Dual Advanced Synchronous Rectified
Buck MOSFET Drivers with Pre-POR OVP
The ISL6614B integrates two ISL6613B MOSFET drivers
and is specifically designed to drive two Channel MOSFETs
in a synchronous rectified buck converter topology. This
driver combined with HIP63xx or ISL65xx Multi-Phase Buck
PWM controllers and N-Channel MOSFETs forms complete
core-voltage regulator solutions for advanced
microprocessors.
The ISL6614B features 7V rising threshold and drives both
the upper and lower gates simultaneouslyover a range from
5V to 12V. This drive-voltage provides the flexibility
necessary to optimize applications involving trade-offs
between gate charge and conduction losses. This driver is
optimized for POL DC/DC Converters for IBA Systems.
An advanced adaptive zero shoot-through protection is
integrated to prevent both the upper and lower MOSFETs
from conducting simultaneously and to minimize the dead
time. These products add an overvoltage protection feature
operational before VCC exceeds its turn-on threshold, at
which the PHASE node is connected to the gate of the low
side MOSFET (LGATE). The output voltage of the converter
is then limited by the threshold of the low side MOSFET,
which provides some protection to the microprocessor if the
upper MOSFET(s) is shorted during start-up.
The ISL6614B also features a three-state PWM input which,
working together with Intersil’s multi-phase PWM controllers,
prevents a negative transient on the output voltage when the
output is shut down. This feature eliminates the Schottky
diode that is used in some systems for protecting the load
from reversed output voltage events.
FN9206.3
Features
• Pin-to-pin Compatible with HIP6602 SOIC Family
• Quad N-Channel MOSFET Drives for Two Synchronous
Rectified Bridges
• Low VCC Rising Threshold (7V) for IBA Applications
• Advanced Adaptive Zero Shoot-Through Protection
- Body Diode Detection
- Auto-zero of r
• Adjustable Gate Voltage (5V to 12V) for Optimal Efficiency
• Internal Bootstrap Schottky Diode
• Bootstrap Capacitor Overcharging Prevention
• Supports High Switching Frequency (up to 1MHz)
- 3A Sinking Current Capability
- Fast Rise/Fall Times and Low Propagation Delays
• Three-State PWM Input for Output Stage Shutdown
• Three-State PWM Input Hysteresis for Applications With
Power Sequencing Requirement
• Pre-POR Overvoltage Protection
• VCC Undervoltage Protection
• Expandable Bottom Copper Pad for Enhanced Heat
Sinking
• QFN Package:
- Compliant to JEDEC PUB95 MO-220 QFN - Quad Flat
No Leads - Package Outline
- Near Chip Scale Package Footprint, which Improves
PCB Efficiency and has a Thinner Profile
• Pb-free Available (RoHS compliant)
Conduction Offset Effect
DS(ON)
Applications
• Optimized for POL DC/DC Converters for IBA Systems
• Core Regulators for Intel
• High Current DC/DC Converters
• High Frequency and High Efficiency VRM and VRD
Related Literature
• Technical Brief TB363 “Guidelines for Handling and
Processing Moisture Sensitive Surface Mount Devices
(SMDs)”
• Technical Brief 400 and 417 for Power Train Design,
Layout Guidelines, and Feedback Compensation Design
1
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 1-888-468-3774
| Intersil (and design) is a registered trademark of Intersil Americas Inc.
All other trademarks mentioned are the property of their respective owners.
