The M29KW064E LightFlash™ is a 64 M bit ( 4Mb
x16) non-volatile memory that can be read, erased
and reprogrammed. Read op erations can b e performed using a single low voltage (2.7 to 3.6V)
supply. Program an d Er ase operations require an
additional V
power-up the memory defaults to its Read mode
where it can be read in the same way as a ROM or
EPROM.
The memory is divided into 32 uniform blocks that
can be erased i ndependently so it is poss ible to
preserve valid data whi le old data is erased (see
Figures 2, Block Address es). Program a nd Erase
commands are written to the Command Interface
of the memory. An on-chip Program/Erase Controller (P/E.C.) simplifies the process of programming or erasing the memory by taking care of all of
the special operations that are required to update
the memory contents.
(11.4 to 12.6) power supply. On
PP
The M29KW064E LightFlash™ features a new
command, Multiple Word Program, used to program large streams of dat a. I t gre atly reduc es t he
total programming time when a large number of
Words are written to the memory at any one time.
Using this command the entire memory can be
programmed in 8s, compared to 36s using the
standard Word Program.
The end of a program or erase operation can be
detected and any error conditions identified. The
command set required to control the memory is
consistent with JEDEC standards.
Chip Enable, Output Enable and Write Enable signals control the bus operation of the memory.
They allow simple conne ction to most m icroprocessors, often without additional logic.
The memory is offered in TSOP48 (12 x 20mm)
and TFBGA48 (6 x 9mm, 0.8mm pitch) packages.
The memory is supplied with all the bits erased
(set to ’1’).
Figure 2. Logic DiagramTable 1. Signal Names
A0-A21Address Inputs
V
V
22
A0-A21DQ0-DQ15
W
E
G
RP
M29KW064E
V
CC
SS
PP
16
RB
AI06264
DQ0-DQ15Data Inputs/Outputs
E
G
W
RP
RB
V
CC
V
PP
V
SS
NCNot Connected Internally
Chip Enable
Output Enable
Write Enable
Reset
Ready/Busy Output
Supply Voltage read
Supply Voltage program erase
Ground
4/30
Page 5
Figure 3. TFBGA Connections (Top view through package)
See Figure 2, Logic Diagram, and Table 1, Sign al
Names, for a brief overview of the signals connected to this device.
Address Inputs (A0-A21). The Address Inputs
select the cells i n the memory array to a ccess during Bus Read operations. During Bus Write operations they control the commands sent to the
Command Interface of the Program/Erase Controller.
Data Inputs/Outputs (DQ0-DQ7). The Data Inputs/Outputs outputs the data stored at the selected address during a Bus Rea d operation. Du ring
Bus Write operations they represent the commands sent to the Command Interface of the Program/Erase Controller.
Data Inputs/Outputs (DQ8-DQ15). The Data Inputs/Outputs output the data stored at the selected
address during a Bus Read operation. During Bus
Write operations the Command Register does not
use these bits. When reading t he Status Register
these bits should be ignored.
Chip Enable (E
). The Chip Enable, E, activates
the memory, allowing Bus Read and Bus Write operations to be performed. When Chip Enable is
High, V
Output Enable (G
, all other pins are ignored.
IH
). The Output Enable, G, con-
trols the Bus Read operation of the memory.
Write Enable (W
). The Write Enable, W, controls
the Bus Write operation of the memory’s Command Interf a c e .
Reset (RP
). The Reset pin can be used to apply
a Hardware Reset to the memory.
A Hardware Reset is achieved by holding Reset
Low, V
V
IH
Bus Write operations after t
, fo r at least t
IL
. After Reset goes High,
PLPX
, the memory will be ready for B us Read and
PHEL
or t
RHEL
, which ever occurs last. See the Ready/Busy Output section, Table 16 and Figure 13, Reset AC
Characteristics for more details.
Ready/Busy Output (RB
). The Ready/Busy pin
is an open-drain output that can be used to identify
when the memory array can be read. Ready/Busy
is high-impedance during Read mode and Auto
Select mode. After a Hardware Reset, Bus Read
and Bus Write operations cannot begin until
M29KW064E
Ready/Busy becomes high-impedance. See Table
16 and Figure 13, Reset AC Characteristics.
During Program or Erase operations Ready/Busy
is Low, V
Read/Reset commands or Hardw are Resets until
the memory is ready to enter Read mode.
The use of an open-drain output allows the Ready/
Busy pins from several memories to be connected
to a single pull-up resistor. A Low will then indicate
that one, or more, of the memories is busy.
Supply Voltage. The VCC Supply Voltage
V
CC
supplies the power for Read operations.
The Command Interface is disabled when the V
Supply Voltage is less than the L ockout Voltage,
V
. This prevents Bus Write operations from ac-
LKO
cidentally damaging the data during power up,
power down and power surges. If the Program/
Erase Controller is programming or erasing during
this time then the operation aborts and the memory contents being altered will be invalid.
A 0.1µF capacitor should be connected between
the V
pin to decouple the current surges from the power
supply. The PCB track widths must be sufficient to
carry the currents required during program and
erase operations, I
Program Supply Voltage. VPP is both a
V
PP
power supply and Write Protect pin. The two functions are selected by t he voltage range a pplied t o
the pin. The Supply Voltage V
before the Program Supply Voltage V
If V
PP
power supply pin for program and erase operations. V
algorithm is completed.
