Datasheet M95040, M95020-W, M95020-R, M95020, M95010-W Datasheet (SGS Thomson Microelectronics)

...
Page 1
4/2/1 Kbit Serial SPI Bus EEPROM
(Positive Clock SPI Modes)
Single Supply Voltage:
– 4.5V to 5.5V for M950x0 – 2.5V to 5.5V for M950x0-W – 1.8V to 3.6V for M950x0-R
5 MHz Clock Rate (maximum)
Status Register
BYTE and PAGE WRITE (up to 16 Bytes)
Self-Tim ed P ro gr a m ming Cycle
Adjustable Size Read-Only EEPR OM Area
Enhanced ESD Protection
More than 1,000,000 Erase/Write Cycles
More than 40 Year Data Retention
DESCRIPTION
These SPI-compatible electrically erasable programmable memory (EEPROM) devices are organized as 512 x 8 bits, 256 x 8 bits and 128 x 8 bits (M95040, M95020, M95010). They operate down to 2.5 V (for the -W version of each device), and down to 1.8 V (for the -R version of each device).
M95020, M95010
With High Speed Clock
8
1
PSDIP8 (BN)
0.25 mm frame
8
SO8 (MN)
150 mil width
Figure 1. Logic Diagram
M95040
PRELIMINARY DATA
8
1
TSSOP8 (DW)
169 mil width
1
V
CC
Table 1. Signal Names
C Serial Clock D Serial Data Input Q Serial Data Output
S
W
Write Protect
Hold
HOLD V
CC
V
SS
May 2000
This is preliminary information on a new product now in development or undergoing evaluation. Details are subject to change without notice.
Chip Select
Supply Voltage Ground
W
HOLD
D C S
M95xxx
V
SS
Q
AI01789C
1/19
Page 2
M95040, M95020, M95010
Figure 2A. DIP Connections
M95xxx
1
SV
2 3
W
4
SS
8 7 6 5
AI01790C
CC
HOLDQ C DV
The M95040 and M95020, M95010 are available in Plastic Dual-in-Line, Plastic Small Out line and Thin Shrink Small Outline packages.
Each memory device is accessed by a simple serial interface that is SPI-compatible. The bus signals are C, D and Q, as shown in Table 1 and Figure 3.
The device is selected when t he chip s elect input
) is held low. Communications with the chip can
(S be interrupted using the hold input (HOLD
). Write operations are disabled by the w rite protect input (W
).
Figure 2B. SO and TSSOP Connections
M95xxx
1
SV
2 3
W
SS
4
8 7 6 5
AI01791C
CC
HOLDQ C DV
SIGNAL DESCRIPTION Seria l O utput ( Q )
The output pin is used to transfer data serially out of the Memory. Data is shifted out on the falling edge of the serial clock.
Serial Inpu t ( D )
The input pin is used to transfer data serially into the device. Instructions, addresses, and the data to be written, are each received t his way. Input is latched on the rising edge of the serial clock.
Serial Clock (C)
The serial clock provides the timing for the serial interface (as shown in Figure 4). Instructions, addresses, or data are latched, from the input pin,
Table 2. Absolute Maximum Ratings
Symbol Parameter Value Unit
T
A
T
STG
T
LEAD
V
O
V
I
V
CC
V
ESD
Note: 1. Exc ept for the rating “Operating Temperature Ra nge”, stres ses above those listed in the Table “Absolute Maximum Ratings” may
2/19
cause permanent damage to the device. These are stress ratings only, and operation of the device at these or any other conditions above those indi cated in t he Operating sect i ons of thi s specifi cation i s not impl i ed. Exposure to Absolute M aximum Rating c ondi­tions for extended periods may affect device reliability. Refer also to the ST SURE Program and other relevant quality documents.
