Datasheet M27C256B Datasheet (SGS Thomson Microelectronics)

Page 1
256 Kbit (32Kb x 8) UV EPROM and OTP EPROM
5V ± 10% SUPPLYVOLTAGEin READ OPERATION
FASTACCESSTIME: 45ns LOW POWERCONSUMPTION: – ActiveCurrent 30mAat 5MHz – StandbyCurrent 100µA PROGRAMMING VOLTAGE:12.75V ± 0.25V PROGRAMMINGTIME: 100µs/byte
(PRESTOII ALGORITHM) ELECTRONICSIGNATURE – ManufacturerCode:20h – DeviceCode: 8Dh
28
1
FDIP28W (F)
M27C256B
28
1
PDIP28 (B)
DESCRIPTION
TheM27C256Bisa256 KbitEPROMofferedin the two ranges UV (ultra violet erase) and OTP (one time programmable). It is ideally suited for micro­processorsystems and is organizedas 32,768 by 8 bits.
The FDIP28W(window ceramicfrit-seal package) has a transparent lid which allows the user to expose the chipto ultravioletlight to erase the bit pattern. A new pattern can then be written to the deviceby followingthe programmingprocedure.
Forapplicationswhere the content isprogrammed only one time and erasure is not required, the M27C256B is offered in PDIP32, PLCC32 and TSOP28(8 x 13.4mm) packages.
Table1. Signal Names
A0-A14 Address Inputs Q0-Q7 Data Outputs E Chip Enable G Output Enable V
PP
Program Supply
PLCC32 (C)
TSOP28 (N)
8 x 13.4mn
Figure1. Logic Diagram
V
15
A0-A14 Q0-Q7
E
G
V
M27C256B
V
PP
SS
8
AI00755B
V
CC
V
SS
July 1998 1/15
Supply Voltage Ground
Page 2
M27C256B
Figure2A. DIPPin Connections
V
PP
A12
A7 A6 A5 A4 A3 A2 A1 A0
Q0
Q2 SS
1 2 3 4 5 6 7
M27C256B
8 9 10 11 12 13 14
28 27 26 25 24 23 22 21 20 19 18 17 16 15
AI00756
V
A14 A13 A8 A9 A11 G A10 E Q7 Q6 Q5Q1 Q4 Q3V
Figure2B. LCC PinConnections
PP
A13
32
V
Q3
A14
Q4
25
Q5
A8 A9 A11 NC G A10 E Q7 Q6
AI00757
V
A7
A12
A6 A5 A4 A3 A2
9 A1 A0
Q0
Q1
Warning: NC = Not Connected, DU = Dont’t Use.
1
M27C256B
17
Q2
SS
V
Figure2C. TSOPPin Connections
G
A11
A13 A14
V
V
A12
A9 A8
PP
A7 A6 A5 A4 A3
22
28
M27C256B
1
78
21
15 14
AI00614B
A10 E Q7 Q6 Q5 Q4 Q3 V
SS
Q2 Q1 Q0 A0 A1 A2
DEVICEOPERATION
The operating modes of the M27C256B are listed in the Operating Modes. A single power supply is requiredinthereadmode. AllinputsareTTLlevels exceptforV
and12V on A9for ElectronicSigna-
PP
ture.
Read Mode
The M27C256Bhas two control functions,both of which must be logically active in order to obtain data at the outputs.Chip Enable (E) is the power control and should be used for device selection. OutputEnable(G) is theoutputcontrol and should be used to gate data to the output pins, inde­pendent of device selection. Assuming that the addresses are stable, the address access time
)isequaltothedelayfromE tooutput(t
(t
AVQV
Datais available at the output after delay of t
ELQV
GLQV
from the falling edge of G, assuming that E has been low and the addresses have been stable for at leastt
AVQV-tGLQV
.
StandbyMode
The M27C256B has a standby mode which re­ducesthe supplycurrentfrom 30mAto 100µA.The M27C256Bis placed in the standby mode by ap­plyinga CMOShigh signal to the E input.When in thestandbymode,theoutputs are ina highimped­ance state,independentof theG input.
).