If V
PP
V
is seen as a Write Protect pin. In this case a
PP
voltage lower than V
tion against program or erase, while V
range of V
12, DC Characteristics for the relevant values).
Note that V
nected as the device may become unreliable.
Vss Ground. The V
for all voltage measurements.
. Ready/Busy will remain Low during
OL
Supply Voltage pin and the VSS Ground
CC
.
CC3
must be applied
CC
PP
.
is in the range 11.4V to 12.6V it acts as a
must be stable until the Program/Erase
PP
is kept in a low voltage range (0V to 3.6V)
gives an absolute p rotec-
HH
enables these functions (see Ta ble
HH
must not be left floating o r uncon-
PP
Ground is the reference
SS
in the
PP
CC
7/30
Page 8
M29KW064E
BUS OPERATIONS
There are six standard bus operations that control
the device. These are Bus Read, Bus Wri te, Output Disable, Standby, Automatic Standby and
Electronic Signature. See Tables 3, Bus Operations, for a summary. Typically glitches of less
than 5ns on Chip Enable or Write Enable are ignored by the memory and do not affect bus operations.
Bus Read. Bus Read operations read from the
memory cells, or specific registers in the Command Interface. A valid Bus Read operation involves setting the desired address on the Address
Inputs, applying a Low sig nal, V
and Output Enable and keeping Write Enable
High, V
. The Data Inputs/Outputs will output the
IH
value, see Figure 10, Read Mode AC Waveforms,
and Table 13, Read AC Characteristics, for details
of when the output becomes valid.
Bus Write. Bus Write operations write to the
Command Interface. A valid Bus Write operation
begins by setting the desire d address on t he Address Inputs. The Address Inputs are latched by
the Command Interface on the falling edge of Chip
Enable or Write Enable, whichever occurs last.
The Data Inputs/Outputs a re latched by the Command Interface on the rising edge of Chip Enable
or Write Enable, whichever occurs first. Output Enable must remain High, V
IH
Write operation. See Figures 11 and 12, Write AC
Waveforms, and Tables 14 and 15, Write AC
, to Chip Enable
IL
, during the whole Bus
Characteristics, for details of the timing requirements.
Output Disa bl e . The Data Inputs/Outputs are in
the high impedance s tate when Output Enable is
High, V
Standby. When Chip Enable is High, V
.
IH
, the
IH
memory enters Standby mode and the Data Inputs/Outputs pins are placed in the high-impedance state. To reduce the S upply Current to the
Standby Supply Current, I
be held within V
± 0.2V. For the Standby current
CC
, Chip Enable should
CC2
level see Table 12, DC Characteristics.
During program or erase operations the memory
will continue to use the Program/Erase Supply
Current, I
, for Program or Erase operations un-
CC3
til the operation completes.
Automatic Standby. If CMOS levels (V
± 0.2V)
CC
are used to drive the bus and the bus is inactive for
150ns or more the memory enters Automatic
Standby where the internal Supply Current is reduced to the Standby Supply Current, I
CC2
. The
Data Inputs/Outputs will still output data if a Bus
Read operation is in progress.
Electronic Signature. The memory has two
codes, the manufacturer code and the device
code, that can be read to identify the memory.
These codes can be read by applying t he signals
listed in Tables 3, Bus Operations.
Table 3. Bus Operations
V
V
XX
PP
HH
X
XX
XX
OperationEGW
V
IL
V
IH
V
IH
XXXXHi-Z
V
IL
V
IL
or V
HH
V
IL
V
IL
V
IH
V
IL
V
IL
Bus Read
Bus Write
Output DisableX
Standby
Read Manufacturer
Code
Read Device Code
Note: 1. X = VIL or VIH.
2. XX = V
3. Not necessary for A uto Select or Read/Res et command s.
4. When re adi ng the Status Register during Program or Eras e operations, V
, V
IL
IH
V
IH
V
IL
V
IH
V
IH
V
IH
Address Inputs
A0-A21
(4)
Cell AddressData Output
(3)
Command AddressData Input
XHi-Z
A0 = V
Others V
A0 = V
Others V
, A1 = VIL,
IL
or V
IL
IH
, A1 = VIL,
IH
or V
IL
IH
must be kept at VHH.
PP
Data Inputs/Outputs
DQ15-DQ0
0020h
88AFh
8/30
Page 9
COMMAND INTERFACE
All Bus Write operations t o the me mory are in terpreted by the Command Interface. Commands
consist of one or more sequential Bus Write operations. Failure to observe a valid sequence of Bus
Write operations will result in the memory returning to Read mode. The long command sequences
are imposed to maximize data security.
Refer to Tables 4 and 5, for a summary of the commands.
Read/Reset Command.
The Read/Reset command returns the memory to
its Read mode where it behaves like a ROM or
EPROM, unless otherwise stated. It also resets
the errors in the Status Register. Either one or
three Bus Write operations can be u sed to issue
the Read/Reset command.
