The M616Z08 is a 128 Kbit (131,072 bit) CMOS
SRAM, organized by 16 bits. The device features
fullystatic operation requiring noexterna l clocks or
timing strobes, with equal address access and cycle times. It requires a single 2.6V ± 10% or
Figure 3. 44-pin Connections
M616Z08
3.3V ± 10% supply, and all inputs and outputs are
TTL compat ible.
The M616Z08 is available in a 44-lead SOIC package.
Stressingthedeviceabovetheratinglistedinthe
“Absolute Maximum Ratings” table may caus e
permanent damage to the device. These are
stress ratings only and operation of the device at
these or any other conditions above those indicated in the Ope ra ting sections of this specification is
Table 2. Absolute Maximum Ratings
SymbolParameterValueUnit
T
A
(1)
T
STG
(2,3)
V
IO
V
CC
(4)
I
O
P
D
Note: 1. Reflow at peak temperature of 215°C to 225°C for < 60 seconds (total thermal budget not to exceed 180°C for between 90 and 120
seconds).
2. Upto a maximum operating V
(min)= VSS–2.0VAC(pulsewidth≤10% t
3. V
IL
V
(max)= VCC+ 2.0V AC (pulse width ≤ 10% t
IH
4. Oneoutput at a time, not to exceed 1 second duration.
Ambient Operating Temperature–40 to 125°C
Storage Temperature–65 to 150°C
Input or Output Voltage
Supply Voltage–0.3 to 4.0V
Output Current10mA
Power Dissipation270mW
of 3.6V only.
CC
AVAV
AVAV
(min))
(min))
not implied. Exposure to Absolute Maximum Rating conditions for extended periods may affec t devicereliability.Referalsotothe
STMicroelectronics SURE Program and other relevant quality documents.
–0.3 to V
CC
+ 0.3
V
4/14
Page 5
DC AND AC PARAM ETERS
This section summarizes the operating and measurement conditions, as well as the DC and AC
characteristics of the device. The parameters in
the following DC and AC Characteristic tables are
ment Conditions listed in the relevant tables. Designers should check that the operating conditions
in their projects match the measure ment conditions when using the quoted parameters.
derived from tests performed under the Measure-
Table 3. DC and AC Measurement Conditions
ParameterM616Z08
Supply Voltage
V
CC
Ambient Operating Temperature–40 to 125°C
2.34 to 3.0V or 3.0 to 3.6V
M616Z08
Load Capacitance (C
Input Rise and Fall Times≤ 5ns
Input Pulse Voltages0to3V
Input and Output Timing Ref. Voltages1.5V
Note: Output High Z is defined as the point where data is no longer driven.
)
L
50pF
Figure 4. AC Testing Load Circuit
3.0V
2.6 KΩ
DEVICE
UNDER
TEST
2.6 KΩ
OUT
CL = 50 pF
or 5pF
AI05650
Table 4. Capacitance
Symbol
C
C
OUT
Note: 1. Effective capacitance measured with power supply at 3.3V; sampled only, not 100% tested.
Input Capacitance on all pins (except DQ)10pF
IN
(3)
Output Capacitance10pF
2. A t 25°C; f = 1MHz.
3. Outputs deselected.
Parameter
(1,2)
MinMaxUnit
5/14
Page 6
M616Z08
Table 5. DC Characteristics
SymParameter
I
Input Leakage Current
LI
I
Output Leakage Current
LO
(3)
I
CC1
I
CC3
Supply Current
Supply Current (Standby)
(4)
CMOS
Test Condition
0V ≤ VIN ≤ V
0V ≤ V
V
V
CC
CC
OUT
CC
= 3.6V,
CE ≥ VCC– 0.2V, f = 0
(1)
TO Pin
(2)
MinTypMaxUnit
65125µA
All other inputs±1µA
≤ V
=3.6V
CC
±1µA
75mA
1mA
V
Input Low Voltage–0.3
IL
V
V
0.7V
CC
CC
CC
–0.2V
–0.3V
V
Input High Voltage
IH
I
V
Output Low Voltage
OL
OL
= 1mA
2.34 to 3.0V
I
V
Note: 1. Valid for AmbientOperating Temperature:TA= –40 to 125°C; VCC= 3.0 to 3.6V or 2.34 to 3.0V (except where noted).
