Datasheet isl6312 Datasheets

®
ISL6312
Data Sheet
Four-Phase Buck PWM Controller with Integrated MOSFET Drivers for Intel VR10, VR11, and AMD Applications
The ISL6312 four-phase PWM control IC provides a precision voltage regulation system for advanced microprocessors. The integration of power MOSFET drivers into the controller IC marks a departure from the separate PWM controller and driver configuration of previous multiphase product families. By reducing the number of external parts, this integration is optimized for a cost and space saving power management solution.
One outstanding feature of this controller IC is its multi-processor compatibility, allowing it to work with both Intel and AMD microprocessors. Included are programmable VID codes for Intel VR10, VR11, as well as AMD DAC t ables. A unity gain, differential amplifier is provided for remote voltage sensing, compensating for any potential difference between remote and local grounds. The output voltage can also be positively or negatively offset through the use of a single external resistor.
The ISL6312 also includes advanced control loop features for optimal transient response to load apply and removal. One of these features is highly accurate, fully differential, continuous DCR current sensing for load line programming and channel current balance. Active Pulse Positioning (APP) modulation is another unique feature, allowing for quicker initial response to high di/dt load transients.
This controller also allows the user the flexibility to choose between PHASE detect or LGATE detect adaptive dead time schemes. This ability allows the ISL6312 to be used in a multitude of applications where either scheme is required.
Protection features of this controller IC include a set of sophisticated overvoltage, undervoltage, and overcurrent protection. Furthermore, the ISL6312 includes protection against an open circuit on the remote sensing inputs. Combined, these features provide advanced protection for the microprocessor and power system.
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Features
• Integrated Multiphase Power Conversion
- 2- or 3-Phase Operation with Internal Drivers
- 4-Phase Operation with External PWM Driver Signal
• Precision Core Voltage Regulation
- Differential Remote Voltage Sensing
- ±0.5% System Accuracy Over-Temperature
- Adjustable Reference-Voltage Offset
• Optimal Transient Response
- Active Pulse Positioning (APP) Modulation
- Adaptive Phase Alignment (APA)
• Fully Differential, Continuous DCR Current Sensing
- Accurate Load Line Programming
- Precision Channel Current Balancing
• User Selectable Adaptive Dead Time Scheme
- PHASE Detect or LGATE Detect for Application Flexibility
• Variable Gate Drive Bias: 5V to 12V
• Multi-Processor Compatible
- Intel VR10 and VR11 Modes of Operation
- AMD Mode of Operation
• Microprocessor Voltage Identification Inputs
-8-bit DAC
- Selectable between Intel’s Extended VR10, VR11, AMD 5-bit, and AMD 6-bit DAC Tables
- Dynamic VID Technology
• Overcurrent Protection
• Multi-Tiered Overvoltage Protection
• Digital Soft-Start
• Selectable Operation Frequency up to 1.5MHz Per Phase
• Pb-Free Plus Anneal Available (RoHS Compliant)
Ordering Information
PART
NUMBER
(Note)
ISL6312CRZ* ISL6312 CRZ 0 to +70 48 Ld 7x7 QFN L48.7x7 ISL6312IRZ* ISL6312 IRZ -40 to +85 48 Ld 7x7 QFN L48.7x7
NOTE: Intersil Pb-free plus anneal products employ special Pb-free material sets; molding compounds/die attach materials and 100% m atte tin plate termination finish, which are RoHS compliant and comp atible with both SnPb and Pb-free soldering operations. Intersil Pb-free products are MSL classified at Pb-free peak reflow temper ature s that meet or exceed the Pb-free requirements of IPC/JEDEC J STD-020.
*Add “-T” or “-TK” suffix for tape and reel. Please refer to TB347 for details on reel specifications.
PART
MARKING
TEMP.
(°C)
PACKAGE
(Pb-Free)
PKG.
DWG . #
1
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 1-888-468-3774
| Intersil (and design) is a registered trademark of Intersil Americas Inc.
Copyright Intersil Americas Inc. 2006, 2007. All Rights Reserved
All other trademarks mentioned are the property of their respective owners.
Pinout
ISL6312ISL6312
ISL6312
(48 LD QFN)
TOP VIEW
VID6
VID7
VID5
48
47 46 45 44 43 42 41 40 39
FS
ISEN3-
ISEN3+
PVCC3
LGATE3
PHASE3
UGATE3
PGOOD
38 37
BOOT3
VID4
1
VID3
2
VID2
3
VID1
4
VID0
5 VRSEL DRSEL
OVPSEL
SS
VCC
REF OFS
6
7
8
9
10 11 12
13 14 15 16 17 18 19 20 21 22
FB
COMP
VDIFF
IDROOP
ISL6312 Integrated Driver Block Diagram
RGND
49
GND
VSEN
ISEN2+
ISEN2-
EN
36
ISEN1+
35
ISEN1-
34
PHASE1
33
UGATE1
32
BOOT1
31
LGATE1
30
PVCC1_2
29
LGATE2
28
BOOT2
27
UGATE2
26
PHASE2
25
23 24
ISEN4-
ISEN4+
PWM4
EN_PH4
DRSEL
PWM
SOFT-START
AND
FAULT LOGIC
PVCC
BOOT
UGATE
20kΩ
GATE
CONTROL
LOGIC
2
SHOOT-
THROUGH
PROTECTION
10kΩ
PHASE
LGATE
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Block Diagram
VSEN
RGND
VDIFF
UNDERVOLTAGE
LINE PREVENTION
x1
DETECTION
LOGIC
OPEN SENSE
ISL6312ISL6312
PGOOD
SOFT-START
AND
FAULT LOGIC
SS
0.85V
EN
POWER-ON
RESET
VCC
PVCC1_2
BOOT1
OVPSEL
VRSEL
VID7 VID6
VID5 VID4 VID3 VID2 VID1 VID0
REF
FB
COMP
OFS
IDROOP
OVERVOLTAGE
DETECTION
MODE/DAC
SELECT
DYNAMIC
VID D/A
OFFSET
LOGIC
E/A
OC
I_TRIP
I_AVG
LOAD APPL Y
TRANSIENT
ENHANCEMENT
CLOCK AND
MODULATOR
WAVEFORM
GENERAT OR
CHANNEL CURRENT BALANCE
0.2V
I_AVG
MOSFET
DRIVER
CHANNEL
DETECT
MOSFET
DRIVER
PH4 POR/
MOSFET
DRIVER
DETECT
PWM1
PWM2
PWM3
PWM4
1 N
UGATE1
PHASE1
LGATE1
DRSEL
FS
BOOT2
UGATE2
PHASE2
LGATE2
EN_PH4
PVCC3
BOOT3 UGATE3
PHASE3
LGATE3
CURRENT
ISEN1-
3
CH1
SENSE
ISEN1+
CURRENT
SENSE
ISEN2-
CH2
ISEN2+
CURRENT
SENSE
ISEN3-
CH3
ISEN3+
CURRENT
SENSE
ISEN4-
CH4
ISEN4+
GND
PWM4
SIGNAL
LOGIC
PWM4
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Typical Application - ISL6312 (4-Phase)
ISL6312ISL6312
+5V
FB
COMP
VSEN RGND
VCC
OFS
FS REF
SS
OVPSEL
IDROOP
VDIFF
ISL6312
BOOT1
UGATE1
PHASE1
LGATE1
ISEN1­ISEN1+
PVCC1_2
BOOT2
UGATE2
PHASE2
LGATE2
ISEN2­ISEN2+
+12V
+12V
LOAD
+12V
VID7 VID6 VID5 VID4 VID3 VID2 VID1 VID0
VRSEL
PGOOD
EN
DRSEL
GND
PVCC3
BOOT3
UGATE3
PHASE3
LGATE3
ISEN3­ISEN3+
EN_PH4
PWM4
ISEN4­ISEN4+
+12V
BOOT
VCC PVCC
ISL6612
PWM
+12V
+12V
UGATE PHASE
LGATE
GND
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Typical Application - ISL6312 with NTC Thermal Compensation (4-Phase)
+5V
FB
COMP
VSEN RGND
VCC
OFS
FS REF
SS
OVPSEL
IDROOP
ISL6312
VDIFF
BOOT1
UGATE1
PHASE1
LGATE1
PVCC1_2
BOOT2
UGATE2
PHASE2
LGATE2
ISEN2+
ISEN1­ISEN1+
ISEN2-
+12V
+12V
NTC
PLACE IN CLOSE PROXIMITY
LOAD
+12V
VID7 VID6 VID5 VID4 VID3 VID2 VID1 VID0
VRSEL PGOOD
EN
DRSEL
GND
PVCC3
BOOT3
UGATE3
PHASE3
LGATE3
ISEN3-
ISEN3+
EN_PH4
PWM4
ISEN4-
ISEN4+
+12V
BOOT
VCC PVCC
ISL6612
PWM
+12V
+12V
UGATE PHASE
LGATE
GND
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Absolute Maximum Ratings
Supply Voltage, VCC. . . . . . . . . . . . . . . . . . . . . . . . . . .-0.3V to +6V
Supply Voltage, PVCC. . . . . . . . . . . . . . . . . . . . . . . . .-0.3V to +15V
BOOT Voltage, V BOOT to PHASE Voltage, V
PHASE Voltage, V
GND - 8V (<400ns, 20µJ) to 24V (<200ns, V
UGATE Voltage, V
V
PHASE
LGATE Voltage, V
GND - 5V (<100ns Pulse Width, 2µJ) to PVCC + 0.3V
Input, Output, or I/O Voltage . . . . . . . . . GND - 0.3V to VCC + 0.3V
ESD Classification . . . . . . . . . . . . . . . . . . . . . . . Class I JEDEC STD
CAUTION: Do not operate at or near the maximum ratings listed for extended periods of time. Exposure to such conditions may adversely impact product reliability and result in failures not covered by warranty.
. . . . . . . . . . . . . .GND - 0.3V to GND + 36V
BOOT
BOOT-PHASE
. . . . . . . GND - 0.3V to 15V (PVCC = 12)
PHASE
. . . . . . . .V
UGATE
- 3.5V (<100ns Pulse Width, 2µJ) to V
. . . . . . . . . . . GND - 0.3V to PVCC + 0.3V
LGATE
. . . . . . -0.3V to 15V (DC)
-0.3V to 16V (<10ns, 10µJ)
BOOT - PHASE
- 0.3V to V
PHASE
BOOT BOOT
= 12V) + 0.3V + 0.3V
Thermal Information
Thermal Resistance θJA (°C/W) θJC (°C/W)
QFN Package (Notes 1, 2). . . . . . . . . . 32 3.5
Maximum Junction Temperature . . . . . . . . . . . . . . . . . . . . . .+150°C
Maximum Storage Temperature Range. . . . . . . . . .-65°C to +150°C
Pb-free reflow profile . . . . . . . . . . . . . . . . . . . . . . . . . .see link below
http://www.intersil.com/pbfree/Pb-FreeReflow.asp
Recommended Operating Conditions
VCC Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .+5V ±5%
PVCC Supply Voltage . . . . . . . . . . . . . . . . . . . . . . .+5V to 12V ±5%
Ambient Temperature (ISL6312CRZ) . . . . . . . . . . . . . 0°C to +70°C
Ambient Temperature (ISL6312IRZ) . . . . . . . . . . . . .-40°C to +85°C
NOTES:
is measured in free air with the component mounted on a high effective thermal conductivity test board with “direct attach” features. See
1. θ
JA
Tech Brief TB379.
2. For θ
, the “case temp” location is the center of the exposed metal pad on the package underside.
JC
3. Limits established by characterization and are not production tested.
Electrical Specifications Recommended Operating Conditions, Unless Otherwise Specified.
