The Direct Rambus RIMM module is a general-purpose high-performance memory module subsystem suitable for
use in a broad range of applications including computer memory, personal computers, workstations, and other
applications where high bandwidth and low latency are required.
MC-4R192CPE6C modules consists of twelve 128M Direct Rambus DRAM (Direct RDRAM™) devices
(
µ
PD488448). These are extremely high-speed CMOS DRAMs organized as 8M words by 16 bits. The use of
Rambus Signaling Level (RSL) technology permits 600MHz, 711MHz or 800MHz transfer rates while using
conventional system and board design technologies.
Direct RDRAM devices are capable of sustained data transfers at 1.25 ns per two bytes (10 ns per sixteen bytes).
The architecture of the Direct RDRAM enables the highest sustained bandwidth for multiple, simultaneous,
randomly addressed memory transactions. The separate control and data buses with independent row and column
control yield over 95 % bus efficiency. The Direct RDRAM's 32 banks support up to four simultaneous transactions
per device.
Features
• 184 edge connector pads with 1mm pad spacing
• 192 MB Direct RDRAM storage
• Each RDRAM
• Gold plated contacts
• RDRAMs use Chip Scale Package (CSP)
• Serial Presence Detect support
• Operates from a 2.5 V supply
• Low power and powerdown self refresh modes
• Separate Row and Column buses for higher efficiency
• Over Drive Factor (ODF) support
has 32 banks, for 384 banks total on module
The information in this document is subject to change without notice. Before using this document, please
confirm that this is the latest version.
Not all devices/types available in every country. Please check with local NEC representative for
availability and additional information.
Document No. M14808EJ2V0DS00 (2nd edition)
Date Published August 2000 NS CP (K)
Printed in Japan
LCFM, LCFMN,
RCFM, RCFMN : Clock from master
LCTM, LCTMN,
RCTM, RCTMN : Clock to master
LCMD, RCMD: Serial Command Pad
LROW2 - LROW0,
RROW2 - RROW0 : Row bus
LCOL4 - LCOL0,
RCOL4 - RCOL0: Column bus
LDQA8 - LDQA0,
RDQA8 - RDQA0: Data bus A
LDQB8 - LDQB0,
RDQB8 - RDQB0: Data bus B
LSCK, RSCK : Clock input
SA0 - SA2: Serial Presence Detect Address
SCL, SDA: Serial Presence Detect Clock
SIN, SOUT: Serial I/O
DD
SV
: SPD Voltage
SWP: Serial Presence Detect Write Protect
CMOS
V
DD
V
REF
V
: Supply voltage for serial pads
: Supply voltage
: Logic threshold
GND: Ground reference
NC: These pads are not connected
Preliminary Data Sheet M14808EJ2V0DS00
3
Page 4
MC-4R192CPE6C
Module Pad Names
PadSignal NamePadSignal NamePadSignal NamePadSignal Name
SignalI/OTypeDescription
GND——Ground reference for RDRAM core and interface. 72 PCB connector pads.
LCFMIRSLClock from mas ter. Interface clock used for receiving RSL signals from t he
Channel. Positive polarity.
LCFMNIRSLClock from master. Interface clock used for receiving RSL signals from the
Channel. Negative polarity.
LCMDIV
LCOL4..LCOL0IRSLColumn bus. 5-bit bus c ontaining control and address information for column
LCTMIRSLCl ock to master. Interf ace clock used for transmi tting RSL signals to the
LCTMNIRSLClock to master. Interface clock used for transmitting RSL signals to the
LDQA8..LDQA0I/ORSLData bus A. A 9-bit bus carrying a byte of read or write data between the Channel
LDQB8..LDQB0I/ORSLData bus B. A 9-bit bus carrying a byte of read or write data between the Channel
LROW2..LROW0IRSLRow bus. 3-bi t bus containing control and address information for row accesses.
