Datasheet LF43881JC40 Datasheet (LOGIC)

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Page 1

DEVICES INCORPORATED

LF43881

8 x 8-bit Digital Filter

LF43881

DEVICES INCORPORATED

FEATURES DESCRIPTION

❑❑

❑ 25 MHz Maximum Sampling Rate

❑❑ ❑❑

❑ 320 MHz Multiply-Accumulate Rate

❑❑ ❑❑

❑ 8 Filter Cells

❑❑ ❑❑

❑ 8-bit Unsigned or Two’s Complement

❑❑

Data

❑❑

❑ 8-bit Unsigned or Two’s Complement

❑❑

Coefficients

❑❑

❑ 26-bit Data Outputs

❑❑ ❑❑

❑ Shift-and-Add Output Stage for

❑❑

Combining Filter Outputs

❑❑

❑ Expandable Data Size, Coefficient

❑❑

Size, and Filter Length

❑❑

❑ User-Selectable 2:1, 3:1, or 4:1

❑❑

Decimation

❑❑

❑ Replaces Harris HSP43881

❑❑ ❑❑

❑ 84-pin PLCC, J-Lead

❑❑

The LF43881 is a video-speed digital filter that contains eight filter cells (taps) cascaded internally and a shiftand-add output stage. An 8 x 8 multiplier, three decimation registers, and a 26-bit accumulator are contained in each filter cell. The output stage of the LF43881 contains a 26-bit accumulator which can add the contents of any filter stage to the output stage accumulator shifted right by 8 bits. 8-bit unsigned or two’s complement format for data and coefficients can be independently selected.

Expanded coefficients and word sizes can be processed by cascading multiple LF43881s to implement larger filter lengths without affecting the sample rate. By reducing the sample

8 x 8-bit Digital Filter

rate, a single LF43881 can process larger filter lengths by using multiple passes. The sampling rate can range from 0 to 40 MHz. Over 1000 taps may be processed without overflows due to the architecture of the device.

The output sample rate can be reduced to one-half, one-third, or onefourth the input sample rate by using the three decimation registers contained in every filter cell. Matrix multiplication, N x N spatial correlations/convolutions, and other 2-D operations for image processing can also be achieved using these registers.

LF43881 BLOCK DIAGRAM

TCCI

7-0

CIN

ADR

2-0

SHADD

SENBL

SENBH RESET

FILTER CELL 0

FILTER

CELL 1

TO ALL CELLS

7-0

DIENB, CIENB,

ERASE, DCM

FILTER CELL 3

OUTPUT

STAGE

MUX

1-0

FILTER CELL 4

TCS

FILTER CELL 5

FILTER CELL 6

FILTER CELL 7

DIN

FILTER

8 8

CELL 2

2626 26 26 26 26 26 26

TCCO COUT

COENB

7-0

CLK

TO ALL REGISTERS

SUM

25-0

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DEVICES INCORPORATED

)

FIGURE 1. FILTER CELL DIAGRAM

LF43881

8 x 8-bit Digital Filter

DCM0.D DCM1.DCIENB.D

TCCI

CIN

DIENB.D

TCS

DIN

DCM DCM

RESET

DIENB CIENB

ADR ADR ADR

ERASE

CIN

7-0

C REG

C.TCCI

7-0

D1 REG

D2 REG

MUX

D.TCCI

7-0

8-0

D3 REG

TRI-STATE BUFFERS

ON FILTER CELL 7 ONLY

MUX

TCCO

COUT

COENB

7-0

DIN

7-0

X REG

8-0

M REG0

DCM1.D

DCM

M REG1

RESET.D DIENB.D

LATCHES

CIENB.D

ADR

ADR ERASE.D

RESET.D

SIGN EXTENSION

25-18

ACC

25-0

17-0

ERASE.D

ACCUMULATOR

CELL 0 CELL 1

ADR ADR ADR

DECODER

CELL 2 CELL 3 CELL 4 CELL 5 CELL 6 CELL 7

CLK TO ALL REGISTERS

RESET.D TO ALL REGISTERS (EXCEPT ACCUMULATOR AND T-REGISTER

CELL n

ACC.D

25-0

T REG

AOUT

25-0

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DEVICES INCORPORATED

LF43881

8 x 8-bit Digital Filter

FILTER CELL DESCRIPTION

8-bit coefficients are loaded into the C register (CIN7-0) and are output as COUT7-0 (the COENB signal enables the COUT7-0 outputs). The path taken by the coefficients varies according to the decimation mode chosen. With no decimation, the coefficients move directly from the C register, bypassing all decimation registers, and are available at the output on the following clock cycle. When decimation is chosen, the coefficient output is delayed by 1, 2, or 3 clock cycles depending on how many decimation registers the coefficients pass through (D1, D2, or D3). The number of decimation registers the coefficients pass through is determined by DCM1-0. Refer to Table 1 for choosing a decimation mode.

