Datasheet LH5164AVT, LH5164AVN Datasheet (Sharp)

Page 1
LH5164AV
CMOS 6 4K (8 K × 8) S tatic RA M
FEATURES
•• 8,192 × 8 bit orga niza ti on
•• Access time: 200 ns (MAX.)
•• Supply curre nt (MAX.):
Operating : 24 8 mW 55 mW (t
, tWC = 1 µs) Standb y: 5.5 µW Data reten tion:
0.6 µW (VCC = 3 V, tA = 25°C)
•• Wide o pera tin g vol ta ge ran g e:
2.7 V to 5.5 V
•• Fully-static operatio n
•• TTL compatible I/O
•• Three-state outputs
•• Packages:
28-pi n , 450 -mil S OP 28-pi n , 8 × 13 mm
2
TSOP (Type I)
DESCRIPTION
The LH5164AV is a static RAM organized as 8,192 × 8 bits. It is fabricated usi ng silicon-gate CMOS process technology.
PIN CONNECTIONS
1 2 3 4
7 8
A
2
A
5
26 25 24 23 22 21
18
15
A
7
A
6
5 6
A
3
A
4
20 19
A
12
GND
A
8
A
11
A
10
CE
1
9
10
11
28 27
WE
A
1
V
CC
12
17 16
A
0
I/O
1
A
9
13 14
NC
OE
I/O
2
I/O
3
I/O
7
I/O
6
I/O
5
I/O
4
I/O
8
CE
2
5164AV-1
TOP VIEW
28-PIN SOP
Figure 1. Pin Connections for SOP Package
2 3
4 5 6
9
10
7 8
A
11
11
1
28 27 26
25
22
21
24 23
20 19
A
10
28-PIN TSOP (Type I)
12 13 14
17 16
18
15
OE
A
8
A
9
CE
2
WE
A
12
NC
I/O
3
I/O
2
A
1
I/O
8
CE
1
I/O
6
I/O
7
GND
I/O
5
I/O
4
I/O
1
A
0
5164AV-2
V
CC
A
7
A
6
A
5
A
4
A
3
A
2
TOP VIEW
Figure 2. Pin Connect ions for TSOP Package
1
Page 2
I/O
8
A
5
A
4
A
3
11
15
18
5164AV-3
MEMORY
ARRAY
(256 x 256)
13
17
12
16
A
6
WE
A
7
A
12
27
A
8
COLUMN I/O
CIRCUITS
COLUMN SELECT
V
CC
GND
OE
I/O
7
I/O
6
I/O
5
I/O
4
I/O
3
I/O
2
I/O
1
22
19
8
A
2A1A0A11
23
9
10
28 14
A
9
CE
1
20
26
CE
2
INPUT
DATA
CONTROL
A
10
21
ROW
SELECT
5 6 7
4
3
2
25
24
NOTE: Pin numbers apply to the 28-pin SOP.
Figure 3. LH5164AV Block Diagram
PIN DESCRIPTION
SIGNA L PIN N AME
A0 - A
12
Addre ss inputs
CE1/CE
2
Chip Ena ble in put
WE Write E na ble inp ut
OE Outpu t E nab le inp ut
SIGNAL PIN NAME
I/O1 - I/O
8
Data i npu ts and ou tpu ts
V
CC
Power sup ply
GND Ground
NC No connec tion
LH5164AV CMOS 64K (8 K × 8) Static RAM
2
Page 3
TRUTH TABLE
CE
1
CE
2
WE OE MODE I/O1 - I/O
8
SUPPLY CURRENT NOTE
HXXX
Standby High-Z Standby (I
SB
)1
XLXX L H L X Write Data input Operating (ICC)1 L H H L Read Data output Operating (I
CC
)
L H H H Output disable High-Z Operating (I
CC
)
NOTE:
1. X = H or L
ABSOLUTE MAXIMUM RATINGS
PARAMETER SYMBOL RATING UNIT NOTE
Suppl y v olt age
V
CC
–0.3 to +7.0 V 1
Input vol tage V
IN
–0.3 to VCC +0.3 V 1, 2 Operating temperature Topr –10 to +70 °C Storag e t emp era ture
Tstg –65 to +150 °C
NOTES:
1. The maximum applicable voltage on any pin with respect to GND.
2.
