OUTPUT VOLTAGE SLOPE CONTROL FOR
LOW ELECTRO MAGNETI C EMISSIONS
■
INTERNAL SHORT CIRCUIT PROTECTION
■
OVERTEMPERATURE PROTECTIO N AND
OVERCURRENT PROTECTION AND DISABLE
■
SWITCHING FREQUENCY UP TO 2kHZ
■
INTERNAL ZENER CLAMP OF THE OUTPUT
VOLTAGE FOR INDUCTIVE LOADS
■
PARALLEL INPUT
■
SPI FOR DIAGNOSTIC INFORMATION EXCHANGE
■
RESET INPUT
L9362
QUAD LOW SIDE DRIVER
PowerSO36
ORDERING NUMBER: L9362
■
TYPICAL INTERNAL OSCILLATOR FREQUENCY 325kHZ
DESCRIPTION
The Quad Driver is an integrated quad low-side
power switch with power limitation, load i nterrupt
and shorted load detection, thermal shutdown, error detection via SPI interface and integrated Z-diodes for output clamping, free running diodes.
1PGND1Power Ground
2N.C.
3CFB1Output Current feedbackSinks current proportional to I
4OUT1Output Power Switch
5OUT1Output Power Switch
6CLKInput ClockDigital input, Schmitt trigger, internal Pullup current
7NCSinverted Chip Select InputDigital input, Schmitt trigger, internal Pullup current
8N.C.
9SGNDSignal Ground
10LGNDGround of digital part
11N.C.
12SDOSerial Data OutputDigital tristate output
13SDISerial Data InputDigital input, Schmitt trigger, internal Pullup current
14OUT4Output Power Switch
15OUT4Output Power Switch
16CFB4Output Current feedbackSinks current proportional to I
17N.C.
18PGND4Power Ground
19PGND3Power Ground
20N.C.
21CFB3Output Current feedbackSinks current proportional to I
22OUT3Output Power Switch
23OUT3Output Power Switch
24NON4Inverted Control Signal InputDigital input, Schmitt trigger, internal Pullup current
OUT1
OUT4
OUT3
2/17
Page 3
L9362
PIN FUNCTIONS
(continued)
Pin No.Pin NamePin DescriptionNotes
25NON3Inverted Control Signal InputDigital input, Schmitt trigger, internal Pullup current
26NRESInverted Reset InputDigital input, Schmitt trigger, internal Pullup current
27N.C.
28VCC5V Supply Voltage Input
29N.C.
30NON2Inverted Control Signal InputDigital input, Schmitt trigger, internal Pullup current
31NON1Inverted Control Signal InputDigital input, Schmitt trigger, internal Pullup current
32OUT2Output Power Switch
33OUT2Output Power Switch
34CFB2Output Current feedbackSinks current proportional to I
OUT2
35N.C.
36PGND2Power Ground
THERMAL DATA
SymbolParameterTest ConditionsMin.Typ.Max.Unit
Thermal resistance
R
th j-case
R
thja
R
thja
ESD
ESDMIL 883C±2KV
Thermal resistance junction to case
(one powerstage in use)
Note 4:At 150°C gu aranteed by design and el ectrical characteri sation
Note 5:Guaranteed by design and electri cal charact erisatio n
Note 6:Values for T
, CURlin1 and CURlin2 are typical values from testing results
MPS1
Diagnostic
V
REF1
Short to GND threshold voltagefor I
≤ 2A0.390
OUT
•V
CC
0.435
•V
CC
t_SCGShort to GND filter time140250µs
I
OL
Open load threshold current1055mA
t_OLOpen load filter time140265µs
R
OL
Pullup resistor at OUT1, OUT2,
2.08.0kΩ
OUT3 and OUT4 for OL detection
T
OFF
Note 7:Guaranteed by meas urement and correlati on
Serial diagnostic link (external Load capacitor at SDO = 100pF)
f
t
clh
t
t
pcld
t
csdv
t
sclch
clk
cll
Clock frequency50% duty cycle.03MHz
Minimum time CLK = HIGH100ns
Minimum time CLK = LOW100ns
Propagation delayCLK to data at SDO valid.100ns
NCS = LOWTo data at SDO valid.100ns
CLK low before NCS lowSetup time CLK to NCS
100ns
change H/L.
t
hclcl
CLK change L/H after
100ns
NCS = LOW
t
scld
SDI input setup timeCLK change H/L after SDI
20ns
data valid.
t
hcld
SDI input hold timeSDI data hold after CLK
20ns
change H/L.
