Datasheet MC74HC573ADW, MC74HC573AF, MC74HC573AFEL, MC74HC573ADTEL, MC74HC573ADT Datasheet (MOTOROLA)

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Page 1
Semiconductor Components Industries, LLC, 2000
May, 2000 – Rev. 9
1 Publication Order Number:
MC74HC573A/D
MC74HC573A
Octal 3-State Noninverting Transpar ent Latch
High–Performance Silicon–Gate CMOS
These latches appear transparent to data (i.e., the outputs change asynchronously) when Latch Enable is high. When Latch Enable goes low, data meeting the setup and hold time becomes latched.
The HC573A is identical in function to the HC373A but has the data inputs on the opposite side of the package from the outputs to facilitate PC board layout.
Output Drive Capability: 15 LSTTL Loads
Outputs Directly Interface to CMOS, NMOS and TTL
Operating Voltage Range: 2.0 to 6.0 V
Low Input Current: 1.0 µA
In Compliance with the Requirements Defined by JEDEC Standard
No. 7A
Chip Complexity: 218 FETs or 54.5 Equivalent Gates
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MARKING
DIAGRAMS
1
20
A = Assembly Location WL = Wafer Lot YY = Year WW = Work Week
SOIC WIDE–20
DW SUFFIX CASE 751D
HC573A
AWLYYWW
PDIP–20 N SUFFIX CASE 738
1
20
MC74HC573AN
AWLYYWW
TSSOP–20 DT SUFFIX
CASE 948E
1
20
1
20
1
20
Device Package Shipping
ORDERING INFORMATION
MC74HC573AN PDIP–20 1440 / Box MC74HC573ADW SOIC–WIDE
38 / Rail MC74HC573ADWR2 SOIC–WIDE 1000 / Reel MC74HC573ADT TSSOP–20 75 / Rail MC74HC573ADTR2 TSSOP–20
2500 / Reel
HC
573A
ALYW
1
20
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2
LOGIC DIAGRAM
DATA
INPUTS
D0 D1 D2 D3 D4 D5 D6 D7
LATCH ENABLE
OUTPUT ENABLE
11 1
9
8
7
6
5
4
3
219
18 17 16 15 14 13 12
Q0 Q1 Q2 Q3 Q4 Q5 Q6 Q7
PIN 20 = V
CC
PIN 10 = GND
NONINVERTING
OUTPUTS
PIN ASSIGNMENT
D4
D2
D1
D0
OUTPUT
ENABLE
GND
D7
D6
D5
D3 5
4
3
2
1
10
9
8
7
6
14
15
16
17
18
19
20
11
12
13
Q3
Q2
Q1
Q0
V
CC
LATCH ENABLE
Q7
Q6
Q5
Q4
FUNCTION TABLE
Inputs Output
Output Latch Enable Enable D Q
LHHH LHLL L L X No Change HXXZ
X = Don’t Care Z = High Impedance
ОООООООО
Î
Design Criteria
ÎÎ
Î
Value
Î
Î
Units
Internal Gate Count*
54.5
ea.
Internal Gate Propagation Delay
1.5
ns
Internal Gate Power Dissipation
5.0
µW
ОООООООО
Î
Speed Power Product
ÎÎ
Î
0.0075
Î
Î
pJ
*Equivalent to a two–input NAND gate.
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3
MAXIMUM RATINGS*
Symbol
Parameter
Value
Unit
V
CC
DC Supply Voltage (Referenced to GND)
– 0.5 to + 7.0
V
V
in
DC Input Voltage (Referenced to GND)
– 0.5 to VCC + 0.5
V
V
out
DC Output Voltage (Referenced to GND)
– 0.5 to VCC + 0.5
V
I
in
DC Input Current, per Pin
± 20
mA
I
out
DC Output Current, per Pin
± 35
mA
I
CC
DC Supply Current, VCC and GND Pins
± 75
mA
ÎÎ
Î
P
D
ОООООООООООО
Î
Power Dissipation in Still Air, Plastic DIP†
SOIC Package†
TSSOP Package†
ÎÎÎ
Î
750 500 450
Î
Î
mW
T
stg
Storage Temperature
– 65 to + 150
_
C
ÎÎ
Î
T
L
ОООООООООООО
Î
Lead Temperature, 1 mm from Case for 10 Seconds
(Plastic DIP, TSSOP or SOIC Package)
ÎÎÎ
Î
260
Î
Î
_
C
*Maximum Ratings are those values beyond which damage to the device may occur.
