Datasheet MAS9264T95LD, MAS9264T95LC, MAS9264T95LB, MAS9264T95FS, MAS9264T95FE Datasheet (DYNEX)

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The MA9264 64k Static RAM is configured as 8192x8 bits and
manufactured using CMOS-SOS high performance, radiation hard,
1.5µm technology. The design uses a 6 transistor cell and has full static operation with
no clock or timing strobe required. Address input buffers are deselected when chip select is in the HIGH state.
See Application Note “Overview of the Dynex Semiconductor
Radiation Hard 1.5µm CMOS/SOS SRAM Range”.
FEATURES
1.5µm CMOS-SOS Technology
Latch-up Free
Fast Access Time 70ns Typical
Total Dose 10
6
Rad(Si)
Transient Upset >10
11
Rad(Si)/sec
SEU 4.3 x 10
-11
Errors/bitday
Single 5V Supply
Three State Output
Low Standby Current 100µA Typical
-55°C to +125°C Operation
All Inputs and Outputs Fully TTL or CMOS
Compatible
Fully Static Operation
Operation Mode CS CE OE WE I/O Power
Read L H L H D OUT Write L H X L D IN ISB1
Output Disable L H H H High Z
Standby H X X X High Z ISB2
XLXX X
Figure 1: Truth Table
Figure 2: Block Diagram
A12
A9 A8
A4 A3
A6 A5
A7
A D D R E S S
B U F F E R
R O W
D E C O D E R
A10 A0 A1 A2 A11
CS
CE
WE
OE
MA9264
Radiation Hard 8192x8 Bit Static RAM
Replaces June 1999 version, DS3692-6.0 DS3692-7.0 January 2000
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SIGNAL DEFINITIONS
A0-12
Address input pins which select a particular eight bit word within the memory array.
D0-7
Bidirectional data pins which serve as data outputs during a read operation and as data inputs during a write operation.
CS
Chip Select, which, at low level, activates a read or write operation. When at a high level it defaults the SRAM to a prechargencondition and holds the data output drivers in a high impedance state.
WE
Write Enable which when at a low level enables a write and holds data output drivers in a high impedance state. When at a high level, it enables a read.
OE
Output Enable which when at a high level holds the data output drivers in a high impedance state. When at a low level, data output driver state is defined by CS, WE and CE. If this signal is not used it must be connected to VSS.
CE
Chip Enable which when at a high level allows normal operation. When at a low level it defaults the SRAM to a precharge condition, disables the input circuits on all input pins and holds the data output drivers in a high impedance state. If this signal is not used it must be connected to VDD.
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CHARACTERISTICS AND RATINGS
Symbol Parameter Min. Max. Units
V
CC
Supply Voltage -0.5 7.0 V
V
I
Input Voltage -0.3 VDD+0.3 V
T
A
Operating Temperature -55 125 °C
T
S
Storage Temperature -65 150 °C
Figure 3: Absolute Maximum Ratings
Stresses above those listed may cause permanent damage to the device. This is a stress rating only and functlonal operation of the device at these condltions, or at any other condition above those indicated in the operations section of this specification, is not Implied Exposure to absolute maxlmum rating conditions for extended perlods may affect device reliability.
Notes for Tables 4 and 5: Characteristics apply to pre radiation at T
A
= -55°C to +125°C with VDD = 5V ±10% and to post 100k Rad(Si) total dose radiation at TA = 25°C with VDD = 5V ±10% (characteristics at higher radiation levels available on request). GROUP A SUBGROUPS 1, 2, 3.