2/15
Page 3
M27C256B
Table2. AbsoluteMaximum Ratings
(1)
Symbol Parameter Value Unit
T
A
T
BIAS
T
STG
V
IO
V
CC
V
A9
V
PP
Notes: 1. Except for the rating ”Operating Temperature Range”, stresses above those listed in the Table ”Absolute Maximum Ratings”
2. Minimum DC voltage on Input or Output is –0.5V withpossible undershoot to –2.0V for a period less than 20ns. Maximum DC
3. Depends on range.
Ambient Operating Temperature TemperatureUnder Bias –50 to 125 Storage Temperature –65 to 150
(2)
Input or Output Voltages(except A9) –2 to 7 V Supply Voltage –2 to 7 V
(2)
A9 Voltage –2 to 13.5 V Program SupplyVoltage –2 to 14 V
may cause permanent damage to the device. These are stress ratingsonly and operation of the device at these or any other conditions above those indicated in the Operating sections of this specificationis not implied. Exposure to Absolute Maximum Rating conditions for extended periods may affectdevice reliability. Refer also tothe STMicroelectronics SURE Program and other relevant quality documents.
voltage on Output is V
+0.5V with possible overshoot to VCC+2V for a period less than20ns.
CC
(3)
–40 to 125
C
°
C
°
C
°
Table3. Operating Modes
Mode E G A9 V
Read V Output Disable V Program V Verify V Program Inhibit V Standby V Electronic Signature V
Note:X =VIHor VIL,VID= 12V±0.5V
IL
IL
Pulse V
IL
IH
IH
IH
IL
PP
V
IL
V
IH
IH
V
IL
V
IH
XVCCData Out XVCCHi-Z XVPPData In XVPPData Out XVPPHi-Z
XXVCCHi-Z
V
IL
V
ID
V
CC
Q0 - Q7
Codes
Table4. Electronic Signature
Identifier A0 Q7 Q6 Q5 Q4 Q3 Q2 Q1 Q0 Hex Data
Manufacturer’s Code V Device Code V
IL
IH
Two Line OutputControl
BecauseEPROMsareusuallyusedin largermem­ory arrays, this product features a 2 line control functionwhich accommodatesthe use of multiple memory connection. The two line control function allows:
a. the lowest possiblememory power dissipation, b. complete assurancethat output bus contention
00100000 20h 10001101 8Dh
Forthe mostefficientuse of thesetwocontrollines, E should be decoded and used as the primary deviceselectingfunction, whileG shouldbe made a common connection to all devices in the array and connected to the READ line from the system controlbus.Thisensuresthat all deselectedmem­ory devices are in their low power standby mode and that the outputpins are only active when data is desired from a particular memorydevice.
will not occur.
3/15
Page 4
M27C256B
Table5. AC MeasurementConditions
High Speed Standard
Input Rise and Fall Times Input Pulse Voltages 0 to 3V 0.4V to 2.4V Input and Output Timing Ref. Voltages 1.5V 0.8V and2V
10ns
20ns
Figure3. AC TestingInput Output Waveform
High Speed
3V
1.5V
0V
Standard
2.4V
0.4V
Table6. Capacitance
Symbol Parameter Test Condition Min Max Unit
C
IN
C
OUT
Note: 1. Sampled only, not 100% tested.
(1)
(TA=25°C, f =1 MHz)
Input Capacitance VIN=0V 6 pF Output Capacitance V
2.0V
0.8V
AI01822
Figure4. AC TestingLoad Circuit
1.3V
1N914
3.3k
DEVICE
UNDER
TEST
C
L
CL= 30pF for High Speed CL= 100pFfor Standard CLincludes JIG capacitance
=0V 12 pF
OUT
OUT
AI01823B
SystemConsiderations
The power switching characteristics of Advance CMOS EPROMsrequire careful decoupling of the devices. The supply current, I
, has three seg-
CC
ments that are of interest to thesystem designer: the standby current level, the active current level, and transient current peaks that are produced by thefalling and risingedgesof E. Themagnitudeof this transient current peaks is dependent on the capacitiveandinductiveloadingofthe deviceat the output.
