Datasheet MC-4R192CPE6C-653, MC-4R192CPE6C-745, MC-4R192CPE6C-845 Datasheet (NEC)

Page 1
PRELIMINARY DATA SHEET
MOS INTEGRATED CIRCUIT
Direct RambusTM DRAM RIMMTM Module
192M-BYTE (96M-WORD x 16-BIT)
Description
The Direct Rambus RIMM module is a general-purpose high-performance memory module subsystem suitable for use in a broad range of applications including computer memory, personal computers, workstations, and other applications where high bandwidth and low latency are required.
MC-4R192CPE6C modules consists of twelve 128M Direct Rambus DRAM (Direct RDRAM™) devices (
µ
PD488448). These are extremely high-speed CMOS DRAMs organized as 8M words by 16 bits. The use of Rambus Signaling Level (RSL) technology permits 600MHz, 711MHz or 800MHz transfer rates while using conventional system and board design technologies.
Direct RDRAM devices are capable of sustained data transfers at 1.25 ns per two bytes (10 ns per sixteen bytes).
The architecture of the Direct RDRAM enables the highest sustained bandwidth for multiple, simultaneous, randomly addressed memory transactions. The separate control and data buses with independent row and column control yield over 95 % bus efficiency. The Direct RDRAM's 32 banks support up to four simultaneous transactions per device.
Features
184 edge connector pads with 1mm pad spacing
192 MB Direct RDRAM storage
Each RDRAM
Gold plated contacts
RDRAMs use Chip Scale Package (CSP)
Serial Presence Detect support
Operates from a 2.5 V supply
Low power and powerdown self refresh modes
Separate Row and Column buses for higher efficiency
Over Drive Factor (ODF) support
has 32 banks, for 384 banks total on module
The information in this document is subject to change without notice. Before using this document, please confirm that this is the latest version.
Not all devices/types available in every country. Please check with local NEC representative for availability and additional information.
Document No. M14808EJ2V0DS00 (2nd edition) Date Published August 2000 NS CP (K) Printed in Japan
The mark
shows major revised points.
★★★★
©
2000
Page 2
Order information
MC-4R192CPE6C
Part number Organization I/O Freq.
MHz
MC-4R192CPE6C - 845 96M x 16 800 45 184 edge connector pads RIMM 12 pieces of MC-4R192CPE6C - 745 711 45 with heat spreader MC-4R192CPE6C - 653 600 53 Edge connector : Gold plated FBGA (µBGA) package
RAS access time
ns
Package Mounted devices
PD488448FF
µ
2
Preliminary Data Sheet M14808EJ2V0DS00
Page 3
Module Pad Configuration
MC-4R192CPE6C
B10 B11 B12 B13 B14 B15 B16 B17 B18 B19 B20 B21 B22 B23 B24 B25 B26 B27 B28 B29 B30 B31 B32 B33 B34 B35 B36 B37 B38 B39 B40 B41 B42 B43 B44 B45 B46
B1 B2 B3 B4 B5 B6 B7 B8 B9
GND LDQA7 GND LDQA5 GND LDQA3 GND LDQA1 GND LCFM GND LCFMN GND NC GND LROW2 GND LROW0 GND LCOL3 GND LCOL1 GND LDQB0 GND LDQB2 GND LDQB4 GND LDQB6 GND LDQB8 GND LCMD
CMOS
V SIN
CMOS
V NC GND NC V
DD
V
DD
NC NC NC NC
GND
LDQA8
GND
LDQA6
GND
LDQA4
GND
LDQA2
GND
LDQA0
GND
LCTMN
GND
LCTM
GND
NC
GND
LROW1
GND
LCOL4
GND
LCOL2
GND
LCOL0
GND
LDQB1
GND
LDQB3
GND
LDQB5
GND
LDQB7
GND
LSCK
V
CMOS
SOUT V
CMOS
NC
GND
NC V V
NC
NC
NC
NC
A1 A2 A3 A4 A5 A6 A7 A8 A9 A10 A11 A12 A13 A14 A15 A16 A17 A18 A19 A20 A21 A22 A23 A24 A25 A26 A27 A28 A29 A30 A31 A32 A33 A34 A35 A36 A37 A38 A39
