
5.2—6—ns
—10—11ns
—3.8—3.8ns
0—0—ns5, 6
1.5—1.5—ns6
0—0—ns5, 6
—3.8—3.8ns5, 6
1.53.81.53.8ns5, 6
2—2—ns
0.5—0.5—ns
—2 x
2 x
t
KHKH
—15—15ns
t
KHKH
—2 x
MCM63F733A–1 1
66 MHz
—2 x
t
KHKH
t
KHKH
UnitNotes
ns
—ns
DDQ
/2. In some
MOTOROLA FAST SRAM
MCM63F733A
9
Page 10
OUTPUT
OUTPUT
C
L
Z0 = 50
Ω
1.25 V
Figure 2. AC Test Load
2400
2200
2000
1800
1600
1400
1200
1000
800
CLOCK ACCESS TIME DELA Y (ps)
600
400
200
0
RL = 50
Ω
LUMPED CAP ACITANCE, CL (pF)
100806040200
Figure 3. Lumped Capacitive Load and T ypical Derating Curve
MCM63F733A
10
MOTOROLA FAST SRAM
Page 11
VOLTAGE (V)
– 0.5
0
0.8
1.25
1.5
2.3
2.7
2.9
VOLTAGE (V)
– 0.5
0
1.4
1.65
2.0
3.135
3.6
PULL–UP
I (mA) MINI (mA) MAX
– 38
– 38
– 38
– 30
– 27
0
0
0
PULL–UP
I (mA) MINI (mA) MAX
– 40
– 40
– 40
– 37
– 28
0
0
– 105
– 105
– 105
– 83
– 75
– 40
– 15
0
– 120
– 120
– 120
– 108
– 81
– 20
0
(a) Pull–Up for V
(b) Pull–Up: V
2.9
2.5
2.3
1.25
VOLTAGE (V)
0.8
DDQ
3.6
3.135
2.8
1.65
VOLTAGE (V)
1.4
DDQ
0
0– 40– 105
CURRENT (mA)
= 2.5 V
0
0
– 40
CURRENT (mA)
= 3.3 V
– 120– 80
PULL–DOWN
VOLTAGE (V)
– 0.5
0
0.4
0.8
1.25
1.6
2.8
3.2
3.4
I (mA) MINI (mA) MAX
MOTOROLA FAST SRAM
0
0
10
20
31
40
40
40
40
V
DD
0
0
20
40
63
80
80
80
80
1.6
1.25
VOLTAGE (V)
0.3
0
04080
(c) Pull–Down
Figure 4. T ypical Output Buffer Characteristics
CURRENT (mA)
MCM63F733A
11
Page 12
CD
READ/WRITE CYCLES
GLQV
t
Q(B)D(C)D(C+1)D(C+2)D(C+3)Q(D)
GLQX
t
SE2, SE3
ADSP, SA
GHQZ
t
BURST WRITE
IGNORED
KLKH
t
KHKL
t
KHKH
t
Q(B+2)Q(B+3)
BURST WRAPS AROUND
KHQX2
Q(B)Q(B+1)
t
KHQV
t
AB
K
SA
ADSP
ADSC
ADV
SE1
E
W
G
Q(A)Q(n)
DQx
KHQX1
t
KHQZ
t
BURST READSINGLE READ
DESELECTEDSINGLE READ
W low = SGW low and/or SW and SBx low.
NOTE: E low = SE2 high and SE3 low.
MCM63F733A
12
MOTOROLA FAST SRAM
Page 13
NORMAL OPERATION
NO READS OR
WRITES ALLOWEDIN SLEEP MODE
SLEEP MODE TIMING
ZZREC
t
ZZ
I
WRITES ALLOWEDNORMAL OPERATION
NO NEW READS OR
K
ADS
ADDR
ADV
ZZ
ZZS
t
I
DD
ZZ
E low = SE1 low, SE2 high, SE3 low.
ADS high = both ADSC, ADSP high.
I (max) specifications will not be met if inputs toggle.
NOTE: ADS low = ADSC low or ADSP low.
ZZQZ
t
E
W
G
DQ
MOTOROLA FAST SRAM
MCM63F733A
13
Page 14
APPLICATION INFORMATION
SLEEP MODE
A sleep mode feature, the ZZ pin, has been implemented
on the MCM63F733A. It allows the system designer to place
the RAM in the lowest possible power condition by asserting
ZZ. The sleep mode timing diagram shows the different
modes of operation: Normal Operation, No READ/WRITE
Allowed, and Sleep Mode. Each mode has its own set of
constraints and conditions that are allowed.
