The M29W641D is a 64 M bit (4Mb x16 ) non-volatile memory that can be read, erased and reprogrammed. These operations can be performed
CCQ
sup-
CC
supply
PP
using a single, low voltage, 2.7V to 3.6V V
ply for the circuitry and a 1.8V to 3.6V V
for the Input/Output pins. An optional 12 V V
power supply is provided to speed up customer
programming.
On power-up the memory defaults to its Read
mode where it can be read in the same way as a
ROM or EPROM.
The highest address blo ck of the M 29W641DH or
the lowest address block of th e M29W641DL c an
be protected from accidental programming or erasure using the WP
M29W641DU does not feature the WP
pin (if WP = VIL). The
pin.
Each block can be erased indep endently so it is
possible to preserve valid dat a while old data is
erased. The blocks can be protected to prevent
accidental Program or Erase commands from
modifying the memory. Program and E rase commands are written to the Command Interface of
the memory. An on-chip Program/Erase Controller
simplifies the process of prog ramming or erasing
the memory by taking care of all of the special operations that are required to update the memory
contents. The end of a program or erase operation
can be detected and any error conditions identified. The command set required to control the
memory is consistent with JEDEC standards.
The M29W641D has an extra block, the Extended
Block, (of 32 KWords) that can be accessed using
a dedicated command. The Extended Block can
be protected and so is useful for storing security
information. However the protec tion i s not re versible, once protected the protection cannot be undone.
Chip Enable, Output Enable and Write Enable signals control the bus operation of the memory.
They allow simple conne ction to most m icroprocessors, often without additional logic.
The memory is offered in a 48-pin TSOP package
(M29W641DL and M29W641DH) or in a 63- ball TFBGA package (M29W64 1DU). All de vices a re del ivered with all the bits erased (set to 1) .
(M29W641DH and M29W641DL only)
Ready/Busy Output (M29W641DU
only)
WP
V
CC
V
CCQ
V
PP
V
SS
Write Protect
Supply Voltage
Supply Voltage for Input/Output
Supply Voltage for Fast Program
(optional)
Ground
5/42
Page 6
M29W641DH, M29W641DL, M29W641DU
Figure 3. TSOP Connections
A15
A14
A13
A12
A11
1
48
A16
V
CCQ
V
SS
DQ15
DQ7
A10DQ14
37
36
DQ6
DQ13
DQ5
DQ12
DQ4
V
CC
DQ11
DQ3
DQ10
DQ2
DQ9
DQ1
DQ8
DQ0
G
V
SS
E
A0
A21
A20
RP
V
PP
WP
A19
A18
A17
A9
A8
W
A7
A6
A5
A4
A3
A2
A1
12
M29W641D
13
2425
AI06698
6/42
Page 7
M29W641DH, M29W641DL, M29W641DU
Figure 4. TFGBA Connections (Top view through package)
654321
A
B
NC
NC
(1)
(1)
C
D
E
F
G
H
NC
A3
A4
A2
A1
A0
(1)
A7
A17
A6
RB
V
PP
A18
A5A20
DQ0
E
DQ8
DQ2
DQ10
W
RP
A21
A19
DQ5
DQ12
A9
A8
A10
A11
DQ7
DQ14
NC
NC
V
(1)
(1)
A13
A12
A14
A15
A16
CCQ
NC
NC
87
(1)
(1)
J
K
L
NC
M
NC
G
DQ9
V
SS
(1)
NC
(1)
NC
DQ1
(1)
(1)
DQ11
DQ3
V
CC
DQ4
Note: 1. Bal l s ar e shorted to get her via the substrate but not connec ted to the die.
DQ13
DQ6
DQ15
V
SS
NC
NC
NC
NC
(1)
(1)
AI06879
(1)
(1)
7/42
Page 8
M29W641DH, M29W641DL, M29W641DU
SIGNAL DESCRIPTIONS
See Figure 2, Logic Diagram, and T able 1, Sign al
Names, for a brief overview of the signals connected to this device.
Address Inputs (A0-A21). The Address Inputs
select the cells i n the memory array to a ccess during Bus Read operations. During Bus Write operations they control the commands sent to the
Command Interface of the Program/Erase Controller.
Data Inputs/Outputs (DQ0-DQ7). The Data I/O
outputs the data stored at the selected address
during a Bus Read operation. During Bus Write
operations they represent the commands sent to
the Command Interface of the Program/Erase
Controller.
Data Inputs/Outputs (DQ8-DQ15). The Data I/O
outputs the data stored at the selected address
during a Bus Read operation. During Bus Write
operations the Command Register does not use
these bits. When reading the Status Register
these bits should be ignored.
Chip Enable (E
the memory, allowing Bus Read and Bus Write operations to be performed. When Chip Enable is
High, V
IH
Output Enable (G
trols the Bus Read operation of the memory.
Write Enable (W
the Bus Write operation of the memory’s Command Interf a c e .
Write Protect (W
available in the M29W641DH and M29W641DL
only. I t provid es a hard ware metho d of pro t ecting
the highest address block for the M29W641DH
and the lowest address block for the
M29W64 1DL. The Write Protect pin must not be
left floating or unconnected.
When Write Protect is Low, V
tects either the highest or low est address block;
Program and Erase operations in this block are ignored while Write Protect is Low.
When Write Pr otect
verts to the previous protection status for this
block. Program and Erase operations can now
modify the data in t his block unless the block is
protected using Block Protection.
Ready/Busy Output (RB
is an open-drain output that can be used to identify
when the device is performing a Program or Erase
operation. During Program or Erase operations
Ready/Busy is Low, V
pedance during Read mode, Auto Select mode
and Erase Suspend mode.
After a Hardware Reset, Bus Read and Bus Write
operations cannot begin until Ready/Busy be-
). The Chip Enable, E, activates
, all other pins are ignored.
). The Output Enable, G, con-
). The Write Enable, W, controls
P). The Write Protect pin is
, the memory pro-
IL
is High, VIH, the memory re-
). The Ready/Busy pin
. Ready/Busy is high-im-
OL
comes high-impedance. See Tabl e 13 and Figure
12, Reset/Block Temporary Unprotect AC Characteristics.
The use of an open-drain output allows the Ready/
Busy pins from several memories to be connected
to a single pull-up resistor. A Low will then indicate
that one, or more, of the memories is busy.
Reset/Block Temporary Unprotect (RP
). The
Reset/Block Temporary Unprotect pin can be
used to apply a Hardware Reset to the memory or
to temporarily unprotect all Blocks that hav e b een
protected.
Note that if Write Protect
(WP) is at VIL, then one
of the two outermost blocks will remain p rotected
even if RP is at V
.
ID
A Hardware Reset is achieved by holding Reset/
Block Temporary Unprotect Low, V
. After Reset/Block Temporary Unprotect
t
PLPX
goes High, V
, the memory will be ready for Bus
IH
Read and Bus Write operations after t
t
, whichever occurs las t. See Table 13 and
RHEL
, for at least
IL
PHEL
or
Figure 12, Reset/Block T emporary Unprotect AC
Characteristics, for more details.
Holding RP
at VID will temporarily unprotect the
protected Blocks in the memory. Program and
Erase operations on all blocks will be possible.
The transition from V
t
V
.
PHPHH
(VPP). When the VPP pin is raised to V
PP
to VID must be slower than
IH
PPH
the memory automatically enters the Unlock Bypass mode. When the pin is returned to V
IH
or V
normal operation resumes. During Unlock Bypass
Program operations the memory draws I
PP
from
the pin to supply the programming circuits. See the
description of the Unlock Bypass comm and in the
Command Interface section. The transitions from
V
to VPP and from VPP to VIH must be slower
IH
than t
Never raise the pin to V
, see Figure 13.