2. MIL -STD-883C, 3015.7 (1 00 pF, 1500 Ω)
3. EIA J I C-121 (Condition C) (200pF, 0W).
Ambient Operating Temperature -40 to 125 °C Storage Temperature -65 to 150 °C
Lead Temperature during Soldering
Output Voltage Range Input Voltage Range -0.3 to 6.5 V Supply Voltage Range -0.3 to 6.5 V
Electrostatic Discharge Voltage (Human Body model) Electrostatic Discharge Voltage (Machine model)
1
PSDIP8: 10 sec SO8: 40 sec TSSOP8: t.b.c.
2
3
260 215
t.b.c.
-0.3 to V
+0.6
CC
4000 V
400 V
°C
V
Page 3
Figure 3. Microcontroller and Memor y Devices on the SPI Bus
M95040, M95020, M95010
SPI Interface with (CPOL, CPHA) = ('0', '0') or ('1', '1')
Master
(ST6, ST7, ST9,
ST10, Others)
CS3 CS2 CS1
SDO
SDI
SCK
CQD
M95xxx
S
on the rising edge of the clock input. The output data on the Q pin chang es state after the falling edge of the clock input.
Chip Select (S
When S
is high, the memory device is deselected,
)
and the Q output pin is held in its high impe dance state. Unless an internal write operation is underway, the memory device is placed in its stand-by power mode.
After power-on, a high-to-low transition on S
is
required prior to the start of any operation.
Write Protect (W
)
This pin is for hardware write protection. When W is low, writes to the device are disabled, but all other operations remain enabled. When W write operations are enabled. If W
goes low at any
is high,
time before the last bit, D0, of the data stream, the write enable latch is reset, thus preventing the write from taking e ffect. No action on W
or on the write enable latch can interrupt a write cycle which has commenced, though.
Hold (HOLD
The HOLD
)
pin is used to pause the serial communications between the SPI memory and controller, without losing bits that have already been decoded in the serial sequence. For a hold condition to occur, the memory device must already have been selected (S condition starts when the HOLD
= 0). The hold
pin is held low while the clock pin (C) is also low (as shown in Figure 14).
CQD
M95xxx
S
CQD
M95xxx
S
AI01958C
During the hold condition, the Q output pin i s held in its high impedance sta te, and the level s on the input pins (D and C) are ignored by the memory device.
It is possible to deselect the device whe n it is still in the hold state, thereby resetting whatever transfer had been in progress. The memory remains in the hold state as long as the HOLD
pin is low. To restart communication with the device, it is necessary both to remove the hold condition (by takin g HO LD taking S
high) and to select the memory (by
low).
The Memory can be driven by a microcontroller with its SPI periphe ral running in ei the r of the two
following modes: (CPOL, CPHA) = (’0’,’0’) or (CPOL,CPHA) = (’1’,’1’).
For these two modes , input data is latched in by the low to high transition of clock C, and output data is available from the h igh to low t ransition of Clock (C).
The difference between (CPOL, CPHA) = (0, 0) and (CPOL, CPHA) = (1, 1) is the stand-by polarity: C remains at ’0’ for (CPOL, CPHA) = (0,
0) and C remains at ’1’ for (CPOL, CPHA) = (1, 1) when there is no data transfer.
OPERATIONS
All instructions, addresses and data are shifted serially in and out of the chip. The most significant bit is presented first, with the data input (D) sampled on the first rising edge of the clock (C) after the chip select (S
) goes low.
3/19
Page 4
M95040, M95020, M95010
Figure 4. Dat a and Clock Timi ng
CPOL
CPHA
0
1
0
1
C
C
D or Q
MSB LSB
Every instruction starts with a single-byte code, as summarized in Table 3. This code is entered via the data input (D), and latched on the rising edge of the clock input (C). To enter an instruction code, the product must have been previously selected (S held low). If an invalid i nstruction is sent (one not contained in Table 3), the chip automatically deselects itself.
Write Enable (WREN) and Write Disable (WRDI)
The write enable latch, inside the memory device, must be set prior to each WRITE and WRSR operation. The WREN instruction (write enable) sets this latch, and the WRDI instruction (write disable) resets it.
