Datasheet M27C2001 Datasheet (SGS Thomson Microelectronics)

Page 1
2 Mbit (256Kb x 8) UV EPROM and OTP EPROM
5V ± 10% SUPPLY VOLTAGE in READ
OPERATION
FAST ACCESS TIME: 55ns
LOW POWER CONSUMPTION:
– Active Current 30mA at 5MHz – Standby Current 100µA
PROGRAMMING VOLTAGE: 12.75V± 0.25V
PROGRAMMING TIME: 100µs/byte (typical)
ELECTRONIC SIGNATURE
– Manufacturer Code: 20h – Device Code: 61h
M27C2001
32
1
FDIP32W (F) PDIP32 (B)
32
1
DESCRIPTION
The M27C2001 is a high speed 2 Mbit EPROM of­fered in the two ranges UV (ultra violet erase) and OTP (one time programmable). It is ideally suited for microprocessor systems requiring large pro­grams and is organised as 262,144 by 8 bits.
The FDIP32W (window ceramic frit-seal package) and LCCC32W (leadless chip carrier package) have a transparent lids which allow the user to ex­pose the chipto ultraviolet light to erase thebitpat­tern. A new pattern can then be written to the device by following the programming procedure.
For applications wherethe content is programmed only one time and erasure is not required, the M27C2001 is offered in PDIP32, PLCC32 and TSOP32 (8 x 20 mm) packages.
Table 1. Signal Names
A0-A17 Address Inputs Q0-Q7 Data Outputs E Chip Enable G Output Enable
LCCC32W (L)
PLCC32 (K) TSOP32 (N)
Figure 1. Logic Diagram
V
CC
18
A0-A17
P
E
G
M27C2001
V
8 x 20 mm
PP
8
Q0-Q7
P Program V
PP
V
CC
V
SS
Program Supply Supply Voltage Ground
V
SS
AI00716B
1/16April 1999
Page 2
M27C2001
Figure 2A. DIP Pin Connections
V
PP
A15 A12
A7 A6 A5 A4 A3 A2 A1 A0
Q0
Q2 SS
1 2 3 4 5 6 7 8
M27C2001
9 10 11 12 13 14 15 16
32 31 30 29 28 27 26 25 24 23 22 21 20 19 18 17
AI00717
V
CC
PA16 A17 A14 A13 A8 A9 A11 G A10 E Q7 Q6 Q5Q1 Q4 Q3V
Figure 2B. LCC Pin Connections
CC
VPPV
32
Q3
Q4
P
Q5
A7 A6 A5 A4 A3 A2 A1 A0
Q0
9
A12
A15
M27C2001
Q1
Q2
A16
1
17
SS
V
A17
25
Q6
A14 A13 A8 A9 A11 G A10 E Q7
AI00718
Figure 2C. TSOP Pin Connections
A11 G
A9
A8 A13 A14 A17
V
CC
V
PP
A16 A15 A12
A7
A6
A5
A4 A3
1
P
M27C2001
8
(Normal)
9
16 17
32
25 24
AI01153B
A10 E Q7 Q6 Q5 Q4 Q3 V
SS
Q2 Q1 Q0 A0 A1 A2
The operationg modes of the M27C2001 are listed in the Operating Modes table. A single power sup­ply is required in the read mode. Allinputs are TTL levels except for VPPand 12V on A9 for Electronic Signature.
Read Mode
The M27C2001 has two control functions, both of which must be logically active in order to obtain data at the outputs. Chip Enable (E) is the power control and should be used for device selection. Output Enable (G) is the output control and should be used to gate data to the output pins, indepen­dent of device selection. Assuming that the ad­dresses are stable, the address access time (t
) is equal to the delay from E to output
AVQV
(t
). Data is availableatthe output after a delay
ELQV
of t
from the falling edge of G, assuming that
GLQV
E has been low and the addresses have been sta­ble for at least t
AVQV-tGLQV
.
Standby Mode
The M27C2001 has a standby mode which reduc­es the supply current from 30mA to 100µA. The M27C2001 is placed in the standby mode by ap­plying a CMOS high signalto the E input. When in the standbymode, theoutputsarein a high imped­ance state, independent of the G input.
