2.0 Change VCCmax from 3.3V to 3.6V January 25, 2002 Add product family and 55ns specification
(January, 2002, Version 2.0) AMIC Technology, Inc.
Page 2
LP62S16256E-T Series
256K X 16 BIT LOW VOLTAGE CMOS SRAM
Features
n Operating voltage: 2.7V to 3.6V
n Access times: 55ns / 70ns (max.)
n Current:
Very low power version: Operating: 40mA (max.)
Standby: 10µA (max.)
n Full static operation, no clock or refreshing required
n All inputs and outputs are directly TTL-compatible
n Common I/O using three-state output
n Data retention voltage: 2.0V (min.)
n Available in 44-pin TSOP and 48-ball CSP (6×8mm)
packages
General Description
The LP62S16256E-T is a low operating current 4,194,304bit static random access memory organized as 262,144
words by 16 bits and operates on low power voltage from
2.7V to 3.3V. It is built using AMIC's high performance
CMOS process.
Inputs and three-state outputs are TTL compatible and
allow for direct interfacing with common system bus
structures.
The chip enable input is provided for POWER-DOWN,
device enable. Two byte enable inputs and an output
enable input are included for easy interfacing.
Data retention is guaranteed at a power supply voltage as
low as 2.0V.
Product Family
Product Family
LP62S16256E-T
Operating
Temperature
-25°C ~ +85°C
1. Typical values are measured at VCC = 3.0V, TA = 25°C and not 100% tested.
2. Data retention current VCC = 2.0V.
VCC
Range
Speed
2.7V~3.6V 55ns / 70ns
Data Retention
(ICCDR, Typ.)
0.08µA 0.3µA
Pin Configurations
Power Dissipation
Standby
(ISB1, Typ.)
Operating
(ICC2, Typ.)
5mA
Package
Type
44L TSOP
48B CSP
nn TSOP nn CSP (Chip Size Package) 48-pin Top View
1
A4
2
A3
3
A2
4
VCC
GND
A1
5
A0
6
CE
7
I/O1
8
I/O2
9
I/O3
10
I/O4
11
12
13
I/O5
14
I/O6
15
I/O7
16
I/O8
17
WE
18
A17
19
A16
20
A15
21
A14
22
A13
LP62S16256EV-T
(January, 2002, Version 2.0) 2 AMIC Technology, Inc.
(January, 2002, Version 2.0) 3 AMIC Technology, Inc.
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LP62S16256E-T Series
Pin Description - CSP
Symbol Description Symbol Description
A0 - A17 Address Inputs
CE
I/O1- I/O16Data Input/Output VCC Power Supply
WE
LB
Chip Enable
Write Enable Input GND Ground
Byte Enable Input
(I/O1- I/O8)
HB
OE
NC No Connection
Higher Byte Enable Input
(I/O9- I/O16)
Output Enable
Recommended DC Operating Conditions
(TA = -25°C to + 85°C)
Symbol Parameter Min. Typ. Max. Unit
VCC Supply Voltage 2.7 3 3.6 V
GND Ground 0 0 0 V
VIHInput High Voltage 2.2 - VCC + 0.3 V
VILInput Low Voltage -0.3 - +0.6 V
CLOutput Load - - 30 pF
TTL Output Load - - 1 -
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LP62S16256E-T Series
Absolute Maximum Ratings*
VCC to GND ..............................................-0.5V to +4.0V
IN, IN/OUT Volt to GND................... -0.5V to VCC + 0.5V
Operating Temperature, Topr...................-25°C to +85°C
Storage Temperature, Tstg.....................-55°C to +125°C
Power Dissipation, PT......................................................................0.7W
*Comments
Stresses above those listed under "Absolute Maximum
Ratings" may cause permanent damage to this device.
These are stress ratings only. Functional operation of this
device at these or any other conditions above those
indicated in the operational sections of this specification
is not implied or intended. Exposure to the absolute
maximum rating conditions for extended periods may
affect device reliability.
DC Electrical Characteristics (TA = -25°C to + 85°C, VCC = 2.7V to 3.6V, GND = 0V)
Symbol Parameter
Min. Typ. Max.
ILI
ILO
ICCActive Power Supply Current - - 5 mA
Input Leakage Current - - 1
Output Leakage Current
LP62S16256E-55LLT / 70LLT
-
-
1
Unit Conditions
VIN = GND to VCC
µA
CE = VIH
µA
HB = VIHor OE = VIH or
WE = VIH
VI/O = GND to VCC
CE = VIL, II/O = 0mA
ICC1- 25 40 mA
Dynamic Operating
Current
ICC2
ISB- - 1 mA
Standby Current
ISB1
VOLOutput Low Voltage - - 0.4 V IOL = 2.1 mA
VOHOutput High Voltage 2.2 - - V IOH = -1.0 mA
- 5 15 mA
- 0.3 10
Min. Cycle, Duty = 100%
CE = VI, II/O = 0mA
CE = VIL, VIH = VCC,
VIL = 0V, f = 1MHz,
II/O = 0 mA
VCC ≤ 3.3V
CE = VIH
VCC ≤ 3.3V
µA
CE ≥ VCC - 0.2V,
VIN≥ 0V
(January, 2002, Version 2.0) 5 AMIC Technology, Inc.