DD DD
A40 A41 A42 A43 A44 A45 A46
Side B Side A
B47 B48 B49 B50 B51 B52 B53 B54 B55 B56 B57 B58 B59 B60 B61 B62 B63 B64 B65 B66 B67 B68 B69 B70 B71 B72 B73 B74 B75 B76 B77 B78 B79 B80 B81 B82 B83 B84 B85 B86 B87 B88 B89 B90 B91 B92
NC NC NC NC V
REF
GND SA0
DD
V SA1
DD
SV SA2
DD
V RCMD GND RDQB8 GND RDQB6 GND RDQB4 GND RDQB2 GND RDQB0 GND RCOL1 GND RCOL3 GND RROW0 GND RROW2 GND NC GND RCFMN GND RCFM GND RDQA1 GND RDQA3 GND RDQA5 GND RDQA7 GND
NC
NC
NC
NC
V
REF
GND
SCL
V
SDA
SV
SWP
V
RSCK
GND
RDQB7
GND
RDQB5
GND
RDQB3
GND
RDQB1
GND
RCOL0
GND
RCOL2
GND
RCOL4
GND
RROW1
GND
NC
GND
RCTM
GND
RCTMN
GND
RDQA0
GND
RDQA2
GND
RDQA4
GND
RDQA6
GND
RDQA8
GND
A47 A48 A49 A50 A51 A52
DD
DD
DD
A53 A54 A55 A56 A57 A58 A59 A60 A61 A62 A63 A64 A65 A66 A67 A68 A69 A70 A71 A72 A73 A74 A75 A76 A77 A78 A79 A80 A81 A82 A83 A84 A85 A86 A87 A88 A89 A90 A91 A92
LCFM, LCFMN, RCFM, RCFMN : Clock from master LCTM, LCTMN, RCTM, RCTMN : Clock to master LCMD, RCMD : Serial Command Pad LROW2 - LROW0, RROW2 - RROW0 : Row bus LCOL4 - LCOL0, RCOL4 - RCOL0 : Column bus LDQA8 - LDQA0, RDQA8 - RDQA0 : Data bus A LDQB8 - LDQB0, RDQB8 - RDQB0 : Data bus B LSCK, RSCK : Clock input SA0 - SA2 : Serial Presence Detect Address SCL, SDA : Serial Presence Detect Clock SIN, SOUT : Serial I/O
DD
SV
: SPD Voltage
SWP : Serial Presence Detect Write Protect
CMOS
V
DD
V
REF
V
: Supply voltage for serial pads : Supply voltage
: Logic threshold GND : Ground reference NC : These pads are not connected
Preliminary Data Sheet M14808EJ2V0DS00
3
Page 4
MC-4R192CPE6C
Module Pad Names
Pad Signal Name Pad Signal Name Pad Signal Name Pad Signal Name
A1 GND B1 GND A47 NC B47 NC A2 LDQA8 B2 LDQA7 A48 NC B48 NC A3 GND B3 GND A49 NC B49 NC A4 LDQA6 B4 LDQA5 A50 NC B50 NC A5 GND B5 GND A51 V A6 LDQA4 B6 LDQA3 A52 GND B52 GND A7 GND B7 GND A53 SCL B53 SA0 A8 LDQA2 B8 LDQA1 A54 V
A9 GND B9 GND A55 SDA B55 SA1 A10 LDQA0 B10 LCFM A56 SV A11 GND B11 GND A57 SWP B57 SA2 A12 LCTMN B12 LCFMN A58 V A13 GND B13 GND A59 RSCK B59 RCMD A14 LCTM B14 NC A60 GND B60 GND A15 GND B15 GND A61 RDQB7 B61 RDQB8 A16 NC B16 LROW2 A62 GND B62 GND A17 GND B17 GND A63 RDQB5 B63 RDQB6 A18 LROW1 B18 LROW0 A64 GND B64 GND A19 GND B19 GND A65 RDQB3 B65 RDQB4 A20 LCOL4 B20 LCOL3 A66 GND B66 GND A21 GND B21 GND A67 RDQB1 B67 RDQB2 A22 LCOL2 B22 LCOL1 A68 GND B68 GND A23 GND B23 GND A69 RCOL0 B69 RDQB0 A24 LCOL0 B24 LDQB0 A70 GND B70 GND A25 GND B25 GND A71 RCOL2 B71 RCOL1 A26 LDQB1 B26 LDQB2 A72 GND B72 GND A27 GND B27 GND A73 RCOL4 B73 RCOL3 A28 LDQB3 B28 LDQB4 A74 GND B74 GND A29 GND B29 GND A75 RROW1 B75 RROW0 A30 LDQB5 B30 LDQB6 A76 GND B76 GND A31 GND B31 GND A77 NC B77 RROW2 A32 LDQB7 B32 LDQB8 A78 GND B78 GND A33 GND B33 GND A79 RCTM B79 NC A34 LSCK B34 LCMD A80 GND B80 GND A35 V
CMOS
B35 V
CMOS
A81 RCTMN B81 RCFMN A36 SOUT B36 SIN A82 GND B82 GND A37 V
CMOS
B37 V
CMOS
A83 RDQA0 B83 RCFM A38 NC B38 NC A84 GND B84 GND A39 GND B39 GND A85 RDQA2 B85 RDQA1 A40 NC B40 NC A86 GND B86 GND A41 V A42 V
DD
DD
B41 V B42 V
DD
DD
A87 RDQA4 B87 RDQA3
A88 GND B88 GND A43 NC B43 NC A89 RDQA6 B89 RDQA5 A44 NC B44 NC A90 GND B90 GND A45 NC B45 NC A91 RDQA8 B91 RDQA7 A46 NC B46 NC A92 GND B92 GND