VHVPP
from any mode except
PP
Read mode, otherwise the memory may be left in
an indeterminate state.
V
Supply Voltage (2.7V to 3.6V). VCC pro-
CC
vides the power supply for all operations (Read,
Program and Erase).
The Command Interface is disabled when the V
CC
Supply Voltage is less than the L ockout Voltage,
. This prevents Bus Write operations from ac-
V
LKO
cidentally damaging the data during power up,
power down and power surges. If the Program/
Erase Controller is programming or erasing during
this time then the operation aborts and the memory contents being altered will be invalid.
V
Supply Voltage (1.8V to 3.6V). V
CCQ
CCQ
provides the power supply to the I/O pins and enables
all Outputs to be powered indepen dently of V
CC
IL
.
8/42
Page 9
M29W641DH, M29W641DL, M29W641DU
V
can be tied to VCC or can use a separate
CCQ
supply.
V
Ground. VSS is the reference for all voltage
SS
measurements. The device f eatu res two V
SS
pins
which must be both connected to the system
ground.
Note: Each device in a system should have
V
CC, VCCQ
and VPP decoupled from V
SS
with a
Table 2. Bus Operations
OperationEGW
Bus Read
Bus Write
Output DisableX
Standby
Read Manufacturer
Code
Read Device Code
Extended Memory
Block Verify Code
Note: X = VIL or VIH.
V
V
V
V
V
V
V
IL
V
IL
V
IH
V
IL
V
IL
V
IL
V
IL
IH
IH
Cell AddressData Output
IH
V
Command AddressData Input
IL
V
XHi-Z
IH
XXXHi-Z
A0 = VIL, A1 = VIL, A9 = VID,
V
IL
IL
IL
IH
Others V
A0 = VIH, A1 = VIL, A9 = VID,
V
IH
Others V
A0 = VIH, A1 = VIH, A6 = VIL,
V
IH
A9 = V
0.1µF ceramic capacitor close to the pin for
current surge protection (high frequency, inherently low inductance ca pacitors should b e
as close as possible to the device). See Figure
8, AC Measurement Load Circuit. The PCB
trace widths should be sufficient to carry the
required V
program and erase curr ents. S ee
PP
Table 9, DC Characteristics.
Address Inputs
A0-A21
or V
IL
IH
or V
IL
IH
, Others VIL or V
ID
IH
Data Inputs/Outputs
DQ15-DQ0
0020h
22C7h
98h (factory locked, WP protects
highest address block)
18h (not factory locked, WP
protects highest address
block)
88h (factory locked, WP
lowest block)
08h (not factory locked, WP
protects lowest block)
protects
9/42
Page 10
M29W641DH, M29W641DL, M29W641DU
BUS OPERATIONS
There are five standard bus operations that control
the device. These are Bus Read, Bus Wri te, Output Disable, Standby and Automatic Standby. See
Table 2, Bus Operations, for a summary. Typically
glitches of less than 5ns on Chip Enabl e o r Write
Enable are ignored by t he mem ory and do not a ffect bus operations.
Bus Read. Bus Read operations read from the
memory cells, or specific registers in the Command Interface. A valid Bus Read operation involves setting the desired address on the Address
Inputs, applying a Low sig nal, V
and Output Enable and keeping Write Enable
High, V
. The Data Inputs/Outputs will output the
IH
value, see Figure 9, Read Mode AC W aveforms,
and Table 10, Read AC Characteristics, for details
of when the output becomes valid.
Bus Write. Bus Write operations write to the
Command Interface. A valid Bus Write operation
begins by setting the desire d address on t he Address Inputs. The Address Inputs are latched by
the Command Interface on the falling edge of Chip
Enable or Write Enable, whichever occurs last.
The Data Inputs/Outputs a re latched by the Command Interface on the rising edge of Chip Enable
or Write Enable, whichever occurs first. Output Enable must remain High, V
IH
Write operation. See Figure 10 and Figure 11,
Write AC Waveforms, and Table 11 and Table 12,
Write AC Characteristics, for details of the timing
requirements.
Output Disa bl e . The Data Inputs/Outputs are in
the high impedance s tate when Output Enable is
High, V
.
IH
Standby. When Chip Enable is High, V
memory enters Standby mode and the Data Inputs/Outputs pins are placed in the high-impedance state. To reduce the S upply Current to the
Standby Supply Current, I
CC2
, to Chip Enable
IL
, during the whole Bus
, the
IH
, Chip Enable should
be held within V
± 0.2V. For the Standby current
CC
level see Table 9, DC Characteristics.
During program or erase operations the memory
will continue to use the Program/Erase Supply
Current, I
, for Program or Erase operations un-
CC3
til the operation completes.
Automatic Standby. If CMOS levels (V
± 0.2V)
CC
are used to drive the bus and the bus is inactive for
300ns or more the memory enters Automatic
Standby where the internal Supply Current is reduced to the Standby Supply Current, I
CC2
. The
Data Inputs/Outputs will still output data if a Bus
Read operation is in progress.
Special Bus Operations
Additional bus operations can be performed to
read the Electronic Signature and also to apply
and remove Block Protec tion. These bus operations are intended for use by programming equipment and are not usually used in applications.
They require V
to be applied to some pins.
ID
Electronic Signature. The memory has two
codes, the manufacturer code and the device
code, that can be read to identify the memory.
These codes can be read by applying t he signals
listed in Table 2, Bus Operations.
Block Protect and Chip Unprotect.
Groups of
blocks can be protected against accidental Program or Erase. The whole chip can be unprotected
to allow the data inside the blocks to be changed.
Write Protect
the outermost blocks. When Write Protect
at V
one of the two outer mos t blo cks is protect-
IL
(WP) can be used to protect one of
(WP) is
ed and r emai ns prote cte d r egar dle ss o f th e Bloc k
Protection Status or the Reset/Block Temporary
Unprotect pin statu s. For the M 29W641D H, it is
the highest addressed block that can be protected. For th e M29W 641DL, it i s t he l owest.
Block Protect and Chip Unprote ct operations are
described in Appendix D.
10/42
Page 11
COMMAND INTERFACE
All Bus Write operations t o the me mory are in terpreted by the Command Interface. Commands
consist of one or more sequential Bus Write operations. Failure to observe a valid sequence of Bus
Write operations will result in the memory returning to Read mode. The long command sequences
are imposed to maximize data security.
See Table 3 for a summary of the commands.
Read/Reset Command
The Read/Reset command returns the memory to
its Read mode where it behaves like a ROM or
EPROM. It also resets the errors in the Status
Register. Either one or three Bus Write operations
can be used to issue the Read/Reset command.
The Read/Reset command can be issued, between Bus Write cycles before the start of a program or erase operation, to return the device to
read mode. If the Read/Reset command is issued
during the timeout of a Block erase operation then
the memory will take up to 10µs to abort. During
the abort period no valid data can be read from the
memory. The Read/Reset command will not abort
an Erase operation when issued while in Erase
Suspend.
Auto Select Command
The Auto Select command is used to read the
Manufacturer Code, the Device Code , the Block
Protection Status and the Extended Memory Block
Verify Code. Three consecutive B us Write operations are required to iss ue the Auto Select command. Once the Auto Select command is issued
the memory remains in Auto Select mode until a
Read/Reset command is issued. Read CFI Query
and Read/Reset comma nds are ac cept ed i n Aut o
Select mode, all other commands are ignored.
In Auto Select mode the Manufac turer Code can
be read using a Bus Read operation with A0 = V
and A1 = VIL. The other address bits may be set to
either V
or VIH. The Manufacturer Code f or ST-
IL
Microelectronics is 0020h.