Symbol Parameter Conditions (Option) Min. Typ. Max. Units
V
DD
Supply voltage - 4.5 5.0 5.5 V
V
lH
Logical ‘1’ Input Voltage - (TTL) VDD/2 - V
DD
V
(CMOS) 0.8 V
DD
-VDDV
V
lL
Logical ‘0’ Input Voltage - (TTL) V
SS
- 0.8 V
(CMOS) V
SS
- 0.2 V
DD
V
V
OH1
Logical ‘1’ Output Voltage I
OH1
= -2mA 2.4 - - V
V
OH2
Logical ‘1’ Output Voltage I
OH2
= -1mA V
DD
-0.5 - - V
V
OL
Logical ‘0’ Output Voltage IOL = 4mA - - 0.4 V
I
LI
Input Leakage Current VIN = VDD or VSS All inputs - - ±10 µA
I
LO
Output Leakage Current Chip disabled, V
OUT
= VDD or V
SS
--±10 µA
I
SB1
Selected Static Current (CMOS) All inputs = V
DD
-0.2V - 0.1 10 mA
except CS = V
SS
+0.2V
I
DD
Dynamic Operating Current fRC = 1MHz, all inputs - 6 18 mA (CMOS) switching, VIH = V
DD
-0.2V
I
SB2
Standby Supply Current CS = V
DD
-0.2V - 0.1 10 mA
CE = V
SS
+0.2V
Figure 4: Electrical Characteristics
Symbol Parameter Conditions (Option) Min. Typ. Max. Units
V
DR
VCC for Data Retention CS = V
DR,
CE = V
SS
2.0 - - V
I
DDR
Data Retention Current CS = VDR, VDR = 2.0V - 0.05 4 mA
CE = V
SS
Figure 5: Data Retention Characteristics
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AC CHARACTERISTICS
Conditions of Test for Tables 5 and 6:
1. Input pulse = VSS to 3.0V (TTL) and VSS to 4.0V (CMOS).
2. Times measurement reference level = 1.5V.
3. Input Rise and Fall times 5ns.
4. Output load 1TTL gate and CL = 60pF.
5. Transition is measured at ±500mV from steady state.
6. This parameter is sampled and not 100% tested. Notes for Tables 6 and 7:
Characteristics apply to pre-radiation at TA = -55°C to +125°C with V
DD
= 5V±10% and to post 100k Rad(Si) total dose radiation
at TA = 25°C with VDD = 5V ±10%. GROUP A SUBGROUPS 9, 10, 11.
MAX9264X70 MAX9264X95
Symbol Parameter Min Max Min Max Units
T
AVAVR
Read Cycle Time 70 - 95 - ns
T
AVQV
Address Access Time - 65 - 90 ns
T
EHQV
Chip Select Access Time - 70 - 95 ns
T
SLQV
Chip Enable Access Time - 70 - 95 ns
T
EHQX
(5,6) Chip Selection to Output in Low Z 15 - 15 - ns
T
SLQX
(5,6) Chip Enable to Output in Low Z 15 - 15 - ns
T
ELQZ
(5,6) Chip Deselection to Output in High Z 0 20 0 20 ns
T
SHQZ
(5,6) Chip Disable to Output in High Z 0 20 0 20 ns
T
AXQX
Output Hold from Address Change 30 - 40 - ns
T
GLQV
Output Enable Access Time - 25 - 30 ns
T
GLQX
(5,6) Output Enable to Output in Low Z 15 - 15 - ns
T
GHQZ
(5,6) Output Enable to Output in High Z 0 20 0 20 ns
Figure 6: Read Cycle AC Electrical Characteristics
MAX9264X70 MAX9264X95
Symbol Parameter Min Max Min Max Units
T
AVAVW
Write Cycle Tlme 55 - 60 - ns
T
EHWH
Chip Selection to End of Write 50 - 60 - ns
T
SLWH
Chip Enable to End of Write 50 - 60 - ns
T
AVWH
Address Valid to End of Write 50 - 55 - ns
T
AVWL
Address Set Up Time 0 - 0 - ns
T
WLWH
Write Pulse Width 40 - 45 - ns
T
WHAV
Write Recovery Time 0 - 0 - ns
T
WLQZ
(5,6) Wnte to Output in High Z 0 20 0 20 ns
T
DVWH
Data to Write Time Overlap 25 - 30 - ns
T
WHDX
Data Hold from Write 0 - 0 - ns
T
WHQX
(5,6) Output Active from End to Write 0 20 0 20 ns
Figure 7: Write Cycle AC Electrical Characteristics
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Symbol Parameter Conditions Min. Typ. Max. Units
C
IN
Input Capacitance Vl = 0V - 3 5 pF
C
OUT
Output Capacitance V
I/O
= 0V - 5 7 pF
Note: T
A
= 25°C and f = 1MHz. Data obtained by characterisation or analysis; not routinely measured.
