Datasheet MC88LV926DW Datasheet (Motorola)

Page 1

SEMICONDUCTOR TECHNICAL DATA
      
The PLL allows the high current, low skew outputs to lock onto a single clock input and distribute it with essentially zero delay to multiple locations on a board. The PLL also allows the MC88LV926 to multiply a low frequency input clock and distribute it locally at a higher (2X) system frequency.
2X_Q Output Meets All Requirements of the 50 and 66MHz 68060
Microprocessor PCLK Input Specifications
Low Voltage 3.3V V
CC
Three Outputs (Q0–Q2) With Output–Output Skew <500ps
CLKEN Output for Half Speed Bus Applications
The Phase Variation From Part–to–Part Between SYNC and the ‘Q’
Outputs Is Less Than 600ps (Derived From the TPD Specification, Which Defines the Part–to–Part Skew)
SYNC Input Frequency Range From 5MHZ to 2X_Q F
All Outputs Have ±36mA Drive (Equal High and Low) CMOS Levels
Can Drive Either CMOS or TTL Inputs. All Inputs Are TTL–Level Compatible
Test Mode Pin (PLL_EN) Provided for Low Frequency Testing
_IN/RST_OUT(LOCK) pins
/4
Max

LOW SKEW CMOS PLL
68060 CLOCK DRIVER
20
1
DW SUFFIX
PLASTIC SOIC PACKAGE
CASE 751D–04
Three ‘Q’ outputs (Q0–Q2) are provided with less than 500ps skew between their rising edges. A 2X_Q output runs at twice the ‘Q’ output frequency . The 2X_Q output is ideal for 68060 systems which require a 2X processor clock input, and it meets the tight duty cycle spec of the 50 and 66MHz 68060. The QCLKEN output is designed to drive the CLKEN the bus logic runs at half of the microprocessor clock rate. The QCLKEN output is skewed relative to the 2X_Q output to ensure that CLKEN multiplication from the ‘Q’ outputs to the SYNC input. Since the feedback is done internally (no external feedback pin is provided) the input/output frequency relationships are fixed. The Q3 tree design.
In normal phase–locked operation the PLL_EN pin is held high. Pulling the PLL_EN pin low disables the VCO and puts the 88LV926 in a static ‘test mode’. In this mode there is no frequency limitation on the input clock, which is necessary for a low frequency board test environment.
The RST pin will be pulled actively low until phase–lock is achieved. When phase–lock occurs, the RST_OUT(LOCK) is released and a pull–up resistor will pull the signal high. To give a processor reset signal, the RST RST
_OUT(LOCK) pin will stay low for 1024 cycles of the ‘Q’ output frequency after the RST_IN pin is brought back high.
Description of the RST
The RST acting as a lock indicator. If the RST steady state phase/frequency lock to the input reference is achieved. 1024 ‘Q’ output cycles after phase–lock is achieved the RST
_OUT(LOCK) pin will go into a high impedance state, allowing it to be pulled high by an external pull–up resistor (see the AC/DC specs for the characteristics of the RST RST
_OUT(LOCK) pin will remain low.
1/96
Motorola, Inc. 1996
setup and hold times of the 68060 are satisfied. A Q/2 frequency is fed back internally, providing a fixed 2X
output provides an inverted clock output to allow flexibility in the clock
_OUT(LOCK) pin doubles as a phase–lock indicator. When the RST_IN pin is held high, the open drain RST_OUT
_IN pin is toggled low, and the
_IN/RST_OUT(LOCK) Functionality
_IN and RST_OUT(LOCK) pins provide a 68030/040/060 processor reset function, with the RST_OUT pin also
_IN pin is held high during system power–up, the RST_OUT pin will be in the low state until
_OUT(LOCK) pin). If the RST_IN pin is held low during power–up, the
1
REV 3
input of the 68060 when
Page 2
MC88LV926
Pinout: 20–Lead Wide SOIC Package (Top View)
1
2
CC
3
Q0
4
5
6
7
8
9
10
RST_IN
Description of the RST_IN/RST_OUT(LOCK) Functionality (continued)
After the system start–up is complete and the 88LV926 is
phase–locked to the SYNC input signal (RST
_OUT high), the processor reset functionality can be utilized. When the RST
_IN pin is toggled low (min. pulse width=10nS),
RST
_OUT(LOCK) will go to the low state and remain there for 1024 cycles of the ‘Q’ output frequency (512 SYNC cycles). During the time in which the RST
_OUT(LOCK) is actively pulled low, all the 88LV926 clock outputs will continue operating correctly and in a locked condition to the SYNC input (clock signals to the 68030/040/060 family of processors must continue while the processor is in reset). A propagation delay after the 1024th cycle RST
_OUT(LOCK) goes back to the high impedance state to be pulled high by the resistor.
