This devi ce em ploys a new advanced trench MO SFET
technology and features low gate charge while maintaining
low on-resistance.
Optimized for switching ap plications, this device improves
the overa ll effi ci enc y of DC/D C converters and allows
operation to higher switching frequencies.
ISL9N7030BLP3TO-220AB7030BL
ISL9N7030BLS3STTO-263AB (Tape and Reel)7030BL
Absolute Maximum Ratings
SYMBOLPARAMETERISL9N7030BLP3, I SL9N703 0BLS3STUNITS
V
DSS
V
DGR
V
I
DM
P
, T
T
J
T
T
THERMAL SPECIFICATIONS
R
R
R
NOTE:
1. T
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
All Fairchild semiconductor products are manufactured, assembled and tested under ISO9000 and QS9000 quality systems certification.
Drain to Source Voltage (Note 1)30V
Drain to Gate Voltage (RGS = 20kΩ) (Note 1)30V
Gate to Source Voltage±20V
GS
Drain Current
I
D
I
D
I
D
D
STG
L
pkg
θJC
θJA
θJA
= 25oC to 150oC.
J
Continuous (T
Continuous (T
Continuous (T
Pulsed Drain Current
Power Dissipation
Derate Above 25
Operating and Storage Temperature-55 to 175
Maximum Temperature for Soldering
Leads at 0.063in (1.6mm) from Case for 10s
Package Body for 10s, See T e chbrief TB334
Thermal Resistance Junction to Case, TO-220, TO-2631.5
Thermal Resistance Junction to Ambient, TO-220, TO-26362
Thermal Resistance Junction to Ambient, TO-263, 1in2 copper pad area43
Product reliability information can be found at http://www.fairchildsemi.com/products/discrete/reliability/index.html
FIGURE 17. SWITCHING TIME TEST CIRCUITFIGURE 18. SWITCHING TIME WAVEFORM
Thermal Resistance vs. Mounting Pad Area
The maximum rated junction temperature, TJM, and the
thermal resistance of the heat dissipating path determines the
maximum allowable d evice power dissipation, P
application. Therefore the application’s ambient temperature,
T
(oC), and thermal resistance R
A
to ensure that T
is never exceeded. Equation 1
JM
(oC/W) must be review ed
θJA
mathematically represents the relationship and serves as the
basis for establishing the rating of the part.
TJMT
–()
P
DM
A
------------------ ------------ -=
Z
θJA
In using surf ace m oun t devices such as the TO-263
package, the environment in which it is applied will have a
significant influen ce on the part’s current and m axi m um
power dissipation ratings. Precise determination of P
complex an d influenced by many factors:
DM
, in an
DM
(EQ.
is
t
ON
t
d(ON)
t
V
DS
90%
0
V
GS
10%
0
r
10%
50%
PULSE WIDTH
t
d(OFF)
90%
t
OFF
50%
t
f
90%
10%
can be evaluated using the Fairchild device Spice thermal
model or manually utilizing the normalized maximum
transient thermal impeda nc e curve.
Displayed on the curve are R
values listed in the Electrical
θJA
Specifications table. The points were chosen to depict the
compromise between the copper board area, the thermal
resistance and ultimately the power dissipation, P
DM
.
Thermal resistances corresponding to other copper areas can
be obtained from Figure 19 or by calculation using Equation 2.
R
is defined as the natural log of the area times a coefficient
θJA
added to a constant. The area, in square inches is the top
copper area including the gate and source pads.
θJA
26.51
19.84
----------------------------------------+=
0.262 A rea
+()
(EQ. 2
1. Mounting pad area onto which the device is attached and
whether there is copper on one side or both sides of the
board.
80
R
= 26.51+ 19.84/(0.262+Area)
θJA
2. The number of copper layers and the thickness of the board.
3. The use of external heat sinks .
4. The use of thermal vias.
5. Air flow and board orientation.
6. For non steady state applica tions , the pulse width, the
60
C/W)
o
(
θJA
R
40
duty cycle and the transient thermal response of the part,
the board and the environment they are in.
Fairchild provides thermal information to assist the
designer’s preliminary application ev al uati on. Figure 19
defines the R
for the device as a function of the top
θJA
copper (component side) area. This is for a horizontally
positioned FR-4 board with 1oz copper after 1000 s econds
20
0.1
AREA, TOP COPPER AREA (in2)
110
IGURE 19. THERMAL RESISTANCE vs MOUNTING PAD ARE
of steady state power with no air flow. This graph provides
the necessary information for calculation of the steady state
junction temper ature or pow er dissipation. Pu lse application s
NOTE: For further discussion of the PSPICE model, consult A New PSPICE Sub-Circuit for the Power MOSFET Featuring Global Temperature Options; IEEE Power Electronics Special ist Conference Records, 1991, writ ten by William J. Hepp and C. Frank Wheatley.
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is
not intended to be an exhaustive list of all such trademarks.
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER
NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD
DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT
OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT
RIGHTS, NOR THE RIGHTS OF OTHERS.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used herein:
1. Life support devices or systems are devices or
systems which, (a) are intended for surgical implant into
the body, or (b) support or sustain life, or (c) whose
failure to perform when properly used in accordance
with instructions for use provided in the labeling, can be
reasonably expected to result in significant injury to the
user.
PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet IdentificationProduct StatusDefinition
Advance Information
Preliminary
No Identification Needed
Formative or
In Design
First Production
Full Production
2. A critical component is any component of a life
support device or system whose failure to perform can
be reasonably expected to cause the failure of the life
support device or system, or to affect its safety or
effectiveness.
This datasheet contains the design specifications for
product development. Specifications may change in
any manner without notice.
This datasheet contains preliminary data, and
supplementary data will be published at a later date.
Fairchild Semiconductor reserves the right to make
changes at any time without notice in order to improve
design.
This datasheet contains final specifications. Fairchild
Semiconductor reserves the right to make changes at
any time without notice in order to improve design.
Obsolete
Not In Production
This datasheet contains specifications on a product
that has been discontinued by Fairchild semiconductor.
The datasheet is printed for reference information only.
Rev. H4
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