LMX2306/LMX2316/LMX2326 PLLatinum Low Power Frequency Synthesizer for RF Personal
Communications
PLLatinum
™
Low Power Frequency Synthesizer for RF
Personal Communications
LMX2306550 MHz
LMX23161.2 GHz
LMX23262.8 GHz
General Description
The LMX2306/16/26 are monolithic, integrated frequency
synthesizers with prescalers that are designed to be used to
generate a very stable low noise signal for controlling the local oscillator of an RF transceiver. They are fabricated using
National’s ABiC V silicon BiCMOS 0.5µ process.
The LMX2306 contains a 8/9 dual modulus prescaler while
the LMX2316 and the LMX2326 have a 32/33 dual modulus
prescaler. The LMX2306/16/26 employ a digital phase
locked loop technique. When combined with a high quality
reference oscillator and loop filter, the LMX2306/16/26 provide the feedback tuning voltage for a voltage controlled oscillator to generate a low phase noise local oscillator signal.
Serial data is transferredintothe LMX2306/16/26 via a three
wire interface (Data, Enable, Clock). Supply voltage can
range from 2.3V to 5.5V. The LMX2306/16/26 feature ultra
low current consumption; LMX2306 - 1.7 mA at 3V,
LMX2316 - 2.5 mA at 3V, and LMX2326 - 4.0 mA at 3V.
The LMX2306/16/26 synthesizers are available in a 16-pin
TSSOP surface mount plastic package.
Features
n 2.3V to 5.5V operation
n Ultra low current consumption
n 2.5V V
n Programmable or logical power down mode:
—I
n Dual modulus prescaler:
— LMX23068/9
— LMX2316/2632/33
n Selectable charge pump TRI-STATE
n Selectable FastLock
n MICROWIRE
n Digital Lock Detect
JEDEC standard compatible
CC
= 1 µA typical at 3V
CC
™
mode with timeout counter
™
Interface
®
mode
Applications
n Portable wireless communications (PCS/PCN, cordless)
n Wireless Local Area Networks (WLANs)
n Cable TV tuners (CATV)
n Pagers
n Other wireless communication systems
Functional Block Diagram
DS100127-1
TRI-STATE®is a registered trademark of National Semiconductor Corporation.
™
FastLock
, PLLatinum™and MICROWIRE™are trademarks of National Semiconductor Corporation.
O FastLock Output. For connection of parallel resistor to the loop filter. (See Section 1.3.4
FASTLOCK MODES description.)
216CP
O Charge Pump Output. For connection to a loop filter for driving the input of an external VCO.
o
31GNDCharge Pump Ground.
42GNDAnalog Ground.
53f
IRF Prescaler Complementary Input. A bypass capacitor should be placed as close as possible to
IN
this pin and be connected directly to the ground plane. The complementary input can be left
unbypassed, with some degradation in RF sensitivity.
64f
75V
IRF Prescaler Input. Small signal input from the VCO.
IN
CC1
Analog Power Supply Voltage Input. Input may range from 2.3V to 5.5V. Bypass capacitors should
be placed as close as possible to this pin and be connected directly to the ground plane. V
86OSC
must equal V
IOscillator Input. This input is a CMOS input with a threshold of approximately VCC/2 and an
IN
CC2
.
equivalent 100k input resistance. The oscillator input is driven from a reference oscillator.
97GNDDigital Ground.
108CEIChip Enable. A LOW on CE powers down the device and will TRI-STATE the charge pump output.
Taking CE HIGH will power up the device depending on the status of the power down bit F2. (See
Section 1.3.1 POWERDOWN OPERATION and Section 1.7.1 DEVICE PROGRAMMING AFTER
FIRST APPLYING V
.)
CC
119ClockIHigh Impedance CMOS Clock Input. Data for the various counters is clocked in on the rising edge
into the 21-bit shift register.
1210DataIBinary Serial Data Input. Data entered MSB first. The last two bits are the control bits. High
impedance CMOS input.
1311LEILoad Enable CMOS Input. When LE goes HIGH, data stored in the shift registers is loaded into one
of the 3 appropriate latches (control bit dependent).
1412Fo/LDO Multiplexed Output of the RF Programmable or Reference Dividers and Lock Detect. CMOS output.
(See
Table 4
.)
1513V
CC2
Digital Power Supply Voltage Input. Input may range from 2.3V to 5.5V. Bypass capacitors should
be placed as close as possible to this pin and be connected directly to the ground plane. V
1614V
must equal V
P
Power Supply for Charge Pump. Must be ≥ VCC.
