The M29F032D is a 32 Mbit (4Mb x8) non-volatile
memory that can be read, erased and reprogrammed. These operations can be performed using a single low voltage 5V supply. On power-up
the memory defaults to its Read mode where it can
be read in the same way as a ROM or EPROM.
The memory is divided into 64 uniform blocks of
64Kbytes (see Figure 5, Block Addresses) that
can be erased i ndependently so it is poss ible to
preserve valid data while old data is erased.
Blocks can be protected in groups of 4 to prevent
accidental Program or Erase commands from
modifying the memory. Program and E rase commands are written to the Command Interface of
simplifies the process of prog ramming or eras ing
the memory by taking care of all of the special operations that are required to update the memory
contents. The end of a program or erase operation
can be detected and any error conditions identified. The command set required to control the
memory is consistent with JEDEC standards.
Chip Enable, Output Enable and Write Enable signals control the bus operation of the memory.
They allow simple conne ction to most m icroprocessors, often without additional logic.
The memor y is deli vered w ith al l the bits er ased (s et
to 1).
the memory. An on-chip Program/Erase Controller
Figure 2. Logi c D iag ramTable 1. Si gn a l Nam es
Note: Als o see Appendix A, Table 16 for a full l i st i ng of the Block Addresses..
64 KByte
64 KByte
64 KByte
64 KByte
64 KByte
64 KByte
Total of 64
64 KByte Blocks
AI05259
7/35
Page 8
M29F032D
SIGNAL DESCRIPTIONS
See Figure 2, Logic Diagram, and Table 1, Sign al
Names, for a brief overview of the signals connected to this device.
Address Inputs (A0-A21). The Address Inputs
select the cells i n the memory array to a ccess during Bus Read operations. During Bus Write operations they control the commands sent to the
Command Interface of the internal state machine.
Data Inputs/Outputs (DQ0-DQ7). The Data I/O
outputs the data stored at the selected address
during a Bus Read operation. During Bus Write
operations they represent the commands sent to
the Command Interface of the internal state machine.
Chip Enable (E
the memory, allowing Bus Read and Bus Write operations to be performed. When Chip Enable is
High, V
IH
Output Enable (G
trols the Bus Read operation of the memory.
Write Enable (W
the Bus Write operation of the memory’s Command Interf a c e.
Reset/Block Temporary Unprotect (RP). The
Reset/Block Temporary Unprotect pin can be
used to apply a Hardware Reset to the memory or
to temporarily unprotect all Blocks that hav e b een
protected.
A Hardware Reset is achieved by holding Reset/
Block Temporary Unprotect Low, V
. After Reset/Block Temporary Unprotect
t
PLPX
goes High, V
Read and Bus Write operations after t
t
, whichever occurs last. See the Ready/Busy
RHEL
Output section, Table 13 and Figure 12, Reset/
Temporary Unprotect AC Characteristics for more
details.
Holding RP
protected Blocks in the memory. Program and
). The Chip Enable, E, activates
, all other pins are ignored.
). The Output Enable, G, con-
). The Write Enable, W, controls
, for at least
IL
, the memory will be ready for Bus
IH
PHEL
at VID will temporarily unprotect the
or
Erase operations on all blocks will be possible.
The transition from V
t
PHPHH
.
Ready/Busy Output (RB
to VID must be slower than
IH
). The Ready/Busy pin
is an open-drain output that can be used to identify
when the device is performing a Program or Erase
operation. During Program or Erase operations
Ready/Busy is Low, V
. Ready/Busy is high-im-
OL
pedance during Read mode, Auto Select mode
and Erase Suspend mode.
After a Hardware Reset, Bus Read and Bus Write
operations cannot begin until Ready/Busy becomes high-impedance. See Tabl e 13 and Figure
12, Reset/Temporary Unprotect AC Characteristics .
The use of an open-drain output allows the Ready/
Busy pins from several memories to be connected
to a single pull-up resistor. A Low will then indicate
that one, or more, of the memories is busy.
Suppl y Voltag e (5V) . VCC provides the
V
CC
power supply for all operations (Read, Program
and Erase).
The Command Interface is disabled when the V
CC
Supply Voltage is less than the L ockout Voltage,
V
. This prevents Bus Write operations from ac-
LKO
cidentally damaging the data during power up,
power down and power surges. If the Program/
Erase Controller is programming or erasing during
this time then the operation aborts and the memory contents being altered will be invalid.
A 0.1µF capacitor should be connected between
the V
Supply Voltage pin and the VSS Ground
CC
pin to decouple the current surges from the power
supply, see Figure 10, AC Measurement Load Circuit. The PCB track widths must be sufficient to
carry the currents required during program and
erase operations, I
V
Ground. VSS is the reference for all voltage
SS
CC3
.
measurements.
8/35
Page 9
BUS OPERATIONS
There are five standard bus operations that control
the device. These are Bus Read, Bus Wri te, Output Disable, Standby and Automatic Standby. See
Tables 2, Bus Operations, for a summary. Typically glitches of less than 5ns on Chip Enable or Write
Enable are ignored by t he mem ory and do not a ffect bus operations.
Bus Read. Bus Read operations read from the
memory cells, or specific registers in the Command Interface. A valid Bus Read operation involves setting the desired address on the Address
Inputs, applying a Low sig nal, V
, to Chip Enable
IL
and Output Enable and keeping Write Enable
High, V
. The Data Inputs/Outputs will output the
IH
value, see Figure 9, Rea d Mode AC Wav eforms,
and Table 10, Read AC Characteristics, for details
of when the output becomes valid.
Bus Write. Bus Write operations write to the
Command Interface. A valid Bus Write operation
begins by setting the desire d address on t he Address Inputs. The Address Inputs are latched by
the Command Interface on the falling edge of Chip
Enable or Write Enable, whichever occurs last.
The Data Inputs/Outputs a re latched by the Command Interface on the rising edge of Chip Enable
or Write Enable, whichever occurs first. Output Enable must remain High, V
, during the whole Bus
IH
Write operation. See Figures 10 and 11, Write AC
Waveforms, and Tables 11 and 12, Write AC
Characteristics, for details of the timing requirements.