®
and AMD® Microprocessors
Copyright Intersil Americas Inc. 2006, 2007. All Rights Reserved
Pinouts
www.BDTIC.com/Intersil
ISL6614BCB, ISL6614BCBZ, ISL6614BIB, ISL6614BIBZ
(14 LD SOIC)
TOP VIEW
ISL6614B
ISL6614BCR, ISL6614BCRZ, ISL6614BIR, ISL6614RBIRZ
(16 LD QFN)
TOP VIEW
PWM1
PWM2
GND
LGATE1
PVCC
PGND
LGATE2
1
1
2
2
3
4
5
6
14
13
12
11
10
9
87
VCC
PHASE1
UGATE1
BOOT1
BOOT2
UGATE2
PHASE2
GND
LGATE1
PVCC
PGND
PWM2
PWM1
15
161413
1
2
3
4
GND
6578
NC
LGATE2
VCC
PHASE2
PHASE1
12
11
10
9
NC
UGATE1
BOOT1
BOOT2
UGATE2
Ordering Information
PART NUMBERPART MARKINGTEMP. RANGE (°C)PACKAGEPKG. DWG. #
ISL6614BCB*6614BCB0 to +8514 Ld SOICM14.15
ISL6614BCBZ* (Note)6614BCBZ0 to +8514 Ld SOIC (Pb-free)M14.15
ISL6614BCR*66 14BCR0 to +8516 Ld 4x4 QFNL16.4x4
ISL6614BCRZ* (Note)66 14BCRZ0 to +8516 Ld 4x4 QFN (Pb-free)L16.4x4
ISL6614BIB*6614BIB-40 to +8514 Ld SOICM14.15
ISL6614BIBZ* (Note)6614BIBZ-40 to +8514 Ld SOIC (Pb-free)M14.15
ISL6614BIR*66 14BIR-40 to +8516 Ld 4x4 QFNL16.4x4
ISL6614BIRZ* (Note)66 14BIRZ-40 to +8516 Ld 4x4 QFN (Pb-free)L16.4x4
*Add “-T” suffix for tape and reel. Please refer to TB347 for details on reel specifications.
NOTE: These Intersil Pb-free plastic packaged products employ special Pb-free material sets; molding compounds/die attach materials and 100%
matte tin plate PLUS ANNEAL - e3 termination finish, which is RoHS compliant and compatible with both SnPb and Pb-free soldering operations.
Intersil Pb-free products are MSL classified at Pb-free peak reflow temperatures that meet or exceed the Pb-free requirements of IPC/JEDEC J
STD-020.
2
FN9206.3
May 5, 2008
Block Diagram
www.BDTIC.com/Intersil
ISL6614B
VCC
PWM1
PWM2
GND
+5V
+5V
10k
8k
10k
8k
PVCC
PRE-POR OVP
FEATURES
CONTROL
LOGIC
SHOOT-
THROUGH
PROTECTION
PGND
PVCC
SHOOT-
THROUGH
PROTECTION
PGND
PVCC
BOOT1
UGATE1
PHASE1
LGATE1
PGND
BOOT2
UGATE2
PHASE2
PVCC
LGATE2
CHANNEL 1
CHANNEL 2
PAD
FOR ISL6614BCR, THE PAD ON THE BOTTOM SIDE OF
THE QFN PACKAGE MUST BE SOLDERED TO THE CIRCUIT’S GROUND.
3
FN9206.3
May 5, 2008
ISL6614B
www.BDTIC.com/Intersil
Typical Application - 4 Channel Converter Using ISL65xx and ISL6614B Gate Drivers
CAUTION: Do not operate at or near the maximum ratings listed for extended periods of time. Exposure to such conditions may adversely impact product reliability and
result in failures not covered by warranty.
NOTES:
is measured with the component mounted on a high effective thermal conductivity test board in free air.
1. θ
JA
2. θ
is measured in free air with the component mounted on a high effective thermal conductivity test board with “direct attach” features. See
JA
Tech Brief TB379.
3. For θ
4. Limits should be considered typical and are not production tested.
, the “case temp” location is the center of the exposed metal pad on the package underside.