CC2
.
CC1
CC1
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Page 3
LMX2306/LMX2316/LMX2326
Absolute Maximum Ratings (Note 1)
If Military/Aerospace specified devices are required,
Recommended Operating
Conditions
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Power Supply Voltage
V
CC1
V
CC2
V
p
−0.3V to +6.5V
−0.3V to +6.5V
−0.3V to +6.5V
Voltage on Any Pin
with GND = 0V (V
Storage Temperature Range (T
Lead Temperature (T
(solder, 4 sec.)+260˚C
)−0.3V to VCC+ 0.3V
I
)−65˚C to +150˚C
S
)
L
Power Supply Voltage
V
CC1
V
CC2
V
p
Operating Temperature (T
Note 1: Absolute Maximum Ratings indicate limits beyond which damage to
the device may occur. Recommended operating conditions indicate conditions for which the device is intended to be functional, but do not guarantee
specific performance limits. For guaranteed specifications and test conditions, see the Electrical Characteristics. The guaranteed specifications apply
only for the test conditions listed.
Note 2: Thisdevice is a high performance RF integrated circuit with an ESD
<
2 keV and is ESD sensitive. Handling and assembly of this device
rating
should only be done at ESD protected work stations.
)−40+85˚C
A
MinMaxUnits
2.35.5V
V
CC1
V
V
CC1
CC
5.5V
V
Electrical Characteristics
VCC= 3.0V, Vp= 3.0V; −40˚C<T
SymbolParameterConditionsValuesUnits
I
CC
I
CC-PWDN
f
IN
Power Supply CurrentLMX2306VCC= 2.3V to 5.5 V1.7mA
Powerdown CurrentVCC= 3.0V1µA
RF Input Operating
Frequency
f
osc
Maximum Oscillator Frequency540MHz
fφMaximum Phase Detector Frequency10MHz
Pf
LMX2306VCC= 2.3V to 5.5V25550MHz
LMX2316V
LMX2326V
MinTypMax
= 2.3V to 5.5V2.5mA
CC
= 2.3V to 5.5V4.0mA
CC
= 2.3V to 5.5V0.11.2GHz
CC
= 2.3V to 5.5V0.12.1GHz
CC
V
= 2.6V to 5.5V0.12.8GHz
CC
V
= 5.0V−10+0dBm
CC
V
=2.3V to 5.5V−10+0dBm
CC
IN
−5dBm
CC
V
CC
−1.01.0µA
(Note 4)
−250µA
(Note 3)
VDo=Vp/2, ICPo= LOW
250µA
(Note 3)
VDo=Vp/2, ICPo= HIGH
−1.0mA
(Note 3)
V
CPo=Vp
/2, ICPo= HIGH
1.0mA
(Note 3)
≤ Vp− 0.5−1.01.0nA
CPo
<
−40˚C
CPo=Vp
<
T
85˚C
A
/25%
TA= 25˚C
V
V
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Page 4
Electrical Characteristics (Continued)
VCC= 3.0V, Vp= 3.0V; −40˚C<T
SymbolParameterConditionsValuesUnits
vs VDoCP Current vs Voltage0.5 ≤ V
ICP
o
ICP
vs TCP Current vs TemperatureV
o
V
OH
LMX2306/LMX2316/LMX2326
V
OL
t
CS
t
CH
t
CWH
t
CWL
t
ES
t
EW
Note 3: See PROGRAMMABLE MODES for ICPodescription
Note 4: Except f
High-Level Output VoltageIOH= −500 µAVCC− 0.4V
Low-Level Output VoltageIOL= 500 µA0.4V
Data to Clock Set Up TimeSee Data Input Timing50ns
Data to Clock Hold TimeSee Data Input Timing10ns
Clock Pulse Width HighSee Data Input Timing50ns
Clock Pulse Width LowSee Data Input Timing50ns
Clock to Load Enable Set Up TimeSee Data Input Timing50ns
Load Enable Pulse WidthSee Data Input Timing50ns
and OSCIN.