Output Disa bl e . The Data Inputs/Outputs are in
the high impedance s tate when Output Enable is
High, V
Standby. When Chip Enable is High, V
.
IH
, the
IH
memory enters Standby mode and the Data Inputs/Outputs pins are placed in the high-impedance state. To reduce the S upply Current to the
Standby Supply Current, I
, Chip Enable should
CC2
M29F032D
be held within V
level see Table 9, DC Characteristics.
During program or erase operations the memory
will continue to use the Program/Erase Supply
Current, I
CC3
til the operation completes.
Automatic Standby. If CMOS levels (V
are used to drive the bus and the bus is inactive for
300ns or more the memory enters Automatic
Standby where the internal Supply Current is reduced to the Standby Supply Current, I
Data Inputs/Outputs will still output data if a Bus
Read operation is in progress.
Special Bus Operations
Additional bus operations can be performed to
read the Electronic Signature and also to apply
and remove Block Protec tio n. These bus operations are intended for use by programming equipment and are not usually used in applications.
They require V
Electronic Signature. The memory has two
codes, the manufacturer code and the device
code, that can be read to identify the memory.
These codes can be read by applying t he signals
listed in Tables 2, Bus Operations.
Block Protection and Blocks Unprotection.
Blocks can be protected in groups of 4 against accidental Program or Erase. See Appendix A, Table
16, Block Addresses, for details of which blocks
must be protected together as a group. Protected
blocks can be unprotected to allow data to be
changed.
There are two methods available for protecting
and unprotecting the blocks, one for use on programming equipment and the other for in-system
use. Block Protect and Chip Unprot ec t operat ions
are described in Appendix C.
± 0.2V. For the Standby current
CC
, for Program or Erase operations un-
± 0.2V)
CC
. The
CC2
to be applied to some pins.
ID
Table 2. Bus Operations
OperationEGW
Bus Read
Bus Write
Output DisableX
Standby
Read Manufacturer
Code
Read Device Code
Note: X = VIL or VIH.
V
IL
V
IL
V
IH
V
IL
V
IL
Address Inputs
A0-A21
V
IL
V
IH
V
IH
XXXHi-Z
V
IL
V
IL
V
Cell AddressData Output
IH
V
Command AddressData Input
IL
V
XHi-Z
IH
A0 = VIL, A1 = VIL, A9 = VID, Others
V
IH
V
or V
IL
IH
A0 = VIH, A1 = VIL,
V
IH
A9 = V
, Others VIL or V
ID
IH
Data Inputs/Outputs
DQ7-DQ0
20h
ACh
9/35
Page 10
M29F032D
COMMAND INTERFACE
All Bus Write operations t o the me mory are in terpreted by the Command Interface. Commands
consist of one or more sequential Bus Write operations. Failure to observe a valid sequence of Bus
Write operations will result in the memory returning to Read mode. The long command sequences
are imposed to maximize data security.
Refer to Table 3, Commands, in conjunc tion with
the following text descriptions.
Read/Reset Command. The Read/Reset command returns the memory to its Read mode where
it behaves like a ROM or EPROM, unless otherwise stated. It also resets t he errors in the S tatus
Register. Either one or three Bus Write operations
can be used to issue the Read/Reset command.
The Read/Reset Command can be issued, between Bus Write cycles before the start of a program or erase operation, to return the device to
read mode. Once the program or erase operation
has started the Read/Reset command is no longer
accepted. The Read/Reset command will not
abort an Erase operation when issued while in
Erase Suspend.
Auto Select Command. The Auto Select command is used to read the Manufacturer Code, the
Device Code and the Block Protection Status.
Three consecutive Bus Write operations are required to issue the Auto Select command. Once
the Auto Select comma nd is issued the memory
remains in Auto Select mode until a Read/Reset
command is issued. Read CFI Query and Read/
Reset commands are accepted in Auto Select
mode, all other commands are ignored.
From the Auto Select mode the Manufacturer
Code can be read using a Bus Read operation
with A0 = V
may be set to either V
Code for STMicroelectronics is 20h.
The Device Code can be read using a B us Read
operation with A0 = V
address bits may be set to e ither V
Device Code for the M29F032D ACh.
The Bl ock Protection Status of each block can be
read using a Bus Read operation with A0 = V
A1 = V
the bl ock. The oth er addr ess bit s may b e set t o either V
IL
then 01h is output on Data Inputs/Outputs DQ0DQ7, otherwise 00h is output.
Program Command. The Program command
can be used to program a value to one address in
the memory array at a time. The command requires four Bus Write operations, the final write operation latches the address and data in the internal
state machine and starts the Program/Erase Controller.
and A1 = VIL. The other address bits
IL
, and A12-A21 specifying the address of
IH
or VIH. The Manufa cturer
IL
and A1 = VIL. The other
IH
or VIH. The
IL
or VIH. If t h e ad dr ess ed b loc k is pro tec te d
IL
If the address falls in a pro tected block then the
Program command is ignored, the data remains
unchanged. The Status Register is never read and
no error condition is given.
During the program operat ion the memo ry will ignore all commands. I t is n ot poss ible t o iss ue any
command to abort or pause the operation. Typical
program times are given in Table 4. Bus Read operations during the program o peration will output
the Status Register on the Data Inputs/Outputs.
See the section on the S tatus Register for more
details.
After the program operation has completed the
memory will return to the Read mode, unle ss an
error has occurred. When an error occurs the
memory will continue to output the Status Register. A Read/Reset command must be issued to reset the error condition and return to Read mode.
Note that the Program command cannot change a
bit set at ’0’ bac k to ’1’. One of the E rase Commands must be used to set all the bits in a block or
in the whole memory from ’0’ to ’1’.
Unlock Bypass Command. The Unlock Bypass
command is used in conjunction with the Unlock
Bypass Program command to program the memory. When the cycle time to the device is long (as
with some EPROM programmers) considerable
time saving can be made by using these commands. Three Bus Write operations are requ ired
to issue the Unlock Bypass command.