VCC Rising Threshold0°C to +85°C6.606.97.25V
VCC Rising Threshold-40°C to +85°C5.60-7.25V
VCC Falling Threshold0°C to +85°C5.205.45.90V
VCC Falling Threshold-40°C to +85°C4.20-5.90V
Upper Drive Source Current I
Upper Drive Source ImpedanceR
Upper Drive Sink Current I
Upper Drive DC Sink ImpedanceR
Lower Drive Source Current I
Lower Drive Source ImpedanceR
Lower Drive Sink Current I
Lower Drive Sink ImpedanceR
U_SOURCEVPVCC
L_SOURCEVPVCC
U_SOURCE
U_SINK
U_SINK
L_SOURCE
L_SINK
L_SINK
= 12V, 3nF Load-1.25-A
150mA Source Current1.252.03.0Ω
V
= 12V, 3nF Load-2-A
PVCC
150mA Source Current0.91.653.0Ω
= 12V, 3nF Load-2-A
150mA Source Current0.851.252.2Ω
V
= 12V, 3nF Load-3-A
PVCC
150mA Sink Current0.600.801.35Ω
Functional Pin Description
PACKAGE PIN
NUMBER
115PWM1The PWM signal is the control input for the Channel 1 driver. The PWM signal can enter three distinct states during
216PWM2The PWM signal is the control input for the Channel 2 driver. The PWM signal can enter three distinct states during
31GNDBias and reference ground. All signals are referenced to this node.
42LGATE1 Lower gate drive output of Channel 1. Connect to gate of the low-side power N-Channel MOSFET.
53PVCCThis pin supplies power to both the lower and higher gate drives in ISL6614B. Its operating range is +5V to 12V.
64PGNDIt is the power ground return of both low gate drivers.
-5, 8N/CNo Connection.
76LGATE2 Lower gate drive output of Channel 2. Connect to gate of the low-side power N-Channel MOSFET.
87PHASE2 Connect this pin to the SOURCE of the upper MOSFET and the DRAIN of the lower MOSFET in Channel 2. This
99UGATE2 Upper gate drive output of Channel 2. Connect to gate of high-side power N-Channel MOSFET.
1010BOOT2Floating bootstrap supply pin for the upper gate drive of Channel 2. Connect the bootstrap capacitor between this
1111BOOT1Floating bootstrap supply pin for the upper gate drive of Channel 1. Connect the bootstrap capacitor between this
1212UGATE1 Upper gate drive output of Channel 1. Connect to gate of high-side power N-Channel MOSFET.
1313PHASE1 Connect this pin to the SOURCE of the upper MOSFET and the DRAIN of the lower MOSFET in Channel 1. This
1414VCCConnect this pin to a +12V bias supply. It supplies power to internal analog circuits. Place a high quality low ESR
-17PADConnect this pad to the power ground plane (GND) via thermally enhanced connection.
PIN
SYMBOLFUNCTIONSOICQFN
operation, see “Three-State PWM Input” on page 7 for further details. Connect this pin to the PWM output of the
controller.
operation, see “Three-State PWM Input” on page 7 for further details. Connect this pin to the PWM output of the
controller.
Place a high quality low ESR ceramic capacitor from this pin to GND.
pin provides a return path for the upper gate drive.
pin and the PHASE2 pin. The bootstrap capacitor provides the charge to turn on the upper MOSFET . See “Internal
Bootstrap Device” on page 8 for guidance in choosing the capacitor value.
pin and the PHASE1 pin. The bootstrap capacitor provides the charge to turn on the upper MOSFET . See “Internal
Bootstrap Device” on page 8 for guidance in choosing the capacitor value.
pin provides a return path for the upper gate drive.
ceramic capacitor from this pin to GND.
6
FN9206.3
May 5, 2008
Description
www.BDTIC.com/Intersil
ISL6614B
PWM
t
PDLU
t
FU
t
RL
FIGURE 1. TIMING DIAGRAM
UGATE
LGATE
t
PDLL
t
PDHU
t
RU
t
FL
t
PDHL
Operation
Designed for versatility and speed, the ISL6614B MOSFET
driver controls both high-side and low-side N-Channel FET s of
two half-bridge power trains from two externally provided PWM
signals.
