Datasheet MC141516, MC141516FJ Datasheet (Motorola)

Page 1
MCM63P733A
1
MOTOROLA FAST SRAM
Advance Information
128K x 32 Bit Pipelined BurstRAM Synchronous Fast Static RAM
The MCM63P733A is a 4M–bit synchronous fast static RAM designed to pro­vide a burstable, high performance, secondary cache for the PowerPC and other high performance microprocessors. It is organized as 128K words of 32 bits each, fabricated with high performance silicon gate CMOS technology. This device integrates input registers, an output register, a 2–bit address counter, and high speed SRAM onto a single monolithic circuit for reduced parts count in cache data RAM applications. Synchronous design allows pre­cise cycle control with the use of an external clock (K). CMOS circuitry reduces the overall power consumption of the integrated functions for greater reliability .
Addresses (SA), data inputs (DQx), and all control signals except output enable (G
) and Linear Burst Order (LBO) are clock (K) controlled through
positive–edge–triggered noninverting registers.
Bursts can be initiated with either ADSP
or ADSC input pins. Subsequent burst addresses can be generated internally by the MCM63P733A (burst sequence operates in linear or interleaved mode dependent upon state of LBO
) and con-
trolled by the burst address advance (ADV
) input pin.
Write cycles are internally self–timed and are initiated by the rising edge of the clock (K) input. This feature eliminates complex off–chip write pulse generation and provides increased timing flexibility for incoming signals.
Synchronous byte write (SBx
), synchronous global write (SGW), and synchro-
nous write enable (SW
) are provided to allow writes to either individual bytes or
to all bytes. The four bytes are designated as “a”, “b”, “c”, and “d”. SBa
controls
DQa, SBb
controls DQb, etc. Individual bytes are written if the selected byte
writes SBx
are asserted with SW. All bytes are written if either SGW is asserted
or if all SBx
and SW are asserted.
For read cycles, pipelined SRAMs output data is temporarily stored by an edge–triggered output register and then released to the output buffers at the next rising edge of clock (K).
The MCM63P733A operates from a 3.3 V core power supply and all outputs operate on a 2.5 V or 3.3 V power supply. All inputs and outputs are JEDEC standard JESD8–5 compatible.
MCM63P733A–133 = 4 ns Access/7.5 ns Cycle (133 MHz)
MCM63P733A–117 = 4.2 ns Access/8.5 ns Cycle (117 MHz) MCM63P733A–100 = 4.5 ns Access/10 ns Cycle (100 MHz) MCM63P733A–90 = 5 ns Access/11 ns Cycle (90 MHz)
3.3 V + 10%/– 5% Core, Power Supply, 2.5 V or 3.3 V I/O Supply
ADSP
, ADSC, and ADV Burst Control Pins
Selectable Burst Sequencing Order (Linear/Interleaved)
Internally Self–Timed Write Cycle
Byte Write and Global Write Control
Single–Cycle Deselect
Sleep Mode (ZZ)
100–Pin TQFP Package
PowerPC is a trademark of IBM Corp.
This document contains information on a new product. Specifications and information herein are subject to change without notice.