REF
DD
DD
B51 V
B54 V
DD
B56 SV
B58 V
REF
DD
DD
DD
4
Preliminary Data Sheet M14808EJ2V0DS00
Page 5
MC-4R192CPE6C
Module Connector Pad Description
Signal I/O Type Description GND Ground reference for RDRAM core and interface. 72 PCB connector pads. LCFM I RSL Clock from mas ter. Interface clock used for receiving RSL signals from t he
Channel. Positive polarity.
LCFMN I RSL Clock from master. Interface clock used for receiving RSL signals from the
Channel. Negative polarity.
LCMD I V
LCOL4..LCOL0 I RSL Column bus. 5-bit bus c ontaining control and address information for column
LCTM I RSL Cl ock to master. Interf ace clock used for transmi tting RSL signals to the
LCTMN I RSL Clock to master. Interface clock used for transmitting RSL signals to the
LDQA8..LDQA0 I/O RSL Data bus A. A 9-bit bus carrying a byte of read or write data between the Channel
LDQB8..LDQB0 I/O RSL Data bus B. A 9-bit bus carrying a byte of read or write data between the Channel
LROW2..LROW0 I RSL Row bus. 3-bi t bus containing control and address information for row accesses. LSCK I V
NC These pads are not connected. These 24 connector pads are reserved for future
RCFM I RSL Clock from master. Interface clock used for receiving RSL signals f rom the
RCFMN I RSL Cl ock from master. I nterface clock used for receiving RS L signals from the
RCMD I V
RCOL4..RCOL0 I RSL Colum n bus . 5-bit bus containing control and address information for column
RCTM I RSL Clock to master. Interface clock used for transmitting RSL s i gnal s to the
RCTMN I RSL Cl ock to master. Interf ace clock used for transmi tting RSL signals to the
RDQA8..RDQA0 I/O RSL Data bus A. A 9-bit bus carrying a byte of read or write data between the Channel
RDQB8..RDQB0 I/O RSL Data bus B. A 9-bit bus carrying a byte of read or write data between the Channel
RROW2..RROW0 I RSL Row bus. 3-bi t bus containing control and address inf ormation for row accesses.
CMOS
CMOS
CMOS
Serial Command used t o read from and write to the control registers . Also used for power management.
accesses.
Channel. Positive polarity.
Channel. Negative polarity.
and the RDRAM. LDQA8 is non-functi onal on modules with x16 RDRAM devices.
and the RDRAM. LDQB8 is non-functi onal on modules with x16 RDRAM devices.
Serial clock input. Cl ock source used to read from and write to t he RDRA M control registers.
use.
Channel. Positive polarity.
Channel. Negative polarity. Serial Command Input used to read from and write to the control registers. Also used for power management.
accesses.
Channel. Positive polarity.
Channel. Negative polarity.
and the RDRAM. RDQA8 is non-functi onal on modules with x16 RDRAM devices.
and the RDRAM. RDQB8 is non-functi onal on modules with x16 RDRAM devices.
(1/2)
Preliminary Data Sheet M14808EJ2V0DS00
5
Page 6
Signal I/O Type Description
MC-4R192CPE6C
(2/2)
RSCK I V
SA0 I SV SA1 I SV SA2 I SV SCL I SV SDA I/O SV SIN I/O V
SOUT I/O V
DD
SV
SPD Voltage. Used for signals SCL, SDA, SWP, SA0, SA1 and SA2.
SWP I SV
CMOS
V
DD
V
REF
V
CMOS I/O Voltage. Used for signals CMD, SCK, SI N, SOUT. — Supply voltage for the RDRAM c ore and i nterface logic. — Logic threshold reference voltage for RSL signals.
