Datasheet M95256-WMW1T, M95256-WMW1, M95256-WBN6, M95256-WBN5, M95256-VMW6 Datasheet (SGS Thomson Microelectronics)

...
1/21
PRELIMINARY DATA
March 2000
This is preliminary information on a new product now in development or undergoing evaluation. Details are subject to change without notice.
M95256 M95128
256/128 Kbit Serial SPI Bus EEPROM
With High Speed Clock
Supports Positive Clock SPI Modes
5 MHz Clock Rate (maximum)
Single Supply Voltage:
– 4.5V to 5.5V for M95xxx – 2.7V to 3.6V for M95xxx-V – 2.5V to 5.5V for M95xxx-W – 1.8V to 3.6V for M95xxx-R
Status Register
Hardware and Software Protection of the Status
Register
BYTE and PAGE WRITE (up to 64 Bytes)
Self-Tim ed P ro gr a m ming Cycle
Resizeable Read-Only EEPROM Area
Enhanced ESD Protection
100,000 Erase/Write Cycles (minimum)
40 Year Data Retention (minimum)
DESCRIPTION
These SPI-compatible electrically erasable programmable memory (EEPROM) devices are organized as 32K x 8 bits (M9525 6) and 16K x 8 bits (M95128), and operate down to 2.7 V (for the
Figure 1. Logic Diagram
AI01789C
S
V
CC
M95xxx
HOLD
V
SS
W
Q
C
D
Table 1. Signal Names
C Serial Clock D Serial Data Input Q Serial Data Output
S
Chip Select
W
Write Protect
HOLD
Hold
V
CC
Supply Voltage
V
SS
Ground
PSDIP8 (BN)
0.25 mm frame
SO8 (MN)
150 mil width
TSSOP14 (DL)
169 mil width
8
1
8
1
14
1
SO8 (MW)
200 mil width
8
1
M95256, M95128
2/21
-V version), 2.5 V (for the -W version), and down to 1.8 V (for the -R version of each device).
The M95256 and M 95128 are available in Plastic Dual-in-Line, Plastic Small Outline and Thin Shrink Small Outline packages.
Each memory device is accessed by a simple serial interface that is SPI bus compatible. The bus signals are C, D and Q, as shown in Table 1 and Figure 3.
The device is selected when t he chip select input (S
) is held low. Communications with the chip can
be interrupted using the hold input (HOLD
).
Figure 2A. DIP Connections
Figure 2B. SO C on ne ct i on s
DV
SS
C
HOLDQ
SV
CC
W
AI01790C
M95xxx
1 2 3 4
8 7 6 5
1
AI01791C
2 3 4
8 7 6 5
DV
SS
C
HOLDQ
SV
CC
W
M95xxx
Figure 2C. TSSOP Connections
Note: 1. NC = Not Connected
1
AI02346
2 3 4
14
9
10
8
DV
SS
WC
S
HOLD
M95128
NC
Q
NC
NC NC
NC
NC
5 6 7
12
13
11
V
CC
Table 2. Absolute Maximum Ratings
1
Note: 1. Except for the rating “Operating Tempera ture Range”, stres ses above th ose listed i n the Tabl e “Absolute Maxim um Ratings” may
cause permanent damage to the device. These are stress ratings only, and operation of the device at these or any other conditions above those indicated in the Operating sections of this specification is not implied. Exposure to Absolute Maximum Rating conditions for extended periods may affect device reliability. Refer also to the ST SURE Program and other relevant quality document s.
2. M IL-STD-883C, 3015.7 (100 pF, 1500 Ω)
Symbol Parameter Value Unit
T
A
Ambient Operating Temperature -40 to 125 °C
T
STG
Storage Temperature -65 to 150 °C
T
LEAD
Lead Temperature during Soldering
PSDIP8: 10 sec SO8: 40 sec TSSOP14: t.b.c.
260 215
t.b.c.
°C
V
O
Output Voltage Range
-0.3 to V
CC
+0.6
V
V
I
Input Voltage Range -0.3 to 6.5 V
V
CC
Supply Voltage Range -0.3 to 6.5 V
V
ESD
Electrostatic Discharge Voltage (Human Body model)
2
4000 V
3/21
M95256, M95128
SIGNAL DESCRIPTION Seria l O utput ( Q )
The output pin is used to transfer data serially out of the Memory. Data is shifted out on the falling edge of the serial clock.
Serial Inpu t ( D )
The input pin is used to transfer data serially into the device. Instructions, addresses, and the data to be written, are each received this way . Input is latched on the rising edge of the serial clock.
Serial Clock (C)
The serial clock provides the timing for the serial interface (as shown in Figure 4). Instructions, addresses, or data are latched, from the input pin, on the rising edge of the clock input. The output data on the Q pin chang es state after the falling edge of the clock input.
