The LTC1273/LTC1275/LTC1276 are 300ksps, sampling
12-bit A/D converters that draw only 75mW from single
5V or ± 5V supplies. These easy-to-use devices come
complete with 600ns sample-and-holds, precision references and internally trimmed clocks. Unipolar and bipolar conversion modes provide flexibility for various applications. They are built with LTBiCMOSTM switched capacitor technology.
These devices have 25ppm/°C (max) internal references.
The LTC1273 converts 0V to 5V unipolar inputs from a
single 5V supply. The LTC1275/LTC1276 convert ±2.5V
and ±5V respectively from ± 5V supplies. Maximum DC
specifications include ±1/2LSB INL, ±3/4LSB DNL and
25ppm/°C full scale drift over temperature. Outstanding
AC performance includes 70dB S/(N + D) and 77dB THD
at the Nyquist input frequency of 150kHz.
The internal clock is trimmed for 2.7µ s maximum conversion time. The clock automatically synchronizes to each
sample command eliminating problems with asynchronous clock noise found in competitive devices. A high
speed parallel interface eases connections to FIFOs, DSPs
and microprocessors.
LTBiCMOSTM is a trademark of Linear Technology Corporation
OUTPUT
U
O
A
PPLICATITYPICAL
Single 5V Supply, 300ksps, 12-Bit Sampling A/D Converter
2.42V
V
REF
+
10µF
PARALLEL BUS
ANALOG INPUT
(0V TO 5V)
0.1µF
8- OR 12-BIT
1
2
3
4
5
6
7
8
9
10
11
12
LTC1273
AIN
V
REF
AGND
D11
D10
D9
D8
D7
D6
D5
D4
DGND
V
NC
BUSY
CS
RD
HBEN
NC
NC
D0/8
D1/9
D2/10
D3/11
24
DD
23
+
22
21
20
19
18
17
16
15
14
13
10µF
µP CONTROL
LINES
LTC1273/75/76 • TA01
Effective Bits and Signal to (Noise + Distortion)
vs Input Frequency
5V
0.1µF
1
Page 2
LTC1273
LTC1275/LTC1276
A
W
O
LUTEXI T
S
A
WUW
ARB
U
G
I
(Notes 1 and 2)
S
Supply Voltage (VDD).............................................. 12V
Negative Supply Voltage (VSS)
LTC1275/LTC1276.................................. – 6V to GND
High Level Input VoltageV
Low Level Input VoltageVDD = 4.95V●0.8V
Digital Input CurrentVIN = 0V to V
Digital Input Capacitance5pF
High Level Output VoltageVDD = 4.95V
CS to RD Setup Time●0ns
RD to BUSY DelayCL = 50pF80190ns
Commercial
Military●270ns
Data Access Time After RD↓CL = 20pF4090ns
Commercial
Military●120ns
CL = 100pF50125ns
Commercial
Military●170ns
RD Pulse Width●t
CS to RD Hold Time●0ns
Data Setup Time After BUSY↑4070ns
Commercial
Military●100ns
●230ns
●110ns
●150ns
3
●90ns
ns
4
Page 5
LTC1273
LTC1275/LTC1276
W
U
TI I G CHARACTERISTICS
SYMBOL PARAMETERCONDITIONSMINTYPMAXUNITS
t
7
t
8
t
9
t
10
t
11
t
12
The
temperature range; all other limits and typicals T
Note 1: Absolute maximum ratings are those values beyond which the life
of a device may be impaired.
Note 2: All voltage values are with respect to ground with DGND and
AGND wired together (unless otherwise noted).
Note 3: When these pin voltages are taken below V
LTC1273) or above V
product can handle input currents greater than 60mA below V
for LTC1273) or above V
Note 4: When these pin voltages are taken below VSS (ground for
LTC1273) they will be clamped by internal diodes. This product can handle
input currents greater than 60mA below V
without latch-up. These pins are not clamped to V
Note 5: VDD = 5V (VSS = –5V for LTC1275/LTC1276), 300kHz at 70°C and
250kHz at 125°C, t
Bus Relinquish Time203075ns
HBEN to RD Setup Time●0ns
HBEN to RD Hold Time●0ns
Delay Between RD Operations●40ns
Delay Between Conversions(Note 10)500ns
Aperture Delay of Sample-and-Hold25ns
● indicates specifications which apply over the full operating
Note 6: Linearity, offset and full scale specifications apply for unipolar and
bipolar modes.
Note 7: Integral nonlinearity is defined as the deviation of a code from a
straight line passing through the actual endpoints of the transfer curve.
The deviation is measured from the center of the quantization band.
Note 8: Bipolar offset (LTC1275/LTC1276) is the different voltage
(ground for
SS
(ground
SS
measured from –0.5LSB when the LTC1275/LTC1276 output code flickers
between 0000 0000 0000 and 1111 1111 1111.
Note 9: Guaranteed by design, not subject to test.
Note 10: Recommended operating conditions.
Note11: A
must not exceed VDD or fall below VSS by more than 50mV for
IN
specified accuracy. Therefore the minimum supply voltage for the
LTC1273 is +4.95V. The minimum supplies for the LTC1275 are +4.75V
.
and –2.45V and the minimum supplies for the LTC1276 are ±4.95V.
