2. 62.5oC/W measured using FR-4 board with 1.00 in2 (645.2 mm2) copper pad at 10 second.
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
DRAIN(5)
= 25oC, Unless Otherwise Specified
A
DSS
DGR
GS
DM
STG
pkg
ITF86116SQTUNITS
30V
30V
±20V
D
D
D
D
L
10.0
9.0
5.0
Figure 4
2
16
-55 to 150
300
260
A
A
A
A
W
mW/oC
o
C
o
C
o
C
1
CAUTION: These devices are sensitive to electrostatic discharge. Follow proper ESD Handling Procedures.
PSPICE® is a registered trademark of MicroSim Corporation.
Total Gate ChargeQ
Gate Charge at 5VQ
Threshold Gate ChargeQ
Gate to Source Gate ChargeQ
Gate to Drain “Miller” ChargeQ
CAPACITANCE SPECIFICATIONS
Input CapacitanceC
Output CapacitanceC
Reverse Transfer CapacitanceC
DSSID
DSS
GSS
GS(TH)VGS
DS(ON)ID
VDS = 30V, VGS = 0V--10µA
VGS = ±20V--±10µA
ID = 5.0A, VGS = 4.5V (Figure 8)-0.0110.016Ω
R
θJA
Pad Area = 1.00 in2(645.2 mm2) (Note 2)--62.5oC/W
Pad Area = 0.035 in2 (22.4 mm2) (Figure 20)--165.4oC/W
Pad Area = 0.0045 in2 (2.88 mm2) (Figure 20)--206.8oC/W
FIGURE 3. NORMALIZED MAXIMUM TRANSIENT THERMAL IMPEDANCE
R
= 62.5oC/W
θJA
-3
10
-2
10
-1
10
0
10
10
t, PULSE WIDTH (s)
FIGURE 4. PEAK CURRENT CAPABILITY
3
TA = 25oC
FOR TEMPERATURES
ABOVE 25
o
C DERATE PEAK
CURRENT AS FOLLOWS:
I = I
1
150 - T
25
125
2
10
A
3
10
Page 4
Typical Performance Curves (Continued)
ITF86116SQT
500
100
10
, DRAIN CURRENT (A)
OPERATION IN THIS
D
I
AREA MAY BE
LIMITED BY r
1
1
V
DS
DS(ON)
10100
, DRAIN TO SOURCE VOLTAGE (V)
R
= 62.5oC/W
θJA
SINGLE PULSE
TJ = MAX RATED
T
= 25oC
A
100µs
1ms
10ms
FIGURE 5. FORWARD BIAS SAFE OPERATING AREA
40
VGS = 10V
VGS = 5V
30
20
, DRAIN CURRENT (A)
10
D
I
TA = 25oC
0
00.20.40.61.0
VDS, DRAIN TO SOURCE VOLTAGE (V)
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
VGS = 4V
VGS = 4.5V
VGS = 3.5V
VGS = 3V
0.8
40
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
= 15V
V
DD
30
TJ = 150oC
20
TJ = 25oC
DRAIN CURRENT (A)
10
D,
I
0
2.02.53.03.54.0
VGS, GATE TO SOURCE VOLTAGE (V)
TJ = -55oC
FIGURE 6. TRANSFER CHARACTERISTICS
25
20
ID = 1A
15
, DRAIN TO SOURCE
ON RESISTANCE (mΩ)
10
DS(ON)
r
5
246810
ID = 10A
, GATE TO SOURCE VOLTAGE (V)
V
GS
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
FIGURE 7. SATURATION CHARACTERISTICSFIGURE 8. DRAIN TO SOURCE ON RESISTANCE vs GATE
VOLTAGE AND DRAIN CURRENT
1.6
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
1.4
1.2
1.0
ON RESISTANCE
0.8
NORMALIZED DRAIN TO SOURCE
0.6
-80-4004080120160
TJ, JUNCTION TEMPERATURE (oC)
VGS = 10V, ID = 10A
FIGURE 9. NORMALIZED DRAIN TO SOURCE ON
RESISTANCE vs JUNCTION TEMPERATURE
1.2
1.0
0.8
NORMALIZED GATE
0.6
THRESHOLD VOLTAGE
0.4
-80-4004080120160
TJ, JUNCTION TEMPERATURE (oC)
VGS = VDS, ID = 250µA
FIGURE 10. NORMALIZED GATE THRESHOLD VOLTAGE vs
JUNCTION TEMPERATURE
4
Page 5
Typical Performance Curves (Continued)
1.10
ID = 250µA
1.05
1.00
ITF86116SQT
3000
1000
C
OSS
≅ CDS+ C
GD
C
ISS
= CGS + C
GD
0.95
BREAKDOWN VOLTAGE
NORMALIZED DRAIN TO SOURCE
0.90
-80-4004080120160
T
, JUNCTION TEMPERATURE (oC)
J
FIGURE 11. NORMALIZED DRAIN TO SOURCE BREAKDOWN
VOLTAGE vs JUNCTION TEMPERATURE
10
VDD = 15V
8
6
4
WAVEFORMS IN
2
, GATE TO SOURCE VOLTAGE (V)
GS
V
0
0203040
10
, GATE CHARGE (nC)
Q
g
DESCENDING ORDER:
ID = 9A
= 1A
I
D
NOTE: Refer to Intersil Application Notes AN7254 and AN7260.