Chip Select (S
)
When S
is high, the memory device is deselected, and the Q output pin is held in its high impe dance state. Unless an internal write operation is underway, the memory device is placed in its stand-by power mode.
After power-on, a high-to-low transition on S
is
required prior to the start of any operation.
Write Protect (W
)
The protection features of t he m em ory device are summarized in Table 3.
The hardware write protection, controlled by the W pin, restricts write access to the Status Register
(though not to the WIP and WEL bits, which are set or reset by the device internal logic).
Bit 7 of the status register (as shown in Table 5) is the Status Register Write Disable bit (SRWD). When this is set to 0 (its initial delivery state) it is possible to write to the status register if the WEL bit (Write Enable Latch) has been set by the WREN instruction (irrespective of the l evel being applied to the W
input).
When bit 7 (SRWD) of the st atus register is set to 1, the ability to write to the status register depends on the logic level being presented at pin W
:
–If W
pin is high, it is possible to write to the status register, after having set the WEL bit using the WREN instruction (Write Enable Latch).
–If W
pin is low, any attempt to modify the status register is ignored by the device, even if the WEL bit has been set. As a consequence, all the data bytes in the EE PROM area, protected by the BPn bits of the status register, are also hardware protected against data corruption, and appear as a Read Only EEPROM area for the microcontroller. This mode is called the Hardware Protected Mode (HPM).
It is possible to enter the Hardware Protected Mode (HPM) either by s etting the SRWD bi t after pulling low the W
pin, or by pulling low the W pin
after setting the SRWD bit. The only way to abort the Hardware Protected
Mode, once entered, is to pull high the W
pin.
If W
pin is permanently t ied to the hi gh level, the
Hardware Protected Mode is never activated, and
Figure 3. Microcontroller and Memor y Devices on the SPI Bus
AI01958C
Master
(ST6, ST7, ST9,
ST10, Others)
M95xxx
SDO
SDI
SCK
CQD
S
M95xxx
CQD
S
M95xxx
CQD
S
CS3 CS2 CS1
SPI Interface with (CPOL, CPHA) = ('0', '0') or ('1', '1')
M95256, M95128
4/21
the memory device only allows the user to protect a part of the memory, usi ng the BPn bits of the status register, in the Software Protected Mode (SPM).
Hold (HOLD
)
The HOLD
pin is used to pause the serial communications between the SPI memory and controller, without losing bits that have already been decoded in the serial sequence. For a hold condition to occur, the memory device must already have been selected (S
= 0). The hold
condition starts when the HOLD
pin is held low while the clock pin (C) is also low (as shown in Figure 5).
During the hold condition, the Q output pin i s held in its high impedance sta te, and the level s on the input pins (D and C) are ignored by the memory device.
It is possible to deselect the device whe n it is still in the hold state, thereby resetting whatever transfer had been in progress. The memory remains in the hold state as long as the HOLD
pin is low. To restart communication with the device, it is necessary both to remove the hold condition (by takin g HO LD
high) and to select the memory (by
taking S
low).
OPERATIONS
All instructions, addresses and data are shifted serially in and out of the chip. The most significant bit is presented first, with the data input (D) sampled on the first rising edge of the clock (C) after the chip select (S
) goes low.
Every instruction starts with a single-byte code, as summarized in Table 4. This code is entered via the data input (D), and latched on the rising edge of the clock input (C). To enter an instruction code, the product must have been previously selected (S held low). If an invalid i nstruction is sent (one not contained in Table 4), the chip automatically deselects itself.
Write Enable (WREN) and Write Disable (WRDI)
The write enable latch, inside the memory device, must be set prior to each WRITE and WRSR operation. The WREN instruction (write enable) sets this latch, and the WRDI instruction (write disable) resets it.
The latch becomes reset by any of the following events:
– Power on – WRDI instruction completion – WRSR in s t ru ctio n completio n – WRITE instruction completion.
Table 3. Write Protection Control on the M95256 and M95128
W
SRWD
Bit
Mode Status Register
Data Bytes
Protected Area Unprotected Area
0 or 1 0 Software
Protected
(SPM)
Writeable (if the WREN
instruction has set the
WEL bit)
Software write protected
by the BPn of the status
register
Writeable (if the WREN
instruction has set the
WEL bit)
11
01
Hardware Protected
(HPM)
Hardware write protected
Hardware write protected
by the BPn bits of the
status register
Writeable (if the WREN
instruction has set the
WEL bit)
Figure 4. Dat a and Clock Timi ng
AI01438
C
C
MSB LSB
CPHA
D or Q
0
1
CPOL
0
1
5/21
M95256, M95128
Figure 5. Hold Condition Activation
Figure 6. Block Diagram
Note: 1. The cell
An
represents the byte at the highest address in the memory
AI02029B
HOLD PIN
CLOCK
ACTIVE
MEMORY STATUS
HOLD ACTIVE HOLD ACTIVE
AI02030B
HOLD
S
W
Control Logic
High Voltage
Generator
I/O Shift Register
Address Register
and Counter
Data
Register
64 Bytes
X Decoder
Y Decoder
Size of the Read only area of the EEPROM
C
D
Q
Status
Register
AnAn - 63
003Fh0000h
M95256, M95128
6/21
As soon as the WREN or WRDI instruction is received, the memory device first executes the instruction, then enters a wait mode until the device is deselected.