The Read/Reset Command can be issued, between Bus Write cycles before the start of a program or erase operation, to return the device to
read mode. Once the program or erase operation
has started the Read/Reset command is no longer
accepted. The Read/Res et co mmand is executed
regardless of the value of V
(VIL, VIH or VHH).
PP
Auto Select Command.
The Auto Select command is used to read the
Manufacturer Code and the Device Code. Three
consecutive Bus Write operations are re quired to
issue the Auto Selec t command. Onc e the Auto
Select command is issued the memory remains in
Auto Select mode until a Read/Reset command is
issued, all other commands are ignored. The Auto
Select command is executed regardless of the value of V
(VIL, VIH or VHH).
PP
From the Auto Select mode the Manufacturer
Code can be read using a Bus Read operation
with A0 = V
may be set to either V
and A1 = VIL. The other address bits
IL
or VIH.
IL
The Device Code can be read using a B us Read
operation with A0 = V
address bits may be set to either V
and A1 = VIL. The other
IH
or VIH.
IL
Word Progr a m Com m a n d.
The Word Program command can be used to program a Word to the memory array. V
set to V
ther V
during Word Program. If VPP is set to ei-
HH
or VIH the command will be ignored, the
IL
must be
PP
data will remain unchanged and the device will revert to Read/Reset mode. The command requires
four Bus Write operations, the final write operation
latches the address and data in the internal state
machine and starts the Program/Erase Controller.
During the program operat ion the memo ry will ignore all commands. I t is n ot poss ible t o iss ue any
command to abort or pause the operation. Typical
program times are given in Table 6. Bus Read operations during the program o peration will output
M29KW064E
the Status Register on the Data Inputs/Outputs.
See the section on the S tatus Register for more
details.
After the program operation has completed the
memory will return to the Read mode, unle ss an
error has occurred. When an error occurs the
memory will continue to output the Status Register. A Read/Reset command must be issued to reset the error condition and return to Read mode.
Note that the Program command cannot change a
bit set at ’0’ bac k to ’1’. One of the E rase Commands must be used to set all the bits in a block or
in the whole memory from ’0’ to ’1’.
Multiple Word Program Command
The Multiple Word Program command can be
used to program large streams of data. It greatly
reduces the total programming time when a l arge
number of Words are written to the memory at any
one time. V
Word Progr am. If V
command will be ignored, the data will remain unchanged and the device will revert to Read/Reset
mode.
It has four phases: the Setup P hase to initiate the
command, the Program Phase to program the
data to the memory, the Verify Phase to check that
the data has been correctly programmed and reprogram if necessary and the Exit Phase.
Setup Phase. The M ultiple Word Program command requires three Bus Write operations to initiate the command (refer to Table 5, Multiple Word
Program Command and Figure 5, Multiple Word
Program Flowchart). The Status Register Toggle
bit (DQ6) should be checked to verify that the operation has started and the Multiple Word Program
bit (DQ0) checked to verify that the P/E.C. is ready
for the first Word.
Program Phase. The Program Phase requires
n+1 cycles, where n is the number of Words, to execute the programming phase (refer to Table 5,
Multiple Word Program Command and Figure 5,
Multiple Word Program Flowchart).
Three successive steps are required to issue and
execute the Program Phase of the command.
1. The fourth Bus Write operation of the command
latches the Start Address and the first Word to
be programmed. The Status Register Multiple
Word Program bit (DQ0) should be read to
check that the P/E.C. is ready for the next Word.
2. Each subsequent Word to be programmed is
latched with a new Bus Write operation. The
address can remain the Start Address, be
incremented or be any address in the same
block, as the device automatically increments
the address with each sucssesive Bus Write
must be set to VHH during Multiple
PP
is set to e ither V
PP
or VIH the
IL
9/30
Page 10
M29KW064E
cycle. If the command is used to program in
more than one block then the address must
remain in the starting block as any address that
is not in the same block as the Start Address
terminates the Program operation. The Status
Register Multiple Word Program bit (DQ0) must
be read between each Bus Write cycle to check
that the P/E.C. is ready for the next Word.
3. Finally, after all Words have been programmed,
write one Bus Write operat ion to any address
outside the block containing the Sta rt Address,
to terminate the programming phase.
The memory is now set to enter the Verify Phase.
Verify Phase. Th e Verify Phase is s imilar to the
Program Phase in that all Words must be resent to
the memory for them to be che cked against the
programmed data. If the ch eck fails the P /E.C wi ll
try to reprogram the correct data. The P/E.C will
remain busy until the correct data has been successfully programmed. The Verify Phase is mandatory. If the Verify Phase is not executed the
programmed data cannot be guaranteed.
Three successive steps are required to execute
the Verify Phase of the command.
1. Use one Bus Write operation to latch the Start
Address and the first Word, to be verified. The
Status Register Multiple Word Program bit
(DQ0) should be read to check that the P/E.C. is
ready for the next Word.
2. Each subsequent Word to be verified is latched
with a new Bus Write operation. If any address
that is not in the same block as the Start
Address is given, the Verify operation
terminates. The Status Register Multiple Word
Program (DQ0) must be read to check that the
P/E.C. is ready for the next Word.
