Document Title
128K X 16 BIT LOW VOLTAGE CMOS SRAM
Revision History
Rev. No. History Issue Date Remark
0.0 Initial issue April 26, 2002 Preliminary
PRELIMINARY (April, 2002, Version 0.0) 1 AMIC Technology, Inc.
Page 2
LP62S16128C-I Series
Preliminary 128K X 16 BIT LOW VOLTAGE CMOS SRAM
Features General Description
n Operating voltage: 2.7V to 3.6V
n Access times: 55/70 ns (max.)
n Current:
Very low power version: Operating:
55ns 40mA (max.)
70ns 35mA (max.)
Standby: 10µA (max.)
n Full static operation, no clock or refreshing required
n All inputs and outputs are directly TTL-compatible
n Common I/O using three-state output
n Data retention voltage: 2V (min.)
n Available in 44-pin TSOP and 48-ball CSP (6 x 8 mm)
packages
Product Family
The LP62S16128C-I is a low operating current
2,097,152-bit static random access memory organized as
131,072 words by 16 bits and operates on low power
voltage from 2.7V to 3.6V. It is built using AMIC's high
performance CMOS process.
Inputs and three-state outputs are TTL compatible and
allow for direct interfacing with common system bus
structures.
The chip enable input is provided for POWER-DOWN,
device enable. Two byte enable inputs and an output
enable input are included for easy interfacing.
Data retention is guaranteed at a power supply voltage
as low as 2V.
Power Dissipation
Standby
(ISB1, Typ.)
0.2µA 0.5µA
Operating
(ICC2, Typ.)
Product Family
LP62S16128C
Operating
Temperature
-40°C ~ +85°C
VCC
Range
Speed
2.7V~3.6V 55ns / 70ns
Data Retention
(ICCDR, Typ.)
1. Typical values are measured at VCC = 3.0V, TA = 25°C and not 100% tested.
2. Data retention current VCC = 2.0V.
Pin Configurations
nn TSOP nn CSP (Chip Size Package) 48-pin Top View
PRELIMINARY (April, 2002, Version 0.0) 2 AMIC Technology, Inc.
Page 3
LP62S16128C-I Series
Block Diagram
A0
A15
A16
DECODER
512 X 4096
MEMORY ARRAY
VCC
GND
1
I/O
INPUT
DATA
CIRCUIT
I/O8
CE
LB
HB
OE
WE
CONTROL
CIRCUIT
Pin Descriptions -- TSOP
Pin No. Symbol Description
1 - 5, 18 – 22,
24 – 27, 42 - 44
6
7 - 10, 13 - 16,
29 - 32, 35 - 38
A0 - A16 Address Inputs
CE
Chip Enable Input
I/O1 - I/O16Data Inputs/Outputs
COLUMN I/O
INPUT
DATA
CIRCUIT
I/O
I/O16
9
17
39
40
41
WE
LB
HB
OE
Write Enable Input
Lower Byte Enable Input (I/O1 to I/O8)
Higher Byte Enable Input (I/O9 to I/O16)
Output Enable Input
11, 33 VCC Power
12, 34 GND Ground
23, 28 NC No Connection
PRELIMINARY (April, 2002, Version 0.0) 3 AMIC Technology, Inc.
Page 4
LP62S16128C-I Series
Pin Description - CSP
Symbol Description Symbol Description
A0 - A16 Address Inputs
CE
I/O1- I/O16Data Input/Output VCC Power Supply
WE
LB
Chip Enable
Write Enable Input GND Ground
Byte Enable Input
(I/O1- I/O8)
HB
OE
NC No Connection
Higher Byte Enable Input
(I/O9- I/O16)
Output Enable
Recommended DC Operating Conditions
(TA = -40°C to + 85°C)
Symbol Parameter Min. Typ. Max. Unit
VCC Supply Voltage 2.7 3 3.6 V
GND Ground 0 0 0 V
VIHInput High Voltage 2.2 - VCC + 0.3 V
VILInput Low Voltage -0.3 - +0.6 V
CLOutput Load - - 30 Pf
TTL Output Load - - 1 -
PRELIMINARY (April, 2002, Version 0.0) 4 AMIC Technology, Inc.