2/16
Page 3
M27C2001
Table 2. Absolute Maximum Ratings
(1)
Symbol Parameter Value Unit
T
A
T
BIAS
T
STG
(2)
V
IO
V
CC
(2)
V
A9
V
PP
Note: 1. Except for the rating ”Operating Temperature Range”, stressesabove those listedin the Table ”Absolute Maximum Ratings” may
cause permanent damage to the device. These are stress ratings only and operation of the device at these or any other conditions above thoseindicated in the Operating sections of this specification is not implied. Exposure to Absolute Maximum Rating condi­tions forextended periods may affect device reliability. Refer alsoto theSTMicroelectronics SUREProgram and otherrelevant qual­ity documents.
2. Minimum DC voltage on Input or Output is –0.5V with possible undershoot to –2.0V for a period less than 20ns. Maximum DC voltage on Output is V
3. Depends on range.
Ambient Operating Temperature Temperature Under Bias –50 to 125 °C Storage Temperature –65 to 150 °C
Input or Output Voltage (except A9) –2 to 7 V Supply Voltage –2 to 7 V A9 Voltage –2 to 13.5 V Program Supply Voltage –2 to 14 V
+0.5V with possible overshoot to VCC+2V for a period less than 20ns.
CC
(3)
–40 to 125 °C
Table 3. OperatingModes
Mode E G P A9
Read Output Disable V Program Verify V Program Inhibit Standby Electronic Signature
Note: X = VIHor VIL,VID= 12V ± 0.5V.
V
IL
IL
V
IL
IL
V
IH
V
IH
V
IL
V
IL
V
IH
V
IH
V
IL
XX XXV
VILPulse
V
IH
X
XVPPData Out XXX XXX
V
IL
V
IH
V
ID
V
PP
V
or V
CC
SS
or V
CC
SS
V
PP
V
PP
V
or V
CC
SS
V
CC
Q0-Q7
Data Out
Hi-Z
Data In
Hi-Z Hi-Z
Codes
Table 4. Electronic Signature
Identifier A0 Q7 Q6 Q5 Q4 Q3 Q2 Q1 Q0 Hex Data
Manufacturer’s Code Device Code
V
IL
V
IH
Two Line Output Control
Because EPROMs are usually used in larger memory arrays, this product features a 2 line con­trol function which accommodates the use of mul­tiple memory connection. The two line control function allows:
a. the lowest possible memory power dissipation, b. complete assurance that output bus contention
will not occur.
00100000 20h 01100001 61h
For the most efficient use of these two control lines, Eshould be decodedandused as the prima­ry device selecting function, while G should be made a common connection to all devices in the array and connected to the READ line from the system control bus. Thisensures that all deselect­ed memory devices are in their lowpower standby mode and that the output pins are only active when data is required from a particular memory device.
3/16
Page 4
M27C2001
Table 5. AC Measurement Conditions
High Speed Standard
Input Rise and Fall Times 10ns 20ns Input Pulse Voltages 0 to 3V 0.4V to 2.4V Input and Output Timing Ref. Voltages 1.5V 0.8V and 2V
Figure 3. AC Testing Input Output Waveform
High Speed
3V
1.5V
0V
Standard
2.4V
0.4V
Table 6. Capacitance
Symbol Parameter Test Condition Min Max Unit
C
IN
C
OUT
Note: 1. Sampled only, not 100% tested.
Input Capacitance Output Capacitance V
(1)
(TA=25°C, f = 1 MHz)
2.0V
0.8V
AI01822
Figure 4. AC Testing Load Circuit
1.3V
1N914
3.3k
DEVICE UNDER
TEST
C
L
CL= 30pFfor High Speed CL= 100pF for Standard CLincludes JIG capacitance
V
=0V
IN
=0V 12 pF
OUT
6pF
OUT
AI01823B
System Considerations
The power switching characteristics of Advanced CMOS EPROMs requirecareful decoupling of the devices. The supply current, ICC, has three seg­ments that are of interest to the system designer: the standby current level, the active current level, and transient current peaks that are produced by the fallingand rising edges of E. The magnitude of the transient current peaks is dependent on the capacitive and inductive loading of the device at the output.
The associated transient voltage peaks can be suppressed by complying with the two line output
4/16
control and by properly selected decoupling ca­pacitors. It is recommended that a 0.1µF ceramic capacitor be used on every device between V
CC
and VSS. This should be a high frequency capaci­tor of low inherent inductance and should be placed as close to the device as possible. In addi­tion, a 4.7µF bulk electrolytic capacitor should be used between VCCand VSSfor every eight devic­es. The bulk capacitor should be located near the power supplyconnection point.Thepurposeof the bulk capacitor is to overcome the voltage drop caused by the inductive effects of PCB traces.