3. Finally, after all Words have been verified, write
one Bus Write operation to any address outside
the block containing the Start Address, to
terminate the Verify Phase.
Exit Phase . Read the Status Register to verify
that DQ6 has stopped toggling. If the Verify Phase
is successfully completed the memory returns to
the Read mode. If the P/E.C. fails to reprogram a
given location, the Verify Phase will terminate and
Error bit DQ5 will be set in the Status Register. If
the error is due to a V
failure DQ4 w ill als o be
PP
set. If the operation fails a Read/ Reset com mand
must be issued to return the device to Read mode.
It is not possible to issue any c ommand to abort or
pause the operation. Typical program times are
given in Table 6. Bus Read operations du ring the
program operatio n will outpu t the Sta tus Regi ster
on the Data Inputs/Outputs. See the section on the
Status Register for more details.
Note that the Multiple Word Program command
cannot change a bit set at ’0’ back to ’1’. One of the
Erase Commands must be used to set all the bits
in a block or in the whole memory from ’0’ to ’1’.
Block Erase Command.
The Block Erase com mand can be used to erase
a block. It sets all of the bits in the block to ’1’. All
previous data in the block is lost.
must be set to VHH during Block Erase. If V
V
PP
is set to either V
or VIH the command will be ig-
IL
PP
nored, the data will remain unchanged and the device will revert to Read/Reset mode.
Six Bus Write operations are required to select the
block . The Block Erase operation starts the Program/Erase Controller after the last Bus Write operation. The Status Register can be read after the
sixth Bus Write operation. See the Status Register
for details on how to identify if the P rogram /Erase
Controller has started the Block Erase operation.
During the Block Erase operation the me mory wi ll
ignore all commands. Typical block erase times
are given in Table 6. All Bus Read operations during the Block Erase operation will output the Status Register on the Data Inputs/Outputs. See the
section on the Status Register for more details.
After the Block Erase operation has completed the
memory will return to the Read Mode, unle ss an
error has occurred. When an error occurs the
memory will continue to output the Status Register. A Read/Reset command must be issued to reset the error condition and return to Read mode.
Chip Erase Command.
The Chip Erase command can be used to erase
the entire memory. It sets all of the bits in the memory to ’1’. All previous data in the memory is lost.
must be set to VHH during Chip Erase. If V
V
PP
is set to either V
or VIH the command will be ig-
IL
PP
nored, the data will remain unchanged and the device will revert to Read/Reset mode. Six Bus Write
operations are required to issue the Chip Erase
Command and start the Program/Erase Controller.
During the erase operation the memory will ignore
all commands. It is not possible to issue any command to abort the operation. Typical chip erase
times are given in Table 6. All Bus Read operations during the Chip E rase operation will output
the Status Register on the Data Inputs/Outputs.
See the section on the S tatus Register for more
details.
After the Chip Erase operation has completed t he
memory will return to the Read Mode, unle ss an
error has occurred. When an error occurs the
memory will continue to output the Status Register. A Read/Reset command must be issued to reset the error condition and return to Read Mode.
10/30
Page 11
M29KW064E
Table 4. Standard Commands
Bus Write Operations
Command
Length
1X F0
Read/Reset
3555AA2AA55XF0
Auto Select3555AA2AA5555590
Word Program4555AA2AA55555A0PAPD
Block Erase6555AA2AA5555580555AA2AA55BA30
Chip Erase6555AA2AA5555580555AA2AA5555510
Note: X Don’t Care, PA Program Address, PD Program Data, BA A ny addres s in the B lo ck . All values in the t able are in hexadecim al . The
Comma nd I n t erface only uses A0-A10 and DQ0-DQ7 to verif y t he commands; A11-A21, DQ8-DQ15 are Don’t Care.
Table 5. Multiple Word Program Command
Phase
Length
Add Data Add Data Add Data Add Data A dd DataAdd Data Add Data
Program
Verifyn+1PA1PD1PA1PD2PA1PD3PA1PD4PA1PD5PA1PAn
Note: A Bus Read must be done between each Write cycle where the data is programmed or verified, to Read the Status Register and check
3+n
555AA2AA5555520
+1
that the memo ry is r eady t o ac ce pt th e next dat a. NO T P A1 i s any ad dress that is not in t he s ame b loc k a s PA1. X D on’t Care , n =
number of Words to be programmed.
1st2nd3rd4th5th6th
AddDataAddDataAddDataAddDataAddDataAddData
Bus Write Operations
1st2nd3rd4 th5thFinal -1F inal
PD1PA1PD2PA1PAn
PA1
NOT
PA1
NOT
PA1
X
X
Table 6. Program, Erase Times and Progra m, Erase Endu ran ce Cycle s
ParameterMin
Typ
(1)
Chip Erase4144120s
Block Erase (128 KWords)1.56s
Program (Word)9250µs
Chip Program (Multiple Word)8144s
Chip Program (Word by Word)36144s
Program/Erase Cycles (per Block)10,000cycles
Note: 1. TA = 25°C, VPP = 12V.
Typical after
10k W/E Cycles
(1)
MaxUnit
Table 7. Multiple Word Program Timings
SymbolParameterMinTypMaxUnit
t
MWP-SETUP
t
MWP-PROG
t
MWP-TRAN
t
MWP-END
Note: 1. MWP = Multiple Word Program.
