AC CHARACTERISTICS
1, 2, 3
(TA = 0 to +70°C, VCC = 5.0 V ±10%)
PARAMETER SYMBOL
–80 ns –150 ns
UNIT NOTE
MIN. MAX. MIN. MAX.
READ OR WRITE CYCLE
Random re ad, wri te cyc le tim e t
RC
140 210 ns
Read m odi fy wri te c yc le time t
RMW
205 280 ns
CE pul se wid th t
CE
80 10,000 150 10,000 ns
CE pre cha rge ti me t
P
50 60 ns
Addres s s etu p t ime t
AS
0 0 ns 4
Addres s h old ti me t
AH
20 30 ns 4
Read c omm and se tup ti me t
RCS
00ns
Read c omm and ho ld time t
RCH
00ns
CE acc es s t ime t
CEA
80 150 ns 5
OE acces s time t
OEA
30 70 ns 5
CE to out put in Low -Z t
CLZ
10 10 ns
OE to out put in Low -Z t
OLZ
00ns
OE setup tim e for WR t
OS W
00ns
Output di sab le tim e fr om CE
t
CHZ
025035ns
Output di sab le tim e fr om OE t
OHZ
025035ns
Output di sab le tim e fr om
WR t
WHZ
025035ns
OE setup tim e t
OES
10 10 ns
OE hold time t
OEH
00ns
OE lead time t
OEL
10 10 ns
Write c omma nd pul se wid th t
WCP
60 85 ns
Write c omma nd set up tim e t
WCS
60 85 ns
Write c omma nd hol d t ime
t
WCH
60 85 ns
Data s etu p t ime fro m WR t
DSW
30 50 ns
Data s etu p t ime fro m
CE t
DSC
30 50 ns
Data h old ti me f rom
WR t
DHW
00ns
Data h old ti me f rom CE
t
DHC
00ns
Transiti on time (r ise an d fa ll) t
T
335335ns
Refres h t ime in terv al t
RE F
44ms
REFRESH CYCLE
Auto r efr esh cy cle ti me t
FC
140 190 ns
Refres h d ela y t ime fro m
CE t
RFD
50 60 ns
Refres h p uls e w idt h ( Aut o Re fre sh) t
FAP
30 8,000 80 8,000 ns
Refres h p rec har ge time (A uto
Refres h)
t
FP
40 30 ns
CE del ay tim e f rom Ref res h a cti ve
(Auto Ref resh)
t
FCE
160 225 ns
NOTES:
1. I n order to initialize the circuit, CE and OEL/RFSH should be kept
VIH for 200 µs after power on and followed by at least 8 dummy
cycles.
2. AC characteristics shall be tested with t
T
= 5 ns.
3. AC charac teristic s are measured at the following condition (see fi gure
at right).
4. Address is latched at the negative edge of
CE.
5. M easured with a load equivalent to 2TTL + 100 pF.
6. Data f or the lo wer byte (I/O
1
to I /O8) is latched at the positive edge
of
LWR or the positive edge of CE. Data for the upper byte (I/O9 to
I/O
16
) is latched at the positive edge of UWR or the positive edge
of CE.
2.4 V
0.8 V
2.6 V
0.6 V
2.2 V
0.8 V
OUTPUT
INPUT
5P1632-9
Figure 3. AC Characteristics
LH5P1632 CMOS 512K (32K × 16) Pseudo-Static RAM
4