4/15
The associated transient voltage peaks can be suppressed by complying with the two line output control and by properly selected decoupling ca­pacitors. It is recommended that a 0.1µF ceramic capacitor be used on every device between V
CC
andVSS. Thisshould bea highfrequencycapacitor of low inherent inductance and should be placed as close to the device as possible. In addition, a
4.7µF bulk electrolytic capacitor should be used betweenV
and VSSforeveryeight devices.The
CC
bulk capacitor should be located near the power supply connection point. The purpose of the bulk capacitoris to overcome the voltage drop caused by the inductiveeffects of PCB traces.
Page 5
M27C256B
Table7. Read Mode DC Characteristics
(1)
(TA=0 to 70°C, –40 to 85°C, –40 to 105°C or –40 to 125°C; VCC=5V±5% or 5V± 10%;VPP=VCC)
Symbol Parameter Test Condition Min Max Unit
I
LI
I
LO
I
CC
I
CC1
I
CC2
I
PP
V
V
IH
V
OL
V
OH
Notes: 1. VCCmust be applied simultaneouslywith or before VPPand removed simultaneously or after VPP.
Input Leakage Current 0V≤V Output Leakage Current 0V≤V
Supply Current
E=V
= 0mA, f = 5MHz
I
OUT
Supply Current (Standby) TTL E = V Supply Current(Standby) CMOS E > VCC– 0.2V 100 Program Current VPP=V Input Low Voltage –0.3 0.8 V
IL
(2)
Input High Voltage 2 VCC+1 V Output Low Voltage IOL= 2.1mA 0.4 V Output High Voltage TTL IOH= –1mA 3.6 V Output High Voltage CMOS I
2. Maximum DC voltage on Outputis V
CC
+0.5V.
OH
V
IN
CC
V
OUT
CC
,G=VIL,
IL
IH
CC
= –100µAV
– 0.7 V
CC
10
±
10
±
µ µ
30 mA
1mA
µ
100
µ
A A
A A
Table8A. ReadMode AC Characteristics
(1)
(TA=0 to 70°C, –40 to 85°C, –40 to 105°C or –40 to 125°C; VCC=5V±5% or 5V± 10%;VPP=VCC)
M27C256B
Symbol Alt Parameter Test Condition
t
AVQVtACC
t
ELQV
t
GLQV
(2)
t
EHQZ
(2)
t
GHQZ
t
AXQX
Notes: 1. VCCmust be applied simultaneously with or before VPPand removed simultaneously or afterVPP.
2. Sampled only,not 100% tested.
3. In caseof 45ns speed see High Speed ACmeasurement conditions.
Address Validto Output Valid
Chip Enable Low to
t
CE
Output Valid Output Enable Low
t
OE
to Output Valid Chip Enable High to
t
DF
Output Hi-Z Output Enable High
t
DF
to Output Hi-Z Address Transition to
t
OH
Output Transition
E=V
G=V
G=V
E=V
,G=V
IL
E=V
E=V
,G=V
IL
IL
IL
IL
IL
IL
IL
(3)
-45
-60 -70 -80
Min Max Min Max Min Max Min Max
45 60 70 80 ns
45 60 70 80 ns
25 30 35 40 ns
0 25 0 30 0 30 0 30 ns
0 25 0 30 0 30 0 30 ns
0000ns
Unit
5/15
Page 6
M27C256B
Table8B. ReadMode AC Characteristics
(1)
(TA=0 to 70°C, –40 to 85°C, –40 to 105°C or –40 to 125°C; VCC=5V±5% or 5V± 10%;VPP=VCC)
M27C256B
Symbol Alt Parameter TestCondition
-90 -10 -12 -15/-20/-25
Min Max Min Max Min Max Min Max
t
AVQVtACC
t
ELQV
t
GLQV
(2)
t
EHQZ
(2)
t
GHQZ
t
AXQX
Notes: 1. VCCmust be applied simultaneously with or before VPPand removed simultaneously or afterVPP.