CIENB enables the C and D registers for coefficient loading. The registers are loaded on the rising edge of CLK when CIENB is LOW. CIENB is latched and delayed internally which enables the registers for loading one clock cycle after CIENB goes active (loading takes place on the second rising edge of CLK after CIENB goes LOW). Therefore, CIENB must be LOW one clock cycle before the coefficients are placed on the CIN7-0 inputs. The coefficients are held when CIENB is HIGH.

FIGURE 2. OUTPUT STAGE DIAGRAM

SHADD

CLK

RESET.D

ADR

2-0

26 26 26

EXTENSION

17-0

MUX

ZERO

25-8

SENBL

SENBH

TO ALL REGISTERS TO ALL REGISTERS

CELL RESULT

SIGN 25-18

17-0

OUTPUT BUFFER

MUX

OUTPUT

TRI-STATE

BUFFER

2626262626

MUX

DIENB enables the X register for the loading of data. The X register is loaded on the rising edge of CLK when DIENB is LOW. DIENB is latched and delayed internally (loading takes place on the second rising edge of CLK after DIENB goes LOW). Therefore, DIENB must be LOW one clock cycle before the data is placed on the DIN7-0 inputs. The X register is loaded with all zeros when DIENB is HIGH.

The output of the C register (C8-0) and X register (X8-0) provide the inputs of the 8 x 8 multiplier. The multiplier is followed by two pipeline registers,

M REG0 and M REG1. The output of the multiplier is sign extended and is used as one of the inputs to the 26-bit adder. The output of the 26-bit accumulator provides the second input to the adder. Both the accumulator and T register are loaded simultaneously with the output of the adder.

The accumulator is loaded with the output of the adder on every clock cycle unless cleared. Clearing the accumulator can be achieved using two methods. The first method, when both RESET and ERASE are LOW, causes all accumulators and all

registers in the device to be cleared together. RESET and ERASE are latched and delayed internally causing the clearing to occur on the second clock cycle after RESET and ERASE go active.

The second method, when only ERASE is LOW, clears a single accumulator of a selected cell. The cell is selected using the ADR2-0 inputs (decoded to Cell n). ERASE is latched and delayed internally causing the clearing to occur on the second clock cycle after ERASE goes active. Refer to Table 2 for clearing registers and accumulators.

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DEVICES INCORPORATED

LF43881

8 x 8-bit Digital Filter

TABLE 1. DECIMATION MODE SELECTION

DCM1 DCM0 Decimation Function

0 0 Decimation registers not used 0 1 One decimation register used (decimation by one-half) 1 0 Two decimation registers used (decimation by one-third) 1 1 Three decimation registers used (decimation by one-fourth)

TABLE 2. REGISTER AND ACCUMULATOR CLEARING

ERASE RESET Clearing Effect

0 0 All accumulators and all registers are cleared 0 1 Only the accumulator addressed by ADR2-0 is cleared 1 0 All registers are cleared (accumulators are not cleared) 1 1 No clearing occurs, internal state remains the same

OUTPUT STAGE DESCRIPTION

The 26-bit adder contained in the output stage can add the contents of any filter cell accumulator (selected by ADR2-0) with the 18 most significant bits of the output buffer. The result is stored back into the output buffer. The complete operation takes only one clock cycle. The eight least significant bits of the output buffer are lost.

The Zero multiplexer is controlled by the SHADD input signal. This allows selection of either the 18 most significant bits of the output buffer or all zeros for the adder input. When SHADD is LOW, all zeros will be selected. When SHADD is HIGH, the 18 most significant bits of the output buffer are selected enabling the shiftand-add operation. SHADD is latched and delayed internally by one clock cycle.