CMOS
DD
DD
DD
DD
DD
CMOS
CMOS
DD
Serial clock input. Cl ock source used to read from and write to t he RDRA M control registers. Serial Presence Detect Address 0.
Serial Presence Detect Address 1. Serial Presence Detect Address 2. Serial Presence Detec t Clock. Serial Presence Detect Data (Open Collector I/O). Serial I/O for reading from and writing to the control registers. A ttaches to SIO0
of the first RDRAM on the module. Serial I/O for reading from and writing to the control registers. A ttaches to SIO1 of the last RDRAM on the modul e.
Serial Presence Detect Write Protect (active high). When low, the SPD can be written as well as read.
6
Preliminary Data Sheet M14808EJ2V0DS00
Page 7
Block Diagram
V
REF
LCMD
LSCK
SIN
LDQB 7
LDQB 8
DQB 7
DQB 8
SIO 0 SIO 1 SCK CMD
REF
V
DQB 7
DQB 8
SIO 0 SIO 1 SCK CMD
REF
V
LDQB 5
LDQB 6
DQB 5
DQB 6
DQB 5
DQB 6
LDQB 3
LDQB 4
DQB 3
DQB 4
DQB 3
DQB 4
LDQB 1
LDQB 2
DQB 1
DQB 2
DQB 1
DQB 2
LDQB 0
LCOL 0
COL 0
DQB 0
COL 0
DQB 0
LCOL 2
LCOL 1
COL 2
COL 1
COL 2
COL 1
LCOL 4
LCOL 3
COL 4
COL 3
COL 4
COL 3
LROW 1
LROW 0
ROW 1
ROW 0
U1
ROW 1
ROW 0
U2
LROW 2
LCTMN
CTMN
ROW 2
CTMN
ROW 2
LCTM
CTM
CTM
LCFMN
LCFM
CFM
CFMN
CFM
CFMN
LDQA 1
LDQA 0
DQA 1
DQA 0
DQA 1
DQA 0
MC-4R192CPE6C
LDQA 8
LDQA 7
LDQA 6
LDQA 5
LDQA 4
LDQA 3
LDQA 2
DQA 8
DQA 7
DQA 6
DQA 5
DQA 4
DQA 3
DQA 2
DQA 8
DQA 7
DQA 6
DQA 5
DQA 4
DQA 3
DQA 2
V
CMOS
V
DD
SCL SWP
47 k
RCMD
SCL WP
A0
SA0
SOUT
RSCK
SV
DD
V
CC
U0
A1 A2
SA1 SA2
DQB 8
SIO 0 SIO 1 SCK CMD
REF
V
DQB 8
SIO 0 SIO 1 SCK CMD
REF
V
RDQB 8
SDA
DQB 5
DQB 6
DQB 7
DQB 5
DQB 6
DQB 7
RDQB 5
RDQB 6
RDQB 7
SERIAL PD
DQB 3
DQB 4
DQB 3
DQB 4
RDQB 3
RDQB 4
SDA
DQB 1
DQB 2
DQB 1
DQB 2
RDQB 1
RDQB 2
SV
DD
COL 0
DQB 0
COL 0
DQB 0
RCOL 0
RDQB 0
COL 2
COL 1
COL 2
COL 1
RCOL 2
RCOL 1
0.1 µF
COL 4
COL 3
COL 4
COL 3
RCOL 4
RCOL 3
ROW 1
ROW 0
U3
ROW 1
ROW 0
U12
RROW 1
RROW 0
V
CTMN
ROW 2
CTMN
ROW 2
RCTMN
RROW 2
V
DD
CMOS
CFMN
CTM
CFMN
CTM
RCFMN
RCTM
DQA 1
DQA 0
CFM
DQA 1
DQA 0
CFM
RDQA 1
RDQA 0
RCFM
2 per RDRAM
0.1 µF
1 per 2 RDRAMs
0.1 µF
DQA 3
DQA 2
DQA 3
DQA 2
RDQA 3
RDQA 2
DQA 5
DQA 4
DQA 5
DQA 4
RDQA 5
RDQA 4
V
REF
DQA 7
DQA 6
DQA 7
DQA 6
RDQA 7
RDQA 6
DQA 8
DQA 8
RDQA 8
1 per 2 RDRAMs Plus one Near Connector
0.1 µF
Remarks 1.
Rambus Channel signals form a loop through the RIMM module, with the exception of the SIO chain.
2.
See Serial Presence Detection Specification for information on the SPD device and its contents.