phase–lock to the reference source, some constraints must be placed on the power supply ramp rate to make sure the RST
_OUT(LOCK) signal holds the processor in reset during system start–up (power–up). With the recommended loop filter values (see Figure 6.) the lock time is approximately 10ms. The phase–lock loop will begin attempting to lock to a reference source (if it is present) when VCC reaches 2V. If the VCC ramp rate is significantly slower than 10ms, then the PLL could lock to the reference source, causing RST
_OUT(LOCK) to go high before the 88LV926 and ’030/040 processor is fully powered up, violating the processor reset specification. Therefore, if it is necessary for the RST ramp rate must be less than 10mS for proper 68030/040/060 reset operation.
Power Supply Ramp Rate Restriction for Correct 030/040 Processor Reset Operation During System Start–up
Because the RST_OUT(LOCK) pin is an indicator of
This ramp rate restriction can be ignored if the RST can be held low during system start–up (which holds RST
_OUT low). The RST_OUT(LOCK) pin will then be pulled back high 1024 cycles after the RST
CAPACITANCE AND POWER SPECIFICATIONS
20
GNDQ3
19
2X_QV
18
QCLKENMR
17
V
CC
16
Q2VCC(AN)
15
GNDRC1
14
RST
_OUT(LOCK)GND(AN)
13
PLL_ENSYNC
12
Q1GND
11
V
CC
_IN pin to be held high during power–up, the V
_IN pin goes high.
CC
_IN pin
Symbol Parameter Value Typ Unit Test Conditions
C
IN
C
PD
PD
1
PD
2
* Value at VCC = 3.3V TBD.
MOTOROLA TIMING SOLUTIONS
Input Capacitance 4.5* pF VCC = 5.0V Power Dissipation Capacitance 40* pF VCC = 5.0V Power Dissipation at 33MHz With 50
Thevenin Termination Power Dissipation at 33MHz With 50
Parallel Termination to GND
15mW/Output*
90mW/Device
37.5mW/Output* 225mW/Device
2
mW VCC = 5.0V
T = 25°C
mW VCC = 5.0V
T = 25°C
BR1333 — REV 5
Page 3
MC88LV926
MAXIMUM RATINGS*
Symbol Parameter Limits Unit
VCC, AV V V I I I T
* Maximum Ratings are those values beyond which damage to the device may occur. Functional operation should be restricted to the
Recommended Operating Conditions.
CC in out
in out CC
stg
RECOMMENDED OPERATING CONDITIONS
Symbol Parameter Limits Unit
V
CC
V
in
V
out
T
A
ESD Static Discharge Voltage > 1500 V
DC Supply Voltage Referenced to GND –0.5 to 7.0 V DC Input Voltage (Referenced to GND) –0.5 to VCC +0.5 V DC Output Voltage (Referenced to GND) –0.5 to VCC +0.5 V DC Input Current, Per Pin ±20 mA DC Output Sink/Source Current, Per Pin ±50 mA DC VCC or GND Current Per Output Pin ±50 mA Storage Temperature –65 to +150 °C
Supply Voltage 3.3 ±0.3 V DC Input Voltage 0 to V DC Output Voltage 0 to V Ambient Operating Temperature 0 to 70 °C
CC CC
V V
DC CHARACTERISTICS (TA = 0°C to 70°C; VCC = 3.3V ± 0.3V)
Symbol Parameter V
V
IH
V
IL
V
OH
V
OL
I
IN
I
CCT
I
OLD
I
OHD
I
CC
1. IOL is +12mA for the RST_OUT output.
2. The PLL_EN input pin is not guaranteed to meet this specification.
3. Maximum test duration 2.0ms, one output loaded at a time.
4. The MC88LV926 can also be operated from a 5.0V supply. VOH output levels will vary 1:1 with VCC, input levels and current specs will be unchanged.
