CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTES:
1. TJ = 25oC to 125oC.
2. 50oC/W measured using FR-4 board with 0.14 in2 (90.3 mm2) copper pad at 1 second.
3. 228oC/W measured using FR-4 board with 0.006 in2 (3.9 mm2) copper pad at 1000 second.
FIGURE 3. NORMALIZED MAXIMUM TRANSIENT THERMAL IMPEDANCE
R
= 228oC/W
θJA
VGS = -2.5V
-3
10
-2
10
-1
10
t, PULSE WIDTH (s)
0
10
1
10
P
DM
t
1
t
2
1/t2
x R
θJA
+ T
θJA
A
2
10
TC = 25oC
FOR TEMPERATURES
ABOVE 25oC DERATE PEAK
CURRENT AS FOLLOWS:
150 - T
I = I
25
A
125
2
10
3
10
3
10
FIGURE 4. PEAK CURRENT CAPABILITY
3
Page 4
Typical Performance Curves (Continued)
ITF87072DK8T
-200
-100
-10
, DRAIN CURRENT (A)
OPERATION IN THIS
D
I
AREA MAY BE
LIMITED BY r
-1
-1-10
DS(ON)
, DRAIN TO SOURCE VOLTAGE (V)
V
DS
SINGLE PULSE
TJ = MAX RATED
T
= 25oC
A
R
= 228oC/W
θJA
100µs
1ms
10ms
-50
-25
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
= 15V
V
DD
-20
-15
-10
DRAIN CURRENT (A)
D,
I
-5
TJ = 25oC
-0
-1.0-1.5-2.0-2.5-3.0
TJ = 150oC
TJ = -55oC
VGS, GATE TO SOURCE VOLTAGE (V)
FIGURE 5. FORWARD BIAS SAFE OPERATING AREAFIGURE 6. TRANSFER CHARACTERISTICS
-25
TA = 25oC
-20
VGS = -4.5V
-15
-10
, DRAIN CURRENT (A)
D
I
-5
0
0-0.5-1.0-1.5-2.0
VDS, DRAIN TO SOURCE VOLTAGE (V)
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
VGS = -3V
V
GS
VGS = -2V
VGS = -1.5V
= -2.5V
80
ID = -1.5A
60
ID = -6A
, DRAIN TO SOURCE
40
ON RESISTANCE (mΩ)
DS(ON)
r
20
-1-2-3-4-5
, GATE TO SOURCE VOLTAGE (V)
V
GS
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
FIGURE 7. SATURATION CHARACTERISTICSFIGURE 8. DRAIN TO SOURCE ON RESISTANCE vs GATE
VOLTAGE AND DRAIN CURRENT
1.6
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
1.4
1.2
VGS = -4.5V, ID = -6A
1.0
ON RESISTANCE
0.8
NORMALIZED DRAIN TO SOURCE
0.6
-80-4004080120160
TJ, JUNCTION TEMPERATURE (oC)
FIGURE 9. NORMALIZED DRAIN TO SOURCE ON
RESISTANCE vs JUNCTION TEMPERATURE
1.4
1.2
1.0
0.8
NORMALIZED GATE
THRESHOLD VOLTAGE
0.6
0.4
-80-4004080120160
TJ, JUNCTION TEMPERATURE (oC)
VGS = VDS, ID = -250µA
FIGURE 10. NORMALIZED GATE THRESHOLD VOLTAGE vs
JUNCTION TEMPERATURE
4
Page 5
Typical Performance Curves (Continued)
ITF87072DK8T
1.2
ID = -250µA
1.1
1.0
BREAKDOWN VOLTAGE
NORMALIZED DRAIN TO SOURCE
0.9
-80-4004080120160
T
, JUNCTION TEMPERATURE (oC)
J
FIGURE 11. NORMALIZED DRAIN TO SOURCE BREAKDOWN
VOLTAGE vs JUNCTION TEMPERATURE
-5
VDD = -10V
-4
-3
2000
1000
C
= C
RSS
GD
C, CAPACITANCE (pF)
VGS= 0V, f = 1MHz
100
-0.1-1-10
VDS, DRAIN TO SOURCE VOLTAGE (V)
C
OSS
C
ISS
≅ CDS+ C
= CGS + C
GD
GD
-20
FIGURE 12. CAPACITANCE vs DRAIN TO SOURCE VOLTAGE
200
VGS = -2.5V, VDD = -10V, ID = -1.5A
t
r
150
-2
-1
, GATE TO SOURCE VOLTAGE (V)
GS
V
0
03691215
, GATE CHARGE (nC)
Q
g
WAVEFORMS IN
DESCENDING ORDER:
ID = -6A
I
= -1.5A
D
NOTE: Refer to Intersil Application Notes AN7254 and AN7260.