Preliminary Data Sheet M14808EJ2V0DS00
7
Page 8
MC-4R192CPE6C
Electrical Specification
Absolute Maximum Ratings
Symbol Parameter MIN. MAX. Unit
I,ABS
V
DD,ABS
V
STORE
T
Caution Exposing the device to stress above those listed in Absolute Maximum Ratings could cause
DC Recommended Electrical Conditions
Symbol Parameter and conditions MIN. MAX. Unit
DD
V
CMOS
V
REF
V
IL
V
IH
V
IL,CMOS
V
IH,CMOS
V
OL,CMOS
V
OH,CMOS
V
REF
I
SCK,CMD
I
SIN,SOUT
I
Voltage applied to any RSL or CMOS signal pad with respect to GND Voltage on VDD with respect to GND Storage temperature
0.3 VDD + 0.3 V
0.5 VDD + 1.0 V
50 +100 °C
permanent damage. The device is not meant to be operated under conditions outside the limits described in the operational section of this specification. Exposure to Absolute Maximum Rating conditions for extended periods may affect device reliability.
Supply voltage 2.50 − 0.13 2.50 + 0.13 V CMOS I/O power supply at pad 2.5V controllers 2.5 − 0.13 2.5 + 0.25 V
1.8V controllers 1.8 − 0.1 1.8 + 0.2 Reference voltage 1.4 − 0.2 1.4 + 0.2 V RSL input low voltage V RSL input high voltage V CMOS input low voltage CMOS input high voltage 0.5V CMOS output low voltage, I CMOS output high voltage, I
REF
V
current, V
REF,MAX
CMOS input leakage current, (0 ≤ V CMOS input leakage current, (0 ≤ V
OL,CMOS
= 1 mA
OH,CMOS
= −0.25 mA V
CMOS
≤ VDD)
CMOS
≤ VDD)
REF
− 0.5 V
REF
+ 0.2 V
0.3 0.5V
CMOS
+0.25 V
CMOS
− 0.3
120.0 +120.0
120.0 +120.0 µA
10.0 +10.0 µA
REF
− 0.2 V
REF
+ 0.5 V
CMOS
− 0.25 V
CMOS
+ 0.3 V
0.3 V
V
A
µ
8
Preliminary Data Sheet M14808EJ2V0DS00
Page 9
AC Electrical Specifications
MC-4R192CPE6C
Symbol
Z Module Impedance
PD
T
Average clock delay f rom finger to finger of all RSL clock nets -845 1.76 ns (CTM, CTMN,CFM, and CFMN) -745 1.76
T
T
PD
PD-CMOS
Propagation delay variation of RSL si gnal s with respect to TPD Propagation delay variation of SCK and CMD si gnal s with respect to
an average clock delay Attenuation Limit -845 20 %
IN
Vα/V
Forward crosstalk coefficient -845 6 %
IN
VXF/V
(300ps input rise time 20% - 80%) -745 6
VXB/V
IN
Backward
crosstalk coefficient -845 2.3 %
(300ps input rise time 20% - 80%) -745 2.3
R
DC
DC Resistance Limit -845 1.1
Parameter and Conditions MIN.
25.2 28 30.8
-653 1.76
Note1
Note1,2
21 +21 ps
100 +100 ps
-745 20
-653 18
-653 6
-653 2.3
-745 1.1
-653 1.1
TYP. MAX. Unit
Notes 1.
PD
T
or Average clock delay is defined as the average delay from finger to finger of all RSL clock nets (CTM,
CTMN, CFM, and CFMN).
2.
If the RIMM module meets the following specification, then it is compliant to the specification. If the RIMM module does not meet these specifications, then the specification can be adjusted by the
PD
Specification” table.
Adjusted
“Adjusted ∆T
PD
Specification
T
∆∆∆∆
Symbol Parameter and conditions Adjusted MIN./MAX. Absolute Unit
MIN. MAX.
PD
Propagation delay variation of RSL si gnal s with respect to T
T
Note
N = Number of RDRAM devices installed on the RIMM module.
Z0 = delta Z0% = (MAX. Z0
MIN. Z0) / (MIN. Z0)
+/− [20+(18*N*∆Z0)]
PD
Note
40 +40 ps
(MAX. Z0 and MIN. Z0 are obtained from the loaded (high impedance) impedance coupons of all RSL layers on the module.)