Order this document
by MCM63P733A/D
MOTOROLA
SEMICONDUCTOR TECHNICAL DATA
MCM63P733A
TQ PACKAGE
TQFP
CASE 983A–01
REV 1 3/24/98
Motorola, Inc. 1998
Page 2
MCM63P733A 2
MOTOROLA FAST SRAM
WRITE
REGISTER
a
WRITE
REGISTER
b
ENABLE
REGISTER
BURST
COUNTER
ADSP
G
CLR
WRITE
REGISTER
c
WRITE
REGISTER
d
SBa
SBb
SBc
SBd
SE3
15
17
SGW
DATA–OUT REGISTER
ENABLE
REGISTER
K2 K
ADDRESS
REGISTER
17
DATA–IN
REGISTER
128K x 32 ARRAY
SE2
LBO
ADV
K
ADSC
SA SA1 SA0
SW
SE1
K
4
32
2
2
K2
DQa – DQd
32
FUNCTIONAL BLOCK DIAGRAM
Page 3
MCM63P733A
3
MOTOROLA FAST SRAM
PIN ASSIGNMENT
71
72
DQc
V
DDQ
NC
69
70
66
67
68
64
65
61
62
63
3738343536 42433940 41 454644
60 59 58 57 56 55 54 53 52 51
31 3233
74
75
76
77
78
79
80
50494847
DQb
DQb
V
SS
DQb
DQb
DQb
DQb V
SS
V
DDQ
DQb
DQb
V
DDQ
V
SS
V
SS
V
DDQ
DQc
DQc DQc DQc DQc
DQc DQc
NC
SASASE1
SBd
K
SBc
ADV
G
SA0
SASASA
SA
NC
NC
NC
LBO
SA1
V
DD
V
DD ZZ DQa
V
SS
DQa
DQa
DQa
DQa
V
SS
V
DDQ
DQa
DQa V
SS V
DDQ
NC
DQa
DQd
V
DD
V
SS
V
SS
V
DDQ
DQd
DQd DQd DQd DQd
73
NC
94 93979695 89889291 90 86858710099 98 81828384
10
9
12
11
15
14
13
17
16
20
19
18
21 22 23 24 25 26 27 28 29 30
7
6
5
4
3
2
1
8
SA
SA
SW
SE2
SE3
VSSV
DD
NC
NC
V
DDQ
V
SS
DQd DQd
NC
SA
SA
SASASA
SA
SA
NC
V
SS
ADSP
ADSC
SGW
SBa
SBb
Page 4
MCM63P733A 4
MOTOROLA FAST SRAM
PIN DESCRIPTIONS
Pin Locations Symbol
Type Description
85 ADSC Input Synchronous Address Status Controller: Active low, interrupts any
ongoing burst and latches a new external address. Used to initiate a READ, WRITE, or chip deselect.
84 ADSP Input Synchronous Address Status Processor: Active low, interrupts any
ongoing burst and latches a new external address. Used to initiate a new READ, WRITE, or chip deselect (exception — chip deselect does not occur when ADSP
is asserted and SE1 is high).
83 ADV Input Synchronous Address Advance: Increments address count in
accordance with counter type selected (linear/interleaved).
(a) 51, 52, 53, 56, 57, 58, 59, 62, 63 (b) 68, 69, 72, 73, 74, 75, 78, 79, 80 (c) 1, 2, 3, 6, 7, 8, 9, 12, 13 (d) 18, 19, 22, 23, 24, 25, 28, 29, 30
DQx I/O Synchronous Data I/O: “x” refers to the byte being read or written
(byte a, b, c, d).
86 G Input Asynchronous Output Enable Input. 89 K Input Clock: This signal registers the address, data in, and all control
signals except G
, LBO, and ZZ.
31 LBO Input Linear Burst Order Input: This pin may be left floating; it will default
as interleaved. Low — linear burst counter (68K/PowerPC). High — interleaved burst counter (486/i960/Pentium).
32, 33, 34, 35, 44, 45, 46,
47, 48, 49, 50, 81, 82, 99, 100
SA Input Synchronous Address Inputs: These inputs are registered and must
meet setup and hold times.
36, 37 SA1, SA0 Input Synchronous Address Inputs: These pins must be wired to the two
LSBs of the address bus for proper burst operation. These inputs are registered and must meet setup and hold times.
93, 94, 95, 96
(a) (b) (c) (d)
SBx Input Synchronous Byte Write Inputs: “x” refers to the byte being written
(byte a, b, c, d). SGW
overrides SBx.
98 SE1 Input Synchronous Chip Enable: Active low to enable chip.
Negated high — blocks ADSP
or deselects chip when ADSC is
asserted. 97 SE2 Input Synchronous Chip Enable: Active high for depth expansion. 92 SE3 Input Synchronous Chip Enable: Active low for depth expansion. 88 SGW Input Synchronous Global Write: This signal writes all bytes regardless of
the status of the SBx
and SW signals. If only byte write signals SBx
are being used, tie this pin high. 87 SW Input Synchronous Write: This signal writes only those bytes that have
been selected using the byte write SBx
pins. If only byte write
signals SBx
are being used, tie this pin low.
