M95256, M95128
10/21
bytes of instruction and address, and one byte of
data. Chip Select (S
) must remain low t hroughout
the operation, as shown in Figure 11. The product
must be deselected just after t he eighth b it of the
data byte has been latched in, otherwise the write
process is cancelled. As soon as the memory
device is deselected, the self-timed internal write
cycle is initiated. While the write is in progress, the
status register may be read t o c heck the s tatus of
the SRWD, BP1, BP0, WEL and WIP bits. In
particular, WIP contains a ‘1’ during the self-timed
write cycle, and a ‘0’ when the cycle is complete,
(at which point the write enable latch is also reset).
Page Write Operation
A maximum of 64 bytes of data can be written
during one Write time, t
W
, provided that they are all
to the same page (see Figure 6). The Page Write
operation is the same as the Byte Write operation,
except that instead of deselecting the device after
the first byte of data, up to 63 additional bytes can
be shifted in (and t hen the device is deselected
after the last byte).
Any address of the memory can be chosen as the
first address to be wri tten. If the addres s counter
reaches the end of the page (an add ress of the
form xxxx xx11 1111) and t he cl ock continues, the
counter rolls over to the first address of the same
page (xxxx xx00 0000) and over-writes any
previously written data.
As before, the Write cycle only starts if the S
transition occurs just after the eighth bit of the last
data byte has been received, as shown in Figure
12.
DATA PROTECTION AND PROTOCOL SAFETY
To protect the data in the memory from inadvertent
corruption, the memory device only responds to
correctly formulated commands. The main
security measures can be summarized as follows:
– The WEL bit is reset at power-up.
–S
must rise after the eighth clock count (or
multiple thereof) in ord er to start a non-volatile
write cycle (in the memory array or in the status
register).
– Accesses to the memory array are ignored
during the non-volatile programming cycle, and
the programming cycle continues unaffected.
– After execution of a WREN, WRDI, or RDSR
instruction, the chip enters a wait state, and
waits to be deselected.
– Inva lid S
and HOLD transitions are ignored.
POWE R O N STATE
After power-on, the memory device is in the
following state:
– low power stand-by state
– deselected (after power-on, a high-to-low
transition is required on the S
input before any
operations can be started).
– not in the hold condition
– the WEL bit is reset
– the SRWD, BP1 and BP0 bits of the status
register are un-changed from the previous
power-down (they are non-volatile bits).
INITIAL DELIVERY STATE
The device is delivered with the memory array in a
fully erased state (all data set at all “1’s” or FFh).
The status register bits are initialized to 00h, as
shown in Table 8.
Table 8. Initial Status Register Format
Table 9. AC Measurement Conditions
Note: 1. Output Hi-Z is defined as the point where data is no
longer driven.
b7 b0
0 0000 0 0 0
Input Rise and Fall Times
≤
50 ns
Input Pulse Voltages
0.2V
CC
to 0.8V
CC
Input and Output Timing
Reference Voltages
0.3V
CC
to 0.7V
CC
Output Load
C
L
= 100 pF
Table 10. Input Parameters1 (TA = 25 °C, f = 5 MHz)
Note: 1. Sampled only, not 100% tested.
Symbol Parameter Test Condition Min. Max. Unit
C
OUT
Output Capacitance (Q) 8 pF
C
IN
Input Capacitance (other pins) 6 pF
Figure 13. AC Testing Input Output Waveforms
AI00825
0.8V
CC
0.2V
CC
0.7V
CC
0.3V
CC