Preliminary Data Sheet M14808EJ2V0DS00
9
Page 10
RIMM Module Current Profile
DD
I
DD1
I
DD2
I
DD3
I
DD4
I
DD5
I
DD6
I
One RDRAM in Read
One RDRAM in Read
One RDRAM in Read
One RDRAM in Write, bal anc e i n NAP mode
One RDRAM in Write, bal anc e i n Standby mode
One RDRAM in Write, bal anc e i n Active mode
RIMM module power conditions
Note2
, balance in NAP mode
Note2
, balance in Standby mode
Note2
, balance in Active mode
Note1
-845
-745
-653
-845
-745
-653
-845
-745
-653
-845
-745
-653
-845
-745
-653
-845
-745
-653
MC-4R192CPE6C
MAX. Unit
736.2 mA
671.2
586.2 1,900 mA 1,780 1,585 2,670 mA 2,440 2,135
696.2 mA
641.2
561.2 1,860 mA 1,750 1,560 2,630 mA 2,410 2,110
Notes 1.
Actual power will depend on individual RDRAM component specifications, memory controller and usage patterns. Power does not include Refresh Current.
2.
I/O current is a function of the following :
DD
V
= 2.5 V, V
% of 1’s, to add I/O power for 50 % 1’s for a x16 need to add 257 mA for the
TERM
= 1.8 V, V
REF
= 1.4 V and V
DIL
= V
REF
0.5 V.
10
Preliminary Data Sheet M14808EJ2V0DS00
Page 11
MC-4R192CPE6C
Timing Parameters
The following timing parameters are from the RDRAMs pins, not the RIMM. Please refer to the RDRAM data sheet (
µ
PD488448) for detailed timing diagrams.
Para- Description MIN. MAX. Units meter -845 -745 -653
t
RC
t
RAS
t
RP
t
PP
t
RR
t
RCD
t
CAC
t
CWD
t
CC
t
PACKET
t
RTR
t
OFFP
t
RDP
t
RTP
Row Cycle time of RDRAM banks - the interval between ROWA packets with
28 28 28 t
ACT commands to the same bank. RAS-asserted time of RDRAM bank - the interval between ROWA packet with ACT
command and next ROWR packet with PRER
Note 1
command to the same bank.
Row Precharge time of RDRAM banks - the interval between ROWR packet with
Note 1
PRER
command and next ROWA packet with ACT command to the same
20 20 20
888—t
Note 2
64µs
bank. Precharge-to-precharge time of RDRAM device - the interval between
successive ROWR packets with PRER
Note 1
commands to any banks of the
888—t
same device. RAS-to-RAS time of RDRAM device - the interval between successive ROWA
888—t
packets with ACT com m ands to any banks of the same devic e. RAS-to-CAS Delay - the int erval from ROWA packet with ACT com m and to
977—t COLC packet with RD or WR comm and. Note - the RAS-to-CAS delay s een by the RDRAM core (t
) is equal to t
RCD-C
RCD-C = 1 + tRCD
because of differences
in the row and column paths through the RDRAM interface. CAS Access delay - the interval from RD command to Q read data. The
equation for t
is given in the TPARM register.
CAC
88812t
CAS Write Delay - interval from WR command to D write data. 6 6 6 6 t CAS-to-CAS time of RDRAM bank - the interval between su ccessive COLC
444—t commands.
Length of ROWA, ROWR, COLC, COLM or COLX pac ket. 4 4 4 4 t Interval from COLC packet wi th WR command to COLC packet which caus es
888—t retire, and to COLM packet with bytemask.
The interval (offset) f rom COLC packet with RDA command, or from COLC
4444t packet with retire command (after WRA automatic precharge), or from COLC packet with PREC comm and, or from COLX packet with PREX command to the equivalent ROWR packet with PRER. The equation for t
is given in the
OFFP
TPARM register. Interval from last COLC packet with RD command to ROWR packet with
444—t PRER.
Interval from last COLC packet with automatic retire c ommand to ROWR
444—t packet with PRER.
CYCLE
t
CYCLE
CYCLE
CYCLE
CYCLE
CYCLE
CYCLE
CYCLE
CYCLE
CYCLE
CYCLE
CYCLE
CYCLE
CYCLE
Notes 1.
Or equivalent PREC or PREX command. This is a constraint imposed by the core, and is therefore in units of ms rather than t
2.
Preliminary Data Sheet M14808EJ2V0DS00
CYCLE
.
11
Page 12
MC-4R192CPE6C
Standard RIMM Module Marking
The RIMM modules available from NEC are marked per Figure 1 below. This marking assists users to specify and verify if the correct RIMM modules are installed in their systems. In the diagram, a label is shown attached to the RIMM module's heat spreader. Information contained on the label is specific to the RIMM module and provides RDRAM information without requiring removal of the RIMM module's heat spreader.