Once the Unlock Bypas s command has bee n issued the memory will only accept the Unloc k Bypass Program command and the Unlock Bypass
Reset command. The memory can be read as if in
Read mode.
Unlock Bypass Program Command. The Unlock Bypass Prog ra m command can be u sed to
program one address in the memory array at a
time. The command requires two Bus Write operations, the final write operation latches the address and data in the internal state machine and
starts the Program/Erase Controller.
The Program operation using the Unlock Bypass
,
Program command behaves identically to the Program operation using the Program command. A
protected block cannot be programmed; the operation cannot be aborted and the Status Register is
read. Errors must be reset using the Read/Re set
command, which l eaves the d evice in Unlo ck Bypass Mode. See the Program command for details
on the behavior.
Unlock Bypass Reset Command. The Unlock
Bypass Reset command can be used to return t o
Read/Reset mode from Unlock Bypass Mode.
Two Bus Write operations are required to issue the
Unlock Bypass Reset command. Read/Reset
10/35
Page 11
M29F032D
command does not exit from Unlock Bypass
Mode.
Chip Erase Command. The Chip Erase command can be used to erase the entire chip. Six Bus
Write operations are required to issue the Chip
Erase Command and start the Program/Erase
Controller.
If any blocks are protected th en these are ignored
and all the other blocks are erased. If all of the
blocks are protect e d th e Chip Erase op erat i on ap-
pears to start but will terminate within about 100µs,
leaving the data unchanged. No error condition is
given when protected blocks are ignored.
During the erase operation the memory will ignore
all commands, including the Erase Suspen d command. It is not possible to i ssue any c ommand t o
abort the operation. Typical chip erase tim es are
given in Table 4. All Bus Read operations during
the Chip Erase operation will output the Status
Register on the Data Inputs/Outputs. See the section on the Status Register for more details.
After the Chip Erase operation has completed t he
memory will return to the Read Mode, unle ss an
error has occurred. When an error occurs the
memory will continue to output the Status Register. A Read/Reset command must be issued to reset the error condition and return to Read Mode.
The Chip Erase Command sets all of the bits in unprotected blocks of the memory to ’1’. All previous
data is lost.
Block Erase Command. The Block Erase command can be use d to erase a list of one or more
blocks. Six Bus Write operations are required to
select the first block in the list. Each additional
block in the list can be selected by repeating the
sixth Bus Write operation using the address of the
additional block. The Block Erase operation starts
the Program/Erase Controller about 50µs after the
last Bus Write operation. Once the Program/Erase
Controller starts it is not possible to select any
more blocks. Each additional block must therefore
be selected within 50µs of the last block. The 50µs
timer restarts when an additional block is selected.
The Status Register can be read after the sixth
Bus Write operation. See the Status Register section for details o n how to identify if the Program/
Erase Controller has started the Block Erase operation.
If any selected blocks are protected then these are
ignored and all the other selected blocks are
erased. If all of the selected blocks are p rotected
the Block Erase operation appears to start but will
terminate within about 100µs, leaving the data unchanged. No error condition is given when protected blocks are ignored.
During the Block Erase operation the me mory wi ll
ignore all commands except the Erase Susp end
command. Typical b lock era se times a re g iven in
Table 4. All Bus Read operations during the Block
Erase ope ra tion will outp ut the S t atus R e gister on
the Data Inputs/Outputs. See the section on the
Status Register for more details.
After the Block Erase operation has completed the
memory will return to the Read Mode, unle ss an
error has occurred. When an error occurs the
memory will continue to output the Status Register. A Read/Reset command must be issued to reset the error condition and return to Read mode.
The Block Erase Command sets all of the bits in
the unprotected selected blocks to ’1’. All previous
data in the selected blocks is lost.
Erase Suspend Command. The Erase Suspend
Command may be used to temporarily suspend a
Block Erase operation and return the memory to
Read mode. The command requires one Bus
Write operation.
The Program/Erase Controller will sus pend within
15µs of the Erase Suspend Command being issued. Once the Program/Erase Controller has
stopped the memory will be set to Read mode and
the Erase will be suspended. If the Erase Suspend
command is issued during the period when the
memory is waiting for an additional block (before
the Program/Erase Controller starts) then the
Erase is suspended immediate ly and wi ll start immediately when the Erase Resume Comm and is
issued. It is not possible to select any further
blocks to erase after the Erase Resume.
11/35
Page 12
M29F032D
During Erase Suspend it is possible to Read and
Program cells in blocks that are not being erased;
both Read and Program operations behave as
normal on these blocks. If any attempt is made to
program in a protected block or in the suspended
block then the Program comm and is ignored and
the data remains unchanged. The Status Register
is not read and no error condi tion is given. Re ading from blocks that are being erased will output
the Status Register.
It is also possible to issue the Auto Select, Read
CFI Query and Unlock Bypass commands during
an Erase Suspend. The Read/Reset command
must be issued to return the device to Read Array
mode before the Resume command will be accepte d.
Erase Resume Command. The Erase Resume
command must be used to restart the Program/
Erase Controller after an Erase Suspend. The device must be in Read Array mode before t he Resume command will be accepted. An erase can be
suspended and resumed more than once.
Read CFI Query Command. The Read CFI
Query Command is used to read data from the
Common Flash Interface (CFI) Memory Area. This
Table 3. Commands
Command
1st2nd3rd4th5th6th
Length
Addr Data Addr Data Addr Data Addr Data Addr Data Addr Data
command is valid when the device i s in the Read
Array mode, or when the device is i n Autoselected
mode.
One Bus Write cycle is required to issue the Read
CFI Query Command. Once the command is issued subsequent Bus Read ope rations read from
the Common Flash Interface Memory Area.
The Read/Reset command m ust be issued to return the device to the previous mode (the Read Array mode or Autoselected mode). A second Read/
Reset command would be needed if the device is
to be put in the Read Array mode from Autoselected mode.
