The M74HC563 is an high speed CMOS OCTAL
LATCH WITH 3-STATE OUTPUTS fabricated
with silicon gate C
2
MOS technology.
This 8-BIT D-Type la tches is controlled by a latch
enable input (LE) and output enable input (OE
).
While the LE in put is held at a high level, the Q
outputs will follow the data input inversely. Wh en
the LE is taken, the Q outputs will be latched
inversely at the logic level of D input data.
TSSOPDIPSOP
ORDER CODES
PACKAGETUBET & R
DIPM74HC563B1R
SOPM74HC563M1RM74HC563RM13TR
TSSOPM74HC563TTR
While the OE
input is at low level, the eight outputs
will be in a norm al logic state (high or low logic
level) and while OE
is in high level the outputs will
be in a high impedance state.
The 3-State output configuration and the wide
choice of outline make bus organized system
simple.
All inputs are equipped with protection circuits
against static discharge and transient excess
voltage.
PIN CONNECTION AND IEC LOGIC SYMBOLS
1/12July 2001
Page 2
M74HC563
INPUT AND OUTPUT EQUIVALENT CIRCUIT PIN DESCRIPTION
PIN NoSYMBOLNAME AND FUNCTION
1OE
2, 3, 4, 5, 6,
7, 8, 9
12, 13, 14,
15, 16, 17,
18, 19
11LELatch Enable Input
10GNDGround (0V)
20V
TRUTH TABLE
INPUTSOUTPUTS
D0 to D7Data Inputs
Q0
to Q73 State Latch Outputs
CC
3 State Output Enable
Input (Active LOW)
Positive Supply Voltage
OE
LEDQ
HXXZ
LLXNO CHANGE (*)
LHLH
LHHL
X: Don’t Care
Z: High Impedance
(*): Q
outputs ar e l atched at the time when the LE i nput is taken low l ogic level.
LOGIC DIAGRAM
2/12
Page 3
M74HC563
ABSOLUTE MAXIMUM RATINGS
SymbolParameterValueUnit
V
V
V
I
I
OK
I
I
or I
CC
P
T
T
Absolute Maximum Ratings are those values beyond which damage to the device may occur. Functional operation under these conditions is
not implied
(*) 500mW at 65
1) CPD is defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without
load. (Refer to Test Circuit). Average operating current can be obtained by the following equation. I
Flop) an d the C
when n pcs of Flip Flop operate, can be gai ned by the fol lo wing equation: C
PD
TEST CIRCUIT
-40 to 85°C -55 to 125°C
= CPD x VCC x fIN + ICC/8 (per Flip
CC(opr)
PD(TOTAL)
= 33 + 16 x n (pF)
Unit
TESTSWITCH
t
, t
PLH
PHL
, t
t
PZL
PLZ
t
, t
PZH
PHZ
CL = 50pF/150pF or equivalent (includes jig and probe capacitance)
R
= 1KΩ or equivalent
1
= Z
R
of pulse generator (typically 50Ω)
T
OUT
6/12
Open
V
CC
GND
Page 7
M74HC563
WAVEFORM 1: LE TO Qn PROPAGATION DELAYS, LE MINIMUM PULSE WIDTH, Dn TO LE SETUP
AND HOLD TIMES (f=1MHz; 50% duty cycle)
WAVEFORM 2: OUTPUT ENABLE AND DISABLE TIMES (f=1MHz; 50% duty cycl e )
7/12
Page 8
M74HC563
WAVEFORM 3: PROPAGATION DELAY TIMES (f=1MHz; 50% duty cycle)
8/12
Page 9
M74HC563
Plastic DIP-20 (0.25) MECHANICAL DATA
mm.inch
DIM.
MIN.TYPMAX.MIN.TYP.MAX.
a10.2540.010
B1.391.650.0550.065
b0.450.018
b10.250.010
D25.41.000
E8.50.335
e2.540.100
e322.860.900
F7.10.280
I3.930.155
L3.30.130
Z1.340.053
P001J
9/12
Page 10
M74HC563
SO-20 MECHANICAL DATA
DIM.
MIN.TYPMAX.MIN.TYP.MAX.
A2.650.104
a10.10.20.0040.008
a22.450.096
b0.350.490.0140.019
b10.230.320.0090.012
C0.50.020
c145° (typ.)
D12.6013.000.4960.512
E10.0010.650.3930.419
e1.270.050
e311.430.450
F7.407.600.2910.300
L0.501.270.0200.050
M0.750.029
S8° (max.)
mm.inch
10/12
PO13L
Page 11
M74HC563
TSSOP20 MECHANICAL DATA
mm.inch
DIM.
MIN.TYPMAX.MIN.TYP.MAX.
A1.20.047
A10.050.150.0020.0040.006
A20.811.050.0310.0390.041
b0.190.300.0070.012
c0.090.200.0040.0089
D6.46.56.60.2520.2560.260
E6.26.46.60.2440.2520.260
E14.34.44.480.1690.1730.176
e0.65 BSC0.0256 BSC
K0°8°0°8°
L0.450.600.750.0180.0240.030
A2
A
A1
b
e
K
c
L
E
D
E1
PIN 1 IDENTIFICATION
1
0087225C
11/12
Page 12
M74HC563
Information furnished is bel ieved to be accurate and reliable. However, STMicroe lectronics assumes no responsibility for the
consequences of use of such information nor for any infringement of patents or other rights of third parties which may result from
its use. No li cense is granted by imp lication or otherwise under a ny patent or patent rig hts of STMicroelectronics. Spec ific at ions
mentioned in this publication ar e subject to change without notice. This publication supersedes and replaces all information
previously supplied. S TMicroelectronics products are not authorized for use as critica l components in life suppo rt devices or
systems without express written approval of STMicroelectronics.
Australi a - Brazil - Chi na - Finland - F rance - Germany - Hong Kon g - I ndia - Italy - Japan - Malay sia - Malta - Morocco