64 ZZ Input Sleep Mode: This active high asynchronous signal places the RAM
into the lowest power mode. The ZZ pin disables the RAMs internal
clock when placed in this mode. When ZZ is negated, the RAM
remains in low power mode until it is commanded to READ or
WRITE. Data integrity is maintained upon returning to normal
operation.
15, 41, 65, 91 V
DD
Supply Core Power Supply.
4, 11, 20, 27, 54, 61, 70, 77 V
DDQ
Supply I/O Power Supply.
5, 10, 17, 21, 26, 40,
55, 60, 67, 71, 76, 90
V
SS
Supply Ground.
14, 16, 38, 39, 42, 43, 66 NC No Connection: There is no connection to the chip.
Page 5
MCM63P733A
5
MOTOROLA FAST SRAM
TRUTH TABLE (See Notes 1 through 5)
Next Cycle
Address
Used
SE1 SE2 SE3 ADSP ADSC ADV G
3
DQx Write 2,
4
Deselect None 1 X X X 0 X X High–Z X Deselect None 0 X 1 0 X X X High–Z X Deselect None 0 0 X 0 X X X High–Z X Deselect None X X 1 1 0 X X High–Z X Deselect None X 0 X 1 0 X X High–Z X Begin Read External 0 1 0 0 X X X High–Z X Begin Read External 0 1 0 1 0 X X High–Z READ Continue Read Next X X X 1 1 0 1 High–Z READ Continue Read Next X X X 1 1 0 0 DQ READ Continue Read Next 1 X X X 1 0 1 High–Z READ Continue Read Next 1 X X X 1 0 0 DQ READ Suspend Read Current X X X 1 1 1 1 High–Z READ Suspend Read Current X X X 1 1 1 0 DQ READ Suspend Read Current 1 X X X 1 1 1 High–Z READ Suspend Read Current 1 X X X 1 1 0 DQ READ Begin Write External 0 1 0 1 0 X X High–Z WRITE Continue Write Next X X X 1 1 0 X High–Z WRITE Continue Write Next 1 X X X 1 0 X High–Z WRITE Suspend Write Current X X X 1 1 1 X High–Z WRITE Suspend Write Current 1 X X X 1 1 X High–Z WRITE
NOTES:
1. X = Don’t Care. 1 = logic high. 0 = logic low.
2. Write is defined as either 1) any SBx
and SW low, or 2) SGW is low.
3. G
is an asynchronous signal and is not sampled by the clock K. G drives the bus immediately (t
GLQX
) following G going low.
4. On write cycles that follow read cycles, G
must be negated prior to the start of the write cycle to ensure proper write data setup times.
G
must also remain negated at the completion of the write cycle to ensure proper write data hold times.
ASYNCHRONOUS TRUTH TABLE
Operation ZZ G I/O Status
Read L L Data Out (DQx) Read L H High–Z Write L X High–Z
Deselected L X High–Z
Selected H X High–Z
LINEAR BURST ADDRESS TABLE (LBO = V
SS
)
1st Address (External)
2nd Address (Internal) 3rd Address (Internal) 4th Address (Internal)
X . . . X00 X . . . X01 X . . . X10 X . . . X11 X . . . X01 X . . . X10 X . . . X11 X . . . X00 X . . . X10 X . . . X11 X . . . X00 X . . . X01 X . . . X11 X . . . X00 X . . . X01 X . . . X10
Page 6
MCM63P733A 6
MOTOROLA FAST SRAM
INTERLEAVED BURST ADDRESS TABLE (LBO = V
DD
)
1st Address (External) 2nd Address (Internal) 3rd Address (Internal) 4th Address (Internal)
X . . . X00 X . . . X01 X . . . X10 X . . . X11 X . . . X01 X . . . X00 X . . . X11 X . . . X10 X . . . X10 X . . . X11 X . . . X00 X . . . X01 X . . . X11 X . . . X10 X . . . X01 X . . . X00
WRITE TRUTH TABLE
Cycle Type SGW SW SBa SBb SBc SBd
Read H H X X X X Read H L H H H H Write Byte a H L L H H H Write Byte b H L H L H H Write Byte c H L H H L H Write Byte d H L H H H L Write All Bytes H L L L L L Write All Bytes L X X X X X
ABSOLUTE MAXIMUM RATINGS (See Note 1)
Rating Symbol Value Unit Notes
Power Supply Voltage V
DD
– 0.5 to + 4.6 V
I/O Supply Voltage V
DDQ
VSS – 0.5 to V
DD
V 2
Input Voltage Relative to VSS for Any Pin Except V
DD
Vin, V
out
– 0.5 to VDD + 0.5 V 2
Input Voltage (Three–State I/O) V
IT
– 0.5 to V
DDQ
+ 0.5 V 2
Output Current (per I/O) I
out
± 20 mA
Package Power Dissipation P
D
1.2 W 3
Temperature Under Bias T
bias
– 10 to + 85 °C
Storage Temperature T
stg
– 55 to + 125 °C
NOTES:
1. Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are exceeded. Functional operation should be restricted to RECOMMENDED OPER­ATING CONDITIONS. Exposure to higher than recommended voltages for extended periods of time could affect device reliability.
