Datasheet MC74HC393FL2, MC74HC393FR1, MC74HC393FR2, MC74HC393FEL, MC74HC393DTR2 Datasheet (MOTOROLA)

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Page 1

SEMICONDUCTOR TECHNICAL DATA
1
REV 6
Motorola, Inc. 1995
10/95
    
High–Performance Silicon–Gate CMOS
The MC54/74HC393 is identical in pinout to the LS393. The device inputs are compatible with standard CMOS outputs; with pullup resistors, they are compatible with LSTTL outputs.
This device consists of two independent 4–bit binary ripple counters with parallel outputs from each counter stage. A ÷ 256 counter can be obtained by cascading the two binary counters.
Internal flip–flops are triggered by high–to–low transitions of the clock input. R eset for the counters is asynchronous and active–high. S tate changes of the Q outputs do not occur simultaneously because of internal ripple delays. Therefore, decoded output signals are subject to decoding spikes and should not be used as clocks or as strobes except when gated with the Clock of the HC393.
Output Drive Capability: 10 LSTTL Loads
Outputs Directly Interface to CMOS, NMOS, and TTL
Operating Voltage Range: 2 to 6 V
Low Input Current: 1 µA
High Noise Immunity Characteristic of CMOS Devices
In Compliance with the Requirements Defined by JEDEC Standard
No. 7A
Chip Complexity: 236 FETs or 59 Equivalent Gates
LOGIC DIAGRAM
Q1 Q2 Q3 Q4
CLOCK
RESET
1, 13
2, 12
3, 11 4, 10
5, 9 6, 8
PIN 14 = V
CC
PIN 7 = GND
BINARY
COUNTER

PIN ASSIGNMENT
FUNCTION TABLE
Inputs
Clock Reset Outputs
X H L H L No Change L L No Change
L No Change L Advance to
Next State
11
12
13
14
8
9
105
4
3
2
1
7
6
Q2
b
Q1
b
RESET b
CLOCK b
V
CC
Q4
b
Q3
b
Q2
a
Q1
a
RESET a
CLOCK a
GND
Q3
a
Q4
a
D SUFFIX
SOIC PACKAGE
CASE 751A–03
N SUFFIX
PLASTIC PACKAGE
CASE 646–06
ORDERING INFORMATION
MC54HCXXXJ MC74HCXXXN MC74HCXXXD
Ceramic Plastic SOIC
1
14
1
14
J SUFFIX
CERAMIC PACKAGE
CASE 632–08
1
14
Page 2
MC54/74HC393
MOTOROLA High–Speed CMOS Logic Data
DL129 — Rev 6
2
MAXIMUM RATINGS*
Symbol
Parameter
Value
Unit
V
CC
DC Supply Voltage (Referenced to GND)
– 0.5 to + 7.0
V
V
in
DC Input Voltage (Referenced to GND)
– 1.5 to VCC + 1.5
V
V
out
DC Output Voltage (Referenced to GND)
– 0.5 to VCC + 0.5
V
I
in
DC Input Current, per Pin
± 20
mA
I
out
DC Output Current, per Pin
± 25
mA
I
CC
DC Supply Current, VCC and GND Pins
± 50
mA
P
D
Power Dissipation in Still Air,Plastic or Ceramic DIP†
SOIC Package†
750 500
mW
T
stg
Storage Temperature
– 65 to + 150
_
C
T
L
Lead Temperature, 1 mm from Case for 10 Seconds
(Plastic or SOIC DIP)
(Ceramic DIP)
260 300
_
C
*Maximum Ratings are those values beyond which damage to the device may occur.
Functional operation should be restricted to the Recommended Operating Conditions.
†Derating — Plastic DIP: – 10 mW/_C from 65_ to 125_C
Ceramic DIP: – 10 mW/_C from 100_ to 125_C SOIC Package: – 7 mW/_C from 65_ to 125_C
For high frequency or heavy load considerations, see Chapter 2 of the Motorola High–Speed CMOS Data Book (DL129/D).