t
sclcl
t
hclch
t
pchdz
t
fNCS
CLK low before NCS high150ns
CLK high after NCS high150ns
NCS L/H to output data float100ns
NCS filter-timePulses ≤ t
Figure 6. Different cases for an Open Load failure detection (case 1 to 10)
CASE 1
Non Input
Failure Register
Status
CASE 2
Non Input
Failure Register
Reset
Output
Current
Failure Register
Status
CASE 3
Output
Current
Failure Register
Status
CASE 4
Output
Current
Failure Register
Status
CASE 5
Output
Current
Failure Register
Status
CASE 6
Output
Current
Failure Register
Status
CASE 7
Output
Current
Failure Register
Status
CASE 8
Output
Current
Failure Register
Status
CASE 9
Output
Current
Failure Register
Status
CASE 10
Output
Current
Failure Register
Status
00AT0004
IOL = OL filter time
IOL
IOL
IOL
IOL
IOL
IOL
IOL
IOL
IOL
t
OL
t
OL
t
OL
t
OL
t
OL
t
OL
t
OL
t
OL
t
OL
t
t
OL
t
OL
t
OL
t
OL
t
OL
t
OL
t
OL
t
OL
t
OL
OL
t
OL
10/17
Page 11
Figure 7. Different cases for an Open Load failure detection (case 11 to 20)
L9362
CASE 11
Output
Current
Failure Register
Status
CASE 12
Output
Current
Failure Register
Status
CASE 13
Output
Current
Failure Register
Status
CASE 14
Output
Current
Failure Register
Status
CASE 15
Output
Current
Failure Register
Status
CASE 16
Output
Current
Failure Register
Status
CASE 17
Output
Current
Failure Register
Status
CASE 18
Output
Current
Failure Register
Status
CASE 19
Output
Current
Failure Register
Status
CASE 20
Non Input
IOL
IOL
IOL
IOL
IOL
IOL
IOL
IOL
IOL
t
OL
t
OL
t
OL
t
OL
t
OL
t
OL
t
OL
t
OL
t
OL
t
OL
t
OL
t
OL
t
OL
t
OL
t
OL
t
OL
t
OL
t
OL
t
OL
t
OL
t
OL
Failure Register
Reset
Output
Current
Failure Register
Status
00AT0005
IOL
t
OL
t
OL
t
OL
t
OL
t
OL
11/17
Page 12
L9362
Figure 8. Max Clamp Energy Specification
1000
800
600
400
Energy/[mJ]
200
0
0.02.04.06.08.010.0
Temp=25˚C
Temp=150˚C
Pulse width/[ms]
Figure 9. Tratio of Current Feedback output versus output curr ent
1.80e-03
1.75e-03
1.70e-03
1.65e-03
1.60e-03
1.55e-03
Tratio
1.50e-03
1.45e-03
1.40e-03
1.35e-03
1.30e-03
0.00.20.40.60.81.01.21.41.61.82.0
IOUT/[A]
Temp=-40˚C
Temp=-20˚C
Temp=25˚C
Temp=70˚C
Temp=150˚C
12/17
Page 13
L9362
Figure 10. TMPS1 vs. Temperature
3
2
1
0
TMPS1/[%]
-1
-2
-3
-500
(4.5V ≤ V
≤ 5.5V; 0.5A ≤ I
cc
out1...4
≤ 3A)
.
50100150200
Temp./[˚C]
FUNCTIONAL DESCRIPTION
Introduction
The Quad Low Side Driver UF07 is built up of four identical channels (Low Side Drivers), controlled by four
CMOS input stages. Each Channel is protected against short to V
A diagnostic logic recognizes four failure types at the output stage: overcurrent, short to GND, open-load and
overtemperature.
The failures are stored individually for each channel in one byte which can be read out via a serial interface (SPI).
Each channel has a current feedback output which sinks a current proportional to the load current of the Low
Side Switch.
Output Stage Control
Each of the four output stages is switched ON and OFF by an individual control line (NON-Input). The logic level of
the control line is CMOS compatible. The output transist ors are switched off when the inputs are not connected.
Power Transistors
Each of the four output stages has its own zener clamp. This caus es a voltage limitation at the power transi stors
when inductive loads are switched off. Output voltage ramp occurring when the output is switched on or off, is
within defined limits. Output transistors can be connected in parallel to increase the current capability. In this
case, the associated inputs, outputs and current feedback outputs should be connected together.
Diagnostics
Following failures at the output stage are recognized:
Short circuit to V
Short circuit to GND...................................=SCG
Open Load.................................................= OL (Lowest Priority)
or overtemp................= SCB (Highest priority)
Bat
and by a zener clamp against overvoltage.