IN
<
85˚C except as specified
A
T
= 25˚C
A
CPo=Vp
−40˚C
MinTypMax
≤ Vp− 0.55%
CPo
/25%
<
<
T
85˚C
A
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Page 5
Charge Pump Current Specification Definitions
LMX2306/LMX2316/LMX2326
DS100127-3
I1 = CP sink current at V
I2 = CP sink current at V
I3 = CP sink current at V
CPo=Vp
CPo=Vp
CPo
= ∆V
–∆V
/2
I4 = CP source current at V
I5 = CP source current at V
I6 = CP source current at V
CPo=Vp
CPo=Vp
= ∆V
CPo
–∆V
/2
∆V = Voltageoffset from positive and negative rails. Dependent on VCO tuning range relative to VCCand ground. Typicalvalues
are between 0.5V and 1.0V
1.ICP
2.ICP
3.ICP
vs V
o
1
*
[
⁄
2
{ |I1| − |I3|}]/[1⁄
o-sink
[|I2| − |I5|]/[
vs T = Charge Pump Output Current magnitude variation vs Temperature =
o
@
[|I2
= Charge Pump Output Current magnitude variation vs Voltage =
CPo
vs ICP
o–source
1
*
⁄
2
{|I2| + |I5|}]*100%
*
2
{|I1| + |I3|}]*100% and [1⁄
= Charge Pump Output Current Sink vs Source Mismatch =
*
2
{|I4| − |I6|}]/[1⁄
*
2
{|I4| + |I6|}]*100%
temp| − |I2@25˚C|]/|I2@25˚C|*100% and [|I5@temp| − |I5@25˚C|]/|I5@25˚C|*100%
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Page 6
RF Sensitivity Test Block Diagram
LMX2306/LMX2316/LMX2326
Note 5: N=10,000 R=50 P=32
Note 6: Sensitivity limit is reached when the error of the divided RF output, FoLD, is greater than or equal to 1 Hz.
DS100127-15
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Page 7
1.0 Functional Description
The simplified block diagram below shows the 21-bit data register, a 14-bit R Counter, an 18-bit N Counter, and a 18-bit Function
Latch (intermediate latches are not shown). The data stream is shifted (on the rising edge of LE) into the DATAinput, MSB first.
The last two bits are the Control Bits. The DATA is transferred into the counters as follows:
] = [0,0], data is transferred from the 21-bit shift register into a latch that sets the 14-bit R Counter.
1,C2
The 4 bits R15–R18 are for test modes, and should be set to 0 for normal use. The LD precision bit, R19, is described in the
LOCK DETECT OUTPUT CHARACTERISTICS section. Serial data format is shown below.
DS100127-5
Note: R15 to R18 are test modes and should be zero for normal operation.
Data is shifted in MSB first.
1.1.1 14-BIT PROGRAMMABLE REFERENCE DIVIDER RATIO (R COUNTER)
DivideRRRRRRRRRRRRRR
Ratio1413121110987654321
3 00000000000011
4 00000000000100
• ••••••••••••••
1638311111111111111
Notes: Divide ratios less than 3 are prohibited.
Divide ratio: 3 to 16383
R1 to R14: These bits select the divide ratio of the programmable reference divider.
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Page 8
1.0 Functional Description (Continued)
1.2 PROGRAMMABLE DIVIDER (N COUNTER)
The N counter consists of the 5-bit swallow counter (A counter) and the 13-bit programmable counter (B counter). If the Control
Bits are [C
a 13-bit latch (which sets the 13-bit programmable (B) Counter), and the GO bit (See Section 1.3.4 FastLock MODES section)
MSB first. For the LMX2306 the maximum N value is 65535 and the minimum N value is 56. For the LMX2316/26, the maximum
N value is 262143 and the minimum N value is 992. Serial data format is shown below.
LMX2306/LMX2316/LMX2326
Note: Data is shifted in MSB first.