RECOMMENDED OPERATING CONDITIONS
Symbol
Parameter
Min
Max
Unit
V
CC
DC Supply Voltage (Referenced to GND)
2.0
6.0
V
Vin, V
out
DC Input Voltage, Output Voltage (Referenced to GND)
0
V
CC
V
T
A
Operating Temperature, All Package Types
– 55
+ 125
_
C
tr, t
f
Input Rise and Fall Time VCC = 2.0 V
(Figure 1) VCC = 4.5 V
VCC = 6.0 V
0 0 0
1000
500 400
ns
DC ELECTRICAL CHARACTERISTICS (Voltages Referenced to GND)
Guaranteed Limit
Symbol
Parameter
Test Conditions
V
CC V
– 55 to
25_C
v
85_Cv 125_C
Unit
V
IH
Minimum High–Level Input Voltage
V
out
= 0.1 V or VCC – 0.1 V
|I
out
| v 20 µA
2.0
4.5
6.0
1.5
3.15
4.2
1.5
3.15
4.2
1.5
3.15
4.2
V
V
IL
Maximum Low–Level Input Voltage
V
out
= 0.1 V or VCC – 0.1 V
|I
out
| v 20 µA
2.0
4.5
6.0
0.3
0.9
1.2
0.3
0.9
1.2
0.3
0.9
1.2
V
V
OH
Minimum High–Level Output Voltage
Vin = VIH or V
IL
|I
out
| v 20 µA
2.0
4.5
6.0
1.9
4.4
5.9
1.9
4.4
5.9
1.9
4.4
5.9
V
Vin = VIH or VIL|I
out
| v 4.0 mA
|I
out
| v 5.2 mA
4.5
6.0
3.98
5.48
3.84
5.34
3.70
5.20
V
OL
Maximum Low–Level Output Voltage
Vin = VIH or V
IL
|I
out
| v 20 µA
2.0
4.5
6.0
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
V
Vin = VIH or VIL|I
out
| v 4.0 mA
|I
out
| v 5.2 mA
4.5
6.0
0.26
0.26
0.33
0.33
0.40
0.40
I
in
Maximum Input Leakage Current
Vin = VCC or GND
6.0
± 0.1
± 1.0
± 1.0
µA
I
CC
Maximum Quiescent Supply Current (per Package)
Vin = VCC or GND I
out
= 0 µA
6.0
8
80
160
µA
NOTE: Information on typical parametric values can be found in Chapter 2 of the Motorola High–Speed CMOS Data Book (DL129/D).
This device contains protection circuitry to guard against damage due to high static voltages or electric fields. However, precautions must be taken to avoid applications of any voltage higher than maximum rated voltages to this high–impedance cir­cuit. For proper operation, Vin and V
out
should be constrained to the
range GND v (Vin or V
out
) v VCC.
Unused inputs must always be tied to an appropriate logic voltage level (e.g., either GND or VCC). Unused outputs must be left open.
Page 3
MC54/74HC393
High–Speed CMOS Logic Data DL129 — Rev 6
3 MOTOROLA
AC ELECTRICAL CHARACTERISTICS (C
L
= 50 pF, Input tr = tf = 6 ns)
Guaranteed Limit
Symbol
Parameter
V
CC V
– 55 to
25_C
v
85_Cv 125_C
Unit
f
max
Maximum Clock Frequency (50% Duty Cycle)
(Figures 1 and 3)
2.0
4.5
6.0
5.4 27 32
4.4 22 26
3.6 18 21
MHz
t
PLH
,
t
PHL
Maximum Propagation Delay, Clock to Q1
(Figures 1 and 3)
2.0
4.5
6.0
120
24 20
150
30 26
180
36 31
ns
t
PLH
,
t
PHL
Maximum Propagation Delay, Clock to Q2
(Figures 1 and 3)
2.0
4.5
6.0
190
38 32
240
48 41
285
57 48
ns
t
PLH
,
t
PHL
Maximum Propagation Delay, Clock to Q3
(Figures 1 and 3)
2.0
4.5
6.0
240
48 41
300
60 51
360
72 61
ns
t
PLH
,
t
PHL
Maximum Propagation Delay, Clock to Q4
(Figures 1 and 3)
2.0
4.5
6.0
290
58 49
365
73 62
435
87 74
ns
t
PHL
Maximum Propagation Delay, Reset to any Q
(Figures 2 and 3)
2.0
4.5
6.0
165
33 28
205
41 35
250
50 43
ns
t
TLH
,
t
THL
Maximum Output Transition Time, Any Output
(Figures 1 and 3)
2.0
4.5
6.0
75 15 13
95 19 16
110
22 19
ns
C
in
Maximum Input Capacitance
10
10
10
pF
NOTES:
1. For propagation delays with loads other than 50 pF, see Chapter 2 of the Motorola High–Speed CMOS Data Book (DL129/D).