Figure 8: Capacitance
Symbol Parameter Conditions
F
T
Basic Functionality VDD = 4.5V - 5.5V, FREQ = 1MHz
VIL = VSS, VIH = VDD, VOL 1.5V, VOH 1.5V TEMP = -55°C to +125°C, GPS PATTERN SET GROUP A SUBGROUPS 7, 8A, 8B
Figure 9: Functionality
Subgroup Definition
1 Static characteristics specified in Tables 4 and 5 at +25°C 2 Static characteristics specified in Tables 4 and 5 at +125°C 3 Static characteristics specified in Tables 4 and 5 at -55°C
7 Functional characteristics specified in Table 9 at +25°C 8A Functional characteristics specified in Table 9 at +125°C 8B Functional characteristics specified in Table 9 at -55°C
9 Switching characteristics specified in Tables 6 and 7 at +25°C 10 Switching characteristics specified in Tables 6 and 7 at +125°C 11 Switching characteristics specified in Tables 6 and 7 at -55°C
Figure 10: Definition of Subgroups
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TIMING DIAGRAMS
Figure 11b: Read Cycle 2
Figure 11a: Read Cycle 1
1. WE is high for Read Cycle.
2. Device is continually selected. CS, OE low, CE high.
1.
WE is high for Read Cycle.
2. Address Vaild prior to or coincident with CS transition low or CE transition high.
T
AVAVR
T
AVQV
T
AXQX
T
SLQV
T
SLQX
T
SHQZ
ADDRESS
CS
DATA OUT
HIGH
IMPEDANCE
DATA VALID
T
EHQX
T
EHQV
T
ELQZ
CE
T
GLQX
T
GLQV
T
GHQZ
OE
T
AVAVR
T
AVQV
T
AXQX
ADDRESS
DATA OUT
DATA VALID
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Figure 12: Write Cycle
ADDRESS
T
AVAVW
T
AVWH
T
AVWL
T
WLWH (2)
T
WHAV (3)
(4)
T
WLQZ
WE
T
AXQX
T
WLQX
DATA OUT
(6) (7)
HIGH
IMPEDANCE
DATA VALIDDATA IN
T
DVWH
T
WHDX
T
SLWH
T
EHWH
CS
CE
(5)
(8)
1. WE must be high during all address transitions.
2. A write occurs during the overlap (T
WLWH
) of a low CS, a high CE and a low WE.
3. T
WHAV
is measured from either CS or WE going high or CE going low, whichever is the earlier, to the end
of the write cycle.
4. If the CS low or CE high transition occurs simultaneously with, or after, the WE low transition, the output remains in the high impedance state.
5. DATA OUT is in the active state, so DATA IN must not be in the opposing state.
6. DATA OUT is the write data of the current cycle, if selected.
7. DATA OUT is the read data of the next address,if selected.
8. OE is low. (If OE is high then DATA OUT remains in the high impedance state throughout the cycle).
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TYPICAL PERFORMANCE CHARACTERISTICS MAx9264x70
55
53
51
49
47
45
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MA9264
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72
68
64
60
56
52
48
44
40
64
62
60
58
56
54
52
50
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MA9264
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25
20
15
10
5
16
14
12
10
8
6
4
2
58 57 56 55 54 53 52 51 50 49 48
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OUTLINES AND PIN ASSIGNMENTS
Figure 13: 28-Lead Ceramic DIL (Solder Seal) - Package Style C
D
W
A
e b Z
H
A
1
15°
M
E
C
e
1
Seating Plane
114
2815
28
VCC
27
W
26
CE
25
A8
24
A9
23
A11
22
OE
21
A10
20
CS
19
D/Q7
18
D/Q6
17
D/Q5
16
D/Q4
15
D/Q3
1
NC
2
A12
3
A7
4
A6
5
A5
6
A4
7
A3
8
A2
9
A1
10
A0
11
D/Q0
12
D/Q1
13
D/Q2
14
GND
Top
View
Ref
Millimetres Inches
Min. Nom. Max. Min. Nom. Max.