The output multiplexer is also controlled by the SHADD input signal. This allows selection of either a filter cell accumulator, selected by ADR2-0, or the output buffer to be output to the SUM25-0 bus. Only the 26 least significant bits from either a filter cell accumulator or the output buffer are output on SUM25-0. If SHADD is LOW during two consecutive clock cycles (low during the current and previous clock cycle), the output

multiplexer selects the contents of a filter cell accumulator addressed by ADR2-0. Otherwise, the output multiplexer selects the contents of the output buffer.

If the same address remains on the ADR2-0 inputs for more than one clock cycle, SUM25-0 will not change to reflect any updates to the addressed cell accumulator. Only the result from the first selection of the cell (first clock cycle) will be output. This allows the interface of slow memory devices where the output needs to be active for more than one clock cycle. Normal FIR operation is not affected because ADR2-0 is changed sequentially.

NUMBER SYSTEMS

Data and coefficients can be represented as either unsigned or two's complement numbers. The TCS and TCCI inputs determine which of the two formats is to be used. All values are represented as 9-bit two's complement numbers internally. The value of the ninth bit is determined by the number system selected. The ninth bit is a sign extended bit when the two's complement mode is chosen. When the unsigned mode is chosen, the ninth bit is zero.

SIGNAL DEFINITIONS Power

VCC and GND

+5 V power supply. All pins must be connected.

Clock

CLK — Master Clock

The rising edge of CLK strobes all registers. All timing specifications are referenced to the rising edge of CLK.

Inputs

DIN7-0 — Data Input

8-bit data is latched into the X register of each filter cell simultaneously. The TCS signal selects the appropriate data format type. The DIENB signal enables loading of the data.

CIN7-0 — Coefficient Input

8-bit coefficients are latched into the C register of Filter Cell 0. The TCCI signal selects the appropriate coefficient format type. The CIENB signal enables loading of the coefficients.

Outputs

SUM25-0 — Data Output

The 26-bit result from an individual filter cell will appear when ADR2-0 is used to select the filter cell result. SHADD in conjunction with ADR2-0 is used to select the output from the shift-and-add output stage.

COUT7-0 — Coefficient Output

The 8-bit coefficient output from Filter Cell 7 can be connected to the CIN7-0 coefficient input of the same LF43881 to recirculate the coefficients. COUT7-0 can also be connected to the CIN7-0 of another LF43881 to cascade the devices. The COENB signal enables the output of the coefficients.

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DEVICES INCORPORATED

LF43881

8 x 8-bit Digital Filter

Controls

TCS — Data Format Control

The TCS input determines the interpretation of the input data. When TCS is HIGH, two’s complement arithmetic is used. When TCS is LOW, unsigned arithmetic is used.

TCCI — Coefficient Input Format Control

The TCCI input determines the interpretation of the coefficients. When TCCI is HIGH, two’s complement arithmetic is used. When TCCI is LOW, unsigned arithmetic is used.

TCCO — Coefficient Output Format

The TCCO output shows the format of the COUT7-0 coefficient output. TCCO follows the TCCI input. When cascading multiple LF43881s, the TCCO output of one device should be connected to the TCCI input of another device. The COENB signal enables TCCO.

DIENB — Data Input Enable

The DIENB input enables the X register of every filter cell. While DIENB is LOW, the X registers are loaded with the data present at the DIN7-0 inputs on the rising edge of CLK. While DIENB is HIGH, all bits of DIN7-0 are forced to zero and a rising edge of CLK will load the X register of every filter cell with all zeros. DIENB must be low one clock cycle prior to presenting the input data on the DIN7-0 input since it is latched and delayed internally.

CIENB — Coefficient Input Enable

The CIENB input enables the C and D registers of every filter cell. While CIENB is LOW, the C and appropriate D registers are loaded with the coefficient data on the rising edge of CLK. While CIENB is HIGH, the contents of the C and D registers are held and the CLK signal is ignored. By using CIENB in its active state, coefficient data can be shifted from cell to cell. CIENB must be low one clock cycle prior to presenting the coefficient data on the CIN7-0 input since it is latched and delayed internally.

COENB — Coefficient Output Enable

The COENB input enables the COUT7-0 and TCCO outputs. When COENB is LOW, the outputs are enabled. When COENB is HIGH, the outputs are placed in a high-impedance state.