Table 3. Instruction Set
Instruc
tion
WREN Set Write Enable Latch 0000 X110 WRDI Reset Write Enable Latch 0000 X100 RDSR Read Status Register 0000 X101 WRSR Write Status Register 0000 X001
READ
WRITE Write Data to Memory Array
Note: 1 . A8 = 1 for the uppe r p age on th e M95 04 0, and 0 for the
Read Data from Memory Array
lower page, and is Don’ t Care for othe r devices.
2. X = Don’t Care.
Description
Instruction
Format
8
8
011
010
0000 A
0000 A
Table 4. Status Register Format
b7 b0
1 1 1 1 BP1 BP0 WEL WIP
Note: 1. BP1 and BP0 are rea d and write bits.
2. WEL and WIP are read only bits.
3. b7 to b4 are read onl y bits.
AI01438
The latch becomes reset by any of the following events:
– Power on – WRDI instruction completion – WRSR in s t ru ctio n completio n – WRITE instruct ion c ompletion – the W
pin is held low.
As soon as the WREN or WRDI instruction is received, the memory device first executes the instruction, then enters a wait mode until the device is deselected.
Read Status Register (RDSR)
The RDSR instruction allows the status register to be read, and can be sent at any time, even during a Write operation. Indeed, when a Write is in progress, it is recommended th at the value of t he Write-In-Progress (WIP) bit be checked. The value in the WIP bit (whose position in the status register is shown in Table 4) can be polled, before sending a new WRITE instruction.
The Write-In-Process (WIP) bit is read-only, and indicates whether the memory is busy with a Write operation. A ’1’ indicates that a write is in progress, and a ’0’ that no write is in progress.
The Write Enable Latch (WEL) bit indicates the status of the write enable latch. It, too, is read-only. Its value can only be changed by one of the events listed in the previous paragraph, or as a result of executing WREN or WRDI instruction. It cannot be changed using a WRSR instruction. A ’1’ indicates that the latch is set (the forthcoming Write instruction will be executed), and a ’0’ that it is reset (and any forthcoming Write instructions will be ignored).
The Block Protect (BP0 and BP1) bits indicate the amount of the memory that is to be write­protected. These two bits are non-volatile. They are set using a WRSR instruction.
4/19
Page 5
Figure 5. RDSR: Read Status Register Sequence
S
21 3456789101112131415
0
C
INSTRUCTION
D
M95040, M95020, M95010
Q
Figure 6. Block Diagram
HOLD
W
S
C
D
Q
Control Logic
Address Register
and Counter
HIGH IMPEDANCE
I/O Shift Register
STATUS REG. OUT
7 6543210
MSB
High Voltage
Generator
Data
Register
AI01444
Status
Register
Size of the Read only EEPROM area
Y Decoder
16 Bytes
X Decoder
AI01272B
5/19
Page 6
M95040, M95020, M95010
Table 5. Write Protected Block Size
Status Register Bits
Protected Block
BP1 BP0 M95040 M95020 M95010
0 0 none none none none 0 1 Upper quarter 180h - 1FFh C0h - FFh 060h - 7Fh 1 0 Upper half 100h - 1FFh 80h - FFh 040h - 7Fh 1 1 Whole memory 000h - 1FFh 00h - FFh 000h - 7Fh
Array Addresses Protected
During a Write operation (whether it be to the memory area or to the status register), all bits of the status register remain valid, and can be read using the RDSR instruction. However, during a Write operation, the values of the no n-vo latile bits (BP0, BP1) become frozen at a constant value. The updated value of these bits becomes available when a new RDSR instruction is executed, after completion of t he write cycle. On the other hand, the two read-only bits (WEL, WIP) are dynamically updated during internal write cycles. U sing th is fac ility, it is possib le to p oll the WIP bit to detect the end of the internal write cycle.
Write Status Register (WRSR)
The format of the WRSR instruction is shown in Figure 7. After the instruction and the eigh t bits of the status register have been latched-in, the internal Write cycle is trigg ered by t he rising edge of the S line. This must occur after the falling edge of the 16 of the 17
th
clock pulse, and before the rising edge
th
clock (as indicated in Figure 7), otherwise the internal write sequence is not performed.