Page 5
M27C2001
Table 7. Read Mode DC Characteristics
(1)
(TA = 0 to 70 °C or –40 to 85 °C; VCC=5V±5% or 5V ± 10%; VPP=VCC)
Symbol Parameter Test Condition Min Max Unit
I
I
I
CC
I
CC1
I
CC2
I V
V
IH
V
Input Leakage Current
LI
Output Leakage Current
LO
Supply Current
I
OUT
0V V
0V V
E=V
Supply Current (Standby)TTL E = V Supply Current (Standby)CMOS Program Current
PP
Input Low Voltage –0.3 0.8 V
IL
(2)
Input High Voltage 2 Output Low Voltage
OL
E>V
I
V
IN
CC
V
OUT
CC
,G=VIL,
IL
= 0mA, f = 5MHz
IH
– 0.2V
CC
V
PP=VCC
= 2.1mA
OL
±10 µA ±10 µA
30 mA
1mA
100 µA
10 µA
V
+1
CC
0.4 V
Output High Voltage TTL IOH= –400µA 2.4 V
V
OH
Output High Voltage CMOS
Note: 1. VCCmust be applied simultaneously with or before VPPand removed simultaneously or after VPP.
2. Maximum DC voltage on Output is V
Table 8A. Read Mode AC Characteristics
CC
+0.5V.
(1)
I
= –100µAV
OH
CC
– 0.7V
(TA = 0 to 70 °C or –40 to 85 °C; VCC=5V±5% or 5V ± 10%; VPP=VCC)
M27V2001
Symbol Alt Parameter Test Condition
(3)
-55
Min Max Min Max Min Max Min Max
-70 -80 -90
V
V
Unit
Address Valid to
(2)
(2)
t
ACC
Output Valid Chip Enable Low to
t
CE
Output Valid Output Enable Low
t
OE
to Output Valid Chip Enable High to
t
DF
Output Hi-Z Output Enable High
t
DF
to Output Hi-Z Address Transitionto
t
OH
Output Transition
t
AVQV
t
ELQV
t
GLQV
t
EHQZ
t
GHQZ
t
AXQX
Note: 1. VCCmust be applied simultaneously with or before VPPand removed simultaneously or after VPP.
2. Sampled only, not 100% tested.
3. In case of 45ns speed see High Speed AC measurament conditions.
E=V
G=V
G=V
E=V
,G=V
IL
E=V
E=V
,G=V
IL
IL
IL
IL
IL
IL
IL
55 70 80 90 ns
55 70 80 90 ns
30 35 40 40 ns
0 30 0 30 0 30 0 30 ns
0 30 0 30 0 30 0 30 ns
0000ns
5/16
Page 6
M27C2001
Table 8B. Read Mode AC Characteristics
(1)
(TA = 0 to 70 °C or –40 to 85 °C; VCC=5V±5% or 5V ± 10%; VPP=VCC)
M27V2001
Symbol Alt Parameter Test Condition
Min Max Min Max Min Max
t
AVQV
t
ELQV
t
GLQV
t
EHQZ
t
GHQZ
t
AXQX
Note: 1. VCCmust be applied simultaneously with or before VPPand removed simultaneously or after VPP.
t
(2)
(2)
2. Sampled only, not 100% tested.
Address Valid to Output
ACC
Valid Chip Enable Low to
t
CE
Output Valid Output Enable Low to
t
OE
Output Valid Chip Enable High to
t
DF
Output Hi-Z Output Enable High to
t
DF
Output Hi-Z Address Transition to
t
OH
Output Transition
E=V
E=V
,G=V
IL
G=V
E=V
G=V
E=V
,G=V
IL
IL
IL
IL
IL
IL
IL
100 120 150 ns
100 120 150 ns
50 50 60 ns
030040050ns
030040050ns
000ns
Figure 5. Read Mode AC Waveforms
Unit-10 -12 -15/-20/-25
A0-A17
E
G
Q0-Q7
VALID
tAVQV
tGLQV
tELQV
Programming
When delivered (and after each erasure for UV EPROM), all bits of the M27C2001 are in the ’1’ state. Data is introduced by selectively program­ming ’0’s into the desired bit locations. Although only ’0’s will be programmed, both ’1’s and ’0’scan be present in the data word. The only way to change a ’0’ to a ’1’ is by die exposition to ultravio-
VALID
tAXQX
tEHQZ
tGHQZ
Hi-Z
AI00719B
let light (UV EPROM). The M27C2001 is in the programming mode when VPPinput is at 12.75V, EisatVILand P is pulsed to VIL. The data to be programmed is applied to 8 bits in parallel to the data output pins. The levels required for the ad­dress and data inputs are TTL. VCCis specified to be 6.25V ±0.25V.