DCM1-0 — Decimation Control

The DCM1-0 inputs select the number of decimation registers to use (Table 1). Coefficients are passed from one cell to another at a rate determined by DCM1-0. When no decimation registers are selected, the coefficients are passed from cell to cell on every rising edge of CLK (no decimation). When one decimation register is selected, the coefficients are passed from cell to cell on every other rising edge of CLK (2:1 decimation). When two decimation registers are selected, the coefficients are passed from cell to cell on every third rising edge of CLK (3:1 decimation) and so on. DCM1-0 is latched and delayed internally.

ADR2-0 — Cell Accumulator Select

The ADR2-0 inputs select which cell’s accumulator will available at the SUM25-0 output or added to the output stage accumulator. In both cases, ADR2-0 is latched and delayed by one clock cycle. If the same address remains on the ADR2-0 inputs for more than one clock cycle, SUM25-0 will not change if the contents of the accumulator changes. Only the result from the first selection of the cell (first clock cycle) by ADR2-0 will be available. ADR2-0 is also used to select which accumulator to clear when ERASE is LOW.

SENBH — MSB Output Enable

When SENBH is LOW, SUM25-16 is enabled. When SENBH is HIGH, SUM25-16 is placed in a high-impedance state.

SENBL — LSB Output Enable

When SENBL is LOW, SUM15-0 is enabled. When SENBL is HIGH, SUM15-0 is placed in a high-impedance state.

RESET — Register Reset Control

When RESET is LOW, all registers are cleared simultaneously except the cell accumulators. RESET can be used with ERASE to clear all cell accumulators. RESET is latched and delayed internally. Refer to Table 2.

ERASE — Accumulator Erase Control

When ERASE is LOW, the cell accumulator specified by ADR2-0 is cleared. When RESET is LOW in conjunction with ERASE, all cell accumulators are cleared. Refer to Table 2.

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DEVICES INCORPORATED

LF43881

8 x 8-bit Digital Filter

MAXIMUM RATINGS

Storage temperature ........................................................................................................... –65°C to +150°C

Operating ambient temperature........................................................................................... –55°C to +125°C

VCC supply voltage with respect to ground............................................................................ –0.5 V to +7.0V

Input signal with respect to ground ............................................................................... –0.5 V to VCC + 0.5 V

Signal applied to high impedance output ...................................................................... –0.5 V to VCC + 0.5 V

Output current into low outputs............................................................................................................. 25 mA

Latchup current ............................................................................................................................... > 400 mA

OPERATING CONDITIONS

Active Operation, Commercial 0°C to +70°C 4.75 V ≤ VCC ≤ 5.25 V Active Operation, Military –55°C to +125°C 4.50 V ≤ VCC ≤ 5.50 V

ELECTRICAL CHARACTERISTICS

Above which useful life may be impaired (Notes 1, 2, 3, 8)

To meet specified electrical and switching characteristics

Mode Temperature Range (Ambient) Supply Voltage

Over Operating Conditions (Note 4)

Symbol Parameter Test Condition Min Typ Max Unit

VOH Output High Voltage VCC = Min., IOH = –400 µA 2.6 V VOL Output Low Voltage VCC = Min., IOL = 2.0 mA 0.4 V VIH Input High Voltage 2.0 VCC V V IL Input Low Voltage (Note 3) 0.0 0.8 V IIX Input Current Ground ≤ VIN ≤ VCC (Note 12) ±10 µA IOZ Output Leakage Current (Note 12) ±10 µA ICC1 VCC Current, Dynamic (Notes 5, 6) 160 mA ICC2 VCC Current, Quiescent (Note 7) 750 µA CIN Input Capacitance TA = 25°C, f = 1 MHz 10 pF COUT Output Capacitance TA = 25°C, f = 1 MHz 10 pF

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DEVICES INCORPORATED

SWITCHING CHARACTERISTICS

LF43881

8 x 8-bit Digital Filter

COMMERCIAL OPERATING RANGE (0°C to +70°C)

Symbol Parameter Min Max Min Max Min Max Min Max

tCYC Cycle Time 50 39 33 25 tPW Clock Pulse Width 20 16 13 10 tS Input Setup Time 16 14 13 10 tH Input Hold Time 0000 tODC Coefficient Output Delay 24 20 18 16 tODS Sum Output Delay 27 25 21 18 tENA Three-State Output Enable Delay (Note 11) 20 15 15 12 tDIS Three-State Output Disable Delay (Note 11) 20 15 15 12

MILITARY OPERATING RANGE (–55°C to +125°C)