Prior to VCC exceeding its POR level, the Pre-POR
overvoltage protection function is activated during initial startup; the upper gate (UGATE) is held low and the lower gate
(LGATE), controlled by the Pre-POR overvoltage protection
circuits, is connected to the PHASE. Once the VCC voltage
surpasses the VCC Rising Threshold (See the “Electrical
Specifications” table on page5), the PWM signal takes control
of gate transitions. A rising edge on PWM initiates the turn-off of
the lower MOSFET (see “TIMING DIAGRAM” on page 7). After
a short propagation delay [t
Typical fall times [t
] are provided in the “Electrical
FL
Specifications” table on page5. Adaptive shoot-through
circuitry monitors the PHASE voltage and determines the upper
gate delay time [t
]. This prevents both the lower and
PDHU
upper MOSFETs from conducting simultaneously. Once this
delay period is complete, the upper gate drive begins to rise
[t
] and the upper MOSFET turns on.
RU
A falling transition on PWM results in the turn-off of the upper
MOSFET and the turn-on of the lower MOSFET. A short
propagation delay [t
gate begins to fall [t
PDLU
]. Again, the adaptive shoot-through
FU
circuitry determines the lower gate delay time, t
PHASE voltage and the UGATE voltage are monitored, and
the lower gate is allowed to rise after PHASE drops below a
level or the voltage of UGATE to PHASE reaches a level
depending upon the current direction (See the following
section for details). The lower gate then rises [t
the lower MOSFET.
], the lower gate begins to fall.
PDLL
] is encountered before the upper
. The
PDHL
], turning on
RL
1.5V<PWM<3.2V
t
TSSHD
t
PDTS
1.0V<PWM<2.6V
t
TSSHD
Advanced Adaptive Zero Shoot-Through Deadtime
Control (Patent Pending)
These drivers incorporate a unique adaptive deadtime control
technique to minimize deadtime, resulting in high efficiency
from the reduced freewheeling time of the lower MOSFET s’
body-diode conduction, and to prevent the upper and lower
MOSFETs from conducting simultaneously. This is
accomplished by ensuring either rising gate turns on its
MOSFET with minimum and sufficient delay after the other has
turned off.
During turn-off of the lower MOSFET, the PHASE voltage is
monitored until it reaches a -0.2V/+0.8V trip point for a
forward/reverse current, at which time the UGATE is released
to rise. An auto-zero comparator is used to correct the r
drop in the phase voltage preventing from false detection of the
-0.2V phase level during r
DS(ON)
conduction period. In the
case of zero current, the UGAT E is released after 35ns delay of
the LGA TE dropping below 0.5V. During the phase detection,
the disturbance of LGA TE’ s falling transition on the PHASE
node is blanked out to prevent falsely tripping. Once the
PHASE is high, the advanced adaptive shoot-through circuitry
monitors the PHASE and UGA TE volt ages during a PWM
falling edge and the subsequent UGATE turn-off. If either the
UGA TE falls to less than 1.75V above the PHASE or the
PHASE falls to less than +0.8V , the LGATE is released to
turn-on.
Three-State PWM Input
A unique feature of these drivers and other Intersil drivers is
the addition of a shutdown window to the PWM input. If the
PWM signal enters and remains within the shutdown window
for a set holdoff time, the driver outputs are disabled and
both MOSFET gates are pulled and held low. The shutdown
state is removed when the PWM signal moves outside the
shutdown window. Otherwise, the PWM rising and falling
thresholds outlined in the the “Electrical Specifications” table
t
PDTS
DS(ON)
7
FN9206.3
May 5, 2008
ISL6614B
www.BDTIC.com/Intersil
on page5 determine when the lower and upper gates are
enabled.
This feature helps prevent a negative transient on the output
voltage when the output is shut down, eliminating the
Schottky diode that is used in some systems for protecting
the load from reversed output voltage events.
In addition, more than 400mV hysteresis also incorporates
into the three-state shutdown window to eliminate PWM
input oscillations due to the capacitive load seen by the
PWM input through the body diode of the controller’s PWM
output when the power-up and/or power-down sequence of
bias supplies of the driver and PWM controller are required.
Power-On Reset (POR) Function
During initial startup, the VCC voltage rise is monitored.