2. Sampled only,not 100% tested.
Address Validto Output Valid
Chip Enable Low to
t
CE
Output Valid Output Enable Low to
t
OE
Output Valid Chip Enable High to
t
DF
Output Hi-Z Output Enable High
t
DF
to Output Hi-Z Address Transition to
t
OH
Output Transition
E=V
E=V
,G=V
IL
G=V
E=V
G=V
E=V
,G=V
IL
IL
IL
IL
IL
IL
IL
90 100 120 150 ns
90 100 120 150 ns
40 50 60 65 ns
0 30 0 30 0 40 0 50 ns
0 30 0 30 0 40 0 50 ns
0000ns
Figure5. Read Mode ACWaveforms
Unit
A0-A14
E
G
Q0-Q7
VALID
tAVQV
tGLQV
tELQV
Programming
When delivered (and after each erasure for UV EPROM), all bits of the M27C256B are in the ”1” state. Data is introduced by selectively program­ming ”0”s into the desired bit locations. Although only ”0”s will be programmed, both ”1”s and ”0”s can be present in thedata word. The only way to
VALID
tAXQX
tEHQZ
tGHQZ
Hi-Z
AI00758B
changea ’0’toa ’1’isbydie expositionto ultraviolet light (UV EPROM). The M27C256B is in the pro­grammingmode when V at V
and E is pulsed to VIL. The data to be
IH
inputis at12.75V,G is
PP
programmed is applied to 8 bits in parallel to the data output pins. The levels required for the ad­dressand data inputs areTTL. V
is specifiedto
CC
be 6.25 V ± 0.25V.
6/15
Page 7
M27C256B
Table9. ProgrammingMode DC Characteristics
(1)
(TA=25°C; VCC=6.25V ± 0.25V;VPP=12.75V ± 0.25V)
Symbol Parameter TestCondition Min Max Unit
I
LI
I
CC
I
PP
V
V
V
OL
V
OH
V
Note: 1. VCCmust be applied simultaneouslywith or before VPPand removed simultaneously or after VPP.
Input Leakage Current V Supply Current 50 mA Program Current E= V Input Low Voltage –0.3 0.8 V
IL
Input High Voltage 2 VCC+ 0.5 V
IH
Output Low Voltage IOL= 2.1mA 0.4 V Output High Voltage TTL IOH= –1mA 3.6 V A9 Voltage 11.5 12.5 V
ID
Table10. ProgrammingMode AC Characteristics
V
V
IL
IN
IH
IL
(1)
10
±
50 mA
(TA=25°C; VCC=6.25V ± 0.25V;VPP=12.75V ± 0.25V)
Symbol Alt Parameter Test Condition Min Max Unit
t
AVEL
t
Address Valid to Chip Enable Low 2 µs
AS
A
µ
t
QVEL
t
VPHEL
t
VCHEL
t
ELEH
t
EHQX
t
QXGL
t
GLQV
t
GHQZ
t
GHAX
Note: 1. VCCmust be applied simultaneouslywith or before VPPand removed simultaneously or after VPP.
t
t
VPS
t
VCS
t
t
t
OES
t
t
DFP
t
Input Validto Chip Enable Low 2 µs
DS
VPPHigh to Chip Enable Low 2 µs VCCHigh to Chip Enable Low 2 µs Chip Enable Program Pulse Width 95 105 µs
PW
Chip Enable High to Input Transition 2 µs
DH
Input Transitionto Output Enable Low 2 µs Output Enable Low to Output Valid 100 ns
OE
Output Enable High to Output Hi-Z 0 130 ns Output Enable High to AddressTransition 0 ns
AH
7/15
Page 8
M27C256B
Figure6. Programmingand VerifyModes AC Waveforms
A0-A14
tAVEL
Q0-Q7
V
PP
V
CC
E
G
DATA IN DATA OUT
tQVEL
tVPHEL
tVCHEL
tELEH
Figure7. ProgrammingFlowchart
VCC= 6.25V, VPP= 12.75V
n=0
E = 100µs Pulse
NO
NO
VERIFY
YES
Last
NO
Addr
YES
CHECK ALL BYTES
1st: VCC=6V
2nd: VCC= 4.2V
++ Addr
YES
++n
=25
FAIL
VALID
tEHQX
tGLQV
tQXGL
PROGRAM VERIFY
PRESTOII ProgrammingAlgorithm
PRESTOII ProgrammingAlgorithmallows to pro­gramthe wholearray with a guaranteedmargin,in a typical time of 3.5 seconds. Programming with PRESTOII involvesthe applicationof a sequence of100µsprogrampulsestoeachbyteuntilacorrect verifyoccurs (see Figure 7). During programming and verify operation, a MARGIN MODE circuit is automatically activated in order to guarantee that each cell is programmedwith enoughmargin. No overprogram pulse is applied since the verify in MARGIN MODE provides necessary margin to each programmedcell.