6/16
Page 7
M27C2001
Table 9. Programming Mode AC Characteristics
(1)
(TA=25°C; VCC= 6.25V ± 0.25V; VPP= 12.75V ± 0.25V)
Symbol Parameter Test Condition Min Max Unit
I
LI
I
CC
I
PP
V
IL
V
IH
V
OL
V
OH
V
ID
Note: 1. VCCmust be applied simultaneously with or before VPPand removed simultaneously or after VPP.
Table 10. Programming Mode AC Characteristics
Input Leakage Current
0 V
V
IN
IH
±10 µA Supply Current 50 mA Program Current
E=V
IL
50 mA
Input Low Voltage –0.3 0.8 V
V
Input High Voltage 2
CC
+ 0.5
Output Low Voltage IOL= 2.1mA 0.4 V
I
Output High Voltage TTL
= –400µA
OH
2.4 V
A9 Voltage 11.5 12.5 V
(1)
(TA=25°C; VCC= 6.25V ± 0.25V; VPP= 12.75V ± 0.25V)
Symbol Alt Parameter Test Condition Min Max Unit
t
AVPL
t
QVPL
t
VPHPL
t
VCHPL
t
ELPL
t
PLPH
t
PHQX
t
QXGL
t
GLQV
(2)
t
GHQZ
t
GHAX
Note: 1. VCCmust be applied simultaneously with or before VPPand removed simultaneously or after VPP.
2. Sampled only, not 100% tested.
t t
t
VPS
t
VCS
t
CES
t
t
t
OES
t
t
DFP
t
Address Valid to Program Low 2 µs
AS
Input Valid to Program Low 2 µs
DS
VPPHigh to Program Low VCCHigh to Program Low
2 µs
2 µs Chip Enable Low to Program Low 2 µs Program Pulse Width 95 105 µs
PW
Program High to Input Transition 2 µs
DH
Input Transition to Output EnableLow 2 µs Output Enable Low to Output Valid 100 ns
OE
Output Enable High to Output Hi-Z 0 130 ns Output Enable High to Address
AH
Transition
0ns
V
7/16
Page 8
M27C2001
Figure 6. Programming and Verify Modes AC Waveforms
A0-A17
tAVPL
Q0-Q7
tQVPL
V
PP
tVPHPL
V
CC
tVCHPL
E
tELPL
P
tPLPH
G
Figure 7. Programming Flowchart
VCC= 6.25V,VPP= 12.75V
n=0
P = 100µs Pulse
NO
NO
VERIFY
YES
Last
NO
Addr
YES
CHECK ALL BYTES
1st: VCC=6V
2nd: VCC= 4.2V
++ Addr
YES
++n
=25
FAIL
VALID
DATA IN DATA OUT
tPHQX
tGLQV
tQXGL
PROGRAM VERIFY
PRESTO II Programming Algorithm
PRESTO II Programming Algorithm allows the whole array to be programmed with a guaranteed margin, in a typical time of 26.5 seconds. Pro­gramming with PRESTO II consists of applying a sequence of 100µs program pulses to each byte until a correct verify occurs (see Figure 7). During programming and verify operation, a MARGIN MODE circuit is automatically activated in order to guarantee that each cell is programmed with enough margin. No overprogram pulse is applied since the verify in MARGIN MODE provides the necessary margin to each programmed cell.
Program Inhibit
Programming of multiple M27C2001s in parallel with different data is also easily accomplished. Ex­cept for E, all like inputs including G of the parallel M27C2001 may be common. A TTL low level pulse applied to a M27C2001’s P input, with E low and VPPat 12.75V, will program that M27C2001. A high level E input inhibits the other M27C2001s from being programmed.
Program Verify
A verify (read) should be performed on the pro­grammed bits to determine that they were correct-
AI00715C
ly programmed. The verify is accomplished with E and G at VIL, P at VIH,VPPat 12.75V and VCCat
6.25V.
tGHQZ
tGHAX
AI00720
8/16
Page 9
M27C2001
On-Board Programming
The M27C2001 can be directlyprogrammedinthe application circuit. See the relevant Application Note AN620.