Bat
13/17
Page 14
L9362
Short-Circuit and Overtemperature Protection (SCB)
If the output current increases above the short current limit for a longer time than t_SCB or if the temperature
increases above T
control signal at the NON-Input is switched off and on again. This filter time has the purpose to suppress wrong
detection on short spikes.
All four outputs have an independent overtemperature detection and shutdown. This measurement is active
while the powerstage is switched on.
The Short circuit detection and the overtemperature detection are using the same bit in the Diagnostic (one for
each channel).
SCG
A
failure will be recogni zed, when the drain voltage of the output s tage is lower as the “Short Cut to Ground
threshold voltage”, while the output stage is switched off (see Fig. 4). The SCG failure is filtered with a digital
filter (t_SCG) to suppress the storage of a failure at small SCG spikes, which are typical during the transition of
the power output. This filter is triggered by the NON input and the (analog) SCG detection.
If the current through the output stage is lower than the IOL-reference, then an
after a filter time. This measurement is active while the powerstage is switched on.
The Open Load failure detection has 2 different modes, the statical failure detection and the sporadic failure
detection. One main difference is, that a statical failure is transferred to the Failure register with the next rising
edge of NON, whereas a sporadic failure is transferred immediately to the Failure register (see fig. 5, 6 and 7).
In both failure modes the OL detection is filtered (t_OL=t
same digital filter for suppression of spikes.
The failures are stor ed regar ding to their prior ity (see above). A fai lure wi th a higher prior ity ov erwrites an eventually already detected failure with a lower priority.
, then the power transistor is immediately switched off. It remains switched off until the
OFF
OL
failure will be recognized
) and is using together with the SCG detection the
OL
Diagnostic interface
The communication between the microprocessor and the failure register runs via the SPI li nk. If there is a failure
stored in the fail ure r egis ter, the fir st bit of the shift register i s set to a high lev el. With the H /L change at the NCS
pin the first bit of the di agnostic shift regi ster wi ll be trans mitted to the SDO output. The SDO output is the s erial
output from the diagnostic shift register and i t is tristate w hen the NCS pin is high. The C LK pin clock s the diagnostic shift register. New SDO data will appear on every rising edge of the CLK pin and new S DI data will be
latched on every falling edge into the shift register. With the first positive pulse of the CLK the contents of the
failure register is copied to the SPI shift register and a internal reset (FR_RESET) is generated. This internal
reset clears the failure register and thus the failure register is capable of detecting failures also during the SPI
read cycle. T here i s no bus colli sion at a s mall spik e at the NCS. The CLK has to be LOW, w hile the N CS si gnal
is changing.
Current feedback
Each channel has a current feedback output which sinks a current proportional to the load current of the Low
Side Switch. Using this output servo loop applications can be realized by applying a PWM signal to the NON
input. A typical diagram of the Current Feedback output at different temperatures is shown in figure 9.
14/17
Page 15
Reset
There are two different reset functions realized:
Undervoltage reset
As long as the voltage of Vcc is lower than V
, the powerstages are switched off, the failure register
ccmin
is reset and the SDO output remains tristate.
External reset
As long as the NRES pin is low following circuits are reset:
Powerstages
Failure register
and the SDO output is tristate.
Under volta ge protectio n
At Vcc below V
the device remains switched off even if there is a voltage ramp at the OUT pin.
(1): "D" and "E1" do not include mold flash or protrusions
- Mold flash or protrusions shall not exceed 0.15mm (0.006 inch)
- Critical dimensions are "a3", "E" and "G".
OUTLINE AND
MECHANICAL DATA
PowerSO36
NN
a2
A
1936
0.12 AB
⊕
e
M
E1
DETAIL B
lead
a3
B
Gage Plane
PSO36MEC
BOTTOM VIEW
DETAIL B
0.35
S
E
DETAIL A
L
E2
h x 45˚
DETAIL A
118
A
e3
H
D
b
c
a1
slug
E3
D1
- C -
SEATING PLANE
GC
(COPLANARITY)
16/17
Page 17
L9362
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences
of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted
by implic ation or otherwise under any patent or patent r i ghts of STM i croelectr oni cs. Specifications menti oned in th i s publicati on are subject
to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not
authorized for use as cri tical components in li f e support dev i ces or systems without express writ t en approval of STMicroe l ectronics.
The ST logo is a registered trademark of STMicroelectronics
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Australia - Brazi l - Canada - Ch i na - F i nl and - Franc e - Germany - Hong Kong - India - Israel - I taly - Japan -M alaysia - Malta - Morocco -
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STMicroelectronics GROUP OF COMPANIES
http://www.s t. com
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