The WRSR instruction is used to select the size of memory area that is to be write-protected.
The BP1 and BP0 bi ts of the st atus register have the appropriate value (see Table 5) written into them after the contents of the protected area of the EEPROM have been written.
The initial delivery state of the BP1 and BP0 bits is 00, indicating a write-protection size of 0.
Read Operation
The chip is first selected by holding S
low. The serial one byte read instruction is followed by a one byte address (A7-A0), each bit being latched­in during the rising edge of the clock (C). The most significant bit, A8, of the address is incorporated as bit b3 of the instruction byte, as shown in Table
3. The data stored in the memory, at the selected
address, is shifted out on the Q output pin. Eac h bit is shifted out during the falling edge of the clock (C) as shown in Figure 8. The internal address counter is automatically increment ed to the next higher address after ea ch byte of data has b een shifted out. The data stored i n t he m em ory, at t he next address, can be read by successive clock pulses. When the highest addres s is reached, the
address counter rolls over to “0000h”, allowing the read cycle to be continued indefini tely. The read operation is terminated by deselecting the chip.
Figure 7. WRSR: Write Status Register Sequence
S
21 3456789101112131415
0
C
INSTRUCTION STATUS REG.
D
HIGH IMPEDANCE
Q
6/19
AI01445
Page 7
Figure 8. Rea d EEPRO M Arr a y Oper a t ion Sequence
S
21 345678910111213141516171819
0
C
INSTRUCTION BYTE ADDRESS
A7
D
A6 A5 A4 A3 A2 A1 A0A8
M95040, M95020, M95010
20 21 22 23
HIGH IMPEDANCE
Q
Note: 1. Depending on the memory size, as shown in Table 6, the most significant address bits are Don’t Care.
Table 6. Address Range Bits
Device M95040 M95020 M95010
Address Bits A8-A0 A7-A0 A6-A0
soon as the memory device is deselected, the self­timed internal write cycle is initiated. While the write is in progress, the status register may be read to check the s tatus of the BP1, B P0, WEL
DATA OUT
76543
and WIP bits. In particular, WIP contains a ‘1’ during the self-timed write cycle, and a ‘0’ when
The chip can be deselected at any time during data output. If a read instruction is received during a write cycle, it is rejected, and the memory device deselects itself.
Byte Write Operat ion
Before any write can take place, the WEL bit must be set, using the WREN instruction. The write state is entered by selecting the c hip, issuing two bytes of instruction and address, and one byte of data. Chip Select (S
) must remain low t hroughout the operation, as shown in Figure 10. The product must be deselected just after t he eighth b it of the data byte has been latched in, as shown in Figure 10, otherwise the write process is cancelled. As
the cycle is complete, (at which point the write enable latch is also reset).
Page Write Operation
A maximum of 16 bytes of data can be written during one Write time, t
, provided that they are all
W
to the same page (see Figure 6). The Page Write operation is the same as the Byte Write operation, except that instead of deselecting the device after the first byte of data, up to 15 additional bytes can be shifted in (and t hen the device is deselected after the last byte).
Any address of the memory can be chosen as the first address to be wri tten. If the addres s counter reaches the end of the page (an add ress of the
2
1
0
AI01440
Figure 9. Write Enable Latch Sequen ce
S
C
D
Q
21 34567
0
HIGH IMPEDANCE
AI01441
7/19
Page 8
M95040, M95020, M95010
Figure 10. Byte Write Operation Sequence
S
21 345678910111213141516171819
0
C
20 21 22 23
INSTRUCTION BYTE ADDRESS
A7
D
HIGH IMPEDANCE
Q
Note: 1. Depending on the memory size, as shown in Table 6, the most significant address bits are Don’t Care.
