■ Battery internally isolated until power is applied
■ Pin and function compatible with JEDEC
PFD
standard 512 K x 8 SRAMs
■ PMDIP32 is an ECOPACK
■ RoHS compliant
– Lead-free second level interconnect
= 4.75 to 5.5 V;
CC
≤ 4.75 V
= 4.5 to 5.5 V;
CC
≤ 4.5 V
= 3.0 to 3.6 V;
CC
≤ 3.0 V
®
package
32
1
PMDIP32 module
Description
The M48Z512A/Y/V ZEROPOWER® RAM is a
non-volatile, 4,194,304-bit static RAM organized
as 524,288 words by 8 bits. The devices combine
an internal lithium battery, a CMOS SRAM and a
control circuit in a plastic, 32-pin DIP module.
June 2011Doc ID 5146 Rev 91/21
This is information on a product still in production but not recommended for new designs.
A15
A17
W
A13
A8
A9
A11
G
A10
E
DQ7
DQ6
DQ5DQ1
DQ4
DQ3V
AI02044
Figure 3.Block diagram
V
CC
POWER
VOLTAGE SENSE
E
AND
SWITCHING
CIRCUITRY
E
INTERNAL
BATTERY
512K x 8
SRAM ARRAY
V
SS
A0-A18
DQ0-DQ7
W
G
AI02045
6/21Doc ID 5146 Rev 9
Page 7
M48Z512A, M48Z512AY, M48Z512AVOperating modes
2 Operating modes
The M48Z512A/Y/V also has its own power-fail detect circuit. The control circuitry constantly
monitors the single V
tolerance, the circuit WRITE protects the SRAM, providing a high degree of data security in
the midst of unpredictable system operation brought on by low V
switchover voltage (V
until valid power returns.
The ZEROPOWER
PROMs without any requirement for special WRITE timing or limitations on the number of
WRITEs that can be performed.
Table 2.Operating modes
supply for an out of tolerance condition. When VCC is out of
CC
. As VCC falls below the
), the control circuitry connects the battery which maintains data
SO
®
RAM replaces industry standard SRAMs. It provides the nonvolatility of
CC
ModeV
Deselect
WRITEV
READV
READV
DeselectV
Deselect≤ V
1. X = VIH or VIL; VSO = battery backup switchover voltage.
SO
CC
4.75 to 5.5 V
or
4.5 to 5.5 V
or
3.0 to 3.6 V
to V
PFD
SO
(min)
(1)
(1)
Note:See Table 10 on page 16 for details.
2.1 READ mode
The M48Z512A/Y/V is in the READ mode whenever W (WRITE enable) is high and E (chip
enable) is low. The device architecture allows ripple-through access of data from eight of
4,194,304 locations in the static storage array. Thus, the unique address specified by the 19
address inputs defines which one of the 524,288 bytes of data is to be accessed. Valid data
will be available at the data I/O pins within address access time (t
address input signal is stable, providing that the E
access times are also satisfied. If the E
available after the later of chip enable access time (t
(t
). The state of the eight three-state data I/O signals is controlled by E and G. If the
GLQV
outputs are activated before t
until t
. If the address inputs are changed while E and G remain low, output data will
AVQ V
remain valid for output data hold time (t
access.
, the data lines will be driven to an indeterminate state
AVQ V
EGWDQ0-DQ7Power
V
IH
IL
IL
IL
XXXHigh ZCMOS standby
XXXHigh ZBattery backup mode
XXHigh ZStandby
XVILD
V
V
V
IL
IH
IH
V
IH
IN
D
OUT
High ZActive
) after the last
AVQ V
Active
Active
(chip enable) and G (output enable)
and G access times are not met, valid data will be
) or output enable access Time
ELQV
) but will go indeterminate until the next address
AXQX
Doc ID 5146 Rev 97/21
Page 8
Operating modesM48Z512A, M48Z512AY, M48Z512AV
Figure 4.Chip enable or output enable controlled, READ mode AC waveforms
tAVAV
A0-A18
tAVQVtAXQX
tELQV
E
tELQX
G
tGLQX
DQ0-DQ7
VAL ID
tGLQV
DATA OUT
1. WRITE enable (W) = high
Figure 5.Address controlled, READ mode AC waveforms
A0-A18
tAVAV
tAVQV
tEHQZ
tGHQZ
AI01221
tAXQX
DQ0-DQ7
DATA VALID
1. Chip enable (E) and output enable (G) = low, WRITE enable (W) = high
AI01220
8/21Doc ID 5146 Rev 9
Page 9
M48Z512A, M48Z512AY, M48Z512AVOperating modes
Table 3.READ mode AC characteristics
SymbolParameter
t
AVAV
t
AVQ V
t
ELQV
t
GLQV
t
ELQX
t
GLQX
t
EHQZ
t
GHQZ
t
AXQX
1. Valid for ambient operating temperature: TA = 0 to 70 °C or –40 to 85 °C; VCC = 4.75 to 5.5 V, 4.5 to 5.5 V,
or 3.0 to 3.6 V (except where noted).