2. This is a steady–state DC parameter that is in effect after the power supply has achieved its nominal operating level. Power sequencing is not necessary.
3. Power dissipation capability is dependent upon package characteristics and use environment. See Package Thermal Characteristics.
PACKAGE THERMAL CHARACTERISTICS
Rating Symbol Max Unit Notes
Junction to Ambient (@ 200 lfm) Single–Layer Board
Four–Layer Board
R
θJA
40 25
°C/W 1, 2
Junction to Board (Bottom) R
θJB
17 °C/W 3
Junction to Case (Top) R
θJC
9 °C/W 4
NOTES:
1. Junction temperature is a function of on–chip power dissipation, package thermal resistance, mounting site (board) temperature, ambient temperature, air flow, board population, and board thermal resistance.
2. Per SEMI G38–87.
3. Indicates the average thermal resistance between the die and the printed circuit board.
4. Indicates the average thermal resistance between the die and the case top surface via the cold plate method (MIL SPEC–883 Method 1012.1).
This device contains circuitry to protect the inputs against damage due to high static volt­ages or electric fields; however, it is advised that normal precautions be taken to avoid application of any voltage higher than maxi­mum rated voltages to this high–impedance circuit.
Page 7
MCM63P733A
7
MOTOROLA FAST SRAM
DC OPERA TING CONDITIONS AND CHARACTERISTICS
(VDD = 3.3 V + 10%, – 5%, TA = 0 to 70°C, Unless Otherwise Noted)
RECOMMENDED OPERATING CONDITIONS: 2.5 V I/O Supply
(Voltages Referenced to VSS = 0 V)
Parameter Symbol Min Typ Max Unit
Supply Voltage V
DD
3.135 3.3 3.6 V
I/O Supply Voltage V
DDQ
2.375 2.5 2.9 V
Input Low Voltage V
IL
– 0.3 0.7 V
Input High Voltage V
IH
1.7 VDD + 0.3 V
Input High Voltage (I/O Pins) V
IH2
1.7 V
DDQ
+ 0.3 V
Output Low Voltage (IOL = 2 mA) V
OL
0.7 V
Output High Voltage (IOH = – 2 mA) V
OH
1.7 V
RECOMMENDED OPERATING CONDITIONS: 3.3 V I/O Supply (Voltages Referenced to V
SS
= 0 V)
Parameter Symbol Min Typ Max Unit
Supply Voltage V
DD
3.135 3.3 3.6 V
I/O Supply Voltage V
DDQ
3.135 3.3 V
DD
V
Input Low Voltage V
IL
– 0.5 0.8 V
Input High Voltage V
IH
2 VDD + 0.5 V
Input High Voltage (I/O Pins) V
IH2
2 V
DDQ
+ 0.5 V
Output Low Voltage (IOL = 8 mA) V
OL
0.4 V
Output High Voltage (IOH = – 4 mA) V
OH
2.4 V
V
IH
20% t
KHKH
(MIN)
V
SS
VSS – 1.0 V
Figure 1. Undershoot Voltage
Page 8
MCM63P733A 8
MOTOROLA FAST SRAM
SUPPLY CURRENTS
Parameter Symbol Min Typ Max Unit Notes
Input Leakage Current (0 V Vin VDD) I