A6 A5 A4 A3 A2 A1 A0A8
DATA BYTE
765432 0
Figure 11. Page Write Operation Sequence
S
21 34567891011121314151617181920 21 22 23
0
C
INSTRUCTION BYTE ADDRESS
DATA BYTE 1
1
AI01442
D
S
2625 27 28 29 30 31
24
C
DATA BYTE 2
54
D
Note: 1. Depending on th e m em ory size, as shown in Table 6, the mo st si gnifica nt a ddress bits are Don’t Care.
76 3210
A7 A6 A5 A4 A3 A2 A1 A0A8 765432 0
8+8N
9+8N
10+8N
11+8N
12+8N
13+8N
14+8N
15+8N
136
137
138
139
140
DATA BYTE N
76543210765432 0
DATA BYTE 16
8/19
141
1
1
142
7
143
AI01443
Page 9
M95040, M95020, M95010
form xxxx 1111) and the clock continues, the counter rolls over to the first address of the same page (xxxx 0000) and over-writes any previously written data.
As before, the Write cycle only starts if the S transition occurs just after the eighth bit of the last data byte has been received, as shown in Figure
11.
DATA PROTECTION AND PROTOCOL SAFETY
To protect the data in the memory from inadvertent corruption, the memory device only responds to correctly formulated commands. The main security measures can be summarized as follows:
– The WEL bit is reset at power-up.
must rise after the eighth clock count (or
–S
multiple thereof) in ord er to start a non-volatile write cycle (in the memory array or in the status register).
– Accesses to the memory array are ignored
during the non-volatile pr ogrammin g cycle, and the programming cycle continues unaffected.
– After execution of a WREN, WRDI, or RDSR
instruction, the chip enters a wait state, and waits to be deselected.
– Inva lid S
and HOLD transitions are ignored.
POWE R O N STATE
After power-on, the memory device is in the following state:
– low power stand-by state – deselected (after power-on, a high-to-low
transition is required on the S
input before any
operations can be started). – not in the hold condition – the WEL bit is reset – the BP1 and BP0 bits of the status regist er are
unchanged from the previous power-down (they
are non-volatile bits).
INITIAL DELIVERY STATE
The device is delivered with the memory array in a fully erased state (all data set at all 1s or FFh). The status register bits are initialized to 00h, as shown in Table 7.
Table 7. Initial Status Register Format
b7 b0
1 1110000
Table 8. Input Parameters1 (TA = 25 °C, f = 5 MHz)
Symbol Parameter Test Condition Min. Max. Unit
C
OUT
C
IN
Note: 1. Sampled only, not 100% tested.
Output Capacitance (Q) 8 pF Input Capacitance (D) 8 pF Input Capacitance (other pins) 6 pF
9/19
Page 10
M95040, M95020, M95010
Table 9. DC Characteristics
(T
= –40 to 85 °C or –40 to 125 °C; VCC = 4.5 to 5.5 V)
A
(T
= –40 to 85 °C; VCC = 2.5 to 5.5 V)
A
= –20 to 85 °C; VCC = 1.8 to 3.6 V)
(T
A
Symbol Parameter
Input Leakage
I
LI
Current
Voltage
Range
all all ± 2 µA
Temp.