A - - 5.715 - - 0.225
A1 0.38 - 1.53 0.015 - 0.060
b 0.35 - 0.59 0.014 - 0.023 c 0.20 - 0.36 0.008 - 0.014
D - - 36.02 - - 1.418
e - 2.54 Typ. - - 0.100 Typ. -
e1 - 15.24 Typ. - - 0.600 Typ. -
H 4.71 - 5.38 0.185 - 0.212
Me - - 15.90 - - 0.626
Z - - 1.27 - - 0.050
W - - 1.53 - - 0.060
XG404
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Figure 14: 28-Lead Ceramic Flatpack (Solder Seal) - Package Style F
Ref
Millimetres Inches
Min. Nom. Max. Min. Nom. Max.
A - - 3.18 - - 0.125 Q 0.66 - - 0.026 - -
b 0.38 - 0.48 0.015 - 0.019 c 0.10 - 0.18 0.004 - 0.007
D 18.08 - 18.49 0.712 - 0.728
e - 1.27 - - 0.050 ­L 7.62 - 9.91 0.300 - 0.390
M 12.50 - 12.09 0.492 - 0.508
XG530
M
b
e
D
L
A
Q
c
Pin 1
Z
M
E
1NC 2 A12 3A7 4A6 5A5 6A4 7A3 8A2
9A1 10 A0 11 D/Q0 12 D/Q1 13 D/Q2 14 GND
28
VCC
27
W
26
CE
25
A8
24
A9
23
A11
22
OE
21
A10
20
CS
19
D/Q7
18
D/Q6
17
D/Q5
16
D/Q4
15
D/Q3
Bottom
View
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Function Pin N umber
Option D and F
Via Static1Static2Dynamic Radiation
A12 2 R 5V 0V F14 5V
A7 3 R 5V 0V F7 5V A6 4 R 5V 0V F9 5V A5 5 R 5V 0V F8 5V A4 6 R 5V 0V F11 5V A3 7 R 5V 0V F10 5V A2 8 R 5V 0V F5 5V A1 9 R 5V 0V F4 5V
A0 10 R 5V 0V F3 5V D/Q0 11 R 5V 0V F1 5V D/Q1 12 R 5V 0V F1 5V D/Q2 13 R 5V 0V F1 5V
GND(VSS ) 14 Direct 0V 0V 0V 0V
D/Q3 15 R 5V 0V F1 5V D/Q4 16 R 5V 0V F1 5V D/Q5 17 R 5V 0V F1 5V D/Q6 18 R 5V 0V F1 5V D/Q7 19 R 5V 0V F1 5V
CSB 20 R 5V 0V F15 5V
A10 21 R 5V 0V F2 5V
OEB 22 R 5V 0V F15 5V
A11 23 R 5V 0V F6 5V
A9 24 R 5V 0V F13 5V
A8 25 R 5V 0V F12 5V
CE 26 R 5V 0V F15B 5V
WB 27 R 5V 0V F0 5V
VDD 28 Direct 5V 5V 5V 5V
1. F0=150KHz, F1=F0/2, F2=F0/4, F3=F0/8 etc.
2. Static 1, Static 2 and Dynamic: R=4k7.
3. Radiation: R=10k.
Figure 15: Burnin and Radiation Configuration
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RADIATION TOLERANCE
Total Dose Radiation Testing
For product procured to guaranteed total dose radiation levels, each wafer lot will be approved when all sample devices from each lot pass the total dose radiation test.