MWP Setup time500ns
MWP Program Time9250µs
MWP Program to Verify transition21020µs
MWP Verify to End transition23µs
11/30
Page 12
M29KW064E
Figure 5. Mul ti pl e W or d Program Fl owchart
Setup
Phase
NO
Setup time
exceeded?
YES
EXIT (
Program
Phase
(t
MWP-SETUP
setup failed)
Start
Write AAh
Address 555h
Write 55h
Address 2AAh
Write 20h
Address 555h
Read Status
Register
NO
DQ6
toggling?
(1)
)
YES
NO
DQ0 = 0?
YES
Write Data1(PD
Start Address (PA1)
Read Status
Register
DQ0 = 0?
Write Data 2 (PD2)
Address in Start Block
Read Status
Register
DQ0 = 0?
Write Data n (PDn)
Address in Start Block
YES
YES
)
1
NO
NO
Read Status
Register
(t
MWP-TRAN
DQ0 = 0?
YES
Write Data1 (PD1)
Start Address (PA1)
Read Status
Register
DQ0 = 0?
YES
Write Data 2 (PD2)
Address in Start Block
Read Status
Register
DQ0 = 0?
YES
Write Data n (PDn)
Address in Start Block
Read Status
Register
DQ0 = 0?
Write XX
Any Address
NOT in Start Block
Read Status
Register
NO
YES
NO
NO
NO
(1)
)
program time
exceeded?
(t
MWP-PROG
program time
exceeded?
(t
MWP-PROG
program time
exceeded?
(t
MWP-PROG
Word
Word
Word
Verify
Phase
NO
NO
(1)
NO
YES
YES
(1)
)
YES
)
YES
(1)
)
Read Status
Register
DQ5 = 1
DQ4 = 0?
NO
Exit
Phase
Read Status
Register
toggling?
DQ0 = 0?
YES
Write XX
Any Address
NOT in Start Block
NO
Note: 1. Ref er to Table 7, M ul tiple Word Program Ti mings, for the values.
12/30
DQ6
NO
(t
YES
(1)
MWP-END
)
Exit (read mode)
Fail error
Write F0h
Address XX
Fail, VPP error
AI05554c
Page 13
STATUS REGISTER
Bus Read operations from any address always
read the Status Register during Program and
Erase operations. The bi ts in the Status Register
are summarized in Table 8, Status Register Bits.
Data Polling Bit (DQ7). The Data Polling Bit can
be used to identify whether the Program/Erase
Controller has successfully completed its operation. The Data Polling Bit is output on DQ7 when
the Status Register is read.
During a Word Program operation the Data Polling
Bit outputs the complement of the bit being programmed to DQ7. After successful completion of
the Word Program ope ration the memory ret urns
to Read mode and Bus Read operations from the
address just programmed output DQ7, not its complement. The Data P olling Bit is not av ailable during a Multiple Word Program operation.
During Er ase ope rations the Data Polling Bit ou t-
puts ’0’, the complement of the erased state of
DQ7. After successful completion of the Erase operation the memory returns to Read Mode.
Figure 6, Data Polling Flowchart, gives an example of how to use the Data Polling Bit. A Valid Address is the address being programmed or an
address within the block being erased.
Toggle Bit (DQ6). The Toggle Bit can be used to
identify whether the Program/Erase Controller has
successfully completed its operation. The Toggle
Bit is output on DQ6 wh en the Status Register is
read.
During Program and Erase operations the Toggle
Bit changes from ’0’ to ’ 1’ to ’ 0’, et c., with su ccessive Bus Read operations at any address. After
successful completion of the operation the memory returns to Read mode.
Figure 7, Data Toggle Flowcha rt, gives an example of how to use the Data Toggle Bit.
Error Bit (DQ5). The Error Bit can be used to
identify errors detected by the Program/Erase
Controller. The Error B it is set to ’1’ when a Program, Block Erase or Chip Erase operation fails to
write the correct data to the memory. If the Error
Bit is set a Read/Rese t command must be iss ued
M29KW064E
before other commands are issued. The E rror bit
is output on DQ5 when the Status Register is read.
Note that the Program command cannot change a
bit set to ’0’ back to ’1’ and attempting to do so will
set DQ5 to ‘1’. A Bus Read operation to that address will s h ow the bit is s ti ll ‘0’. One o f t he E r as e
commands must b e used to set all the bits in a
block or in the whole memory from ’0’ to ’1’.
Status Bit (DQ4). The VPP Status Bit can be
V
PP
used to identify if any Program or Erase operation
has failed due to a V
during any Program or Erase operation, the operation aborts and DQ4 is set to ‘1’. If V
V
throughout the Program or Erase operat ion,
HH
the operation completes and DQ4 is set to ‘0’.
Erase Timer Bit (DQ3). The Erase Timer Bit can
be used to identify the start of Program/Erase
Controller operation during a Block Erase command. Once the Program/Erase Controller starts
erasing the Erase Timer Bit is set t o ’ 1’. The Erase
Timer Bit is output on DQ3 when the Status Register is read .