FIGURE 13. GATECHARGE WAVEFORMS FOR CONSTANT
GATE CURRENT
C, CAPACITANCE (pF)
C
= C
RSS
VGS= 0V, f = 1MHz
100
0.11.01030
VDS, DRAIN TO SOURCE VOLTAGE (V)
GD
FIGURE 12. CAPACITANCE vs DRAIN TO SOURCE VOLTAGE
250
VGS = 4.5V, VDD = 15V, ID = 5.0A
200
t
r
150
100
SWITCHING TIME (ns)
50
0
0 1020304050
RGS, GATE TO SOURCE RESISTANCE (Ω)
t
d(ON)
t
f
t
d(OFF)
FIGURE 14. SWITCHING TIME vs GATE RESISTANCE
250
200
150
100
SWITCHING TIME (ns)
FIGURE 15. SWITCHING TIME vs GATE RESISTANCE
5
VGS = 10V, VDD = 15V, ID = 10A
t
d(OFF)
t
f
t
r
50
t
0
0 1020304050
RGS, GATE TO SOURCE RESISTANCE (Ω)
d(ON)
Page 6
Test Circuits and Waveforms
V
DS
V
GS
I
g(REF)
FIGURE 16. GATE CHARGE TEST CIRCUITFIGURE 17. GATE CHARGE WAVEFORMS
DUT
ITF86116SQT
R
L
+
V
DD
-
V
DD
VGS= 1V
0
I
g(REF)
0
Q
g(TOT)
V
DS
Q
g(5)
V
GS
Q
g(TH)
Q
gs
Q
gd
VGS = 5V
VGS= 10V
R
L
V
DS
+
-
0V
V
GS
V
GS
R
GS
DUT
FIGURE 18. SWITCHING TIME TEST CIRCUITFIGURE 19. SWITCHING TIME WAVEFORM
Thermal Resistance vs Mounting Pad Area
The maximum rated junction temperature, TJM, and the
thermal resistance of the heat dissipating path determines the
maximum allowable de vice po w er dissipation, P
application. Therefore the application’ s ambient temperature ,
T
(oC), and thermal resistance R
A
to ensure that T
is never e xceeded. Equation 1
JM
(oC/W) must be reviewed
θJA
mathematically represents the relationship and serves as the
basis for establishing the rating of the part.
P
TJMTA–()
------------------------------ -=
DM
Z
θJA
In using surface mount devices such as the TSSOP-8
package, the environment in which it is applied will have a
significant influence on the part’s current and maximum
power dissipation ratings. Precise determination of P
complex and influenced by many factors:
DM
, in an
(EQ. 1)
DM
is
t
ON
t
d(ON)
t
V
DS
0
V
GS
10%
0
r
90%
10%
50%
PULSE WIDTH
t
d(OFF)
90%
t
OFF
50%
t
f
90%
10%
1. Mounting pad area onto which the device is attached and
whether there is copper on one side or both sides of the
board.
2. Thenumber of copperlayersand the thicknessof the board.
3. The use of external heat sinks.
4. The use of thermal vias.
5. Air flow and board orientation.
6. For non steady state applications, the pulse width, the
duty cycle and the transient thermal response of thepart,
the board and the environment they are in.