Page 5
LP62S16128C-I Series
Absolute Maximum Ratings*
VCC to GND ...............................................-0.5V to +4.6V
IN, IN/OUT Volt to GND.................... -0.5V to VCC + 0.5V
Operating Temperature, Topr....................-40°C to +85°C
Storage Temperature, Tstg......................-55°C to +125°C
Power Dissipation, PT ...............................................0.7W
*Comments
Stresses above those listed under “Absolute Maximum
Ratings” may cause permanent damage to this device.
These are stress ratings only. Functional operation of this
device at these or any other conditions above those
indicated in the operational sections of this specification
is not implied or intended. Exposure to the absolute
maximum rating conditions for extended periods may
affect device reliability.
DC Electrical Characteristics (TA = -40°C to + 85°C, VCC = 2.7V to 3.6V, GND = 0V)
Symbol Parameter
Min. Max. Min. Max.
ILI
ILO
ICC
ICC1
ICC2
Input Leakage Current - 1 - 1
Output Leakage
Current
Active Power Supply
Current
Dynamic Operating
Current
LP62S16128C-55LLI LP62S16128C-70LLI
-
- 5 - 5 mA
-
- 15 - 15 mA
1
40 - 35 mA
-
1
Unit Conditions
VIN = GND to VCC
µA
CE = VIH or
µA
LB = HB = VIH
VI/O = GND to VCC
CE = VIL ,
LB = VIL or HB = VIL , II/O = 0 mA
Min. Cycle, Duty = 100%
CE = VIL,
LB = VIL or HB = VIL , II/O = 0 mA
CE ≤ 0.2V ,
LB ≤ 0.2V or HB ≤ 0.2V,
f = 1MHz , II/O = 0 mA
ISB- 0.5 - 0.5 mA
ISB1
VOLOutput Low Voltage - 0.4 - 0.4 V IOL = 2.1 mA
VOHOutput High Voltage 2.2 - 2.2 - V IOH = -1.0 mA
PRELIMINARY (April, 2002, Version 0.0) 5 AMIC Technology, Inc.
Standby Power
Supply Current
- 10 - 10
CE = VIH or LB = HB = VIH
CE ≥ VCC – 0.2V or
µA
LB = HB ≥ VCC – 0.2V,
VIN≥ VCC – 0.2V or VIN ≤ 0.2V
Page 6
LP62S16128C-I Series
CE OE WE LB HB
Truth Table
I/O1 to I/O8 Mode I/O9 to I/O16 Mode VCC Current
H X X X X Not selected Not selected ISB1, ISB
X X X H H High-Z High-Z ISB1, ISB
L L Read Read ICC1, ICC2, ICC
L L H L H Read High - Z ICC1, ICC2, ICC
H L High - Z Read ICC1, ICC2, ICC
L L Write Write ICC1, ICC2, ICC
L X L L H Write High - Z ICC1, ICC2, ICC
H L High - Z Write ICC1, ICC2, ICC
L H H L X High - Z High - Z ICC1, ICC2, ICC
L H H X L High - Z High - Z ICC1, ICC2, ICC
Note: X = H or L
Capacitance (TA = 25°C, f = 1.0MHz)
Symbol Parameter Min. Max. Unit Conditions
CIN* Input Capacitance 6 pF VIN = 0V
CI/O* Input/Output Capacitance 8 pF VI/O = 0V
* These parameters are sampled and not 100% tested.
PRELIMINARY (April, 2002, Version 0.0) 6 AMIC Technology, Inc.
Page 7
LP62S16128C-I Series
AC Characteristics (TA = -40°C to +85°C, VCC = 2.7V to 3.6V)
Symbol Parameter
Min. Max. Min. Max.