Alternative Toggle Bit (DQ2). The Alternative
Toggle Bit can be used to monitor the Program/
Erase controller during Block and Chip Erase operations. The Alternative Toggle Bit is out put on
DQ2 when the Status Register is read.
During Erase operations the Toggle Bit changes
from ’0’ to ’1’ to ’0 ’, etc. , wit h su ccessive Bu s Read
operations to any address. Once the operation
completes the memory returns to Read mode.
If an Erase operation f ails a nd the Error Bit is set,
the Alternative Toggle Bit will continue to toggle
with successive Bus Read operations to any address. The Alternative Toggle Bit does not change
if the addressed block has erased correctly.
Multiple Word Program Bit (DQ0). The Multiple
Word Program Bit can be used to indicate whether
the Program/Erase Controller is a ctive or inactive
during Multiple Word Program. When the Program/Erase Controller has written one Word and is
ready to accept the next Word, the bit is set to ‘0’.
Status Register Bit DQ1 is reserved.
error. If V
PP
falls below V
PP
remains at
PP
HH
13/30
Page 14
M29KW064E
Table 8. Status Register Bits
OperationConditionDQ7DQ6DQ5DQ4DQ3DQ2DQ0RB
Word ProgramAny AddressDQ7Toggle0–– – –0
V
Word Program
Error
Block/ Chip
Erase
Erase Error
Multiple Word
Program
= V
PP
HH
< V
V
PP
HH
Any Address0Toggle0–1
V
= V
PP
HH
V
< V
PP
HH
P/E.C. active–Toggle0–––10
P/E.C. inactive,
waiting for next
Word
DQ7Toggle10–––0
DQ7Toggle11–––0
0Toggle101
0Toggle111
Toggle
Toggle
Toggle
(2)
(2)
(2)
–0
–0
–0
–Toggle0–––01
Multiple Word
V
PP
= V
HH
–Toggle10––10
Program
V
Error
Note: 1. Unspecified dat a bi ts should be ignored.
2. DQ2 toggl es on any addr ess during Block or Chip E rase and after an Erase error.
PP
< V
HH
–Toggle11––10
Figure 6. Dat a Po ll i ng Fl o wc h a rtFigure 7. Data To ggl e Fl owchart
READ DQ6
DQ5 & DQ6
TOGGLE
NO
READ DQ6
TOGGLE
START
READ
DQ6
=
DQ5
= 1
TWICE
DQ6
=
NO
YES
YES
NO
YES
START
READ DQ5 & DQ7
at VALID ADDRESS
DQ7
YES
=
DATA
NO
NO
DQ5
= 1
YES
READ DQ7
at VALID ADDRESS
DQ7
YES
=
DATA
NO
FAILPASS
14/30
AI03598
FAILPASS
AI01370B
Page 15
M29KW064E
MAXIMUM RATIN G
Stressing the device ab ove the rating listed in t he
Absolute Maximum Ratings" table may cause permanent damage to the device. Exposure to Absolute Maximum Rating conditions for extended
periods may affect device reliability. These are
stress ratings only and operation of the dev ice at
Table 9. Absolute Maximum Ratings
SymbolParameterMinMaxUnit
T
BIAS
T
STG
V
IO
V
CC
V
PP
Note: 1. Minimum vol tage may undershoot to –2V for less than 20ns during transiti ons.
2. Maximu m voltage may overshoot to V
3. Maximu m voltage may oversh oot to 14.0V for less than 20ns during transitions. V
of 80hrs.
Temperature Under Bias–50125°C
Storage Temperature–65150°C
these or any other conditions above those indicated in the Operating sections of this specification is
not implied. Refer also to the STMicroelectronics
SURE Program and ot her relevant quality documents.
V
–0.6
must not remain at VHH for more than a total
PP
CC
+0.6
V
15/30
Page 16
M29KW064E
DC AND AC PARAMETERS
This section summarizes t he operating m easurement conditions, and the DC and AC characteristics of the device. The parameters in the DC and
AC characteristics Tables that follow, are derived
from tests performed under the Measurement
Table 10. Operating and AC Measurement Conditions
Parameter
V
Read Supply Voltage
CC
V
Program/Erase Supply Voltage
PP
Ambient Operating Temperature070070°C
Load Capacitance (C
)
L
Input Rise and Fall Times1010ns
11.412.611.412.6V
Conditions summarized in Table 10, Operating
and AC Measurement Conditions. Designers
should check that the operating conditions in their
circuit match the operating conditions when relying on the quoted parameters.
M29KW064 E
MinMaxMinMax
2.73.62.73.6V
3030pF
Unit90110
Input Pulse Voltages
Input and Output Timing Ref. Voltages
0 to V
CC
V
/2VCC/2
CC
0 to V
CC
Figure 8. AC Measurement I/O WaveformFigure 9. AC Measurement Load Circuit
V
CC
V
CC
VCC/2
0V
AI05565
CL includes JIG capacitance
DEVICE
UNDER
TEST
0.1µF
V
CC
C
L
Table 11. Device Capacitance
SymbolParameterTest ConditionMinMaxUnit
V
V
IN
OUT
= 0V
= 0V
6pF
12pF
C
IN
C
OUT
Note: Sampled only, not 100% te st ed.