●2085ns
●600ns
W
U
TI I G CHARACTERISTICS
Slow Memory Mode, Parallel Read Timing Diagram
CS
RD
BUSY
DATA
HOLD
TRACK
t
1
t
2
t
CONV
t
3
t
12
OLD DATA
DB11 TO DB0
t
6
t
5
t
7
NEW DATA
DB11 TO DB0
t
11
(Note 5)
t
10
LTC1273/75/76 • TA03
ROM Mode, Parallel Read Timing Diagram
CS
RD
t
1
t
2
t
3
DB11 TO DB0
t
12
t
OLD DATA
t
1
BUSY
DATA
HOLD
TRACK
t
t
CONV
5
t
7
4
t
1
t
11
t
2
t
3
t
12
t
5
t
4
t
CONV
NEW DATA
DB11 TO DB0
t
7
LTC1273/75/76 • TA04
5
Page 6
LTC1273
LTC1275/LTC1276
W
U
TI I G CHARACTERISTICS
Slow Memory Mode, Two Byte Read Timing Diagram
HBEN
t
8
CS
t
1
RD
t
BUSY
DATA
HOLD
2
t
3
t
12
t
CONV
OLD DATA
DB7 TO DB0
(Note 5)
t
6
NEW DATA
DB7 TO DB0
t
9
t
5
t
7
t
8
t
1
t
4
t
10
t
11
t
3
NEW DATA
DB11 TO DB8
t
9
t
5
t
10
t
7
t
12
TRACK
HBEN
BUSY
DATA
HOLD
TRACK
RD
LTC1273/75/76 • TA05
ROM Mode, Two Byte Read Timing Diagram
t
8
CS
t
1
t
2
t
t
12
3
t
4
OLD DATA
DB7 TO DB0
t
5
t
t
7
t
CONV
9
t
8
t
1
t
4
t
11
t
3
NEW DATA
DB11 TO DB8
t
9
t
5
t
7
t
8
t
1
t
10
t
2
t
t
12
3
t
4
NEW DATA
DB7 TO DB0
t
9
t
5
t
7
LTC1273/75/76 • TA06
6
Page 7
LPER
RIPPLE FREQUENCY (Hz)
1k
–120
AMPLITUDE OF POWER SUPPLY FEEDTHROUGH (dB)
–40
–20
0
10k100k1M
LTC1273/75/76 • TPC08
–60
–80
–100
f
SAMPLE
= 300kHz
V
DD (VRIPPLE
= 1mV)
DGND
(VRIPPLE
= 0.1V)
V
SS (VRIPPLE
= 10mV)
F
O
R
ATYPICA
UW
CCHARA TERIST
E
C
LTC1273
LTC1275/LTC1276
ICS
Integral Nonlinearity
1.0
0.5
0
INL ERROR (LSB)
–0.5
–1.0
0
512 1024 1536 2048
ENOBs and S/(N + D)
vs Input Frequency
12
11
10
9
8
7
6
5
4
3
EFFECTIVE NUMBER OF BITS
2
1
f
= 300kHz
SAMPLE
0
10k
100k2M
INPUT FREQUENCY (Hz)
2560 3072 3584 4096
CODE
LTC1273/75/76 • TPC01
LTC1273/75/76 • TPC04
1M
74
68
62
56
S/(N + D) (dB)
50
Differential NonlinearitySupply Current vs Temperature
1.0
0.5
0
DNL ERROR (LSB)
–0.5
–1.0
0
512 1024 1536 2048
2560 3072 3584 4096
CODE
LTC1273/75/76 • TPC02
25
20
15
10
SUPPLY CURRENT (mA)
5
0
–50
–25
0
TEMPERATURE (°C)
50
25
Signal-to-Noise Ratio (Without
Harmonics) vs Input FrequencyDistortion vs Input Frequency
80
70
60
50
40
30
20
SIGNAL-TO-NOISE RATIO (dB)
10
f
= 300kHz
SAMPLE
0
1k
10k1M
INPUT FREQUENCY (Hz)
100k
LTC1273/75/76 • TPC05
0
f
= 300kHz
SAMPLE
–10
–20
–30
–40
–50
–60
–70
–80
–90
AMPLITUDE (dB BELOW THE FUNDAMENTAL)
–100
1k100k1M10M
10k
INPUT FREQUENCY (Hz)
THD
2nd HARMONIC
3rd HARMONIC
75
100
LTC1273/75/76 • TPC03
LTC1273/75/76 • TPC06
125
Power Supply Feedthrough
vs Ripple Frequency (LTC1273)
0
f
SAMPLE
–20
–40
–60
–80
–100
–120
1k
AMPLITUDE OF POWER SUPPLY FEEDTHROUGH (dB)
= 300kHz
VDD
= 1mV)
(V
RIPPLE
DGND
= 0.1V)
(V
RIPPLE
10k100k1M
RIPPLE FREQUENCY (Hz)
LTC1273/75/76 • TPC07
Power Supply Feedthrough
vs Ripple Frequency (LTC1275/76)
7
Page 8
LTC1273
LTC1275/LTC1276
LPER
F
O
R
ATYPICA
UW
CCHARA TERIST
E
C
ICS
Intermodulation Distortion Plot
0
f
SAMPLE
f
–20
–40
–60
AMPLITUDE (dB)
–80
–100
–120
2060100
0
4080
FREQUENCY (kHz)
IN1
f
IN2
Spurious Free Dynamic Range
vs Input Frequency
0
f
SAMPLE
–10
–20
–30
–40
–50
–60
–70
–80
–90
SPURIOUS FREE DYNAMIC RANGE (dB)
–100
10k
= 300kHz
= 29.37kHz
= 32.446kHz
120
140
160
LTC1273/75/76 • F05
= 300kHz
100k1M10M
INPUT FREQUENCY (Hz)
Acquisition Time
vs Source Impedance
4500
4000
3500
3000
2500
2000
1500
ACQUISITION TIME (ns)
1000
500
0
10
LTC1273/75/76 • TPC12
1001k10k
R
(Ω)
SOURCE
LTC1273/75/76 • TPC10
Reference Voltage
vs Load Current
2.435
2.430
2.425
2.420
2.415
REFERENCE VOLTAGE (V)
2.410
2.405
–4–2–12
–5
S/(N + D) vs Input Frequency and
Amplitude
80
70
60
50
40
30
20
10
SIGNAL/(NOISE + DISTORTION) (dB)
0
1k
–301
LOAD CURRENT (mA)
VIN = 0dB
VIN = –20dB
VIN = –60dB
10k100k10M
INPUT FREQUENCY (Hz)
LTC1273/75/76 • TPC13
f
SAMPLE
LTC1273/75/76 • TPC11
= 300kHz
1M
UUU
PI FU CTIO S
A
(Pin 1): Analog Input. 0V to 5V (LTC1273), ± 2.5V
IN
(LTC1275) or ±5V (LTC1276).
V
(Pin 2): +2.42V Reference Output. Bypass to AGND
REF
(10µ F tantalum in parallel with 0.1µF ceramic).
AGND (Pin 3): Analog Ground.
D11-D4 (Pins 4 to 11): Three-State Data Outputs.
DGND (Pin 12): Digital Ground.
D3/11-D0/8 (Pins 13 to 16): Three-State Data Outputs.
NC (Pins 17 and 18): No Connection.
8
HBEN (Pin 19): High Byte Enable Input. This pin is used to
multiplex the internal 12-bit conversion result into the
lower bit outputs (D7-D0/8). See Table 1. HBEN also
disables conversion start when HIGH.
RD (Pin 20): READ Input. This active low signal starts a
conversion when CS and HBEN are low. RD also enables
the output drivers when CS is low.