Once the rising VCC voltage exceeds 6.9V (typically),
operation of the driver is enabled and the PWM input signal
takes control of the gate drives. If VCC drops below the
falling threshold of 5.6V (typically), operation of the driver is
disabled.
Pre-POR Overvoltage Protection
Prior to VCC exceeding its POR level, the upper gate is held
low and the lower gate is controlled by the overvoltage
protection circuits during initial startup. The PHASE is
connected to the gate of the low side MOSFET (LGATE),
which provides some protection to the microprocessor if the
upper MOSFET(s) is shorted during initial start-up. For
complete protection, the low side MOSFET should have a
gate threshold well below the maximum voltage rating of the
load/microprocessor.
where Q
at V
control MOSFETs per channel. The ΔV
is the amount of gate charge per upper MOSFET
G1
gate-source voltage and NQ1 is the number of
GS1
BOOT_CAP
term is
defined as the allowable droop in the rail of the upper gate
drive.
As an example, suppose two IRLR7821 FET s are chosen as
the upper MOSFETs. The gate charge, Q
sheet is 10nC at 4.5V (V
Q
is calculated to be 53nC for PVCC = 12V. We will
GATE
) gate-source voltage. Then the
GS
, from the data
G
assume a 200mV droop in drive voltage over the PWM
cycle. We find that a bootstrap capacitance of at least
0.267µF is required.
1.6
1.4
1.2
1.0
(µF)
0.8
BOOT_CAP
0.6
C
0.4
0.2
20nC
0.0
FIGURE 2. BOOTSTRAP CAPACITANCE vs BOOT RIPPLE
Q
50nC
VOLTAGE
= 100nC
GATE
0.30.00.1 0.20.4 0.5 0.60.90.7 0.81.0
ΔV
BOOT_CAP
(V)
When VCC drops below its POR level, both gates pull low
and the Pre-POR overvoltage protection circuits are not
activated until VCC resets.
Internal Bootstrap Device
Both drivers feature an internal bootstrap schottky diode.
Simply adding an external capacitor across the BOOT and
PHASE pins completes the bootstrap circuit. The bootstrap
function is also designed to prevent the bootstrap capacitor
from overcharging due to the large negative swing at the
trailing-edge of the PHASE node. This reduces voltage
stress on the boot to phase pins.
The bootstrap capacitor must have a maximum voltage
rating above UVCC + 5V and its capacitance value can be
chosen from Equation 1:
Q
GATE
C
BOOT_CAP
Q
GATE
--------------------------------------
≥
ΔV
BOOT_CAP
QG1PVCC•
----------------------------------- -
V
GS1
(EQ. 1)
•=
N
Q1
Gate Drive Voltage Versatility
The ISL6614B provides the user flexibility in choosing the
gate drive voltage for efficiency optimization. The ISL6614B
ties the upper and lower drive rails together. Simply applying
a voltage from 5V up to 12V on PVCC sets both gate drive
rail voltages simultaneously. Connecting a SOT-23 package
type of dual Schottky diodes from the VCC to BOOT1 and
BOOT2 can bypass the internal bootstrap devices of both
upper gates so that the part can operate as a dual ISL6612B
driver, which has a fixed VCC (7V to 12V typically) on the
upper gate and a programmable lower gate drive voltage.