PARAMETER TEST CONDITIONS MIN TYP MAX UNITS
BIAS SUPPLIES
Input Bias Supply Current I Gate Drive Bias Current - PVCC1_2 Pin I Gate Drive Bias Current - PVCC3 Pin I VCC POR (Power-On Reset) Threshold VCC rising 4.25 4.38 4.50 V
PVCC POR (Power-On Reset) Threshold PVCC rising 4.25 4.38 4.50 V
PWM MODULATOR
Oscillator Frequency Accuracy, f
SW
Adjustment Range of Switching Frequency (Note 3) 0.08 - 1.0 MHz Oscillator Ramp Amplitude, V
PP
CONTROL THRESHOLDS
EN Rising Threshold -0.85-V EN Hysteresis -110-mV EN_PH4 Rising Threshold 1.160 1.210 1.250 V EN_PH4 Falling Threshold 1.00 1.06 1.10 V COMP Shutdown Threshold COMP falling 0.1 0.2 0.3 V
REFERENCE AND DAC
System Accuracy (1.000V - 1.600V) -0.5 - 0.5 % System Accuracy (0.600V - 1.000V) -1.0 - 1.0 % System Accuracy (0.375V - 0.600V) -2.0 - 2.0 % DAC Input Low Voltage (VR10, VR11) - - 0.4 V DAC Input High Voltage (VR10, VR11) 0.8 - - V
; EN = high 15 20 25 mA
VCC PVCC1_2 PVCC3
; EN = high 2 4.3 6 mA
; EN = high 1 2.1 3 mA
VCC falling 3.75 3.88 4.00 V
PVCC falling 3.60 3.88 4.00 V
RT = 100kΩ (± 0.1%) 225 250 275 kHz
(Note 3) - 1.50 - V
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Electrical Specifications Recommended Operating Conditions, Unless Otherwise Specified. (Continued)
PARAMETER TEST CONDITIONS MIN TYP MAX UNITS
DAC Input Low Voltage (AMD) --0.6V DAC Input High Voltage (AMD) 1.0 - - V
PIN-ADJUSTABLE OFFSET
OFS Sink Current Accuracy (Negative Offset) R OFS Source Current Accuracy (Positive Offset) R
ERROR AMPLIFIER
DC Gain R Gain-Bandwidth Product C Slew Rate CL = 100pF, Load = ±400mA, (Note 3) - 8 - V/μs Maximum Output Voltage Load = 1mA 3.90 4.20 - V Minimum Output Voltage Load = -1mA - 1.30 1.5 V
SOFT-START RAMP
Soft-Start Ramp Rate VR10/VR11, R
Adjustment Range of Soft-Start Ramp Rate (Note 3) 0.625 - 6.25 mV/µs
PWM OUTPUT
PWM Output Voltage LOW Threshold Iload = ±500µA - - 0.5 V PWM Output Voltage HIGH Threshold Iload = ±500µA 4.5 - - V
CURRENT SENSING
Current Sense Resistance, R
ISEN
Sensed Current Tolerance ISEN1+ = ISEN2+ = ISEN3+ = ISEN4+ = 80μA 768084μA
OVERCURRENT PROTECTION
Overcurrent Trip Level - Average Channel Normal operation 110 125 140 μA
Overcurrent Trip Level - Individual Channel Normal operation 150 177 204 μA
PROTECTION
Undervoltage Threshold VSEN falling 55 60 65 %VID Undervoltage Hysteresis VSEN rising - 10 - %VID Overvoltage Threshold During Soft-Start VR10/VR11 1.24 1.28 1.32 V
Overvoltage Threshold (Default) VR10/VR11, OVPSEL tied to ground, VSEN rising VDAC +
Overvoltage Threshold (Alternate) OVPSEL tied to +5V, VSEN rising VDAC +
Overvoltage Hysteresis VSEN falling - 100 - mV
SWITCHING TIME (Note 3)
UGATE Rise Time t LGATE Rise Time t
= 10kΩ from OFS to GND 37.0 40.0 43.0 μA
OFS
= 30kΩ from OFS to VCC 50.5 53.5 56.5 μA
OFS
= 10k to ground, (Note 3) - 96 - dB
L
= 100pF, RL = 10k to ground, (Note 3) - 20 - MHz
L
= 100kΩ - 1.563 - mV/µs
S
AMD 2.063 mV/µs
T = +25°C 297 300 303 Ω
Dynamic VID change 143 163 183 μA
Dynamic VID change (Note 3) 209.4 238 266.6 μA
AMD 2.13 2.20 2.27 V
150mV
AMD, OVPSEL tied to ground, VSEN rising VDAC +
225mV
325mV
RUGATE; VPVCC RLGATE; VPVCC
= 12V, 3nF load, 10% to 90% - 26 - ns
= 12V, 3nF load, 10% to 90% - 18 - ns
VDAC +
175mV
VDAC +
250mV
VDAC +
350mV
VDAC +
200mV
VDAC +
275mV
VDAC +
375mV
V
V
V
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Electrical Specifications Recommended Operating Conditions, Unless Otherwise Specified. (Continued)
PARAMETER TEST CONDITIONS MIN TYP MAX UNITS
UGATE Fall Time t LGATE Fall Time t UGATE Turn-On Non-Overlap t LGATE Turn-On Non-Overlap t
FUGATE; VPVCC FLGATE; VPVCC PDHUGATE PDHLGATE
GATE DRIVE RESISTANCE (Note 3) Upper Drive Source Resistance V Upper Drive Sink Resistance V Lower Drive Source Resistance V Lower Drive Sink Resistance V
= 12V, 15mA source current 1.25 2.0 3.0 Ω
PVCC
= 12V, 15mA sink current 0.9 1.65 3.0 Ω
PVCC
= 12V, 15mA source current 0.85 1.25 2.2 Ω
PVCC
= 12V, 15mA sink current 0.60 0.80 1.35 Ω
PVCC
OVER TEMPERATURE SHUTDOWN (Note 3)
Thermal Shutdown Setpoint - 160 - °C Thermal Recovery Setpoint - 100 - °C
= 12V, 3nF load, 90% to 10% - 18 - ns
= 12V, 3nF load, 90% to 10% - 12 - ns
; V
= 12V, 3nF load, adaptive - 10 - ns
PVCC
; V
= 12V, 3nF load, adaptive - 10 - ns
PVCC
Timing Diagram
t
PDHUGATE
t
RUGATE
t
FUGATE
UGATE
LGATE
t
FLGATE
t
PDHLGATE
t
RLGATE
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Functional Pin Description
VCC
VCC is the bias supply for the ICs small-signal circuitry. Connect this pin to a +5V supply and decouple using a quality 0.1μF ceramic capacitor.
PVCC1_2 and PVCC3
These pins are the power supply pins for the corresponding channel MOSFET drive, and can be connected to any voltage from +5V to +12V depending on the desired MOSFET gate-drive level. Decouple these pins with a quality
1.0μF ceramic capacitor . Leaving PVCC3 unconnected or grounded programs the
controller for 2-phase operation.
GND
GND is the bias and reference ground for the IC.
EN
This pin is a threshold-sensitive (approxima tely 0.85V) enable input for the controller. Held low, this pin disables controller operation. Pulled high, the pin enables the controller for operation.
FS
A resistor, placed from FS to ground, sets the switching frequency of the controller.
VID0, VID1, VID2, VID3, VID4, VID5, VID6, and VID7
These are the inputs for the internal DAC that provides the reference voltage for output regulation. These pins respond to TTL logic thresholds. These pins are internally pulled high, to approximately 1.2V, by 40μA internal current sources for Intel modes of operation, and pulled low by 20μA internal current sources for AMD modes of operation. The internal pull-up current decreases to 0 as the VID voltage approaches the internal pull-up voltage. All VID pins are compat ible with external pull-up voltages not exceeding the IC’s bias voltage (VCC).
VRSEL
The state of this pin selects which of the available DAC tables will be used to decode the VID inputs and puts the controller into the corresponding mode of operation. For VR10 mode of operation VRSEL should be less then 0.6V. The VR11 mode of operation can be selected by setting VRSEL between 0.6V and
3.0V , and AMD compliance is selected if this pin is between
3.0V and VCC.
VSEN and RGND
VSEN and RGND are inputs to the precision differe ntial remote-sense amplifier and should be connected to the sense pins of the remote load.
VDIFF
VDIFF is the output of the differential remote-sense amplifier . The voltage on this pin is equal to the difference between VSEN and RGND.
FB and COMP
These pins are the internal error amplifier inverting input and output respectively. FB, VDIFF, and COMP are tied together through external R-C networks to compensate the regulator.
IDROOP
The IDROOP pin is the average channel-current sense output. Connecting this pin through a tuned parallel R-C network to FB allows the converter to incorporate output voltage droop proportional to the output current. If voltage droop is not desired leave this pin unconnected.
REF
The REF input pin is the positive input of the error amplifier. It is internally connected to the DAC output through a 1kΩ resistor. A cap acitor is used between the REF pin and gro und to smooth the voltage transition during Dynamic VID operations.
OFS
The OFS pin provides a means to program a DC current for generating an offset voltage across the re sistor betwe en FB and VDIFF. The offset current is generated via an external resistor and precision internal voltage references. The polarity of the offset is selected by connecting the resistor to GND or VCC. For no offset, the OFS pin should be left unconnected.
ISEN1-, ISEN1+, ISEN2-, ISEN2+, ISEN3-, ISEN3+, ISEN4-, and ISEN4+
These pins are used for differentially sensing the corresponding channel output currents. The sensed currents are used for channel balancing, protection, and load line regulation.
Connect ISEN1-, ISEN2-, ISEN3-, and ISEN4- to the node between the RC sense elements surrounding the inductor of their respective channel. Tie the ISEN+ pins to the VCORE side of their corresponding channel’s sense capacitor.
UGATE1, UGATE2, and UGATE3
Connect these pins to the corresponding upper MOSFET gates. These pins are used to control the upper MOSFETs and are monitored for shoot-through prevention purposes.
BOOT1, BOOT2, and BOOT3
These pins provide the bias voltage for the corresponding upper MOSFET drives. Connect these pins to appropriately­chosen external bootstrap capacitors. Internal bootstrap diodes connected to the PVCC pins provide the necessary bootstrap charge.
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PHASE1, PHASE2, and PHASE3
Connect these pins to the sources of the corresponding upper MOSFETs. These pins are the return path for the upper MOSFET drives.
LGATE1, LGATE2, and LGATE3
These pins are used to control the lower MOSFET s. Connect these pins to the corresponding lower MOSFETs’ gates.
PWM4
Pulse-width modulation output. Connect this pin to the PWM input pin of an Intersil driver IC if 4-phase operation is desired.
EN_PH4
This pin has two functions. First, a resistor divider connected to this pin will provide a POR power-up synch between the on-chip and external driver. The resistor divider should be designed so that when the POR-trip point of the external driver is reached the voltage on this pin should be 1.21V.
The second function of this pin is disabling PWM4 for 3-phase operation. This can be accomplished by connecting this pin to a +5V supply.
SS
A resistor, placed from SS to ground, will set the soft-start ramp slope for the Intel DAC modes of operation. Refer to Equations 18 and 19 for proper resistor calculation.
For AMD modes of operation, the soft-start ramp frequency is preset, so this pin can be left unconnected.
OVPSEL
This pin selects the OVP trip point during normal operation. Leaving it unconnected or tieing it to ground selects the default setting of VDAC+175mV for Intel Modes of operation and VDAC+250mV for AMD modes of operation. Connecting this pin to VCC will select an OVP trip setting of VID+350mV for all modes of operation.
DRSEL
This pin selects the adaptive dead time scheme the internal drivers will use. If driving MOSFETs, tie this pin to ground to select the PHASE detect scheme or to a +5V supply through a 50kΩ resistor to select the LGATE detect scheme.
PGOOD
During normal operation PGOOD indicates whether the output voltage is within specified overvolt age an d undervoltage limits. If the output voltage exceed s these limit s or a reset event occurs (such as an overcurrent event), PGOOD is pulled low. PGOOD is always low prior to the end of soft-start.
Operation
Multiphase Power Conversion
Microprocessor load current profiles have changed to the point that using single-phase regulators is no longer a viable solution. Designing a regulator that is cost-effective, thermally sound, and efficient has become a challenge that only multiphase converters can accomplish. The ISL6322 controller helps simplify implementation by integrating vital functions and requiring minimal external components. The “Block Diagram” on page 3 provides a top level view of multiphase power conversion using the ISL6322 controller.
IL1 + IL2 + IL3, 7A/DIV
IL3, 7A/DIV
PWM3, 5V/DIV
IL2, 7A/DIV
PWM2, 5V/DIV
IL1, 7A/DIV
PWM1, 5V/DIV
1μs/DIV
FIGURE 1. PWM AND INDUCTOR-CURRENT WAVEFORMS
FOR 3-PHASE CONVERTER
Interleaving
The switching of each channel in a multiphase converter is timed to be symmetrically out of phase with each of the other channels. In a 3-phase converter, each channel switches 1/3 cycle after the previous channel and 1/3 cycle before the following channel. As a result, the three-phase converter has a combined ripple frequency three times greater than the ripple frequency of any one phase. In addition, the peak-to-peak amplitude of the combined inductor currents is reduced in proportion to the number of phases (Equations 1 and 2). Increased ripple frequency and lower ripple amplitude mean that the designer can use less per-channel inductance and lower total output capacitance for any performance specification.
Figure 1 illustrates the multiplicative effect on output ripple frequency. The three channel currents (IL1, IL2, and IL3) combine to form the AC ripple current and the DC load current. The ripple component has three times the ripple frequency of each individual channel current. Each PWM pulse is terminated 1/3 of a cycle after the PWM pulse of the previous phase. The peak-to-peak current for each phase is about 7A, and the DC components of the inductor currents combine to feed the load.
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T o understand the reduction of ripple current amplitude in the multiphase circuit, examine the equation representing an individual channel peak-to-peak inductor current.
VINV
I
PP()
----------------------------------------------------------=
()V
In Equation 1, V
Lf
OUT
S
and V
IN
OUT
VIN⋅
are the input and output
OUT
(EQ. 1)
voltages respectively, L is the single-channel inductor value, and f
is the switching frequency.
S
The output capacitors conduct the ripple component of the inductor current. In the case of multiphase converters, the capacitor current is the sum of the ripple currents from each of the individual channels. Compare Equation 1 to the expression for the peak-to-peak current after the summation of N symmetrically phase-shifted inductor currents in Equation 2. Peak-to-peak ripple current decreases by an amount proportional to the number of channels. Output voltage ripple is a function of capacitance, capacitor equivalent series resistance (ESR), and inductor ripple current. Reducing the inductor ripple current allows the designer to use fewer or less costly output capacitors.