Figure 1. RIMM Module marking example
AB C
JAPAN
MC-4R128CEE6C-845
EF
GHI J
Label Field Description Marked Text Units A Vendor logo Vendor logo area B Manufacturing Country Country of origin C Module Memory Capacity Number of 8-bit or 9-bit M B ytes of RDRAM storage in
RIMM module
Number of RDRAMs Number of RDRAM devices contained in the RIMM
module
D ECC Support Indicates whether the RIMM module supports 8-bi t
(non ECC) or 9-bit (ECC) Bytes
E Part No. NEC RIMM Part No. F Memory Speed Data transfer speed for RIMM module 800, 711, 600 MHz
t
RAC
G Manufacturing Lot No. Manufact ured Y ear code, Week code, In-house code Y YWW H Gerber Version PCB Gerber file revision us ed on RIMM Module G100 as Rev 1.00
I SPD Version SPD code version S100 as Rev 1.00
J Caut i on Logo
Row Access Time -45, -53 ns
−−
128MB/8d nonECC
800-45
G100 S1000020B9001
D
1996
No. 6043B-ISOHCS, Inc. 800-748-0241
NEC JAPAN, USA, FRANCE 64MB, 96MB, 128MB, 192M B ,
256MB /4d, /6d, /8d, /12d, /16d RDRAM
non ECC, ECC
See table
Order information
∗∗∗∗∗
MBytes
devices
12
Preliminary Data Sheet M14808EJ2V0DS00
Page 13
Package Drawings
184 EDGE CONNECTOR PADS RIMM (SOCKET TYPE) (1/2)
EEPROM
R
A (AREA B)
128 M Direct RDRAM
MC-4R192CPE6C
M1 (AREA B)
V
P
ON M
K
G
S
L
H
B
detail of A part
W
Y
X
A
A1 (AREA A)
R1.00
Q
B
I
J
M2 (AREA A)
T
FDE
C
ITEM MILLIMETERS
133.35 TYP.
A
133.35±0.13
A1
55.175
B
1.00±0.10
B1
11.50
detail of B part
C1
B1
Z
R1.00
C C1 D E F G H I J K L M M1 M2 N O P Q R S T V W X Y Z
3.00±0.10
45.00
32.00
45.00
5.675
47.625
25.40
47.625
6.35
1.00 TYP.
31.75±0.13
11.97
19.78
29.21
17.78
4.00±0.10 R 2.00
3.00±0.10
φ
2.44
1.27±0.10
3.49 MAX.
0.80±0.10
2.99
0.15
2.00±0.10
Preliminary Data Sheet M14808EJ2V0DS00
13
Page 14
184 EDGE CONNECTOR PADS RIMM (SOCKET TYPE) (2/2)
A
MC-4R192CPE6C
B
E
Pad A1 Pad A92
C C D
ITEM
A
B
C
D
E
F
G
H
DESCRIPTION PCB length
PCB height for 1.25" RIMM Module
Center-center pad width from pad A1 to A46, A47 to A92, B1 to B46 or B47 to B92 Spacing from PCB left edge to connector key notch
Spacing from contact pad PCB edge to side edge retainer notch PCB thickness
Heat spreader thickness from PCB surface (one side) to heat spreader top surface RIMM thickness
MIN.
133.22
31.62
44.95
-
-
1.17
-
-
TYP.
133.35
31.75
45.00
55.175
17.78
1.27
-
-
MAX.
133.48
31.88
45.05
-
-
1.37
3.09
7.55
G H
UNIT
mm
mm
mm
mm
mm
mm
mm
mm
F
14
Preliminary Data Sheet M14808EJ2V0DS00
Page 15
MC-4R192CPE6C
NOTES FOR CMOS DEVICES
1 PRECAUTION AGAINST ESD FOR SEMICONDUCTORS
Note: Strong electric field, when exposed to a MOS device, can cause destruction of the gate oxide and ultimately degrade the device operation. Steps must be taken to stop generation of static electricity as much as possible, and quickly dissipate it once, when it has occurred. Environmental control must be adequate. When it is dry, humidifier should be used. It is recommended to avoid using insulators that easily build static electricity. Semiconductor devices must be stored and transported in an anti-static container, static shielding bag or conductive material. All test and measurement tools including work bench and floor should be grounded. The operator should be grounded using wrist strap. Semiconductor devices must not be touched with bare hands. Similar precautions need to be taken for PW boards with semiconductor devices on it.