See Appendix B, Tables 17, 18, 19, 20, 21 and 22
for details on the information contained in the
Common Flash Interface (CFI) memory area.
Block Protect and Chip Unprotect Commands. Groups of blocks can be protected
against accidental Program or Erase. The Protection Groups are shown in Appendix A, Table 16.
The whole chip can be unpro tected to allow the
data inside the blocks to be changed.
Block Protect and Chip Unprote ct operations are
described in Appendix C.
Bus Write Operations
Read/Reset
Auto Select3555AA2AA5555590
Program4555AA2AA55555A0PAPD
Unlock Bypass3555AA2AA5555520
Unlock Bypass
Note: X Don’t Care, PA P rogram Add ress, PD Pro gram Data, B A Any addre ss i n the Block. All values in th e t able are in hexadecimal.
1X F0
3555AA2AA55XF0
2X A0PAPD
12/35
Page 13
M29F032D
Table 4. Program, Erase Times and Progra m, Erase Endu ran ce Cycle s
ParameterMin
Chip Erase4040200s
Block Erase (64 Kbytes)0.86s
Program (Byte)10200µs
Chip Program (Byte by Byte)40200s
Program/Erase Cycles (per Block)100,000cycles
Note: 1. TA = 25°C, VCC = 5V.
Typ
(1)
STATUS REGISTER
Bus Read operations from any address always
read the Status Register during Program and
Erase operations. It is also read during Erase Suspend when an address within a block being erased
is accessed.
The bits in the Status Register are summarized in
Table 5, Status Register Bits.
Data Polling Bit (DQ7). The Data Polling Bit can
be used to identify whether the Program/Erase
Controller has successfully completed its operation or if it has responded to an Erase Suspend.
The Data Polling Bit is output on DQ7 when the
Status Register is read.
During Program operations the Data Polling Bit
outputs the complement of the bit being programmed to DQ7. After successful completion of
the Program operation the memory returns to
Read mode and Bus Read operations from the address just programmed o utput DQ7, not its complement.
During Er ase ope rations the Data Polling Bit ou t-
puts ’0’, the complement of the erased state of
DQ7. After successful completion of the Erase operation the memory returns to Read Mode.
In Erase Suspend mode the Data Polling Bit will
output a ’1’ during a Bus Read operation within a
block being erased. The Data Polling Bit will
change from a ’0’ to a ’1’ when the Program/Erase
Controller has suspended the Erase operation.
Figure 5, Data Polling Flowchart, gives an example of how to use the Data Polling Bit. A Valid Address is the address being programmed or an
address within the block being erased.
Toggle Bit (DQ6). The Toggle Bit can be used to
identify whether the Program/Erase Controller has
successfully completed its operation or if it has responded to an Erase Suspen d. The Toggle Bit is
output on DQ6 when the Status Register is read.
During Program and Erase operations the Toggle
Bit changes from ’0’ to ’ 1’ to ’ 0’, et c., with su cces-
sive Bus Read operations at any address. After
successful completion of the operation the memory returns to Read mode.
During Erase Suspend mode the Toggle Bit will
output when addressing a cell within a block being
erased. The Toggle Bit will stop toggling when the
Program/Erase Controller has suspended the
Erase operation.
If any attempt is made to erase a protected bl ock,
the operation is abort ed, no error is sig nalle d and
DQ6 toggles for approximately 100µs. If any attempt is made to program a protected block or a
suspended block, the operation is abort ed, no error is signalled and DQ6 toggles for approximately
1µs.
Figure 6, Data Toggle Flowchart, g ives an example of how to use the Data Toggle Bit.
Error Bit (DQ5). The Error Bit can be used to
identify errors detected by the Program/Erase
Controller. The Error B it is set to ’1’ when a Program, Block Erase or Chip Erase operation fails to
write the correct data to the memory. If the Error
Bit is set a Read/Rese t command must be iss ued
before other commands are issued. The E rror bit
is output on DQ5 when the Status Register is read.
Note that the Program command cannot change a
bit set to ’0’ back to ’1’ and attempting to do so will
set DQ5 to ‘1’. A Bus Read operation to that address will s h ow the bit is s ti ll ‘0’. One o f t he E r as e
commands must b e used to set all the bits in a
block or in the whole memory from ’0’ to ’1’.
Erase Timer Bit (DQ3). The Erase Timer Bit can
be used to identify the start of Program/Erase
Controller operation during a Block Erase command. Once the Program/Erase Controller starts
erasing the Erase Timer Bit is set to ’1’. Before the
Program/Erase Controller starts the Erase Timer
Bit is set to ’0’ and additional block s to be erased
may be written to the Command Interface. The
Erase Timer Bit is output on DQ3 when the Status
Register is read.
Typical after
100k W/E Cycles
(1)
MaxUnit
13/35
Page 14
M29F032D
Alternative Toggle Bit (DQ2). The Alternative
Toggle Bit can be used to monitor the Program/
Erase controller during Erase operations. The Alternative Toggle Bit is output on DQ2 when the
Status Register is read.
During Chip Erase and Block Erase operations the
Toggle Bit changes from ’0’ to ’1’ to ’0’, etc., with
successive Bus Read operations from addresses
within the blocks being erased. A protected block
is treated the same as a block not being erased.
Once the operation completes the memory returns
to Read mode.
During Erase Suspend the Alternative Toggle Bit
Bus Read operations from addresses within the
blocks being erased. Bus Read operations to addresses within blocks not being erased will ou tput
the memory cell data as if in Read mode.