The Device Code can be read using a B us Read
operation with A0 = V
address bits may be set to e ither V
and A1 = VIL. The other
IH
or VIH. The
IL
Device Code for the M29W641D is 22C7h.
The Bl ock Prot ection S tatus of each block can be
read using a Bus Read operation with A0 = V
A1 = V
, and A 12 -A 21 spec ify i n g t he address of
IH
IL
the bl ock. The oth er addr ess bit s may b e set t o either V
or VIH. If t h e ad dr ess ed b loc k is pro tec te d
IL
then 01h is output on Data Inputs/Outputs DQ0DQ7, otherwise 00h is output.
Read CFI Query Command
The Read CFI Query Command is used to read
data from the Common Flash Interface (CFI)
Memory Area. This command is valid when the de-
M29W641DH, M29W641DL, M29W641DU
vice is in the Read Array mode, or when the device
is in Autose lec ted mode .
One Bus Write cycle is required to issue the Read
CFI Query Command. Once the command is issued subsequent Bus Read ope rations read from
the Common Flash Interface Memory Area.
The Read/Reset command m ust be issued to return the device to the previous mode (the Read Array mode or Autoselected mode). A second Read/
Reset command would be needed if the device is
to be put in the Read Array mode from Autoselected mode.
See Appendix B, Table 18 to Table 23 for details
on the information contained in the Common Flash
Interface (CFI) memory area.
Program Command
The Program command can be used to program a
value to one address in the memory array at a
time. The command requires four Bus Write operations, the final write operation latches the address and data, and starts the Program/Erase
Controller.
If the address falls in a pro tected block then the
Program command is ignored, the data remains
unchanged. The Status Register is never read and
no error condition is given.
During the program operat ion the memo ry will ignore all commands. I t is n ot poss ible t o iss ue any
command to abort or pause the operation. Typical
program times are given in Table 4. Bus Read operations during the program o peration will output
the Status Register on the Data Inputs/Outputs.
See the section on the S tatus Register for more
details.
After the program operation has completed the
memory will return to the Read mode, unle ss an
IL
error has occurred. When an error occurs the
memory will continue to output the Status Register. A Read/Reset command must be issued to reset the error condition and return to Read mode.
Note that the Program command cannot change a
bit set at ’0’ bac k to ’1’. One of the E rase Commands must be used to set all the bits in a block or
in the whole memory from ’0’ to ’1’.
Fast Program Commands
,
There is a Fast Program command available to improve the programming throughput, by writing several adjacent words or bytes in parallel: the Double
Word Program command.
Double Word Program Command. Th e D oub l e
Word Program command is used to write a p age
of two adjacent words in parallel. Th e two words
must differ only for the address A0.
Three bus write cycles are necessary to issue the
Double Word Program command.
11/42
Page 12
M29W641DH, M29W641DL, M29W641DU
■ The first bus cycle sets up the Double Word
Program Command.
■ The second bus cycle latches the Address and
the Data of the first word to be written.
■ The third bus cycle latches the Address and the
Data of the second word to be written and starts
the Program/Erase Controller.
Only one bank can be programmed at any one
time. The other b ank must be in Read mode or
Erase Suspend.
Programming should not be attempted when V
is not at V
PPH
.
PP
After programming has started, Bus Read operations in the Bank being programmed output the
Status Register content, while Bus Read operations to the other B ank outpu t the cont ents of t he
memory ar ray.
After the program operation has completed the
memory will return to the Read mode, unle ss an
error has occurred. When an error occurs Bus
Read operations to the Bank where the command
was issued will continue to output the Status Register. A Read/Reset command must be issued to
reset the error condition and return t o Read mode.
Note that the Fast Program commands cannot
change a bit set at ’0’ back to ’1’. One of the Erase
Commands must be used to set all the bits in a
block or in the whole memory from ’0’ to ’1’.
Typical Program times are given in Tab le 4, Program, Erase Times and Program, Erase Endurance Cycles.
Unlock Bypass Command
The Unlock Bypass command is used in conjunction with the Unlock Bypass Program command to
program the memory faster than with the standard
program commands. When th e cycle time to the
device is long (as with some EPROM programmers) considerable time saving can be m ade by
using these commands. Three Bus Write operations are required to issue the Unlock Bypass
command.
Once the Unlock Bypas s command has bee n issued the memory enters Unlock Bypass mode.
When in this mode the memory can be read as if
in Read mode.
When V
is applied to the VPP pin the memory
PPH
automatically enters the Unlock Bypass mode and
the Unlock Bypass Program command can be issued immediately.
Unlock Bypass Program Command
The Unlock Bypass Program command can be
used to program one address in the memory array
at a time. The command requires two B us Write
operations, the final write operation latches the ad-
dress and data, and starts the Program/Erase
Controller.
A Program operation initiated by issuing the Unlock Bypass Program command is identical to a
Program operation initiated by issuing the Program command. I t cannot be abo rted and a Bus
Read operation will output the Status Register.
See the Program Comma nd paragrap h f or further
details.
Unlock Bypass Reset Command
The Unlock Bypass Rese t command can be used
to return to Read/Reset mode from Unlock Bypass
Mode. Two Bus Write operations are required to
issue the Unlock Bypass Reset command. Read/
Reset command does not exit from Unlock Bypass
Mode.
Chip Erase Command
The Chip Erase command can be used to erase
the entire chip. Six Bus Write operations a re required to issue the Chip Erase Command and start
the Program/Erase Controller.
If any blocks are protected then these are ignored
and all the other blocks are erased. If all of the
blocks are protect e d th e Chip Erase op erat i on appears to start but will terminate within about 100µs,
leaving the data unchanged. No error condition is
given when protected blocks are ignored.
During the erase operation the memory will ignore
all commands, including the Erase Suspen d command. It is not possible to i ssue any c ommand t o
abort the operation. Typical chip erase tim es are
given in Table 4. All Bus Read operations during
the Chip Erase operation will output the Status
Register on the Data Inputs/Outputs. See the section on the Status Register for more details.
After the Chip Erase operation has completed t he
memory will return to the Read Mode, unle ss an
error has occurred. When an error occurs the
memory will continue to output the Status Register. A Read/Reset command must be issued to reset the error condition and return to Read Mode.
The Chip Erase Command sets all of the bits in unprotected blocks of the memory to ’1’. All previous
data is lost.
Block Erase Command
The Block Erase com mand can be used to erase
a list of one or more blocks. Six Bus Write operations are required to select the first block in the li st.
Each additional block in the list can be selected by
repeating the sixth Bus Write operation using the
address of the additional block. The B lock Erase
operation starts the Program/Erase Controller
about 50µs after the last Bus Write operation.
Once the Pr ogram /Erase Co ntroller st arts it is not
possible to select any more blocks. Each additional block must therefore be selected within 50µs of
12/42
Page 13
M29W641DH, M29W641DL, M29W641DU
the lowest address block. The 50µs timer restarts
when an additional block is selected. The Status
Register can be read after the sixth Bus Write operation. See the Status Register section for details
on how to identify if th e Program /Erase Controller
has started the Block Erase operation.
If any selected blocks are protected then these are
ignored and all the other selected blocks are
erased. If all of the selected blocks are p rotected
the Block Erase operation appears to start but will
terminate within about 100µs, leaving the data unchanged. No error condition is given when protected blocks are ignored.
During the Block Erase operation the me mory wi ll
ignore all commands except the Erase Susp end
command. Typical b lock era se tim es are g iven in
Table 4. All Bus Read operations during the Block
Erase ope ra tion will outp ut the S t atus R e gister on
the Data Inputs/Outputs. See the section on the
Status Register for more details.
After the Block Erase operation has completed the
memory will return to the Read Mode, unle ss an
error has occurred. When an error occurs the
memory will continue to output the Status Register. A Read/Reset command must be issued to reset the error condition and return to Read mode.
