• HIGH-DENSITY PROGRAMMABLE LOGIC
— 256 I/O Pins
— 12000 PLD Gates
— 512 Registers
— High Speed Global Interconnect
— Wide Input Gating for Fast Counters, State
Machines, Address Decoders, etc.
— Small Logic Block Size for Random Logic
2
• HIGH PERFORMANCE E
—
fmax = 100 MHz Maximum Operating Frequency
tpd = 10 ns Propagation Delay
—
— TTL Compatible Inputs and Outputs
— Electrically Erasable and Reprogrammable
— Non-Volatile
— 100% Tested at Time of Manufacture
— Unused Product Term Shutdown Saves Power
• IN-SYSTEM PROGRAMMABLE
— 5V In-System Programmable (ISP™) using Lattice
ISP or Boundary Scan Test (IEEE 1149.1) Protocol
— Increased Manufacturing Yields, Reduced Time-to-
Market, and Improved Product Quality
— Reprogram Soldered Devices for Faster Debugging
• 100% IEEE 1149.1 BOUNDARY SCAN COMPATIBLE
• OFFERS THE EASE OF USE AND FAST SYSTEM
SPEED OF PLDs WITH THE DENSITY AND FLEXIBILITY
OF FIELD PROGRAMMABLE GATE ARRAYS
— Complete Programmable Device Can Combine Glue
Logic and Structured Designs
— Five Dedicated Clock Input Pins
— Synchronous and Asynchronous Clocks
— Programmable Output Slew Rate Control to Mini-
mize Switching Noise
— Flexible Pin Placement
— Optimized Global Routing Pool Provides Global
Interconnectivity
• ispDesignEXPERT™ – LOGIC COMPILER AND COMPLETE ISP DEVICE DESIGN SYSTEMS FROM HDL
SYNTHESIS THROUGH IN-SYSTEM PROGRAMMING
— Superior Quality of Results
— Tightly Integrated with Leading CAE Vendor Tools
— Productivity Enhancing Timing Analyzer, Explore
Tools, Timing Simulator and ispANALYZER™
— PC and UNIX Platforms
CMOS® TECHNOLOGY
Functional Block Diagram
ORP
H3 H2 H1 H0
A0
A1
A2
ORP
A3
B0
ORPORP
B1
B2
ORP
B3
C0 C1 C2 C3
ORP
ORP
OR
Array
AND Array
OR
Array
Global Routing Pool
ORP
ORP
G3
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
D0
ORP
ORP
G2 G1 G0
Twin
GLB
D1 D2
ORP
D3
Boundary
Scan
F3
F2
F1
F0
E3
ORPORP
E2
E1
ORPORP
E0
0139A/3256E
Description
The ispLSI 3256E is a High Density Programmable Logic
Device containing 512 Registers, 256 Universal I/O pins,
five Dedicated Clock Input Pins, 16 Output Routing Pools
(ORP) and a Global Routing Pool (GRP) which allows
complete inter-connectivity between all of these elements. The ispLSI 3256E features 5V in-system
programmability and in-system diagnostic capabilities.
The ispLSI 3256E offers non-volatile reprogrammability
of the logic, as well as the interconnect to provide truly
reconfigurable systems.
The basic unit of logic on the ispLSI 3256E device is the
Twin Generic Logic Block (Twin GLB) labelled A0, A1...H3.
There are a total of 32 Twin GLBs in the ispLSI 3256E
device. Each Twin GLB has 24 inputs, a programmable
AND array and two OR/Exclusive-OR Arrays and eight
outputs which can be configured to be either combinatorial or registered. All Twin GLB inputs come from the
GRP.
All local logic block outputs are brought back into the
GRP so they can be connected to the inputs of any other
logic block on the device. The device also has 256 I/O
cells, each of which is directly connected to an I/O pin.
Each I/O cell can be individually programmed to be a
combinatorial input, a registered input, a latched input, an
output or a bidirectional I/O pin with 3-state control. The
signal levels are TTL compatible voltages and the output
drivers can source 4 mA or sink 8 mA. Each output can
be programmed independently for fast or slow output
slew rate to minimize overall output switching noise.
The 256 I/O Cells are grouped into 16 sets of 16 bits.
Pairs of these I/O groups are associated with a logic
Megablock through the use of the ORP. Each Megablock
is able to provide one Product Term Output Enable
(PTOE) signal which is globally distributed to all I/O cells.
That PTOE signal can be generated within any GLB in the
Megablock. Each I/O cell can select either a Global OE
or a PTOE.
Four Twin GLBs, 32 I/O Cells and two ORPs are connected together to make a logic Megablock. The
Megablock is defined by the resources that it shares. The
outputs of the four Twin GLBs are connected to a set of
32 I/O cells by the ORP. The ispLSI 3256E device
contains eight of these Megablocks.
Clocks in the ispLSI 3256E device are provided through
five dedicated clock pins. The five pins provide three
clocks to the Twin GLBs and two clocks to the I/O cells.
The table below lists key attributes of the device along
with the number of resources available.
An additional feature of the ispLSI 3256E is its Boundary
Scan capability, which is composed of cells connected
between the on-chip system logic and the device’s input
and output pins. All I/O pins have associated boundary
scan registers, with 3-state I/O using three boundary
scan registers and inputs using one.
The ispLSI 3256E supports all IEEE 1149.1 mandatory
instructions, which include BYPASS, EXTEST and
SAMPLE.
Key Attributes of the ispLSI 3256E
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The GRP has as its inputs the outputs from all of the Twin
GLBs and all of the inputs from the bidirectional I/O cells.