After an Erase operation that c auses t he Error Bit
to be set the Alternative Toggle Bit can be used to
identify which block or blocks have caused the error. The Alternative Toggle Bit changes from ’0’ to
’1’ to ’0’, etc. with successive Bus Re ad Operations from addresses within blocks that have not
erased correctly. The Alternative Togg le Bit does
not change if the addressed block has erased correctly.
changes from ’0’ to ’1’ to ’0’, etc. with successive
Table 5. Status Register Bits
OperationAddre ssDQ7DQ6D Q5DQ3DQ2
ProgramAny AddressDQ7Toggle0––0
Program During Erase
Suspend
Program ErrorAny AddressDQ7
Chip EraseAny Address0Toggle01Toggle0
Block Erase before
timeout
Block Erase
Erase Suspend
Any AddressDQ7
Erasing Block0Toggle00Toggle0
Non-Erasing Block0Toggle00No Toggle0
Erasing Block0Toggle01Toggle0
Non-Erasing Block0Toggle01No Toggle0
Erasing Block1No Toggle0–Toggle1
Non-Erasing BlockData read as normal1
Toggle0––0
Toggle1––0
RB
Erase Error
Note: Uns pecified da ta bits shou ld be i gnored.
14/35
Good Block Address0Toggle11No Toggle0
Faulty Block Address0Toggle11Toggle0
Page 15
Figure 5. Dat a Po ll i ng Fl o wc h a rtFigure 6. Dat a Toggle Flow c hart
M29F032D
START
READ DQ5 & DQ7
at VALID ADDRESS
DQ7
YES
=
DATA
NO
NO
DQ5
= 1
YES
READ DQ7
at VALID ADDRESS
DQ7
YES
=
DATA
NO
FAILPASS
AI05267
START
READ
DQ5 & DQ6
READ DQ6
DQ6
=
TOGGLE
YES
NO
DQ5
= 1
YES
READ DQ6
TWICE
DQ6
=
TOGGLE
YES
FAILPASS
NO
NO
AI05268
15/35
Page 16
M29F032D
MAXIMUM RATIN G
Stressing the device ab ove the rating listed in t he
Absolute Maximum Ratings table may cause permanent damage to the device. Exposure to Absolute Maximum Rating conditions for extended
periods may affect device reliability. These are
stress ratings only and operation of the dev ice at
Table 6. Absolute Maximum Ratings
SymbolParameterMinMaxUnit
T
BIAS
T
STG
V
IO
V
CC
V
ID
Note: 1. Minimum Volt age may unde rshoot to –2V or overshoot to VCC +2V during tr ansition for a maximum of 20ns.
these or any other conditions above those indicated in the Operating sections of this specification is
not implied. Refer also to the STMicroelectronics
SURE Program and ot her relevant quality documents.
–65150°C
V
–0.6
CC
+ 0.6
V
16/35
Page 17
M29F032D
DC AND AC PARAMETERS
This section summarizes t he operating m easurement conditions, and the DC and AC characteristics of the device. The parameters in the DC and
AC characteristics Tables that follow, are derived
from tests performed under the Measurement
Table 7. Operating and AC Measurement Conditions
Parameter
V
Supply Voltage
CC
Ambient Operating Temperature– 4085°C
Conditions summarized in Table 7, Operating and
AC Measurement Conditions. Designers should
check that the operating cond itions in their circuit
match the operating conditions when relying on
the quoted parameters.
M29F032D
MinMax
4.55.5V
Unit70
Load Capacitance (C
)
L
100pF
Input Rise and Fall Times10ns
Input Pulse Voltages0.45 to 2.4V
Input and Output Timing Ref. Voltages0.8 and 2.0V
Figure 7. AC Measurement I/O WaveformFigure 8. AC Measurement Load Circuit
1.3V
V
2.4V
0.45V
2.0V
0.8V
CC
DEVICE
UNDER
TEST
AI05750
0.1µF
1N914
3.3kΩ
CL
OUT
CL includes JIG capacitance
Table 8. Device Capacitance
SymbolParameterTest ConditionMinMaxUnit
V
V
IN
OUT
= 0V
= 0V
6pF
12pF
C
IN
C
OUT
Note: Sampled only, not 100% te st ed.
Input Capacitance
Output Capacitance
AI05266
17/35
Page 18
M29F032D
Table 9. DC Characteristics
SymbolParameterTest ConditionMinMaxUnit
I
LI
I
LO
I
CC1
I
CC2
I
CC3
Input Leakage Current
Output Leakage Current
Supply Current (Read)
Supply Current (Standby) TTL
Supply Current (Standby) CMOS
0V ≤ V
0V ≤ V
E
= VIL, G = VIH, f = 6MHz
E
RP
≤ V
IN
CC
≤ V
OUT
E
= V
IH
= VCC ± 0.2V,
= VCC ±0.2V
CC
±1µA
±1µA
20mA
1mA
150µA
(1)
I
CC4
V
V
V
Supply Current (Program/Erase)
Input Low Voltage–0.50.8V
IL
Input High Voltage2
IH
Output Low Voltage
OL
Output High Voltage TTL
V
OH
V
I
V
LKO
Note: 1. Sampled only, not 100% tested.
Output High Voltage CMOS
Identification Voltage11.512.5V
ID
Identification Current
ID
Program/Erase Lockout Supply
(1)
Voltage
Program/Erase
Controller active
I
= 5.8mA
OL
I
= –2.5mA
OH
I
= –100µAVCC – 0.4
OH
A9 = V
ID
20mA
V
+ 0.5
CC
0.45V
2.4V
100µA
3.24.2V
V
V
18/35
Page 19
Figure 9. Read AC Waveforms
M29F032D
tAVAV
A0-A21
tAVQVtAXQX
E
tELQV
tELQXtEHQZ
G
tGLQXtGHQX
DQ0-DQ7
VALID
tGLQV
Table 10. Read AC Characteristics
SymbolAltParameterTest Condition
E
t
AVAV
t
AVQV
(1)
t
ELQX
t
ELQV
(1)
t
GLQX
t
GLQV
(1)
t
EHQZ
(1)
t
GHQZ
t
EHQX
t
GHQX
t
AXQX
Note: 1. Sampled only, not 100% tested.