The Block Erase Command sets all of the bits in
the unprotected selected blocks to ’1’. All previous
data in the selected blocks is lost.
Erase Suspend Command
The Erase Suspend Command may be used to
temporarily suspend a B lock Eras e operation and
return the memory to Read mode. T he comm and
requires one Bus Write operation.
The Program/Erase Controller will sus pend within
the Erase Suspend Latency time of the Erase Suspend Command being issued. Once the Program/
Erase Controller has stopped the mem ory will be
set to Read mode and the E ras e wi ll be s uspended. If the Erase Suspend command is issued during the period when the memory is waiting for an
additional block (before the Program/Er ase Controller starts) then the Erase is suspended immediately and will start immediately when the Erase
Resume Command is issued. It is not possibl e to
select any further blocks to erase after the Erase
Resume.
During Erase Suspend it is possible to Read and
Program cells in blocks that are not being erased;
both Read and Program operations behave as
normal on these blocks. If any attempt is made to
program in a protected block or in the suspended
block then the Program comm and is ignored and
the data remains unchanged. The Status Register
is not read and no error condi tion is given. Reading from blocks that are being erased will output
the Status Register.
It is also possible to issue the Auto Select, Read
CFI Query and Unlock Bypass commands du ring
an Erase Suspend. The Read/Reset command
must be issued to return the device to Read Array
mode before the Resume command will be accepte d.
Erase Resume Command
The Erase Resume command must be used to restart the Program/Erase Controller after an Erase
Suspend. The device must be in Read Array mode
before the Resume command will be accepted. An
erase can be suspe nded and resumed mo re t han
once.
Enter Extended Block Command
The device has an extra 32 KWord block (Extended Block) that can only be accessed using the Enter Extended Block command. Three Bus write
cycles are required to issue the Exte nded Block
command. Once the command has been issued
the device enters Extended B lock mo de where all
Bus Read or Write operations to the Boot Block
addresses access the Extended Block. The Extended Block (with the same address as the Boot
Blocks) cannot be erased, and can be t reated as
one-time programmable (OTP) memory. In Extended Block mode the Boot Blocks are not accessible.
To exit from the Extended Block mode the Exit Extended Block command must be issued.
The Extended Block can be protected, however
once protected the protection cannot be undone.
Exit Extended Block Com m a n d
The Exit Extended Block command is used to exit
from the Extended Block mod e and ret urn the device to Read mode. Four Bus Write operations are
required to issue the command.
Block Protect andChip Unprotect Commands
Groups of blocks can be protected against acci-
dental Program or E rase. The whole chip can be
unprotected to allow the data i nside the blocks to
be changed.
Block Protect and Chip Unprote ct operations are
described in Appendix D.
13/42
Page 14
M29W641DH, M29W641DL, M29W641DU
Table 3. Commands
Bus Write Operations
Command
1X F0
Read/Reset
3555AA2AA55XF0
Auto Select3555AA2AA5555590
Program4555AA2AA55555A0PAPD
Double Word Program355550PA0PD0PA1PD1
Unlock Bypass3555AA2AA5555520
1st2nd3rd4th5th6th
Length
Addr Data Addr DataAddrData Addr Data Addr Data Addr Dat a
Note: X Do n’ t Care, PA P rogram Address, PD Pro gram Data , B A Any address in the Block. All values i n the table are i n hexadecim al .
Table 4. Program, Erase Times and Progra m , Erase Endurance Cycles
ParameterMin
Typ
(1, 2)
Chip Erase80
Block Erase (32 KWords)0.8
Erase Suspend Latency Time
Program (Word)10
Double Word Program10
Chip Program (Word by Word)40
Chip Program (Double Word)20
Program/Erase Cycles (per Block)100,000cycles
Data Retention20years
Note: 1. Typical value s m easured at room temp erature and nominal vol t ages.
2. Sampled, but not 100% tested.
3. Maximum value measu red at worst cas e conditio ns for both temperature an d V
4. Maximum value measu red at worst cas e conditio ns for both temperature an d V
after 100,0 0 program/erase cycle s.
CC
.
CC
Max
400
6
50
200
200
200
100
(4)
(4)
(3)
(3)
(3)
(3)
(3)
(2)
Unit
s
s
µs
µs
µs
s
s
14/42
Page 15
STATUS REGISTER
Bus Read operations from any address always
read the Status Register during Program and
Erase operations. It is also read during Erase Suspend when an address within a block being erased
is accessed.
The bits in the Status Register are summarized in
Table 5, Status Register Bits.
Data Polling Bit (DQ7). The Data Polling Bit can
be used to identify whether the Program/Erase
Controller has successfully completed its operation or if it has responded to an Erase Suspend.
The Data Polling Bit is output on DQ7 when the
Status Register is read.
During Program operations the Data Polling Bit
outputs the complement of the bit being programmed to DQ7. After successful completion of
the Program operation the memory returns to
Read mode and Bus Read operations from the address just programmed o utput DQ7, not its complement.
During Er ase ope rations the Data Polling Bit ou t-
puts ’0’, the complement of the erased state of
DQ7. After successful completion of the Erase operation the memory returns to Read Mode.
In Erase Suspend mode the Data Polling Bit will
output a ’1’ during a Bus Read operation within a
block being erased. The Data Polling Bit will
change from a ’0’ to a ’1’ when the Program/Erase
Controller has suspended the Erase operation.
Figure 5, Data Polling Flowchart, gives an example of how to use the Data Polling Bit. A Valid Address is the address being programmed or an
address within the block being erased.
Toggle Bit (DQ6). The Toggle Bit can be used to
identify whether the Program/Erase Controller has
successfully completed its operation or if it has responded to an Erase Suspen d. The Toggle Bit is
output on DQ6 when the Status Register is read.
During Program and Erase operations the Toggle
Bit changes from ’0’ to ’ 1’ to ’ 0’, et c., with su ccessive Bus Read operations at any address. After
successful completion of the operation the memory returns to Read mode.
During Erase Suspend mode the Toggle Bit will
output when addressing a cell within a block being
erased. The Toggle Bit will stop toggling when the
Program/Erase Controller has suspended the
Erase operation.
Figure 6, Dat a Toggle Flowchart, gives an example of how to use the Data Toggle Bit.
M29W641DH, M29W641DL, M29W641DU
Error Bit (DQ5). The Error Bit can be used to
identify errors detected by the Program/Erase
Controller. The Error B it is set to ’1’ when a Program, Block Erase or Chip Erase operation fails to
write the correct data to the memory. If the Error
Bit is set a Read/Rese t command must be iss ued
before other commands are issued. The E rror bit
is output on DQ5 when the Status Register is read.
Note that the Program command cannot change a
bit set to ’0’ back to ’1’ and attempting to do so will
set DQ5 to ‘1’. A Bus Read operation to that address will s h ow the bit is s ti ll ‘0’. One o f t he E r as e
commands must b e used to set all the bits in a
block or in the whole memory from ’0’ to ’1’.
Erase Timer Bit (DQ3). The Erase Timer Bit can
be used to identify the start of Program/Erase
Controller operation during a Block Erase command. Once the Program/Erase Controller starts
erasing the Erase Timer Bit is set to ’1’. Before the
Program/Erase Controller starts the Erase Timer
Bit is set to ’0’ and additional block s to be erased
may be written to the Command Interface. The
Erase Timer Bit is output on DQ3 when the Status
Register is read.
Alternative Toggle Bit (DQ2). The Alternative
Toggle Bit can be used to monitor the Program/
Erase controller during Erase operations. The Alternative Toggle Bit is output on DQ2 when the
Status Register is read.