LSCKIV
NC——These pads are not connected. These 24 connector pads are reserved for future
RCFMIRSLClock from master. Interface clock used for receiving RSL signals f rom the
RCFMNIRSLCl ock from master. I nterface clock used for receiving RS L signals from the
RCMDIV
RCOL4..RCOL0IRSLColum n bus . 5-bit bus containing control and address information for column
RCTMIRSLClock to master. Interface clock used for transmitting RSL s i gnal s to the
RCTMNIRSLCl ock to master. Interf ace clock used for transmi tting RSL signals to the
RDQA8..RDQA0I/ORSLData bus A. A 9-bit bus carrying a byte of read or write data between the Channel
RDQB8..RDQB0I/ORSLData bus B. A 9-bit bus carrying a byte of read or write data between the Channel
RROW2..RROW0IRSLRow bus. 3-bi t bus containing control and address inf ormation for row accesses.
CMOS
CMOS
CMOS
Serial Command used t o read from and write to the control registers . Also used
for power management.
accesses.
Channel. Positive polarity.
Channel. Negative polarity.
and the RDRAM. LDQA8 is non-functi onal on modules with x16 RDRAM devices.
and the RDRAM. LDQB8 is non-functi onal on modules with x16 RDRAM devices.
Serial clock input. Cl ock source used to read from and write to t he RDRA M
control registers.
use.
Channel. Positive polarity.
Channel. Negative polarity.
Serial Command Input used to read from and write to the control registers. Also
used for power management.
accesses.
Channel. Positive polarity.
Channel. Negative polarity.
and the RDRAM. RDQA8 is non-functi onal on modules with x16 RDRAM
devices.
and the RDRAM. RDQB8 is non-functi onal on modules with x16 RDRAM
devices.
(1/2)
Preliminary Data Sheet M14808EJ2V0DS00
5
Page 6
SignalI/OTypeDescription
MC-4R192CPE6C
(2/2)
RSCKIV
SA0ISV
SA1ISV
SA2ISV
SCLISV
SDAI/OSV
SINI/OV
SOUTI/OV
DD
SV
——SPD Voltage. Used for signals SCL, SDA, SWP, SA0, SA1 and SA2.
SWPISV
CMOS
V
DD
V
REF
V
——CMOS I/O Voltage. Used for signals CMD, SCK, SI N, SOUT.
——Supply voltage for the RDRAM c ore and i nterface logic.
——Logic threshold reference voltage for RSL signals.
CMOS
DD
DD
DD
DD
DD
CMOS
CMOS
DD
Serial clock input. Cl ock source used to read from and write to t he RDRA M
control registers.
Serial Presence Detect Address 0.
Serial Presence Detect Address 1.
Serial Presence Detect Address 2.
Serial Presence Detec t Clock.
Serial Presence Detect Data (Open Collector I/O).
Serial I/O for reading from and writing to the control registers. A ttaches to SIO0
of the first RDRAM on the module.
Serial I/O for reading from and writing to the control registers. A ttaches to SIO1
of the last RDRAM on the modul e.
Serial Presence Detect Write Protect (active high). When low, the SPD can be