2. Information on typical parametric values can be found in Chapter 2 of the Motorola High–Speed CMOS Data Book (DL129/D).
Typical @ 25°C, VCC = 5.0 V
C
PD
Power Dissipation Capacitance (Per Counter)*
40
pF
*Used to determine the no–load dynamic power consumption: PD = CPD V
CC
2
f + ICC VCC. For load considerations, see Chapter 2 of the
Motorola High–Speed CMOS Data Book (DL129/D).
TIMING REQUIREMENTS (Input t
r
= tf = 6 ns)
Guaranteed Limit
Symbol
Parameter
V
CC V
– 55 to
25_C
v
85_Cv 125_C
Unit
t
rec
Minimum Recovery Time, Reset Inactive to Clock
(Figure 2)
2.0
4.5
6.0
50 10
9
65 13 11
75 15 13
ns
t
w
Minimum Pulse Width, Clock
(Figure 1)
2.0
4.5
6.0
80 16 14
100
20 17
120
24 20
ns
t
w
Minimum Pulse Width, Reset
(Figure 2)
2.0
4.5
6.0
125
25 21
155
31 26
190
38 32
ns
tr, t
f
Maximum Input Rise and Fall Times
(Figure 1)
2.0
4.5
6.0
1000
500 400
1000
500 400
1000
500 400
ns
NOTE: Information on typical parametric values can be found in Chapter 2 of the Motorola High–Speed CMOS Data Book (DL129/D).
Page 4
MC54/74HC393
MOTOROLA High–Speed CMOS Logic Data
DL129 — Rev 6
4
PIN DESCRIPTIONS
INPUTS Clock (Pins 1, 13)
Clock input. The internal flip–flops are toggled and the counter state advances on high–to–low transitions of the clock input.
CONTROL INPUTS Reset (Pins 2, 12)
Active–high, asynchronous reset. A separate reset is pro-
vided for each counter. A high at the Reset input prevents counting and forces all four outputs low.
OUTPUTS
Q1, Q2, Q3, Q4 (Pins 3, 4, 5, 6, 8, 9, 10, 11)
Parallel binary outputs Q4 is the most significant bit.
SWITCHING WAVEFORMS
t
PHL
V
CC
GND
V
CC
GND
50%
50%
50%
t
rec
CLOCK
Q
RESET
Figure 1. Figure 2.
Figure 3. Test Circuit
Q1
Q2
Q3
Q4
CLOCK
RESET
1, 13
2, 12
3, 11
4, 10
5, 9
6, 8
EXPANDED LOGIC DIAGRAM
*Includes all probe and jig capacitance
CL*
TEST
POINT
DEVICE UNDER
TEST
OUTPUT
CLOCK
Q
90%90% 50%
10%
t
f
t
r
V
CC
GND
t
w
1/f
max
t
PLH
t
PHL
90%
50%
10%
t
TLH
t
THL
C
D Q
t
w
Q
C
D Q
Q
C
D Q
Q
C
D Q
Q
Page 5
MC54/74HC393
High–Speed CMOS Logic Data DL129 — Rev 6
5 MOTOROLA
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 0
CLOCK
RESET
Q1
Q2
Q3
Q4
TIMING DIAGRAM
COUNT SEQUENCE
Outputs
Count
Q4 Q3 Q2 Q1
0 L L L L 1 L L L H 2 L L H L 3 L L H H 4 L H L L 5 L H L H 6 L H H L 7 L H H H 8 H L L L
9 H L L H 10 H L H L 11 H L H H 12 H H L L 13 H H L H 14 H H H L 15 H H H H
Page 6
MC54/74HC393
MOTOROLA High–Speed CMOS Logic Data
DL129 — Rev 6
6
OUTLINE DIMENSIONS
J SUFFIX
CERAMIC DIP PACKAGE
CASE 632–08
ISSUE Y
MIN MINMAX MAX
INCHES MILLIMETERS
DIM
A B C D F G J K L M N
0.785
0.280
0.200
0.020
0.065
0.015
0.170 15
°
0.040
0.750
0.245
0.155
0.015
0.055
0.008
0.125 0
°
0.020
19.94
7.11
5.08
0.50
1.65
0.38
4.31 15
°
1.01
19.05
6.23
3.94
0.39
1.40
0.21
3.18 0
°
0.51
0.100 BSC
0.300 BSC
2.54 BSC
7.62 BSC
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION: INCH.