Power Dissipation
Package power dissipation i s mai nl y a fu nction of the
switching frequency (f
external gate resistance, and the selected MOSFET’s
internal gate resistance and total gate charge. Calculating
the power dissipation in the driver for a desired application is
critical to ensure safe operation. Exceeding the maximum
allowable power dissipation level will push the IC beyond the
maximum recommended operating junction temperature of
+125°C. The maximum allowable IC power dissipation for
the SO14 package is approximately 1W at room
temperature, while the power dissipation capacity in the
), the output drive impedance, the
SW
8
FN9206.3
May 5, 2008
ISL6614B
www.BDTIC.com/Intersil
QFN packages, with an exposed heat escape pad, is around
2W. See “Layout Considerations” on page 9 for thermal
transfer improvement suggestions. When designing the
driver into an application, it is recommended that the
following calculation is used to ensure safe operation at the
desired frequency for the selected MOSFETs. The total gate
drive power losses due to the gate charge of MOSFETs and
the driver’s internal circuitry and their corresponding average
driver current can be estimated with Equations 2 and 3,
respectively,
P
Qg_TOT
P
P
where the gate charge (Q
particular gate to source voltage (V
corresponding MOSFET datasheet; I
Qg_Q1
Qg_Q2
I
DR
2P
•2P
Qg_Q1
QG1PVCC
---------------------------------------
V
QG2PVCC
---------------------------------------
V
QG1NQ1•
⎛⎞
----------------------------- -
⎜⎟
V
⎝⎠
GS1
•
GS1
•
GS2
•IQVCC•++=
Qg_Q2
2
•NQ1•=
f
SW
2
•NQ2•=
f
SW
•
Q
G2NQ2
----------------------------- -
+
V
GS2
and QG2) is defined at a
G1
f
SW
and V
GS1
Q
GS2
is the driver’s total
2•IQ+•=
quiescent current with no load at both drive outputs; N
and N
are number of upper and lower MOSFETs,
Q2
(EQ. 2)
(EQ. 3)
) in the
Q1
respectively; PVCC is the drive voltages for both upper and
lower FETs, respectively. The I
VCC product is the
Q*
quiescent power of the driver without capacitive load and is
typically 200mW at 300kHz.
The total gate drive power losses are dissipated among the
resistive components along the transition path. The drive
resistance dissipates a portion of the total gate drive power
losses, the rest will be dissipated by the external gate
resistors (R
(R
and R
GI1
and RG2) and the internal gate resistors
G1
) of MOSFETs. Figures 3 and 4 show the
GI2
typical upper and lower gate drives turn-on transition path.
The power dissipation on the driver can be roughly
estimated in Equation 4:
P
DR
P
DR_UP
2P•
DR_UP
⎛⎞
--------------------------------------
⎜⎟
R
⎝⎠
2P•
R
HI1
+
HI1REXT1
DR_LOWIQ
R
LO1
----------------------------------------
+
R
+
LO1REXT1
VCC•++=
P
Qg_Q1
---------------------
•=
(EQ. 4)
2
PVCC
FIGURE 3. TYPICAL UPPER-GATE DRIVE TURN-ON PATH
PVCC
FIGURE 4. TYPICAL LOWER-GATE DRIVE TURN-ON PATH
BOOT
R
PHASE
R
HI2
R
LO2
R
HI1
LO1
D
C
GD
G
R
GI1
R
G1
C
GS
S
C
GD
G
R
GI2
R
G2
C
GS
S
C
DS
Q1
D
C
DS
Q2
Layout Considerations
For heat spreading, place copper underneath the IC whether
it has an exposed pad or not. The copper area can be
extended beyond the bottom area of the IC and/or
connected to buried copper plane(s) with thermal vias. This
combination of vias for vertical heat escape, extended
copper plane, and buried planes for heat spreading allows
the IC to achieve its full thermal potential.
Place each channel power component as close to each
other as possible to reduce PCB copper losses and PCB
parasitics: shortest distance between DRAINs of upper FETs
and SOURCEs of lower FETs; shortest distance between
DRAINs of lower FETs and the power ground. Thus, smaller
amplitudes of positive and negative ringing are on the
switching edges of the PHASE node. However, some space
in between the power components is required for good
airflow. The traces from the drivers to the FETs should be
kept short and wide to reduce the inductance of the traces
and to promote clean drive signals.