written as well as read.
6
Preliminary Data Sheet M14808EJ2V0DS00
Page 7
Block Diagram
V
REF
LCMD
LSCK
SIN
LDQB 7
LDQB 8
DQB 7
DQB 8
SIO 0
SIO 1
SCK
CMD
REF
V
DQB 7
DQB 8
SIO 0
SIO 1
SCK
CMD
REF
V
LDQB 5
LDQB 6
DQB 5
DQB 6
DQB 5
DQB 6
LDQB 3
LDQB 4
DQB 3
DQB 4
DQB 3
DQB 4
LDQB 1
LDQB 2
DQB 1
DQB 2
DQB 1
DQB 2
LDQB 0
LCOL 0
COL 0
DQB 0
COL 0
DQB 0
LCOL 2
LCOL 1
COL 2
COL 1
COL 2
COL 1
LCOL 4
LCOL 3
COL 4
COL 3
COL 4
COL 3
LROW 1
LROW 0
ROW 1
ROW 0
U1
ROW 1
ROW 0
U2
LROW 2
LCTMN
CTMN
ROW 2
CTMN
ROW 2
LCTM
CTM
CTM
LCFMN
LCFM
CFM
CFMN
CFM
CFMN
LDQA 1
LDQA 0
DQA 1
DQA 0
DQA 1
DQA 0
MC-4R192CPE6C
LDQA 8
LDQA 7
LDQA 6
LDQA 5
LDQA 4
LDQA 3
LDQA 2
DQA 8
DQA 7
DQA 6
DQA 5
DQA 4
DQA 3
DQA 2
DQA 8
DQA 7
DQA 6
DQA 5
DQA 4
DQA 3
DQA 2
V
CMOS
V
DD
SCL
SWP
47 kΩ
RCMD
SCL
WP
A0
SA0
SOUT
RSCK
SV
DD
V
CC
U0
A1 A2
SA1 SA2
DQB 8
SIO 0
SIO 1
SCK
CMD
REF
V
DQB 8
SIO 0
SIO 1
SCK
CMD
REF
V
RDQB 8
SDA
DQB 5
DQB 6
DQB 7
DQB 5
DQB 6
DQB 7
RDQB 5
RDQB 6
RDQB 7
SERIAL PD
DQB 3
DQB 4
DQB 3
DQB 4
RDQB 3
RDQB 4
SDA
DQB 1
DQB 2
DQB 1
DQB 2
RDQB 1
RDQB 2
SV
DD
COL 0
DQB 0
COL 0
DQB 0
RCOL 0
RDQB 0
COL 2
COL 1
COL 2
COL 1
RCOL 2
RCOL 1
0.1 µF
COL 4
COL 3
COL 4
COL 3
RCOL 4
RCOL 3
ROW 1
ROW 0
U3
ROW 1
ROW 0
U12
RROW 1
RROW 0
V
CTMN
ROW 2
CTMN
ROW 2
RCTMN
RROW 2
V
DD
CMOS
CFMN
CTM
CFMN
CTM
RCFMN
RCTM
DQA 1
DQA 0
CFM
DQA 1
DQA 0
CFM
RDQA 1
RDQA 0
RCFM
2 per
RDRAM
0.1 µF
1 per
2 RDRAMs
0.1 µF
DQA 3
DQA 2
DQA 3
DQA 2
RDQA 3
RDQA 2
DQA 5
DQA 4
DQA 5
DQA 4
RDQA 5
RDQA 4
V
REF
DQA 7
DQA 6
DQA 7
DQA 6
RDQA 7
RDQA 6
DQA 8
DQA 8
RDQA 8
1 per
2 RDRAMs
Plus one
Near Connector
0.1 µF
Remarks 1.
Rambus Channel signals form a loop through the RIMM module, with the exception of the SIO chain.
2.
See Serial Presence Detection Specification for information on the SPD device and its contents.
Preliminary Data Sheet M14808EJ2V0DS00
7
Page 8
MC-4R192CPE6C
Electrical Specification
Absolute Maximum Ratings
SymbolParameterMIN.MAX.Unit
I,ABS
V
DD,ABS
V
STORE
T
Caution Exposing the device to stress above those listed in Absolute Maximum Ratings could cause
DC Recommended Electrical Conditions
SymbolParameter and conditionsMIN.MAX.Unit
DD
V
CMOS
V
REF
V
IL
V
IH
V
IL,CMOS
V
IH,CMOS
V
OL,CMOS
V
OH,CMOS
V
REF
I
SCK,CMD
I
SIN,SOUT
I
Voltage applied to any RSL or CMOS signal pad with respect to GND
Voltage on VDD with respect to GND
Storage temperature
0.3VDD + 0.3V
−
0.5VDD + 1.0V
−
50+100°C
−
permanent damage. The device is not meant to be operated under conditions outside the limits
described in the operational section of this specification. Exposure to Absolute Maximum Rating
conditions for extended periods may affect device reliability.