1.2.1 5-BIT SWALLOW COUNTER DIVIDE RATIO (A COUNTER)
] = [1,0], data is transferred from the 21-bit shift register into a 5-bit latch (which sets the Swallow (A) Counter),
1,C2
DS100127-6
LMX2316/26
DivideNNNNN
Ratio54321
000000
100001
••••••
31 11111
Note: Divide ratio: 0 to 31
B ≥ A
LMX2306
DivideNNNNN
Ratio54321
0XX000
1XX001
••••••
7XX111
Note: Divide ratio: 0 to 7
B ≥ A
X denotes a Don’t Care condition
1.2.2 13-BIT PROGRAMMABLE COUNTER DIVIDE RATIO (B COUNTER)
DivideNNNNNNNNNNNNN
Ratio1817161514131211109876
3 0000000000011
4 0000000000100
• •••••••••••••
81911111111111111
Divide ratio: 3 to 8191 (Divide ratios less than 3 are prohibited) B≥A
1.2.3 PULSE SWALLOW FUNCTION
fvco = [(P x B) + A] x fosc/R
f
: Output frequency of external voltage controlled oscillator (VCO)
vco
B:Preset divide ratio of binary 13-bit programmable counter (3 to 8191)
A:Preset divide ratio of binary 5-bit swallow counter (0 ≤ A ≤ 31; A ≤ B for LMX2316/26)
or (0 ≤ A ≤ 7, A ≤ B for LMX2306)
f
: Output frequency of the external reference frequency oscillator
osc
R:Preset divide ratio of binary 14-bit programmable reference counter (3 to 16383)
P:Preset modulus of dual modulus prescaler
for the LMX2306; P = 8 for the LMX2316/26; P = 32
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Page 9
1.0 Functional Description (Continued)
1.3 FUNCTION AND INITIALIZATION LATCHES
Both the function and initialization latches write to the same registers. (See Section 1.7.1 DEVICE PROGRAMMING AFTER
FIRST APPLYING V
C1C2F1F2F3–5F6F7F8
01COUNTERPOWER DOWNFoLDPDCPFASTLOCK
F9F10F11–14F15–F17F18
FAST-TIMEOUTTIMEOUTTESTPOWER
LOCKCOUNTERCOUNTERMODESDOWN
CONTROLENABLEVALUEMODE
section for initialization latch description.)
CC
DS100127-7
TABLE 1. Programmable Modes
RESETCONTROLPOLARITYTRI-STATEENABLE
LMX2306/LMX2316/LMX2326
TABLE 2. Mode Select Truth Table
REGISTER
LEVEL
COUNTER
RESET
POWER
DOWN
PHASECP
DETECTOR
TRI-STATE
POLARITY
0RESETPOWEREDNEGATIVENORMAL
DISABLEDUPOPERATION
1RESETPOWEREDPOSITIVETRI-STATE
ENABELEDDOWN
FUNCTION DESCRIPTION
F1. The Counter Reset enable mode bit F1, when activated, allows the reset of both N and R counters. Upon powering up, the
F1 bit needs to be disabled, then the N counter resumes counting in “close” alignment with the R counter. (The maximum error
is one prescalar cycle).
F2. Refer to Section 1.3.1 POWERDOWN OPERATION section.
F3–5. Controls output of FoLD pin. See FoLD truth table. See
Table 4
.
F6. Phase Detector Polarity. Depending upon VCO characteristics, F6 bit should be set accordingly.When VCO characteristics
are positive F6 should be set HIGH; When VCO characteristics are negative F6 should be set LOW
F7. Charge Pump TRI-STATE is set using bit F7. For normal operation this bit is set to zero.
F8. When the FastLock Enable bit is set the part is forced into one of the four FastLock modes. See description in
Table 5
, Fast-
Lock Decoding.
F9. The FastLock Control bit determines the mode of operation when in FastLock (F8 = 1). When not in FastLock mode, FL
can be used as a general purpose output controlled by this bit. For F9 = 1, FLois HIGH and for F9 = 0, FLois LOW. See
5
for truth table.
F10. Timeout Counter Enable bit is set to 1 to enable the timeout counter. See
F11–14. FastLock Timeout Counter is set using bits F11-14.
Table 6
for counter values.
Table 5
for truth table.
Table
F15–17. Function bits F15–F17 are for Test Modes, and should be set to 0 for normal use.
F18. Refer to Section 1.3.1 POWERDOWN OPERATION section.
o
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Page 10
1.0 Functional Description (Continued)
1.3.1 POWERDOWN OPERATION
Bits F[2] and F[18] provide programmable powerdown modes when the CE pin is HIGH. When CE is LOW, the part is always immediately disabled regardless of powerdown bit status. Refer to
Synchronous and asynchronous powerdown modes are both available by MICROWIRE selection. Synchronous powerdown occurs if the F[18] bit (Powerdown Mode) is HIGH when F[2] bit (Powerdown) becomes HIGH. Asynchronous powerdown occurs
if the F[18] bit is LOW when its F[2] bit becomes HIGH.
In the synchronous powerdown mode (F[18] = HIGH), the powerdown function is gated by the charge pump to prevent unwanted
frequency jumps. Once the powerdown program bit F[2] is loaded, the part will go into powerdown mode after the first successive
charge pump event.
LMX2306/LMX2316/LMX2326
In the asynchronous powerdown mode (F[18] = LOW), the device powers down immediately after latching LOW data into bit F[2].
The device returns to an actively powered up condition in either synchronous or asynchronous mode immediately upon LE latch-
ing LOW data into bit F[2].
