Datasheet JANTXV2N6788, JANTX2N6788 Datasheet (International Rectifier)

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HEXFET
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®
POWER MOSFET
Provisional Data Sheet No. PD-9.426B
JANTX2N6788
JANTXV2N6788
[REF:MIL-PRF-19500/555]
[GENERIC:IRFF120]
N-CHANNEL
100 Volt, 0.30
HEXFET technology is the key to International Rectifier’s advanced line of power MOSFET transis­tors. The efficient geometry achieves very low on­state resistance combined with high transconductance.
HEXFET transistors also feature all of the well-es­tablish advantages of MOSFETs, such as voltage control, very fast switching, ease of paralleling and electrical parameter temperature stability. They are well-suited for applications such as switching power supplies, motor controls, inverters, choppers, audio amplifiers, and high energy pulse circuits, and virtu­ally any application where high reliability is required.
ΩΩ
HEXFET
ΩΩ
Product Summary
Part Number BVDSS RDS(on) ID
JANTX2N6788
JANTXV2N6788
Features:
Avalanche Energy Rating
Dynamic dv/dt Rating
Simple Drive Requirements
Hermetically Sealed
Absolute Maximum Ratings
Parameter JANTX2N6788, JANTXV2N6788 Units
ID @ VGS = 10V, TC = 25°C Continuous Drain Current 6.0
ID @ VGS = 10V , TC = 100°C Continuous Drain Current 3.5
I
DM
PD @ TC = 25°C Max. Power Dissipation 20 W
V
GS
dv/dt Peak Diode Recovery dv/dt 5.5
T
J
T
STG
Pulsed Drain Current 24
Linear Derating Factor 0.16 W/K Gate-to-Source Voltage ±2 0 V
Operating Junction -55 to 150 Storage T emperature Range
Lead Temperature 300
Weight 0.98 (typical) g
(0.063 in. (1.6mm) from
case for 10.5 seconds)
0.30100V
6.0A
A
V/ns
o
C
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JANTX2N6788, JANTXV2N6788 Device
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Electrical Characteristics @ Tj = 25°C (Unless Otherwise Specified)
Parameter Min. Typ. Max. Units Test Conditions
BV
DSS
BV R
DS(on)
V
GS(th)
g
fs
I
DSS
I
GSS
I
GSS
Q
g
Q
gs
Q
gd
t
d(on)
t
r
t
d(off)
t
f
L
D
L
S
C
iss
C
oss
C
rss
DSS
Drain-to-Source Breakdown Voltage 100 V VGS = 0V, ID = 1.0 mA
/TJTemperature Coefficient of Breakdown 0.10 V/°C Reference to 25°C, ID = 1.0 mA
Voltage Static Drain-to-Source 0.30 VGS = 10V, ID = 3.5A On-State Resistance 0.345 VGS = 10V, ID = 6.0A Gate Threshold Voltage 2.0 4.0 V VDS = VGS, ID = 250µA Forward Transconductance 1.5 S ( )VDS > 15V, IDS = 3.5A Zero Gate Voltage Drain Current 25 VDS = 0.8 x Max Rating,VGS = 0V
250 VDS = 0.8 x Max Rating
Gate-to-Source Leakage Forward 100 VGS = 20V Gate-to-Source Leakage Reverse -100 VGS = -20V Total Gate Charge 7.7 17 VGS = 10V, ID = 6.0A Gate-to-Source Charge 0.7 4.0 VDS = Max. Rating x 0.5 Gate-to-Drain (“Miller”) Charge 2.0 7.7 see figures 6 and 13 Turn-On Delay T ime 40 VDD = 50V , ID = 6.0A, Rise Time 70 RG = 7.5, VGS = 10V Turn-Off Delay Time 40 Fall Time 70 see figure 10 Internal Drain Inductance 5.0
Internal Source Inductance 15
Input Capacitance 350 VGS = 0V, VDS = 25V Output Capacitance 150 f = 1.0 MHz Reverse Transfer Capacitance 24 see figure 5
µA
nA
nC
ns
Measured from the drain lead, 6mm (0.25 in.) from package to center of die.
nH
Measured from the source lead, 6mm (0.25 in.) from package to source bonding pad.
pF
VGS = 0V, TJ = 125°C
Modified MOSFET symbol showing the internal inductances.