Read Cycle
tRCRead Cycle Time 55 - 70 - ns
tAAAddress Access Time - 55 - 70 ns
tACEChip Enable Access Time - 55 - 70 ns
tBEByte Enable Access Time - 55 - 70 ns
tOEOutput Enable to Output Valid - 25 - 35 ns
tCLZChip Enable to Output in Low Z 10 - 10 - ns
tBLZByte Enable to Output in Low Z 10 - 10 - ns
tOLZOutput Enable to Output in Low Z 5 - 5 - ns
tCHZChip Disable to Output in High Z - 20 - 25 ns
tBHZByte Disable to Output in High Z - 20 - 25 ns
tOHZOutput Disable to Output in High Z - 20 - 25 ns
tOHOutput Hold from Address Change 5 - 5 - ns
Write Cycle
LP62S16128C-55LLI LP62S16128C-70LLI Unit
tWCWrite Cycle Time 55 - 70 - ns
tCWChip Enable to End of Write 50 - 60 - ns
tBWByte Enable to End of Write 50 - 60 - ns
tASAddress Setup Time 0 - 0 - ns
tAWAddress Valid to End of Write 50 - 60 - ns
tWPWrite Pulse Width 40 - 55 - ns
tWRWrite Recovery Time 0 - 0 - ns
tWHZWrite to Output in High Z - 25 - 25 ns
tDWData to Write Time Overlap 25 - 30 - ns
tDHData Hold from Write Time 0 - 0 - ns
tOWOutput Active from End of Write 5 - 5 - ns
Note: tBLZ, tOLZ, tCHZ, tBHZ and tOHZ and tWHZ are defined as the time at which the outputs achieve the open circuit condition and are not referred to output voltage levels.
PRELIMINARY (April, 2002, Version 0.0) 7 AMIC Technology, Inc.
Page 8
LP62S16128C-I Series
Timing Waveforms
Read Cycle 1
Address
DOUT
(1, 2, 4)
tRC
tAA
tOH
tOH
Read Cycle 2
Address
CE
HB, LB
OE
DOUT
(1, 2, 3)
tRC
tAA
tCLZ
tACE
5
tBE
5
tBLZ
tOE
5
tOLZ
tOHZ
tBHZ
5
tCHZ
5
5
Notes: 1. WE is high for Read Cycle.
2. Device is continuously enabled CE = VIL , HB = VIL and, or LB = VIL.
3. Address valid prior to or coincident with CE and (HB and, or LB ) transition low.
4. OE = VIL.
5. Transition is measured ±500mV from steady state. This parameter is sampled and not 100% tested.
PRELIMINARY (April, 2002, Version 0.0) 8 AMIC Technology, Inc.
Page 9
LP62S16128C-I Series
Timing Waveforms (continued)
Write Cycle 1
(Write Enable Controlled)
tWC
Address
3
tAW
tCW
CE
tBW
HB, LB
tWR
WE
DATA IN
DATA OUT
1
tAS
4
tWHZ
tWP
2
tDW
tDH
tOW
PRELIMINARY (April, 2002, Version 0.0) 9 AMIC Technology, Inc.
Page 10
LP62S16128C-I Series
Timing Waveforms (continued)
Write Cycle 2
(Chip Enable Controlled)
tWC
Address
CE
HB, LB
WE
DATA IN
DATA OUT
tAW
tWP
tCW
2
tBW
tDW
1
tAS
4
tWHZ
tWR
3
tDH
tOW
PRELIMINARY (April, 2002, Version 0.0) 10 AMIC Technology, Inc.
Page 11
LP62S16128C-I Series
Timing Waveforms (continued)
Write Cycle 3
(Byte Enable Controlled)
tWC
Address
tAW
tCW
CE
3
tWR
HB, LB
WE
tWP
tBW
2
1
tAS
tDH
tOW
DATA IN
DATA OUT
tWHZ
tDW
4
Notes: 1. tAS is measured from the address valid to the beginning of Write.
2. A Write occurs during the overlap (tWP, tBW) of a low CE, WE and (HB and , or LB ).
3. tWR is measured from the earliest of CE or WE or (HB and , or LB ) going high to the end of the Write cycle.
4. OE level is high or low.
5. Transition is measured ±500mV from steady state. This parameter is sampled and not 100% tested.
PRELIMINARY (April, 2002, Version 0.0) 11 AMIC Technology, Inc.
Page 12
LP62S16128C-I Series
AC Test Conditions
Input Pulse Levels 0.4V to 2.4V
Input Rise And Fall Time 5 ns
Input and Output Timing Reference Levels 1.5V
Output Load See Figures 1 and 2
TTL
CL
30pF
* Including scope and jig.* Including scope and jig.