Electronic Signature
The Electronic Signature (ES) mode allows the reading out of a binary code froman EPROM that will identify its manufacturer and type. This mode is intended for use by programming equipment to automatically match the device to be programmed with its corresponding programming algorithm. The ES mode is functional in the 25°C ± 5°C am­bient temperaturerange that is required when pro­gramming the M27C2001. To activate the ES mode, the programming equipment must force
11.5V to 12.5V on address line A9 of the M27C2001 with VPP=VCC=5V. Two identifier bytes maythen be sequenced fromthedeviceout­puts bytogglingaddress lineA0from VILtoVIH. All other address lines must be held at VILduring Electronic Signature mode. Byte 0 (A0=VIL) repre­sents the manufacturer code and byte 1 (A0=VIH) the device identifier code. For the STMicroelec­tronics M27C2001, these two identifier bytes are given in Table 4 and can be read-out on outputs Q0 to Q7.
ERASURE OPERATION (applies to UV EPROM)
The erasure characteristics of the M27C2001 are such that erasure begins when the cells are ex­posed to light with wavelengths shorter than ap­proximately 4000 Å. It should be noted that sunlight and some type of fluorescent lamps have wavelengths in the 3000-4000 Å range. Data shows that constant exposure to room level fluo­rescent lighting could erase atypical M27C2001 in about 3 years, while it would take approximately 1 week to cause erasure when exposed to direct sunlight. If the M27C2001 is to be exposed to these types of lighting conditions for extended pe­riods of time, it is suggested that opaque labels be put over the M27C2001 window to prevent unin­tentional erasure. The recommended erasure pro­cedure for the M27C2001 is exposure to short wave ultraviolet light which has wavelength of 2537 Å. The integrated dose (i.e. UV intensity x exposure time) for erasure should be a minimum of 15 W-sec/cm2. The erasure time with this dos­age is approximately 15 to 20 minutes using an ul­traviolet lamp with 12000 µW/cm2power rating. The M27C2001 should be placed within 2.5 cm (1 inch) of the lamp tubes during the erasure. Some lamps have a filter on their tubes which should be removed before erasure.
9/16
Page 10
M27C2001
Table 11. Ordering Information Scheme
Example: M27C2001 -55 X C 1 X
Device Type
M27
SupplyVoltage
C=5V
Device Function
2001 = 2Mb, 256Kb x8
Speed
(1)
=55ns
-55
-70 = 70 ns
-80 = 80 ns
-90 = 90 ns
-10 = 100 ns
Not for New Design
-12 = 120 ns
-15 = 150 ns
-20 = 200 ns
-25 = 250 ns
Tolerance
V
CC
X=±5% blank = ± 10%
Package
F = FDIP32W B = PDIP32 L = LCCC32W C = PLCC32 N = TSOP32: 8 x 20mm
Temperature Range
1=0to70°C 6=–40to85°C
Options
X = Additional Burn-in TR = Tape& Reel Packing
Note: 1. High Speed, see AC Characteristics section forfurther information.
For a list of available options (Speed, Package, etc...)or for further information on any aspect of this de­vice, please contact the ST Sales Office nearest to you.
10/16
Page 11
M27C2001
Table 12. FDIP32W - 32 pin Ceramic Frit-seal DIP, with window, Package Mechanical Data
Symb
A 5.72 0.225 A1 0.51 1.40 0.020 0.055 A2 3.91 4.57 0.154 0.180 A3 3.89 4.50 0.153 0.177
B 0.41 0.56 0.016 0.022 B1 1.45 0.057
C 0.23 0.30 0.009 0.012
D 41.73 42.04 1.643 1.655
D2 38.10 1.500
E 15.24 0.600 – E1 13.06 13.36 0.514 0.526
e 2.54 0.100 – eA 14.99 0.590 – eB 16.18 18.03 0.637 0.710
L 3.18 0.125
S 1.52 2.49 0.060 0.098
7.11 0.280
α 4° 11° 4° 11°
N32 32
Typ Min Max Typ Min Max
mm inches
Figure 8. FDIP32W - 32 pin Ceramic Frit-seal DIP, with window, Package Outline
A2
B1 B e
A3A1A
L
α
C
eA
D2
eB
D
S
N
1
Drawing is not to scale.