2. CL = 5 pF.
READ cycle time7085ns
Address valid to output valid7085ns
Chip enable low to output valid7085ns
Output enable low to output valid3545ns
(2)
Chip enable low to output transition55ns
(2)
Output enable low to output transition55ns
(2)
Chip enable high to output Hi-Z3035ns
(2)
Output enable high to output Hi-Z2025ns
Address transition to output transition55ns
2.2 WRITE mode
The M48Z512A/Y/V is in the WRITE mode whenever W and E are active. The start of a
WRITE is referenced from the latter occurring falling edge of W
by the earlier rising edge of W
(1)
or E.
M48Z512A/Y
–70
M48Z512A/Y/V
–85
MinMaxMinMax
or E. A WRITE is terminated
Unit
The addresses must be held valid throughout the cycle. E
minimum of t
cycle. Data-in must be valid t
t
or t
EHDX
WHDX
EHAX
from E or t
from W prior to the initiation of another READ or WRITE
WHAX
DVE H
or t
prior to the end of WRITE and remain valid for
DVW H
afterward. G should be kept high during WRITE cycles to avoid bus
or W must return high for a
contention; although, if the output bus has been activated by a low on E
will disable the outputs t
after W falls.
WLQZ
and G, a low on W
Doc ID 5146 Rev 99/21
Page 10
Operating modesM48Z512A, M48Z512AY, M48Z512AV
Figure 6.WRITE enable controlled, WRITE AC waveforms
tAVAV
A0-A18
tAVEL
E
tAVWL
W
tWLQZ
DQ0-DQ7
VAL ID
tAVWH
tWLWH
tWHDX
DATA INPUT
tDVWH
1. Output enable (G) = high.
Figure 7.Chip enable controlled, WRITE AC waveforms
tAVAV
A0-A18
tAVEL
VAL ID
tAVEH
tELEH
tWHAX
tWHQX
AI01222
tEHAX
E
W
DQ0-DQ7
1. Output enable (G) = high.
tAVWL
tEHDX
DATA INPUT
tDVEH
AI01223
10/21Doc ID 5146 Rev 9
Page 11
M48Z512A, M48Z512AY, M48Z512AVOperating modes
Table 4.WRITE mode AC characteristics
SymbolParameter
(1)
M48Z512A/Y
–70
M48Z512A/Y/V
–85
Unit
MinMaxMinMax
t
AVAV
t
AVW L
t
AVEL
t
WLWH
t
ELEH
t
WHAX
t
EHAX
t
DVW H
t
DVE H
t
WHDX
t
EHDX
t
WLQZ
t
AVW H
t
AVEH
t
WHQX
1. Valid for ambient operating temperature: TA = 0 to 70 °C or –40 to 85 °C; VCC = 4.75 to 5.5 V, 4.5 to 5.5 V
or 3.0 to 3.6 V (except where noted).
2. CL = 5 pF.
goes low simultaneously with W going low, the outputs remain in the high impedance state.
3. If E
WRITE cycle time7085ns
Address valid to WRITE enable low00ns
Address valid to chip enable low00ns
WRITE enable pulse width5565ns
Chip enable low to chip enable high5575ns
WRITE enable high to address transition55ns
Chip enable high to address transition1515ns
Input valid to WRITE enable high3035ns
Input valid to chip enable high3035ns
WRITE enable high to input transition00ns
Chip enable high to input transition1010ns
(2)(3)
WRITE enable low to output Hi-Z2530ns
Address valid to WRITE enable high6575ns
Address valid to chip enable high6575ns
(2)(3)
WRITE enable high to output transition55ns
2.3 Data retention mode
With valid VCC applied, the M48Z512A/Y/V operates as a conventional BYTEWIDE™ static
RAM. Should the supply voltage decay, the RAM will automatically power-fail deselect,
WRITE protecting itself t
and all inputs are treated as “don't care.”