CS (Pin 21): The CHIP SELECT Input must be low for the
ADC to recognize RD and HBEN inputs.
BUSY (Pin 22): The BUSY Output shows the converter
status. It is low when a conversion is in progress.
Page 9
LTC1273
3k10pF
DBN
DGND
A) V
OH
TO HIGH-Z
10pF
DBN
3k
5V
B) V
OL
TO HIGH-Z
DGND
1273/75/76 • TA08
LTC1275/LTC1276
U
PI
VSS (Pin 23): Negative Supply. – 5V for LTC1275/LTC1276.
Bypass to AGND with 0.1µF ceramic.
FUUC
TI
O
U
S
V
(Pin 24): Positive Supply, 5V. Bypass to AGND (10µ F
MNEMONIC*D11D10D9D8D7D6D5D4D3/11D2/10D1/9D0/8
HBEN = LOWDB11DB10DB9DB8DB7DB6DB5DB4DB3DB2DB1DB0
HBEN = HIGHDB11DB10DB9DB8LOWLOWLOWLOWDB11DB10DB9DB8
*D11...D0/8 are the ADC data output pins.
DB11...DB0 are the 12-bit conversion results, DB11 is the MSB.
UUW
FU TIO AL BLOCK DIAGRA
SAMPLE
V
(NC ON LTC1273)V
SS
C
SAMPLE
A
IN
SAMPLE
HOLD
COMPARATOR
–
+
DD
V
REF(OUT)
TEST CIRCUITS
Load Circuits for Access Time
DBN
3kC
DGND
A) HIGH-Z TO V
AND V
OH
TO VOH (t6)
OL
(t3)
L
2.42V
REFERENCE
DBN
12-BIT
CAPACITIVE
DAC
5V
B) HIGH-Z TO V
AND V
TO VOL (t6)
OH
DGNDAGND
3k
C
L
DGND
(t3)
OL
1273/75/76 • TA07
12
INTERNAL
CLOCK
SUCCESSIVE
APPROXIMATION
REGISTER
CONTROL
LOGIC
12
OUTPUT
LATCHES
D11
•
•
•
D0/8
BUSY
CS
RD
HBEN
LTC1273/75/76 • FBD
Load Circuits for Output Float Delay
9
Page 10
LTC1273
LTC1275/LTC1276
PPLICATI
A
U
O
S
IFORATIO
WU
U
CONVERSION DETAILS
The LTC1273/LTC1275/LTC1276 use a successive approximation algorithm and an internal sample-and-hold
circuit to convert an analog signal to a 12-bit parallel or
2-byte output. The ADCs are complete with a precision
reference and an internal clock. The control logic provides
easy interface to microprocessors and DSPs. (Please refer
to the Digital Interface section for the data format.)
Conversion start is controlled by the CS, RD and HBEN
inputs. At the start of conversion the successive approximation register (SAR) is reset and the three-state data
outputs are enabled. Once a conversion cycle has begun
it cannot be restarted.
During conversion, the internal 12-bit capacitive DAC
output is sequenced by the SAR from the most significant
bit (MSB) to the least significant bit (LSB). Referring to
Figure 1, the AIN input connects to the sample-and-hold
capacitor during the acquire phase, and the comparator
offset is nulled by the feedback switch. In this acquire
phase, a minimum delay of 600ns will provide enough
time for the sample-and-hold capacitor to acquire the
analog signal. During the convert phase, the comparator
feedback switch opens, putting the comparator into the
compare mode. The input switch switches C
SAMPLE
to
ground, injecting the analog input charge onto the summing junction. This input charge is successively compared with the binary-weighted charges supplied by the
capacitive DAC. Bit decisions are made by the high speed
comparator. At the end of a conversion, the DAC output
balances the AIN input charge. The SAR contents (a 12-bit
data word) which represent the AIN are loaded into the
12-bit output latches.
DYNAMIC PERFORMANCE
The LTC1273/LTC1275/LTC1276 have an exceptionally
high speed sampling capability. FFT (Fast Fourier Transform) test techniques are used to characterize the ADC’s
frequency response, distortion and noise at the rated
throughput. By applying a low distortion sine wave and
analyzing the digital output using an FFT algorithm, the
ADC’s spectral content can be examined for frequencies
outside the fundamental. Figure 2 shows a typical LTC1275
FFT plot.
Signal-to-Noise Ratio
The Signal-to-Noise plus Distortion Ratio [S/(N + D)] is the
ratio between the RMS amplitude of the fundamental input
frequency to the RMS amplitude of all other frequency
components at the A/D output. The output is band limited
to frequencies from above DC and below half the sampling
frequency. Figure 2 shows a typical spectral content with
a 300kHz sampling rate and a 29kHz input. The dynamic
performance is excellent for input frequencies up to the
Nyquist limit of 150kHz.
A
IN
10
SAMPLE
HOLD
C
SAMPLE
C
DAC
V
DAC
DAC
Figure 1. AIN Input
SAMPLE
SI
–
+
COMPARATOR
LTC1273/75/76 • F01
S
A
R
12-BIT
LATCH
0
–20
–40
–60
AMPLITUDE (dB)
–80
–100
–120
0
Figure 2. LTC1275 Nonaveraged, 1024 Point FFT Plot
4080
2060100
FREQUENCY (kHz)
f
SAMPLE
= 29.37kHz
f
IN
= 300kHz
120
140
LTC1273/75/76 • F02
160
Page 11
LTC1273
INPUT FREQUENCY (Hz)
–80
AMPLITUDE (dB BELOW THE FUNDAMENTAL)
–60
–40
–20
0
1k100k1M10M
LTC1273/75/76 • F04
–100
10k
–90
–70
–50
–30
–10
f
SAMPLE
= 300kHz
THD
2nd HARMONIC
3rd HARMONIC
LTC1275/LTC1276
PPLICATI
A
U
O
S
I FORATIO
WU
U
Effective Number of Bits
The Effective Number of Bits (ENOBs) is a measurement of
the resolution of an ADC and is directly related to the
S/(N + D) by the equation:
N = [S/(N + D) – 1.76]/6.02
where N is the Effective Number of Bits of resolution and
S/(N + D) is expressed in dB. At the maximum sampling
rate of 300kHz the LTC1273/LTC1275/LTC1276 maintain
very good ENOBs up to the Nyquist input frequency of
150kHz. Refer to Figure 3.
