- Change Data Sheet format :
One data sheets for industrial and commercial product
Revision
- Change Data Sheet format
- Remove 45ns part from commercial product and 100ns part
from industrial product
- Remove low power part form TSOP package
Draft Data
Novemer 28, 1993
May 13, 1994
December 1, 1994
August 12, 1995
April 15, 1996
January 9, 1998
Remark
Design target
Preliminary
Final
Final
Final
Final
The attached data, sheets are provided by SAMSUNG Electronics. SAMSUNG Electronics CO., LTD. reserve the right to change the specifications and
products. SAMSUNG Electronics will answer to your questions about device. If you have any questions, please contact the SAMSUNG branch offices.
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Revision 4.0
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KM68512A FamilyCMOS SRAM
64Kx8 bit Low Power CMOS Static RAM
FEATURES
• Process Technology: Poly Load
• Organization: 64Kx8
• Power Supply Voltage: 4.5~5.5V
• Low Data Retention Voltage: 2V(Min)
• Three state output and TTL Compatible
• Package Type: 32-SOP-525, 32-TSOP1-0820F
GENERAL DESCRIPTION
The KM68512A families are fabricated by SAMSUNG′s
advanced CMOS process technology. The families support
various operating temperature ranges and have various
package types for user flexibility of system design. The
families also support low data retention voltage for battery
back-up operation with low data retention current.
PRODUCT FAMILY
Product Family Operating TemperatureVCC RangeSpeed
Voltage on any pin relative to VssVIN,VOUT-0.5 to 7.0VVoltage on Vcc supply relative to VssVCC-0.5 to 7.0VPower DissipationPD1.0WStorage temperatureTSTG-65 to 150°C-
Operating TemperatureTA
0 to 70°CKM68512A
-40 to 85°CKM68512AI
Soldering temperature and timeTSOLDER260°C, 10sec(Lead Only)--
1. Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. Functional operation should be
restricted to recommended operating condition. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
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KM68512A FamilyCMOS SRAM
-0.5
1)
Vcc+0.5V
3)
-0.8V
2)
V
RECOMMENDED DC OPERATING CONDITIONS
ItemSymbolMinTypMaxUnit
Supply voltageVcc4.55.05.5V
GroundVss000V
Input high voltageVIH2.2Input low voltageVIL
Note
1. Commercial Product : TA=0 to 70°C, unless otherwise specified
Industrial Product : TA=-40 to 85°C, unless otherwise specified
2. Overshoot : VCC+3.0V in case of pulse width≤30ns
3. Undershoot : -3.0V in case of pulse width≤30ns
4. Overshoot and undershoot are sampled, not 100% tested
Input leakage currentILIVIN=Vss to Vcc-1-1µA
Output leakage currentILOCS1=VIH or CS2=VIL or OE=VIH or WE=VIL, VIO=Vss to Vcc-1-1µA
Operating power supply current ICC IIO=0mA, CS1=VIL, CS2=VIH, VIN=VIH or VIL-715mA
Cycle time=1µs, 100% duty, IIO=0mA
ICC1
Average operating current
CS1≤0.2V, CS2≥VCC-0.2V, VIN≤0.2V or VIN≥Vcc -0.2V
Cycle time=Min, 100% duty, IIO=0mA, CS1=VIL, CS2=VIH, VIN=VIH or VIL
ICC2
Test Conditions
Min Typ Max Unit
--10mA
--70mA
Output low voltageVOLIOL=2.1mA--0.4V
Output high voltageVOHIOH=-1.0mA2.4--V
Standby Current(TTL)ISBCS1=VIH, CS2=VIL, Other inputs =VIH or VIL--3mA
Standby
Current
(CMOS)
KM68512AL/L-L
KM68512ALI/LI-L
CS1≥Vcc-0.2V, CS2≥Vcc-0.2V or CS2≤0.2V
ISB1
Other inputs =0 ~ Vcc
Low Power
Low Low Power
Low Power
Low Low Power
4
--21100
20
--21100
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µA
µA
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KM68512A FamilyCMOS SRAM
AC OPERATING CONDITIONS
TEST CONDITIONS( Test Load and Input/Output Reference)
Input pulse level : 0.8 to 2.4V
Input rising and falling time : 5ns
Input and output reference voltage :1.5V
Output load(see right) : CL=100pF+1TTL
AC CHARACTERISTICS (Vcc=4.5~5.5V, KM68512A Family:TA=0 to 70°C, KM68512AI Family:TA=-40 to 85°C)
Parameter ListSymbol
Read cycle timetRC55-70-ns
Address access timetAA-55-70ns
Chip select to outputtCO1, tCO2-55-70ns
Output enable to valid outputtOE-25-35ns
Read
Write
Chip select to low-Z outputtLZ10-10-ns
Output enable to low-Z outputtOLZ5-5-ns
Chip disable to high-Z outputtHZ020025ns
Output disable to high-Z outputtOHZ020025ns
Output hold from address changetOH10-10-ns
Write cycle timetWC55-70-ns
Chip select to end of writetCW45-60-ns
Address set-up timetAS0-0-ns
Address valid to end of writetAW45-60-ns
Write pulse widthtWP40-50-ns
Write recovery timetWR0-0-ns
Write to output high-ZtWHZ020025ns
Data to write time overlaptDW25-30-ns
Data hold from write time tDH0-0-ns
End write to output low-ZtOW5-5-ns
1)
CL
1. Including scope and jig capacitance
Speed Bins
55ns70ns
MinMaxMinMax
Units
DATA RETENTION CHARACTERISTICS
ItemSymbol
Vcc for data retentionVDR
KM68512AL/L-L
Data retention currentIDR
KM68512ALI/LI-L
Data retention set-up timetSDR
Recovery timetRDR5--
1.CS1≥Vcc-0.2V, CS2≥Vcc-0.2V( CS1 controlled) or CS2≤0.2V(CS2 controlled).