Output High Voltage
OH
2. I nput leakage on TO Pin due to internal pull-down to V
3. A verage AC current, Outputs open, cycling at t
4. A ll other Inputs at V
≤ 0.2V or VIH≥ VCC–0.2V.
IL
OH
= –1mA
minimum.
AVAV
3.0 to 3.6V
.
SS
0.3V
CC
VCC+ 0.3
0.2V
OPERATION
READ Mode
The M616Z08 is in the READ Mode whenever
WRITE Enable (WE0
Enable (OE
) Low, and Chip Enable (CE) is assert-
or WE1) is High with Output
ed. This provides access to data from sixteen of
the 131,072 locations in the static memory array,
specified by the 13 address inputs. Valid data will
be available at the sixteen output pins wit hin t
AVQV
after the last stable address, providi ng OE is Low
and C
E is Low. If Chip Enable or Output Enable
access times are not met, data access wi ll be
measured from the limiting parameter (t
t
) rather than the address. Data out may be
GLQV
indeterminate at t
will always be valid at t
ELQX
and t
AVQV
, but data lines
GLQX
.
Figure 5. Address Controlled, READ Mode AC Waveforms
tAVAV
ELQV
V
V
V
or
A0-A12
DQ0-DQ15
Note: CE =Low,OE= Low, WE(0,1) =High.
6/14
VALID
tAVQVtAXQX
DATA VALID
AI04210
Page 7
Figure 6. Chip Enable or Output Enable Controlled, READ Mode AC Waveforms
tAVAV
M616Z08
A0-A12
tAVQVtAXQX
tELQV
CE
tELQX
tGLQV
OE
tGLQX
DQ0-DQ15
VALID
VALID
Table 6. READ Mode AC Characteristics
Symbol
t
AVAV
t
AVQV
t
ELQV
t
GLQV
t
ELQX
t
GLQX
t
EHQZ
t
GHQZ
t
AXQX
Note: 1. Valid for AmbientOperating Temperature:TA= –40 to 125°C (except where noted).
2. C
READ Cycle Time3620ns
Address Valid to Output Valid3620ns
Chip Enable Low to Output Valid3620ns
Output Enable Low to Output Valid2010ns
Chip Enable Low to Output Transition00ns
Output Enable Low to Output Transition00ns
(2)
Chip Enable High to Output Hi-Z1010ns
(2)
Output Enable High to Output Hi-Z1010ns
Address Transition to Output Transition00ns
= 5pF.
L
Parameter
(1)
2.34 to 3.0V3.0 to 3.6V
MinMaxMinMax
tGHQZ
M616Z08
–20
tEHQZ
AI05638
Unit
7/14
Page 8
M616Z08
WRITE Mode
TheM 616Z08 is in the WRITE mode whenever the
(low memory addresses) or WE1 (high mem-
WE0
ory addresses) and C
page 10). Either the Chip Enable input (C
WRITE Enable input (WE0
E pins are low (see Table 8,
E)orthe
or WE1) must be deasserted during Address transitions for subsequent WRIT E cycles. WRITE begins with the concurrence of Chip Enable being active with WE0
WE1
low. There fore, address setup t im e is referenced toWRITE Enable and Chip Enable ast
and t
respectively, and is determined by the
AVEH
or
AVWL
latter occurring edge.
Figure 7. WRITE Enable Controlled, WRITE Mode AC Waveforms
The WRITE cycle can be terminated by the e arlier
rising edge of C
if theOutput is enabled (C
then WE0
or WE1 will return the outputs to high
impedance within t
must be taken to avoid bus c ontention in this type
of operation. Dat a input must be v ali d for t
before the rising edge of WRITE Enable, or for t
before the rising edge of CE, whichever oc-
VEH
curs first, and remain valid f or t
Note: When using MCP555 with TO Pin high, re-
laxedWRITEtiming(CSNT=1inthechipselect
configuration register) should be selected.
tAVAV
E,orWE0/WE1.
E = Low and OE =Low),
of its falling edge. Care
WLQZ
WHDX
or t
EHDX
DVWH
D-
.
A0-A12
tAVEL
CE
tAVWL
WE (0,1)
tWLQZ
DQ0-DQ15
VALID
tAVWH
tWLWH
DATA INPUT
tDVWH
Figure 8. Chip Enable Controlled, WRITE Mode AC Waveforms
tAVAV
A0-A12
tAVEL
VALID
tAVEH
tELEH
tWHAX
tWHQX
tWHDX
AI04211
tEHAX
CE
WE (0,1)
DQ0-DQ15
Note: 1. Output Enable (OE) = High.