Activation of a powerdown condition in either synchronous or asynchronous mode including CE pin activated powerdown has the
following effects:
Removes all active DC current paths.
•
Forces the R, N, and timeout counters to their load state
•
conditions.
Will TRI-STATE the charge pump.
•
Resets the digital lock detect circuitry.
•
TABLE 3. Power Down Truth Table
CE(Pin 10)F[2]F[18]Mode
LOWXXAsynchronous Power Down
HIGH0XNormal Operation
HIGH10Asynchronous Power Down
HIGH11Synchronous Power Down
Table 3
.
Debiases the fINinput to a high impedance state.
•
Disables the oscillator input buffer circuitry.
•
The MICROWIRE control register remains active and ca-
•
pable of loading the data.
TABLE 4. The Fo/LD (pin 14) Output Truth Table
F[3]F[4]F[5]Fo/LD Output State
000TRI-STATE
001R Divider Output (fr)
010N Divider Output (fp)
011Serial Data Output
100Digital Lock Detect (See 1.3.2 LOCK DETECT OUTPUT Section)
101n Channel Open Drain Lock Detect (See 1.3.2 LOCK DETECT OUTPUT
Section)
110Active HIGH
111Active LOW
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Page 11
1.0 Functional Description (Continued)
1.3.2 LOCK DETECT OUTPUT CHARACTERISTICS
Output provided to indicate when the VCO frequency is in “lock.” When the loop is locked and the open drain lock detect mode
is selected, the pin’s output is HIGH, with narrow pulses LOW.When digital lock detect is selected, the output will be HIGH when
the absolute phase error is
value of R[19]. Once lock is detected the output stays HIGH unless the absolute phase error exceeds 30 ns for a single reference
cycle. Setting the charge pump to TRI-STATE or power down (bits F2, F18) will reset the digital lock detect to the unlocked state.
The LD precision bit, R[19], will select five consecutive reference cycles, instead of three, for entering the locked state when R[19]
= HIGH.
<
15 ns for three or five consecutive phase frequency detector reference cycles, depending on the
DS100127-13
FIGURE 1. Typical Lock Detect Circuit
LMX2306/LMX2316/LMX2326
1.3.3 LOCK DETECT FILTER CALCULATION
The component values for the open drain lock detect filter can be determined after assessing the qualifications for an in-lock condition. The in-lock condition can be specified as being a particular number (N) of consecutive reference cycles or duration (D)
wherein the phase detector phase error is some factor less than the reference period. In an example where the phase detector
reference period is 10 kHz, one might select the threshold for in-lock as occurring when 5 consecutive phase comparisons have
elapsed where the phase errors are a 1000 times shorter than the reference period (100 ns). Here, N = 5 and F = 1000.
For the lock detect filter shown in
resistor value for R2 would be chosen to be a factor of F
Figure 1
, when used in conjunction with a open drain (active sink only) lock detect output, the
*
R1. Thus, if resistor R1 were pulled low for only 1/1000th of the reference cycle period, its “effective” resistance would be on par with R2. The two resistors for that duty cycle condition on average
appear to be two 1000x R1 resistors connected across the supply voltage with their common node voltage (Vc) at V
errors larger than 1/1000th of the reference cycle period would drag the average voltage of node Vc below V
out-of-lock status. If the time constant of R2
node Vc would fall below V
/2 only after 5 consecutive phase errors whose average pulse width was greater than 100 ns.
CC
*
C1 is now calculated to be N*the reference period (500 µs), then the voltage of
CC
/2. Phase
CC
/2 indicating an
1.3.4 FastLock MODES
FastLock enables the designer to achieve both fast frequency transitions and good phase noise performance by dynamically
changing the PLL loop bandwidth. The FastLock modes allow wide band PLL fast locking with seemless transition to a low phase
noise narrow band PLL. Consistent gain and phase margins are maintained by simultaneously changing charge pump current
magnitude, counter values, and loop filter damping resistor.The four FastLock modes in
Table 5
are similar to the technique used
in National Semiconductor’s LMX 233X series Dual Phase Locked Loops and are selected by F9, F10, and N19 when F8 is HIGH.