Read Status Register (RDSR)
The RDSR instruction allows the status register to be read, and can be sent at any time, even during a Write operation. Indeed, when a Write is in progress, it is recommended th at the value of t he Write-In-Progress (WIP) bit be checked. The value in the WIP bit (whose position in the status register is shown in Table 5) can be continuously p olled, before sending a new WRITE instruction, using the timing shown in Figure 7. The Write-In­Process (WIP) bit is read-only, and indicates whether the memory is busy with a Write
operation. A ’1’ indicates that a write is in progress, and a ’0’ that no write is in progress.
The Write Enable Latch (WEL) bit indicates the status of the write enable latch. It, too, is read-only.
Its value can only be changed by one of the events listed in the previous paragraph, or as a result of executing WREN or WRDI instruction. It cannot be changed using a WRSR instruction. A ’1’ indicates that the latch is set (the forthcoming Write instruction will be executed), and a ’0’ that it is reset (and any forthcoming Write instructions will be ignored).
The Block Protect (BP0 and BP1) bits indicate the amount of the memory that is to be write­protected. These two bits are non-volatile. They are set using a WRSR instruction.
During a Write operation (whether it be to the memory area or to the status register), all bits of the status register remain valid, and can be read using the RDSR instruction. However, during a Write operation, the values of the no n-vo latile bits (SRWD, BP0, BP1) be come frozen at a constant value. The updated value of these bi ts becomes available when a new RDSR instruction is executed, after completio n of the write cycle. On the other hand, the two read-only bits (WEL, WIP) are dynamically updated during internal write cycles. U sing t his fac ility, it is possib le to p oll the WIP bit to detect the end of the internal write cycle.
Write Status Register (WRSR)
The format of the WRSR instruction is shown in Figure 8. After the instruction and the eigh t bits of the status register have been latched-in, the internal Write cycle is triggered by the rising edge of the S
line. This must occur before the rising
edge of the 17
th
clock pulse (as indicated in Figure
14), otherwise the internal write sequence is not performed.
The WRSR instruction is used for the following:
to select the size of memory area that is to be
write-protected
to select between SPM (Software Protected
Mode) and HPM (Hardware Protected Mode).
Figure 7. RDSR: Read Status Register Sequence
C
D
S
21 3456789101112131415
INSTRUCTION
0
AI02031
Q
7 6543210
STATUS REG. OUT
HIGH IMPEDANCE
MSB
7 6543210
STATUS REG. OUT
MSB MSB
7
Table 4. Instruction Set
Table 5. Status Register Format
Note: 1. SRWD, BP0 and BP1 are Read and wri te bits.
2. WEL and WIP are Read only bits.
Instruc
tion
Description
Instruction
Format
WREN Set Write Enable Latch 0000 0110 WRDI Reset Write Enable Latch 0000 0100 RDSR Read Status Register 0000 0101 WRSR Write Status Register 0000 0001 READ Read Data from Memory Array 0000 0011 WRITE Write Data to Memory Array 0000 0010
b7 b0
SRWD X X X BP1 BP0 WEL WIP
7/21
M95256, M95128
The size of the write-protection area applies equally in SPM and HPM. The BP1 and BP0 bits of the status register have the appropriate value (see Table 6) written into them after the contents of the protected area of the EEPROM have been written.
The initial delivery state of the BP1 and BP0 bits is 00, indicating a write-protection size of 0.
Software Protected Mode (SPM)
The act of writing a non-zero value to the BP1 and BP0 bits causes the Software Protected Mode (SPM) to be started. All attempts to write a byte or page in the protected area are ignored, even if the Write Enable Latch is set. However, writing is still allowed in the unprotected area of the memory array and to the SRWD, BP 1 and BP 0 bits of the status register, provided that the WEL bit is first set.
Hardware Prot ected Mode (H P M)
The Hardware Protected Mode (HPM) offers a higher level of protection, and can be selected by setting the SRWD bit after pulling down the W
pin or by pulling down the W
pin after setting the SRWD bit. The SRWD is set by the WSR instruction, provided that the WEL bit is first set.
The setting of the SRWD bit can be made independently of, or at the same time as, writing a new value to the BP1 and BP0 bits.