Minimum High Level Input Voltage 3.0
Minimum Low Level Input Voltage 3.0
Minimum High Level Output Voltage 3.0
Minimum Low Level Output Voltage 3.0
Maximum Input Leakage Current 3.3 ±1.0 µA VI = VCC, GND Maximum ICC/Input 3.3 2.0 Minimum Dynamic3 Output Current 3.3 88 mA V
Maximum Quiescent Supply Current 3.3 750 µA VI = VCC, GND
CC
3.3
3.3
3.3
3.3
3.3 –88 mA V
4
Guaranteed Limits Unit Condition
2.0
2.0
0.8
0.8
2.2
2.5
0.55
0.55
2
V V
V V
V VIN = VIH or V
V VIN = VIH or V
mA VI = VCC – 2.1V
= 0.1V or
OUT
VCC – 0.1V
= 0.1V or
OUT
VCC – 0.1V
I
OH –36mA
I
OH +36mA
OLD OHD
–36mA
+36mA
= 1.0V Max
= 3.85 Min
IL
IL
1
TIMING SOLUTIONS BR1333 — REV 5
3 MOTOROLA
Page 4
MC88LV926
RST_OUT
RST_IN
SYNC1
PLL_EN
LOCK INDICAT OR
RESET_OUT
PFD
÷
8
POWER–ON
RESET
CH
PUMP
01
VCO
DELAY
Q
÷
2
R
Q
÷
4
R
Q
÷
4
R
Q
÷
4
R
Q
÷
4
R
÷
4
R
2X_Q
Q0
Q1
Q2
Q3
CLKEN
MR
Figure 1. MC88L V926 Logic Block Diagram
SYNC INPUT TIMING REQUIREMENTS
Symbol Parameter Minimum Maximum Unit
t
RISE/FALL
SYNC Input t
,
CYCLE
SYNC Input Duty Cycle Duty Cycle, SYNC Input 50% ± 25%
Rise/Fall Time, SYNC Input From 0.8V to 2.0V
Input Clock Period SYNC Input
5.0 ns
f
2X_Q
1
ń
4
200 ns
FREQUENCY SPECIFICATIONS (TA = 0°C to 70°C; VCC = 3.3V ± 0.3V or 5.0V ±5%)
Symbol Parameter Guaranteed Minimum Unit
Fmax (2X_Q) Maximum Operating Frequency, 2X_Q Output 66 MHz Fmax (‘Q’) Maximum Operating Frequency,
Maximum Operating Frequency is guaranteed with the 88LV926 in a phase–locked condition.
MOTOROLA TIMING SOLUTIONS
Q0–Q3 Outputs
4
33 MHz
BR1333 — REV 5
Page 5
MC88LV926
AC CHARACTERISTICS (TA = 0°C to 70°C; VCC = 3.3V ± 0.3V or 5.0V ±5%)
Symbol Parameter Mimimum Maximum Unit Condition
t
RISE/FALL
All Outputs t
RISE/FALL
2X_Q Output t
pulse width(a)
(Q0, Q1, Q2, Q3)
t
pulse width(b)
(2X_Q Output)
t
SKEWr
(Rising)
t
SKEWf
(Falling)
t
SKEWall
t
SKEW
t
LOCK
t
PHL
t
REC
SYNC tW, MR LOW tW, RST_IN LOW Minimum Pulse Width, RST_IN Low 10 ns When in Phase–Lock t
PZL
t
PLZ
1. These specifications are not tested, they are guaranteed by statistical characterization. See Application Note 1 for a discussion of this methodology.