lkg(I)
± 1 µA 1, 2
Output Leakage Current (0 V Vin V
DDQ
) I
lkg(O)
± 1 µA
AC Supply Current (Device Selected, MCM63P733A–133 All Outputs Open, Freq = Max) MCM63P733A–117 Includes VDD Only MCM63P733A–100
MCM63P733A–90
I
DDA
TBD mA 3, 4, 5
CMOS Standby Supply Current (Device Deselected, Freq = 0, VDD = Max, All Inputs Static at CMOS Levels)
I
SB2
TBD mA 6, 8
Sleep Mode Supply Current (Sleep Mode, Freq = Max, VDD = Max, All Other Inputs Static at CMOS Levels, ZZ VDD – 0.2 V)
I
ZZ
2 mA 2, 7, 8
TTL Standby Supply Current (Device Deselected, Freq = 0, VDD = Max, All Inputs Static at TTL Levels)
I
SB3
TBD mA 6, 9
Clock Running (Device Deselected, MCM63P733A–133 Freq = Max, VDD = Max, All Inputs MCM63P733A–117 Toggling at CMOS Levels) MCM63P733A–100
MCM63P733A–90
I
SB4
TBD mA 3, 4,
5, 6, 8
Static Clock Running (Device Deselected, MCM63P733A–133 Freq = Max, VDD = Max, All Inputs MCM63P733A–117 Static at TTL Levels) MCM63P733A–100
MCM63P733A–90
I
SB5
TBD mA 6, 9
NOTES:
1. LBO
pin has an internal pullup and will exhibit leakage currents of ± 5 µA.
2. ZZ pin has an internal pulldown and will exhibit leakage currents of ± 5 µA.
3. Reference AC Operating Conditions and Characteristics for input and timing.
4. All addresses transition simultaneously low (LSB) then high (MSB).
5. Data states are all zero.
6. Device is deselected as defined by the Truth Table.
7. Device in Sleep Mode as defined by the Asynchronous Truth T able.
8. CMOS levels for I/O’s are VIT VSS + 0.2 V or V
DDQ
– 0.2 V . CMOS levels for other inputs are Vin VSS + 0.2 V or VDD – 0.2 V.
9. TTL levels for I/O’s are VIT VIL or V
IH2
. TTL levels for other inputs are Vin VIL or VIH.
CAPACITANCE (f = 1.0 MHz, dV = 3.0 V, T
A
= 0 to 70°C, Periodically Sampled Rather Than 100% Tested)
Parameter
Symbol Min Typ Max Unit
Input Capacitance C
in
4 5 pF
Input/Output Capacitance C
I/O
7 8 pF
Page 9
MCM63P733A
9
MOTOROLA FAST SRAM
AC OPERA TING CONDITIONS AND CHARACTERISTICS
(VDD = 3.3 V + 10%, – 5%, TA = 0 to 70°C, Unless Otherwise Noted)
Input Timing Measurement Reference Level 1.25 V. . . . . . . . . . . . . .
Input Pulse Levels 0 to 2.5 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input Rise/Fall Time 1.0 V/ns (20 to 80%). . . . . . . . . . . . . . . . . . . . . .
Output Timing Reference Level 1.25 V. . . . . . . . . . . . . . . . . . . . . . . . .
Output Load See Figure 2 Unless Otherwise Noted. . . . . . . . . . . . . .