Once the device is in the Hardware Protected Mode, the data bytes in the protected area of the memory array,
and
the content of the status register, are write-protected. The only way to re­enable writing new v alue s t o t he s tatus register is to pull the W
pin high. This cause the device to leave the Hardware Protected Mode, and to revert to being in the Software Protected Mode. (The value in the BP1 and BP0 bits will not have been changed).
Further details of the operation of the Write Protect pin (W
) is given earlier, on page 3.
Typical Use of HPM and SPM
The W
pin can be dynamically driven by an output port of a microcontroller. It is also possible, though, to connect it permanently to V
SS
(by a solder connection, or through a pull-down resistor). The manufacturer of such a printed circuit board can take the memory device, still in its initial delivery state, and can solder it directly on to the board. After power on, the microcontroller can be instructed to write the protected data into the
Table 6. Write Protected Block Size
Status Register Bits
Protected Block
Array Addresses Protected
BP1 BP0 M95256 M95128
0 0 none none none 0 1 Upper quarter 6000h - 7FFFh 3000h - 3FFFh 1 0 Upper half 4000h - 7FFFh 2000h - 3FFFh 1 1 Whole memory 0000h - 7FFFh 0000h - 3FFFh
Figure 8. WRSR: Write Status Register Sequence
C
D
AI02282
S
Q
21 3456789101112131415
HIGH IMPEDANCE
INSTRUCTION STATUS REG.
0
765432 0
1
MSB
M95256, M95128
8/21
appropriate area of the memory. When it has finished, the appropriate v alues a re written to the BP1, BP0 and SRWD bits, thereby putting the device in the hardware protected mode.
An alternative method is to write the protected data, and to set the BP1, BP0 and SRWD bits, before soldering the memory device to the board. Again, this results in the memory device being placed in its hardware protected mode.
If the W
pin has been connect ed to VSS by a pull-
down resistor, the mem ory device can be taken
out of the hardware protected mode by driving the W
pin high, to override the pull-down resistor.
If the W
pin has been directly soldered to VSS, there is only one way of taking the memory device out of the hardware protect ed mode: t he memory device must be de-soldered from the board, and connected to external equipment in which the W pin is allowed to be taken high.
Read Operation
The chip is first selected by holding S
low. The serial one byte read instruction is followed by a two byte address (A15-A0), each bit being latched-in during the rising edge of the clock (C).
The data stored in the memory, at the selected address, is shifted out on the Q output pin. Eac h bit is shifted out during the falling edge of the clock (C) as shown in Figure 9. The internal address counter is automatically increment ed to the next higher address after ea ch byte of data has b een shifted out. The data stored i n t he m em ory, at t he
Figure 9. Rea d EEPRO M Arr a y Oper a t ion Sequence
Note: 1. Depending on the memory size, as shown in Table 7, the most significant address bits are Don’t Care.
C
D
AI01793
S
Q
15
21 345678910 2021222324252627
1413 3210
28 29 30
765432 0
1
HIGH IMPEDANCE
DATA OUT
INSTRUCTION 16 BIT ADDRESS
0
MSB
Table 7. Address Range Bits
Note: 1. b15 is Don’t Care on t he M 9 5256 series.
b15 and b14 ar e Don’t Care on t he M95128 se ri es.
Device M95256 M95128
Address Bits A14-A0 A13-A0
Figure 10. Write Enable Latch Sequen ce
C
D
AI02281B
S
Q
21 34567
HIGH IMPEDANCE
0
INSTRUCTION
9/21
M95256, M95128
a write cycle, it is rejected, and the memory device deselects itself.
Byte Write Operat ion
Before any write can take place, the WEL bit must be set, using the WREN instruction. The write state is entered by selecting the chip, issuing three
next address, can be read by successive clock pulses. When the highest addres s is reached, the
address counter rolls over to “0000h”, allowing the read cycle to be continued indefini tely. The read operation is terminated by deselecting the chip. The chip can be deselected at any time during data output. If a read instruction is received during
Figure 11. Byte Write Operation Sequence
Note: 1. Depending on the memory size, as shown in Table 7, the most significant address bits are Don’t Care.
C
D
AI01795
S
Q
15
21 345678910 2021222324252627
1413 3210
28 29 30
HIGH IMPEDANCE
INSTRUCTION 16 BIT ADDRESS
0
765432 0
1
DATA BYTE
31
Figure 12. Page Write Operation Sequence
Note: 1. Depending on the memory size , as shown in Table 7, the mo st si gnifica nt address bit s are Don’t Care.