Functional operation should be restricted to the Recommended Operating Conditions.
†Derating — Plastic DIP: –10 mW/_C from 65_ to 125_C
SOIC Package: –7 mW/_C from 65_ to 125_C TSSOP Package: –6.1 mW/°C from 65_ to 125_C
For high frequency or heavy load considerations, see Chapter 2 of the ON Semiconductor High–Speed CMOS Data Book (DL129/D).
RECOMMENDED OPERATING CONDITIONS
Symbol
Parameter
Min
ÎÎ
Max
Unit
V
CC
DC Supply Voltage (Referenced to GND)
2.0
ÎÎ
6.0
V
Vin, V
out
DC Input Voltage, Output Voltage (Referenced to GND)
0
ÎÎ
V
CC
V
T
A
Operating Temperature, All Package Types
– 55
ÎÎ
+ 125
_
C
ÎÎ
Î
tr, t
f
ООООООООООООО
Î
Input Rise and Fall Time VCC = 2.0 V
(Figure 1) VCC = 4.5 V
VCC = 6.0 V
Î
Î
0 0 0
ÎÎ
ÎÎ
1000
500 400
Î
Î
ns
DC ELECTRICAL CHARACTERISTICS (Voltages Referenced to GND)
Guaranteed Limit
Symbol
Parameter
Test Conditions
V
CC V
– 55 to
25_C
v
85_Cv 125_C
Unit
ÎÎ
Î
ÎÎ
Î
V
IH
ООООООО
Î
ООООООО
Î
Minimum High–Level Input Voltage
ООООООО
Î
ООООООО
Î
V
out
= 0.1 V or VCC – 0.1 V
|I
out
| v 20 µA
ÎÎ
Î
ÎÎ
Î
2.0
3.0
4.5
6.0
ÎÎ
Î
ÎÎ
Î
1.5
2.1
3.15
4.2
Î
Î
Î
Î
1.5
2.1
3.15
4.2
ÎÎ
Î
ÎÎ
Î
1.5
2.1
3.15
4.2
Î
Î
Î
Î
V
ÎÎ
Î
ÎÎ
V
IL
ООООООО
Î
ООООООО
Maximum Low–Level Input Voltage
ООООООО
Î
ООООООО
V
out
= 0.1 V or VCC – 0.1 V
|I
out
| v 20 µA
ÎÎ
Î
ÎÎ
2.0
3.0
4.5
6.0
ÎÎ
Î
ÎÎ
0.5
0.9
1.35
1.8
Î
Î
Î
0.5
0.9
1.35 1 8
ÎÎ
Î
ÎÎ
0.5
0.9
1.35
1.8
Î
Î
Î
V
ÎÎ
Î
ÎÎ
Î
V
OH
ООООООО
Î
ООООООО
Î
Minimum High–Level Output Voltage
ООООООО
Î
ООООООО
Î
Vin = VIH or V
IL
|I
out
| v 20 µA
ÎÎ
Î
ÎÎ
Î
2.0
4.5
6.0
ÎÎ
Î
ÎÎ
Î
1.9
4.4
5.9
Î
Î
Î
Î
1.9
4.4
5.9
ÎÎ
Î
ÎÎ
Î
1.9
4.4
5.9
Î
Î
Î
Î
V
ÎÎÎОООООООÎООООООО
Î
Vin = VIH or VIL|I
out
| 2.4mA
|I
out
| v 6.0 mA
|I
out
| v 7.8 mA
ÎÎ
Î
3.0
4.5
6.0
ÎÎ
Î
2.48
3.98
5.48
Î
Î
2.34
3.84
5.34
ÎÎ
Î
2.2
3.7
5.2
Î
Î
NOTE: Information on typical parametric values can be found in Chapter 2 of the ON Semiconductor High–Speed CMOS Data Book
(DL129/D).