READ/WRITE CYCLE TIMING (See Notes 1 through 4)
63P733A–133
133 MHz
63P733A–117
117 MHz
63P733A–100
100 MHz
63P733A–90
90 MHz
Parameter Symbol
Min Max Min Max Min Max Min Max
Unit Notes
Cycle Time t
KHKH
7.5 8.5 10 11 ns
Clock High Pulse Width t
KHKL
3 3.4 4 4.4 ns
Clock Low Pulse Width t
KLKH
3 3.4 4 4.4 ns
Clock Access Time t
KHQV
4 4.2 4.5 5 ns
Output Enable to Output Valid
t
GLQV
3.8 3.8 4.5 5 ns
Clock High to Output Active
t
KHQX1
0 0 0 0 ns 5, 6
Clock High to Output Change
t
KHQX2
1.5 1.5 1.5 1.5 ns 6
Output Enable to Output Active
t
GLQX
0 0 0 0 ns 5, 6
Output Disable to Q High–Z
t
GHQZ
3.8 3.8 4.5 5 ns 5, 6
Clock High to Q High–Z t
KHQZ
1.5 7.5 1.5 8.5 1.5 10 1.5 11 ns 5, 6
Setup Times: Address
ADSP
, ADSC, ADV
Data In
Write
Chip Enable
t
ADKH
t
ADSKH t
DVKH
t
WVKH
t
EVKH
2 2 2 2 ns
Hold Times: Address
ADSP
, ADSC, ADV
Data In
Write
Chip Enable
t
KHAX
t
KHADSX
t
KHDX
t
KHWX
t
KHEX
0.5 0.5 0.5 0.5 ns
Sleep Mode Standby t
ZZS
2 x
t
KHKH
2 x
t
KHKH
2 x
t
KHKH
2 x
t
KHKH
ns
Sleep Mode Recovery t
ZZREC
2 x
t
KHKH
2 x
t
KHKH
2 x
t
KHKH
2 x
t
KHKH
ns
Sleep Mode High to Q High–Z
t
ZZQZ
15 15 15 15 ns
NOTES:
1. Write is defined as either any SBx
and SW low or SGW is low. Chip Enable is defined as SE1 low , SE2 high, and SE3 low whenever ADSP
or ADSC is asserted.
2. All read and write cycle timings are referenced from K or G
.
3. G
is a don’t care after write cycle begins. To prevent bus contention, G should be negated prior to start of write cycle.
4. In order to reduce test correlation issues and to reduce the effects of application specific input edge rate variations on correlation between data sheet parameters and actual system performance, FSRAM AC parametric specifications are always specified at V
DDQ
/2. In some design exercises, it is desirable to evaluate timing using other reference levels. Since the maximum test input edge rate is known and is given in the AC Test Conditions section of the data sheet as 1 V/ns, one can easily interpolate timing values to other reference levels.
5. This parameter is sampled and not 100% tested.
6. Measured at
± 200 mV from steady state.
Page 10
MCM63P733A 10
MOTOROLA FAST SRAM
OUTPUT
Z0 = 50
RL = 50
1.25 V
Figure 2. AC Test Load
Figure 3. Lumped Capacitive Load and Typical Derating Curve
2000
1600
1200
800
400
0
LUMPED CAP ACITANCE, CL (pF)
100806040200
C
L
CLOCK ACCESS TIME DELAY (ps)
OUTPUT
2400
200
600
1800
1400
1000
2200
Page 11
MCM63P733A
11
MOTOROLA FAST SRAM
(c) Pull–Down
VOLTAGE (V)
PULL–DOWN
I (mA) MIN I (mA) MAX
– 0.5
0
0.4
0.8
1.25
1.6
2.8
3.2
3.4
0
0 10 20 31 40 40 40 40
0
0 20 40 63 80 80 80 80
Figure 4. Typical Output Buffer Characteristics
V
DD
1.6
1.25
0.3
0
040 80
CURRENT (mA)
VOLTAGE (V)
(b) Pull–Up: V
DDQ
= 3.3 V
VOLTAGE (V)
PULL–UP
I (mA) MIN I (mA) MAX
– 0.5
0
1.4
1.65
2.0
3.135
3.6
– 40 – 40 – 40 – 37 – 28
0 0
– 120 – 120 – 120 – 108
– 81 – 20
0
3.135
2.8
1.65
1.4
0
0
– 40
CURRENT (mA)
VOLTAGE (V)
3.6
– 120– 80
(a) Pull–Up for V
DDQ
= 2.5 V
VOLTAGE (V)
PULL–UP
I (mA) MIN I (mA) MAX
– 0.5
0
0.8
1.25
1.5
2.3
2.7
2.9
– 38 – 38 – 38 – 30
– 27
0 0 0
– 105 – 105 – 105
– 83 – 75
– 40 – 15
0
2.9
2.5
2.3
1.25
0.8
0
0 – 40 – 105
CURRENT (mA)
VOLTAGE (V)
Page 12
MCM63P733A 12
MOTOROLA FAST SRAM
BURST READSINGLE READ
ADSC
t
KHKL
t
KHKH
DQx
E
K
ADSP
ADV
Q(A)Q(n)
BURST WRITE
ADSP, SA
SA
AB
t
KLKH
CD
SE1
W
Q(B) Q(B+1)
t
KHQV
BURST WRAPS AROUND
Q(B+2) Q(B+3)
Q(B) D(C) D(C+1) D(C+2) D(C+3) Q(D)
t
KHQV
DESELECTED SINGLE READ
SE2, SE3
IGNORED
G
t
KHQZ
t
KHQX1
t
KHQX2
t
GHQZ
t
GLQX
W low = SGW low and / or SW and SBx low.