Modes 1 and 2 change loop bandwidth by a factor of two while modes 3 and 4 change the loop bandwidth by a factor of 4. Modes
1 and 2 increase charge pump magnitude by a factor of 4 and should use R2’=R2 for consistent gain and phase margin. Modes
3 and 4 increase charge pump magnitude and decrease the counter values by a factor of 4. R2’ =
sistent stability margin in modes 3 and 4. When F8 is LOW, the FastLock modes are disabled, F9 controls only the FL
level (FL
= F9), and N19 determines the charge pump current magnitude (N19=LOW→ICPo= 250 µA, N19=HIGH→ICPo=
Note 7: Whenthe GO bit N[19] is set to one, the part is forced into the high gain mode. When the timeout counter is activated, termination of the counter cycle resets
the GO bit to 0. If the timeout counter is not activated, N[19] must be reprogrammed to zero in order to remove the high gain state. See below for descriptions of each
individual FastLock mode.
There are two techniques of switching in and out of FastLock. Toprogram the device into any of the FastLock modes, the GO bit
N[19] must be set to one to begin FastLock operation. In the first approach, the timeout counter can be used (FastLock 2 and 4)
to stay in FastLock mode for a programmable number of phase detector reference cycles (up to 63) and then reset the GO bit
automatically.In the second approach (FastLock 1 and 3) without the timeout counter, the PLL will remain in FastLock mode until
the user resets the GO bit via the MICROWIRE serial bus. Once the GO bit is set to zero by the timeout counter or by MICROWIRE, the PLL will then return to normal operation. This transition does not effect the charge on the loop filter capacitors and is enacted synchronous with the charge pump output. This creates a nearly seamless transition between FastLock and standard
mode.
FastLock Mode 1 In this mode, the output level of the FL
is programmed in a low state while the ICPois in the 4x state. The
o
device remains in this state until a command is received, resetting the N[19] bit to zero. Programming N[19]
to zero will return the device to normal operation
*
., i.e., ICPo= 1x and FLoreturned to TRI-STATE.
FastLock Mode 2 Identical to mode 1, except the switching of the device out of FastLock is controlled by the Timeout counter.
The device will remain in FastLock until the timeout counter has counted down the appropriate number of
phase detector cycles, at which time the PLL returns to normal operation
FastLock Mode 3 This mode is similar to mode 1 in that the output level of the FL
is low and the ICPois switched to the 4x state.
o
*
.
Additionally, the R and N divide ratios are reduced by one fourth during the transient, resulting in a 16x improved gain. As in mode 1, the device remains in this state until a MICROWIRE command is received, resetting the N[19] bit to zero and returning the device to normal operation
*
.
FastLock Mode 4 Identical to mode 3, except the switching of the device out of FastLock is controlled by the Timeout counter.
The device will remain in FastLock until the timeout counter has counted down the appropriate number of
phase detector cycles, at which time the PLL returns to normal operation
*
Normal Operation FastLock Normal Operation is defined as the device being in low current mode and standard divider values.
*
.
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Page 13
1.0 Functional Description (Continued)
TABLE 6. FastLock Timeout Counter Value Programming
Timeout3711151923273135
#
(
PD Cycles)
(Note 8)
F11010101010
(4)
F12001100110
(8)
F13000011110
(16)
F14000000001
(32)
Note 8: The timeout counter decrements after each phase detector comparison cycle.
1.4 SERIAL DATA INPUT TIMING
•
•
•
•
•
5963
LMX2306/LMX2316/LMX2326
01
11
11
11
Notes: Parenthesis data indicates programmable reference divider data.
Data shifted into register on clock rising edge.
Data is shifted in MSB first.
TEST CONDITIONS: The Serial Data Input Timing is tested using a symmetrical waveform around V
amplitudes of 1.84V@VCC= 2.3V and 4.4V@VCC= 5.5V.
. The test waveform has an edge rate of 0.6V/ns with
CC/2
1.5 PHASE COMPARATOR AND INTERNAL CHARGE PUMP CHARACTERISTICS
Notes: Phase difference detection range: −2π to +2π
The Phase Detector Polarity F[6] = HIGH
The minimum width pump up and pump down current pulses occur at the ICP
pin when the loop is locked.
o
DS100127-9
DS100127-10
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Page 14
1.0 Functional Description (Continued)
1.6 Typical Application Example
LMX2306/LMX2316/LMX2326
DS100127-11
OPERATIONAL NOTES:
*
VCO is assumed AC coupled.
**
R1 increases impedance so that VCO output power is provided to the load rather than the PLL. Typical values are 10Ω to 200Ω depending on the VCO
power level. fINRF impedance ranges from 40Ω to 100Ω.
**
50Ω termination is often used on test boards to allow use of external reference oscillator. For most typical products a CMOS clock is used and no terminating
resistor is required. OSCINmay be AC or DC coupled. AC coupling is recommended because the input circuit provides its own bias. (See
DS100127-12
Figure
below.)