Range
Test Condition Min. Max. Unit
I
LO
I
CC
I
CC1
V
IL
V
IH
1
V
OL
Output Leakage Current
Supply Current
Supply Current (Stand-by)
Input Low Voltage
Input High Voltage
Output Low Voltage
all all ± 2 µA
4.5-5.5 6
4.5-5.5 3
2.5-5.5 6
1.8-3.6 5
4.5-5.5 6
4.5-5.5 3
2.5-5.5 6
1.8-3.6 5 S
C = 0.1V
C = 0.1V
C = 0.1V
C = 0.1V
S
= VCC, V
S
= VCC, V
S
= VCC, V = VCC, V
all all – 0.3
all all
4.5-5.5 6 I
4.5-5.5 3
2.5-5.5 6 I
1.8-3.6 5
OL
I
OL
4.5-5.5 6 I
/0.9VCC , at 5 MHz,
CC
= 5 V, Q = open
V
CC
/0.9VCC , at 2 MHz,
CC
V
= 5 V, Q = open
CC
/0.9VCC , at 2 MHz,
CC
= 2.5 V, Q= open
V
CC
/0.9VCC , at 1 MHz,
CC
= 1.8 V, Q= open
V
CC
= VSS or V
IN
= VSS or V
IN
= VSS or V
IN
= VSS or V
IN
= 2 mA, VCC = 5 V 0.4 V
OL
I
= 2 mA, VCC = 5 V
OL
CC
CC
, V
CC
CC
= 5 V
CC
, V
= 5 V
CC
, V
= 2.5 V
CC
, V
= 1.8 V 2 µA
CC
0.7 V
CC
5mA
5mA
2mA
2mA
10 µA 10 µA
A
0.3 V
CC
VCC+1
0.4 V
= 1.5 mA, VCC = 2.5 V 0.4 V
= 0.15 mA, VCC = 1.8 V
= –2 mA, VCC = 5 V 0.8 V
OH
CC
0.3
V
V
V V
Output High
1
V
OH
Voltage
4.5-5.5 3
2.5-5.5 6
1.8-3.6 5
Note: 1. For all 5V range devi ces, the devi ce meets th e out put requi rem ents for b ot h TT L and CMOS standards.
I
= –2 mA, VCC = 5 V
OH
I
= –0.4 mA, VCC = 2.5V 0.8 V
OH
I
= –0.1 mA, VCC = 1.8V 0.8 V
OH
0.8 V
10/19
CC
CC
CC
V V
V
Page 11
Table 10A. AC Characteristics
Symbol Alt. Parameter
M95040, M95020, M95010
M95040, M95020, M95010
V
=4.5 to 5.5 V
CC
T
=–40 to 85°C
A
Min Max Min Max
=4.5 to 5.5 V
V
CC
T
=–40 to 125°C
A
Unit
f
C
t
SLCH
t
SHCH
t
SHSL
t
CHSH
t
CHSL
t
CH
1
t
CL
t
CLCH
t
CHCL
t
DVCH
t
CHDX
t
DLDH
t
DHDL
t
HHCH
t
HLCH
t
CLHL
t
CLHH
t
SHQZ
t
CLQV
t
CLQX
t
QLQH
t
QHQL
t
HHQX
t
HLQZ
t
W
Note: 1. tCH + tCL ≥ 1 / fC.
2. Val ue guarantee d by characterization, not 100% tes ted in product i on.
f
t
CSS1
t
CSS2
t
Clock Frequency D.C. 5 D.C. 2 MHz
SCK
S Active Setup Time 90 200 ns S Not Active Setup Time 90 200 ns
t
S Deselect Time 100 200 ns
CS
S Active Hold Time 90 200 ns
CSH
S Not Active Hold Time 90 200 ns
1
t t
2
2
t
2
2
Clock High Time 90 200 ns
CLH
Clock Low Time 90 200 ns
CLL
t
Clock Rise Time 1 1 µs
RC
t
Clock Fall Time 1 1 µs
FC
Data In Setup Time 20 40 ns
DSU
t
Data In Hold Time 30 50 ns
DH
t
Data In Rise Time 1 1 µs
RI
t
Data In Fall Time 1 1 µs
FI
t
Clock Low Hold Time after HOLD not Active 70 140 ns
CD
Clock Low Hold Time after HOLD Active 40 90 ns Clock Low Set-up Time before HOLD Active 0 0 ns Clock Low Set-up Time before HOLD not Active 0 0 ns
2
t
2
2
2
2
t
Output Disable Time 100 250 ns
DIS
t
Clock Low to Output Valid 60 150 ns
V
t
Output Hold Time 0 0 ns
HO
t
Output Rise Time 50 100 ns
RO
t
Output Fall Time 50 100 ns
FO
t
HOLD High to Output Low-Z 50 100 ns
LZ
t
HOLD Low to Output High-Z 100 250 ns
HZ
Write Time 10 10 ms
WC
11/19
Page 12
M95040, M95020, M95010
Table 10B. AC Characteristics
Symbol Alt. Parameter
f
C
t
SLCH
t
SHCH
t
SHSL
t
CHSH
t
CHSL
1
t
CH
1
t
CL
t
CLCH
t
CHCL
t
DVCH
t
CHDX
t
DLDH
t
DHDL
t
HHCH
t
HLCH
t
CLHL
t
CLHH
t
SHQZ
t
CLQV
t
CLQX
t
QLQH
t
QHQL
t
HHQX
t
HLQZ
t
W
Note: 1. tCH + tCL ≥ 1 / fC.