E1 E
FDIPW-a
11/16
Page 12
M27C2001
Table 13. PDIP32 - 32 lead Plastic DIP, 600 mils width, Package Mechanical Data
Symb
Typ Min Max Typ Min Max
A 5.08 0.200 A1 0.38 0.015 – A2 3.56 4.06 0.140 0.160
B 0.38 0.51 0.015 0.020 B1 1.52 0.060
C 0.20 0.30 0.008 0.012 D 41.78 42.04 1.645 1.655
D2 38.10 1.500
E 15.24 0.600 – E1 13.59 13.84 0.535 0.545
e1 2.54 0.100 – eA 15.24 0.600 – eB 15.24 17.78 0.600 0.700
L 3.18 3.43 0.125 0.135 S 1.78 2.03 0.070 0.080 α 0° 10° 0° 10°
N32 32
mm inches
Figure 9. PDIP32 - 32 lead Plastic DIP, 600 mils width, Package Outline
A2A1A
L
B1 B e1
D2
α
eA eB
D
S
N
E1 E
1
Drawing is not to scale.
C
PDIP
12/16
Page 13
M27C2001
Table14.LCCC32W-32 lead Leadless Ceramic Chip Carrier, withwindow, Package Mechanical Data
Symb
Typ Min Max Typ Min Max
A 2.28 0.090 B 0.51 0.71 0.020 0.028 D 11.23 11.63 0.442 0.458 E 13.72 14.22 0.540 0.560
e 1.27 0.050 – e1 0.39 0.015 – e2 7.62 0.300 – e3 10.16 0.400
h 1.02 0.040
j 0.51 0.020
L 1.14 1.40 0.045 0.055 L1 1.96 2.36 0.077 0.093
K 10.50 10.80 0.413 0.425 K1 8.03 8.23 0.316 0.324
N32 32
mm inches
Figure 10. LCCC32W - 32 lead Leadless Ceramic Chip Carrier, with window, Package Outline
e2
o
D
e
N
1
jx45
L1
EK
e3
e1
B
K1
LCCCW-a
Drawing is not to scale.
A
o
Lhx45
13/16
Page 14
M27C2001
Table 15. PLCC32 - 32 lead Plastic Leaded Chip Carrier, rectangular, Package Mechanical Data
Symb
A 2.54 3.56 0.100 0.140 A1 1.52 2.41 0.060 0.095 A2 0.38 0.015
B 0.33 0.53 0.013 0.021 B1 0.66 0.81 0.026 0.032
D 12.32 12.57 0.485 0.495
D1 11.35 11.56 0.447 0.455 D2 9.91 10.92 0.390 0.430
E 14.86 15.11 0.585 0.595 E1 13.89 14.10 0.547 0.555 E2 12.45 13.46 0.490 0.530
e 1.27 0.050
F 0.00 0.25 0.000 0.010
R 0.89 0.035
N32 32
Nd 7 7 Ne 9 9 CP 0.10 0.004
Typ Min Max Typ Min Max
mm inches
Figure 11. PLCC32 - 32 lead Plastic Leaded Chip Carrier, rectangular, Package Outline
D
D1
1N
Ne E1 E
F
D2/E2
A2
B
0.51 (.020)
1.14 (.045)
PLCC
Drawing is not to scale.
Nd
R
CP
A
A1
B1
e
14/16
Page 15
M27C2001
Table 16. TSOP32 - 32 lead Plastic Thin Small Outline,8 x 20mm, Package Mechanical Data
Symb
Typ Min Max Typ Min Max
A 1.20 0.047 A1 0.05 0.15 0.002 0.007 A2 0.95 1.05 0.037 0.041
B 0.15 0.27 0.006 0.011
C 0.10 0.21 0.004 0.008
D 19.80 20.20 0.780 0.795
D1 18.30 18.50 0.720 0.728
E 7.90 8.10 0.311 0.319
e 0.50 - - 0.020 - -
L 0.50 0.70 0.020 0.028
α 0° 5° 0° 5°
N32 32
CP 0.10 0.004
mm inches
Figure 12. TSOP32 - 32 lead Plastic Thin Small Outline, 8 x 20mm, Package Outline
A2
1N
e
E
B
N/2
D1
D
DIE
A
CP
C
TSOP-a
Drawing is not to scale.
LA1 α
15/16
Page 16
M27C2001
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences of use of such information nor forany infringement ofpatents orother rights ofthird parties whichmay result from its use. No licenseis granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are subject to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
The ST logo is registered trademark of STMicroelectronics
1999 STMicroelectronics - All RightsReserved
All other names are the property of their respective owners.
Australia - Brazil - Canada - China - France - Germany - Italy - Japan - Korea - Malaysia - Malta - Mexico - Morocco - The Netherlands -
Singapore - Spain - Sweden - Switzerland - Taiwan - Thailand - United Kingdom -U.S.A.
STMicroelectronics GROUP OF COMPANIES
http://www.st.com
16/16
Loading...