2. Under equally loaded conditions and at a fixed temperature and voltage.
3. With VCC fully powered–on: t
4. See Application Note 4 for the distribution in time of each output referenced to SYNC.
5. Specification is valid only when the PLL_EN pin is low.
6. Guaranteed that QCLKEN
1
1
1,2
1,2
1,2
QCLKEN Output–to–Output Skew
3
MR – Q Propagation Delay,
, MR to
5
5
Rise/Fall Time, into 50 Load 0.3 1.6 ns t
Rise/Fall Time into a 50 Load 0.5 1.6 ns t
1
Output Pulse Width Q0, Q1, Q2, Q3 at 1.65V
1
Output Pulse Width 2X_Q at 1.65V
Output–to–Output Skew Between Outputs Q0–Q2 (Rising Edge Only)
Output–to–Output Skew Between Outputs Q0–Q2 (Falling Edge Only)
Output–to–Output Skew 2X_Q, Q0–Q2, Q3
QCLKEN to 2X_Q 2X_Q = 50MHz
Phase–Lock Acquisition Time, All Outputs to SYNC Input
MR to Any Output (High–Low) Reset Recovery Time rising MR edge
to falling SYNC edge Minimum Pulse Width, MR input Low 5 ns
Output Enable Time RST
_IN Low to RST_OUT Low
Output Enable Time RST_IN High to RST_OUT High Z
Max is with C1 = 0.1µF; t
CLOCK
will meet the setup and hold time requirement of the 68060.
2X_Q = 66MHz
0.5t
0.5t
1016 ‘Q’ Cycles
(508 Q/2 Cycles)
LOCK
– 0.5 0.5t
cycle
– 0.5 0.5t
cycle
500 ps Into a 50 Load
1.0 ns Into a 50 Load
750 ps Into a 50 Load
6
9.7
6
7.0
1 10 ms
1.5 13.5 ns Into a 50 Load
9 ns
1.5 16.5 ns See Application
1024 ‘Q’ Cycles
(512 Q/2 Cycles)
Min is with C1 = 0.01µF.
+ 0.5 ns 50 Load Terminated to
cycle
+ 0.5 ns 50 Load Terminated to
cycle
ns Into a 50 Load
ns See Application
– 0.8V to 2.0V
RISE
t
– 2.0V to 0.8V
FALL
– 0.8V to 2.0V
RISE
t
– 2.0V to 0.8V
FALL
VCC/2 (See Application Note 3)
VCC/2 (See Application Note 3)
Terminated to VCC/2 (See Timing Diagram in Figure 5.)
Terminated to VCC/2 (See Timing Diagram in Figure 5.)
Terminated to VCC/2 (See Timing Diagram in Figure 5.)
Terminated to VCC/2 (See Timing Diagram in Figure 5.)
Terminated to VCC/2
Note 5
Note 5
TIMING SOLUTIONS BR1333 — REV 5
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Page 6
MC88LV926
Application Notes
1. Several specifications can only be measured when the MC88LV926 is in phase–locked operation. It is not possible to have the part in phase–lock on ATE (automated test equipment). Statistical characterization techniques were used to guarantee those specifications which cannot be measured on the A TE. MC88L V926 units were fabricated with key transistor properties intentionally varied to create a 14 cell designed experimental matrix. IC performance was characterized over a range of transistor properties (represented by the 14 cells) in excess of the expected process variation of the wafer fabrication area. Response Surface Modeling (RSM) techniques were used to relate IC performance to the CMOS transistor properties over operation voltage and temperature. IC performance to each specification and fab variation were used in conjunction with Yield Surface Modeling (YSM) methodology to set performance limits of ATE testable specifications within those which are to be guaranteed by statistical characterization. In this way, all units passing the ATE test will meet or exceed the non–tested specifications limits.
2. A 470K resistor tied to either Analog VCC or Analog GND, as shown in Figure 2., is required to ensure no jitter is present on the MC88LV926 outputs. This technique causes a phase offset between the SYNC input and the Q0 output, measured at the pins. The tPD spec describes how this offset varies with process, temperature, and voltage. The specs were arrived at by measuring the phase relationship for the 14 lots described in note 1 while the part was in phase–locked operation. The actual measurements were made with a 10MHz SYNC input (1.0ns edge rate from 0.8V to 2.0V). The phase measurements were made at 1.5V. See Figure 2. for a graphical description.
3. Two specs (t
RISE/FALL
and t
Width 2X_Q output,
PULSE
see AC Specifications) guarantee that the MC88LV926 meets the 33MHz and 66MHz 68060 P–Clock input specification.