ProgramInhibit
Programming of multiple M27C256Bs in parallel with different data is also easily accomplished. Except for E, all like inputs including G of the parallel M27C256B may be common. ATTL low level pulse applied to a M27C256B’sE input,with
at 12.75 V, will program that M27C256B. A
V
PP
high level E input inhibits the other M27C256Bs frombeingprogrammed.
ProgramVerify
AI00760B
A verify (read) should be performed on the pro­grammedbits todeterminethattheywere correctly programmed. Theverifyis accomplishedwith Gat
, E at VIH,VPPat 12.75V and VCCat 6.25V.
V
IL
tGHQZ
tGHAX
AI00759
8/15
Page 9
M27C256B
On-BoardProgramming
TheM27C256Bcan bedirectly programmedin the application circuit. See the relevant Application NoteAN620.
ElectronicSignature
The Electronic Signature (ES) mode allows the reading outof abinary code from an EPROMthat will identify its manufacturerand type. This mode is intended for use by programming equipment to automaticallymatchthe deviceto be programmed withits correspondingprogrammingalgorithm.The ES mode is functionalin the 25°C ± 5°C ambient temperaturerange that is required when program­mingthe M27C256B.Toactivatethe ESmode,the programmingequipmentmustforce11.5Vto 12.5V on addressline A9 of the M27C256B, with V V
= 5V. Two identifier bytes may then be se-
PP
CC
quenced from the device outputs by toggling ad­dresslineA0fromV must be held at V mode. Byte 0 (A0=V turercodeand byte1 (A0=V
toVIH. Allotheraddresslines
IL
during Electronic Signature
IL
) represents the manufac-
IL
) thedeviceidentifier
IH
code. For the STMicroelectronics M27C256B, thesetwo identifier bytes are givenin Table4 and canbe read-outon outputsQ0 to Q7.
ERASURE OPERATION(appliesfor UV EPROM)
The erasure characteristics of the M27C256B is such that erasure begins when the cells are ex­posed to light with wavelengths shorter than ap­proximately4000 Å.It shouldbe notedthatsunlight and some type of fluorescent lamps have wave­lengthsin the3000-4000Årange.Researchshows that constant exposure to room level fluorescent lighting could erasea typicalM27C256B in about 3 years, while it would take approximately1 week to cause erasure when exposedto directsunlight. If the M27C256B is to be exposed to these types of lightingconditions for extendedperiods of time, it is suggestedthat opaque labels be put over the M27C256B window to prevent unintentional era­sure.The recommendederasureprocedureforthe
=
M27C256B is exposure to short wave ultraviolet light which haswavelength 2537Å.The integrated dose(i.e. UVintensityx exposuretime)forerasure should be a minimum of 15 W-sec/cm sure time with this dosage is approximately15 to 20 minutes using an ultraviolet lamp with 12000 µW/cm
2
power rating. The M27C256B should be placed within 2.5 cm (1 inch) of the lamp tubes during the erasure. Some lamps have a filter on their tubes which should be removed before era­sure.
2
. The era-
9/15
Page 10
M27C256B
ORDERING INFORMATION SCHEME
Example: M27C256B -70 X C 1 TR
Speed
(1)
-45
-60 60 ns
-70 70 ns
-80 80 ns
-90 90 ns
-10 100 ns
-12 120 ns
-15 150 ns
-20 200 ns
-25 250 ns
Note: 1. High Speed,see AC Characteristics section for further information.
45 ns
V
Tolerance
CC
X ± 5%
blank
±
10%
Package
F FDIP28W B PDIP28 C PLCC32 N TSOP28
8 x 13.4mm
Temperature Range
1 0 to 70 °C 6 –40 to 85°C 7 –40 to 105°C 3 –40 to 125°C
Option
X Additional
Burn-in
TR Tape& Reel
Packing
Fora listofavailableoptions(Speed,Package,etc...)or forfurtherinformationon anyaspectof thisdevice, pleasecontact the STMicroelectronicsSales Officenearest to you.