I
CP P()
------------------------------------------------------------------- -=
()V
Lf
OUT
S
OUT
VIN⋅
(EQ. 2)
VINNV
Another benefit of interleaving is to reduce input ripple current. Input capacitance is determined in part by the maximum input ripple current. Multiphase topologies can improve overall system cost and size by lowering input ripple current and allowing the designer to reduce the cost of input capacitance. The example in Figure 2 illustrates input currents from a three-phase converter combining to reduce the total input ripple current.
The converter depicted in Figure 2 delivers 1.5V to a 36A load from a 12V input. The RMS input capacitor current is 5.9A. Compare this to a single-phase converter also stepping down 12V to 1.5V at 36A. The single-phase converter has 11.9A RMS input capacitor current. The single-phase converter must use an input capacitor bank with twice the RMS current capacity as the equivalent three-phase converter.
INPUT-CAPACITOR CURRENT, 10A/DIV
Active Pulse Positioning (APP) Modulated PWM Operation
The ISL6312 uses a proprietary Active Pulse Positioning (APP) modulation scheme to control the internal PWM signals that command each channel’s driver to turn their upper and lower MOSFETs on and off. The time interval in which a PWM signal can occur is generated by an internal clock, whose cycle time is the inverse of the switching frequency set by the resistor between the FS pin and ground. The advantage of Intersil’s proprietary Active Pulse Positioning (APP) modulator is that the PWM signal has the ability to turn on at any point during this PWM time interval, and turn off immediately after the PWM signal has transitioned high. This is important because is allows the controller to quickly respond to output voltage drops associated with current load spikes, while avoiding the ring back affects associated with other modulation schemes.
The PWM output state is driven by the position of the error amplifier output signal, V signal relative to the proprietary modulator ramp waveform as illustrated in Figure 3. At the beginning of each PWM time interval, this modified V internal modulator waveform. As long as the modified V
voltage is lower then the modulator waveform
COMP
voltage, the PWM signal is commanded low. The internal MOSFET driver detects the low state of the PWM signal and turns off the upper MOSFET and turns on the lower synchronous MOSFET. When the modified V crosses the modulator ramp, the PWM output transitions high, turning off the synchronous MOSFET and turning on the upper MOSFET. The PWM signal will remain high until the modified V
voltage crosses the modulator ramp
COMP
again. When this occurs the PWM signal will transition low again.
During each PWM time interval the PWM signal can only transition high once. Once PWM transitions high it can not transition high again until the beginning of the next PWM time interval. This prevents the occurrence of double PWM pulses occurring during a single period.
, minus the current correction
COMP
signal is compared to the
COMP
COMP
voltage
CHANNEL 3 INPUT CURRENT 10A/DIV
CHANNEL 2 INPUT CURRENT 10A/DIV
CHANNEL 1 INPUT CURRENT 10A/DIV
1μs/DIV
FIGURE 2. CHANNEL INPUT CURRENTS AND INPUT-
CAPACITOR RMS CURRENT FOR 3-PHASE CONVERTER
11
To further improve the transient response, ISL6312 also implements Intersil’s proprietary Adaptive Phase Alignment (APA) technique, which turns on all phases together under transient events with large step current. With both APP and APA control, ISL6312 can achieve excellent transient performance and reduce the deman d on the output capacitors.
Channel-Current Balance
One important benefit of multiphase operation is the thermal advantage gained by distributing the dissipated heat over multiple devices and greater area. By doing this the designer avoids the complexity of driving parallel MOSFETs and the expense of using expensive heat sinks and exotic magnetic materials.
FN9289.4
August 1, 2007
ISL6312
In order to realize the thermal advantage, it is important that each channel in a multiphase converter be controlled to carry equal amounts of current at any load level. To achieve this, the currents through each channel must be sampled every switching cycle. The sampled currents, I
, from each
n
active channel are summed together and divided by the number of active channels. The resulting cycle average current, I
, provides a measure of the total load-current
AVG
demand on the converter during each switching cycle. Channel-current balance is achieved by comparing the sampled current of each channel to the cycle average current, and making the proper adjustment to each channel pulse width based on the error. Intersil’s patented current­balance method is illustrated in Figure 3, with error correction for Channel 1 represented. In the figure, the cycle average current, I sample, I
V
COMP
, to create an error signal IER.
1
+
-
FILTER
I
ER
+
, is compared with the Channel 1
AVG
+
-
Σ
f(s)
I
AVG
-
MODULATOR
RAMP
WAVEFORM
÷ N
PWM1
I
4
I
3
I
2
TO GATE
CONTROL
LOGIC
Continuous Current Sampling
In order to realize proper current-balance, the currents in each channel are sensed continuously every switching cycle. During this time the current-sense amplifier uses the ISEN inputs to reproduce a signal proportional to the inductor current, I scaled version of the inductor current.
The ISL6312 supports inductor DCR current sensing to continuously sense each channel’s current for channel­current balance. The internal circuitry, shown in Figure 5 represents channel n of an N-channel converter. This circuitry is repeated for each channel in the converter, but may not be active depending on how many channels are operating.
MOSFET
DRIVER
ISL6312 INTERNAL CIRCUIT
. This sensed current, I
L
V
IN
UGATE(n)
LGATE(n)
SEN
I
L
L
DCR
INDUCTOR
VL(s)
+
VC(s)
+
R
C
1
R
, is simply a
-
-
1
2*
C
V
OUT
OUT
I
1
NOTE: Channel 3 and 4 are optional.
FIGURE 3. CHANNEL-1 PWM FUNCTION AND CURRENT-
BALANCE ADJUSTMENT
The filtered error signal modifies the pulse width commanded by V I
toward zero. The same method for error signal
ER
to correct any unbalance and force
COMP
correction is applied to each active channel.
PWM
SWITCHING PERIOD
I
L
I
SEN
TIME
FIGURE 4. CONTINUOUS CURRENT SAMPLING
In
SAMPLE
I
SEN
+
+
VC(s)
-
R
ISEN
-
ISEN-(n)
ISEN+(n)
*R2 is OPTIONAL
FIGURE 5. INDUCTOR DCR CURRENT SENSING
CONFIGURATION
Inductor windings have a characteristic distributed resistance or DCR (Direct Current Resistance). For simplicity, the inductor DCR is considered as a separate lumped quantity, as shown in Figure 5. The channel current I
, flowing through the inductor, passes through the DCR.
L
Equation 3 shows the s-domain equivalent voltage, V
,
L
across the inductor.
VLs() ILsL DCR+()=
A simple R-C network across the inductor (R
and C)
1
(EQ. 3)
extracts the DCR voltage, as shown in Figure 5. The voltage across the sense capacitor, V proportional to the channel current I
, can be shown to be
C
, shown in Equation 4.
L
12
FN9289.4
August 1, 2007
ISL6312
sL
VCs()
⎛⎞
-------------
⎝⎠
--------------------------------------
sR
1+
DCR
C⋅⋅ 1+()
1
DCR I
=
L
(EQ. 4)
In some cases it may be necessary to use a resistor divider R-C network to sense the current through the inductor. This can be accomplished by placing a second resistor, R
,
2
across the sense capacitor. In these cases the voltage across the sense capacitor , V channel current I
--------------------------------------------------------
s()
V
C
⎛⎞
s
⎜⎟ ⎝⎠
R
2
---------------------
K
=
R2R1+
, and the resistor divider ratio, K.
L
sL
⎛⎞
-------------
⎝⎠
R
------------------------
R
1+
DCR
()
1R2
+
1R2
C⋅⋅1+
, becomes proportional to the
C
(EQ. 5)
⋅⋅=
KDCRI
L
(EQ. 6)
If the R-C network components are selected such that the RC time constant matches the inductor L/DCR time constant, then V
is equal to the voltage drop across the
C
DCR multiplied by the ratio of the resistor divider, K. If a resistor divider is not being used, the value for K is 1.
The capacitor voltage V sense resistor R
ISEN
, is then replicated across the
C
. The current through R
ISEN
is proportional to the inductor current. Equation 7 shows that the proportion between the channel current and the sensed current (I
) is driven by the value of the sense resistor,
SEN
the resistor divider ratio, and the DCR of the inductor.
DCR
----------------- -
KI
I
SEN
⋅⋅=
L
R
ISEN
(EQ. 7)
Output Voltage Setting
The ISL6312 uses a digital to analog converter (DAC) to generate a reference voltage based on the logic signals at the VID pins. The DAC decodes the logic signals into one of the discrete voltages shown in Tables 2, 3, 4 and 5. In Intel modes of operation, each VID pin is pulled up to an internal
1.2V voltage by a weak current source (40μA), which decreases to 0A as the voltage at the VID pin varies from 0 to the internal 1.2V pull-up voltage. In AMD modes of operation the VID pins are pulled low by a weak 20μA current source. External pull-up resistors or active-high output stages can augment the pull-up current sources, up to a voltage of 5V .
The ISL6312 accommodates four different DAC ranges: Intel VR10 (Extended), Intel VR1 1, AMD K8/K9 5- bit, and AMD 6-bit. The state of the VRSEL and VID7 pins decide which DAC version is active. Refer to Table 1 for a description of how to select the desired DAC version.
TABLE 1. ISL6312 DAC SELECT TABLE
DAC VERSION VRSEL PIN VID7 PIN
VR10(Extended) VRSEL < 0.6V -
VR11 0.8V < VRSEL < 3.0V ­AMD 5-Bit 3.0V < VRSEL < VCC low AMD 6-Bit 3.0V < VRSEL < VCC high
TABLE 2. VR10 (EXTENDED) VOLT AGE IDENTIFICA TION
CODES
VID4 VID3 VID2 VID1 VID0 VID5 VID6 VDAC
0 1 0 1 0 1 1 1.60000
0 1 0 1 0 1 0 1.59375
0 1 0 1 1 0 1 1.58750
0 1 0 1 1 0 0 1.58125
0 1 0 1 1 1 1 1.57500
0 1 0 1 1 1 0 1.56875
0 1 1 0 0 0 1 1.56250
0 1 1 0 0 0 0 1.55625
0 1 1 0 0 1 1 1.55000
0 1 1 0 0 1 0 1.54375
0 1 1 0 1 0 1 1.53750
0 1 1 0 1 0 0 1.53125
0 1 1 0 1 1 1 1.52500
0 1 1 0 1 1 0 1.51875
0 1 1 1 0 0 1 1.51250
0 1 1 1 0 0 0 1.50625
0 1 1 1 0 1 1 1.50000
0 1 1 1 0 1 0 1.49375
0 1 1 1 1 0 1 1.48750
0 1 1 1 1 0 0 1.48125
0 1 1 1 1 1 1 1.47500
0 1 1 1 1 1 0 1.46875
1 0 0 0 0 0 1 1.46250
1 0 0 0 0 0 0 1.45625
1 0 0 0 0 1 1 1.45000
1 0 0 0 0 1 0 1.44375
1 0 0 0 1 0 1 1.43750
1 0 0 0 1 0 0 1.43125
1 0 0 0 1 1 1 1.42500
1 0 0 0 1 1 0 1.41875
1 0 0 1 0 0 1 1.41250
1 0 0 1 0 0 0 1.40625
13
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ISL6312
TABLE 2. VR10 (EXTENDED) VOLTAGE IDENTIFICATION
CODES (Continued)
VID4 VID3 VID2 VID1 VID0 VID5 VID6 VDAC
1 0 0 1 0 1 1 1.40000
1 0 0 1 0 1 0 1.39375
1 0 0 1 1 0 1 1.38750
1 0 0 1 1 0 0 1.38125
1 0 0 1 1 1 1 1.37500
1 0 0 1 1 1 0 1.36875
1 0 1 0 0 0 1 1.36250
1 0 1 0 0 0 0 1.35625
1 0 1 0 0 1 1 1.35000
1 0 1 0 0 1 0 1.34375
1 0 1 0 1 0 1 1.33750
1 0 1 0 1 0 0 1.33125
1 0 1 0 1 1 1 1.32500
