MC54/74HC241A
MOTOROLA High–Speed CMOS Logic Data
DL129 — Rev 6
4
SWITCHING W AVEFORMS
Figure 1. Figure 2.
*Includes all probe and jig capacitance
CL*
TEST POINT
DEVICE
UNDER
TEST
OUTPUT
Figure 3. Test Circuit
*Includes all probe and jig capacitance
CL*
TEST POINT
DEVICE
UNDER
TEST
OUTPUT
Figure 4. Test Circuit
CONNECT TO VCC WHEN
TESTING t
PLZ
AND t
PZL
.
CONNECT TO GND WHEN
TESTING t
PHZ
AND t
PZH
.
1 k
Ω
ENABLE A
ENABLE B
OUTPUT Y
OUTPUT Y
V
CC
GND
V
CC
GND
HIGH
IMPEDANCE
HIGH
IMPEDANCE
V
OL
V
OH
50%
50%
50%
50%
90%
10%
t
PZLtPLZ
t
PZHtPHZ
V
CC
GND
t
f
t
r
DATA INPUT
A OR B
OUTPUT
YA OR YB
10%
50%
90%
10%
50%
90%
t
TLH
t
PLH
t
PHL
t
THL
PIN DESCRIPTIONS
INPUTS
A1, A2, A3, A4, B1, B2, B3, B4
(Pins 2, 4, 6, 8, 11, 13, 15, 17)
Data input pins. Data on these pins appear in noninverted
form on the corresponding Y outputs when the outputs are
enabled.
CONTROLS
Enable A (Pin 1)
Output enable (active–low). When a low level is applied to
this pin, the outputs of the “A” devices are enabled and the
devices function as noninverting buffers. When a high level is
applied, the outputs assume the high–impedance state.
Enable 8 (Pin 19)
Output enable (active–high). When a high level is applied
to this pin, the outputs of the “B” devices are enabled and the
devices function as noninverting buffers. When a low level is
applied, the outputs assume the high–impedance state.
OUTPUTS
YA1, YA2, YA3, YA4, YB1, YB2, YB3, YB4
(Pins 18, 16, 14, 12, 9, 7, 5, 3)
Device outputs. Depending upon the state of the output–
enable pins, these outputs are either noninverting outputs or
high–impedance outputs.