3. DIMENSION L TO CENTER OF LEAD WHEN FORMED PARALLEL.
4. DIMESNION F MAY NARROW TO 0.76 (0.030) WHERE THE LEAD ENTERS THE CERAMIC BODY.
14 8
1 7
-A-
-B-
-T-
SEATING
PLANE
F G
N
K
C
L
M
0.25 (0.010) T A
M
S
0.25 (0.010) T B
M
S
J 14 PL
D 14 PL
N SUFFIX
PLASTIC DIP PACKAGE
CASE 646–06
ISSUE L
NOTES:
1. LEADS WITHIN 0.13 (0.005) RADIUS OF TRUE POSITION AT SEATING PLANE AT MAXIMUM MATERIAL CONDITION.
2. DIMENSION L TO CENTER OF LEADS WHEN FORMED PARALLEL.
3. DIMENSION B DOES NOT INCLUDE MOLD FLASH.
4. ROUNDED CORNERS OPTIONAL.
1 7
14 8
B
A
F
H G D
K
C
N
L
J
M
SEATING PLANE
DIM MIN MAX MIN MAX
MILLIMETERSINCHES
A 0.715 0.770 18.16 19.56 B 0.240 0.260 6.10 6.60 C 0.145 0.185 3.69 4.69 D 0.015 0.021 0.38 0.53 F 0.040 0.070 1.02 1.78 G 0.100 BSC 2.54 BSC H 0.052 0.095 1.32 2.41 J 0.008 0.015 0.20 0.38 K 0.115 0.135 2.92 3.43 L 0.300 BSC 7.62 BSC M 0 10 0 10 N 0.015 0.039 0.39 1.01
_ _ _ _
D SUFFIX
PLASTIC SOIC PACKAGE
CASE 751A–03
ISSUE F
MIN MINMAX MAX
MILLIMETERS INCHES
DIM
A B C D F G
J K M P R
8.55
3.80
1.35
0.35
0.40
0.19
0.10 0
°
5.80
0.25
8.75
4.00
1.75
0.49
1.25
0.25
0.25 7
°
6.20
0.50
0.337
0.150
0.054
0.014
0.016
0.008
0.004 0
°
0.228
0.010
0.344
0.157
0.068
0.019
0.049
0.009
0.009 7°
0.244
0.019
1.27 BSC 0.050 BSC
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSIONS A AND B DO NOT INCLUDE MOLD PROTRUSION.
4. MAXIMUM MOLD PROTRUSION 0.15 (0.006) PER SIDE.
5. DIMENSION D DOES NOT INCLUDE DAMBAR PROTRUSION. ALLOWABLE DAMBAR PROTRUSION SHALL BE 0.127 (0.005) TOTAL IN EXCESS OF THE D DIMENSION AT MAXIMUM MATERIAL CONDITION.
–A–
–B–
P 7 PL
G
C
K
SEATING PLANE
D 14 PL
M
J
R
X 45°
1
7
814
0.25 (0.010) T B A
M
S S
B0.25 (0.010)
M M
F
Page 7
MC54/74HC393
High–Speed CMOS Logic Data DL129 — Rev 6
7 MOTOROLA
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MC54/74HC393/D
*MC54/74HC393/D*
CODELINE
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