1M
74
68
62
56
S/(N + D) (dB)
50
12
11
10
9
8
7
6
5
EFFECTIVE BITS
4
3
2
1
f
= 300kHz
SAMPLE
0
10k
Figure 3. Effective Bits and Signal to (Noise + Distortion)
vs Input Frequency
100k2M
INPUT FREQUENCY (Hz)
LTC1273/75/76 • F03
quency is shown in Figure 4. The LTC1273/LTC1275/
LTC1276 have good distortion performance up to Nyquist
and beyond.
Figure 4. Distortion vs Input Frequency
Intermodulation Distortion
If the ADC input signal consists of more than one spectral
component, the ADC transfer function nonlinearity can
produce intermodulation distortion (IMD) in addition to
THD. IMD is the change in one sinusoidal input caused by
the presence of another sinusoidal input at a different
frequency.
Total Harmonic Distortion
Total Harmonic Distortion (THD) is the ratio of the RMS
sum of all harmonics of the input signal to the fundamental
itself. The out-of-band harmonics alias into the frequency
band between DC and half the sampling frequency. THD is
expressed as:
√V
THD = 20log
where V1 is the RMS amplitude of the fundamental frequency and V2 through VN are the amplitudes of the
second through Nth harmonics. THD versus input fre-
2
2
+ V
3
2
+ V
If two pure sine waves of frequencies fa and fb are applied
to the ADC input, nonlinearities in the ADC transfer function can create distortion products at sum and difference
frequencies of mfa ± nfb, where m and n = 0, 1, 2, 3, etc.
For example, the 2nd order IMD terms include (fa + fb) and
(fa – fb) while the 3rd order IMD terms include (2fa + fb),
(2fa – fb), (fa + 2fb), and (fa – 2fb). If the two input sine
waves are equal in magnitude, the value (in decibels) of the
2
... + V
4
V
1
2
N
2nd order IMD products can be expressed by the following
formula:
IMD (fa ± fb) = 20log
Amplitude at (fa ± fb)
Amplitude at fa
11
Page 12
LTC1273
LTC1275/LTC1276
PPLICATI
A
U
O
S
IFORATIO
WU
U
Figure 5 shows the IMD performance at a 30kHz input.
0
f
= 300kHz
SAMPLE
= 29.37kHz
f
–20
–40
–60
AMPLITUDE (dB)
–80
–100
–120
0
Figure 5. Intermodulation Distortion Plot
4080
2060100
FREQUENCY (kHz)
IN1
= 32.446kHz
f
IN2
120
140
LTC1273/75/76 • F05
160
Peak Harmonic or Spurious Noise
The peak harmonic or spurious noise is the largest spectral component excluding the input signal and DC. This
value is expressed in decibels relative to the RMS value of
a full scale input signal.
Full Power and Full Linear Bandwidth
The full power bandwidth is that input frequency at which
the amplitude of the reconstructed fundamental is reduced by 3dB for a full scale input signal.
The full linear bandwidth is the input frequency at which
the S/(N + D) has dropped to 68dB (11 effective bits). The
LTC1273/LTC1275/LTC1276 have been designed to optimize input bandwidth, allowing ADCs to undersample
input signals with frequencies above the converters’ Nyquist
Frequency. The noise floor stays very low at high frequencies; S/(N + D) becomes dominated by distortion at
frequencies far beyond Nyquist.
Driving the Analog Input
The analog inputs of the LTC1273/LTC1275/LTC1276 are
easy to drive. They draw only one small current spike while
charging the sample-and-hold capacitor at the end of
conversion. During conversion the analog input draws no
current. The only requirement is that the amplifier driving
the analog input must settle after the small current spike
before the next conversion starts. Any op amp that settles
in 600ns to small current transients will allow maximum
speed operation. If slower op amps are used, more settling
time can be provided by increasing the time between
conversions. Suitable devices capable of driving the ADCs’
AIN input include the LT1190/LT1191, LT1007, LT1220,
LT1223 and LT1224 op amps.
The analog input tolerates source resistance very well.
Here again, the only requirement is that the analog input
must settle before the next conversion starts. For larger
source resistance, full DC accuracy can be obtained if
more time is allowed between conversions. For more
information, see the Acquisition Time vs Source Resistance curve in the Typical Performance Characteristics
section. For optimum frequency domain performance
[e.g., S/(N + D)], keep the source resistance below 100Ω.
Internal Reference
The LTC1273/LTC1275/LTC1276 have an on-chip, temperature compensated, curvature corrected, bandgap reference which is factory trimmed to 2.42V. It is internally
connected to the DAC and is available at pin 2 to provide
up to 1mA current to an external load.
For minimum code transition noise the reference output
should be decoupled with a capacitor to filter wideband
noise from the reference (10µ F tantalum in parallel with a
0.1µ F ceramic).
I
n the LTC1275, the V
pin can be driven above its
REF
normal value with a DAC or other means to provide input
span adjustment or to improve the reference temperature
drift. Figure 6 shows an LT1006 op amp driving the
INPUT RANGE
±1.033V
REF(OUT)
LTC1275
+
LT1006
–
Figure 6. Driving the V
V
≥ 2.45V
REF(OUT)
3Ω
10µF
with the LT1006 Op Amp
REF
A
IN
V
REF
AGND
LTC1273/75/76 • F06
12
Page 13
LTC1273
LTC1275/LTC1276
O
PPLICATI
A
reference pin. The V
U
S
I FORATIO
pin must be driven to at least
REF
WU
U
2.45V to prevent conflict with the internal reference. The
reference should be driven to no more than 4.8V to keep
the input span within the ±5V supplies. In the LTC1273/
LT1276, the input spans are 0V to 5V and ±5V respectively with the internal reference. Driving the reference is
not recommended on the LTC1273/LTC1276 since the
input spans will exceed the supplies and codes will be lost
at full scale.
Figure 7 shows a typical reference, the LT1019A-2.5
connected to the LTC1275. This will provide an improved
drift (equal to the maximum 5ppm/°C of the LT1019A-2.5)
and a ±2.582V full scale.