FIGURE 13. GATECHARGE WAVEFORMS FOR CONSTANT
GATE CURRENT
200
VGS = -4.5V, VDD = -10V, ID = -6A
150
100
50
SWITCHING TIME (ns)
100
50
SWITCHING TIME (ns)
0
0 1020304050
RGS, GATE TO SOURCE RESISTANCE (Ω)
t
f
t
d(OFF)
t
d(ON)
FIGURE 14. SWITCHING TIME vs GATE RESISTANCE
t
d(OFF)
t
f
t
r
t
d(ON)
0
0 1020304050
RGS, GATE TO SOURCE RESISTANCE (Ω)
FIGURE 15. SWITCHING TIME vs GATE RESISTANCE
5
Page 6
Test Circuits and Waveforms
ITF87072DK8T
Q
V
DS
R
L
0
gs
Q
g(TH)
Q
gd
VGS= -0.5V
VGS= -2V
g(TOT)
I
g(REF)
V
GS
V
DD
+
DUT
-V
GS
Q
g(-2)
V
DD
Q
0
I
g(REF)
FIGURE 16. GATE CHARGE TEST CIRCUITFIGURE 17. GATE CHARGE WAVEFORMS
t
ON
t
R
L
V
DS
V
GS
-
+
0
d(ON)
t
r
10%
V
t
d(OFF)
DS
t
OFF
VGS= -4.5V
t
f
10%
0V
DS
R
GS
-V
GS
DUT
0
V
GS
90%
10%
50%
PULSE WIDTH
V
FIGURE 18. SWITCHING TIME TEST CIRCUITFIGURE 19. SWITCHING TIME WAVEFORM
90%
50%
90%
6
Page 7
ITF87072DK8T
Thermal Resistance vs Mounting Pad Area
Themaximum rated junction temperature, TJM, and the
thermal resistance of the heat dissipating path determines
the maximum allowabledevice powerdissipation, P
application.Therefore the application’sambient temperature,
T
(oC), and thermal resistance R
A
reviewed to ensure that T
JM
is never exceeded. Equation 1
(oC/W) must be
θJA
mathematically represents the relationship and serves as
the basis for establishing the rating of the part.
TJMTA–()
------------------------------ -=
P
DM
R
θJA
In using surface mount devices such as the SO8 package,
the environment in which it is applied will have a significant
influence on the part’s current and maximum power
dissipation ratings. Precise determination of P
DM
and influenced by many factors:
1. Mounting pad area onto whichthe deviceis attached and
whether there is copper on one side or both sides of the
board.
2. The number of copper layers and the thickness of the
board.
3. The use of external heat sinks.
4. The use of thermal vias.
5. Air flow and board orientation.
6. For non steady state applications, the pulse width, the
duty cycle and the transient thermal response of thepart,
the board and the environment they are in.
Intersil provides thermal information to assist the designer’s
preliminary application evaluation. Figure 20 defines the
for the device as a function of the top copper
R
θJA
(component side) area. This is for a horizontally positioned
FR-4 board with 1oz copper after 1000 seconds of steady
state power with no air flow. This graph provides the
necessary information for calculation of the steady state
junction temperature or power dissipation. Pulse
applications can be evaluated using the Intersil device Spice
thermal model or manually utilizing the normalized maximum
transient thermal impedance curve.
Displayed on the curve are R
values listed in the
θJA
Electrical Specifications table. The points were chosen to
depict the compromise between the copper board area, the
thermal resistance and ultimately the power dissipation,
P
.
DM
Thermal resistances corresponding to other copper areas
can be obtained from Figure 20 or by calculation using
Equation 2. R
is defined as the natural log of the area
θJA
times a coefficient added to a constant. The area, in square
inches is the top copper area including the gate and source
pads.
R
103.2 24.3Area()
θJA
ln×–=
,inan
DM
(EQ. 1)
is complex
(EQ. 2)
300
250
200
C/W)
o
(
θJA
150
, R
θβ
100
R
50
FIGURE 20. THERMAL RESISTANCE vs MOUNTING PAD
R
= 103.2 - 24.3 *ln(AREA)
θJA
228oC/W - 0.006in
R
= 46.4 - 21.7 *ln(AREA)
θβ
0
0.0010.010.11
AREA, TOP COPPER AREA (in2) PER DIE
AREA
2
191oC/W - 0.027in
2
While Equation 2 describes the thermal resistance of a
single die, several devices are offered with two die in the
SO8 package. The dual die SO8 package introduces an
additional thermal component, thermal coupling resistance,
R
. Equation 3 describes Rθβ as a function of the top
θβ
copper mounting pad area.