This device contains protection circuitry to guard against damage due to high static voltages or electric fields. However, precautions must be taken to avoid applications of any voltage higher than maximum rated voltages to this high–impedance cir­cuit. For proper operation, Vin and V
out
should be constrained to the
range GND v (Vin or V
out
) v VCC.
Unused inputs must always be tied to an appropriate logic voltage level (e.g., either GND or VCC). Unused outputs must be left open.
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4
DC ELECTRICAL CHARACTERISTICS (Voltages Referenced to GND)
Guaranteed Limit
ÎÎ
Î
Symbol
ООООООО
Î
Parameter
ООООООО
Î
Test Conditions
ÎÎ
Î
V
CC V
ÎÎ
Î
– 55 to
25_C
Î
Î
v
85_C
ÎÎ
Î
v
125_C
Î
Î
Unit
ÎÎ
Î
V
OL
ООООООО
Î
Maximum Low–Level Output Voltage
ООООООО
Î
V
out
= 0.1 V or VCC – 0.1 V
|I
out
| v 20 µA
ÎÎ
Î
2.0
4.5
6.0
ÎÎ
Î
0.1
0.1
0.1
Î
Î
0.1
0.1
0.1
ÎÎ
Î
0.1
0.1
0.1
Î
Î
V
ÎÎÎОООООООÎООООООО
Î
Vin = VIH or VIL|I
out
| 2.4mA
|I
out
| v 6.0 mA
|I
out
| v 7.8 mA
ÎÎ
Î
3.0
4.5
6.0
ÎÎ
Î
0.26
0.26
0.26
Î
Î
0.33
0.33
0.33
ÎÎ
Î
0.4
0.4
0.4
Î
Î
ÎÎ
Î
I
in
ООООООО
Î
Maximum Input Leakage Current
ООООООО
Î
Vin = VCC or GND
ÎÎ
Î
6.0
ÎÎ
Î
± 0.1
Î
Î
± 1.0
ÎÎ
Î
± 1.0
Î
Î
µA
ÎÎ
Î
I
OZ
ООООООО
Î
Maximum Three–State Leakage Current
ООООООО
Î
Output in High–Impedance State Vin = VIL or V
IH
V
out
= VCC or GND
ÎÎ
Î
6.0
ÎÎ
Î
0.5
Î
Î
5.0
ÎÎ
Î
10
Î
Î
µA
I
CC
Maximum Quiescent Supply Current (per Package)
Vin = VCC or GND II
out
I = 0 µA
6.0
4.0
40
160
µA
NOTE: Information on typical parametric values can be found in Chapter 2 of the ON Semiconductor High–Speed CMOS Data Book
(DL129/D).