The sample devices will be subjected to the total dose radiation level (Cobalt-60 Source), defined by the ordering code, and must continue to meet the electrical parameters specified in the data sheet. Electrical tests, pre and post irradiation, will be read and recorded.
Dynex Semiconductor can provide radiation testing compliant with MIL-STD-883 test method 1019, Ionizing Radiation (Total Dose).
Ion LET (MeV.cm2/mg)
UPSET BIT CROSS-SECTION (cm2/bit)
Figure 17: Typical Per-Bit Upset Cross-Section vs Ion LET
SINGLE EVENT UPSET CHARACTERISTICS
Total Dose (Function to specification)* 1x105 Rad(Si) Transient Upset (Stored data loss) 5x10
10
Rad(Si)/sec Transient Upset (Survivability) >1x1012 Rad(Si)/sec Neutron Hardness (Function to specification) >1x1015 n/cm
2
Single Event Upset** 4.3x10
-11
Errors/bit day
Latch Up Not possible
* Other total dose radiation levels available on request ** Worst case galactic cosmic ray upset - interplanetary/high altitude orbit
Figure 16: Radiation Hardness Parameters
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ORDERING INFORMATION
For details of reliability, QA/QC, test and assembly options, see ‘Manufacturing Capability and Quality Assurance Standards’ Section 9.
Unique Circuit Designator
S R Q
Radiation Hard Processing 100 kRads (Si) Guaranteed 300 kRads (Si) Guaranteed
For radiation levels above thos
e
stated please contact Marketing
Radiation Tolerance
C F L N
Ceramic DIL (Solder Seal) Flatpack (Solder Seal) Leadless Chip Carrier Naked Die
Package Type
QA/QCI Process
(See Section 9 Part 4)
Test Process
(See Section 9 Part 3)
Assembly Process
(See Section 9 Part 2)
L C D E B S
Rel 0 Rel 1 Rel 2 Rel 3/4/5/STACK Class B Class S
Reliability Level
MAx9264xxxxxxxx
TCTTL
CMOS
709570ns Speed
95ns Speed
CUSTOMER SERVICE CENTRES
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SALES OFFICES
France, Benelux, Italy and Spain Tel: +33 (0)1 69 18 90 00. Fax: +33 (0)1 64 46 54 50 Germany Tel: 07351 827723 North America Tel: (613) 723-7035. Fax: (613) 723-1518. Toll Free: 1.888.33.DYNEX (39639) /
Tel: (831) 440-1988. Fax: (831) 440-1989 / Tel: (949) 733-3005. Fax: (949) 733-2986. UK, Germany, Scandinavia & Rest Of W orld Tel: +44 (0)1522 500500. Fax: +44 (0)1522 500020 These offices are supported by Representatives and Distributors in many countries world-wide. © Dynex Semiconductor 2000 Publication No. DS3692-7 Issue No. 7.0 January 2000 TECHNICAL DOCUMENTATION – NOT FOR RESALE. PRINTED IN UNITED KINGDOM
HEADQUARTERS OPERATIONS
DYNEX SEMICONDUCTOR LTD
Doddington Road, Lincoln. Lincolnshire. LN6 3LF. United Kingdom. Tel: 00-44-(0)1522-500500 Fax: 00-44-(0)1522-500550
DYNEX POWER INC.
Unit 7 - 58 Antares Drive, Nepean, Ontario, Canada K2E 7W6. Tel: 613.723.7035 Fax: 613.723.1518 Toll Free: 1.888.33.DYNEX (39639)
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All brand names and product names used in this publication are trademarks, registered trademarks or trade names of their respective owners.
http://www.dynexsemi.com
e-mail: power_solutions@dynexsemi.com
Datasheet Annotations:
Dynex Semiconductor annotate datasheets in the top right hard corner of the front page, to indicate product status. The annotations are as follows:­Target Information: This is the most tentative form of information and represents a very preliminary specification. No actual design work on the product has been
started.
Preliminary Information: The product is in design and development. The datasheet represents the product as it is understood but details may change. Advance Information: The product design is complete and final characterisation for volume production is well in hand.
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