INPUT RANGE
±2.58V
Figure 7. Supplying a 2.5V Reference Voltage
to the LTC1275 with the LT1019A-2.5
5V
V
IN
V
OUT
LT1019A-2.5
GND
3Ω
10µF
LTC1275
A
IN
V
REF
AGND
LTC1273/75/76 • F07
FS
111...111
111...110
111...101
111...100
OUTPUT CODE
000...011
000...010
000...001
000...000
0V
1LSB =
UNIPOLAR
ZERO
1
LSB
5V
=
4096
4096
INPUT VOLTAGE (V)
FS – 1LSB
LTC1273/75/76 • F08
Figure 8. LTC1273 Unipolar Transfer Characteristic
Figure 8 shows the ideal input/output characteristics for
the LTC1273. The code transitions occur midway between
successive integer LSB values (i.e., 1/2LSB, 1 1/2LSBs,
2 1/2LSBs, ... FS – 1 1/2LSBs). The output code is natural
binary with 1LSB = FS/4096 = 5V/4096 = 1.22mV. Figure
9 shows the input/output transfer characteristics for the
LTC1275/LTC1276 in 2’s complement format. As stated in
the figure, 1LSB for LTC1275/LTC1276 are 1.22mV and
2.44mV respectively.
Unipolar Offset and Full Scale Adjustment (LTC1273)
In applications where absolute accuracy is important,
offset and full scale errors can be adjusted to zero. Figure
10a shows the extra components required for full scale
error adjustment. If both offset and full scale adjustments
are needed, the circuit in Figure 10b can be used. Offset
–1
0V
1
LSB
INPUT VOLTAGE (V)
FS/2 – 1LSB–FS/2
LSB
LTC1273/75/76 • F09
Figure 9. LTC1275/LTC1276 Bipolar Transfer Characteristic
R1
50Ω
V
1
R2
10k
ADDITIONAL PINS OMITTED FOR CLARITY
±20LSB TRIM RANGE
R3
10k
+
–
A1
FULL SCALE
R4
100Ω
ADJUST
A
IN
LTC1273
LTC1275
LTC1276
AGND
LTC1273/75/76 • F10a
Figure 10a. Full Scale Adjust Circuit
13
Page 14
LTC1273
LTC1275/LTC1276
U
O
PPLICATI
A
R1
ANALOG
0V TO 5V
10k
INPUT
5V
Figure 10b. LTC1273 Offset and Full Scale Adjust Circuit
10k
R2
10k
R9
20Ω
S
IFORATIO
+
–
WU
R4
100k
R5
4.3k
FULL SCALE
ADJUST
R3
100k
R6
400Ω
R7
100k
5V
R8
10k
OFFSET
ADJUST
U
A
IN
LTC1273
LTC1273/75/76 • F10b
should be adjusted before full scale. To adjust offset, apply
0.61mV (i.e., 1/2LSB) at the input and adjust the offset trim
until the LTC1273 output code flickers between 0000 0000
0000 and 0000 0000 0001. To adjust full scale, apply an
analog input of 4.99817V (i.e., FS – 1 1/2LSBs or last code
transition) at the input and adjust the full scale trim until
the LTC1273 output code flickers between 1111 1111
1110 and 1111 1111 1111. It should be noted that if
negative ADC offsets need to be adjusted or if an output
swing to ground is required, the op amp in Figure 10b
requires a negative power supply.
Bipolar Offset and Full Scale Adjustment
(LTC1275/LTC1276)
R1
ANALOG
±2.5V (LTC1275)
±5V (LTC1276)
input
10k
INPUT
Figure 10c. LTC1275/LTC1276 Offset and
Full Scale Adjust Circuit
and R5 is
+
R2
10k
–
R4
100k
R5
4.3k
FULL SCALE
ADJUST
R3
100k
R6
200Ω
adjusted until the output code flickers
R7
100k
5V
–5V
R8
LTC1273/75/76 • F10c
20k
OFFSET
ADJUST
A
IN
LTC1275
LTC1276
between 0111 1111 1110 and 0111 1111 1111.
BOARD LAYOUT AND BYPASSING
The LTC1273/LTC1275/LTC1276 are easy to use. To obtain the best performance from the devices a printed
circuit board is required. Layout for the printed circuit
board should ensure that digital and analog signal lines are
separated as much as possible. In particular, care should
be taken not to run any digital track alongside an analog
signal track. The analog input should be screened by
AGND.
Bipolar offset and full scale errors are adjusted in a similar
fashion to the unipolar case. Figure 10a shows the extra
components required for full scale error adjustment. If both
offset and full scale adjustments are needed, the circuit in
Figure 10c can be used. Again, bipolar offset must be
adjusted before full scale error. Bipolar offset adjustment is
achieved by trimming the offset adjustment of Figure 10c
while the input voltage is 1/2LSB below ground. This is done
by applying an input voltage of –0.61mV or –1.22mV
(–0.5LSB for LTC1275 or LTC1276) to the input in Figure
10c and adjusting R8 until the ADC output code flickers
between 0000 0000 0000 and 1111 1111 1111. For full
scale adjustment, an input voltage of 2.49817V or 4.99636V
(FS – 1 1/2LSBs for LTC1275 or LTC1276) is applied to the
14
High quality tantalum and ceramic bypass capacitors
should be used at the VDD and V
pins as shown in Figure
REF
11. For the LTC1275/LTC1276 a 0.1µF ceramic provides
adequate bypassing for the VSS pin. The capacitors must
be located as close to the pins as possible. The traces
connecting the pins and the bypass capacitors must be
kept short and should be made as wide as possible.
Noise: Input signal leads to AIN and signal return leads
from AGND (Pin 3) should be kept as short as possible to
minimize input noise coupling. In applications where this
is not possible, a shielded cable between source and ADC
is recommended. Also, since any potential difference in
grounds between the signal source and ADC appears as an
Page 15
LTC1273
LTC1275/LTC1276
PPLICATI
A
U
O
S
ANALOG
INPUT
CIRCUITRY
IFORATIO
1
A
IN
+
–
WU
AGNDV
322412
ANALOG GROUND PLANE
Figure 11. Power Supply Grounding Practice
U
LTC1273
REF
0.1µF
error voltage in series with the input signal, attention
should be paid to reducing the ground circuit impedances
as much as possible.
A single point analog ground plane separate from the logic
system ground should be established at Pin 3 (AGND) or
as close as possible to the ADC, as shown in Figure 11. Pin
12 (DGND) and all other analog grounds should be connected to this single analog ground point. No other digital
grounds should be connected to this analog ground point.
Low impedance analog and digital power supply common
returns are essential to low noise operation of the ADC and
the width for these traces should be as wide as possible.