1 0 1 0 1 1 0 1.31875
1 0 1 1 0 0 1 1.31250
1 0 1 1 0 0 0 1.30625
1 0 1 1 0 1 1 1.30000
1 0 1 1 0 1 0 1.29375
1 0 1 1 1 0 1 1.28750
1 0 1 1 1 0 0 1.28125
1 0 1 1 1 1 1 1.27500
1 0 1 1 1 1 0 1.26875
1 1 0 0 0 0 1 1.26250
1 1 0 0 0 0 0 1.25625
1 1 0 0 0 1 1 1.25000
1 1 0 0 0 1 0 1.24375
1 1 0 0 1 0 1 1.23750
1 1 0 0 1 0 0 1.23125
1 1 0 0 1 1 1 1.22500
1 1 0 0 1 1 0 1.21875
1 1 0 1 0 0 1 1.21250
1 1 0 1 0 0 0 1.20625
1 1 0 1 0 1 1 1.20000
1 1 0 1 0 1 0 1.19375
1 1 0 1 1 0 1 1.18750
1 1 0 1 1 0 0 1.18125
1 1 0 1 1 1 1 1.17500
1 1 0 1 1 1 0 1.16875
1 1 1 0 0 0 1 1.16250
TABLE 2. VR10 (EXTENDED) VOLT AGE IDENTIFICA TION
CODES (Continued)
VID4 VID3 VID2 VID1 VID0 VID5 VID6 VDAC
1 1 1 0 0 0 0 1.15625
1 1 1 0 0 1 1 1.15000
1 1 1 0 0 1 0 1.14375
1 1 1 0 1 0 1 1.13750
1 1 1 0 1 0 0 1.13125
1 1 1 0 1 1 1 1.12500
1 1 1 0 1 1 0 1.11875
1 1 1 1 0 0 1 1.11250
1 1 1 1 0 0 0 1.10625
1 1 1 1 0 1 1 1.10000
1 1 1 1 0 1 0 1.09375
1111101OFF
1111100OFF
1111111OFF
1111110OFF
0 0 0 0 0 0 1 1.08750
0 0 0 0 0 0 0 1.08125
0 0 0 0 0 1 1 1.07500
0 0 0 0 0 1 0 1.06875
0 0 0 0 1 0 1 1.06250
0 0 0 0 1 0 0 1.05625
0 0 0 0 1 1 1 1.05000
0 0 0 0 1 1 0 1.04375
0 0 0 1 0 0 1 1.03750
0 0 0 1 0 0 0 1.03125
0 0 0 1 0 1 1 1.02500
0 0 0 1 0 1 0 1.01875
0 0 0 1 1 0 1 1.01250
0 0 0 1 1 0 0 1.00625
0 0 0 1 1 1 1 1.00000
0 0 0 1 1 1 0 0.99375
0 0 1 0 0 0 1 0.98750
0 0 1 0 0 0 0 0.98125
0 0 1 0 0 1 1 0.97500
0 0 1 0 0 1 0 0.96875
0 0 1 0 1 0 1 0.96250
0 0 1 0 1 0 0 0.95625
0 0 1 0 1 1 1 0.95000
0 0 1 0 1 1 0 0.94375
14
FN9289.4
August 1, 2007
ISL6312
TABLE 2. VR10 (EXTENDED) VOLTAGE IDENTIFICATION
CODES (Continued)
VID4 VID3 VID2 VID1 VID0 VID5 VID6 VDAC
0 0 1 1 0 0 1 0.93750
0 0 1 1 0 0 0 0.93125
0 0 1 1 0 1 1 0.92500
0 0 1 1 0 1 0 0.91875
0 0 1 1 1 0 1 0.91250
0 0 1 1 1 0 0 0.90625
0 0 1 1 1 1 1 0.90000
0 0 1 1 1 1 0 0.89375
0 1 0 0 0 0 1 0.88750
0 1 0 0 0 0 0 0.88125
0 1 0 0 0 1 1 0.87500
0 1 0 0 0 1 0 0.86875
0 1 0 0 1 0 1 0.86250
0 1 0 0 1 0 0 0.85625
0 1 0 0 1 1 1 0.85000
0 1 0 0 1 1 0 0.84375
0 1 0 1 0 0 1 0.83750
0 1 0 1 0 0 0 0.83125
TABLE 3. VR11 VOLTAGE IDENTIFICATION CODES
VID7 VID6 VID5 VID4 VID3 VID2 VID1 VID0 VDAC
00000000OFF
00000001OFF
000000101.60000
000000111.59375
000001001.58750
000001011.58125
000001101.57500
000001111.56875
000010001.56250
000010011.55625
000010101.55000
000010111.54375
000011001.53750
000011011.53125
000011101.52500
000011111.51875
000100001.51250
000100011.50625
000100101.50000
TABLE 3. VR11 VOLTAGE IDENTIFICATION CODES (Continued)
VID7 VID6 VID5 VID4 VID3 VID2 VID1 VID0 VDAC
000100111.49375
000101001.48750
000101011.48125
000101101.47500
000101111.46875
000110001.46250
000110011.45625
000110101.45000
000110111.44375
000111001.43750
000111011.43125
000111101.42500
000111111.41875
001000001.41250
001000011.40625
001000101.40000
001000111.39375
001001001.38750
001001011.38125
001001101.37500
001001111.36875
001010001.36250
001010011.35625
001010101.35000
001010111.34375
001011001.33750
001011011.33125
001011101.32500
001011111.31875
001100001.31250
001100011.30625
001100101.30000
001100111.29375
001101001.28750
001101011.28125
001101101.27500
001101111.26875
001110001.26250
001110011.25625
001110101.25000
15
FN9289.4
August 1, 2007
ISL6312
TABLE 3. VR11 VOLTAGE IDENTIFICATION CODES (Continued)
VID7 VID6 VID5 VID4 VID3 VID2 VID1 VID0 VDAC
001110111.24375
001111001.23750
001111011.23125
001111101.22500
001111111.21875
010000001.21250
010000011.20625
010000101.20000
010000111.19375
010001001.18750
010001011.18125
010001101.17500
010001111.16875
010010001.16250
010010011.15625
010010101.15000
010010111.14375
010011001.13750
010011011.13125
010011101.12500
010011111.11875
010100001.11250
010100011.10625
010100101.10000
010100111.09375
010101001.08750
010101011.08125
010101101.07500
010101111.06875
010110001.06250
010110011.05625
010110101.05000
010110111.04375
010111001.03750
010111011.03125
010111101.02500
010111111.01875
011000001.01250
011000011.00625
011000101.00000
TABLE 3. VR11 VOLTAGE IDENTIFICATION CODES (Continued)
VID7 VID6 VID5 VID4 VID3 VID2 VID1 VID0 VDAC
011000110.99375
011001000.98750
011001010.98125
011001100.97500
011001110.96875
011010000.96250
011010010.95625
011010100.95000
011010110.94375
011011000.93750
011011010.93125
011011100.92500
011011110.91875
011100000.91250
011100010.90625
011100100.90000
011100110.89375
011101000.88750
011101010.88125
011101100.87500
011101110.86875
011110000.86250
011110010.85625
011110100.85000
011110110.84375
011111000.83750
011111010.83125
011111100.82500
011111110.81875
100000000.81250
100000010.80625
100000100.80000
100000110.79375
100001000.78750
100001010.78125
100001100.77500
100001110.76875
100010000.76250
100010010.75625
100010100.75000
16
FN9289.4
August 1, 2007
ISL6312
TABLE 3. VR11 VOLTAGE IDENTIFICATION CODES (Continued)
VID7 VID6 VID5 VID4 VID3 VID2 VID1 VID0 VDAC
100010110.74375
100011000.73750
100011010.73125
100011100.72500
100011110.71875
100100000.71250
100100010.70625
100100100.70000
100100110.69375
100101000.68750
100101010.68125
100101100.67500
100101110.66875
100110000.66250
100110010.65625
100110100.65000
100110110.64375
100111000.63750
100111010.63125
100111100.62500
100111110.61875
101000000.61250
101000010.60625
101000100.60000
101000110.59375
101001000.58750
101001010.58125
101001100.57500
101001110.56875
101010000.56250
101010010.55625
101010100.55000
101010110.54375
101011000.53750
101011010.53125
101011100.52500
101011110.51875
101100000.51250
101100010.50625
101100100.50000
TABLE 3. VR11 VOLTAGE IDENTIFICATION CODES (Continued)
VID7 VID6 VID5 VID4 VID3 VID2 VID1 VID0 VDAC
11111110OFF
11111111OFF
TABLE 4. AMD 5-BIT VOLTAGE IDENTIFICATION CODES
VID4 VID3 VID2 VID1 VID0 VDAC
11111Off
111100.800
111010.825
111000.850
110110.875
110100.900
110010.925
110000.950
101110.975
101101.000
101011.025
101001.050
100111.075
100101.100
100011.125
100001.150
011111.175
011101.200
011011.225
011001.250
010111.275
010101.300
010011.325
010001.350
001111.375
001101.400
001011.425
001001.450
000111.475
000101.500
000011.525
000001.550
17
FN9289.4
August 1, 2007
ISL6312
TABLE 5. AMD 6-BIT VOLTAGE IDENTIFICATION COD ES
VID5 VID4 VID3 VID2 VID1 VID0 VDAC
0 0 0 0 0 0 1.5500
0 0 0 0 0 1 1.5250
0000101.5000
0000111.4750
0001001.4500
0001011.4250
0001101.4000
0001111.3750
0010001.3500
0010011.3250
0010101.3000
0010111.2750
0011001.2500
0011011.2250
0011101.2000
0011111.1750
0100001.1500
0100011.1250
0100101.1000
0100111.0750
0101001.0500
0101011.0250
0101101.0000
0101110.9750
0110000.9500
0110010.9250
0110100.9000
0110110.8750
0111000.8500
0111010.8250
0111100.8000
0111110.7750
1000000.7625
1000010.7500
1000100.7375
1000110.7250
1001000.7125
1001010.7000
1001100.6875
TABLE 5. AMD 6-BIT VOLTAGE IDEN TIFICATION CODES
VID5 VID4 VID3 VID2 VID1 VID0 VDAC
1001110.6750
1010000.6625
1010010.6500
1010100.6375
1010110.6250
1011000.6125
1011010.6000
1011100.5875
1011110.5750
1100000.5625
1100010.5500
1100100.5375
1100110.5250
1101000.5125
1101010.5000
1101100.4875
1101110.4750
1110000.4625
1110010.4500
1110100.4375
1110110.4250
1111000.4125
1111010.4000
1111100.3875
1111110.3750
(Continued)
Voltage Regulation
The integrating compensation network shown in Figure 6 insures that the steady-state error in the output voltage is limited only to the error in the reference voltage (output of the DAC) and offset errors in the OFS current source, remote-sense and error amplifiers. Intersil specifies the guaranteed tolerance of the ISL6312 to include the combined tolerances of each of these elements.
The output of the error amplifier, V triangle waveform to generate the PWM signals. The PWM signals control the timing of the Internal MOSFET drivers and regulate the converter output so that the voltage at FB is equal to the voltage at REF. This will regulate the output voltage to be equal to Equation 8. The internal and external circuitry that controls voltage regulation is illustrated in Figure 6.
, is compared to the
COMP
18
FN9289.4
August 1, 2007
ISL6312
V
OUTVREFVOFS
V
=
DROOP
(EQ. 8)
The ISL6312 incorporates an internal differential remote­sense amplifier in the feedback path. The amplifier removes the voltage error encountered when measuring the output voltage relative to the controller ground reference point resulting in a more accurate means of sensing output voltage. Connect the microprocessor sense pins to the non­inverting input, VSEN, and inverting input, RGND, of the remote-sense amplifier. The remote-sense output, V
DIFF
, is connected to the inverting input of the error amplifier through an external resistor.
EXTERNAL CIRCUIT ISL6312 INTERNAL CIRCUIT
COMP
VID DAC
C
C
R
C
+
R
(V
FB
DROOP
-
V
+
OUT
V
-
OUT
FIGURE 6. OUTPUT VOLT AGE AND LOAD-LINE
REGULATION WITH OFFSET ADJUSTMENT
REF
C
REF
IDROOP
+ V
OFS
VDIFF
VSEN
RGND
FB
)
1k
ERROR
AMPLIFIER
I
AVG
+
-
I
OFS
+
-
DIFFERENTIAL REMOTE-SENSE AMPLIFIER
V
COMP
Load-Line (Droop) Regulation
Some microprocessor manufacturers require a precisely­controlled output resistance. This dependence of output voltage on load current is often termed “droop” or “load line” regulation. By adding a well controlled output impedance, the output voltage can effectively be level shifted in a direction which works to achieve the load-line regulation required by these manufacturers.
In other cases, the designer may determine that a more cost-effective solution can be achieved by adding droop. Droop can help to reduce the output-voltage spike that results from fast load-current demand changes.
The magnitude of the spike is dictated by the ESR and ESL of the output capacitors selected. By positioning the no-load voltage level near the upper specification limit, a larger
negative spike can be sustained without crossing the lower limit. By adding a well controlled output impedance, the output voltage under load can effectively be level shifted down so that a larger positive spike can be sustained without crossing the upper specification limit.
As shown in Figure 6, a current proportional to the average current of all active channels, I load-line regulation resistor R across R
is proportional to the output current, effectively
FB
, flows from FB through a
AVG
. The resulting voltage drop
FB
creating an output voltage droop with a steady-state value defined as:
V
DROOPIAVGRFB
=
(EQ. 9)
The regulated output voltage is reduced by the droop voltage V
. The output voltage as a function of load current is
DROOP
derived by combining Equations 7, 8, and 9.
I
V
OUTVREFVOFS
In Equation 10, V
⎛⎞
=
⎜⎟ ⎝⎠
is the reference voltage, V
REF
programmed offset voltage, I of the converter, R
is the internal sense resistor
ISEN
connected to the ISEN+ pin, R
DCR
OUT
-------------
----------------- -
⋅⋅
N
R
ISEN
is the total output current
OUT
is the feedback resistor, N
FB
R
FB
OFS
(EQ. 10)
is the
is the active channel number, and DCR is the Inductor DCR value.