10/15
Page 11
FDIP28W - 28 pin CeramicFrit-seal DIP, with window
M27C256B
Symb
A 5.71 0.225 A1 0.50 1.78 0.020 0.070 A2 3.90 5.08 0.154 0.200
B 0.40 0.55 0.016 0.022 B1 1.17 1.42 0.046 0.056
C 0.22 0.31 0.009 0.012
D 38.10 1.500
E 15.40 15.80 0.606 0.622 E1 13.05 13.36 0.514 0.526
e1 2.54 0.100 – e3 33.02 1.300
eA 16.17 18.32 0.637 0.721
L 3.18 4.10 0.125 0.161
S 1.52 2.49 0.060 0.098
α
N28 28
Typ Min Max Typ Min Max
7.11 0.280
mm inches
4
°
15
°
4
°
15
°
Drawing is not to scale.
A2
B1 B e
D2
D
S
N
1
A3A1A
L
α
C
eA eB
E1 E
FDIPW-a
11/15
Page 12
M27C256B
PDIP28 - 28 pin Plastic DIP, 600 mils width
Symb
Typ Min Max Typ Min Max
A 5.08 0.200 A1 0.38 0.015 – A2 3.56 4.06 0.140 0.160
B 0.38 0.51 0.015 0.020 B1 1.52 0.060
C 0.20 0.30 0.008 0.012 D 36.83 37.34 1.450 1.470
D2 33.02 1.300
E 15.24 0.600 – E1 13.59 13.84 0.535 0.545
e1 2.54 0.100 – eA 14.99 0.590 – eB 15.24 17.78 0.600 0.700
L 3.18 3.43 0.125 0.135 S 1.78 2.08 0.070 0.082
α
N28 28
mm inches
0
°
10
°
0
°
10
°
Drawing is notto scale.
12/15
B1 B e1
D2
D
S
N
1
A2A1A
E1 E
L
α
C
eA
eB
PDIP
Page 13
PLCC32 - 32lead Plastic Leaded Chip Carrier- rectangular
M27C256B
Symb
Typ Min Max Typ Min Max
A 2.54 3.56 0.100 0.140 A1 1.52 2.41 0.060 0.095 A2 0.38 0.015
B 0.33 0.53 0.013 0.021 B1 0.66 0.81 0.026 0.032
D 12.32 12.57 0.485 0.495 D1 11.35 11.56 0.447 0.455 D2 9.91 10.92 0.390 0.430
E 14.86 15.11 0.585 0.595 E1 13.89 14.10 0.547 0.555 E2 12.45 13.46 0.490 0.530
e 1.27 0.050
F 0.00 0.25 0.000 0.010
R 0.89 0.035
N32 32 Nd 7 7 Ne 9 9
CP 0.10 0.004
mm inches
D
D1
1N
Ne E1 E
Nd
PLCC
Drawing is not to scale.
R
F
0.51 (.020)
1.14 (.045)
D2/E2
A1
A2
B1
e
B
A
CP
13/15
Page 14
M27C256B
TSOP28- 28 lead Plastic Thin Small Outline, 8 x 13.4mm
Symb
Typ Min Max Typ Min Max
A 1.00 1.25 0.039 0.049 A1 0.20 0.008 A2 0.95 1.05 0.037 0.041
B 0.30 0.012
C 0.10 0.21 0.004 0.008 D 13.10 13.70 0.516 0.539
D1 11.70 11.90 0.461 0.469
E 7.90 8.25 0.311 0.325
e 0.55 - - 0.022 - -
L 0.30 0.70 0.012 0.028
α
N28 28
CP 0.10 0.004
mm inches
0
°
5
°
0
°
5
°
Drawing is notto scale.
28
1
22
21
E
78
D1
D
DIE
TSOP-c
A2
e
B
A
CP
C
LA1 α
14/15
Page 15
M27C256B
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences ofuse ofsuch information nor for any infringement of patents or other rights of third parties which may resultfrom itsuse. No license is granted by implicationor otherwiseunder any patent or patent rights of STMicroelectronics. Specifications mentioned in this publicationare subject to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not authorized for use as criticalcomponents in life support devices or systems without express written approval of STMicroelectronics.
The ST logo is a registeredtrademark of STMicroelectronics
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