AC ELECTRICAL CHARACTERISTICS (C
L
= 50 pF, Input tr = tf = 6.0 ns)
Guaranteed Limit
ÎÎÎ
Î
Symbol
ОООООООООООООО
Î
Parameter
ÎÎ
Î
V
CC V
ÎÎ
Î
– 55 to
25_C
Î
Î
v
85_C
ÎÎ
Î
v
125_C
Î
Î
Unit
ÎÎÎ
Î
ÎÎÎ
Î
t
PLH
,
t
PHL
ОООООООООООООО
Î
ОООООООООООООО
Î
Maximum Propagation Delay, Input D to Q
(Figures 1 and 5)
ÎÎ
Î
ÎÎ
Î
2.0
3.0
4.5
6.0
ÎÎ
Î
ÎÎ
Î
150 100
30 26
Î
Î
Î
Î
190 140
38 33
ÎÎ
Î
ÎÎ
Î
225 180
45 38
Î
Î
Î
Î
ns
ÎÎÎ
Î
ÎÎÎ
Î
t
PLH
,
t
PHL
ОООООООООООООО
Î
ОООООООООООООО
Î
Maximum Propagation Delay, Latch Enable to Q
(Figures 2 and 5)
ÎÎ
Î
ÎÎ
Î
2.0
3.0
4.5
6.0
ÎÎ
Î
ÎÎ
Î
160 105
32 27
Î
Î
Î
Î
200 145
40 34
ÎÎ
Î
ÎÎ
Î
240 190
48 41
Î
Î
Î
Î
ns
ÎÎÎ
Î
ÎÎÎ
Î
t
PLZ
,
t
PHZ
ОООООООООООООО
Î
ОООООООООООООО
Î
Maximum Propagation Delay, Output Enable to Q
(Figures 3 and 6)
ÎÎ
Î
ÎÎ
Î
2.0
3.0
4.5
6.0
ÎÎ
Î
ÎÎ
Î
150 100
30 26
Î
Î
Î
Î
190 125
38 33
ÎÎ
Î
ÎÎ
Î
225 150
45 38
Î
Î
Î
Î
ns
ÎÎÎ
Î
ÎÎÎ
Î
t
PZL
,
t
PZH
ОООООООООООООО
Î
ОООООООООООООО
Î
Maximum Propagation Delay, Output Enable to Q
(Figures 3 and 6)
ÎÎ
Î
ÎÎ
Î
2.0
3.0
4.5
6.0
ÎÎ
Î
ÎÎ
Î
150 100
30 26
Î
Î
Î
Î
190 125
38 33
ÎÎ
Î
ÎÎ
Î
225 150
45 38
Î
Î
Î
Î
ns
ÎÎÎ
Î
ÎÎÎ
Î
t
TLH
,
t
THL
ОООООООООООООО
Î
ОООООООООООООО
Î
Maximum Output Transition Time, Any Output
(Figures 1 and 5)
ÎÎ
Î
ÎÎ
Î
2.0
3.0
4.5
6.0
ÎÎ
Î
ÎÎ
Î
60 27 12 10
Î
Î
Î
Î
75 32 15 13
ÎÎ
Î
ÎÎ
Î
90 36 18 15
Î
Î
Î
Î
ns
C
in
Maximum Input Capacitance
10
10
10
pF
C
out
Maximum Three–State Output Capacitance (Output in High–Impedance State)
15
15
15
pF
NOTE: For propagation delays with loads other than 50 pF, and information on typical parametric values, see Chapter 2 of the ON
Semiconductor High–Speed CMOS Data Book (DL129/D).
Typical @ 25°C, VCC = 5.0 V
C
PD
Power Dissipation Capacitance (Per Enabled Output)*
23
pF
*Used to determine the no–load dynamic power consumption: PD = CPD V
CC
2
f + ICC VCC. For load considerations, see Chapter 2 of the
ON Semiconductor High–Speed CMOS Data Book (DL129/D).
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5
TIMING REQUIREMENTS (C
L
= 50 pF, Input tr = tf = 6.0 ns)
Guaranteed Limit
ÎÎ
V
– 55 to 25_C
v
85_C
v
125_C
ÎÎ
Symbol
Parameter
Fig.