8/14
goes High with WE0 or WE1 high, the output remains in a high-impedance state.
2. I f CE
tAVWL
tEHDX
DATA INPUT
tDVEH
AI05639
Page 9
Table 7. WRITE Mode AC Characteristics
M616Z08
M616Z08
Symbol
Parameter
(1)
2.34 to 3.0V3.0 to 3.6V
MinMaxMinMax
t
AVAV
t
AVWL
t
AVWH
t
AVEH
t
WLWH
t
WHAX
t
WHDX
t
WHQX
t
WLQZ
t
AVEL
t
ELEH
t
EHAX
t
EHDX
t
DVWH
t
DVEH
Note: 1. Valid for AmbientOperating Temperature:TA= –40 to 125°C (except where noted).
2. C
3. A t any given temperature and voltage condition, t
WRITE Cycle Time3620ns
Address Valid to WRITE Enable Low22ns
Address Valid to WRITE Enable High3418ns
Address Valid to Chip Enable High3418ns
WRITE Enable Pulse Width2511ns
WRITE Enable High to Address Transition22ns
WRITE Enable High to Input Transition22ns
(3)
WRITE Enable High to Output Transition00ns
(2,3)
WRITE Enable Low to Output Hi-Z1010ns
Address Valid to Chip Enable Low22ns
Chip Enable Low to Chip Enable High2511ns
Chip Enable High to Address Transition22ns
Chip Enable High to Input Transition22ns
Input Valid to WRITE Enable High208ns
Input Valid to Chip Enable High208ns
= 5pF
L
WLQZ
is less than t
for any given device.
WHQX
–20
Unit
9/14
Page 10
M616Z08
“Operational” Mode
The M616Z08 has a Chip Enable power down feature which invokes an automatic standby mode
whenever Chip Enableis de-asserted (C
An Output Enable (OE
) signal provides a high
E =High).
speed tri-state control,allowing fast READ/WRITE
cycles to be achieved with the common I /O data
bus. Operational modes are determined by device
control inputs WE0
or WE1 and CE as summa-
rized in “ Operating Modes” (see Table 8 and Table
9).
Table 8. WE(0,1)
WRITE EnableUsed during 16-bit Port Access
States during Access
WE0
WE1
WRITE Enable for DQ (0-7)
WRITE Enable for DQ (8-15)
Noise Immunity
When designing with high speed mem ory , proper
power trace layout and capacitive decoupling
must bemaintained toensure proper system operation.Power and ground line inductance s hould be
reduced by providing separate power planes. The
impedance of the decoupling path from t he power
pin through the decoupling capacitor should also
be kept to a minimum. Sm all decoupling capacitors (10nF) should be located as close to the device pins as possible to limit the high frequency
noise. Larger capacitor values (10uF and 1uF) are
recommended to reduce low frequency noise and
should be placed next to t he power entry point of
the board. Proper line termination should al s o be
employed to minimize signal reflection.
See Motorola Semiconductor Application Note
AN2127/D for additional Electromagnetic Compa tibility (EMC) system design guidelines.
For a list of available options (e.g., Speed, Package) or for further information on any as pec t of this device,
please contact the ST Sales Office nearest to you.
11/14
Page 12
M616Z08
PACKAGE MECHANICAL INFORMATION
Figure 9. SO44 – 44-Lead, Plastic, Hatless, Small Package Outline
A2
A
Be
CP
D
N
E
H
1
SOH-C
Note: Drawing is not to scale.
Table 11. SO44 – 44-lead, Plastic, Hatless, Small Package Mechanical Data
02/12/022.1Add TO Pin (Figure 2, 3, Table 1); change WRITE Mode AC Characteristics (Table 7)
02/21/022.2Changes for TO Pin (Table 5) and change characteristics (Table 6, 7)
05/13/022.3Add reflow time and temperature footnote (Table 2)
07/22/022.4Add “Hatless” to package description (Figure 1, 9 and Table 10, 11)
Correction of Operating Modes text (Table 9); document status changed to “Data Sheet;”
add text for Noise Immunity (page 10)
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