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LP62S16256E-T Series
CE OE WE LB HB
Truth Table
I/O1 to I/O8 Mode I/O9 to I/O16 Mode VCC Current
H X X X X Not selected Not selected ISB1, ISB
X X X H H High - Z High - Z ISB1, ISB
L L Read Read ICC1, ICC2, ICC
L L H L H Read High - Z ICC1, ICC2, ICC
H L High - Z Read ICC1, ICC2, ICC
L L Write Write ICC1, ICC2, ICC
L X L L H Write High - Z ICC1, ICC2, ICC
H L High - Z Write ICC1, ICC2, ICC
L H H L X High - Z High - Z ICC1, ICC2, ICC
L H H X L High - Z High - Z ICC1, ICC2, ICC
Note: X = H or L
Capacitance (TA = 25°C, f = 1.0MHz)
Symbol Parameter Min. Max. Unit Conditions
CIN* Input Capacitance 6 pF VIN = 0V
CI/O* Input/Output Capacitance 8 pF VI/O = 0V
* These parameters are sampled and not 100% tested.
(January, 2002, Version 2.0) 6 AMIC Technology, Inc.
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LP62S16256E-T Series
AC Characteristics (TA = -25°C to +85°C, VCC = 2.7V to 3.6V)
Symbol Parameter
Min. Max. Min. Max.
Read Cycle
tRCRead Cycle Time 55 - 70 - ns
tAAAddress Access Time - 55 - 70 ns
tACEChip Enable Access Time - 55 - 70 ns
tBEByte Enable Access Time - 55 - 70 ns
tOEOutput Enable to Output Valid - 30 - 35 ns
tCLZChip Enable to Output in Low Z 10 - 10 - ns
tBLZByte Enable to Output in Low Z 10 - 10 - ns
tOLZOutput Enable to Output in Low Z 5 - 5 - ns
tCHZChip Disable to Output in High Z - 20 - 25 ns
tBHZByte Disable to Output in High Z - 20 - 25 ns
tOHZOutput Disable to Output in High Z - 20 - 25 ns
tOHOutput Hold from Address Change 5 - 5 - ns
Write Cycle
LP62S16256E-55LLT LP62S16256E-70LLT
Unit
tWCWrite Cycle Time 55 - 70 - ns
tCWChip Enable to End of Write 50 - 60 - ns
tBWByte Enable to End of Write 50 - 60 - ns
tASAddress Setup Time 0 - 0 - ns
tAWAddress Valid to End of Write 50 - 60 - ns
tWPWrite Pulse Width 40 - 50 - ns
tWRWrite Recovery Time 0 - 0 - ns
tWHZWrite to Output in High Z - 25 - 25 ns
tDWData to Write Time Overlap 25 - 30 - ns
tDHData Hold from Write Time 0 - 0 - ns
tOWOutput Active from End of Write 5 - 5 - ns
Note: tCHZ, tBHZ and tOHZ and tWHZ are defined as the time at which the outputs achieve the open circuit condition and are not referred to output voltage levels.
(January, 2002, Version 2.0) 7 AMIC Technology, Inc.
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LP62S16256E-T Series
Timing Waveforms
Read Cycle 1
Address
DOUT
(1, 2, 4)
tRC
tAA
tOH
tOH
Read Cycle 2
Address
CE
HB, LB
OE
DOUT
(1, 2, 3)
tRC
tAA
tCLZ
tACE
5
tBE
5
tBLZ
tOE
5
tOLZ
tOHZ
tBHZ
5
tCHZ
5
5
Notes: 1. WE is high for Read Cycle.
2. Device is continuously enabled CE = VIL, HB = VIL and, or LB = VIL.
3. Address valid prior to or coincident with CE and (HB and, or LB ) transition low.
4. OE = VIL.
5. Transition is measured ±500mV from steady state. This parameter is sampled and not 100% tested.
(January, 2002, Version 2.0) 8 AMIC Technology, Inc.
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LP62S16256E-T Series
Timing Waveforms (continued)
Write Cycle 1
(Write Enable Controlled)
tWC
Address
3
tAW
tCW
CE
tBW
HB, LB
tWR
WE
DATA IN
DATA OUT
1
tAS
4
tWHZ
tWP
2
tDW
tDH
tOW
(January, 2002, Version 2.0) 9 AMIC Technology, Inc.
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LP62S16256E-T Series
Timing Waveforms (continued)
Write Cycle 2
(Chip Enable Controlled)
tWC
Address
CE
HB, LB
WE
DATA IN
DATA OUT
tAW
tWP
tCW
2
tBW
tDW
1
tAS
4
tWHZ
tWR
3
tDH
tOW
(January, 2002, Version 2.0) 10 AMIC Technology, Inc.
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LP62S16256E-T Series
Timing Waveforms (continued)
Write Cycle 3
(Byte Enable Controlled)
tWC
Address
tAW
tCW
CE
3
tWR
HB, LB
WE
tWP
tBW
2
1
tAS
tDH
tOW
DATA IN
DATA OUT
tWHZ
tDW
4
Notes: 1. tAS is measured from the address valid to the beginning of Write.
2. A Write occurs during the overlap (tWP, tBW) of a low CE , WE and (HB and , or LB).
3. tWR is measured from the earliest of CE or WE or (HB and , or LB) going high to the end of the Write cycle.
4. OE level is high or low.
5. Transition is measured ±500mV from steady state. This parameter is sampled and not 100% tested.
(January, 2002, Version 2.0) 11 AMIC Technology, Inc.
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LP62S16256E-T Series
AC Test Conditions
Input Pulse Levels 0.4V to 2.4V
Input Rise And Fall Time 5 ns
Input and Output Timing Reference Levels 1.5V
Output Load See Figures 1 and 2
TTL
CL
30pF
* Including scope and jig.* Including scope and jig.