Therefore the equivalent loadline impedance, i.e. droop impedance, is equal to Equation 11:
R
DCR
FB
------------
----------------- -
R
LL
=
N
R
ISEN
(EQ. 11)
Output-Voltage Offset Programming
The ISL6312 allows the designer to accurately adjust the offset voltage by connecting a resistor, R pin to VCC or GND. When R
is connected between OFS
OFS
and VCC, the voltage across it is regulated to 1.6V. This causes a proportional current (I If R regulated to 0.4V, and I
is connected to ground, the voltage across it is
OFS
flows out of the FB pin. The
OFS
) to flow into the FB pin.
OFS
offset current flowing through the resistor between VDIFF and FB will generate the desired offset voltage which is equal to the product (I
x RFB). These functions are
OFS
shown in Figures 7 and 8. Once the desired output offset voltage has been determined,
use the following formulas to set R For Negative Offset (connect R
0.4 RFB⋅
OFS
--------------------------
=
V
OFFSET
R
For Positive Offset (connect R
1.6 RFB⋅
OFS
--------------------------
=
V
OFFSET
R
OFS
OFS
OFS
to GND):
to VCC):
, from the OFS
OFS
:
(EQ. 12)
(EQ. 13)
19
FN9289.4
August 1, 2007
FB
-
V
OFS
R
FB
+
VDIFF
VCC
R
OFS
OFS
ISL6312
I
OFS
1:1
CURRENT
MIRROR
I
OFS
E/A
REF
FIGURE 7. POSITIVE OFFSET OUTPUT VOL T AGE
PROGRAMMING
FB
V
+
OFS
-
VDIFF
R
FB
I
OFS
VCC
E/A
REF
VCC
-
1.6V
+
ISL6312
a new code is established and it remains stable for 3 consecutive readings (1ms to 1.33ms), the ISL6312 recognizes the new code and changes the internal DAC reference directly to the new level. The Intel processor controls the VID transitions and is responsible for incrementing or decrementing one VID step at a time. In VR10 and VR11 settings, the ISL6312 will immediately change the internal DAC reference to the new requested value as soon as the request is validated, which means the fastest recommended rate at which a bit change can occur is once every 2ms. In cases where the reference step is too large, the sudden change can trigger overcurrent or overvoltage events.
In order to ensure the smooth transition of output voltage during a VR10 or VR11 VID change, a VID step change smoothing network is required. This network is composed of an internal 1kW resistor between the DAC and the REF pin, and the external capacitor CREF, between the REF pin and ground. The selection of CREF is based on the time duration for 1 bit VID change and the allowable delay time.
Assuming the microprocessor controls the VID change at 1 bit every TVID, the relationship between CREF and TVID is given by Equation 14.
C
REF
0.001 S() T
=
VID
(EQ. 14)
As an example, for a VID step change rate of 5ms per bit, the value of CREF is 5600pF based on Equation 14.
1:1
R
OFS
GND
OFS
ISL6312
CURRENT
MIRROR
I
OFS
+
0.4V
-
GND
FIGURE 8. NEGATIVE OFFSET OUTP UT VOL TAGE
PROGRAMMING
Dynamic VID
Modern microprocessors need to make changes to their core voltage as part of normal operation. They direct the ISL6312 to do this by making changes to the VID inputs. The ISL6312 is required to monitor the DAC inputs and respond to on-the­fly VID changes in a controlled manner, sup ervising a safe output voltage transition without discontinuity or disruption. The DAC mode the ISL6312 is operating in determines how the controller responds to a dynamic VID change.
INTEL DYNAMIC VID TRANSITIONS
When in Intel VR10 or VR11 mode the ISL6312 checks the VID inputs on the positive edge of an internal 3MHz clock. If
AMD DYNAMIC VID TRANSITIONS
When running in AMD 5-bit or 6-bit modes of operation, the ISL6312 responds differently to a dynamic VID change then when in Intel VR10 or VR11 mode. In the AMD modes the ISL6312 still checks the VID inputs on the positive edge of an internal 3MHz clock. In these modes the VID code can be changed by more than a 1-bit step at a time. If a new code is established and it remains stable for 3 consecutive readings (1ms to 1.33ms), the ISL6312 recognizes the change and begins slewing the DAC in 6.25mV steps at a stepping frequency of 330kHz until the VID and DAC are equal. Thus, the total time required for a VID change, tDVID, is dependent only on the size of the VID change (DVVID).
The time required for a ISL6312-based converter in AMD 5-bit DAC configuration to make a 1.1V to 1.5V reference voltage change is about 194ms, as calculated using Equation 15.
V
t
DVID
1
------------------------- -
330 10
×
Δ
VID
⎛⎞
---------------------
=
⎝⎠
3
0.00625
(EQ. 15)
In order to ensure the smooth transition of output voltage during an AMD VID change, a VID step change smoothing network is required. This network is composed of an internal 1kΩ resistor between the DAC and the REF pin, and the external capacitor C For AMD VID transitions C
, between the REF pin and ground.
REF
should be a 1000pF
REF
capacitor.
20
FN9289.4
August 1, 2007
ISL6312
User Selectable Adaptive Deadtime Control Techniques
The ISL6312 integrated drivers incorporate two different adaptive deadtime control techniques, which the user can choose between. Both of these control techniques help to minimize deadtime, resulting in high efficiency from the reduced freewheeling time of the lower MOSFET body-diode conduction, and both help to prevent the upper and lower MOSFETs from conducting simultaneously. This is accomplished by ensuring either rising gate turns on its MOSFET with minimum and sufficient delay after the other has turned off.
The difference between the two adaptive deadtime control techniques is the method in which they detect that the lower MOSFET has transitioned off in order to turn on the upper MOSFET. The state of the DRSEL pin chooses which of the two control techniques is active. By tying the DRSEL pin directly to ground, the PHASE Detect Scheme is chosen, which monitors the voltage on the PHASE pin to determine if the lower MOSFET has transitioned off or not. Tying the DRSEL pin to VCC though a 50kΩ resistor selects the LGATE Detect Scheme, which monitors the voltage on the LGA TE pin to determine if the lower MOSFET has turned off or not. For both schemes, the method for determining whether the upper MOSFET has transitioned off in order to signal to turn on the lower MOSFET is the same.
PHASE DETECT
If the DRSEL pin is tied directly to ground, the PHASE Detect adaptive deadtime control technique is selected. For the PHASE detect scheme, during turn-off of the lower MOSFET, the PHASE voltage is monitored until it reaches a -0.3V/+0.8V (forward/reverse inductor current). At this time the UGATE is released to rise. An auto-zero comparator is used to correct the r the -0.3V phase level during r case of zero current, the UGATE is released after 35ns delay of the LGATE dropping below 0.5V. When LGATE first begins to transition low, this quick transition can disturb the PHASE node and cause a false trip, so there is 20ns of blanking time once LGA TE falls until PHASE is monitored.
Once the PHASE is high, the advanced adaptive shoot-through circuitry monitors the PHASE and UGATE voltages during a PWM falling edge and the subsequent UGATE turn-off. If either the UGATE falls to less than 1.75V above the PHASE or the PHASE falls to less than +0.8V , the LGATE is released to turn-on.
drop in the phase voltage preventing false detection of
DS(ON)
DS(ON)
conduction period. In the
Once the PHASE is high, the advanced adaptive shoot-through circuitry monitors the PHASE and UGATE voltages during a PWM falling edge and the subsequent UGATE turn-off. If either the UGATE falls to less than 1.75V above the PHASE or the PHASE falls to less than +0.8V , the LGATE is released to turn on.
Internal Bootstrap Device
All three integrated drivers feature an internal bootstrap schottky diode. Simply adding an external capacitor across the BOOT and PHASE pins completes the bootstrap circuit. The bootstrap function is also designed to prevent the bootstrap capacitor from overcharging due to the large negative swing at the PHASE node. This reduces voltage stress on the boot to phase pins.
1.6
1.4
1.2
1.0
(µF)
0.8
0.6
BOOT_CAP
C
0.4
0.2 20nC
0.0
FIGURE 9. BOOTSTRAP CAPACIT ANCE vs BOOT RIPPLE
The bootstrap capacitor must have a maximum voltage rating above PVCC + 4V and its capacitance value can be chosen from Equation 16: where Q charge per upper MOSFET at V N
is the number of control MOSFETs. The ΔV
Q1
term is defined as the allowable droop in the rail of the upper gate drive.
C
BOOT_CAP
Q
GATE
QG1PVCC
----------------------------------
V
Q
GATE
50nC
0.30.0 0.1 0.2 0.4 0.5 0.6 0.90.7 0.8 1.0
VOLTAGE
Q
GATE
--------------------------------------
ΔV
BOOT_CAP
=
GS1
N
= 100nC
ΔV
Q1
BOOT_CAP
(V)
is the amount of gate
G1
gate-source voltage and
GS1
BOOT_CAP
(EQ. 16)
LGATE DETECT
If the DRSEL pin is tied to VCC through a 50kΩ resistor, the LGA TE Detect adaptive deadtime control technique is selected. For the LGATE detect scheme, during turn-off of the lower MOSFET, the LGA TE voltage is monitored until it reaches
1.75V. At this time the UGA TE is r eleased to rise.
21
Gate Drive Voltage Versatility
The ISL6312 provides the user flexibility in choosing the gate drive voltage for efficiency optimization. The controller ties the upper and lower drive rails together. Simply applying a voltage from 5V up to 12V on PVCC sets both gate drive rail voltages simultaneously.
FN9289.4
August 1, 2007
ISL6312
Initialization
Prior to initialization, proper conditions must exist on the EN, VCC, PVCC and the VID pins. When the conditions are met, the controller begins soft-start. Once the output voltage is within the proper window of operation, the controller asserts PGOOD.
ISL6312 INTERNAL CIRCUIT
POR
CIRCUIT
SOFT-START
AND
FAULT LOGIC
FIGURE 10. POWER SEQUENCING USING THRESHOLD-
SENSITIVE ENABLE (EN) FUNCTION
ENABLE COMPARATOR
+
-
0.85V
+
-
1.21V
Enable and Disable
While in shutdown mode, the PWM outputs are held in a high-impedance state to assure the drivers remain off. The following input conditions must be met, for both Intel and AMD modes of operation, before the ISL6312 is released from shutdown mode to begin the soft-start startup sequence:
1. The bias voltage applied at VCC must reach the internal power-on reset (POR) rising threshold. Once this threshold is reached, proper operation of all aspects of the ISL6312 is guaranteed. Hysteresis between the rising and falling thresholds assure that once enabled, the ISL6312 will not inadvertently turn off unless the bias voltage drops substantially (see “Electrical Specifications” on page 6).
2. The voltage on EN must be above 0.85V. The EN input allows for power sequencing between the controller bias voltage and another voltage rail. The enable comparator holds the ISL6312 in shutdown until the voltage at EN rises above 0.85V . The enable comparator has 110mV of hysteresis to prevent bounce.
3. The voltage on the EN_PH4 pin must be above 1.21V. The EN_PH4 input allows for power sequencing between the controller and the external driver.
4. The driver bias voltage applied at the PVCC pins must reach the internal power-on reset (POR) rising threshold.
EXTERNAL CIRCUIT
VCC
PVCC1
+12V
10.7kΩ
EN
1.40kΩ
EN_PH4
In order for the ISL6312 to begin operation, PVCC1 is the only pin that is required to have a voltage applied that exceeds POR. However, for 2 or 3-phase operation PVCC2 and PVCC3 must also exceed the POR threshold. Hysteresis between the rising and falling thresholds assure that once enabled, the ISL6312 will not inadvertently turn off unless the PVCC bias voltage drops substantially (see “Electrical Specifications” on page 6).
For Intel VR10, VR11 and AMD 6-bit modes of operation these are the only conditions that must be met for the controller to immediately begin the soft-start sequence. If running in AMD 5-bit mode of operation there is one more condition that must be met:
5. The VID code must not be 11 1 1 1 in AMD 5-bit mode. This code signals the controller that no load is present. The controller will not allow soft-start to begin if this VID code is present on the VID pins.
Once all of these conditions are met the controller will begin the soft-start sequence and will ramp the output voltage up to the user designated level.
Intel Soft-Start
The soft-start function allows the converter to bring up the output voltage in a controlled fashion, resulting in a linear ramp-up. The soft-start sequence for the Intel modes of operation is slightly different then the AMD soft-start sequence.
For the Intel VR10 and VR11 modes of operation, the soft-start sequence if composed of four periods, as shown in Figure 11. Once the ISL6312 is released from shutdown and soft-start begins (as described in “Enable and Disable” on page 22), the controller will have fixed delay period TD1. After this delay period, the VR will begin first soft-start ramp until the output voltage reaches 1.1V VBOOT voltage. Then, the controller will regulate the VR voltage at 1.1V for another fixed period TD3. At the end of TD3 period, ISL6312 will read the VID signals. If the VID code is valid, ISL6312 will initiate the second soft-start ramp until the output voltage reaches the VID voltage plus/minus any offset or droop voltage.
The soft-start time is the sum of the 4 periods as shown in Equation 17.
T
SS
TD1TD2TD3TD4+++=
(EQ. 17)
22
FN9289.4
August 1, 2007
VOUT, 500mV/DIV
ISL6312
.
TDB
1
------------------------- -
×
330 10
V
VID
⎛⎞
---------------------
=
⎝⎠
3
0.00625
(EQ. 20)
After the DAC voltage reaches the final VID setting, PGOOD will be set to high with the fixed delay TDC. The typical value for TDC can range between 1.5ms and 3.0ms.