Supply voltage2.50 − 0.132.50 + 0.13V
CMOS I/O power supply at pad2.5V controllers2.5 − 0.132.5 + 0.25V
1.8V controllers1.8 − 0.11.8 + 0.2
Reference voltage1.4 − 0.21.4 + 0.2V
RSL input low voltageV
RSL input high voltageV
CMOS input low voltage
CMOS input high voltage0.5V
CMOS output low voltage, I
CMOS output high voltage, I
REF
V
current, V
REF,MAX
CMOS input leakage current, (0 ≤ V
CMOS input leakage current, (0 ≤ V
OL,CMOS
= 1 mA
OH,CMOS
= −0.25 mAV
CMOS
≤ VDD)
CMOS
≤ VDD)
REF
− 0.5V
REF
+ 0.2V
0.30.5V
−
CMOS
+0.25V
—
CMOS
− 0.3
120.0+120.0
−
120.0+120.0 µA
−
10.0+10.0 µA
−
REF
− 0.2V
REF
+ 0.5V
CMOS
− 0.25V
CMOS
+ 0.3V
0.3V
—
V
A
µ
8
Preliminary Data Sheet M14808EJ2V0DS00
Page 9
AC Electrical Specifications
MC-4R192CPE6C
•
Symbol
ZModule Impedance
PD
T
Average clock delay f rom finger to finger of all RSL clock nets-8451.76ns
(CTM, CTMN,CFM, and CFMN)-7451.76
T
∆
T
∆
PD
PD-CMOS
Propagation delay variation of RSL si gnal s with respect to TPD
Propagation delay variation of SCK and CMD si gnal s with respect to
an average clock delay
Attenuation Limit-84520%
IN
Vα/V
Forward crosstalk coefficient-8456%
IN
VXF/V
(300ps input rise time 20% - 80%)-7456
VXB/V
IN
Backward
crosstalk coefficient-8452.3%
(300ps input rise time 20% - 80%)-7452.3
R
DC
DC Resistance Limit-8451.1
Parameter and ConditionsMIN.
25.22830.8
-6531.76
Note1
Note1,2
21+21ps
−
100+100ps
−
-74520
-65318
-6536
-6532.3
-7451.1
-6531.1
TYP.MAX.Unit
Ω
Ω
Notes 1.
PD
T
or Average clock delay is defined as the average delay from finger to finger of all RSL clock nets (CTM,
CTMN, CFM, and CFMN).
2.
If the RIMM module meets the following specification, then it is compliant to the specification.
If the RIMM module does not meet these specifications, then the specification can be adjusted by the
PD
Specification” table.
Adjusted
“Adjusted ∆T
PD
Specification
T
∆∆∆∆
SymbolParameter and conditionsAdjusted MIN./MAX.AbsoluteUnit
MIN.MAX.
PD
Propagation delay variation of RSL si gnal s with respect to T
T
∆
Note
N = Number of RDRAM devices installed on the RIMM module.
∆Z0 = delta Z0% = (MAX. Z0
− MIN. Z0) / (MIN. Z0)
+/− [20+(18*N*∆Z0)]
PD
Note
40+40 ps
−
(MAX. Z0 and MIN. Z0 are obtained from the loaded (high impedance) impedance coupons of all RSL layers
on the module.)
Preliminary Data Sheet M14808EJ2V0DS00
9
Page 10
RIMM Module Current Profile
DD
I
DD1
I
DD2
I
DD3
I
DD4
I
DD5
I
DD6
I
One RDRAM in Read
One RDRAM in Read
One RDRAM in Read
One RDRAM in Write, bal anc e i n NAP mode
One RDRAM in Write, bal anc e i n Standby mode
One RDRAM in Write, bal anc e i n Active mode
RIMM module power conditions
Note2
, balance in NAP mode
Note2
, balance in Standby mode
Note2
, balance in Active mode
Note1
-845
-745
-653
-845
-745
-653
-845
-745
-653
-845
-745
-653
-845
-745
-653
-845
-745
-653
MC-4R192CPE6C
MAX.Unit
736.2 mA
671.2
586.2
1,900 mA
1,780
1,585
2,670 mA
2,440
2,135
696.2 mA
641.2
561.2
1,860 mA
1,750
1,560
2,630 mA
2,410
2,110
Notes 1.
Actual power will depend on individual RDRAM component specifications, memory controller and usage
patterns. Power does not include Refresh Current.
2.
I/O current is a function of the
following :
DD
V
= 2.5 V, V
% of 1’s, to add I/O power for 50 % 1’s for a x16 need to add 257 mA for the
TERM
= 1.8 V, V
REF
= 1.4 V and V
DIL
= V
REF
− 0.5 V.