CS11)≥Vcc-0.2V
Vcc=3.0V CS1≥Vcc-0.2V
CS2≥Vcc-0.2V or CS2≤0.2V
See data retention waveform
Test Condition
L-Ver
LL-Ver
L-Ver
LL-Ver
5
MinTypMaxUnit
2.0-5.5V
-
1
-
0.5
-
-
0--
-
-
50
10
50
25
January 1997
µA
ms
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KM68512A FamilyCMOS SRAM
TIMMING DIAGRAMS
TIMING WAVEFORM OF READ CYCLE(1) (Address Controlled, CS1=OE=VIL, WE=VIH)
tRC
Address
tAA
tAA
Data Valid
tRC
tOH
tCO1
tHZ(1,2)
tOH
Data Out
Previous Data Valid
TIMING WAVEFORM OF READ CYCLE(2) (WE=VIH)
Address
CS1
CS2
OE
Data out
NOTES (READ CYCLE)
1. tHZ and tOHZ are defined as the time at which the outputs achieve the open circuit conditions and are not referenced to output voltage
levels.
2. At any given temperature and voltage condition, tHZ(Max.) is less than tLZ(Min.) both for a given device and from device to device
interconnection.
High-Z
tLZ
tOLZ
tCO2
tOE
tOHZ
Data Valid
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KM68512A FamilyCMOS SRAM
TIMING WAVEFORM OF WRITE CYCLE(1) (WE Controlled)
tWC
Address
tCW(2)
CS1
tAW
tWR(4)
CS2
WE
tAS(3)
Data in
tWHZ
Data out
Data Undefined
TIMING WAVEFORM OF WRITE CYCLE(2)(CS1 Controlled)
Address
tAS(3)
CS1
CS2
WE
Data in
tWC
tCW(2)
tAW
tCW(2)
tWP(1)
tWP(1)
tDW
Data Valid
tDW
Data Valid
tDH
tOW
tWR(4)
tDH
Data out
High-Z
High-Z
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KM68512A FamilyCMOS SRAM
TIMING WAVEFORM OF WRITE CYCLE(3) (CS2 Controlled)
tWC
Address
tAS(3)
CS1
CS2
WE
Data in
Data out
NOTES (WRITE CYCLE)
1. A write occurs during the overlap of a low CS1, a high CS2 and a low WE. A write begins at the latest transition among CS1 goes low,
CS2 going high and WE going low : A write end at the earliest transition among CS1 going high, CS2 going low and WE going high,
tWP is measured from the begining of write to the end of write.
2. tCW is measured from the CS1 going low or CS2 going high to the end of write.
3. tAS is measured from the address valid to the beginning of write.
4. tWR is measured from the end of write to the address change. tWR(1) applied in case a write ends as CS1 or WE going high tWR(2)
applied in case a write ends as CS2 going to low.
High-Z
tAW
tCW(2)
tCW(2)
tWP(1)
tDW
Data Valid
tWR(4)
tDH
High-Z
DATA RETENTION WAVE FORM
CS1 controlled
VCC
4.5V
tSDR
Data Retention Mode
tRDR
2.2V
VDR
CS1
GND
CS2 controlled
VCC
4.5V
CS2
VDR
0.4V
GND
tSDR
CS1≥VCC - 0.2V
Data Retention Mode
CS2≤0.2V
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tRDR
Revision 4.0
January 1997
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KM68512A FamilyCMOS SRAM
PACKAGE DIMENSIONS
32 PIN SMALL OUTLINE PACKAGE (525mil)
#32
0.71
( )
0.028
#1
0.41
0.016
20.87
0.822
20.47±0.20
0.806±0.008
+0.100
-0.050+0.004
-0.002
MAX
1.27
0.050
#17
#16
14.12±0.30
0.556±0.012
2.74±0.20
0.108±0.008
0.05
MIN
0.002
3.00
0.118
11.43±0.20
0.450±0.008
MAX
+0.10
0.20
-0.05+0.004
0.008
-0.002
0.10 MAX
0.004 MAX
Units: millimeter(Inch)
0~8°
13.34
0.525
0.80±0.20
0.031±0.008
32-THIN SMALL OUTLINE PACKAGE TYPE I (0820F)
0.50
0.0197
0~8°
+0.10
0.20
-0.05+0.004
0.008
-0.002
#16
0.25
TYP
0.010
0.45 ~0.75
0.018 ~0.030
#1
20.00±0.20
0.787±0.008
18.40±0.10
0.724±0.004
#32
0.331
#17
0.15
0.006
0.50
( )
0.020
MAX
8.40
1.00±0.10
0.039±0.004
1.20
MAX
0.047
+0.10
-0.05+0.004
-0.002
0.25
( )
0.010
8.00
0.315
0.05
MIN
0.002
0.10 MAX
0.004 MAX
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Revision 4.0
January 1997
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