DIGITAL
SYSTEM
VDDDGND
10µF10µF
0.1µF
GROUND CONNECTION
TO DIGITAL CIRCUITRY
LTC1273/75/76 • F11
Internal Clock
These ADCs have an internal clock that eliminates the need
for synchronization between an external clock and the CS
and RD signals found in other ADCs. The internal clock is
factory trimmed to achieve a typical conversion time of
2.45µs, and a maximum conversion time over the full
operating temperature range of 2.7µ s. No external adjustments are required and, with the guaranteed maximum
acquisition time of 600ns, throughput performance of
300ksps is assured.
Timing and Control
In applications where the ADC data outputs and control
signals are connected to a continuously active microprocessor bus, it is possible to get errors in conversion
results. These errors are due to feedthrough from the
microprocessor to the ADC. The problem can be eliminated by forcing the microprocessor into a WAIT state
during conversion or by using three-state buffers to isolate the ADC data bus.
DIGITAL INTERFACE
The ADCs are designed to interface with microprocessors
as a memory mapped device. The CS and RD control
inputs are common to all peripheral memory interfacing.
The HBEN input serves as a data byte select for 8-bit
processors and is normally either connected to the microprocessor address bus or grounded.
Conversion start and data read operations are controlled
by three digital inputs: HBEN, CS and RD. Figure 12 shows
the logic structure associated with these inputs. The three
signals are internally gated so that a logic “0” is required
LTC1273/75/76
19
HBEN
21
CS
20
RD
D11....D0/8 ARE THE ADC DATA OUTPUT PINS
*
DB11....DB0 ARE THE 12-BIT CONVERSION RESULTS
Figure 12. Internal Logic for Control Inputs CS, RD and HBEN
FLIP
FLOP
CLEAR
ACTIVE HIGH
ACTIVE HIGH
BUSY
QD
ENABLE THREE-STATE OUTPUTS
D11....D0/8 = DB11....DB0
ENABLE THREE-STATE OUTPUTS
D11....D8 = DB11....DB8
D7....D4 = LOW
D3/11....D0/8 = DB11....DB8
CONVERSION
START (RISING
EDGE TRIGGER)
LTC1273/75/76 • F12
15
Page 16
LTC1273
LTC1275/LTC1276
PPLICATI
A
U
O
S
IFORATIO
WU
U
on all three inputs to initiate a conversion. Once initiated it
cannot be restarted until the conversion is complete.
Converter status is indicated by the BUSY output, and this
is low while conversion is in progress.
There are two modes of operation as outlined by the timing
diagrams of Figures 13 to 16. Slow Memory Mode is
designed for microprocessors which can be driven into a
WAIT state. A READ operation brings CS and RD low which
initiates a conversion and data is read when conversion is
complete. The second is the ROM Mode which does not
require microprocessor WAIT states. A READ operation
brings CS and RD low which initiates a conversion and
reads the previous conversion result.
Data Format
The output format can be either a complete parallel load for
16-bit microprocessors or a two byte load for 8-bit microprocessors. Data is always right justified (i.e., LSB is the
most right-hand bit in a 16-bit word). For a two byte read,
only data outputs D7...D0/8 are used. Byte selection is
governed by the HBEN input which controls an internal
digital multiplexer. This multiplexes the 12-bits of conversion data onto the lower D7...D0/8 outputs (4MSBs or
8MSBs) where it can be read in two read cycles. The
4MSBs always appear on D11...D8 whenever the threestate output drivers are turned on.
Slow Memory Mode, Parallel Read (HBEN = LOW)
Figure 13 and Table 2 show the timing diagram and data
bus status for Slow Memory Mode, Parallel Read. CS and
RD going low trigger a conversion and the ADC acknowledges by taking BUSY low. Data from the previous conversion appears on the three-state data outputs. BUSY returns high at the end of conversion when the output
latches have been updated and the conversion result is
placed on data outputs D11...D0/8.
Slow Memory Mode, Two Byte Read
For a two byte read, only 8 data outputs D7...D0/8 are used.
Conversion start procedure and data output status for the
first read operation are identical to Slow Memory Mode,
Parallel Read. See Figure 14 timing diagram and Table 3
data bus status. At the end of the conversion, the low data
byte (D7...D0/8) is read from the ADC. A second READ
operation, with the HBEN high, places the high byte on data
outputs D3/11...D0/8 and disables conversion start.
Note
t
1
RDCSRD
t
2
BUSY
t
3
DATA
t
HOLD
TRACK
Table 2. Slow Memory Mode, Parallel Read Data Bus Status
Figure 14. Slow Memory Mode, Two Byte Read Timing Diagram
Table 3. Slow Memory Mode, Two Byte Read Data Bus Status
t
8
t
1
t
4
t
10
t
11
t
3
NEW DATA
DB11-DB8
t
9
t
5
t
10
t
7
t
12
LTC1273/75/76 • F14
Data OutputsD7D6D5D4D3/11D2/10D1/9D0/8
First ReadDB7DB6DB5DB4DB3DB2DB1DB0
Second ReadLowLowLowLowDB11DB10DB9DB8
that the 4MSBs appear on data output D11...D8 during
both READ operations.
ROM Mode, Parallel Read (HBEN = LOW)
The ROM Mode avoids placing a microprocessor into a
WAIT state. A conversion is started with a READ operation, and the 12 bits of data from the previous conversion
are available on data outputs D11...D0/8 (see Figure 15
and Table 4). This data may be disregarded if not required. A second READ operation reads the new data
(DB11...DB0) and starts another conversion. A delay at
least as long as the ADC’s conversion time plus the 600ns
minimum delay between conversions must be allowed
between READ operations.
ROM Mode, Two Byte Read
As previously mentioned for a two byte read, only data
outputs D7...D0/8 are used. Conversion is started in the
normal way with a READ operation and the data output
status is the same as the ROM mode, Parallel Read (see
Figure 16 timing diagram and Table 5 data bus status).
Two more READ operations are required to access the new
conversion result. A delay equal at the ADCs’ conversion
time must be allowed between conversion start and the
third data READ operation. The second READ operation
with HBEN high disables conversion start and places the
high byte (4MSBs) on data outputs D3/11...D0/8. A third
read operation accesses the low data byte (DB7...DB0)
and starts another conversion. The 4MSBs appear on data
outputs D11...D8 during all three read operations.
MICROPROCESSOR INTERFACING
The LTC1273/LTC1275/LTC1276 allow easy interfacing to digital signal processors as well as modern high
speed, 8-bit or 16-bit microprocessors. Here are several examples.