t
t
ACC
t
t
t
OLZ
t
t
t
t
OH
Address Valid to Next Address Valid
RC
Address Valid to Output Valid
Chip Enable Low to Output Transition
LZ
Chip Enable Low to Output Valid
CE
Output Enable Low to Output Transition
Output Enable Low to Output Valid
OE
Chip Enable High to Output Hi-Z
HZ
Output Enable High to Output Hi-Z
DF
Chip Enable, Output Enable or Address
Transition to Output Transition
= VIL,
G
= V
E
= VIL,
G
= V
G
= V
G
= V
E
= V
E
= V
G
= V
E
= V
IL
IL
IL
IL
IL
IL
IL
IL
tEHQX
tGHQZ
VALID
AI05261
M29F032D
Unit
70
Min70ns
Max70ns
Min0ns
Max70ns
Min0ns
Max30ns
Max20ns
Max20ns
Min0ns
19/35
Page 20
M29F032D
Figure 10. Write AC Waveforms, Write Enable Controlled
tAVAV
A0-A21
tAVWL
E
VALID
tWLAX
tWHEH
tELWL
G
tWLWHtGHWL
W
tDVWH
DQ0-DQ7
V
CC
RB
tVCHEL
VALID
tWHRL
Table 11. Write AC Characteristics, Write Enable Controlled
SymbolAltParameter
t
AVAV
t
ELWL
t
WLWH
t
DVWH
t
WHDX
t
WHEH
t
WHWL
t
AVWL
t
WLAX
t
GHWL
t
WHGL
(1)
t
WHRL
t
VCHEL
Note: 1. Sampled only, not 100% tested.
t
WC
t
CS
t
WP
t
DS
t
DH
t
CH
t
WPH
t
AS
t
AH
t
OEH
t
BUSY
t
VCS
Address Valid to Next Address ValidMin70ns
Chip Enable Low to Write Enable LowMin0ns
Write Enable Low to Write Enable HighMin45ns
Input Valid to Write Enable HighMin45ns
Write Enable High to Input TransitionMin0ns
Write Enable High to Chip Enable HighMin0ns
Write Enable High to Write Enable LowMin20ns
Address Valid to Write Enable LowMin0ns
Write Enable Low to Address TransitionMin45ns
Output Enable High to Write Enable LowMin0ns
Write Enable High to Output Enable LowMin0ns
Program/Erase Valid to RB LowMax30ns
VCC High to Chip Enable Low
tWHGL
tWHWL
tWHDX
AI05262
M29F032D
Unit
70
Min50µs
20/35
Page 21
Figure 11. Write AC Waveforms, Chip Enable Controlled
tAVAV
A0-A21
tAVEL
W
VALID
M29F032D
tELAX
tEHWH
tWLEL
G
tELEHtGHEL
E
tDVEH
DQ0-DQ7
V
CC
RB
tVCHWL
VALID
tEHRL
Table 12. Write AC Characteristics, Chip Enable Controlled
SymbolAltParameter
t
AVAV
t
WLEL
t
ELEH
t
DVEH
t
EHDX
t
EHWH
t
EHEL
t
AVEL
t
ELAX
t
GHEL
t
EHGL
(1)
t
EHRL
t
VCHWL
Note: 1. Sampled only, not 100% tested.
t
WC
t
WS
t
CP
t
DS
t
DH
t
WH
t
CPH
t
AS
t
AH
t
OEH
t
BUSY
t
VCS
Address Valid to Next Address ValidMin70ns
Write Enable Low to Chip Enable LowMin0ns
Chip Enable Low to Chip Enable HighMin45ns
Input Valid to Chip Enable HighMin45ns
Chip Enable High to Input TransitionMin0ns
Chip Enable High to Write Enable HighMin0ns
Chip Enable High to Chip Enable LowMin20ns
Address Valid to Chip Enable LowMin0ns
Chip Enable Low to Address TransitionMin45ns
Output Enable High Chip Enable LowMin0ns
Chip Enable High to Output Enable LowMin0ns
Program/Erase Valid to RB LowMax30ns
VCC High to Write Enable Low
tEHGL
tEHEL
tEHDX
AI05263
M29F032D
Unit
70
Min50µs
21/35
Page 22
M29F032D
Figure 12. Reset/Block Temporary Unprotect AC Wavefo rms
E, G
W,
tPHWL, tPHEL, tPHGL
RB
RP
Table 13. Reset/Block Temporary Unprotect AC Characteristics
SymbolAltParameter
(1)
t
PHWL
t
PHEL
(1)
t
PHGL
(1)
t
RHWL
(1)
t
RHEL
(1)
t
RHGL
t
PLPX
(1)
t
PLYH
(1)
t
PHPHH
(1)
t
VHH
Note: 1. Sampled only, not 100% tested.
t
RH
t
RB
t
RP
t
READY
t
VIDR
tPLPX
tPLYH
RP High to Write Enable Low, Chip Enable Low,
Output Enable Low
RB High to Write Enable Low, Chip Enable Low,
Output Enable Low
RP Pulse WidthMin500ns
RP Low to Read ModeMax10µs
RP Rise Time to V
ID
VHH Rise and Fall Time
tRHWL, tRHEL, tRHGL
tPHPHH
AI02931B
M29F032D
Unit
70
Min50ns
Min0ns
Min500ns
Min250ns
22/35
Page 23
PACKAGE MECHANICAL
TSOP40 – 40 lead Plastic Thin Small Outline, 10 x 20mm, Package Outline
A2
M29F032D
Note: Drawing is not to scale.
1N
N/2
D1
DIE
TSOP-a
E
A
D
C
e
B
CP
LA1α
TSOP40 – 40 lead Plastic Thin Small Outline, 10 x 20mm, Package Mechan ic al Data
Devices are shipped from the factory with the memory content bits erased to ’1’.
For a list of available options (Speed, Pac kage, etc...) or for furthe r information on any aspect of this device, please contact the ST Sales Office nearest to you.
REVISION HIST ORY
Table 15. Document Revision History
DateVersionRevision Details
March-2001-01First Issue (Brief Data)
21-Jun-2001-02Document expanded to full Product Preview
14-Dec-2001-03
05-Apr-2002-04
55ns Speed Class removed, Block Protection Appendix added, CFI Table 21, address
2Fh data clarified, Read/Reset operation during Erase Suspend clarified .