RC1
EXTERNAL
LOOP FILTER
WITH THE 470K SPECIFICA TION, MEASURED AT THE INPUT PINS IS:
tPD = 2.25ns
SYNC INPUT
Q0 OUTPUT
330
R2
0.1µF
RESISTOR TIED IN THIS FASHION THE T
±
1.0ns (TYPICAL VALUES)
2.25ns
OFFSET
C1
ANALOG GND
470K REFERENCE RESISTOR
3V
Figure 2. Depiction of the Fixed SYNC to Q0 Offset (tPD) Which Is Present
When a 470K Resistor Is Tied to VCC or Ground
5V
PD
ANALOG V
470K
REFERENCE
RESISTOR
WITH THE 470K SPECIFICA TION, MEASURED AT THE INPUT PINS IS:
SYNC INPUT
Q0 OUTPUT
RESISTOR TIED IN THIS FASHION THE T
tPD = –0.80ns
CC
RC1
330
R2
0.1µF
ANALOG GND
±
0.30ns
–0.8ns
OFFSET
C1
5V
PD
3V
MOTOROLA TIMING SOLUTIONS
6
BR1333 — REV 5
Page 7
MC88LV926
RST_OUT PIN
INTERNAL
LOGIC
ANALOG GND
V
CC
1K
C
L
Figure 3. RST_OUT Test Circuit
12.5MHz
CRYSTAL
OSCILLA T OR
SYNC
MR PLL_EN RST
_IN
2X_Q
QCLKEN
RST
_OUT
Q0 Q1 Q2
Q3
66MHz P–CLOCK OUT-
PUT
33MHz
B–CLOCK
AND SYSTEM
OUTPUTS
DELAY 33MHz CLKEN OUTPUT
Figure 4. Logical Representation of the MC88L V926 With Input/Output Frequency Relationships
SYNC Input
Q0–Q3 Outputs
2X_Q Output
QCLKEN
t
SKEWall
t
SKEWQCLKEN
Figure 5. Output/Input Switching Waveforms and Timing Relationships
t
SKEWf
t
SYNC Input
CYCLE
t
SKEWr
Timing Notes
t
SKEWf
t
‘Q’ Outputs
CYCLE
t
SKEWQCLKEN
t
SKEWr
1. The MC88LV926 aligns rising edges of the outputs and the SYNC input, therefore the SYNC input does not require a 50% duty cycle.
2. All skew specs are measured between the VCC/2 crossing point of the appropriate output edges. All skews are specified as ‘windows’, not as a ± deviation around a center point.
TIMING SOLUTIONS BR1333 — REV 5
7 MOTOROLA
Page 8
MC88LV926
The tPD spec includes the full temperature range from 0°C to 70°C and the full VCC range from 3.0V to 3.3V . If the T and VCC is a given system are less than the specification limits, the tPD spec window will be reduced. The t
PD
window for a given T and VCC is given by the following regression formula:
TBD
Notes Concerning Loop Filter and Board Layout Issues
1. Figure 6. shows a loop filter and analog isolation scheme which will be effective in most applications. The following guidelines should be followed to ensure stable and jitter–free operation:
1a. All loop filter and analog isolation components should be
tied as close to the package as possible. Stray current passing through the parasitics of long traces can cause undesirable voltage transients at the RC1 pin.
1b. The 47 resistors, the 10µF low frequency bypass
capacitor, and the 0.1µF high frequency bypass capacitor form a wide bandwidth filter that will make the 88LV926 PLL insensitive to voltage transients from the system digital VCC supply and ground planes. This filter will typically ensure that a 100mV step deviation on the digital VCC supply will cause no more than a 100ps phase deviation on the 88LV926 outputs. A 250mV step deviation on VCC using the recommended filter values will cause no more than a 250ps phase deviation; if a 25µF bypass capacitor is used (instead of 10µF) a 250mV VCC step will cause no more than a 100ps phase deviation.