V
IN
(MIN.) = –3. 0 V for pu lse widt h 50 ns.
RECOMMENDED OPERATING CON DITIONS (TA = –10°C to +70°C)
PARAMETER SYMBOL MIN. TYP. MAX. UN IT NOTE
Suppl y v olt age V
CC
2.7 5.5 V
Input vol tage (V
CC
= 2.7 V to 3.6 V)
V
IH
VCC – 0.5 VCC + 0.3 V
V
IL
–0.3 0.2 V 1
Input vol tage (V
CC
= 4.5 V to 5.5 V)
V
IH
2.2 VCC + 0.3 V
V
IL
–0.3 0.8 V 1
NOTE:
1.
V
IL
(MIN.) = –3. 0 V for p ulse w idt h 50 ns.
CMOS 64K (8K × 8) Static RAM LH5164AV
3
Page 4
DC CHARACTERISTICS 1 (TA = –10°C to +70°C, VCC = 2.7 V to 5.5 V)
PARAMETER SYMBOL CONDITIONS MIN. MAX. UNIT NOTE
Input lea kage curren t
I
LI
VIN = 0 V to V
CC
–1.0 1.0 µA
Output le aka ge curren t
I
LO
CE1 = VIH or CE2 = VIL or
OE = VIH or WE = V
IL
V
I/O
= 0 to V
CC
–1.0 1.0
µA
Operat ing su ppl y curren t
I
CC
CE1 = 0.2 V, VIN = 0.2 V, or
V
CC
– 0.2 V
CE
2
= VCC – 0.2 V,
Outputs open,
V
CC
= 2.7 V to 3.6 V
t
CYCLE
=
200 ns
20
mA
t
CYCLE
=
1.0 µs
8
CE1 = VIL, VIN = VIL or V
IH
CE2 = VIH, Outputs open,
V
CC
= 4.5 V to 5.5 V
t
CYCLE
=
200 ns
45
t
CYCLE
=
1.0 µs
10
Standb y c urr ent
I
SB
CE2 0.2 V or
CE1 VCC – 0.2 V
V
CC
= 2.7 V
to 3.6 V
0.6 µA
1
V
CC
= 4.5 V
to 5.5 V
1.0
I
SB1
CE1 = V
IH or CE2
= V
IL
5mA
Output vo lta ge
V
OL
IOL = 500 µA, VCC = 2.7 V to 3.6 V
0.4
V
I
OL
= 2.1 mA, VCC = 4.5 V to 5.5 V 0.4
V
OH
IOH = –500 µA, VCC = 2.7 V to 3.6 V
V
CC
0.5
V
I
OH
= –1.0 mA, VCC = 4.5 V to 5.5 V 2.4
NOTE:
1.
CE
2
should be VCC – 0.2 V or 0. 2 V when CE1 ≥ V
CC
– 0.2 V.
LH5164AV CMOS 64K (8 K × 8) Static RAM
4
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READ CYCLE (TA = –10°C to +70°C, VCC = 2.7 V to 5.5 V)
PARAMETER SYMBOL MIN. MAX. UNIT
Read c yc le t ime
t
RC
200 ns
Addres s a cc ess ti me
t
AA
200 ns
CE1 acces s t ime
t
ACE 1
200 ns
CE
2
acces s t ime t
ACE 2
200 ns
Output en abl e a cce ss tim e t
OE
150 ns
Output ho ld time t
OH
10 ns
CE1 Low to ou tpu t i n Lo w-Z t
LZ1
20 ns
CE
2
High t o o utp ut in L ow -Z t
LZ2
20 ns
OE Low to ou tpu t in Lo w-Z t
OLZ
10 ns
CE1 High t o o utp ut in H ig h-Z t
HZ1
060ns
CE
2
Low to ou tpu t i n H igh -Z t
HZ2
060ns
OE Hig h t o o utp ut i n H igh -Z t
OHZ
040ns
WRITE CYCLE (TA = –10°C to +70°C, VCC = 2.7 V to 5.5 V)
PARAMETER SYMBOL MIN. MAX. UNIT
Write c ycl e t ime t
WC
200 ns
CE Low to en d o f wr ite t
CW
180 ns
Addres s v al id t o e nd of writ e t
AW
180 ns
Addres s s etu p t ime
t
AS
0ns
Write p uls e w idt h
t
WP
150 ns
Write re co ver y ti me t
WR
0ns
Input dat a s etu p ti me t
DW
100 ns
Input dat a h old tim e t
DH
0ns
WE Hig h t o o utp ut i n L ow- Z t
OW
20 ns
WE Low to ou tpu t in Hi gh- Z t
WZ
060ns
OE Hig h t o o utp ut i n H igh -Z t
OHZ
040ns
TEST CONDI TIONS
PARAMETER MODE NOTE
Input pulse level 0.2 V to VCC – 0.2 V Input rise/fall time 10 ns Input/ out put ti ming le vel 1.5 V Output lo ad C
L
(100 pF) 1
NOTE:
1. In cludes scope and jig capacitance.
CAPAC ITANC E 1 (TA = 25°C, f = 1 MHz)
PARAMETER SYMBOL CONDITI ONS MIN. TYP. MAX. UNIT
Input cap acitan ce C
IN
VIN = 0 V 7 pF
I/O ca pac ita nce C
I/O
V
I/O
= 0 V 10 pF
NOTE:
1. Th is parameter is sampled and not production tested.
CMOS 64K (8K × 8) Static RAM LH5164AV
5
Page 6
DATA RETENTION CHARACTERISTICS (TA = –10°C to +70°C)
PARAMETER SYMBOL CONDITIONS MIN. MAX. UNIT NOTE
Data r ete nti on s up ply vo lta ge
V
CCDR
CE2 0.2 V or
CE1 V
CCDR
– 0.2 V
2.0 5.5 V 1
Data r ete nti on s up ply cu rren t I
CCDR
V
CCDR
= 3 V,
CE
2
≤ 0.2 V or
CE1 V
CCDR
– 0.2 V
T
A
=
25°C
0.2
µA
1
T
A
=
40°C
0.4 µA
0.6 µA
Chip d isa ble to da ta rete nti on t
CDR
0ns
Recov ery tim e t
R
t
RC
ns 2
NOTES:
1.
CE
2
should be V
CCDR
– 0.2 V or 0.2 V when CE1 V
CCDR
– 0.2 V.
2. t
RC
= Read cycle time.
DATA RETENTION MODE
V
CC
0 V
t
CDR
5164AV-7
t
R
V
CCDR
CE
1
CE1 V
CCDR
- 0.2 V
CE2 CONTROL
CE
1
CONTROL (NOTE)
NOTE: To control the data retention mode at CE
1
, fix the input level of CE2 between
V
CCDR
to V
CCDR
- 0.2 V or 0 V and 0.2 V during the data retention mode.
- 0.5 V
2.7 V
V
CC
DATA RETENTION MODE
V
CC
0 V
t
CDR
t
R
V
CCDR
CE2
CE
2
0.2 V
2.7 V
0.2 V
Figure 4. Data Retention Characteristics
LH5164AV CMOS 64K (8 K × 8) Static RAM
6
Page 7
t
LZ1
t
ACE1
A0 - A
12
t
OHZ
D
OUT
DATA VALID
OE
t
RC
5164AV-4
t
OLZ
NOTE: WE = 'HIGH.'
t
ACE2
t
AA
t
LZ2
CE
1
CE
2
t
HZ1
t
OE
t
OH
t
HZ2
Figure 5. Read Cycle
CMOS 64K (8K × 8) Static RAM LH5164AV
7
Page 8
DATA VALID
t
DH
t
DW
WE
D
IN
t
CW
OE
t
WC
5164AV-5
t
WR
t
CW
t
AW
CE
1
CE
2
t
AS
t
OHZ
t
WP
t
WR
D
OUT
t
WR
(NOTE 2)
(NOTE 1)
(NOTE 3)
(NOTE 4)
(NOTE 5)
NOTES:
1. t
CW
is defined as the time from the last occuring transition, either CE1 LOW transition or CE2
HIGH transition, to the time when the writing is finished.