If power fail detection occurs during a valid access, the memory cycle continues to
completion. If the memory cycle fails to terminate within the time t
takes place. When V
energy source which preserves data.
The internal coin cell will maintain data in the M48Z512A/Y/V after the initial application of
V
for an accumulated period of at least 10 years when VCC is less than VSO. As system
CC
power returns and V
is switched to external V
allow for processor stabilization. After t
For more information on battery storage life refer to the application note AN1012.
after VCC falls below V
WP
drops below VSO, the control circuit switches power to the internal
CC
rises above VSO, the battery is disconnected, and the power supply
CC
. WRITE protection continues for tER after VCC reaches V
CC
. All outputs become high impedance,
PFD
, WRITE protection
WP
to
, normal RAM operation can resume.
ER
PFD
Doc ID 5146 Rev 911/21
Page 12
Operating modesM48Z512A, M48Z512AY, M48Z512AV
2.4 VCC noise and negative going transients
ICC transients, including those produced by output switching, can produce voltage
fluctuations, resulting in spikes on the V
capacitors are used to store energy which stabilizes the V
bypass capacitors will be released as low going spikes are generated or energy will be
absorbed when overshoots occur. A ceramic bypass capacitor value of 0.1 µF (see Figure 8)
is recommended in order to provide the needed filtering.
In addition to transients that are caused by normal SRAM operation, power cycling can
generate negative voltage spikes on V
one volt. These negative spikes can cause data corruption in the SRAM while in battery
backup mode. To protect from these voltage spikes, ST recommends connecting a schottky
diode from V
CC
to V
(cathode connected to VCC, anode to VSS). (Schottky diode 1N5817
SS
is recommended for through hole and MBRS120T3 is recommended for surface-mount).
Figure 8.Supply voltage protection
V
CC
bus. These transients can be reduced if
CC
that drive it to values below VSS by as much as
CC
V
bus. The energy stored in the
CC
CC
0.1µFDEVICE
V
SS
AI02169
12/21Doc ID 5146 Rev 9
Page 13
M48Z512A, M48Z512AY, M48Z512AVMaximum ratings
3 Maximum ratings
Stressing the device above the rating listed in the absolute maximum ratings table may
cause permanent damage to the device. These are stress ratings only and operation of the
device at these or any other conditions above those indicated in the operating sections of
this specification is not implied. Exposure to absolute maximum rating conditions for
extended periods may affect device reliability.
Table 5.Absolute maximum ratings
SymbolParameterValueUnit
Grade 10 to 70
T
T
A
STG
Ambient operating temperature
°C
Grade 6-40 to 85
Storage temperature (VCC off)–40 to 85°C
Grade 10 to 70
T
T
SLD
BIAS
V
IO
Temperature under bias
Grade 6–40 to 85
(1)
Lead solder temperature for 10 seconds260°C
Input or output voltages–0.3 to 7V
°C
M48Z512A/512AY–0.3 to 7.0V
V
CC
I
O
P
1. Soldering temperature of the IC leads is to not exceed 260 °C for 10 seconds. Furthermore, the devices
shall not be exposed to IR reflow nor preheat cycles (as performed as part of wave soldering). ST
recommends the devices be hand-soldered or placed in sockets to avoid heat damage to the batteries.
Supply voltage
M48Z512AV–0.3 to 4.6V
Output current20mA
Power dissipation1W
D
Caution:Negative undershoots below –0.3 V are not allowed on any pin while in the battery backup
mode.
Doc ID 5146 Rev 913/21
Page 14
DC and AC parametersM48Z512A, M48Z512AY, M48Z512AV
4 DC and AC parameters
This section summarizes the operating and measurement conditions, as well as the DC and
AC characteristics of the device. The parameters in the following DC and AC characteristic
tables are derived from tests performed under the measurement conditions listed in the
relevant tables. Designers should check that the operating conditions in their projects match
the measurement conditions when using the quoted parameters.
Table 6.Operating and AC measurement conditions
ParameterM48Z512A/512AYM48Z512AV Unit
Supply voltage (V
)4.75 to 5.5 V or 4.5 to 5.53.0 to 3.6V
CC
Grade 10 to 700 to 70
Ambient operating temperature (T
Load capacitance (C
)10050pF
L
)
A
Grade 6–40 to 85–40 to 85
Input rise and fall times≤ 5≤ 5ns
Input pulse voltages0 to 30 to 3V
Input and output timing ref. voltages1.51.5V
Note:Output Hi-Z is defined as the point where data is no longer driven.