R
θβ
46.4 21.7Area()ln×–=
(EQ. 3)
The thermal coupling resistance vs copper area is also
graphically depicted in Figure 20. It is important to note the
thermal resistance (R
(
R
) are equivalent for both die. For example at 0.1 square
θβ
) and thermal coupling resistance
θJA
inches of copper:
R
= R
θJA1
R
= R
θβ1
and TJ2 define the junction temperature of the
T
J1
respective die. Similarly, P
= 159oC/W
θJA2
= 97oC/W
θβ2
and P2 define the power
1
dissipated in each die. The steady state junction
temperature can be calculated using Equation 4 for die 1
and Equation 5 for die 2.
Example: To calculate the junction temperature of each die
when die 2 is dissipating 0.5 Watts and die 1 is dissipating 0
Watts.The ambient temperature is 70
o
C and the package is
mounted to a top copper area of 0.1 square inches per die.
Use Equation 4 to calculate T
T
varied top copper board area. Figure 21 shows the effect of
copper pad area on single pulse transient thermal
impedance. Each trace represents a copper pad area in
square inches corresponding to the descending list in the
graph. Spice and SABER thermal models are provided for
each of the listed pad areas.
160
COPPER BOARD AREA - DESCENDING ORDER
2
0.020 in
2
0.140 in
2
0.257 in
120
C/W)
o
80
, THERMAL
JA
θ
Z
IMPEDANCE (
40
0
10
0.380 in
0.493 in
-1
2
2
0
10
t, RECTANGULAR PULSE DURATION (s)
FIGURE 21. THERMAL RESISTANCE vs MOUNTING PAD AREA
Copper pad area has no perceivable eff ect on tr ansient
thermal impedance for pulse widths less than 100ms. For
pulse widths less than 100ms the transient thermal
impedance is determined by the die and package. Therefore ,
CTHERM1 through CTHERM5 and RTHERM1 through
RTHERM5 remain constant for each of the thermal models. A
listing of the model component values is available in Table 1.
NOTE: For further discussion of the PSPICE model, consult A New PSPICE Sub-Circuit for the Power MOSFET Featuring Global
Temperature Options; IEEE Power Electronics Specialist Conference Records, 1991, written by William J. Hepp and C. Frank Wheatley.
1. All dimensions are within allowable dimensions of Rev. C of
JEDEC MS-012AA outline dated 5-90.
2. Dimension “D” does not include mold flash, protrusions or gate
burrs. Mold flash, protrusions or gate burrs shall not exceed
0o-8
0.004 IN
0.10 mm
o
0.006 inches (0.15mm) per side.
3. Dimension “E1” does not include inter-lead flash or protrusions.
Inter-lead flash and protrusions shall not exceed 0.010 inches
(0.25mm) per side.
0.050
1.27
4. “L” is the length of terminal for soldering.
5. The chamfer on the body is optional. If it is not present, a visual index
feature must be located within the crosshatched area.
0.024
0.6
1.5mm
DIA. HOLE
6. Controlling dimension: Millimeter.
7. Revision 8 dated 5-99.
4.0mm
USER DIRECTION OF FEED
2.0mm
1.75mm
MS-012AA
12mm TAPE AND REEL
12
12mm
COVER TAPE
GENERAL INFORMATION
1. 2500 PIECES PER REEL.
2. ORDER IN MULTIPLES OF FULL REELS ONLY.
3. MEETS EIA-481 REVISION “A” SPECIFICATIONS.
8.0mm
40mm MIN.
ACCESS HOLE
330mm
C
L
18.4mm
13mm
12.4mm
50mm
Page 13
ITF87072DK8T
All Intersil semiconductor products are manufactured, assembled and tested under ISO9000 quality systems certification.
Intersil semiconductor products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and
reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result
from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see web site www.intersil.com
Sales Office Headquarters
NORTH AMERICA
Intersil Corporation
P. O. Box 883, Mail Stop 53-204
Melbourne, FL 32902
TEL: (321) 724-7000
FAX: (321) 724-7240
13
EUROPE
Intersil SA
Mercure Center
100, Rue de la Fusee
1130 Brussels, Belgium
TEL: (32) 2.724.2111
FAX: (32) 2.724.22.05
ASIA
Intersil (Taiwan) Ltd.
7F-6, No. 101 Fu Hsing North Road
Taipei, Taiwan
Republic of China
TEL: (886) 2 2716 9310
FAX: (886) 2 2715 3029
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