2. t
WR
is defined as the time from writing finish to address change.
3. t
AS
is defined as the time from address change to writing start.
4. The writing occurs during an overlapping period of CE
1
= 'LOW,' CE2 = 'HIGH,' and WE = 'LOW' (tWP).
5. When I/O pins are in the output state, input signals with the opposite logic level must not be applied.
A0 - A
12
Figure 6. Write Cyc l e (OE Controlled)
LH5164AV CMOS 64K (8 K × 8) Static RAM
8
Page 9
DATA VALID
t
DH
t
DW
WE
D
IN
t
CW
t
WC
t
CW
t
AW
CE
1
CE
2
t
AS
t
WP
D
OUT
t
WZ
t
WR
t
OW
t
WR
t
WR
5164AV-6
(NOTE 4)
(NOTE 1)
(NOTE 3)
(NOTE 2)
(NOTE 7)
(NOTE 5)
(NOTE 6)
NOTES:
1. t
CW
is defined as the time from the last occuring transition, either CE1 LOW transition or CE2 HIGH transition,
to the time when the writing is finished.
2. tWR is defined as the time from writing finish to address change.
3. t
AS
is defined as the time from address change to writing start.
4. The writing occurs during an overlapping period of CE1 = 'LOW,' CE2 = 'HIGH,' and WE = 'LOW' (tWP).
5. If CE1 LOW transition or CE2 HIGH transition occurs at the same time or after WE LOW transition, the outputs will remain high-impedance.
6. If CE1 HIGH transition or CE2 LOW transition occurs at the same time or before WE HIGH transition, the outputs will remain high-impedance.
7. When I/O pins are in the output state, input signals with the opposite logic level must not be applied.
A0 - A
12
Figure 7. Write Cycle (OE Low Fixed)
CMOS 64K (8K × 8) Static RAM LH5164AV
9
Page 10
DIMENSIONS IN MM [INCHES]
MAXIMUM LIMIT
MINIMUM LIMIT
28SOP (SOP028-P-0450)
12.40 [0.488]
11.60 [0.457]
8.80 [0.346]
8.40 [0.331]
10.60 [0.417]
18.20 [0.717]
17.80 [0.701]
0.15 [0.006]
1.025 [0.040]
0.20 [0.008]
0.00 [0.000]
1.025 [0.040]
2.40 [0.094]
2.00 [0.079]
0.20 [0.008]
0.10 [0.004]
0.50 [0.020]
0.30 [0.012]
1.27 [0.050] TYP.
28 15
141
1.70 [0.067]
1.70 [0.067]
28SOP
28-pin, 450-mil SOP
PACKAGE DIAGRAMS
LH5164AV CMOS 64K (8 K × 8) Static RAM
10
Page 11
DIMENSIONS IN MM [INCHES]
MAXIMUM LIMIT
MINIMUM LIMIT
28TSOP (TSOP028-P-0813)
28
1
28TSOP
14
15
0.28 [0.011]
0.12 [0.005]
0.55 [0.022] TYP.
12.00 [0.472]
11.60 [0.457]
13.70 [0.539]
13.10 [0.516]
8.20 [0.323]
7.80 [0.307]
0.15 [0.006]
1.10 [0.043]
0.90 [0.035]
1.20 [0.047] MAX.
12.60 [0.496]
12.20 [0.480]
0.20 [0.008]
0.10 [0.004]
0.20 [0.008]
0.00 [0.000]
1.10 [0.043]
0.90 [0.035]
0.425 [0.017]
0.20 [0.008]
0.00 [0.000]
0 - 10°
DETAIL
0.425 [0.017]
28-pin, 8 × 13 mm2 TSOP (Type I)
LH5164AV
Device TypeXPackage
5164AV-8
CMOS 64K (8K x 8) Static RAM
N 28-pin, 450-mil SOP (SOP028-P-0450) T 28-pin, 8 x 13 mm
2
TSOP (Type I) (TSOP028-P-0813)
Example: LH5164AVN (CMOS 64K (8K x 8) Static RAM, 28-pin, 450-mil SOP)
ORDERING INFORMATION
CMOS 64K (8K × 8) Static RAM LH5164AV
11
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