2. Val ue guarantee d by characterization, not 100% tes ted in product i on.
f
SCK
t
CSS1
t
CSS2
t
t
CSH
Clock Frequency D.C. 2 D.C. 1 MHz S Active Setup Time 200 400 ns S Not Active Setup Time 200 400 ns S Deselect Time 200 300 ns
CS
S Active Hold Time 200 400 ns S Not Active Hold Time 200 400 ns
t
CLH
t
CLL
2
t
2
t
t
DSU
t
2
t
2
t
Clock High Time 200 400 ns Clock Low Time 200 400 ns Clock Rise Time 1 1 µs
RC
Clock Fall Time 1 1 µs
FC
Data In Setup Time 40 60 ns Data In Hold Time 50 100 ns
DH
Data In Rise Time 1 1 µs
RI
t
Data In Fall Time 1 1 µs
FI
Clock Low Hold Time after HOLD not Active 140 350 ns
CD
Clock Low Hold Time after HOLD Active 90 200 ns Clock Low Set-up Time before HOLD Active 0 0 ns Clock Low Set-up Time before HOLD not Active 0 0 ns
2
t
t
2
t
2
t
2
t
2
t
t
Output Disable Time 250 500 ns
DIS
t
Clock Low to Output Valid 150 380 ns
V
Output Hold Time 0 0 ns
HO
Output Rise Time 100 200 ns
RO
Output Fall Time 100 200 ns
FO
HOLD High to Output Low-Z 100 250 ns
LZ
HOLD Low to Output High-Z 250 500 ns
HZ
Write Time 10 10 ms
WC
M950x0-W M950x0-R
V
=2.5 to 5.5 V
CC
T
=–40 to 85°C
A
=1.8 to 3.6 V
V
CC
T
=–20 to 85°C
A
Min Max Min Max
Unit
12/19
Page 13
M95040, M95020, M95010
Table 11. AC Measurement Conditions
Input Rise and Fall Times Input Pulse Voltages Input and Output Timing
Reference Voltages Output Load
Note: 1. Output Hi-Z is defined as the point where data is no long-
er driven.
0.2V
0.3V
50 ns
to 0.8V
CC
to 0.7V
CC
C
= 100 pF
L
CC
CC
Figure 13. Serial Input Timing
S
tSLCH
C
tDVCH
tCHDX
D
Q
MSB IN
HIGH IMPEDANCE
Figure 12. AC Testing Input Output Waveforms
0.8V
0.2V
tDLDH tDHDL
CC
CC
tCHSHtCHSL
tCLCH
tSHSL
tSHCH
tCHCL
LSB IN
AI01447
0.7V
0.3V
AI00825
CC
CC
Figure 14. Hol d Timing
S
C
Q
D
HOLD
tCLHL
tHLCH
tHHCH
tCLHH
tHHQXtHLQZ
AI01448
13/19
Page 14
M95040, M95020, M95010
Figure 15. Output Timing
S
C
tCLQX
tCLQV
tCH
tCL
tSHQZ
Q
ADDR.LSB IN
D
tQLQH tQHQL
LSB OUT
AI01449B
ORDERING INFORMATION
The notation used for the device number is as show n in Table 12. For a list of available option s (speed, package, etc.) or for further information on any aspect of this device, please contact t he ST Sales Office nearest to you.