Input Capacitance
Output Capacitance
V
V
25kΩ
25kΩ
AI05566
16/30
Page 17
M29KW064E
Table 12. DC Characteristics
SymbolParameterTest ConditionMinMaxUnit
I
I
I
V
V
V
I
I
V
I
LI
I
LO
CC1
CC2
CC3
V
V
OL
OH
HH
HH1
HH2
LKO
Input Leakage Current
Output Leakage Current
Supply Current (Read)
Supply Current (Standby)
0V ≤ V
0V ≤ V
E
E
RP
≤ V
IN
CC
≤ V
OUT
CC
= VIL, G = VIH,
f = 6MHz
= VCC ±0.2V,
= VCC ±0.2V
±1
±1
10mA
100
µA
µA
µA
Supply Current (Program/Erase)P/E.C. active20mA
IL
IH
Input Low Voltage–0.50.8V
Input High Voltage
I
Output Low Voltage
= 1.8mA
OL
Output High VoltageIOH = –100µA
V
Program/Erase Voltage
PP
VPP Current (Read/Standby)VPP = V
HH
VPP Current (Program/Erase)P/E.C. Active
Program/Erase Lockout Supply
Voltage
0.7V
CC
V
–0.4
CC
11.412.6V
1.82 .3V
VCC +0.3
0.45V
100µA
10mA
V
V
17/30
Page 18
M29KW064E
Figure 10. Read AC Waveforms
tAVAV
A0-A21
tAVQVtAXQX
E
tELQVtEHQX
tELQXtEHQZ
G
tGLQXtGHQX
DQ0-DQ15
Table 13. Read AC Characteristics
SymbolAltParameterTest Condition
t
AVAV
t
AVQV
t
ELQX
t
ELQV
t
GLQX
(1)
(1)
t
t
ACC
t
t
t
OLZ
Address Valid to Next Address Valid
RC
Address Valid to Output Valid
Chip Enable Low to Output Transition
LZ
Chip Enable Low to Output Valid
CE
Output Enable Low to Output
Transition
tGLQV
VALID
E
= VIL,
G
= V
E
= VIL,
G
= V
G
= V
G
= V
= V
E
IL
IL
IL
IL
IL
tGHQZ
VALID
AI06267
M29KW064E
Unit
90110
Min90110ns
Max90110ns
Min00ns
Max90110ns
Min00ns
t
GLQV
(1)
t
EHQZ
(1)
t
GHQZ
t
EHQX
t
GHQX
t
AXQX
Note: 1. Sampled only, not 100% tested.
t
t
t
t
Output Enable Low to Output Valid
OE
Chip Enable High to Output Hi-Z
HZ
Output Enable High to Output Hi-Z
DF
Chip Enable, Output Enable or
OH
Address Transition to Output Transition
18/30
G
E
E
= V
= V
= V
Max3535ns
IL
Max3030ns
IL
Max3030ns
IL
Min00ns
Page 19
Figure 11. Write AC Waveforms, Write Enable Controlled
tAVAV
A0-A21
tAVWL
E
VALID
M29KW064E
tWLAX
tWHEH
G
W
DQ0-DQ15
V
CC
V
PP
RB
tVCHEL
tVPHEL
tELWL
tWLWHtGHWL
tDVWH
tWHGL
tWHWL
tWHDX
VALID
tWHRL
AI06268
19/30
Page 20
M29KW064E
Table 14. Write AC Characteristics, Write Enable Controlled
SymbolAltParameter
M29KW064 E
Unit
90110
t
AVAV
t
ELWL
t
WLWH
t
DVWH
t
WHDX
t
WHEH
t
WHWLtWPH
t
AVWL
t
WLAX
t
GHWL
t
WHGL
t
WHRL
t
VCHELtVCSVCC
t
VPHEL
Note: 1. Sampled only, not 100% tested.
2. Not requi red in Auto S el ect or Read/Reset co m mand sequences.
(1)
(2)
t
WC
t
CS
t
WP
t
DS
t
DH
t
CH
t
AS
t
AH
t
OEH
t
BUSY
t
VCSVPP
Address Valid to Next Address ValidMin90110ns
Chip Enable Low to Write Enable LowMin00ns
Write Enable Low to Write Enable HighMin3535ns
Input Valid to Write Enable HighMin3535ns
Write Enable High to Input TransitionMin00ns
Write Enable High to Chip Enable HighMin00ns
Write Enable High to Write Enable LowMin3030ns
Address Valid to Write Enable LowMin00ns
Write Enable Low to Address TransitionMin4545ns
Output Enable High to Write
Enable Low
Write Enable High to Output
Enable Low
Program/Erase Valid to RB LowMax3535ns
High to Chip Enable Low
High to Chip Enable Low
Read modeMin00ns
Read SR Toggle bitsMin1010ns
Read modeMin00ns
Read SR Toggle bits in
Multiple Word Program
Read SR Toggle bits
other operations
Min2020ns
Min3030ns
Min5050µs
Min500500ns
20/30
Page 21
Figure 12. Write AC Waveforms, Chip Enable Controlled
tAVAV
A0-A21
tAVEL
W
VALID
M29KW064E
tELAX
tEHWH
G
E
DQ0-DQ15
V
CC
V
PP
RB
tWLEL
tVCHWL
tVPHWL
tELEHtGHEL
tDVEH
tEHGL
tEHEL
tEHDX
VALID
tEHRL
AI06269
21/30
Page 22
M29KW064E
Table 15. Write AC Characteristics, Chip Enable Controlled
SymbolA ltParameter
M29KW064E
Unit
90110
t
AVAV
t
WLEL
t
ELEH
t
DVEH
t
EHDX
t
EHWH
t
EHEL
t
AVEL
t
ELAX
t
GHEL
t
EHGL
t
EHRL
t
VCHWL
t
VPHWL
Note: 1. Sampled only, not 100% tested.