During Chip Erase and Block Erase operations the
Toggle Bit changes from ’0’ to ’1’ to ’0’, etc., with
successive Bus Read operations from addresses
within the blocks being erased. A protected block
is treated the same as a block not being erased.
Once the operation completes the memory returns
to Read mode.
During Erase Suspend the Alternative Toggle Bit
changes from ’0’ to ’1’ to ’0’, etc. with successive
Bus Read operations from addresses within the
blocks being erased. Bus Read operations to addresses within blocks not being erased will ou tput
the memory cell data as if in Read mode.
After an Erase operation that c auses t he Error Bit
to be set the Alternative Toggle Bit can be used to
identify which block or blocks have caused the error. The Alternative Toggle Bit changes from ’0’ to
’1’ to ’0’, etc. with successive Bus Re ad Operations from addresses within blocks that have not
erased correctly. The Alternative Togg le Bit does
not change if the addressed block has erased correctly.
15/42
Page 16
M29W641DH, M29W641DL, M29W641DU
Table 5. Status Register Bits
OperationAddressDQ7DQ6DQ5DQ3DQ2
ProgramAny AddressDQ7Toggle0––0
Program During Erase SuspendAny AddressDQ7
Toggle0––0
RB
(1)
Program ErrorAny AddressDQ7
Toggle1––0
Chip EraseAny Address0Toggle01Toggle0
Erasing Block0Toggle00Toggle0
Block Erase before timeout
Non-Erasing Block0Toggle00
No
Toggle
Erasing Block0Toggle01Toggle0
Block Erase
Erase Suspend
Non-Erasing Block0Toggle01
Erasing Block1
No
Toggle
0–Toggle1
No
Toggle
Non-Erasing BlockData read as normal1
Erase Error
Good Block Address0Toggle11
No
Toggle
Faulty Block Address0Toggle11Toggle0
Note: 1. Only the M29W641DU device is concerned.
2. Unspecif i ed data bits should be ignored.
0
0
0
16/42
Page 17
M29W641DH, M29W641DL, M29W641DU
Figure 5. Dat a Po ll i ng Fl o wc h a rtFigure 6. Dat a Toggle Flow c hart
START
READ DQ5 & DQ7
at VALID ADDRESS
DQ7
DATA
NO
DQ5
READ DQ7
at VALID ADDRESS
DQ7
DATA
FAILPASS
= 1
YES
=
NO
YES
YES
=
NO
AI90194
START
READ DQ6
READ
DQ5 & DQ6
DQ6
=
TOGGLE
YES
NO
DQ5
= 1
YES
READ DQ6
TWICE
DQ6
=
TOGGLE
YES
FAILPASS
NO
NO
AI90195B
17/42
Page 18
M29W641DH, M29W641DL, M29W641DU
MAXIMUM RATIN G
Stressing the device ab ove the rating listed in t he
Absolute Maximum Ratings table m ay cause permanent damage to the device. Exposure to Absolute Maximum Rating conditions for extended
periods may affect device reliability. These are
stress ratings only and operation of the dev ice at
Table 6. Absolute Maximum Ratings
SymbolParameterMinMaxUnit
T
BIAS
T
STG
V
CCQ
V
CC
V
ID
(3)
V
PP
Note: 1. M in i m um voltage ma y undershoot to –2V during transitio n and for less t han 20ns during transitions.
2. Maximum voltage may overshoot to V
3. V
PP
Temperature Under Bias–50125°C
Storage Temperature
Input/Output Supply Voltage
(1,2)
Supply Voltage–0.64V
Identification Voltage–0.613.5V
Program Voltage–0.613.5V
+2V during transition and for less than 20ns during transitions.
must not rem ai n at 12V for more than a total of 80hrs.
CC
these or any other conditions above those indicated in the Operating sections of this specification is
not implied. Refer also to the STMicroelectronics
SURE Program and ot her relevant quality documents.
–65150°C
–0.64V
18/42
Page 19
M29W641DH, M29W641DL, M29W641DU
DC AND AC PARAMETERS
This section summarizes the operat ing and measurement conditions, and the DC and AC characteristics of the device. The parameters in t he DC
and AC Characteristic tables that follow are derived from tests performed under the Measure-
ment Conditions summarized in the relevant
tables. Designers should chec k th at the o perat ing
conditions in their circuit matc h the meas urement
conditions when relying on the quoted parameters.
M29W641D
Unit7090100120
Input Pulse Voltages
Input and Output Timing Ref.
Voltages
0 to V
V
CCQ
CCQ
/2V
0 to V
CCQ
CCQ
/2V
0 to V
CCQ
CCQ
/2V
0 to V
CCQ
CCQ
/2
Figure 7. AC Measurement I/O WaveformFigure 8. AC Measurement Load Circuit
V
CCQ
0V
V
CCQ
AI05557b
V
/2
PP
0.1µF
V
CCQ
V
CC
DEVICE
UNDER
TEST
0.1µF
0.1µF
CL includes JIG capacitance
C
L
25kΩ
25kΩ
V
CCQ
AI05558b
V
V
Table 8. Device Capacitance
SymbolParameterTest ConditionMinMaxUnit
V
V
IN
OUT
= 0V
= 0V
6pF
12pF
C
IN
C
OUT
Note: Sampled only, not 100% test ed.
Input Capacitance
Output Capacitance
19/42
Page 20
M29W641DH, M29W641DL, M29W641DU
Table 9. DC Characteristics
SymbolParameterTest ConditionMinMaxUnit
I
I
LO
I
CC1
I
CC2
I
CC3
V
V
V
PPH
I
PP
V
V
OH
V
V
LKO
Note: 1. Sampled only, not 100% tested.
Input Leakage Current
LI
Output Leakage Current
Supply Current (Read)
Supply Current (Standby)
Supply Current (Program/
Erase)
Input Low Voltage
IL
Input High Voltage
IH
Voltage for VPP Program
Acceleration
Current for VPP Program
Acceleration
Output Low Voltage
OL
(1)
Output High Voltage
Identification Voltage11.512.5V
ID
Program/Erase Lockout Supply
(1)
V oltage
0V ≤ V
0V ≤ V
OUT
E
= VIL, G = VIH,
f = 6 MHz
E
= VCC ±0.2V,
RP
= VCC ±0.2V
Program/Erase
Controller active
V
CCQ
V
CCQ
= 3.0V ±10%
V
CC
= 3.0V ±10%
V
CC
I
= 4.0mA, VCC = V
OL
= –2.0mA, VCC = V
I
OH
I
= –100µA, VCC = V
OH
IN
≤ V
≤ V
≤ V
≤ V
CCQ
CC
CC
CCQ
V
V
V
PP
IL
PP
V
pin =
or V
pin =
PPH
CCmin
CCmin
CCmin
±1
±1
µA
µA
10mA
100
IH
20mA
µA
20mA
V
CCQ
0.8
+ 0.3
V
V
–0.5
0.7V
CCQ
11.512.5V
15mA
0.45V
0.85V
V
CCQ
CCQ
– 0.4
V
V
1.82.3V
20/42
Page 21
Figure 9. Read Mode AC Waveforms
A0-A21
tAVQVtAXQX
E
G
DQ0-DQ7/
DQ8-DQ15
M29W641DH, M29W641DL, M29W641DU
tAVAV
VALID
tELQVtEHQX
tELQXtEHQZ
tGLQXtGHQX
tGLQV
tGHQZ
VALID
AI06699
Table 10. Read AC Characteristics
SymbolAltParameterTest Condition
E
t
AVAV
t
AVQV
t
ELQX
t
ELQV
t
GLQX
t
GLQV
t
EHQZ
t
GHQZ
t
EHQX
t
GHQX
t
AXQX
Note: 1. Sampled only, not 100% tested.