16 LEAD QUAD FLAT NO-LEAD PLASTIC PACKAGE
(COMPLIANT TO JEDEC MO-220-VGGC ISSUE C)
MILLIMETERS
SYMBOL
A0.800.901.00-
A1--0.05-
A2--1.009
A30.20 REF9
b0.230.280.355, 8
D4.00 BSC-
D13.75 BSC9
D21.952.102.257, 8
E4.00 BSC-
E13.75 BSC9
E21.952.102.257, 8
e 0.65 BSC-
k0.25 -- -
L0.500.600.758
L1 --0.1510
N162
Nd43
Ne43
P- -0.609
θ--129
NOTES:
1. Dimensioning and tolerancing conform to ASME Y14.5-1994.
2. N is the number of terminals.
3. Nd and Ne refer to the number of terminals on each D and E.
4. All dimensions are in millimeters. Angles are in degrees.
5. Dimension b applies to the metallized terminal and is measured
between 0.15mm and 0.30mm from the terminal tip.
6. The configuration of the pin #1 identifier is optional, but must be
located within the zone indicated. The pin #1 identifier may be
either a mold or mark feature.
7. Dimensions D2 and E2 are for the exposed pads which provide
improved electrical and thermal performance.
8. Nominal dimensions are provided to assist with PCB Land Pattern
Design efforts, see Intersil Technical Brief TB389.
9. Features and dimensions A2, A3, D1, E1, P & θ are present when
Anvil singulation method is used and not present for saw
singulation.
10. Depending on the method of lead termination at the edge of the
package, a maximum 0.15mm pull back (L1) maybe present. L
minus L1 to be equal to or greater than 0.3mm.
NOTESMINNOMINALMAX
Rev. 5 5/04
10
FN9206.3
May 5, 2008
Small Outline Plastic Packages (SOIC)
www.BDTIC.com/Intersil
ISL6614B
N
INDEX
AREA
123
-A-
E
-B-
SEATING PLANE
D
A
-C-
0.25(0.010)BMM
H
L
h x 45
o
α
e
B
0.25(0.010)C AMBS
NOTES:
1. Symbols are defined in the “MO Series Symbol List” in Section 2.2 of
Publication Number 95.
2. Dimensioning and tolerancing per ANSI Y14.5M-1982.
3. Dimension “D” does not include mold flash, protrusions or gate burrs.
Mold flash, protrusion and gate burrs shall not exceed 0.15mm (0.006
inch) per side.
4. Dimension “E” does not include interlead flash or protrusions. Interlead
flash and protrusions shall not exceed 0.25mm (0.010 inch) per side.
5. The chamfer on the body is optional. If it is not present, a visual index
feature must be located within the crosshatched area.
6. “L” is the length of terminal for soldering to a substrate.
7. “N” is the number of terminal positions.
8. Terminal numbers are shown for reference only.
9. The lead width “B”, as measured 0.36mm (0.014 inch) or greater
above the seating plane, shall not exceed a maximum value of
0.61mm (0.024 inch).
10. Controlling dimension: MILLIMETER. Converted inch dimensions
are not necessarily exact.
M
A1
C
0.10(0.004)
M14.15 (JEDEC MS-012-AB ISSUE C)
14 LEAD NARROW BODY SMALL OUTLINE PLASTIC
PACKAGE
INCHESMILLIMETERS
SYMBOL
A0.05320.06881.351.75-
A10.00400.00980.100.25-
B0.0130.0200.330.519
C0.00750.00980.190.25-
D0.33670.34448.558.753
E0.14970.15743.804.004
e0.050 BSC1.27 BSC-
H0.22840.24405.806.20-
h0.00990.01960.250.505
L0.0160.0500.401.276
N14147
o
α
0
o
8
o
0
o
8
Rev. 0 12/93
NOTESMINMAXMINMAX
-
All Intersil U.S. products are manufactured, assembled and tested utilizing ISO9000 quality systems.
Intersil Corporation’s quality certifications can be viewed at www.intersil.com/design/quality
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design, software and/or specifications at any time without
notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and
reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result
from its use. No license is granted by implic atio n or other wise u nde r any p a tent or patent rights of Intersil or its subsidi ari es.
For information regarding Intersil Corporation and its products, see www.intersil.com
11
FN9206.3
May 5, 2008
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