Figure 9.AC measurement load circuit
DEVICE
UNDER
TEST
650Ω
CL = 100 pF
or 30 pF
(1)
1.75V
°C
CL includes JIG capacitance
1. Excluding open drain output pins; 50 pF for M48Z512AV.
Table 7.Capacitance
SymbolParameter
C
C
IO
1. Effective capacitance measured with power supply at 5 V (M48Z512A/Y) or 3.3 V (M48Z512AV); sampled
only, not 100% tested.
2. Outputs deselected.
3. At 25 °C.
Input capacitance -10pF
IN
(3)
Input/output capacitance-10pF
(1)(2)
14/21Doc ID 5146 Rev 9
AI03903
MinMaxUnit
Page 15
M48Z512A, M48Z512AY, M48Z512AVDC and AC parameters
Table 8.DC characteristics
SymParameter
Test condition
(1)
M48Z512A/Y
–70
M48Z512AV
–85
MinMaxMinMax
(2)
I
Input leakage current0 V ≤ VIN ≤ V
LI
(2)
I
1. Valid for ambient operating temperature: TA = 0 to 70 °C or –40 to 85 °C; VCC = 4.75 to 5.5 V, 4.5 to 5.5 V, or 3.0 to 3.6 V
2. Outputs deselected.
Output leakage current0 V ≤ V
LO
I
Supply current
CC
Supply current (standby) TTLE = V
I
CC1
I
Supply current (standby) CMOSE ≥ VCC – 0.2 V53mA
CC2
Input low voltage–0.30.8–0.30.6V
V
IL
Input high voltage2.2VCC + 0.32.2VCC + 0.3V
V
IH
V
Output low voltageIOL = 2.1 mA0.40.4V
OL
Output high voltageIOH = –1 mA2.42.2V
V
OH
(except where noted).
OUT
E
= V
outputs open
≤ V
IL
IH
CC
CC
±1±1µA
±1±1µA
11550mA
104mA
Unit
Figure 10. Power down/up mode AC waveforms
V
CC
V
(max)
PFD
V
(min)
PFD
VSO
V
SS
INPUTS
(Including E)
OUTPUTS
tWP
VAL IDVAL ID
tF
tFB
tDR
tRB
DON'T CARE
HIGH-Z
tR
tER
RECOGNIZEDRECOGNIZED
AI02385
Doc ID 5146 Rev 915/21
Page 16
DC and AC parametersM48Z512A, M48Z512AY, M48Z512AV
Table 9.Power down/up AC characteristics
SymbolParameter
(2)
t
F
t
FB
(3)
V
(max) to V
PFD
V
(min) to VSS VCC fall time
PFD
PFD
(min) VCC fall time300µs
(1)
MinMaxUnit
M48Z512A/Y10
µs
M48Z512AV150
t
t
RB
V
R
(min) to V
PFD
VSS to V
PFD
(min) V
(max) VCC rise time10µs
PFD
rise time1µs
CC
M48Z512A/Y40150
t
WPT
t
ER
1. Valid for ambient operating temperature: TA = 0 to 70 °C or –40 to 85 °C; VCC = 4.75 to 5.5 V, 4.5 to 5.5 V,
or 3.0 to 3.6 V (except where noted).
2. V
PFD
until 200 µs after V
3. V
PFD
Table 10.Power down/up trip points DC characteristics
SymbolParameter
WRITE protect time
M48Z512AV40250
E recovery time40120ms
(max) to V
(min) to VSS fall time of less than tFB may cause corruption of RAM data.
(min) fall time of less than tF may result in deselection/WRITE protection not occurring
PFD
passes V
CC
PFD
(min).
(1)(2)
MinTypMaxUnit
µs
M48Z512A4.54.64.75V
V
Power-fail deselect voltage
PFD
M48Z512AY4.24.34.5V
M48Z512AV2.82.93.0V
M48Z512A/Y3.0V
V
t
DR
1. All voltages referenced to VSS.
2. Valid for ambient operating temperature: T
or 3.0 to 3.6 V (except where noted).
3. At 25 °C; VCC = 0 V.
Battery backup switchover voltage
SO
(3)
Expected data retention time10Years
= 0 to 70 °C or –40 to 85 °C; VCC = 4.75 to 5.5 V, 4.5 to 5.5 V,
A
M48Z512AV2.5V
16/21Doc ID 5146 Rev 9
Page 17
M48Z512A, M48Z512AY, M48Z512AVPackage mechanical data
5 Package mechanical data
In order to meet environmental requirements, ST offers these devices in different grades of
ECOPACK
specifications, grade definitions and product status are available at: www.st.com.