t
Address Valid to Next Address Valid
RC
t
Address Valid to Output Valid
ACC
(1)
t
(1)
(1)
(1)
Chip Enable Low to Output Transition
LZ
t
Chip Enable Low to Output Valid
CE
t
Output Enable Low to Output Transition
OLZ
t
Output Enable Low to Output Valid
OE
t
Chip Enable High to Output Hi-Z
HZ
t
Output Enable High to Output Hi-Z
DF
Chip Enable, Output Enable or Address
t
OH
Transition to Output Transition
= VIL,
G
= V
E
= VIL,
G
= V
G
= V
G
= V
E
= V
E
= V
G
= V
E
= V
IL
IL
IL
IL
IL
IL
IL
IL
M29W641D
Unit
7090100120
Min7090100120ns
Max7090100120ns
Min0000ns
Max7090100120ns
Min0000ns
Max30353550ns
Max25303030ns
Max25303030ns
Min0000ns
21/42
Page 22
M29W641DH, M29W641DL, M29W641DU
Figure 10. Write AC Waveforms, Write Enable Controlled
tAVAV
A0-A21
tAVWL
E
VALID
tWLAX
tWHEH
tELWL
G
tWLWHtGHWL
W
tDVWH
DQ0-DQ7/
DQ8-DQ15
V
CC
tVCHEL
RB
tWHRL
Note: 1. RB concerns the M29W461DU only.
Table 11. Write AC Characteristics, Write Enable Controlled
SymbolAltParameter
tWHGL
tWHWL
tWHDX
VALID
AI06800b
M29W641D
Unit
7090100120
t
AVAV
t
ELWL
t
WLWH
t
DVWH
t
WHDX
t
WHEH
t
WHWLtWPH
t
AVWL
t
WLAX
t
GHWL
t
WHGL
t
WHRL
t
VCHEL
Note: 1. This timing concerns the M29W461DU only.
(1)
t
WC
t
CS
t
WP
t
DS
t
DH
t
CH
t
AS
t
AH
t
OEH
t
BUSY
t
VCSVCC
Address Valid to Next Address ValidMin7090100120ns
Chip Enable Low to Write Enable LowMin0000ns
Write Enable Low to Write Enable HighMin35353550ns
Input Valid to Write Enable HighMin45454550ns
Write Enable High to Input TransitionMin0000ns
Write Enable High to Chip Enable HighMin0000ns
Write Enable High to Write Enable LowMin30303030ns
Address Valid to Write Enable LowMin0000ns
Write Enable Low to Address TransitionMin45454550ns
Output Enable High to Write Enable LowMin0000ns
Write Enable High to Output Enable LowMin0000ns
Program/Erase Valid to RB LowMax90909090ns
High to Chip Enable Low
22/42
Min50505050µs
Page 23
M29W641DH, M29W641DL, M29W641DU
Figure 11. Write AC Waveforms, Chip Enable Controlled
tAVAV
A0-A21
tAVEL
W
VALID
tELAX
tEHWH
tWLEL
G
tELEHtGHEL
E
tDVEH
DQ0-DQ7/
DQ8-DQ15
V
CC
tVCHWL
RB
Note: 1. RB concerns the M29W461DU only.
Table 12. Write AC Characteristics, Chip Enable Controlled
SymbolAltParameter
t
AVAV
t
WLEL
t
ELEH
t
DVEH
t
EHDX
t
EHWH
t
EHEL
t
AVEL
t
ELAX
t
GHEL
t
EHGL
t
EHRL
t
VCHWLtVCSVCC
Note: 1. This timing concerns the M29W461DU only.
(1)
t
WC
t
WS
t
CP
t
DS
t
DH
t
WH
t
CPH
t
AS
t
AH
t
OEH
t
BUSY
Address Valid to Next Address ValidMin7090100120ns
Write Enable Low to Chip Enable LowMin0000ns
Chip Enable Low to Chip Enable HighMin45454550ns
Input Valid to Chip Enable HighMin45454550ns
Chip Enable High to Input TransitionMin0000ns
Chip Enable High to Write Enable HighMin0000ns
Chip Enable High to Chip Enable LowMin30303030ns
Address Valid to Chip Enable LowMin0000ns
Chip Enable Low to Address TransitionMin45454550ns
Output Enable High Chip Enable LowMin0000ns
Chip Enable High to Output Enable LowMin0000ns
Program/Erase Valid to RB LowMax90909090ns
High to Write Enable Low
Min50505050µs
tEHGL
tEHEL
tEHDX
VALID
tEHRL
M29W641D
7090100120
AI06801b
Unit
23/42
Page 24
M29W641DH, M29W641DL, M29W641DU
Figure 12. Reset/Block Temporary Unp rotec t AC Waveforms
E, G
W,
tPHWL, tPHEL, tPHGL
RB
RP
Note: 1. RB concerns the M29W461DU only.
Table 13. Reset/Block Temporary Unprotect AC Characteristics
SymbolAltParameter
(1)
t
PHWL
t
PHEL
(1)
t
PHGL
(1, 2)
t
RHWL
(1, 2)
t
RHEL
(1, 2)
t
RHGL
t
PL YHtREADY
t
PLPX
(1)
t
PHPHH
(1)
t
VHVPP
Note: 1. Sampled only, not 100% tested.
2. These timings concern the M29W461DU only.
RP High to Write Enable Low, Chip Enable Low,
t
RH
Output Enable Low
RB High to Write Enable Low, Chip Enable Low,
t
RB
Output Enable Low
RP Low to Read ModeMax50505050µs
t
RP Pulse WidthMin500500500500ns
RP
t
RP Rise Time to V
VIDR
VPP Rise and Fall Time
tPLPX
tPLYH
Min50505050ns
Min0000ns
ID
Min500500500500ns
Min250250250250ns
tRHWL, tRHEL, tRHGL
tPHPHH
AI06802b
M29W641D
Unit
7090100120
Figure 13. Accelerated Program Timing Waveforms
V
PP
VPP Pin
V
or V
IL
IH
24/42
tVHVPP
tVHVPP
AI06806
Page 25
M29W641DH, M29W641DL, M29W641DU
PACKAGE MECHANICAL
Figure 14. TSO P48 – 48 lead Plastic Thin Smal l Outline, 12 x 20mm, Package Outline
A2
1N
e
E
B
N/2
D1
D
DIE
A
CP
C
TSOP-a
Note: Drawing is not to scale.
LA1α
Table 14. TSOP48 – 48 lead Plastic Thin Small Outline, 12 x 20mm, Package Me chan ica l Data
641DU = 64 Mbit (x16), Uniform Block, No Write Protection
Speed
70 = 70ns
90 = 90ns
10 = 100ns
12 = 120ns
= 2.7 to 3.6V
CC
Package
N = TSOP48: 12 x 20 mm (M29W641DH and M29W641DL only)
ZA = TFBGA63: 7 x 11mm, 0.80mm pitch (M29W641DU only)
Temperature Range
1 = 0 to 70 °C
6 = –40 to 85 °C
Option
T = Tape & Reel Packing
E = Lead-free Package, Standard Packing
F = Lead-free Package, Tape & Reel Packing
Note: This product is also available with the Extended Block factory locked. For further details and ordering
information contact your nearest ST sales office.
Devices are shipped from the factory with the memory content bits erased to 1. For a list of available options (Speed, Package, et c.) o r for further info rmation on a ny aspect of this devi ce, please con tact your
nearest ST Sales Office.
Note: 1. Used as the Ext ended Block Ad dresses in E xt ended Block m ode.