First Read (Old Data)DB11DB10DB9DB8DB7DB6DB5DB4DB3DB2DB1DB0
Second ReadDB11DB10DB9DB8DB7DB6DB5DB4DB3DB2DB1DB0
HBEN
CS
RD
RD
BUSY
DATA
HOLD
TRACK
t
8
t
1
t
4
t
2
t
3
OLD DATA
DB7-DB0
t
12
t
9
t
5
t
CONV
t
7
t
8
t
1
t
4
t
3
NEW DATA
DB11-DB8
t
9
t
5
t
11
t
7
t
8
t
t
10
t
1
t
t
12
3
4
t
2
NEW DATA
DB7-DB0
t
9
t
5
t
7
LTC1272 • TA16
Figure 16. ROM Mode Two Byte Read Timing Diagram
Table 5. ROM Mode, Two Byte Read Data Bus Status
Data OutputsD7D6D5D4D3/11D2/10D1/9D0/8
First Read (Old Data)DB7DB6DB5DB4DB3DB2DB1DB0
Second Read (New Data)LowLowLowLowDB11DB10DB9DB8
Third Read (New Data)DB7DB6DB5DB4DB3DB2DB1DB0
18
Page 19
LTC1273
LTC1275/LTC1276
PPLICATI
A
U
O
S
IFORATIO
WU
U
TMS320C25
Figure 17 shows an interface between the LTC1273 and
the TMS320C25.
The W/R signal of the DSP initiates a conversion and
conversion results are read from the LTC1273 using the
following instruction:
IND, PA
where D is Data Memory Address and PA is the PORT
ADDRESS.
A16
A1
IS
TMS320C25
READY
R/W
D16
D0
ADDITIONAL PINS OMITTED FOR CLARITY
Figure 17. TMS320C25 Interface
ADDRESS BUS
ADDRESS
EN
DECODE
DATA BUS
LTC1273/75/76
CS
BUSY
RD
D11
D0/8
HBEN
LTC1273/75/76 • F17
MC68000 Microprocessor
Figure 18 shows a typical interface for the MC68000. The
LTC1273 is operating in the Slow Memory Mode. Assuming the LTC1273 is located at address C000, then the
following single 16-bit MOVE instruction both starts a
conversion and reads the conversion result:
Move.W $C000,D0
At the beginning of the instruction cycle when the ADC
address is selected, BUSY and CS assert DTACK so that
the MC68000 is forced into a WAIT state. At the end of
conversion, BUSY returns high and the conversion result
is placed in the D0 register of the microprocessor.
A23
A1
AS
MC68000
DTACK
R/W
D11
D0
ADDITIONAL PINS OMITTED FOR CLARITY
ADDRESS BUS
ADDRESS
EN
DECODE
DATA BUS
LTC1273/75/76
CS
BUSY
RD
D11
D0/8
HBEN
LTC1273/75/76 • F18
Figure 18. MC68000 Interface
8085A/Z80 Microprocessor
Figure 19 shows an LTC1273 interface for the Z80/8085A.
The LTC1273 is operating in the Slow Memory Mode and
a two byte read is required. Not shown in the figure is the
8-bit latch required to demultiplex the 8085A common
address/data bus. A0 is used to assert HBEN so that an
even address (HBEN = LOW) to the LTC1273 will start a
conversion and read the low data byte. An odd address
(HBEN = HIGH) will read the high data byte. This is
accomplished with the single 16-bit LOAD instruction
below.
For the 8085ALHLD (B000)
For the Z80LDHL, (B000)
A15
A0
MREQ
Z80
8085A
WAIT
RD
D7
D0
ADDRESS BUS
ADDRESS
EN
DECODE
DATA BUS
A0
HBEN
CS
BUSY
LTC1273/75/76
RD
D7
D0/8
ADDITIONAL PINS OMITTED FOR CLARITY
Figure 19. 8085A and Z80 Interface
LTC1273/75/76 • F19
19
Page 20
LTC1273
SOURCE RESISTANCE (Ω)
10
2
ACQUISITION TIME (µs)
3
4
1001k10k
LTC1273/75/76 • F22
1
0
LTC1275A
IN
R
SOURCE
V
IN
500Ω
LTC1275/LTC1276
PPLICATI
A
U
O
S
IFORATIO
WU
U
This is a two byte read instruction which loads the ADC
data (address B000) into the HL register pair. During the
first read operation, BUSY forces the microprocessor to
WAIT for the LTC1273 conversion. No WAIT states are
inserted during the second read operation when the microprocessor is reading the high data byte.
TMS32010 Microcomputer
Figure 20 shows an LTC1273/TMS32010 interface. The
LTC1273 is operating in the ROM Mode.
The LTC1273 is mapped at a port address. The following
I/O instruction starts a conversion and reads the previous
conversion result into data memory.
IN A,PA(PA = PORT ADDRESS)
When conversion is complete, a second I/O instruction
reads the up-to-date data into memory and starts another
conversion. A delay at least as long as the ADC conversion
time must be allowed between I/O instructions.
PA2
PA0
DEN
TMS32010
PORT ADDRESS BUS
ADDRESS
EN
DECODE
LTC1273/75/76
CS
current so it can be accurately driven by the unbuffered
MUX. The CD4520 counter increments the MUX channel
after each sample is taken. Figure 22 shows the acquisition time of LTC1275 vs the source resistance. For a
500Ω maximum “on” resistance of the CD4051, the
acquisition time of the ADC is not greatly affected. For
larger source resistances, modest increases in acquisition time must be allowed.
5V
NO
BUFFER
REQUIRED
A
IN
LTC1275
5V
Q2
Q1
COUNTER
Q0
BUSY
ENABLE
CD4520
RESET
D11
RD
•
•
•
D0
CS
µP
OR
DSP
LTC1273/75/76 • F21
8 INPUT
CHANNELS
±2.8V
INPUT
VARIES
CD4051
V
DD
V
SS
VEEABC
–5V
Figure 21. MUXing the LTC1275 with CD4051
RD
D11
D0
LINEAR CIRCUITRY OMITTED FOR CLARITY
DATA BUS
D11
D0/8
LTC1273/75/76 • F20
HBEN
Figure 20. TMS32010 Interface
MUXing with CD4051
The high input impedance of the LTC1273/LTC1275/
LTC1276 provides an easy, cheap, fast, and accurate way
to multiplex many channels of data through one converter. Figure 21 shows a low cost CD4051 connected to
the LTC1275. The LTC1275’s input draws no DC input
20
Figure 22. Acqusition Time of LTC1275 vs Source Resistance
Page 21
LTC1273
LTC1275/LTC1276
PPLICATI
A
U
O
S
I FORATIO
WU
U
Demodulating a Signal by Undersampling
with LTC1275
Figure 23 shows a 455kHz amplitude modulated input
undersampled by the LTC1275. With a 227.5kHz sample
rate, the converter provides a 100dB noise floor and 68dB
distortion when digitizing the 455kHz AM input.