10
Preliminary Data Sheet M14808EJ2V0DS00
Page 11
MC-4R192CPE6C
Timing Parameters
The following timing parameters are from the RDRAMs pins, not the RIMM. Please refer to the RDRAM data sheet
(
µ
PD488448) for detailed timing diagrams.
Para-DescriptionMIN.MAX.Units
meter-845-745-653
t
RC
t
RAS
t
RP
t
PP
t
RR
t
RCD
t
CAC
t
CWD
t
CC
t
PACKET
t
RTR
t
OFFP
t
RDP
t
RTP
Row Cycle time of RDRAM banks - the interval between ROWA packets with
282828—t
ACT commands to the same bank.
RAS-asserted time of RDRAM bank - the interval between ROWA packet with ACT
command and next ROWR packet with PRER
Note 1
command to the same bank.
Row Precharge time of RDRAM banks - the interval between ROWR packet with
Note 1
PRER
command and next ROWA packet with ACT command to the same
202020
888—t
Note 2
64µs
bank.
Precharge-to-precharge time of RDRAM device - the interval between
successive ROWR packets with PRER
Note 1
commands to any banks of the
888—t
same device.
RAS-to-RAS time of RDRAM device - the interval between successive ROWA
888—t
packets with ACT com m ands to any banks of the same devic e.
RAS-to-CAS Delay - the int erval from ROWA packet with ACT com m and to
977—t
COLC packet with RD or WR comm and. Note - the RAS-to-CAS delay s een
by the RDRAM core (t
) is equal to t
RCD-C
RCD-C = 1 + tRCD
because of differences
in the row and column paths through the RDRAM interface.
CAS Access delay - the interval from RD command to Q read data. The
equation for t
is given in the TPARM register.
CAC
88812t
CAS Write Delay - interval from WR command to D write data.6666t
CAS-to-CAS time of RDRAM bank - the interval between su ccessive COLC
444—t
commands.
Length of ROWA, ROWR, COLC, COLM or COLX pac ket.4444t
Interval from COLC packet wi th WR command to COLC packet which caus es
888—t
retire, and to COLM packet with bytemask.
The interval (offset) f rom COLC packet with RDA command, or from COLC
4444t
packet with retire command (after WRA automatic precharge), or from COLC
packet with PREC comm and, or from COLX packet with PREX command to
the equivalent ROWR packet with PRER. The equation for t
is given in the
OFFP
TPARM register.
Interval from last COLC packet with RD command to ROWR packet with
444—t
PRER.
Interval from last COLC packet with automatic retire c ommand to ROWR
444—t
packet with PRER.
CYCLE
t
CYCLE
CYCLE
CYCLE
CYCLE
CYCLE
CYCLE
CYCLE
CYCLE
CYCLE
CYCLE
CYCLE
CYCLE
CYCLE
Notes 1.
Or equivalent PREC or PREX command.
This is a constraint imposed by the core, and is therefore in units of ms rather than t
2.
Preliminary Data Sheet M14808EJ2V0DS00
CYCLE
.
11
Page 12
MC-4R192CPE6C
•
Standard RIMM Module Marking
The RIMM modules available from NEC are marked per Figure 1 below. This marking assists users to specify and
verify if the correct RIMM modules are installed in their systems. In the diagram, a label is shown attached to the
RIMM module's heat spreader. Information contained on the label is specific to the RIMM module and provides
RDRAM information without requiring removal of the RIMM module's heat spreader.
Figure 1. RIMM Module marking example
ABC
JAPAN
MC-4R128CEE6C-845
EF
GHI J
Label FieldDescriptionMarked TextUnits
A Vendor logoVendor logo area
B Manufacturing CountryCountry of origin
C Module Memory Capacity Number of 8-bit or 9-bit M B ytes of RDRAM storage in
RIMM module
Number of RDRAMsNumber of RDRAM devices contained in the RIMM
module
D ECC SupportIndicates whether the RIMM module supports 8-bi t
(non ECC) or 9-bit (ECC) Bytes
E Part No.NEC RIMM Part No.