Description of Ready/Busy signal clarified (and Figure 12 modified)
Clarified allowable commands during block erase
Clarified the mode the device returns to in the CFI Read Query command section
The Common Flash Interface is a JEDEC approved, standardized data structure that can be
read from the Flash memory device. It allows a
system software to query the device to det ermine
various electrical and t iming parameters, density
information and functions supported by the memory. The system can interface easily with the device, enabling the software to upgrade itself when
necessary.
When the CFI Query Command is issued the device enters CFI Query mode and the data structure
Table 17. Query Structure Overvi ew
AddressSub-section NameDescription
10hCFI Query Identification StringCommand set ID and algorithm data offset
1BhSystem Interface InformationDevice timing & voltage information
27hDevice Geometry DefinitionFlash device layout
is read from the memory. Tables 17, 18, 19, 20, 21
and 22 show the address es used to retrieve the
data.
The CFI data structure also contains a security
area where a 64 bit unique security number is written (see Table 22, Security Code area). This area
can be accessed only in Read mode by the final
user. It is impossible to change t he secu rity number after it has been written by ST. Issue a Read
command to return to Read mode.
40h
61hSecurity Code Area64 bit unique device number
Note: Query data are always presented on the lowest order data outputs.
Primary Algorithm-specific Extended Query
table
Additional information specific to the Primary
Algorithm (optional)
Primary Algorithm Command Set and Control Interface ID code 16 bit ID code
defining a specific algorithm
Address for Primary Algorithm extended Query table (see Table 20)P = 40h
Alternate Vendor Command Set and Control Interface ID Code second vendor
- specified algorithm supported
Address for Alternate Algorithm extended Query table
AMD
Compatible
NA
NA
26/35
Page 27
M29F032D
Table 19. CFI Query System Interface Information
AddressDataDescriptionValue
V
Logic Supply Minimum Program/Erase voltage
1Bh45h
1Ch55h
1Dh00h
1Eh00h
1Fh04h
20h00h
21h0Ah
22h00h
23h04h
24h00h
25h03h
26h00h
Note: 1. Not supported in the CFI
CC
bit 7 to 4BCD value in volts
bit 3 to 0BCD value in 100 mV
Logic Supply Maximum Program/Erase voltage
V
CC
bit 7 to 4BCD value in volts
bit 3 to 0BCD value in 100 mV
V
[Programming] Supply Minimum Program/Erase voltage
PP
00h not supported
[Programming] Supply Maximum Program/Erase voltage
V
PP
00h not supported
n
Typical timeout per single byte program = 2
µs
Typical timeout for minimum size write buffer program = 2
Typical timeout per individual block erase = 2
Typical timeout for full chip erase = 2
n
Maximum timeout for byte program = 2
Maximum timeout for write buffer program = 2
Maximum timeout per individual block erase = 2
Maximum timeout for chip erase = 2
n
times typical
n
ms
ms
n
times typical
n
times typical
n
times typical
n
µs
see note (1)
256µs
see note (1)
4.5V
5.5V
NA
NA
16µs
NA
1s
NA
8s
27/35
Page 28
M29F032D
Table 20. Device Geometry Definition
AddressDa taDescriptionValue
27h16h
28h
29h
2Ah
2Bh
2Ch01h
2Dh
2Eh
2Fh
30h
00h
00h
00h
00h
3Fh
00h
00h
01h
n
Device Size = 2
Flash Device Interface Code description
Maximum number of bytes in multi-byte program or page = 2
Number of Erase Block Regions within the device.
It specifies the number of regions within the device containing contiguous
Erase Blocks of the same size.
Region 1 Information
Number of identical size erase block = 003Fh+1
Region 1 Information
Block size in Region 1 = 0100h * 256 byte
in number of bytes
n
4 MByte
x8 only
Async.
64 Kbyte
NA
1
64
28/35
Page 29
M29F032D
Table 21. Primary Algorithm-Sp ecific Extend ed Qu ery Ta ble
AddressDataDescriptionValue
40h5 0h
"P"
41h52h"R"
42h49h"I"
43h31hMajor version number, ASCII"1"
44h30hMinor version number, ASCII"0"
45h00hAddress Sensitive Unlock (bits 1 to 0)
46h02hErase Suspend
47h04hBlock Protection
48h01hTemporary Block Unprotect
49h04hBlock Protect /Unprotect
4Ah00hSimultaneous Operati ons, 00 = not supporte dNo
4Bh00hBurst Mode, 00 = not supported, 01 = supportedNo
4Ch00hPage Mode, 00 = not supported, 01 = 4 page word, 02 = 8 page wordNo
00 = required, 01= not required
Silicon Revision Number (bits 7 to 2)
00 = not supported, 01 = Read only, 02 = Read and Write
00 = not supported, x = number of blocks per group
00 = not supported, 01 = supported
04 = M29W400B mode
Table 22. Security Code Area
AddressDataDescription
61hXX
62hXX
63hXX
64hXX
65hXX
66hXX
67hXX
68hXX
64 bit: unique device number
Yes
2
4
yes
4
29/35
Page 30
M29F032D
APPENDIX C. BLOCK PROTECTION
Block protection can be used to prevent any operation from modifying the data stored in the memory. The blocks are protected in groups, refer to
Appendix A, Table 16 for details of the Protection
Groups. Once protected, P rogram and Erase operations within the protected group fail to change
the data.
There are three techniques that can be used to
control Block Protection, these are the Programmer technique, the In-System technique and Temporary Unprotection. Temporary Unprotection is
controlled by the Reset/B lock Temporary Unprotection pin, RP
scriptions section.
To protect the Extended Block issue the Enter Extended Block command and then use either the
Programmer or In-System technique. Once protected issue the Exit Extended Block command to
return to read mode. The Extended Block protection is irreversible, once protected th e protection
cannot be undone.
Programm er Technique
The Programmer techniq ue uses high (V
age levels on some of the bus pins. These cannot
be achieved using a standard microprocessor bus,
therefore the technique is recommended on ly for
use in Programming Equipment.