ECOPACK
®
packages, depending on their level of environmental compliance. ECOPACK®
Table 11.PMDIP32 – 32-pin plastic DIP module, package mechanical data
B
e3
D
e1
E
eA
C
PMDIP
mminches
Symb
TypMinMaxTypMinMax
A9.279.520.3650.375
A10.380.015
B0.430.590.0170.023
C0.200.330.0080.013
D42.4243.181.6701.700
E18.0318.800.7100.740
e12.292.790.0900.110
e338.101.50
eA14.9916.000.5900.630
L3.053.810.1200.150
S1.912.790.0750.110
N3232
Doc ID 5146 Rev 917/21
Page 18
Part numberingM48Z512A, M48Z512AY, M48Z512AV
6 Part numbering
Table 12.Ordering information scheme
Example: M48Z512AY –70PM 1
Device type
M48Z
Supply voltage and WRITE protect voltage
(1)
= VCC = 4.75 to 5.5 V; V
512A
(1)
512AY
512AV
= VCC = 4.5 to 5.5 V; V
(1)
= VCC = 3.0 to 3.6 V; V
Speed
–70 = 70 ns (for M48Z512A/Y)
= 4.5 to 4.75 V
PFD
= 4.2 to 4.5 V
PFD
= 2.8 to 3.0 V
PFD
–85 = 85 ns (for M48Z512A/Y/V)
Package
PM = PMDIP32
Temperature range
1 = 0 to 70 °C
6 = –40 to 85 °C
1. Device is not recommended for new design. Contact ST sales office for availability.
For other options, or for more information on any aspect of this device, please contact the
ST sales office nearest you.
18/21Doc ID 5146 Rev 9
Page 19
M48Z512A, M48Z512AY, M48Z512AVEnvironmental information
7 Environmental information
Figure 12. Recycling symbols
This product contains a non-rechargeable lithium (lithium carbon monofluoride chemistry)
button cell battery fully encapsulated in the final product.
Recycle or dispose of batteries in accordance with the battery manufacturer's instructions
and local/national disposal and recycling regulations.
Doc ID 5146 Rev 919/21
Page 20
Revision historyM48Z512A, M48Z512AY, M48Z512AV
8 Revision history
Table 13.Revision history
DateRevisionChanges
Mar-20001First issue
19-Jul-20001.1M48Z12AV added
15-Jan-20011.2Changed LPSRAM device (Tabl e 2 )
Reformatted; added temperature information (Ta b l e 3 , Ta b le 4 , Ta bl e 7 ,
19-Dec-20012
08-Feb-20022.1Remove 85ns speed grade (Ta bl e 3 , Ta bl e 4 , and Ta bl e 8 )
29-May-20022.2Modify reflow time and temperature footnotes (Ta b le 5 )
18-Nov-20022.3Modified SMT text (Figure 1, Figure , and Tabl e 2 )
Ta bl e 8 , Ta b le 9 , and Ta bl e 1 0 ); remove chipset option from Ordering
Information (Ta b le 1 2 ); remove reference to “clock”
17-Sep-20032.4
Remove references to M68xxx (obsolete) part (Figure and Tabl e 2 );
update disclaimer
30-Nov-20043Reformatted; remove extended temperature references (Ta bl e 1 2 )
21-Dec-20044
Update Marketing Status for qualification, correct drawing (Figure and
Ta bl e 1 2 )
22-Feb-20055 IR reflow, SO package updates (Ta bl e 5 )
Document reformatted.
ECOPACK package text added on coverpage.
21-Dec-20066
Note 2 concerning Leaded SOIC package removed below Ta bl e 5 .
Updated PMDIP32 package mechanical data in Section 5: Package
mechanical data; updated T
to include Grade 1 (0 to 70°C) and Grade
A
6 (-40 to 85°C).
7-Nov-20087
Indicated that M48Z512AV is Not for New Design; removed all
SNAPHAT
®
battery and SOIC package references; updated Section 5:
Package mechanical data.
02-Aug-20108
Updated Features, Section 3, Ta bl e 1 2, ECOPACK
added Section 7: Environmental information.
®
text in Section 5;
Devices are not recommended for new design (updated cover page,
24-Jun-20119
Ta bl e 1 2 ); updated footnote of Table 5: Absolute maximum ratings;
updated Section 7: Environmental information.
20/21Doc ID 5146 Rev 9
Page 21
M48Z512A, M48Z512AY, M48Z512AV
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