F Memory SpeedData transfer speed for RIMM module800, 711, 600MHz
t
RAC
G Manufacturing Lot No.Manufact ured Y ear code, Week code, In-house code Y YWW
H Gerber VersionPCB Gerber file revision us ed on RIMM ModuleG100 as Rev 1.00
I SPD VersionSPD code versionS100 as Rev 1.00
J Caut i on Logo
Row Access Time-45, -53ns
−−−
128MB/8d nonECC
800-45
G100 S1000020B9001
D
1996
No. 6043B-ISOHCS, Inc. 800-748-0241
NEC
JAPAN, USA, FRANCE
64MB, 96MB, 128MB, 192M B ,
256MB
/4d, /6d, /8d, /12d, /16dRDRAM
non ECC, ECC
See table
Order information
∗∗∗∗∗−
−
−
MBytes
devices
−
−
−
−
12
Preliminary Data Sheet M14808EJ2V0DS00
Page 13
Package Drawings
184 EDGE CONNECTOR PADS RIMM (SOCKET TYPE) (1/2)
EEPROM
R
A (AREA B)
128 M Direct RDRAM
MC-4R192CPE6C
M1 (AREA B)
V
P
ON M
K
G
S
L
H
B
detail of A part
W
Y
X
A
A1 (AREA A)
R1.00
Q
B
I
J
M2 (AREA A)
T
FDE
C
ITEM MILLIMETERS
133.35 TYP.
A
133.35±0.13
A1
55.175
B
1.00±0.10
B1
11.50
detail of B part
C1
B1
Z
R1.00
C
C1
D
E
F
G
H
I
J
K
L
M
M1
M2
N
O
P
Q
R
S
T
V
W
X
Y
Z
3.00±0.10
45.00
32.00
45.00
5.675
47.625
25.40
47.625
6.35
1.00 TYP.
31.75±0.13
11.97
19.78
29.21
17.78
4.00±0.10
R 2.00
3.00±0.10
φ
2.44
1.27±0.10
3.49 MAX.
0.80±0.10
2.99
0.15
2.00±0.10
Preliminary Data Sheet M14808EJ2V0DS00
13
Page 14
184 EDGE CONNECTOR PADS RIMM (SOCKET TYPE) (2/2)
A
MC-4R192CPE6C
B
E
Pad A1Pad A92
CC
D
ITEM
A
B
C
D
E
F
G
H
DESCRIPTION
PCB length
PCB height for 1.25" RIMM Module
Center-center pad width from pad A1 to A46,
A47 to A92, B1 to B46 or B47 to B92
Spacing from PCB left edge to connector key notch
Spacing from contact pad PCB edge
to side edge retainer notch
PCB thickness
Heat spreader thickness from PCB surface (one side) to
heat spreader top surface
RIMM thickness
MIN.
133.22
31.62
44.95
-
-
1.17
-
-
TYP.
133.35
31.75
45.00
55.175
17.78
1.27
-
-
MAX.
133.48
31.88
45.05
-
-
1.37
3.09
7.55
G
H
UNIT
mm
mm
mm
mm
mm
mm
mm
mm
F
14
Preliminary Data Sheet M14808EJ2V0DS00
Page 15
MC-4R192CPE6C
NOTES FOR CMOS DEVICES
1PRECAUTION AGAINST ESD FOR SEMICONDUCTORS
Note:
Strong electric field, when exposed to a MOS device, can cause destruction of the gate oxide and
ultimately degrade the device operation. Steps must be taken to stop generation of static electricity
as much as possible, and quickly dissipate it once, when it has occurred. Environmental control
must be adequate. When it is dry, humidifier should be used. It is recommended to avoid using
insulators that easily build static electricity. Semiconductor devices must be stored and transported
in an anti-static container, static shielding bag or conductive material. All test and measurement
tools including work bench and floor should be grounded. The operator should be grounded using
wrist strap. Semiconductor devices must not be touched with bare hands. Similar precautions need
to be taken for PW boards with semiconductor devices on it.