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Page 15
1.7 Application Information
1.7.1 DEVICE PROGRAMMING AFTER FIRST
APPLYING V
Three MICROWIRE programming methods can be used to
change the function latch, R counter latch, and N counter
latch contents with close phase alignment of R and N
counters to minimize lock up time after the cold power up.
1.7.2 INITIALIZATION SEQUENCE METHOD
Loading the function latch with [C1, C2] = [1, 1] immediately
followed by an R counter load, then an N counter load, efficiently programs the MICROWIRE. Loading the function
latch with [C1, C2] = [1, 1] programs the same function latch
as a load with [C1, C2] = [0, 1] and additionally provides an
internal reset pulse described below. This program sequence insures that the counters are at load point when the
N counter data is latched in and the part will begin counting
in close phase alignment.
The following results from latching the MICROWIRE with an
F latch word, [C1, C2] = [1, 1]:
The function latch contents are loaded.
•
An internal pulse resets the R, N, and timeout counters to
•
load state conditions and will TRI-STATE the charge
pump. If the function latch is programmed for the synchronous powerdown case; CE = HIGH, F[2] = HIGH,
F[18] = HIGH, this internal pulse triggers powerdown.
Refer to Section 1.3.1 POWERDOWN OPERATION section for a synchronous powerdown description. Note that
the prescaler bandgap reference and the oscillator input
buffer are unaffected by the internal reset pulse, allowing
close phase alignment when counting resumes.
Latching the first N counter data after the initialization
•
word will activate the same internal reset pulse. Successive N counter data loads without an initialization load will
not trigger the internal reset pulse.
1.7.3 CE METHOD
Programming the function latch, R counter latch and N
counter latch while the part is being held in a powerdown
state by CE allows lowest possible power dissipation. After
the MICROWIRE contents have been programmed and the
part is enabled, the R and N counter contents will resume
counting in close phase alignment. Note that after CE transitions from LOW to HIGH, a duration of 1 µs may be required
for the prescaler bandgap voltage and oscillator input buffer
bias to reach steady state.
CE can be used to power the part up and down by pin control
in order to check for channel activity.The MICROWIRE does
not need to be reprogrammed each time the part is enabled
and disabled as long as it has been programmed at least
once after V
CC
was applied.
CC
1.7.4 COUNTER RESET METHOD
This MICROWIRE programming method consists of a function latch load, [C1, C2] = [0, 1], enabling the counter reset
bit, F[1]. The R and N counter latches are then loaded followed by a final function latch load that disables the counter
reset. This provides the same close phase alignment as the
initialization sequence method with direct control over the internal reset. Note that counter reset holds the counters at
load point and will TRI-STATE the charge pump, but does
not trigger synchronous powerdown. The counter reset
method requires an extra function latch load compared to the
initialization sequence method.
1.7.5 DEVICE PROGRAMMING
When programmingthe LMX2306, LMX2316,and
LMX2326, first determine the frequencies and mode of operation desired. Data register is programmed with a 21-bit
data stream shifted into the R counter, N counter, or the F
latch. The Functional Description section shows the bits for
the R counter, and the corresponding information for the N
counter. The FL
programming information is given in the
o
FUNCTION AND INITIALIZATION LATCHES section. Typical numbers for a GSM application example are given. In the
example, the RF output is locking at 950 MHz (f
200 kHz channel spacing (f
reference input is 10 MHz (f
comparison
osc
). The crystal oscillator
) and the prescaler value (P)
) with a
vco
is 32. An example of both methods of FastLock will be
shown.
The last two bits (control bits C1 and C2) of each bit stream
identify which counter or FL
mode will be programmed. For
o
example, to program the R counter, C1 and C2 will be 0,0.
Immediately proceeding these two bits is the N, R, or F bits
providing the divide ratios and FastLock mode information.
For example, to load the N counter, the last two bits C1 and
C2 must be 10.