Symbol Parameter Min Max Min Max Min Max

tCYC Cycle Time 50 39 33 tPW Clock Pulse Width 20 16 13 tS Input Setup Time 20 17 13 tH Input Hold Time 0 0 0 tODC Coefficient Output Delay 24 20 18 tODS Sum Output Delay 31 25 21 tENA Three-State Output Enable Delay (Note 11) 20 15 15 tDIS Three-State Output Disable Delay (Note 11) 20 15 15

Notes 9, 10 (ns)

23456789012

Notes 9, 10 (ns)

LF43881–

23456789012345678901234

40 33

23456789012345678901234567890121234

23456789012345678901234

LF43881–

SWITCHING WAVEFORMS

CLK

DIN7-0 CIN7-0

CONTROLS

OUTPUTS

OUTPUT ENABLES

2345678901234567890123

*DISCONTINUED SPEED GRADE

†

‡

includes DIENB, CIENB, ERASE, RESET, TCS, TCCI, SHADD, DCM

†

includes TCCO, SUM

‡

includes SENBL, SENBH, and COENB.

25-0, and COUT7-0.

tPW

tODC tODS

tDIS

1-0, and ADR2-0.

tPW

HIGH IMPEDANCE

tENA

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DEVICES INCORPORATED

0.2 V

DIS

ENA

0.2 V

1.5 V 1.5 V

3.5V Vth

1.5 V

0V Vth

VOL*

Measured V

with IOH = –10mA and IOL = 10mA

Measured V

with IOH = –10mA and IOL = 10mA

NOTES

LF43881

8 x 8-bit Digital Filter

1. Maximum Ratings indicate stress specifications only. Functional operation of these products at values beyond those indicated in the Operating Conditions table is not implied. Exposure to maximum rating conditions for extended periods may affect reliability.

2. The products described by this specification include internal circuitry designed to protect the chip from damaging substrate injection currents and accumulations of static charge. Nevertheless, conventional precautions should be observed during storage, handling, and use of these circuits in order to avoid exposure to excessive electrical stress values.

3. This device provides hard clamping of transient undershoot and overshoot. Input levels below ground or above VCC will be clamped beginning at –0.6 V and VCC + 0.6 V. The device can withstand indefinite operation with inputs in the range of –0.5 V to +7.0 V. Device operation will not be adversely affected, however, input current levels will be well in excess of 100 mA.

9. AC specifications are tested with input transition times less than 3 ns, output reference levels of 1.5 V (except

tDIS test), and input levels of nominally

0 to 3.0 V. Output loading may be a resistive divider which provides for specified IOH and IOL at an output voltage of VOH min and VOL max respectively. Alternatively, a diode bridge with upper and lower current sources of IOH and IOL respectively, and a balancing voltage of 1.5 V may be used. Parasitic capacitance is 30 pF minimum, and may be distributed.

This device has high-speed outputs capable of large instantaneous current pulses and fast turn-on/turn-off times. As a result, care must be exercised in the testing of this device. The following measures are recommended:

a. A 0.1 µF ceramic capacitor should be installed between VCC and Ground leads as close to the Device Under Test (DUT) as possible. Similar capacitors should be installed between device VCC and the tester common, and device ground and tester common.

11. For the tENA test, the transition is measured to the 1.5 V crossing point with datasheet loads. For the tDIS test, the transition is measured to the ±200mV level from the measured steady-state output voltage with ±10mA loads. The balancing voltage, VTH, is set at 3.5 V for Z-to-0 and 0-to-Z tests, and set at 0 V for Zto-1 and 1-to-Z tests.

12. These parameters are only tested at the high temperature extreme, which is the worst case for leakage current.

FIGURE A. OUTPUT LOADING CIRCUIT

DUT

FIGURE B. THRESHOLD LEVELS

4. Actual test conditions may vary from those designated but operation is guaranteed as specified.

5. Supply current for a given application can be accurately approximated by:

NCV F

where

N = total number of device outputs C = capacitive load per output V = supply voltage F = clock frequency

b. Ground and VCC supply planes must be brought directly to the DUT socket or contactor fingers.

c. Input voltages should be adjusted to compensate for inductive ground and VCC noise to maintain required DUT input levels relative to the DUT ground pin.