2HANDLING OF UNUSED INPUT PINS FOR CMOS
Note:
No connection for CMOS device inputs can be cause of malfunction. If no connection is provided
to the input pins, it is possible that an internal input level may be generated due to noise, etc., hence
causing malfunction. CMOS devices behave differently than Bipolar or NMOS devices. Input levels
of CMOS devices must be fixed high or low by using a pull-up or pull-down circuitry. Each unused
DD
pin should be connected to V
being an output pin. All handling related to the unused pins must be judged device by device and
related specifications governing the devices.
or GND with a resistor, if it is considered to have a possibility of
3STATUS BEFORE INITIALIZATION OF MOS DEVICES
Note:
Power-on does not necessarily define initial status of MOS device. Production process of MOS
does not define the initial operation status of the device. Immediately after the power source is
turned ON, the devices with reset function have not yet been initialized. Hence, power-on does
not guarantee out-pin levels, I/O settings or contents of registers. Device is not initialized until the
reset signal is received. Reset operation must be executed immediately after power-on for devices
having reset function.
Preliminary Data Sheet M14808EJ2V0DS00
15
Page 16
MC-4R192CPE6C
Rambus, RDRAM and the Rambus Logo are registered trademarks of Rambus Inc.
DirectRambus, DirectRDRAM, RIMM, RModule and RSocket are trademarks of Rambus Inc.
BGA is a registered trademark of Tessera Inc.
µµµµ
CAUTION FOR HANDLING MEMORY MODULES
When handling or inserting memory modules, be sure not to touch any components on the modules, such as
the memory IC, chip capacitors and chip resistors. It is necessary to avoid undue mechanical stress on these
components to prevent damaging them.
When re-packing memory modules, be sure the modules are NOT touching each other. Modules in contact
with other modules may cause excessive mechanical stress, which may damage the modules.
•
The information in this document is current as of August, 2000. The information is subject to
change without notice. For actual design-in, refer to the latest publications of NEC's data sheets or
data books, etc., for the most up-to-date specifications of NEC semiconductor products. Not all
products and/or types are available in every country. Please check with an NEC sales representative
for availability and additional information.
•
No part of this document may be copied or reproduced in any form or by any means without prior
written consent of NEC. NEC assumes no responsibility for any errors that may appear in this document.
•
NEC does not assume any liability for infringement of patents, copyrights or other intellectual property rights of
third parties by or arising from the use of NEC semiconductor products listed in this document or any other
liability arising from the use of such products. No license, express, implied or otherwise, is granted under any
patents, copyrights or other intellectual property rights of NEC or others.
•
Descriptions of circuits, software and other related information in this document are provided for illustrative
purposes in semiconductor product operation and application examples. The incorporation of these
circuits, software and information in the design of customer's equipment shall be done under the full
responsibility of customer. NEC assumes no responsibility for any losses incurred by customers or third
parties arising from the use of these circuits, software and information.
•
While NEC endeavours to enhance the quality, reliability and safety of NEC semiconductor products, customers
agree and acknowledge that the possibility of defects thereof cannot be eliminated entirely. To minimize
risks of damage to property or injury (including death) to persons arising from defects in NEC
semiconductor products, customers must incorporate sufficient safety measures in their design, such as
redundancy, fire-containment, and anti-failure features.
•
NEC semiconductor products are classified into the following three quality grades:
"Standard", "Special" and "Specific". The "Specific" quality grade applies only to semiconductor products
developed based on a customer-designated "quality assurance program" for a specific application. The
recommended applications of a semiconductor product depend on its quality grade, as indicated below.
Customers must check the quality grade of each semiconductor product before using it in a particular
application.
"Standard": Computers, office equipment, communications equipment, test and measurement equipment, audio
and visual equipment, home electronic appliances, machine tools, personal electronic equipment
and industrial robots
systems, anti-crime systems, safety equipment and medical equipment (not specifically designed
for life support)
"Specific": Aircraft, aerospace equipment, submersible repeaters, nuclear reactor control systems, life
support systems and medical equipment for life support, etc.
The quality grade of NEC semiconductor products is "Standard" unless otherwise expressly specified in NEC's
data sheets or data books, etc. If customers wish to use NEC semiconductor products in applications not
intended by NEC, they must contact an NEC sales representative in advance to determine NEC's willingness
to support a given application.
(Note)
(1) "NEC" as used in this statement means NEC Corporation and also includes its majority-owned subsidiaries.
(2) "NEC semiconductor products" means any semiconductor product developed or manufactured by or for
NEC (as defined above).
M8E 00. 4
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