TD1
EN_VTT
PGOOD
FIGURE 11. SOFT-START WAVEFORMS
TD2
500µs/DIV
TD3 TD4
TD5
TD1 is a fixed delay with the typical value as 1.40ms. TD3 is determined by the fixed 85µs plus the time to obtain valid VID voltage. If the VID is valid before the output reaches the
1.1V, the minimum time to validate the VID input is 500ns. Therefore the minimum TD3 is about 86µs.
During TD2 and TD4, ISL6312 digitally controls the DAC voltage change at 6.25mV per step. The time for each step is determined by the frequency of the soft-start oscillator which is defined by the resistor R
from SS pin to GND. The
SS
second soft-start ramp time TD2 and TD4 can be calculated based on Equations 18 and 19:
1.1 R
SS
------------------------
TD2
TD4
6.25 25
----------------------------------------------------
V
VID
6.25 25
μs()=
1.1()RSS⋅
(EQ. 18)
μs()=
(EQ. 19)
VOUT, 500mV/DIV
TDA
EN_VTT
PGOOD
FIGURE 12. SOFT-START WAVEFORMS
TDB
500µs/DIV
TDC
Pre-Biased Soft-Start
The ISL6312 also has the ability to start up into a pre-charged output, without causing any unnecessary disturbance. The FB pin is monitored during soft-start, and should it be higher than the equivalent internal ramping reference voltage, the output drives hold both MOSFET s of f.
OUTPUT PRECHARGED
ABOVE DAC LEVEL
For example, when VID is set to 1.5V and the R
is set at
SS
100kΩ, the first soft-start ramp time TD2 will be 704µs and the se c o nd s oft-st a r t r a m p t im e T D4 will be 256µs.
NOTE: If the SS pin is grounded, the soft-start ramp in TD2 and TD4 will be defaulted to a 6.25mV step frequency of 330kHz.
After the DAC voltage reaches the final VID setting, PGOOD will be set to high with the fixed delay TD5. The typical value for TD5 is 440µs.
AMD Soft-Start
For the AMD 5-bit and 6-bit modes of operation, the soft-start sequence is composed of three periods, as shown in Figure 12. At the beginning of soft-start, the VID code is immediately obtained from the VID pins, followed by a fixed delay period TDA. After this delay period the ISL6312 will begin ramping the output voltage to the desired DAC level at a fixed rate of 6.25mV per step, with a stepping frequency of 330kHz. The amount of time required to ramp the output voltage to the final DAC voltage is referred to as TDB, and can be calculated as shown in Equation 20:
23
OUTPUT PRECHARGED
BELOW DAC LEVEL
V
GND>
GND>
T1
T2
FIGURE 13. SOFT-ST ART WAVEFORMS FOR ISL6312-BASED
MULTIPHASE CONVERTER
T3
(0.5V/DIV)
OUT
EN (5V/DIV)
Once the internal ramping reference exceeds the FB pin potential, the output drives are enabled, allowing the output to ramp from the pre-charged level to the final level dictated by the DAC setting. Should the output be pre-charged to a level exceeding the DAC setting, the output drives are enabled at the end of the soft-start period, leading to an abrupt correction in the output voltage down to the DAC-set level.
FN9289.4
August 1, 2007
ISL6312
Fault Monitoring and Protection
The ISL6312 actively monitors output voltage and current to detect fault conditions. Fault monitors trigger protective measures to prevent damage to a microprocessor load. One common power good indicator is provided for linking to external system monitors. The schematic in Figure 14 outlines the interaction between the fault monitors and the power good signal.
170μA
-
OCL
+
I
1
VDAC
VRSEL
+175mV,
+250mV,
V
+350mV
SOFT-START, FAULT
AND CONTROL LOGIC
OVP
OVPSEL
-
VSEN
RGND
+
x1
-
OV
+
-
UV
+
VDIFF
0.60 x DAC
FIGURE 14. POWER GOOD AND PROTECTION CIRCUITRY
Power Good Signal
The power good pin (PGOOD) is an open-drain logic output that signals whether or not the ISL6312 is regulating the output voltage within the proper levels, and whether any fault conditions exist. This pin should be tied to a +5V source through a resistor.
During shutdown and soft-start PGOOD pulls low and releases high after a successful soft-start and the output voltage is operating between the undervoltage and overvoltage limits. PGOOD transitions low when an undervoltage, overvoltage, or overcurrent condition is detected or when the controller is disabled by a reset from EN, EN_PH4, POR, or one of the no-CPU VID codes. In the event of an overvoltage or overcurrent condition, the controller latches off and PGOOD will not return high until after a successful soft-start. In the case of an undervoltage event, PGOOD will return high when the output voltage returns to within the undervoltage.
REPEAT FOR
EACH CHANNEL
125μA
-
OCP
+
I
AVG
PGOOD
ISL6312 INTERNAL CIRCUITRY
Overvoltage Protection
The ISL6312 constantly monitors the sensed output volt age on the VDIFF pin to detect if an overvoltage event occurs. When the output voltage rises above the OVP trip level actions are taken by the ISL6312 to protect the microprocessor load. The overvoltage protection trip level changes depending on what mode of operation the controller is in and what state the OVPSEL and VRSEL pins are in. Table 6 and 7 below list what the OVP trip levels are under all conditions.
At the inception of an overvoltage event, LGATE1, LGATE2 and LGATE3 are commanded high, PWM4 is commanded low, and the PGOOD signal is driven low. This turns on the all of the lower MOSFET s and pulls the output voltage below a level that might cause damage to the load. The LGATE outputs remain high and PWM4 remains low until VDIFF falls 100mV below the OVP threshold that tripped the overvoltage protection circuitry. The ISL6312 will continue to protect the load in this fashion as long as the overvoltage condition recurs. Once an overvoltage condition ends the ISL6312 latches off, and must be reset by toggling EN, or through POR, before a soft-start can be reinitiated.
TABLE 6. INTEL VR10 AND VR11 OVP THRESHOLDS
MODE OF
OPERATION
Soft-Start (TD1 and TD2)
Soft-Start (TD3 and TD4)
Normal Operation VDAC + 175mV VDAC + 350mV
TABLE 7. AMD OVP THRESHOLDS
MODE OF
OPERATION
Soft-Start 2.200V and
Normal Operation VDAC + 250mV VDAC + 350mV
OVPSEL PIN OPEN
OR TIED TO GND
1.280V and
VDAC + 175mV
(higher of the two)
VDAC + 175mV VDAC + 350mV
OVPSEL PIN OPEN
OR TIED TO GND
VDAC + 250mV
(higher of the two)
OVPSEL PIN TIED
TO VCC
1.280V and
VDAC + 350mV
(higher of the two)
OVPSEL PIN TIED
TO VCC
2.200V and
VDAC + 350mV
(higher of the two)
One exception that overrides the overvoltage protection circuitry is a dynamic VID transition in AMD modes of operation. If a new VID code is detected during normal operation, the OVP protection circuitry is disabled from the beginning of the dynamic VID transition, until 50μs after the internal DAC reaches the final VID setting. This is the only time during operation of the ISL6312 that the OVP circuitry is not active.
Pre-POR Overvoltage Protection
Prior to PVCC and VCC exceeding their POR levels, the ISL6312 is designed to protect the load from any overvoltage events that may occur. This is accomplished by means of an internal 10kΩ resistor tied from PHASE to LGATE, which
24
FN9289.4
August 1, 2007
turns on the lower MOSFET to control the output voltage until the overvoltage event ceases or the input power supply cuts off. For complete protection, the low side MOSFET should have a gate threshold well below the maximum voltage rating of the load/microprocessor.
In the event that during normal operation the PVCC or VCC voltage falls back below the POR threshold, the pre-POR overvoltage protection circuitry reactivates to protect from any more pre-POR overvoltage events.
Undervoltage Detection
The undervoltage threshold is set at 60% of the VID code. When the output voltage (VSEN-RGND) is below the undervoltage threshold, PGOOD gets pulled low. No other action is taken by the controller. PGOOD will return high if the output voltage rises above 70% of the VID code.
Open Sense Line Prevention
In the case that either of the remote sense lines, VSEN or GND, become open, the ISL6312 is designed to prevent the controller from regulating. This is accomplished by means of a small 5μA pull-up current on VSEN, and a pull-down current on RGND. If the sense lines are opened at any time, the voltage difference between VSEN and RGND will increase until an overvoltage event occurs, at which point overvoltage protection activates and the controller stops regulating. The ISL6312 will be latched off and cannot be restarted until the controller is reset.
ISL6312
I
I
⎛⎞ ⎜⎟
OCP
⎝⎠
>
OCPIOCP min,
125 106–R
----------------------------------------------------------
DCR
ISEN
N⋅⋅ ⋅
+
R
⎛⎞
1R2
---------------------
=
⎜⎟
R
⎝⎠
2
(EQ. 22)
The overcurrent trip level of the ISL6312 cannot be set any lower then the I
OCP,min
overcurrent trip level lower then I
level calculated above. If an
OCP,min
is desired, then the
ISL6312A should be used in the place of the ISL6312. At the beginning of overcurrent shutdown, the controller sets
all of the UGATE and LGATE signals low, puts PWM4 in a high-impedance state, and forces PGOOD low. This turns off all of the upper and lower MOSFET s. The system remains in this state for fixed period of 12ms. If the controller is still enabled at the end of this wait period, it will attempt a soft­start. If the fault remains, the trip-retry cycles will continue indefinitely until either the controller is disabled or the fault is cleared. Note that the energy delivered during trip-retry cycling is much less than during full-load operation, so there is no thermal hazard.
OUTPUT CURRENT, 50A/DIV
0A
Overcurrent Protection
The ISL6312 takes advantage of the proportionality between the load current and the average current, I overcurrent condition. See “Continuous Current Sampling” on page 12 for more detail on how the average current is measured. The average current is continually compared with a constant 125μA OCP reference current as shown in Figure 14. Once the average current exceeds the OCP reference current, a comparator triggers the converter to begin overcurrent protection procedures.
This method for detecting overcurrent events limits the minimum overcurrent trip threshold because of the fact the ISL6312 uses set internal R
current sense resistors.
ISEN
The minimum overcurrent trip threshold is dictated by the DCR of the inductors and the number of active channels. To calculate the minimum overcurrent trip level, I Equation 21, where N is the number of active channels, DCR is the individual inductor ’s DCR, and R
ISEN
internal current sense resistor.
I
OCP min,
125 106–R
----------------------------------------------------------
=
DCR
ISEN
N⋅⋅ ⋅
If the desired overcurrent trip level is greater then the minimum overcurrent trip level, I
OCP,min
divider R-C circuit around the inductor shown in Figure 5 should be used to set the desired trip level.
, to detect an
AVG
OCP,min
, use
is the 300Ω
(EQ. 21)
, then the resistor
OUTPUT VOLTAGE, 500mV/DIV
0V
FIGURE 15. OVERCURRENT BEHAVIOR IN HICCUP MODE
3ms/DIV
Individual Channel Overcurrent Limiting
The ISL6312 has the ability to limit the current in each individual channel without shutting down the entire regulator. This is accomplished by continuously comparing the sensed currents of each channel with a constant 170μA OCL reference current as shown in Figure 14. If a channel’s individual sensed current exceeds this OCL limit, the UGATE signal of that channel is immediately forced low, and the LGATE signal is forced high. This turns off the upper MOSFET(s), turns on the lower MOSFET(s), and stops the rise of current in that channel, forcing the current in the channel to decrease. That channel’s UGATE signal will not be able to return high until the sensed channel current falls back below the 170μA reference.
25
FN9289.4
August 1, 2007
ISL6312
General Design Guide
This design guide is intended to provide a high-level explanation of the steps necessary to create a multiphase power converter. It is assumed that the reader is familiar with many of the basic skills and techniques referenced below. In addition to this guide, Intersil provides complete reference designs that include schematics, bills of materials, and example board layouts for all common microprocessor applications.
Power Stages
The first step in designing a multiphase converter is to determine the number of phases. This determination depends heavily on the cost analysis which in turn depends on system constraints that differ from one design to the next. Principally, the designer will be concerned with whether components can be mounted on both sides of the circuit board, whether through-hole components are permitted, the total board space available for power-supply circuitry, and the maximum amount of load current. Generally speaking, the most economical solutions are those in which each phase handles between 25A and 30A. All surface-mount designs will tend toward the lower end of this current range. If through-hole MOSFETs and inductors can be used, higher per-phase currents are possible. In cases where board space is the limiting constraint, current can be pushed as high as 40A per phase, but these designs require heat sinks and forced air to cool the MOSFETs, inductors and heat­dissipating surfaces.
MOSFETS
The choice of MOSFETs depends on the current each MOSFET will be required to conduct, the switching frequency , the capability of the MOSFETs to dissipate heat, and the availability and nature of heat sinking and air flow .
LOWER MOSFET POWER CALCULATION
The calculation for power loss in the lower MOSFET is simple, since virtually all of the loss in the lower MOSFET is due to current conducted through the channel resistance (r output current, I Equation 1), and d is the duty cycle (V
P
). In Equation 23, IM is the maximum continuous
DS(ON)
LOW 1,
is the peak-to-peak inductor current (see
PP
OUT/VIN
2
I
LPP,
------------------------------------ -+=
r
DS ON()
⎛⎞
I
M
⎜⎟
----- ­N
⎝⎠
2
1d()
12
).