Protection Group
3E0000h–3E7FFFh
3F8000h–3FFFFFh
31/42
Page 32
M29W641DH, M29W641DL, M29W641DU
APPENDIX B. COMMON FLASH INTERFACE (CFI)
The Common Flash Interface is a JEDEC approved, standardized data structure that can be
read from the Flash memory device. It allows a
system software to query the device to det ermine
various electrical and t iming parameters, density
information and functions supported by the memory. The system can interface easily with the device, enabling the software to upgrade itself when
necessary.
Table 18. Query Structure Overvi ew
AddressSub-section NameDescription
10hCFI Query Identification StringCommand set ID and algorithm data offset
1BhSystem Interface InformationDevice timing & voltage information
27hDevice Geometry DefinitionFlash device layout
40h
61hSecurity Code Area64 bit unique device number
Note: Query data are always presented on the lowest order data outputs.
Primary Algorithm-specific Extended
Query table
When the CFI Query Command is issued the device enters CFI Query mode and the data structure
is read from the memory. Table 18 to Table 23
show the addresses used to retrieve the data.
The CFI data structure also contains a security
area where a 64 bit unique security number is written (see Table 23, Security Code Area). This area
can be accessed only in Read mode by the final
user. It is impossible to change t he secu rity number after it has been written by ST.
Additional information specific to the Primary
Algorithm (optional)
bit 7 to 4BCD value in volts
bit 3 to 0BCD value in 100 mV
Logic Supply Maximum Program/Erase voltage
V
CC
bit 7 to 4BCD value in volts
bit 3 to 0BCD value in 100 mV
V
[Programming] Supply Minimum Program/Erase voltage
PP
bit 7 to 4HEX value in volts
bit 3 to 0BCD value in 100 mV
[Programming] Supply Maximum Program/Erase voltage
V
PP
bit 7 to 4HEX value in volts
bit 3 to 0BCD value in 100 mV
Typical timeout per single word program = 2
n
µs
Typical timeout for minimum size write buffer program = 2
Typical timeout per individual block erase = 2
Typical timeout for full chip erase = 2
n
Maximum timeout for word program = 2
Maximum timeout for write buffer program = 2
Maximum timeout per individual block erase = 2
Maximum timeout for chip erase = 2
n
times typical
n
ms
n
times typical
ms
n
times typical
n
times typical
n
µs
2.7V
3.6V
11.5V
12.5V
16µs
NA
1s
NA
256 µs
NA
8s
NA
Table 21. Device Geometry Definition
AddressDataDescriptionValue
27h0017h
28h
29h
2Ah
2Bh
0001h
0000h
0000h
0000h
2Ch0001h
2Dh
2Eh
2Fh
30h
007Fh
0000h
0000h
0001h
Device Size = 2
Flash Device Interface Code description
Maximum number of bytes in multi-byte program or page = 2
Number of Erase Block Regions. It specifies the number of
regions containing contiguous Erase Blocks of the same size.
Region 1 Information
Number of identical size erase block = 007Fh+1
Region 1 Information
Block size in Region 1 = 0100h * 256 byte
n
in number of bytes
n
8 MByte
x16
Async.
NA
1
128
64 KByte
33/42
Page 34
M29W641DH, M29W641DL, M29W641DU
Table 22. Primary Algorithm-Sp ecific Extend ed Qu ery Ta ble
AddressDataDescriptio nValue
40h0050h
"P"
41h0052h"R"
42h0049h"I"
43h0031hMajor version number, ASCII"1"
44h0030hMinor version number, ASCII"0"
45h0000hAddress Sensitive Unlock (bits 1 to 0)
46h0002hErase Suspend
47h0004hBlock Protection
48h0001hTemporary Block Unprotect
49h0004hBlock Protect /Unprotect
4Ah0000hSimultaneous Operations, 00 = not supportedNo
4Bh0000hBurst Mode, 00 = not supported, 01 = supportedNo
4Ch0000hPage Mode, 00 = not supported, 01 = 4 page word, 02 = 8 page wordNo
4Dh00B5hV
00 = required, 01= not required
Silicon Revision Number (bits 7 to 2)
00 = not supported, 01 = Read only, 02 = Read and Write
00 = not supported, x = number of blocks per protection group
00 = not supported, 01 = supported
04 = M29W400B
Supply Minimum Program/Erase voltage
PP
bit 7 to 4 HEX value in volts
bit 3 to 0 BCD value in 100 mV
Supply Maximum Program/Erase voltage
PP
bit 7 to 4 HEX value in volts
bit 3 to 0 BCD value in 100 mV
Yes
2
4
Yes
4
11.5V
12.5V
Table 23. Security Code Area
AddressDataDescription
61hXXXX
62hXXXX
63hXXXX
64hXXXX
34/42
64 bit: unique device number
Page 35
APPENDIX C. EXTENDED MEMORY BLOCK
The M29W641D has an extra block, the Extended
Block, that can be accessed using a dedicated
command.
This Extended Block is 32 KWords. It is used as a
security block (to provide a permanent security
identification number) or to store addition al information .
The Extended Block is either Factory Locked or
Customer Lockable, its status is indicated by bit
DQ7. This bit is permane ntly set t o either ‘ 1’ or ‘ 0’
at the factory and cannot be changed. When set to
‘1’, it indicates that the device is factory locked and
the Extended Block is protected. When set to ‘0’, it
indicates that the device is customer lockable and
the Extended Block is unprotected. Bit DQ7 being
permanently locked to either ‘1’ or ‘0’ is another
security feature which ensures that a customer
lockable device cannot be used instead of a factory locked one.
Bit DQ7 is the most significant bit in the Extended
Block Verify Code and a specific proced ure must
be followed to read it. See “Extended Memory
Block Verify Code
” in Table 2, Bus Operations, for
details of how to read bit DQ7.
The Extended Block can only be accessed when
the device is in Extended Block mode. Fo r det ails
of how the Extended Block mode is entered and
exited, refer to the Enter Extended Block Command and Exit E xtended Block Command para-
graphs, and to Table 3, “Commands”.
M29W641DH, M29W641DL, M29W641DU
Factory Locked Extended Block
In devices where the Extended Block is factory
locked, the Security Identification Number is written to the Extended Block address space (see Table 24, Extended Block Address and Data) in the
factory. The DQ7 bit is set to ‘1’ and the Extended
Block cannot be unprotected.
Customer Lockable Extended Block
A device where the Extended Block is customer
lockable is delivered with the DQ7 bit set to ‘0’ and
the Extended Block unprotected. It is up to the
customer to program and protect the Extended
Block but care must be taken because the protection of the Extended Block is not reversible.
There are two ways of protecting the Extended
Block:
■ Issue the Enter Extended Block command t o
place the device in Extended Block mode, then
use the In-System Technique (refer to Appendix
D, In-System Technique and to the
corresponding flowcharts, Figures 18 and 19,
for a detailed explanation of the technique).
■ Issue the Enter Extended Block command to
place the device in Extended Block mode, then
use the Programmer Technique (refer to
Appendix D, Programmer Technique and to the
corresponding flowcharts, Figures 16 and 17,
for a detailed explanation of the technique).
Once the Extended Block is programmed and protected, the Exit Extended Block command must be
issued to exit the Extended Block mode and return
the device to Read mode.
Table 24. Extended Block Address and Data
Device
M29W641D
Note: 1. See T able 17, Blo ck Addresse s.
Address
000000h-000007hSecurity Identification Number
000008h-007FFFhUnavailable
(1)
x16Factory LockedCusto mer Lockable
Data
Determined by Customer
35/42
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M29W641DH, M29W641DL, M29W641DU
APPENDIX D. BLOCK PROTECTION
Block protection can be used to prevent any operation from modifying the data stored in the memory. Once protected, Program and Erase
operations within the protected group fail to
change the data.