Table 12. Ordering Information Scheme
Example: M95040 – W MN 6 TR
Memory Capacity
3
040 4 Kbit (512 x 8) with positive clock strobe TR Tape and Reel Packing 020 2 Kbit (256 x 8) with positive clock strobe 010 1 Kbit (128 x 8) with positive clock strobe Temperature Range
5 –20 °C to 85 °C 6 –40 °C to 85 °C
1
3
Option
–40 °C to 125 °C
Operating Voltage Package
blank 4.5 V to 5.5 V BN PSDIP8 (0.25 mm frame) W 2.5 V to 5.5 V MN SO8 (150 mil width)
2
1.8 V to 3.6 V
R
Note: 1. Temperature range avail abl e only on re quest, in VCC range 4.5 V t o 5. 5 V only.
2. The -R version (V
3. All devices use a positive clock strobe: Data In is strobed on the rising edge of the clock (C) and Data Out is synchronized from the falling ed ge of the clock.
range 1.8 V t o 3. 6 V) only avail able in temperature ra nge 5.
CC
TSSOP8 (169 mil width)
DW
14/19
Page 15
Table 13. PSDIP8 - 8 pin Plastic Skinny DIP, 0.25mm lead frame
mm inches
Symb.
Typ. Min. Max. Typ. Min. Max.
A 3.90 5.90 0.154 0.232
A1 0.49 0.019
A2 3.30 5.30 0.130 0.209
B 0.36 0.56 0.014 0.022
B1 1.15 1.65 0.045 0.065
C 0.20 0.36 0.008 0.014 D 9.20 9.90 0.362 0.390
E 7.62 0.300 – E1 6.00 6.70 0.236 0.264 e1 2 .54 0.100 – eA 7.80 0.307 – eB 10.00 0.394
L 3 .00 3.80 0.118 0.150
N8 8
M95040, M95020, M95010
Figure 16. PSDIP8 (BN)
Note: 1. Drawing is not to scale.
A2
A1AL
B
N
1
e1
B1
D
E1 E
eA eB
C
PSDIP-a
15/19
Page 16
M95040, M95020, M95010
Table 14. SO8 - 8 lead Plastic Small Outline, 150 mils body width
Symb.
Typ. Min. Max. Typ. Min. Max.
A 1.35 1.75 0.053 0.069 A1 0.10 0.25 0.004 0.010
B 0.33 0.51 0.013 0.020
C 0.19 0.25 0.007 0.010
D 4.80 5.00 0.189 0.197
E 3.80 4.00 0.150 0.157
e 1.27 0.050
H 5.80 6.20 0.228 0.244
h 0 .25 0.50 0.010 0.020
L 0 .40 0.90 0.016 0.035
α
N8 8
CP 0.10 0.004
mm inches
Figure 17. SO8 narrow (MN)
B
SO-a
Note: 1. Drawing is not to scale.
h x 45˚
A
e
D
N
1
CP
E
H
C
LA1 α
16/19
Page 17
Table 15. TSSOP8 - 8 lead Thin Shrink Small Outline
Symb.
Typ. Min. Max. Typ. Min. Max.
A 1.10 0.043 A1 0.05 0.15 0.002 0.006 A2 0.85 0.95 0.033 0.037
B 0.19 0.30 0.007 0.012
C 0.09 0.20 0.004 0.008
D 2.90 3.10 0.114 0.122
E 6.25 6.50 0.246 0.256 E1 4.30 4.50 0.169 0.177
e 0.65 0.026
L 0.50 0.70 0.020 0.028
α
N8 8
CP 0.08 0.003
mm inches
M95040, M95020, M95010
Figure 18. TSSOP8 (DW)
CP
Note: 1. Drawing is not to scale.
D
A1
DIE
C
α
L
TSSOP
N
EE1
1
N/2
A2A
eB
17/19
Page 18
M95040, M95020, M95010
Table 16. Revision History
Date Description of Revision
10-May-2000 s/issuing three bytes/issuing two bytes/ in the 2nd sentence of the Byte Write Operation
18/19
Page 19
M95040, M95020, M95010
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