2 HANDLING OF UNUSED INPUT PINS FOR CMOS
Note: No connection for CMOS device inputs can be cause of malfunction. If no connection is provided to the input pins, it is possible that an internal input level may be generated due to noise, etc., hence causing malfunction. CMOS devices behave differently than Bipolar or NMOS devices. Input levels of CMOS devices must be fixed high or low by using a pull-up or pull-down circuitry. Each unused
DD
pin should be connected to V being an output pin. All handling related to the unused pins must be judged device by device and related specifications governing the devices.
or GND with a resistor, if it is considered to have a possibility of
3 STATUS BEFORE INITIALIZATION OF MOS DEVICES
Note: Power-on does not necessarily define initial status of MOS device. Production process of MOS does not define the initial operation status of the device. Immediately after the power source is turned ON, the devices with reset function have not yet been initialized. Hence, power-on does not guarantee out-pin levels, I/O settings or contents of registers. Device is not initialized until the reset signal is received. Reset operation must be executed immediately after power-on for devices having reset function.
Preliminary Data Sheet M14808EJ2V0DS00
15
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MC-4R192CPE6C
Rambus, RDRAM and the Rambus Logo are registered trademarks of Rambus Inc. DirectRambus, DirectRDRAM, RIMM, RModule and RSocket are trademarks of Rambus Inc.
BGA is a registered trademark of Tessera Inc.
µµµµ
CAUTION FOR HANDLING MEMORY MODULES
When handling or inserting memory modules, be sure not to touch any components on the modules, such as the memory IC, chip capacitors and chip resistors. It is necessary to avoid undue mechanical stress on these components to prevent damaging them.
When re-packing memory modules, be sure the modules are NOT touching each other. Modules in contact with other modules may cause excessive mechanical stress, which may damage the modules.
The information in this document is current as of August, 2000. The information is subject to change without notice. For actual design-in, refer to the latest publications of NEC's data sheets or data books, etc., for the most up-to-date specifications of NEC semiconductor products. Not all products and/or types are available in every country. Please check with an NEC sales representative for availability and additional information.
No part of this document may be copied or reproduced in any form or by any means without prior written consent of NEC. NEC assumes no responsibility for any errors that may appear in this document.
NEC does not assume any liability for infringement of patents, copyrights or other intellectual property rights of third parties by or arising from the use of NEC semiconductor products listed in this document or any other liability arising from the use of such products. No license, express, implied or otherwise, is granted under any patents, copyrights or other intellectual property rights of NEC or others.
Descriptions of circuits, software and other related information in this document are provided for illustrative purposes in semiconductor product operation and application examples. The incorporation of these circuits, software and information in the design of customer's equipment shall be done under the full responsibility of customer. NEC assumes no responsibility for any losses incurred by customers or third parties arising from the use of these circuits, software and information.
While NEC endeavours to enhance the quality, reliability and safety of NEC semiconductor products, customers agree and acknowledge that the possibility of defects thereof cannot be eliminated entirely. To minimize risks of damage to property or injury (including death) to persons arising from defects in NEC semiconductor products, customers must incorporate sufficient safety measures in their design, such as redundancy, fire-containment, and anti-failure features.
NEC semiconductor products are classified into the following three quality grades: "Standard", "Special" and "Specific". The "Specific" quality grade applies only to semiconductor products developed based on a customer-designated "quality assurance program" for a specific application. The recommended applications of a semiconductor product depend on its quality grade, as indicated below. Customers must check the quality grade of each semiconductor product before using it in a particular application. "Standard": Computers, office equipment, communications equipment, test and measurement equipment, audio
and visual equipment, home electronic appliances, machine tools, personal electronic equipment and industrial robots
"Special": Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster
systems, anti-crime systems, safety equipment and medical equipment (not specifically designed for life support)
"Specific": Aircraft, aerospace equipment, submersible repeaters, nuclear reactor control systems, life
support systems and medical equipment for life support, etc. The quality grade of NEC semiconductor products is "Standard" unless otherwise expressly specified in NEC's data sheets or data books, etc. If customers wish to use NEC semiconductor products in applications not intended by NEC, they must contact an NEC sales representative in advance to determine NEC's willingness to support a given application. (Note) (1) "NEC" as used in this statement means NEC Corporation and also includes its majority-owned subsidiaries. (2) "NEC semiconductor products" means any semiconductor product developed or manufactured by or for
NEC (as defined above).
M8E 00. 4
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