1d()
(EQ. 23)
P
LOW 2,
V
DON()fS
⎛⎞
I
M
⋅⋅=
⎜⎟
------
⎝⎠
N
I
----------+
PP
2
⎛⎞
I
⎜⎟
M
td1⋅
------
⎜⎟
N
⎝⎠
I
PP
---------­2
td2⋅+
(EQ. 24)
The total maximum power dissipated in each lower MOSFET is approximated by the summation of P
LOW,1
and P
LOW,2
.
UPPER MOSFET POWER CALCULATION
In addition to r
losses, a large portion of the upper-
DS(ON)
MOSFET losses are due to currents conducted across the input voltage (V
) during switching. Since a substantially
IN
higher portion of the upper-MOSFET losses are dependent on switching frequency, the power calculation is more complex. Upper MOSFET losses can be divided into separate components involving the upper-MOSFET switching times, the lower-MOSFET body-diode reverse­recovery charge, Q
, and the upper MOSFET r
rr
DS(ON)
conduction loss. When the upper MOSFET turns off, the lower MOSFET does
not conduct any portion of the inductor current until the voltage at the phase node falls below ground. Once the lower MOSFET begins conducting, the current in the upper MOSFET falls to zero as the current in the lower MOSFET ramps up to assume the full inductor current. In Equation 25, the required time for this commutation is t approximated associated power loss is P
P
UP 1,VIN
I
M
⎛⎞
⋅⋅
----- -
⎝⎠
N
I
-------- -+
PP
t
⎛⎞
1
f
----
⎜⎟
S
2
2
⎝⎠
and the
1
.
UP,1
(EQ. 25)
At turn on, the upper MOSFET begins to conduct and this transition occurs over a time t approximate power loss is P
I
I
⎛⎞
PP
M
P
UP 2,VIN
⋅⋅
-------- -
⎜⎟
----- ­2
N
⎝⎠
. In Equation 26, the
2
.
UP,2
t
⎛⎞
2
f
----
⎜⎟
S
2
⎝⎠
(EQ. 26)
A third component involves the lower MOSFET reverse­recovery charge, Q
. Since the inductor current has fully
rr
commutated to the upper MOSFET before the lower­MOSFET body diode can recover all of Q
, it is conducted
rr
through the upper MOSFET across VIN. The power dissipated as a result is P
VINQrrf
P
UP 3,
⋅⋅=
S
UP,3
.
(EQ. 27)
An additional term can be added to the lower-MOSFET loss equation to account for additional loss accrued during the dead time when inductor current is flowing through the lower-MOSFET body diode. This term is dependent on the diode forward voltage at I frequency, f
, and the length of dead times, td1 and td2, at
S
, V
M
, the switching
D(ON)
the beginning and the end of the lower-MOSFET conduction interval respectively.
26
Finally, the resistive part of the upper MOSFET is given in Equation 28 as P
P
UP 4,rDS ON()
UP,4
d
.
⎛⎞
I
M
⎜⎟
----- ­N
⎝⎠
2
2
I
PP
+⋅⋅
---------­12
(EQ. 28)
FN9289.4
August 1, 2007
The total power dissipated by the upper MOSFET at full load can now be approximated as the summa ti on of the resu l ts from Equations 25, 26, 27 and 28. Since the power equations depend on MOSFET parameters, choosing the correct MOSFETs can be an iterative process involving repetitive solutions to the loss equations for different MOSFETs and different switching frequencies.
Package Power Dissipation
When choosing MOSFETs it is important to consider the amount of power being dissipated in the integrated drivers located in the controller. Since there are a total of three drivers in the controller package, the total power dissipated by all three drivers must be less than the maximum allowable power dissipation for the QFN package.
ISL6312
PVCC
BOOT
R
PHASE
R
HI1
LO1
UGATE
G1
D
C
GD
G
R
GI1R
C
GS
C
DS
Q1
S
FIGURE 16. TYPICAL UPPER-GATE DRIVE TURN-ON PATH
Calculating the power dissipation in the drivers for a desired application is critical to ensure safe operation. Exceeding the maximum allowable power dissipation level will push the IC beyond the maximum recommended operating junction temperature of +125°C. The maximum allowable IC power dissipation for the 7x7 QFN package is approximately 3.5W at room temperature. See “Layout Considerations” on page 32 for thermal transfer improvement suggestions.
When designing the ISL6312 into an application, it is recommended that the following calculation is used to ensure safe operation at the desired frequency for the selected MOSFETs. The total gate drive power losses, P
Qg_TOT
, due to the gate charge of MOSFETs and the integrated driver’s internal circuitry and their corresponding average driver current can be estimated with Equations 29 and 30, respectively.
P
Qg_TOTPQg_Q1PQg_Q2IQ
3
P
Qg_Q1
P
Qg_Q2QG2
-- -
2
PVCC FSWNQ1N
⋅⋅ ⋅ ⋅⋅=
Q
G1
PVCC FSWNQ2N
⋅⋅⋅⋅=
VCC++=
(EQ. 29)
PHASE
PHASE
PVCC
D
C
GD
R
HI2
R
LO2
LGATE
G
R
GI2
R
G2
C
GS
S
Q2
C
DS
FIGURE 17. TYPICAL LOWER-GATE DRIVE TURN-ON PATH
The total gate drive power losses are dissipated among the resistive components along the transition path and in the bootstrap diode. The portion of the total power dissipated in the controller itself is the power dissipated in the upper drive path resistance, P P
, and in the boot strap diode, P
DR_UP
power will be dissipated by the external gate resistors (R and R
) and the internal gate resistors (R
G2
, the lower drive path resistance,
DR_UP
BOOT
. The rest of the
and R
GI1
GI2
G1
) of the MOSFETs. Figures 16 and 17 show the typical upper and lower gate drives turn-on transition path. The total power dissipation in the controller itself, P
, can be roughly
DR
estimated as:
(EQ. 30)
3
⎛⎞
I
In Equations 29 and 30, P power loss and P loss; the gate charge (Q
-- -
DR
⎝⎠
2
N
QG2NQ2⋅+
Q
G1
Q1
Qg_Q2
N
PHASEFSWIQ
is the total upper gate drive
Qg_Q1
is the total lower gate drive power
and QG2) is defined at the
G1
+⋅⋅=
particular gate to source drive voltage PVCC in the corresponding MOSFET data sheet; I quiescent current with no load at both drive outputs; N and N phase, respectively; N phases. The I
are the number of upper and lower MOSFETs per
Q2
VCC product is the quiescent power of the
Q*
is the number of active
PHASE
is the driver total
Q
Q1
controller without capacitive load and is typically 75mW at 300kHz.
27
P
DRPDR_UPPDR_LOW PBOOTIQ
P
Qg_Q1
P
BOOT
P
DR_UP
P
DR_LOW
R
EXT1RG1
---------------------
=
3
R
⎛⎞
HI1
--------------------------------------
⎜⎟
R
+
⎝⎠
HI1REXT1
R
⎛⎞
HI2
--------------------------------------
⎜⎟
R
+
⎝⎠
HI2REXT2
R
GI1
-------------
+=
N
Q1
R
LO1
----------------------------------------
+
R
+
LO1REXT1
R
LO2
----------------------------------------
+
R
+
LO2REXT2
R
EXT2RG2
VCC()+++=
P
Qg_Q1
---------------------
=
P
---------------------
=
R
-------------
+=
N
3
Qg_Q2
2
GI2
Q2
August 1, 2007
(EQ. 31)
FN9289.4
ISL6312
Inductor DCR Current Sensing Component Selection
The ISL6312 senses each individual channel’s inductor current by detecting the voltage across the output inductor DCR of that channel (As described in the “Continuous Current Sampling” on page 12). As Figure 18 illustrates, an R-C network is required to accurately sense the inductor DCR voltage and convert this information into a current, which is proportional to the total output current. The time constant of this R-C network must match the time constant of the inductor L/DCR.
V
UGATE(n)
MOSFET
DRIVER
ISL6312 INTERNAL CIRCUIT
LGATE(n)
In
IN
I
L
L
DCR
INDUCTOR
VL(s)
+
VC(s)
+
R
1
V
OUT
C
-
C
1
R
2*
OUT
-
2. Plug the inductor L and DCR component values, and the value for C
chosen in step 1, into Equation 33 to
1
calculate the value for R1.
1
3. Resistor R
DCR C
1
should be left unpopulated.
2
L
-------------------------
R
=
If the desired overcurrent trip level, I minimum overcurrent trip level, I
OCP,min
I
=
OCPIOCP min,
, is greater then the
OCP
, then a resistor
(EQ. 33)
divider R-C circuit should be used to set the desired trip level. Follow the steps below to choose the component
values for the resistor divider R-C current sensing network:
1. Choose an arbitrary value for C
. The recommended
1
value is 0.1μF.
2. Plug the inductor L and DCR component values, the value for C1 chosen in step 1, the number of active channels N, and the desired overcurrent protection level
into Equations 34 and 35 to calculate the values for
I
OCP
R1 and R2.
LI
1
R
2
0.0375 N⋅⋅
C
1
LI
----------------------------------------------------------------------------------
=
C
1IOCP
OCP
DCR 0.0375 N()
OCP
---------------------------------------
R
=
I
>
OCPIOCP min,
(EQ. 34)
(EQ. 35)
SAMPLE
I
SEN
+
+
VC(s)
-
R
ISEN
-
ISEN-(n)
ISEN+(n)
*R2 is OPTIONAL
FIGURE 18. DCR SENSING CONFIGURATION
The R-C network across the inductor also sets the overcurrent trip threshold for the regulator. Before the R-C components can be selected, the desired overcurrent protection level should be chosen. The minimum overcurrent trip threshold the controller can support is dictated by the DCR of the inductors and the number of active channels. To calculate the minimum overcurrent trip level, I
OCP,min
, use Equation 32 below, where N is the number of active channels, and DCR is the individual inductor’s DCR.
I
OCP min,
0.0375 N
-------------------------- -
=
DCR
(EQ. 32)
The overcurrent trip level of the ISL6312 cannot be set any lower then the I
OCP,min
level calculated above. If the
minimum overcurrent trip level is desired, follow the steps below to choose the component values for the R-C current sensing network:
1. Choose an arbitrary value for C
. The recommended
1
value is 0.1μF.
Due to errors in the inductance or DCR it may be necessary to adjust the value of R
and R2 to match the time constants
1
correctly. The ef fects of time constant mismatch can be seen in the form of droop overshoot or undershoot during the initial load transient spike, as shown in Figure 19. Follow the steps below to ensure the R-C and inductor L/DCR time constants are matched accurately.
1. Capture a transient event with the oscilloscope set to about L/DCR/2 (sec/div). For example, with L = 1μH and DCR = 1mΩ, set the oscilloscope to 500μs/div.
2. Record ΔV1 and ΔV2 as shown in Figure 19.
ΔV
ΔV
1
FIGURE 19. TIME CONSTANT MISMATCH BEHAVIOR
2
V
OUT
I
TRAN
ΔI
28
FN9289.4
August 1, 2007
ISL6312
3. Select new values, R constant resistors based on the original values, R and R
R
1NEW,
R
2NEW,
4. Replace R
, using Equations 36 and 37.
2,OLD
R
R
1
=
1OLD,
=
2OLD,
and R2 with the new values and check to see
1,NEW
V1Δ
----------
V
Δ
2
V1Δ
----------
V
Δ
2
and R
2,NEW
, for the time
1,OLD
(EQ. 36)
(EQ. 37)
that the error is corrected. Repeat the procedure if necessary.
Loadline Regulation Resistor
If loadline regulation is desired, the IDROOP pin should be shorted to the FB pin in order for the internal average sense current to flow out across the loadline regulation resistor, labeled R the desired loadline required for the application. The desired loadline, R where V current I
R
LL
DROOP
.
FL
V
DROOP
------------------------ -= I
FL
Based on the desired loadline, the loadline regulation resistor, RFB, can be calculated from Equation 39 or Equation 40, depending on the R-C current sense circuitry being employed. If a basic R-C sense circuit consisting of C1 and R1 is being used, use Equation 39. If a resistor divider R-C sense circuit consisting of R1, R2, and C1 is being used, use Equation 40.
in Figure 6. This resistor’s value sets
FB
, can be calculated by Equation 38
LL
is the desired droop voltage at the full load
(EQ. 38)
COMPENSATION WITH LOAD-LINE REGULATION
The load-line regulated converter behaves in a similar manner to a peak current mode controller because the two poles at the output filter L-C resonant frequency split with the introduction of current information into the control loop. The final location of these poles is determined by the system function, the gain of the current signal, and the value of the compensation components, R
C2 (OPTIONAL)
R
C
R
FB
FIGURE 20. COMPENSATION CONFIGURA TION FOR
LOAD-LINE REGULATED ISL6312 CIRCUIT
C
C
and CC.