NOTE: E low = SE2 high and SE3 low.
READ/WRITE CYCLES
Page 13
ZZ
E
K
ADS
ADV
SLEEP MODE TIMING
W
G
t
ZZQZ
ADS high = both ADSC, ADSP high.
NOTE: ADS low = ADSC low or ADSP low.
IDD
t
ZZS
t
ZZREC
E low = SE1 low, SE2 high, SE3 low.
ADDR
DQ
NORMAL OPERATION
NO READS OR
WRITES ALLOWED
IN SLEEP MODE
NO NEW READS OR
WRITES ALLOWED
NORMAL OPERATION
I
ZZ
I (max) specifications will not be met if inputs toggle.
ZZ
MCM63P733A
13
MOTOROLA FAST SRAM
Page 14
MCM63P733A 14
MOTOROLA FAST SRAM
APPLICATION INFORMATION
SLEEP MODE
A sleep mode feature, the ZZ pin, has been implemented on the MCM63P733A. It allows the system designer to place the RAM in the lowest possible power condition by asserting ZZ. The sleep mode timing diagram shows the different modes of operation: Normal Operation, No READ/WRITE Allowed, and Sleep Mode. Each mode has its own set of constraints and conditions that are allowed.
Normal Operation: All inputs must meet setup and hold times prior to sleep and t
ZZREC
nanoseconds after re­covering from sleep. Clock (K) must also meet cycle, high, and low times during these periods. Two cycles prior to sleep, initiation of either a read or write operation is not allowed.
No READ/WRITE: During the period of time just prior to sleep and during recovery from sleep, the assertion of either ADSC
, ADSP, or any write signal is not allowed. If a write operation occurs during these periods, the memory array may be corrupted. Validity of data out from the RAM can not be guaranteed immediately after ZZ is asserted (prior to being in sleep).
Sleep Mode: The RAM automatically deselects itself. The
RAM disconnects its internal clock buffer . The external clock
may continue to run without impacting the RAMs sleep cur­rent (IZZ). All inputs are allowed to toggle — the RAM will not be selected and perform any reads or writes. However, if inputs toggle, the IZZ (max) specification will not be met.
NON–BURST SYNCHRONOUS OPERATION
Although this BurstRAM has been designed for PowerPC — and other high end MPU–based systems, these SRAMs can be used in other high speed L2 cache or memory applications that do not require the burst address feature. Most L2 caches designed with a synchronous interface can make use of the MCM63P733A. The burst counter feature of the BurstRAM can be disabled, and the SRAM can be con­figured to act upon a continuous stream of addresses. See Figure 4.
CONTROL PIN TIE VALUES EXAMPLE
(H VIH, L VIL)
Non–Burst
ADSP ADSC ADV SE1 SE2 LBO
Sync Non–Burst, Pipelined SRAM
H L H L H X
NOTE: Although X is specified in the table as a don’t care, the pin
must be tied either high or low.