V
CC
Volts
Min
Max
Min
Max
Min
Max
Unit
ÎÎ
Î
ÎÎ
Î
t
su
ООООООООООО
Î
ООООООООООО
Î
Minimum Setup Time, Input D to Latch Enable
Î
Î
Î
Î
4
Î
Î
Î
Î
2.0
3.0
4.5
6.0
Î
Î
Î
Î
50 40 10
9.0
Î
Î
Î
Î
Î
Î
Î
Î
65 50 13 11
Î
Î
Î
Î
Î
Î
Î
Î
75 60 15 13
Î
Î
Î
Î
ÎÎ
ÎÎ
ÎÎ
ns
ÎÎ
Î
ÎÎ
Î
t
h
ООООООООООО
Î
ООООООООООО
Î
Minimum Hold Time, Latch Enable to Input D
Î
Î
Î
Î
4
Î
Î
Î
Î
2.0
3.0
4.5
6.0
Î
Î
Î
Î
5.0
5.0
5.0
5.0
Î
Î
Î
Î
Î
Î
Î
Î
5.0
5.0
5.0
5.0
Î
Î
Î
Î
Î
Î
Î
Î
5.0
5.0
5.0
5.0
Î
Î
Î
Î
ÎÎ
ÎÎ
ÎÎ
ns
ÎÎ
Î
ÎÎ
Î
t
w
ООООООООООО
Î
ООООООООООО
Î
Minimum Pulse Width, Latch Enable
Î
Î
Î
Î
2
Î
Î
Î
Î
2.0
3.0
4.5
6.0
Î
Î
Î
Î
75 60 15 13
Î
Î
Î
Î
Î
Î
Î
Î
95 80 19 16
Î
Î
Î
Î
Î
Î
Î
Î
110
90 22 19
Î
Î
Î
Î
ÎÎ
ÎÎ
ÎÎ
ns
ÎÎ
Î
ÎÎ
Î
tr, t
f
ООООООООООО
Î
ООООООООООО
Î
Maximum Input Rise and Fall Times
Î
Î
Î
Î
1
Î
Î
Î
Î
2.0
3.0
4.5
6.0
Î
Î
Î
Î
Î
Î
Î
Î
1000
800 500 400
Î
Î
Î
Î
Î
Î
Î
Î
1000
800 500 400
Î
Î
Î
Î
Î
Î
Î
Î
1000
800 500 400
ÎÎ
ÎÎ
ÎÎ
ns
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6
SWITCHING W AVEFORMS
V
CC
GND
t
f
t
r
INPUT D
Q
10%
50%
90%
10%
50%
90%
t
TLH
t
PLH
t
PHL
t
THL
OUTPUT ENABLE
Q
Q
50%
50%
1.3 V
90%
10%
t
PZL
t
PLZ
t
PZHtPHZ
3.0 V
GND HIGH
IMPEDANCE V
OL
V
OH
HIGH IMPEDANCE
*Includes all probe and jig capacitance
CL*
TEST POINT
DEVICE UNDER
TEST
OUTPUT
*Includes all probe and jig capacitance
CL*
TEST POINT
DEVICE UNDER
TEST
OUTPUT
CONNECT TO VCC WHEN TESTING t
PLZ
AND t
PZL
. CONNECT TO GND WHEN TESTING t
PHZ
AND t
PZH
.
1 k
Figure 1. Figure 2.
Figure 3. Figure 4.
V
CC
GND
50%
50%
LATCH
ENABLE
t
PLH
t
PHL
Q
t
w
Figure 5. Test Circuit
Figure 6. Test Circuit
EXPANDED LOGIC DIAGRAM
D LE
Q
D0
2
19
Q0
D LE
Q
D1
3
18
Q1
D LE
Q
D2
4
17
Q2
D LE
Q
D3
5
16
Q3
D LE
Q
D4
6
15
Q4
D LE
Q
D5
7
14
Q5
D LE
Q
D6
8
13
Q6
D LE
Q
D7
9
12
Q7
LATCH ENABLE
OUTPUT ENABLE
11
1
V
CC
GND
V
CC
GND
50%
50%
VALID
t
SU
t
h
INPUT D
LATCH
ENABLE
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7
P ACKAGE DIMENSIONS
SO–20
DW SUFFIX
CASE 751D–05
ISSUE F
PDIP–20
N SUFFIX
PLASTIC DIP PACKAGE
CASE 738–03
ISSUE E
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION: INCH.