If good bypass techniques are used on a board design near components which may cause digital VCC and ground noise, the above described VCC step deviations should not occur at the 88L V926’s digital VCC supply . The
5. The RST
_OUT pin is an open drain N–Channel output. Therefore an external pull–up resistor must be provide to pull up the RST
_OUT pin when it goes into the high impedance state (after the MC88LV926 is phase–locked to the reference input with RST cycles after the RST locked). In the t
_IN pin goes high when the part is
and t
PLZ
_IN held high or 1024 ‘Q’
specifications, a 1K resistor
PZL
is used as a pull–up as shown in Figure 3.
purpose of the bypass filtering scheme shown in Figure
6. is to give the 88LV926 additional protection from the power supply and ground plane transients that can occur in a high frequency, high speed digital system.
1c. There are no special requirements set forth for the loop
filter resistors (470K and 330). The loop filter capacitor (0.1uF) can be a ceramic chip capacitor, the same as a standard bypass capacitor.
1d. The 470K reference resistor injects current into the
internal charge pump of the PLL, causing a fixed offset between the outputs and the SYNC input. This also prevents excessive jitter caused by inherent PLL dead–band. If the VCO (2X_Q output) is running above 40MHz, the 470K resistor provides the correct amount of current injection into the charge pump (2–3µA). If the VCO is running below 40MHz, a 1M reference resistor should be used (instead of 470K).
2. In addition to the bypass capacitors used in the analog filter of Figure 6., there should be a 0.1µF bypass capacitor between each of the other (digital) four V
CC
pins and the board ground plane. This will reduce output switching noise caused by the 88LV926 outputs, in addition to reducing potential for noise in the ‘analog’ section of the chip. These bypass capacitors should also be tied as close to the 88LV926 package as possible.
NOTE: FURTHER LOOP OPTIMIZA TION MA Y OCCUR
10µF LOW
FREQ BIAS
0.1µF HIGH FREQ BIAS
BOARD V
47
470K
47
BOARD GND
CC
5
ANALOG V
330
6
RC1
0.1µF (LOOP FILTER CAP)
A SEPARATE ANALOG POWER SUPPLY IS NOT NECESSARY AND SHOULD NOT BE USED. FOLLOWING THESE PRESCRIBED GUIDE­LINES IS ALL THAT IS NECESSARY T O USE THE MC88L V926 IN A NOR­MAL DIGITAL ENVIRONMENT.
7
ANALOG GND
CC
ANALOG LOOP FILTER/VCO SECTION OF THE MC88LV926 20–PIN SOIC PACKAGE (NOT DRAWN TO SCALE)
Figure 6. Recommended Loop Filter and Analog Isolation Scheme for the MC88L V926
MOTOROLA TIMING SOLUTIONS
8
BR1333 — REV 5
Page 9
MC88LV926
16.67MHz X–TAL
OSCILLA TOR
SYSTEM RESET
MC68060 PCLK
CLKEN
RESET
MEMORY MODULE
SYNC
_IN
RST
2X_Q
QCLKEN
RST
_OUT
Q0 Q1 Q2
Q3
66MHz
33MHz
Figure 7. T ypical MC88LV926/MC68060 System Configuration
ASIC
ASIC
TIMING SOLUTIONS BR1333 — REV 5
9 MOTOROLA
Page 10
MC88LV926
1
-T-
-A-
G
D
20 PL
0.25 (0.010)MT
OUTLINE DIMENSIONS
DW SUFFIX
SOIC PACKAGE
CASE 751D-03
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSION A AND B DO NOT INCLUDE MOLD
1120
-B-
P
0.25 (0.010) B
10
10 PL
MM
R X 45°
C
SEATING PLANE
K
S
S
A
B
M
F
J
PROTRUSION.
4. MAXIMUM MOLD PROTRUSION 0.15 (0.006) PER SIDE.
5. 751D-01, AND -02 OBSOLETE, NEW STANDARD 751D-03.
MILLIMETERS INCHES
MIN MINMAX MAX
DIM
12.95
12.65
A B C D F G
K
M
P R
7.60
7.40
2.65
2.35
0.49
0.35
0.90
0.50
1.27 BSC 0.050 BSC
J
0.32
0.25
0.25
0.10 7
0
°
0.25
10.55
0.75
°
10.05
0.499
0.292
0.093
0.014
0.020
0.010
0.004 0
0.395
0.010
0.510
0.299
0.104
0.019
0.035
0.012
0.009 7
°
°
0.415
0.029
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10
*MC88LV926/D*
MC88LV926/D
BR1333 — REV 5
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