C
D
AI01796
S
3433 35 36 37 38 39 40 41 42 44 45 46 4732
C
D
S
15
21 345678910 2021222324252627
1413 3210
28 29 30
INSTRUCTION 16 BIT ADDRESS
0
765432 0
1
DATA BYTE 1
31
43
765432 0
1
DATA BYTE 2
765432 0
1
DATA BYTE 3
65432 0
1
DATA BYTE N
M95256, M95128
10/21
bytes of instruction and address, and one byte of data. Chip Select (S
) must remain low t hroughout the operation, as shown in Figure 11. The product must be deselected just after t he eighth b it of the data byte has been latched in, otherwise the write process is cancelled. As soon as the memory device is deselected, the self-timed internal write cycle is initiated. While the write is in progress, the status register may be read t o c heck the s tatus of the SRWD, BP1, BP0, WEL and WIP bits. In
particular, WIP contains a ‘1’ during the self-timed write cycle, and a ‘0’ when the cycle is complete, (at which point the write enable latch is also reset).
Page Write Operation
A maximum of 64 bytes of data can be written during one Write time, t
W
, provided that they are all to the same page (see Figure 6). The Page Write operation is the same as the Byte Write operation, except that instead of deselecting the device after the first byte of data, up to 63 additional bytes can be shifted in (and t hen the device is deselected after the last byte).
Any address of the memory can be chosen as the first address to be wri tten. If the addres s counter reaches the end of the page (an add ress of the form xxxx xx11 1111) and t he cl ock continues, the counter rolls over to the first address of the same page (xxxx xx00 0000) and over-writes any previously written data.
As before, the Write cycle only starts if the S transition occurs just after the eighth bit of the last data byte has been received, as shown in Figure
12.
DATA PROTECTION AND PROTOCOL SAFETY
To protect the data in the memory from inadvertent corruption, the memory device only responds to correctly formulated commands. The main security measures can be summarized as follows:
– The WEL bit is reset at power-up. –S
must rise after the eighth clock count (or multiple thereof) in ord er to start a non-volatile write cycle (in the memory array or in the status register).
– Accesses to the memory array are ignored
during the non-volatile programming cycle, and the programming cycle continues unaffected.
– After execution of a WREN, WRDI, or RDSR
instruction, the chip enters a wait state, and waits to be deselected.
– Inva lid S
and HOLD transitions are ignored.
POWE R O N STATE
After power-on, the memory device is in the following state:
– low power stand-by state – deselected (after power-on, a high-to-low
transition is required on the S
input before any
operations can be started).
– not in the hold condition – the WEL bit is reset – the SRWD, BP1 and BP0 bits of the status
register are un-changed from the previous power-down (they are non-volatile bits).
INITIAL DELIVERY STATE
The device is delivered with the memory array in a fully erased state (all data set at all “1’s” or FFh). The status register bits are initialized to 00h, as shown in Table 8.
Table 8. Initial Status Register Format
Table 9. AC Measurement Conditions
Note: 1. Output Hi-Z is defined as the point where data is no
longer driven.
b7 b0
0 0000 0 0 0
Input Rise and Fall Times
50 ns
Input Pulse Voltages
0.2V
CC
to 0.8V
CC
Input and Output Timing Reference Voltages
0.3V
CC
to 0.7V
CC
Output Load
C
L
= 100 pF
Table 10. Input Parameters1 (TA = 25 °C, f = 5 MHz)
Note: 1. Sampled only, not 100% tested.
Symbol Parameter Test Condition Min. Max. Unit
C
OUT
Output Capacitance (Q) 8 pF
C
IN
Input Capacitance (other pins) 6 pF
Figure 13. AC Testing Input Output Waveforms
AI00825
0.8V
CC
0.2V
CC
0.7V
CC
0.3V
CC
11/21
M95256, M95128
Table 11. DC Characteristics
(T
A
= 0 to 70 °C, –40 to 85 °C or –40 to 125 °C; VCC = 4.5 to 5.5 V)
(T
A
= 0 to 70 °C or –40 to 85 °C; VCC = 2.7 to 3.6 V)
(T
A
= 0 to 70 °C or –40 to 85 °C; VCC = 2.5 to 5.5 V)
(T
A
= 0 to 70 °C or –20 to 85 °C; VCC = 1.8 to 3.6 V)
Note: 1. For all 5V range devi ces, the devi ce meets th e out put requi rem ents for b oth TTL and CMOS standards.