To protect a group of blocks follow the flowchart in
Figure 13, Programmer Equip ment Block Protect
Flowchart. To unprotect the whole chip it is necessary to protect all of the groups first, then all
groups can be unprotected at the same time. To
unprotect the chip follow F igure 14, Programmer
Equipment Chip Unprotect Flowchart. Table 23,
; this is described in the Signal De-
) volt-
ID
Programmer Technique B us Operations, gives a
summary of each operation.
The timing on these flowcharts is critical. Care
should be taken to en sure that, where a pau se is
specified, it is followed as closely as possible. Do
not abort the procedure be fore reaching the end.
Chip Unprotect can take several seconds and a
user message should be provided to show that the
operation is progressing.
In-System Technique
The In-System technique requires a high volt age
level on the Reset/Blocks Temporary Unprotect
pin, RP
. This can be achieved without violating the
maximum ratings of the components on the microprocessor bus, therefore this technique is suitable
for use after the memory has been fitted to the system.
To protect a group of blocks follow the flowchart in
Figure 15, In-System B lock Protect Flowchart. T o
unprotect the whole chip it is necessary to protect
all of the groups first, then all the groups can be
unprotected at the same time. To unprotect the
chip follow Figure 16, In-System Chip Unprotect
Flowchart.
The timing on these flowcharts is critical. Care
should be taken to en sure that, where a pau se is
specified, it is followed as closely as possible. Do
not allow the microprocessor to s ervice interrupts
that will upset the timing and do not abort the procedure before reaching the end. Chip Unprotect
can take several seconds and a user message
should be provided to show that the operation is
progressing.
Table 23. Programmer Technique Bus Op erati ons , BYTE
OperationEGW
Block (Group)
(1)
Protect
Chip Unprotect
Block (Group)
Protection Verify
Block (Group)
Unprotection Verify
Note: 1. Block Protection Groups are sh own in Appendix A, Table 16.
30/35
V
ILVIDVIL
V
IDVIDVIL
V
ILVIL
V
ILVIL
Pulse
Pulse
V
IH
V
IH
A9 = V
A0 = VIL, A1 = VIH, A6 = VIL, A9=VID,
A0 = VIL, A1 = VIH, A6 = VIH, A9 = VID,
Address Inputs
A0-A21
, A12-A21 Block Address
ID
Others = X
A9 = V
, A12 = VIH, A15 = VIH
ID
Others = X
A12-A21 Block Address
Others = X
A12-A21 Block Address
Others = X
= VIH or V
IL
Data Inputs/Outputs
DQ15A–1, DQ14 -DQ0
X
X
Pass = XX01h
Retry = XX00h
Retry = XX01h
Pass = XX00h
Page 31
Figure 13. Programmer Equipment Group Protect Flowchart
START
ADDRESS = GROUP ADDRESS
W = V
IH
n = 0
G, A9 = VID,
E = V
IL
Wait 4µs
W = V
IL
Wait 100µs
W = V
IH
M29F032D
VerifyProtectSet-upEnd
E, G = VIH,
A0, A6 = VIL,
A1 = V
IH
E = V
IL
Wait 4µs
G = V
IL
Wait 60ns
Read DATA
DATA
=
01h
YES
A9 = V
IH
E, G = V
IH
PASS
NO
++n
= 25
A9 = V
E, G = V
NO
YES
IH
IH
Note: Block Protection Groups are shown in Appendix A, Table 16.
FAIL
AI05574
31/35
Page 32
M29F032D
Figure 14. Programmer Equipme nt Chip Unprotect Flowchart
START
PROTECT ALL GROUPS
CURRENT GROUP = 0
ADDRESS = CURRENT GROUP ADDRESS
n = 0
A6, A12, A15 = V
E, G, A9 = V
Wait 4µs
W = V
Wait 10ms
W = V
E, G = V
A0 = VIL, A1, A6 = V
E = V
Wait 4µs
IH
ID
IL
IH
IH
IL
(1)
IH
Wait 60ns
VerifyUnprotectSet-upEnd
++n
NO
= 1000
YES
A9 = V
IH
E, G = V
IH
FAILPASS
Note: Block Protection Groups are shown in Appendix A, Table 16.
Read DATA
32/35
G = V
DATA
=
00h
IL
YESNO
A9 = V
E, G = V
INCREMENT
CURRENT GROUP
LAST
GROUP
NO
YES
IH
IH
AI05575
Page 33
Figure 15. In- S ys te m Eq ui pm ent Group P rote ct Fl owchart
START
n = 0
RP = V
ID
M29F032D
VerifyProtectSet-upEnd
ADDRESS = GROUP ADDRESS
ADDRESS = GROUP ADDRESS
ADDRESS = GROUP ADDRESS
ADDRESS = GROUP ADDRESS
A0 = VIL, A1 = VIH, A6 = V
WRITE 60h
A0 = VIL, A1 = VIH, A6 = V
WRITE 60h
A0 = VIL, A1 = VIH, A6 = V
Wait 100µs
WRITE 40h
A0 = VIL, A1 = VIH, A6 = V
Wait 4µs
READ DATA
DATA
RP = V
=
01h
NO
YES
IH
IL
IL
IL
IL
++n
= 25
NO
ISSUE READ/RESET
COMMAND
PASS
Note: Block Protection Groups are shown in Appendix A, Table 16.
Note: Block Protection Groups are shown in Appendix A, Table 16.
34/35
DATA
=
00h
YESNO
LAST
GROUP
RP = V
ISSUE READ/RESET
COMMAND
PASS
NO
YES
IH
AI05577
Page 35
M29F032D
Information furnished is believed to be ac curate and reli able. Howev er, STMicroel ectronics assumes no responsibilit y for the consequence s
of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted
by implic ation or otherwise under any patent or patent rights of STMi croelectr onics. Specifications mentioned in thi s publicati on are subject
to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not
authorized for use as cri tical comp onents in life support dev i ces or systems wi t hout express written ap proval of STMi croelect ro nics.
The ST log o i s registered trademark of STMicroelectronics
All other nam es are the pro perty of their respective owners