Figure 24 shows an FFT of the AM signal digitized at
212.5kHz.
5V
227.5kHz
455kHz
AMPLITUDE
MODULATED
INPUT
A
LTC1275
IN
RDRD
D11
D0
–5V
Figure 23. A 455kHz Amplitude Modulated Input
Undersampled by the LTC1275
SAMPLE RATE
DATA OUTPUT
LTC1273/75/76 • F23
A time domain view of the demodulation is shown in Figure
25. The top trace shows the 455kHz waveform modulated
by a –6dB, 5kHz signal. The bottom trace shows the
demodulated signal produced by the LTC1275 reconstructed through a 12-bit DAC. The resultant frequency is
5kHz with a sample rate of 227.5kHz. There are roughly 45
points per cycle.
455kHz
AM SIGNAL
DEMODULATED
5kHz OUTPUT
50µs/DIV
LTC1273/75/76 • F27
1V/DIV
1V/DIV
0
–10
–20
–30
–40
–50
–60
–70
AMPLITUDE (dB)
–80
–90
–100
–110
0
20406080
FREQUENCY (kHz)
f
SAMPLE
= 454.8kHz
f
IN
= 5.03kHz
f
MOD
= 212.5kHz
100120
LTC1273/75/76 • F24
Figure 24. 455kHz Input Voltage Modulated by a 5kHz Signal
Figure 25. 455kHz AM Signal Demodulated to 10.5 ENOBs
100ps Resolution ∆Time Measurement with LTC1273
Figure 26 shows a circuit that precisely measures the
difference in time between two events. It has a 400ns full
scale and 100ps resolution. The start signal releases the
ramp generator made up of the PNP current source and
the 250pF capacitor. The circuit ramps until the stop
signal shuts off the current source. The final value of the
ramp represents the time between the start and stop
events. The LTC1273 digitizes this final value and outputs
the digital data.
21
Page 22
LTC1273
LTC1275/LTC1276
PPLICATI
A
65Ω
1N457
LM134
45.3Ω
1N457
45.3Ω
START↑
STOP↑
U
O
S
I FORATIO
74HC74
5V
D
CLK
5V
D
CLK
Q
Q
CLR
Q
Q
CLR
WU
7V5V
65Ω
2N5771
74HC03
U
620Ω
400k
2N2369
5V
1k
20k
1N4148
100k
2N2369
250pF
POLYSTYRENE
1N4148
1k
10k
100pF
0.001µF
10µF
A
REF
OUTVDD
CS
LTC1273
VSSGND
RD BUSY
IN
10µF
12-BIT
DATA OUTPUT
DATA LATCH
SIGNAL
1k
5V
10k
10pF
LTC1273/75/76 • F26
Figure 26. ∆Time Measurement with the LTC1273
22
Page 23
PACKAGEDESCRIPTI
O
LTC1275/LTC1276
U
Dimensions in inches (millimeters) unless otherwise noted.
N Package
24-Lead Plastic DIP
1.265
(32.131)
151718
131416
0.260 ± 0.010
(6.604 ± 0.254)
24
123456
21
2223
20
7
89101911 12
LTC1273
0.300 – 0.325
(7.620 – 8.255)
0.009 – 0.015
(0.229 – 0.381)
+0.025
0.325
–0.015
+0.635
8.255
()
–0.381
0.015
(0.381)
MIN
(3.175)
0.125
MIN
0.130 ± 0.005
(3.302 ± 0.127)
0.050 – 0.085
(1.27 – 2.159)
0.100 ± 0.010
(2.540 ± 0.254)
S Package
24-Lead Plastic SOL
NOTE 1
0.045 – 0.065
(1.143 – 1.651)
0.598 – 0.614
(15.190 – 15.600)
2324
22 21 20 19 181716 15
(NOTE 2)
0.018 ± 0.003
(0.457 ± 0.076)
1314
0.065
(1.651)
TYP
0.394 – 0.419
(10.007 – 10.643)
0.005
(0.127)
RAD MIN
0.009 – 0.013
(0.229 – 0.330)
2345678
0.093 – 0.104
0.050
(1.270)
TYP
1
0.014 – 0.019
(0.356 – 0.482)
0.291 – 0.299
(7.391 – 7.595)
(NOTE 2)
0.010 – 0.029
(0.254 – 0.737)
NOTE 1
× 45°
0° – 8° TYP
0.016 – 0.050
(0.406 – 1.270)
NOTE:
1. PIN 1 IDENT, NOTCH ON TOP AND CAVITIES ON THE BOTTOM OF PACKAGES ARE THE MANUFACTURING OPTIONS.
THE PART MAY BE SUPPLIED WITH OR WITHOUT ANY OF THE OPTIONS.
2. THESE DIMENSIONS DO NOT INCLUDE MOLD FLASH OR PROTRUSIONS.
MOLD FLASH OR PROTRUSIONS SHALL NOT EXCEED 0.006 INCH (0.15mm).
Information furnished by Linear Technology Corporation is believed to be accurate and reliable.
However, no responsibility is assumed for its use. Linear Technology Corporation makes no representation that the interconnection of its circuits as described herein will not infringe on existing patent rights.
(2.362 – 2.642)
910
11 12
0.037 – 0.045
(0.940 – 1.143)
0.004 – 0.012
(0.102 – 0.305)
23
Page 24
LTC1273
LTC1275/LTC1276
U.S. Area Sales Offices
NORTHEAST REGION
Linear Technology Corporation
One Oxford Valley
2300 E. Lincoln Hwy.,Suite 306
Langhorne, PA 19047
Phone: (215) 757-8578
FAX: (215) 757-5631
Linear Technology Corporation
266 Lowell St., Suite B-8
Wilmington, MA 01887
Phone: (508) 658-3881
FAX: (508) 658-2701
FRANCE
Linear Technology S.A.R.L.
Immeuble "Le Quartz"
58 Chemin de la Justice
92290 Chatenay Malabry
France
Phone: 33-1-41079555
FAX: 33-1-46314613