3. DIMENSION L TO CENTER OF LEAD WHEN FORMED PARALLEL.
4. DIMENSION B DOES NOT INCLUDE MOLD FLASH.
M
L
J
20 PL
M
B
M
0.25 (0.010) T
DIM MIN MAX MIN MAX
MILLIMETERSINCHES
A 25.66 27.171.010 1.070 B 6.10 6.600.240 0.260 C 3.81 4.570.150 0.180 D 0.39 0.550.015 0.022
G 2.54 BSC0.100 BSC
J 0.21 0.380.008 0.015 K 2.80 3.550.110 0.140 L 7.62 BSC0.300 BSC M 0 15 0 15 N 0.51 1.010.020 0.040
____
E
1.27 1.770.050 0.070
1
11
10
20
–A–
SEATING PLANE
K
N
FG
D
20 PL
–T–
M
A
M
0.25 (0.010) T
E
B
C
F
1.27 BSC0.050 BSC
20
1
11
10
B20X
H10X
C
L
18X
A1
A
SEATING PLANE
q
h X 45
_
E
D
M
0.25
M
B
M
0.25
SAS
B
T
e
T
B
A
DIM MIN MAX
MILLIMETERS
A 2.35 2.65
A1 0.10 0.25
B 0.35 0.49 C 0.23 0.32 D 12.65 12.95 E 7.40 7.60
e 1.27 BSC
H 10.05 10.55
h 0.25 0.75 L 0.50 0.90
q
0 7
NOTES:
1. DIMENSIONS ARE IN MILLIMETERS.
2. INTERPRET DIMENSIONS AND TOLERANCES PER ASME Y14.5M, 1994.
3. DIMENSIONS D AND E DO NOT INCLUDE MOLD PROTRUSION.
4. MAXIMUM MOLD PROTRUSION 0.15 PER SIDE.
5. DIMENSION B DOES NOT INCLUDE DAMBAR PROTRUSION. ALLOWABLE PROTRUSION SHALL BE 0.13 TOTAL IN EXCESS OF B DIMENSION AT MAXIMUM MATERIAL CONDITION.
__
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8
P ACKAGE DIMENSIONS
TSSOP–20 DT SUFFIX
CASE 948E–02
ISSUE A
DIMAMIN MAX MIN MAX
INCHES
6.60 0.260
MILLIMETERS
B 4.30 4.50 0.169 0.177 C 1.20 0.047 D 0.05 0.15 0.002 0.006 F 0.50 0.75 0.020 0.030 G 0.65 BSC 0.026 BSC H 0.27 0.37 0.011 0.015 J 0.09 0.20 0.004 0.008
J1 0.09 0.16 0.004 0.006
K 0.19 0.30 0.007 0.012
K1 0.19 0.25 0.007 0.010
L 6.40 BSC 0.252 BSC M 0 8 0 8
____
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSION A DOES NOT INCLUDE MOLD FLASH, PROTRUSIONS OR GATE BURRS. MOLD FLASH OR GATE BURRS SHALL NOT EXCEED
0.15 (0.006) PER SIDE.
4. DIMENSION B DOES NOT INCLUDE INTERLEAD FLASH OR PROTRUSION. INTERLEAD FLASH OR PROTRUSION SHALL NOT EXCEED 0.25 (0.010) PER SIDE.
5. DIMENSION K DOES NOT INCLUDE DAMBAR PROTRUSION. ALLOWABLE DAMBAR PROTRUSION SHALL BE 0.08 (0.003) TOTAL IN EXCESS OF THE K DIMENSION AT MAXIMUM MATERIAL CONDITION.
6. TERMINAL NUMBERS ARE SHOWN FOR REFERENCE ONLY.
7. DIMENSION A AND B ARE TO BE DETERMINED AT DATUM PLANE –W–.
110
1120
PIN 1 IDENT
A
B
–T–
0.100 (0.004)
C
D
G
H
SECTION N–N
K
K1
JJ1
N
N
M
F
–W–
SEATING PLANE
–V–
–U–
S
U
M
0.10 (0.004) V
S
T
20X REFK
L
L/2
2X
S
U0.15 (0.006) T
DETAIL E
0.25 (0.010)
DETAIL E
6.40 0.252 ––– –––
S
U0.15 (0.006) T
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