Symbol Parameter
Voltage
Range
Temp. Range
Test Condition Min. Max. Unit
I
LI
Input Leakage Current
all all ± 2 µA
I
LO
Output Leakage Current
all all ± 2 µA
I
CC
Supply Current
4.5-5.5 6
C=0.1V
CC
/0.9. VCC at 5 MHz,
V
CC
= 5 V, Q = open
4mA
4.5-5.5 3
C=0.1V
CC
/0.9. VCC at 2 MHz,
V
CC
= 5 V, Q = open
4mA
2.7-3.6 6
C=0.1V
CC
/0.9. VCC at 5 MHz,
V
CC
= 2.7 V, Q = open
3mA
2.5-5.5 6
C=0.1V
CC
/0.9. VCC at 2 MHz,
V
CC
= 2.5 V, Q = open
2mA
1.8-3.6 5
C=0.1V
CC
/0.9. VCC at 1 MHz,
V
CC
= 1.8 V, Q = open
2mA
I
CC1
Supply Current (Stand-by)
4.5-5.5 6
S
= VCC, V
IN
= VSS or V
CC
, V
CC
= 5 V
10 µA
4.5-5.5 3
S
= VCC, V
IN
= VSS or V
CC
, V
CC
= 5 V
20 µA
2.7-3.6 6
S
= VCC, V
IN
= VSS or V
CC
, V
CC
= 2.7 V
A
2.5-5.5 6 S
= VCC, V
IN
= VSS or V
CC
, V
CC
= 2.5 V 2 µA
1.8-3.6 5 S
= VCC, V
IN
= VSS or V
CC
, V
CC
= 1.8 V 1 µA
V
IL
Input Low Voltage
all all – 0.3
0.3 V
CC
V
V
IH
Input High Voltage
all all
0.7 V
CC
VCC+1
V
V
OL
1
Output Low Voltage
4.5-5.5 6 I
OL
= 2 mA, VCC = 5 V 0.4 V
4.5-5.5 3
I
OL
= 2 mA, VCC = 5 V
0.4 V
2.7-3.6 6 I
OL
= 1.5 mA, VCC = 2.7 V 0.4 V
2.5-5.5 6
I
OL
= 1.5 mA, VCC = 2.5 V
0.4 V
1.8-3.6 5 I
OL
= 0.15 mA, VCC = 1.8 V
0.3
V
V
OH
1
Output High Voltage
4.5-5.5 6
I
OH
= –2 mA, VCC = 5 V 0.8 V
CC
V
4.5-5.5 3
I
OH
= –2 mA, VCC = 5 V
0.8 V
CC
V
2.7-3.6 6 I
OH
= –0.4 mA, VCC = 2.7V 0.8 V
CC
V
2.5-5.5 6 I
OH
= –0.4 mA, VCC = 2.5V 0.8 V
CC
V
1.8-3.6 5 I
OH
= –0.1 mA, VCC = 1.8V 0.8 V
CC
V
M95256, M95128
12/21
Table 12A. AC Characteristics
Note: 1. tCH + tCL ≥ 1 / fC.
2. Value guarant eed by characterization, not 100% tested in pro duction.
Symbol Alt. Parameter
M95256 / M95128
Unit
V
CC
=4.5 to 5.5 V
T
A
=0 to 70°C or
-40 to 85°C
V
CC
=4.5 to 5.5 V
T
A
=-40 to 125°C
Min Max Min Max
f
C
f
SCK
Clock Frequency D.C. 5 D.C. 2 MHz
t
SLCH
t
CSS1
S Active Setup Time 90 200 ns
t
SHCH
t
CSS2
S Not Active Setup Time 90 200 ns
t
SHSL
t
CS
S Deselect Time 100 200 ns
t
CHSH
t
CSH
S Active Hold Time 90 200 ns
t
CHSL
S Not Active Hold Time 90 200 ns
t
CH
1
t
CLH
Clock High Time 90 200 ns
t
CL
1
t
CLL
Clock Low Time 90 200 ns
t
CLCH
2
t
RC
Clock Rise Time 1 1 µs
t
CHCL
2
t
FC
Clock Fall Time 1 1 µs
t
DVCH
t
DSU
Data In Setup Time 20 40 ns
t
CHDX
t
DH
Data In Hold Time 30 50 ns
t
DLDH
2
t
RI
Data In Rise Time 1 1 µs
t
DHDL
2
t
FI
Data In Fall Time 1 1 µs
t
HHCH
Clock Low Hold Time after HOLD not Active 70 140 ns
t
HLCH
Clock Low Hold Time after HOLD Active 40 90 ns
t
CHHL
Clock High Set-up Time before HOLD Active 60 120 ns
t
CHHH
Clock High Set-up Time before HOLD not Active 60 120 ns
t
SHQZ
2
t
DIS
Output Disable Time 100 250 ns
t
CLQV
t
V
Clock Low to Output Valid 60 150 ns
t
CLQX
t
HO
Output Hold Time 0 0 ns
t
QLQH
2
t
RO
Output Rise Time 50 100 ns
t
QHQL
2
t
FO
Output Fall Time 50 100 ns
t
HHQX
2
t
LZ
HOLD High to Output Low-Z 50 100 ns
t
HLQZ
2
t
HZ
HOLD Low to Output High-Z 100 250 ns
t
W
t
WC
Write Time 10 10 ms
13/21
M95256, M95128
Table 12B. AC Characteristics
Note: 1. tCH + tCL ≥ 1 / fC.