2. Not requi red in Auto S el ect or Read/Reset co m mand sequences.
(1)
(2)
t
WC
t
WS
t
CP
t
DS
t
DH
t
WH
t
CPH
t
AS
t
AH
t
OEH
t
BUSY
t
VCSVCC
t
VCSVPP
Address Valid to Next Address ValidMin90110ns
Write Enable Low to Chip Enable LowMin00ns
Chip Enable Low to Chip Enable HighMin3535ns
Input Valid to Chip Enable HighMin3535ns
Chip Enable High to Input TransitionMin00ns
Chip Enable High to Write Enable HighMin00ns
Chip Enable High to Chip Enable LowMin3030ns
Address Valid to Chip Enable LowMin00ns
Chip Enable Low to Address TransitionMin4545ns
Output Enable High Chip Enable
Low
Chip Enable High to Output
Enable Low
Program/Erase Valid to RB LowMax3535ns
High to Write Enable Low
High to Write Enable Low
Read modeMin00ns
Read SR Toggle bitsMin1010ns
Read modeMin00ns
Read SR Toggle bits in
Multiple Word Program
Read SR Toggle bits
other operations
Min2020ns
Min3030ns
Min5050µs
Min500500ns
22/30
Page 23
Figure 13. Reset AC Waveforms
E, G
W,
RB
RP
tPLPX
tPLYH
Table 16. Reset AC Characteristics
SymbolAltParameter
(1)
t
PHWL
t
PHEL
(1)
t
PHGL
(1)
t
RHWL
(1)
t
RHEL
(1)
t
RHGL
t
PLPX
(1)
t
PLYH
Note: 1. Sampled only, not 100% tested.
t
t
t
t
READY
RP High to Write Enable Low, Chip Enable Low,
RH
Output Enable Low
RB High to Write Enable Low, Chip Enable Low,
RB
Output Enable Low
RP Pulse WidthMin500500ns
RP
RP Low to Read ModeMax1010µs
M29KW064E
tPHWL, tPHEL, tPHGL
tRHWL, tRHEL, tRHGL
AI05570
M29KW064E
Unit
90110
Min5050ns
Min00ns
23/30
Page 24
M29KW064E
PACKAGE MECHANICAL
Figure 14. TSOP48 - 48 lead Plastic Thin Small Outline, 12 x 20mm, Package Outline
A2
1N
e
E
B
N/2
D1
D
DIE
A
CP
C
TSOP-a
Note: Drawing is not to scale.
LA1α
Table 17. TSOP48 - 48 lead Plastic Thin Small Outline, 12 x 20mm, Package Mechanical Data
N = TSOP48: 12 x 20 mm
ZA = TFBGA48: 6 x 9mm - 0.80mm pitch
= 2.7 to 3.6V
CC
Temperature Range
1 = 0 to 70 °C
Option
T = Tape & Reel Packing
Table 20. Daisy Chain Ordering Scheme
Example:M29KDCL3-32T
Device Type
M29K
Daisy Chain
DCL3-32 = Daisy Chain Level 3 for 64 Mbit parts
Option
T = Tape & Reel Packing
Devices are shipped from the factory with the memory content bits erased to ’1’.
For a list of available options (Speed, Pac kage, etc...) or for furthe r information on any aspect of this de-
vice, please contact the ST Sales Office nearest to you.
28/30
Page 29
REVISION HIST ORY
Table 21. Document Revision History
DateVersionRevision Details
17-Jun-2002-01First Issue
Revision numbering modified: a minor revision will be indicated by incrementing the
digit after the dot, and a major revision, by incrementing the digit before the dot.
23-Jul-20021.1
(revision version 01 becomes 1.0).
Figure 5, Multiple Word Program Flowchart, modified; Table 7, Multiple Word
Program Timings, added.
M29KW064E
29/30
Page 30
M29KW064E
Information furnished is believed to be ac curate and reli able. Howev er, STMicroel ectronics assumes no responsibilit y for the consequence s
of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted
by implic ation or otherwise under any patent or patent rights of STMi croelectr onics. Specifications mentioned in thi s publicati on are subject
to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not
authorized for use as cri tical comp onents in life support dev i ces or systems wi t hout express written ap proval of STMi croelect ro nics.
The ST log o i s registered trademark of STMicroelectronics
LightFlash is a trademark of STMicroelectro ni cs
All other names are the property of their respective owners.