All of these signals are made available to the inputs of the
Twin GLBs. Delays through the GRP have been equalized to minimize timing skew and logic glitching.
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3
Page 4
Specifications ispLSI 3256E
Absolute Maximum Ratings
1
Supply Voltage Vcc...........................................................................-0.5 to +7.0V
Input Voltage Applied........................................................................-2.5 to VCC +1.0V
Off-State Output Voltage Applied .....................................................-2.5 to VCC +1.0V
Storage Temperature........................................................................-65 to 150°C
Case Temp. with Power Applied ......................................................-55 to 125°C
Max. Junction Temp. (TJ) with Power Applied (304-Pin PQFP) ......150°C
Max. Junction Temp. (TJ) with Power Applied (320-Ball BGA)........140°C
1. Stresses above those listed under the “Absolute Maximum Ratings” may cause permanent damage to the device. Functional
operation of the device at these or at any other conditions above those indicated in the operational sections of this specification
is not implied (while programming, follow the programming specifications).
DC Recommended Operating Condition
T
V
V
V
A
SYMBOL
CC
IL
IH
PARAMETER
Ambient Temperature
Supply Voltage
Input Low Voltage
Input High Voltage
Output Low Voltage
Output High Voltage
Input or I/O Low Leakage Current
Input or I/O High Leakage Current
Bscan/ispEN Input Low Leakage Current
I/O Active Pull-Up Current
Output Short Circuit Current
Operating Power Supply Current
PARAMETER
I = 8 mA
OL
I = -4 mA
OH
0V ≤ V ≤ V (Max.)
3.5V ≤ V ≤ V
0V ≤ V ≤ V
0V ≤ V ≤ V
V = 5V, V = 0.5V
CC OUT
V = 0.0V, V = 3.0V
IL IH
f = 1 MHz
TOGGLE
1. One output at a time for a maximum duration of one second. V = 0.5V was selected to avoid test problems
CONDITIONMIN.TYP.MAX. UNITS
–
IN IL
IN
IN IL
IN CC
IL
2.4
–
–
–
–
–
–
OUT
by tester ground degradation. Characterized but not 100% tested.
2. Measured using sixteen 16-bit counters.
3. Typical values are at V
4. Maximum I
varies widely with specific device configuration and operating frequency. Refer to the Power Consumption
CC
= 5V and TA = 25°C.
CC
section of this datasheet and Thermal Management section of the Lattice Semiconductor Data Book or CD-ROM to estimate
maximum I
Note: Calculations are based upon timing specifications for the ispLSI 3256E-100L.
0902/3256E
9
Page 10
Power Consumption
Specifications ispLSI 3256E
Power consumption in the ispLSI 3256E device depends
on two primary factors: the speed at which the device is
operating and the number of product terms used.
Figure 3. Typical Device Power Consumption vs fmax
600
500
400
(mA)
CC
I
300
200
020406080100
f
max (MHz)
Notes: Configuration of 16 16-bit Counters
Typical Current at 5V, 25° C
Figure 3 shows the relationship between power and
operating speed.
ispLSI 3256E
ICC can be estimated for the ispLSI 3256E using the following equation:
ICC = 60 + (# of PTs * 0.48) + (# of nets * Max. freq * 0.0106) where:
# of PTs = Number of Product Terms used in design
# of nets = Number of Signals used in device
Max. freq = Highest Clock Frequency to the device
The I
GLB loads on average exists. These values are for estimates only. Since the value of I
operating conditions and the program in the device, the actual I
estimate is based on typical conditions (VCC = 5.0V, room temperature) and an assumption of two
CC
should be verified.
CC
is sensitive to
CC
10
Page 11
Specifications ispLSI 3256E
Pin Description
Pin Name Description
I/OInput/Output pins – These are the general purpose I/O pins used by the logic array.
GOE0, GOE1Global Output Enable input pins.
TOETest Output Enable pin – This pin tristates all I/O pins when a logic low is driven.
RESETActive Low (0) Reset pin – Resets all of the GLB and I/O registers in the device.
Y0, Y1, Y2Dedicated Clock inputs. These clock inputs are connected to one of the clock inputs of all the GLBs on
the device.
Y3, Y4Dedicated Clock inputs. These clock inputs are connected to one of the clock inputs of all the I/O cells
on the device.
BSCAN/ispENInput – Dedicated in-system programming enable input pin. When this pin is high, the BSCAN TAP
controller pins TMS, TDI, TDO and TCK are enabled. When this pin is brought low, the ISP State
Machine control pins MODE, SDI, SDO and SCLK are enabled. High-to-low transition of this pin will put
the device in the programming mode and put all I/O pins in the high-Z state.
TDI/SDIInput – This pin performs two functions. It is the Test Data input pin when ispEN is logic high. When
ispEN is logic low, it functions as an input pin to load programming data into the device. SDI is also
used as one of the two control pins for the ISP State Machine.
TCK/SCLKInput – This pin performs two functions. It is the Test Clock input pin when ispEN is logic high. When
ispEN is logic low, it functions as a clock pin for the Serial Shift Register.
TMS/MODEInput – This pin performs two functions. It is the Test Mode Select input pin when ispEN is logic high.
When ispEN is logic low, it functions as a pin to control the operation of the ISP State Machine.
TRST/NC
1
TDO/SDOOutput – This pin performs two functions. When ispEN is logic low, it functions as the pin to read the
GNDGround (GND)
VCCVcc
1
NC
1. NC pins are not to be connected to any active signals, VCC or GND.
Input – Test Reset, active low to reset the Boundary Scan State Machine.
ISP data. When ispEN is high, it functions as Test Data Out.