Source-Drain Diode Ratings and Characteristics
Parameter Min. Typ. Max. Units Test Conditions
I
Continuous Source Current (Body Diode) 6.0 Modified MOSFET symbol showing the
S
I
Pulse Source Current (Body Diode) ——24 integral reverse p-n junction rectifier.
SM
V
Diode Forward Voltage 1.8 V Tj = 25°C, IS = 6.0A, VGS = 0V
SD
t
Reverse Recovery Time 240 ns Tj = 25°C, IF = 6.0A, di/dt 100A/µs
rr
Q
Reverse Recovery Charge 2.0 µCV
RR
t
Forward Turn-On Time
on
Intrinsic turn-on time is negligible. T urn-on speed is substantially controlled by LS + LD.
Thermal Resistance
Parameter Min. Typ. Max. Units Test Conditions
R R
thJC thJA
Junction-to-Case — 6.25 Junction-to-Ambient 175 K/W Typical socket mount
A
50V
DD
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Fig. 1 — Typical Output Characteristics
Fig. 3 — Typical Transfer Characteristics
T
C
= 25°C
Fig. 2 — Typical Output Characteristics
TC = 150°C
Fig. 4 — Normalized On-Resistance Vs.Temperature
Fig. 5 — Typical Capacitance Vs. Drain-to-Source
Voltage
Fig. 6 — Typical Gate Charge Vs. Gate-to-Source
Voltage
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Fig. 7 — Typical Source-to-Drain Diode Forward
Voltage
Fig. 9 — Maximum Drain Current Vs. Case Temperature
Fig. 8 — Maximum Safe Operating Area
Fig. 10a — Switching Time Test Circuit
Fig. 10b — Switching Time Waveforms
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Fig. 11 — Maximum Effective Transient Thermal Impedance, Junction-to-Case Vs. Pulse Duration
Fig. 12a — Unclamped Inductive Test Circuit
Fig. 13a — Gate Charge Test Circuit
Fig. 12b — Unclamped Inductive Waveforms
Fig. 13b — Basic Gate Charge Waveform
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Repetitive Rating; Pulse width limited by
maximum junction temperature. (see figure 11)
@ V
= 25V, Starting TJ = 25°C,
DD
EAS = [0.5 * L * (I Peak IL = 6.0A, VGS = 10V, 25 RG 200
2
) * [BV
L
DSS
/(BV
DSS-VDD
)]
I
6.0A, di/dt 110A/µs,
SD
VDD ≤ BV
Pulse width 300 µs; Duty Cycle 2%
, TJ 150°C
DSS
K/W = °C/W
W/K = W/°C
Case Outline and Dimensions — TO-205AF (Modified TO-39)
All dimensions are shown millimeters (inches)
IR FAR EAST: K&H Bldg., 2F, 3-30-4 Nishi-Ikeburo 3-Chome, Toshima-Ki, Tokyo Japan 171 Tel: 81 3 3983 0086
IR SOUTHEAST ASIA: 315 Outram Road, #10-02 Tan Boon Liat Building, Singapore 0316 Tel: 65 221 8371
WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, Tel: (310) 322 3331
EUROPEAN HEADQUARTERS: Hurst Green, Oxted, Surrey RH8 9BB, UK Tel: ++ 44 1883 732020
IR CANADA: 7321 Victoria Park Ave., Suite 201, Markham, Ontario L3R 2Z8, Tel: (905) 475 1897
http://www.irf.com/ Data and specifications subject to change without notice. 10/96
IR GERMANY: Saalburgstrasse 157, 61350 Bad Homburg Tel: ++ 49 6172 96590
IR ITALY: Via Liguria 49, 10071 Borgaro, Torino Tel: ++ 39 11 451 0111
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