2. Value guarant eed by characterization, not 100% tested in pro duction.
Symbol Alt. Parameter
M95256-V /
M95128-V
M95256-W /
M95128-W
M95256-R /
M95128-R
Unit
V
CC
=
2.7 to 3.6 V
T
A
=0 to 70°C
or –40 to 85°C
V
CC
=
2.5 to 5.5 V
T
A
=0 to 70°C
or –40 to 85°C
V
CC
=
1.8 to 3.6 V
T
A
=0 to 70°C
or –20 to 85°C
Min Max Min Max Min Max
f
C
f
SCK
Clock Frequency D.C. 5 D.C. 2 D.C. 1 MHz
t
SLCHtCSS1
S Active Setup Time 90 200 400 ns
t
SHCHtCSS2
S Not Active Setup Time 90 200 400 ns
t
SHSL
t
CS
S Deselect Time 100 200 300 ns
t
CHSHtCSH
S Active Hold Time 90 200 400 ns
t
CHSL
S Not Active Hold Time 90 200 400 ns
t
CH
1
t
CLH
Clock High Time 90 200 400 ns
t
CL
1
t
CLL
Clock Low Time 90 200 400 ns
t
CLCH
2
t
RC
Clock Rise Time 0.05 1 1 µs
t
CHCL
2
t
FC
Clock Fall Time 0.05 1 1 µs
t
DVCHtDSU
Data In Setup Time 20 40 60 ns
t
CHDX
t
DH
Data In Hold Time 30 50 100 ns
t
DLDH
2
t
RI
Data In Rise Time 0.05 1 1 µs
t
DHDL
2
t
FI
Data In Fall Time 0.05 1 1 µs
t
HHCH
Clock Low Hold Time after HOLD not Active
70 140 350 ns
t
HLCH
Clock Low Hold Time after HOLD Active 40 90 200 ns
t
CHHL
Clock High Set-up Time before HOLD Active
60 120 250 ns
t
CHHH
Clock High Set-up Time before HOLD not Active
60 120 250 ns
t
SHQZ
2
t
DIS
Output Disable Time 100 250 500 ns
t
CLQV
t
V
Clock Low to Output Valid 60 150 380 ns
t
CLQX
t
HO
Output Hold Time 0 0 0 ns
t
QLQH
2
t
RO
Output Rise Time 50 100 200 ns
t
QHQL
2
t
FO
Output Fall Time 50 100 200 ns
t
HHQX
2
t
LZ
HOLD High to Output Low-Z 50 100 250 ns
t
HLQZ
2
t
HZ
HOLD Low to Output High-Z 100 250 500 ns
t
W
t
WC
Write Time 10 10 10 ms
M95256, M95128
14/21
Figure 14. Serial Input Timing
Figure 15. Hol d Timing
Figure 16. Output Timing
C
D
AI01447
S
MSB IN
Q
tDVCH
HIGH IMPEDANCE
LSB IN
tSLCH
tCHDX
tDLDH tDHDL
tCHCL
tCLCH
tSHCH
tSHSL
tCHSHtCHSL
C
Q
AI02032
S
D
HOLD
tCHHL
tHLCH
tHHCH
tCHHH
tHHQXtHLQZ
C
Q
AI01449B
S
LSB OUT
D
ADDR.LSB IN
tSHQZ
tCH
tCL
tQLQH tQHQL
tCLQX
tCLQV
15/21
M95256, M95128
Table 13. Ordering Information Scheme
Note: 1. Temperature range available only on re quest.
2. Produced with High Reliability Certified Flow (HRCF), in V
CC
range 4.5 V to 5.5 V only.
3. T he -R version (V
CC
range 1.8 V t o 3. 6 V) only avail able in temperature ra nges 5 or 1.
4. SO8, 150 mil width, package is availa bl e for the M95128 series only.
5. T SSOP14, 169 mil wi dth, package is availa bl e for the M95128 series on ly.
Example: M95256 –R MW 6 T
Memory Capacity Option
256 256 Kbit (32K x 8) T Tape and Reel Packing 128 128 Kbit (16K x 8)
Temperature Range
1
1
0 °C to 70 °C
5 –20 °C to 85 °C
Operating Voltage 6 –40 °C to 85 °C
blank 4.5 V to 5.5 V
3
2
–40 °C to 125 °C
V
2.7 V to 3.6 V W 2.5 V to 5.5 V Package R
3
1.8 V to 3.6 V BN PSDIP8 (0.25 mm frame)
MW SO8 (200 mil width) MN
4
SO8 (150 mil width)
DL
5
TSSOP14 (169 mil width)
ORDERING INFORMATION
The notation used for the device number is as shown in Table 13. For a list of available options (speed, package, etc.) or for further information on any aspect of this device, please contact your nearest ST Sales Office.