WRITESREADS
DQ
K
Q(B)Q(A)
ADDR A B CD EFGH
W
Q(D)Q(C) D(F)D(E) D(H)D(G)
G
Figure 5. Example Configuration as Non–Burst Synchronous SRAM
SE3
MCM 63P733A XX X X
Motorola Memory Prefix Part Number
Full Part Numbers — MCM63P733ATQ133 MCM63P733ATQ117 MCM63P733ATQ100 MCM63P733ATQ90
MCM63P733ATQ133R MCM63P733A TQ117R MCM63P733ATQ100R MCM63P733ATQ90R
Package (TQ = TQFP)
Blank = Trays, R = Tape and Reel Speed (133 = 133 MHz, 117 = 117 MHz,
100 = 100 MHz, 90 = 90 MHz)
ORDERING INFORMATION
(Order by Full Part Number)
Page 15
MCM63P733A
15
MOTOROLA FAST SRAM
P ACKAGE DIMENSIONS
TQ PACKAGE
100–PIN TQFP
CASE 983A–01
DIM MIN MAX MIN MAX
INCHESMILLIMETERS
A ––– 1.60 ––– 0.063 A1 0.05 0.15 0.002 0.006 A2 1.35 1.45 0.053 0.057
b 0.22 0.38 0.009 0.015 b1 0.22 0.33 0.009 0.013
c 0.09 0.20 0.004 0.008 c1 0.09 0.16 0.004 0.006
D 22.00 BSC 0.866 BSC
E 16.00 BSC 0.630 BSC E1 14.00 BSC 0.551 BSC
e 0.65 BSC 0.026 BSC
L 0.45 0.75 0.018 0.030 L1 1.00 REF 0.039 REF L2 0.50 REF
S 0.20 ––– 0.008 ––– R1 0.08 ––– 0.003 ––– R2 0.08 0.20 0.003 0.008
q
0 7 0 7
q
0 ––– 0 –––
q
11 13 11 13
q
11 13 11 13
1 2 3
D1 20.00 BSC 0.787 BSC
0.020 REF
_ _ _ _
_ _
_
_ _ _ _
_ _
_
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DATUM PLANE –H– IS LOCATED AT BOTTOM OF LEAD AND IS COINCIDENT WITH THE LEAD WHERE THE LEAD EXITS THE PLASTIC BODY AT THE BOTTOM OF THE PARTING LINE.
4. DATUMS –A–, –B– AND –D– TO BE DETERMINED AT DATUM PLANE –H–.
5. DIMENSIONS D AND E TO BE DETERMINED AT SEATING PLANE –C–.
6. DIMENSIONS D1 AND E1 DO NOT INCLUDE MOLD PROTRUSION. ALLOWABLE PROTRUSION IS 0.25 (0.010) PER SIDE. DIMENSIONS D1 AND B1 DO INCLUDE MOLD MISMATCH AND ARE DETERMINED AT DATUM PLANE –H–.
7. DIMENSION b DOES NOT INCLUDE DAMBAR PROTRUSION. DAMBAR PROTRUSION SHALL NOT CAUSE THE b DIMENSION TO EXCEED 0.45 (0.018).
A–B0.20 (0.008) H
e
D
A–B0.20 (0.008)
C D
A–B0.20 (0.008)
C D
0.10 (0.004)
C
0.25 (0.010)
S
0.05 (0.002)
S
A–B
M
0.13 (0.005) D
S
C
e/2
D/2
E
E1
D1
D
D1/2
E1/2
E/2
4X
2X 30 TIPS
2X 20 TIPS
–D–
–B–
–A–
–C–
–H–
q
1
q
3
q
2
q
100
81
80 51
50
31
301
PLATING
SECTION B–B
c1
c
b
b1
ÉÉÉ
BASE
METAL
A
SEATING PLANE
VIEW AB
S
VIEW AB
A2
A1
R1
L2
L
L1
R2
GAGE PLANE
–X–
VIEW Y
B B
X=A, B, OR D
Page 16
MCM63P733A 16
MOTOROLA FAST SRAM
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MCM63P733A/D
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