Normal Operation: All inputs must meet setup and hold
times prior to sleep and t
ZZREC
nanoseconds after recovering from sleep. Clock (K) must also meet cycle, high,
and low times during these periods. Two cycles prior to sleep,
initiation of either a read or write operation is not allowed.
No READ/WRITE: During the period of time just prior to
sleep and during recovery from sleep, the assertion of either
, ADSP, or any write signal is not allowed. If a write
ADSC
operation occurs during these periods, the memory array
may be corrupted. Validity of data out from the RAM can not
be guaranteed immediately after ZZ is asserted (prior to
being in sleep).
Sleep Mode: The RAM automatically deselects itself. The
RAM disconnects its internal clock buffer . The external clock
K
may continue to run without impacting the RAMs sleep current (IZZ). All inputs are allowed to toggle — the RAM will not
be selected and perform any reads or writes. However, if
inputs toggle, the IZZ (max) specification will not be met.
NON–BURST SYNCHRONOUS OPERATION
Although this BurstRAM has been designed for PowerPC
— and other high end MPU–based systems, these SRAMs
can be used in other high speed L2 cache or memory
applications that do not require the burst address feature.
Most L2 caches designed with a synchronous interface can
make use of the MCM63F733A. The burst counter feature of
the BurstRAM can be disabled, and the SRAM can be configured to act upon a continuous stream of addresses. See
Figure 5.
CONTROL PIN TIE VALUES EXAMPLE
Non–Burst
Sync Non–Burst,
Pipelined SRAM
NOTE: Although X is specified in the table as a don’t care, the pin
must be tied either high or low.
ADSP ADSC ADVSE1SE2 LBO
HLHLHX
(H ≥ VIH, L ≤ VIL)
ADDRABCDEFGH
SE3
W
G
DQ
Q(B)Q(A)
Q(D)Q(C)D(E)
D(F)
D(G)
WRITESREADS
D(H)
Figure 5. Example Configuration as Non–Burst Synchronous SRAM
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DATUM PLANE –H– IS LOCATED AT BOTTOM OF
LEAD AND IS COINCIDENT WITH THE LEAD
WHERE THE LEAD EXITS THE PLASTIC BODY AT
THE BOTTOM OF THE PARTING LINE.
4. DATUMS –A–, –B– AND –D– TO BE DETERMINED
AT DATUM PLANE –H–.
5. DIMENSIONS D AND E TO BE DETERMINED AT
SEATING PLANE –C–.
6. DIMENSIONS D1 AND E1 DO NOT INCLUDE
MOLD PROTRUSION. ALLOWABLE PROTRUSION
IS 0.25 (0.010) PER SIDE. DIMENSIONS D1 AND
B1 DO INCLUDE MOLD MISMATCH AND ARE
DETERMINED AT DATUM PLANE –H–.
7. DIMENSION b DOES NOT INCLUDE DAMBAR
PROTRUSION. DAMBAR PROTRUSION SHALL
NOT CAUSE THE b DIMENSION TO EXCEED 0.45
(0.018).
Motorola reserves the right to make changes without further notice to any products herein. Motorola makes no warranty , representation or guarantee regarding
the suitability of its products for any particular purpose, nor does Motorola assume any liability arising out of the application or use of any product or circuit, and
specifically disclaims any and all liability, including without limitation consequential or incidental damages. “T ypical” parameters which may be provided in Motorola
data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals”
must be validated for each customer application by customer’s technical experts. Motorola does not convey any license under its patent rights nor the rights of
others. Motorola products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other
applications intended to support or sustain life, or for any other application in which the failure of the Motorola product could create a situation where personal injury
or death may occur. Should Buyer purchase or use Motorola products for any such unintended or unauthorized application, Buyer shall indemnify and hold Motorola
and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees
arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that
Motorola was negligent regarding the design or manufacture of the part. Motorola and are registered trademarks of Motorola, Inc. Motorola, Inc. is an Equal
Opportunity/Affirmative Action Employer.
How to reach us:
USA/EUROPE/Locations Not Listed: Motorola Literature Distribution;JAPAN: Nippon Motorola Ltd.: SPD, Strategic Planning Office, 141,
P.O. B o x 5405, Denver , Colorado, 80217. 1-303-675-2140 or 1-800-441-2447 4-32-1 Nishi-Gotanda, Shagawa-ku, Tokyo, Japan. 03-5487-8488
Mfax: RMFAX0@email.sps.mot.com – TOUCHTONE 1-602-244-6609ASIA/PACIFIC: Motorola Semiconductors H.K. Ltd.; 8B Tai Ping Industrial Park,
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Mfax is a trademark of Motorola, Inc.
MCM63F733A16
◊
MOTOROLA FASTSRAM
MCM63F733A/D
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