M95256, M95128
16/21
Figure 17. PSDIP8 (BN)
Note: 1. D rawing is not to scale.
PSDIP-a
A2
A1AL
e1
D
E1 E
N
1
C
eA eB
B1
B
Table 14. PSDIP8 - 8 pin Plastic Skinny DIP, 0.25mm lead frame
Symb.
mm inches
Typ. Min. Max. Typ. Min. Max.
A 3.90 5.90 0.154 0.232
A1 0.49 0.019
A2 3.30 5.30 0.130 0.209
B 0.36 0.56 0.014 0.022
B1 1.15 1.65 0.045 0.065
C 0.20 0.36 0.008 0.0 14 D 9.20 9.90 0.362 0.3 90
E 7.62 0.300 – E1 6.00 6.70 0.236 0.264 e1 2.54 0.100 – eA 7.80 0.307 – eB 10.00 0.394
L 3 .00 3.80 0.118 0.150
N8 8
17/21
M95256, M95128
Table 15. SO8 - 8 lead Plastic Small Outline, 150 mils body width
Symb.
mm inches
Typ. Min. Max. Typ. Min. Max.
A 1.35 1.75 0.053 0.069 A1 0.10 0.25 0.004 0.010
B 0.33 0.51 0.013 0.020
C 0.19 0.25 0.007 0.0 10
D 4.80 5.00 0.189 0.1 97
E 3.80 4.00 0.150 0.157
e 1 .27 0.050
H 5.80 6.20 0.228 0.2 44
h 0 .25 0.50 0.010 0.020
L 0 .40 0.90 0.016 0.035
α
N8 8
CP 0.10 0.004
Figure 18. SO8 narrow (MN)
Note: 1. D rawing is not to scale.
SO-a
E
N
CP
B
e
A
D
C
LA1 α
1
H
h x 45˚
M95256, M95128
18/21
Table 16. SO8 - 8 lead Plastic Small Outline, 200 mils body width
Symb.
mm inches
Typ. Min. Max. Typ. Min. Max.
A 2.03 0.080 A1 0.10 0.25 0.004 0.010 A2 1.78 0.070
B 0.35 0.45 0.014 0.018
C 0.20 0.008
D 5.15 5.35 0.203 0.2 11
E 5.20 5.40 0.205 0.213
e 1 .27 0.050
H 7.70 8.10 0.303 0.3 19
L 0 .50 0.80 0.020 0.031
α
10° 10°
N8 8
CP 0.10 0.004
Figure 19. SO8 wide (MW)
Note: 1. D rawing is not to scale.
SO-b
E
N
CP
B
e
A2
D
C
LA1 α
H
A
1
19/21
M95256, M95128
Table 17. TSSOP14 - 14 lead Thin Shrink Small Outline
Symb.
mm inches
Typ. Min. Max. Typ. Min. Max.
A 1.10 0.043 A1 0.05 0.15 0.002 0.006 A2 0.85 0.95 0.033 0.037
B 0.19 0.30 0.007 0.012
C 0.09 0.20 0.004 0.0 08
D 4.90 5.10 0.193 0.1 97
E 6.25 6.50 0.246 0.256 E1 4.30 4.50 0.169 0.177
e 0 .65 0.026
L 0 .50 0.70 0.020 0.028
α
N14 14
CP 0.08 0.003
Figure 20. TSSOP14 (DL)
Note: 1. D rawing is not to scale.
TSSOP
1
N
CP
N/2
DIE
C
L
A1
EE1
D
A2A
α
eB
M95256, M95128
20/21
Table 18. Revision History
Date Description of Revision
17-Nov-1999
New -V voltage range added (including the tables for DC characteristics, AC characteristics, and ordering information).
07-Feb-2000
New -V voltage range extended to M95256 (including AC characteristics, and ordering
information). 22-Feb-2000 tCLCH and tCHCL, for the M95xxx-V, changed from 1us to 100ns 15-Mar-2000 -V voltage range changed to 2.7-3.6V
21/21
M95256, M95128
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted by implic ation or otherwise under any patent or p atent rights of STMi croelectr oni cs. Spec i fications mentioned i n this publicatio n are subject to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not authorized for use as cri tical comp onents in life support dev i ces or systems wi t hout expres s written approval of STMi croelectr o nics.
© 2000 STMicroelectronics - All Rights Reserved
The ST logo is a registered trademark of STMicroelectr oni cs.
All other na m es are the prop erty of their respectiv e owners.
STMicroelectronics GROUP OF COMPANIES
Australia - Brazil - China - Finland - France - Germany - Hong Kong - India - Italy - Japan - Malaysia - Malta - Morocco - Singapore - Spain -
Sweden - Switzerland - United K i ngdom - U.S. A.
http://www.s t. com
Loading...