Intersil provides thermal information to assist the designer’s
preliminary application evaluation. Figure 20 defines the
for the device as a function of the top copper
R
θJA
(component side) area. This is for a horizontally positioned
FR-4 board with 1oz copper after 1000 seconds of steady
state power with no air flow. This graph provides the
6
Page 7
ITF86116SQT
necessary information for calculation of the steady state
junction temperature or power dissipation. Pulse
applications can be evaluated using the Intersil device Spice
thermal model or manually utilizing the normalized maximum
transient thermal impedance curve.
Displayed on the curve are R
values listed in the Electrical
θJA
Specifications table. The points were chosen to depict the
compromise between the copper board area, the thermal
resistance and ultimately the power dissipation, P
DM
.
Thermal resistances corresponding to other copper areas can
be obtained from Figure 20 or by calculation using Equation 2.
R
is defined as the natural log of the area times a coefficient
θJA
added to a constant. The area, in square inches is the top
copper area including the gate and source pads.
R
The transient thermal impedance (Z
97.5 20.2Area()
θJA
ln–=
) is also effected by
θJA
(EQ. 2)
varied top copper board area. Figure 21 shows the effect of
copper pad area on single pulse transient thermal
impedance. Each trace represents a copper pad area in
square inches corresponding to the descending list in the
graph. Spice and SABER thermal models are provided for
each of the listed pad areas.
Copper pad area has no perceivable eff ect on tr ansient
thermal impedance for pulse widths less than 100ms. For
pulse widths less than 100ms the transient thermal
impedance is determined by the die and package. Therefore ,
CTHERM1 through CTHERM5 and RTHERM1 through
RTHERM5 remain constant for each of the thermal models. A
listing of the model component values is available in Table 1.
240
C/W)
o
(
θJA
R
220
200
180
160
140
120
100
80
0.001
206.8oC/W - 0.0045in
0.011.0
AREA, TOP COPPER AREA (in2)
FIGURE 20. THERMAL RESISTANCE vs MOUNTING PAD AREA
NOTE: For further discussion of the PSPICE model, consult A New PSPICE Sub-Circuit for the Power MOSFET Featuring Global
Temperature Options; IEEE Power Electronics Specialist Conference Records, 1991, written by William J. Hepp and C. Frank Wheatley.
1. These dimensions are within allowable dimensions of Rev. E of
JEDEC MO-153AA outline dated 10-97.
2. Dimension “D” does not include mold flash, protrusions or gate
burrs. Mold flash, protrusions or gate burrs shall not exceed
0.006 inches (0.15mm) per side.
0.232
5.9
0.025
0.65
0.077
1.95
3. Dimension “E1” does not include inter-lead flash or protrusions.
Interlead flash and protrusions shall not exceed 0.010 inches
(0.25mm) per side.
4. “L” is the length of terminal for soldering.
5. Controlling dimension: Millimeter
6. Revision 2 dated: 1-00.
MO-153AA (TSSOP-8)
12mm TAPE AND REEL
330mm
20.4mm
13mm
53.5mm
13.4mm
COVER TAPE
1.5mm
DIA. HOLE
12mm
4.0mm
8.0mm
USER DIRECTION OF FEED
GENERAL INFORMATION
1. 3000 PIECES PER REEL.
2. ORDER IN MULTIPLES OF FULL REELS ONLY.
3. MEETS EIA-481 REVISION "A" SPECIFICATIONS.
2.0mm
1.75mm
C
L
11
Page 12
ITF86116SQTITF86116SQT
All Intersil semiconductor products are manufactured, assembled and tested under ISO9000 quality systems certification.
Intersil semiconductor products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and
reliable. However,no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result
from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see web site www.intersil.com
Sales Office Headquarters
NORTH AMERICA
Intersil Corporation
P. O. Box 883, Mail Stop 53-204
Melbourne, FL 32902
TEL: (321) 724-7000
FAX: (321) 724-7240
12
EUROPE
Intersil SA
Mercure Center
100, Rue de la Fusee
1130 Brussels, Belgium
TEL: (32) 2.724.2111
FAX: (32) 2.724.22.05
ASIA
Intersil (Taiwan) Ltd.
7F-6, No. 101 Fu Hsing North Road
Taipei, Taiwan
Republic of China
TEL: (886) 2 2716 9310
FAX: (886) 2 2715 3029
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