Once the control bits have been determined, the frequency
information must be determined. To begin, determine the N
and R counter values as follows:
N=f
vco/fcomparison
and
R=f
osc/fcomparison
For this example R and N are determined as follows:
R = 10 MHz/200 kHz = 50
and
N = 950 MHz/200 kHz = 4750
LMX2306/LMX2316/LMX2326
www.national.com15
Page 16
1.7 Application Information (Continued)
1.7.6 N COUNTER
The calculated value of N, and the value of P are now used to determine the values of A and B where A and B are both integer
values:
*
N=P
where B is the divisor and A is the remainder. Therefore:
B = div (N/P)
A=N−(B
For this example, B and A are calculated as follows:
LMX2306/LMX2316/LMX2326
B = div (4750/32) = 148 = 0000010010100
A = 4750 − (148
To load the N counter with these values, the programming bit stream would be as follows. The first bit, the GO bit, (MSB) N[19]
is used for FastLock operation and will be discussed in the F Latch section. The next 13 bits, (N[18]–N[6]) shifted in, are the B
counter value, 0000010010100
*
. Bits N[5]–N[1] are the A counter and are 01110bin this example. The final two bits (the control
b
bits) are 1,0 identifying the N counter. In programming the N counter, the value of B must be greater than or equal to A, and the
value of B must be greater than or equal to 3.
Note:*In programming the counter, data is shifted in MSB first.
B+A
and
*
P)
and
*
32)=14=01110
DS100127-14
1.7.7 R COUNTER
Programming the R counter is done by shifting in the binary value of R calculated previously (50
= 110010b). The first bit shifted
d
in is R[19] the LD precision bit. The next 4 bits (R[18]–R[15]) shifted in, are used for testing and should always be loaded with
zeros. The R[14]–R[1] bits are used to program the reference divider ratio and should be 00000000110010
for this example. The
b
final two bits, C[1] and C[2] denote the R counter and should be 0, 0. The resulting bit stream looks as follows:
DS100127-16
1.7.8 F LATCH
To program the device for any of the FastLock modes, C[1] = 0 and C[2] = 1 which direct data to the F latch. The Section 1.3
FUNCTION AND INITIALIZATION LATCH section discusses the 4 modes of FastLock operation. The user must first determine
which FastLock mode will be used. When using any of the FastLock modes, the programmer needs to experimentally determine
the length of time to stay in high gain mode. This is done by looking at the transient response and determining the time at which
the device has settled to within the appropriate frequency tolerance. FastLock mode should be terminated just prior to “lock” to
place the switching phase glitch within the transient settling time. The counter reset mode (F[1] bit) holds both the N and R
counters at load point when F[1] = HIGH. Upon setting F[1] = LOW, the N and R counters will resume counting in close phase
alignment. Other functions of the F latch such as FoLD output control, Phase detector polarity,and charge pump TRI-STATE are
defined in the 1.3 FUNCTION AND INITIALIZATION LATCH section also.
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Page 17
1.7 Application Information (Continued)
1.7.9 FastLock MODE 1 PROGRAMMING
The F[1]–F[7] bits will be denoted as (
vice for mode 1 FastLock, the F[8]–F[10] bits are programmed 100, while the N[19] bit is set to 1. The device will stay in the 4X
current mode until another N bit stream is sent with the N[19] bit reset to 0. This gives a bit stream as follows:
1.7.10 FastLock MODE 2 PROGRAMMING
Again, the F[1]–F[7] bits will be denoted as don’t care (
To program the device for mode 2 FastLock, the F[8]–F[10] bits are programmed 101, while the N[19] bit is set to 1. The device
will stay in the 4X current mode for the programmed number of phase detector cycles. Bits F[11]–F[14] program this number of
cycles and are shown in
Table 6
27 phase detector cycles, the N[19] bit returns to zero, bringing the device back to low current mode. The resulting bit stream is
as follows:
*
) and are dependent on the desired modes of the applicable functions. To program the de-
DS100127-17
*
) but are dependent on the desired modes of the applicable functions.
. For our example, we will use 27 phase detector cycles, i.e. bits F[11]–F[14] will be 0110b. After
LMX2306/LMX2316/LMX2326
DS100127-18
FastLock modes 3 and 4 are programmed in the same manner and give the added 4X gain increase as discussed in Section 1.3.4
FastLock modes.
LMX2306/LMX2316/LMX2326 PLLatinum Low Power Frequency Synthesizer for RF Personal
Communications
Order Number LMX2306SLBX, LM2316SLBX or LM2326SLBX
NS Package Number SLB16A
LIFE SUPPORT POLICY
NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT AND GENERAL
COUNSEL OF NATIONAL SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are devices or
systems which, (a) are intended for surgical implant
into the body, or (b) support or sustain life, and
whose failure to perform when properly used in
accordance with instructions for use provided in the
2. A critical component is any component of a life
support device or system whose failure to perform
can be reasonably expected to cause the failure of
the life support device or system, or to affect its
safety or effectiveness.
labeling, can be reasonably expected to result in a
significant injury to the user.
National does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and National reserves the right at any time without notice to change said circuitry and specifications.
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