10. Each parameter is shown as a minimum or maximum value. Input requirements are specified from the point of view of the external system driving the chip. Setup time, for example, is specified as a minimum since the exter-

6. Tested with all outputs changing every cycle and no load, at a 20 MHz clock rate.

nal system must supply at least that much time to meet the worst-case requirements of all parts. Responses from the internal circuitry are specified from

7. Tested with all inputs within 0.1 V of

VCC or Ground, no load.

8. These parameters are guaranteed but not 100% tested.

the point of view of the device. Output delay, for example, is specified as a maximum since worst-case operation of any device always provides data within that time.

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DEVICES INCORPORATED

ORDERING INFORMATION

84-pin

LF43881

8 x 8-bit Digital Filter

SUM SUM

SUM SUM SUM SUM

GND SUM SUM

SUM SUM SUM SUM

GND SUM SUM

SUM SUM SUM

GND

CIN

74 73 72 71 70 69 68 67 66 65 64 63 62 61 60 59 58 57 56 55 54

CIN

COUT COUT GND TCCO COENB V

ERASE RESET DIENB TCS DIN

DIN

CIENB TCCI V

6 7

GND

SUM24DCM1SUM25SENBH

14 15

19 20

27 28

GND

SUM

VCCADR0ADR1GND

891011 78 77 76 75

DCM0ADR2CLK

SHADD

1234567

84 83 82 81 80 79

COUT0COUT1GND

COUT2COUT3COUT4COUT5V

Top

View

36353433 50 51 52 53

SUM

SUM3SUM2SUM1SUM

4443 45 46 47 493837 39 40 41 42

GND

CIN

SENBL

CIN

CIN2CIN3CIN4CIN

Speed

40 ns

Plastic J-Lead Chip Carrier

(J3)

0°C to +70°C — COMMERCIAL SCREENING

LF43881JC40

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DEVICES INCORPORATED

123456789012345678901234567890121234567890123456789012345678901212345678901234567890123456789012

8 x 8-bit Digital Filter

ORDERING INFORMATION

12345678901234567890123456789012123456789012345678901234567890121234567890123456789012345678901

100-pin

12345678901234567890123456789012123456789012345678901234567890121234567890123456789012345678901

DCM1

SUM24

GND

GND SUM23 SUM22

VCC

VCC SUM21 SUM20 SUM19 SUM18

GND

GND SUM17 SUM16

VCC

VCC SUM15 SUM14 SUM13 SUM12

GND SUM11 SUM10

SUM9 SUM8 SUM7

SUM6

SUM25

SENBH

VCC

ADR0

ADR1

GND

DCM0

ADR2

CLK

SHADD

VCC

99989796959493929190898887868584838281

100

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30

Top

View

31323334353637383940414243444546474849

GND

VCC

SUM5

SUM4

SUM3

SUM2

SUM1

CIN0

CIN1

GND

SUM0

SENBL

Discontinued Package

COUT0

COUT1

GND

COUT2

COUT3

COUT4

COUT5

VCC

COUT6

COUT7

GND

TCCO

COENB

VCC

ERASE

RESET

DIENB

TCS

DIN7

DIN6

DIN5

DIN4

DIN3

DIN2

DIN1

DIN0

CIENB

TCCI

VCC

CIN7

CIN6

GND

VCC

CIN2

CIN3

CIN4

CIN5

GND

Plastic Quad Flatpack

Speed

(Q2)

0°C to +70°C — COMMERCIAL SCREENING

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DEVICES INCORPORATED

8 x 8-bit Digital Filter

ORDERING INFORMATION

23456789012345678901234567890121234567890123456789012345678901212345678901234567890123456789012

84-pin

23456789012345678901234567890121234567890123456789012345678901212345678901234567890123456789012

Speed

0°C to +70°C — COMMERCIAL SCREENING

–55°C to +125°C — COMMERCIAL SCREENING

–55°C to +125°C — MIL-STD-883 COMPLIANT

12345

RESET

GND

COUT

GND

ADR

SENBH

DCM

COENB

COUT

GND

COUT

DCM

ADR

SUM

COUT

SHADD

SUM

TCCO

CLK

GND

DIN

ERASE

TCS

DIENB

(i.e., Component Side Pinout)

SUM

Discontinued Package

Ceramic Pin Grid Array

DIN

Top View

Through Package

SUM

GND

SUM

(G3)

7 8 9 10 11

DIN

CIENB

SUM

TCCI

CIN

SUM

GND

CIN

SUM

CIN

SENBL

GND

SUM

GND

SUM

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LF43881