There are three techniques that can be used to
control Block Protection, these are the Programmer technique, the In-System technique and Temporary Unprotection. Temporary Unprotection is
controlled by the Reset/B lock Temporary Unprotection pin, RP
scriptions section.
Progra m me r Technique
The Programmer techniq ue uses high (V
age levels on some of the bus pins. These cannot
be achieved using a standard microprocessor bus,
therefore the technique is recommended on ly for
use in Programming Equipment.
To protect a group of blocks follow the flowchart in
Figure 16, Program me r E quipm ent Group Protect
Flowchart. To unprotect the whole chip it is necessary to protect all of the groups first, then all
groups can be unprotected at the same time. To
unprotect the chip follow Figure 17, Prog rammer
Equipment Chip Unprotect Flowchart. Table 25,
Programmer Technique B us Operations, gives a
summary of each operation.
The timing on these flowcharts is critical. Care
should be taken to ensure that, where a pause is
; this is described in the Signal De-
) volt-
ID
specified, it is followed as closely as possible. Do
not abort the procedure be fore reaching the end.
Chip Unprotect can take several seconds and a
user message should be provided to show that the
operation is progressing.
In-System Technique
The In-System technique requires a high volt age
level on the Reset/Blocks Temporary Unprotect
pin, RP
. This can be achieved without violating the
maximum ratings of the components on the microprocessor bus, therefore this technique is suitable
for use after the memory has been fitted to the system.
To protect a group of blocks follow the flowchart in
Figure 18, In-System Equipment Group Protect
Flowchart. To unprotect the whole chip it is necessary to protect all of the groups first, then all the
groups can be unprotected at the same time. To
unprotect the chip follow Figure 19, In-System
Equipment Chip Unprotect Flowchart.
The timing on these flowcharts is critical. Care
should be taken to en sure that, where a pau se is
specified, it is followed as closely as possible. Do
not allow the microprocessor to s ervice interrupts
that will upset the timing and do not abort the procedure before reaching the end. Chip Unprotect
can take several seconds and a user message
should be provided to show that the operation is
progressing.
Table 25. Programmer Tech niqu e Bus Op erati ons
OperationEGW
Block (Group)
(1)
Protect
Chip Unprotect
Block (Group)
Protection Verify
Block (Group)
Unprotection Verify
Note: 1. Blo ck Pr otection Gr oups are show n i n A ppendix A, Tables 17.
V
ILVIDVIL
V
IDVIDVIL
V
V
IL
IL
V
V
IL
IL
Pulse
Pulse
V
IH
V
IH
A9 = V
ID
A9 = V
A0 = VIL, A1 = VIH, A6 = VIL, A9=VID,
A12-A21 Block Address
A0 = VIL, A1 = VIH, A6 = VIH, A9 = VID,
A12-A21 Block Address
Address Inputs
A0-A21
, A12-A21 Block Address
Others = X
, A12 = VIH, A15 = VIH
ID
Others = X
Others = X
Others = X
Data Inputs/Outputs
DQ15-DQ0
X
X
Pass = XX01h
Retry = XX00h
Retry = XX01h
Pass = XX00h
36/42
Page 37
M29W641DH, M29W641DL, M29W641DU
Figure 16. Programmer Equipment Group Protect Flowchart
START
ADDRESS = GROUP ADDRESS
W = V
IH
n = 0
G, A9 = VID,
E = V
IL
Wait 4µs
W = V
IL
Wait 100µs
W = V
IH
VerifyProtectSet-upEnd
E, G = VIH,
A0, A6 = VIL,
A1 = V
IH
E = V
IL
Wait 4µs
G = V
IL
Wait 60ns
Read DATA
DATA
=
01h
YES
A9 = V
IH
E, G = V
IH
PASS
NO
++n
= 25
A9 = V
E, G = V
NO
YES
IH
IH
FAIL
AI05574
37/42
Page 38
M29W641DH, M29W641DL, M29W641DU
Figure 17. Pr ogramm er Equi pm ent Chi p Unprot ect Fl owchar t
START
PROTECT ALL GROUPS
n = 0
CURRENT GROUP = 0
VerifyUnprotectSet-upEnd
A6, A12, A15 = V
E, G, A9 = V
Wait 4µs
W = V
Wait 10ms
W = V
E, G = V
ADDRESS = CURRENT GROUP ADDRESS
A0 = VIL, A1, A6 = V
E = V
Wait 4µs
G = V
Wait 60ns
Read DATA
(1)
IH
ID
IL
IH
IH
IH
IL
IL
INCREMENT
CURRENT GROUP
38/42
=
00h
YESNO
DATA
++n
NO
= 1000
YES
A9 = V
IH
E, G = V
IH
FAILPASS
LAST
GROUP
A9 = V
E, G = V
NO
YES
IH
IH
AI05575
Page 39
M29W641DH, M29W641DL, M29W641DU
Figure 18. In-System Equipment Group Protect Flowchart
When in Extended Block mode, the block at the boot block address can be used as OTP.
Data Toggle Flow chart corrected. Double Word Program Time (typ) changed to 20s.
05-Sep-20021.1
8-Apr-20032.0
Revision numbering modified: a minor revision will be indicated by incrementing the digit
after the dot, and a major revision, by incrementing the digit before the dot (revision
version 01 equals 1.0).
New Part Numbers added. 100ns and 120ns Speed Classes added. TFBGA63 package
added. V
removed from and V
IO
added to Table 6, Absolute Maximum Ratings. V
CCQ
added to Table 7, Operating and AC Measurement Conditions. Ready/Busy pin
(TFBGA63 package) added to the signals (concerns M29W641DU only).
Figure 7, AC Measurement I/O Waveform, and Figure 8, AC Measurement Load Circuit,
modified. Unlock Bypass Commands clarified and V
DESCRIPTIONS section. Test Conditions modified for I
parameters in Table 9, DC Characteristics, and V
corrected. t
WLWH
, t
DVWH
, t
WLAX
, t
parameters modified for 90ns speed class in Tab le
WHRL
11, Write AC Characteristics, Write Enable Controlled. t
parameters modified for 90ns speed class in Table 12, Write AC Characteristics, Chip
Enable Controlled. t
parameter added to Tab le 13, Reset/Block Temporary Unprotect
PLYH
AC Characteristics.
Data and Value modified for address 2Dh, and Data modified for address 30h in T ab le 21,
Device Geometry Definition. Description modified at address offset 4Eh in Table 22.
Data Retention and Erase Suspend Latency Time parameters added to T able 6, Program,
Erase Times and Program, Erase Endurance Cycles, and Typical after 100k W/E Cycles
column removed. I
(Identification) current removed from Table 9, DC Characteristics.
ID
Lead-free package options E and F added to Table 16, Ordering Information Scheme.
Appendix C, EXTENDED MEMORY BLOCK, added. V
clarified. Auto Select Command is used to read the Extended Memory Block. Note added
to Table 16, Ordering Information Scheme.
description specified in SIGNAL
CCQ
, ILO, VIL, VIH, VOL and VOH
LI
, VIH, VOL and VOH parameters
IL
, t
, t
ELEH
DVEH
pin connection to ground
SS
ELAX
and t
EHRL
CCQ
41/42
Page 42
M29W641DH, M29W641DL, M29W641DU
Information furnished is believed to be ac curate and reli able. Howev er, STMicroel ectronics assumes no responsibilit y for the consequence s
of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted
by implic ation or otherwise under any patent or patent rights of STMi croelectr onics. Specifications mentioned in thi s publicati on are subject
to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not
authorized for use as cri tical comp onents in life support dev i ces or systems wi t hout express written ap proval of STMi croelect ro nics.
The ST log o i s registered trademark of STMicroelectronics
All other nam es are the pro perty of their respective owners