MC54/74HC244A
MOTOROLA High–Speed CMOS Logic Data
DL129 — Rev 6
4
TEST CIRCUITS
*Includes all probe and jig capacitance
CL*
TEST POINT
DEVICE
UNDER
TEST
OUTPUT
Figure 3. Test Circuit
*Includes all probe and jig capacitance
CL*
TEST POINT
DEVICE
UNDER
TEST
OUTPUT
Figure 4. Test Circuit
CONNECT TO VCC WHEN
TESTING t
PLZ
AND t
PZL
.
CONNECT TO GND WHEN
TESTING t
PHZ
AND t
PZH
.
1 k
Ω
PIN DESCRIPTIONS
INPUTS
A1, A2, A3, A4, B1, B2, B3, B4
(Pins 2, 4, 6, 8, 11, 13, 15, 17)
Data input pins. Data on these pins appear in noninverted
form on the corresponding Y outputs, when the outputs are
enabled.
CONTROLS
Enable A, Enable B (Pins 1, 19)
Output enables (active–low). When a low level is applied
to these pins, the outputs are enabled and the devices function as noninverting buffers. When a high level is applied, the
outputs assume the high impedance state.
OUTPUTS
YA1, YA2, YA3, YA4, YB1, YB2, YB3, YB4
(Pins 18, 16, 14, 12, 9, 7, 5, 3)
Device outputs. Depending upon the state of the output–
enable pins, these outputs are either noninverting outputs or
high–impedance outputs.
LOGIC DETAIL
DATA
INPUT
A OR B
ENABLE A OR
ENABLE B
TO THREE OTHER
A OR B INVERTERS
ONE OF 8
INVERTERS
YA
OR
YB
V
CC