C
COMP
IDROOP
VDIFF
FB
ISL6312
Since the system poles and zero are affected by the values of the components that are meant to compensate them, the solution to the system equation becomes fairly complicated. Fortunately, there is a simple approximation that comes very close to an optimal solution. Treating the system as though it were a voltage-mode regulator, by compensating the L-C poles and the ESR zero of the voltage mode approximation, yields a solution that is always stable with very close to ideal transient performance.
RLLN 300⋅⋅
--------------------------------- -
=
R
FB
R
FB
DCR
RLLN 300 R1R2+()⋅⋅ ⋅
----------------------------------------------------------------
=
DCR R
2
In Equations 39 and 40, R
is the loadline resistance; N is
LL
(EQ. 39)
(EQ. 40)
the number of active channels; DCR is the DCR of the individual output inductors; and R1 and R2 are the current sense R-C resistors.
If no loadline regulation is required, the IDROOP pin should be left open and not connected to anything. To choose the value for R
in this situation, please refer to the
FB
Compensation Without Loadline Regulation section.
Compensation
The two opposing goals of compensating the voltage regulator are stability and speed. Depending on whether the regulator employs the optional load-line regulation as described in Load-Line Regulation, there are two distinct methods for achieving these goals.
Select a target bandwidth for the compensated system, f0. The target bandwidth must be large enough to assure adequate transient performance, but smaller than 1/3 of the per-channel switching frequency. The values of the compensation components depend on the relationships of f0 to the L-C pole frequency and the ESR zero frequency. For each of the following three, there is a separate set of equations for the compensation components.
In Equation 41, L is the per-channel filter inductance divided by the number of active channels; C is the sum total of all output capacitors; ESR is the equivalent series resistance of the bulk output filter capacitance; and VPP is the peak-to­peak sawtooth signal amplitude as described in the “Electrical Specifications” on page 6 .
Once selected, the compensation values in Equation 41 assure a stable converter with reasonable transient performance. In most cases, transient performance can be improved by making adjustments to RC. Slowly increase the value of RC while observing the transient performance on an oscilloscope until no further improvement is noted. Normally, CC will not need adjustment. Keep the value of CC from Equation 41 unless some performance issue is noted.
29
FN9289.4
August 1, 2007
ISL6312
.
1
Case 1:
Case 2:
Case 3:
------------------------------- -f 2 π LC⋅⋅
R
CRFB
C
C
1
------------------------------- ­2 π LC⋅⋅
R
CRFB
C
C
f
0
R
CRFB
C
C
>
0
2 π f0VppLC⋅⋅ ⋅ ⋅
--------------------------------------------------------
=
0.66 V
0.66 VIN⋅
----------------------------------------------------= 2 π V
⋅⋅
PPRFBf0
f
-------------------------------------<
0
2 π C ESR⋅⋅ ⋅
VPP2 π⋅()
---------------------------------------------------------------- -
=
0.66 V
-------------------------------------------------------------------------------------= 2 π⋅()
-------------------------------------> 2 π C ESR⋅⋅ ⋅
0.66 VIN⋅
2
2
f
VPPR
0
1
2 π f0VppL⋅⋅ ⋅ ⋅
---------------------------------------------
=
0.66 V
0.66 VINESR C⋅⋅ ⋅
----------------------------------------------------------------= 2 π V
PPRFBf0
IN
1
2
2
f
LC⋅⋅⋅
0
IN
LC⋅⋅ ⋅ ⋅
FB
ESR⋅⋅
IN
(EQ. 41)
L⋅⋅ ⋅ ⋅
The optional capacitor C2, is sometimes needed to bypass noise away from the PWM comparator (see Figure 20). Keep a position available for C
, and be prepared to install a high-
2
frequency capacitor of between 22pF and 150pF in case any leading edge jitter problem is noted.
COMPENSATION WITHOUT LOAD-LINE REGULATION
The non load-line regulated converter is accurately modeled as a voltage-mode regulator with two poles at the L-C resonant frequency and a zero at the ESR frequency. A type III controller, as shown in Figure 20, provides the necessary compensation.
The first step is to choose the desired bandwidth, f
, of the
0
compensated system. Choose a frequency high enough to assure adequate transient performance but not higher than 1/3 of the switching frequency. The type-III compensator has an extra high-frequency pole, f
. This pole can be used for
HF
added noise rejection or to assure adequate attenuation at the error-amplifier high-order pole and zero frequencies. A good general rule is to choose f higher if desired. Choosing f
= 10f0, but it can be
HF
to be lower than 10f0 can
HF
cause problems with too much phase shift below the system bandwidth.
C
2
C
C
R
C
C
1
R
R
1
FB
COMP
FB
ISL6312
IDROOP
VDIFF
FIGURE 21. COMPENSATION CIRCUIT WITHOUT LOAD-LINE
REGULATION
In the solutions to the compensation equations, there is a single degree of freedom. For the solutions presented in Equation 42, R
is selected arbitrarily. The remaining
FB
compensation components are then selected according to Equation 42.
In Equation 42, L is the per-channel filter inductance divided by the number of active channels; C is the sum total of all output capacitors; ESR is the equivalent-series resistance of the bulk output-filter capacitance; and V
is the peak-to-
PP
peak sawtooth signal amplitude as described in “Electrical Specifications” on page 6.
CESR
--------------------------------------------
R1R
C
1
C
2
R
C
C
C
=
FB
LC C ESR
LC C ESR
--------------------------------------------= R
FB
-------------------------------------------------------------------------------------------------------------=
2
2 π⋅()
⎛⎞
VPP2π
⎝⎠
---------------------------------------------------------------------------------------- -=
0.75 V
0.75 VIN2 π f
-------------------------------------------------------------------------------------------------------------=
2
2 π⋅()
0.75 VIN⋅
f0f
⋅⋅ ⋅ ⋅ ⋅
HF
2
f0fHFLCR
⋅⋅ ⋅⋅⋅
2 π f
IN
f0f
⋅⋅ ⋅ ⋅ ⋅
HF
LC()RFBV
FB
LC 1–⋅⋅ ⋅()⋅⋅
HF
LC 1–⋅⋅ ⋅()⋅⋅
HF
LC()RFBV
PP()
(EQ. 42)
PP()
Output Filter Design
The output inductors and the output capacitor bank together to form a low-pass filter responsible for smoothing the pulsating voltage at the phase nodes. The output filter also must provide the transient energy until the regulator can respond. Because it has a low bandwidth compared to the switching frequency, the output filter limits the system transient response. The output capacitors must supply or sink load current while the current in the output inductors increases or decreases to meet the demand.
30
FN9289.4
August 1, 2007
ISL6312
In high-speed converters, the output capacitor bank is usually the most costly (and often the largest) part of the circuit. Output filter design begins with minimizing the cost of this part of the circuit. The critical load parameters in choosing the output capacitors are the maximum size of the load step, ΔI, the load-current slew rate, di/dt, and the maximum allowable output-voltage deviation under transient loading, ΔV
MAX
. Capacitors are characterized according to their capacita nce, ESR, and ESL (equivalent series inductance).
At the beginning of the load transient, the output capacitors supply all of the transient current. The output voltage will initially deviate by an amount approximated by the voltage drop across the ESL. As the load current increases, the voltage drop across the ESR increases linearly until the load current reaches its final value. The capacitors selected must have sufficiently low ESL and ESR so that the total output­voltage deviation is less than the allowable maximum. Neglecting the contribution of inductor current and regulator response, the output voltage initially deviates by an amount:
ΔVESL
di
-----
ESR ΔI+
dt
(EQ. 43)
The filter capacitor must have sufficiently low ESL and ESR so that ΔV < ΔV
MAX
.
Most capacitor solutions rely on a mixture of high frequency capacitors with relatively low capacitance in combination with bulk capacitors having high capacitance but limited high-frequency performance. Minimizing the ESL of the high-frequency capacitors allows them to support the output voltage as the current increases. Minimizing the ESR of the bulk capacitors allows them to supply the increased current with less output voltage deviation.
output-voltage deviation than the leading edge. Equation 46 addresses the leading edge. Normally, the trailing edge dictates the selection of L because duty cycles are usually less than 50%. Nevertheless, both inequalities should be evaluated, and L should be selected based on the lower of the two results. In each equation, L is the per-channel inductance, C is the total output capacitance, and N is the number of active channels.
2NCV
⋅⋅⋅
---------------------------------
L
1.25
-----------------------------
L
()
ΔI
NC⋅⋅
2
()
ΔI
O
ΔV
2
ΔV
⋅⋅
MAX
ΔIESR()
MAX
ΔI ESR() VINVO–
⎛⎞ ⎝⎠
(EQ. 45)
(EQ. 46)
Switching Frequency
There are a number of variables to consider when choosing the switching frequency, as there are considerable effects on the upper MOSFET loss calculation. These effects are outlined in “MOSFETs” on page 26, and they establish the upper limit for the switching frequency. The lower limit is established by the requirement for fast transient response and small output-voltage ripple as outlined in “Compensation without load-line regulation” on page 30. Choose the lowest switching frequency that allows the regulator to meet the transient-response requirements.
Switching frequency is determined by the selection of the frequency-setting resistor, R are provided to assist in selecting the correct value for R
[]
=
1000
10.61 1.035 fS()log()
RT10
. Figure 22 and Equation 47
T
(EQ. 47)
.
T
The ESR of the bulk capacitors also creates the majority of the output-voltage ripple. As the bulk capacitors sink and source the inductor AC ripple current (see “Interleaving” on page 10 and Equation 2), a voltage develops across the bulk capacitor ESR equal to I
(ESR). Thus, once the output
C,PP
capacitors are selected, the maximum allowable ripple voltage, V
PP(MAX)
, determines the lower limit on the
inductance.
⎛⎞
NV
V
IN
L
⎝⎠
------------------------------------------------------------------- -
ESR
f
⋅⋅
SVINVPP MA X()
OUT
V
OUT
(EQ. 44)
Since the capacitors are supplying a decreasing portion of the load current while the regulator recovers from the transient, the capacitor voltage becomes slightly depleted. The output inductors must be capable of assuming the entire load current before the output voltage decreases more than ΔV
. This places an upper limit on inductance.
MAX
Equation 45 gives the upper limit on L for the cases when the trailing edge of the current transient causes a greater
31
100
(kΩ)
T
R
10
10 100 1000 10000
FIGURE 22. RT vs SWITCHING FREQUENCY
SWITCHING FREQUENCY (kHz)
Input Capacitor Selection
The input capacitors are responsible for sourcing the AC component of the input current flowing into the upper MOSFETs. Their RMS current capacity must be sufficient to handle the AC component of the current drawn by the upper MOSFETs which is related to duty cycle and the number of active phases.
FN9289.4
August 1, 2007
ISL6312
0.3 I
= 0
L(P-P)
I
)
O
I
RMS/
0.2
0.1
INPUT-CAPACITOR CURRENT (I
= 0.25 I
L(P-P)
0
00.4 1.00.2 0.6 0.8
O
I
L(P-P)
I
L(P-P)
DUTY CYCLE (V
= 0.5 I = 0.75 I
O/VIN
O
O
)
FIGURE 23. NORMALIZED INPUT -CAP ACITOR RMS CURRENT
vs DUTY CYCLE FOR 4-PHASE CONVERTER
For a four-phase design, use Figure 23 to determine the input-capacitor RMS current requirement set by the duty cycle, maximum sustained output current (I of the peak-to-peak inductor current (I
), and the ratio
O
) to IO. Select a
(P-P)
L
bulk capacitor with a ripple current rating which will minimize the total number of input capacitors required to support the RMS current calculated.
The voltage rating of the capacitors should also be at least
1.25x greater than the maximum input voltage. Figures 24 and 25 provide the same input RMS current information for three-phase and two-phase designs respectively. Use the same approach for selecting the bulk capacitor type and number.
0.3
I
= 0
(P-P)
L
)
O
I
RMS/
0.2
= 0.25 I
I
(P-P)
L
O
I I
L L
(P-P) (P-P)
= 0.5 I = 0.75 I
O
O
close as possible to each upper MOSFET drain to minimize board parasitics and maximize suppression.
0.3
)
O
I
RMS/
0.2
0.1
I
= 0
(P-P)
L
= 0.5 I
I
(P-P)
L
INPUT-CAPACITOR CURRENT (I
I
(P-P)
L
0
00.4 1.00.2 0.6 0.8
= 0.75 I
O
O
DUTY CYCLE (V
IN/VO
)
FIGURE 25. NORMALIZED INPUT-CAPACITOR RMS
CURRENT FOR 2-PHASE CONVERTER
Layout Considerations
MOSFETs switch very fast and efficiently. The speed with which the current transitions from one device to another causes voltage spikes across the interconnecting impedances and parasitic circuit elements. These voltage spikes can degrade efficiency, radiate noise into the circuit and lead to device overvoltage stress. Careful component selection, layout, and placement minimizes these voltage spikes. Consider, as an example, the turnoff transition of the upper PWM MOSFET. Prior to turnoff, the upper MOSFET was carrying channel current. During the turnoff, current stops flowing in the upper MOSFET and is picked up by the lower MOSFET. Any inductance in the switched current path generates a large voltage spike during the switching interval. Careful component selection, tight layout of the critical components, and short, wide circuit traces minimize the magnitude of voltage spikes.
0.1
INPUT-CAPACITOR CURRENT (I
0
00.4 1.00.2 0.6 0.8 DUTY CYCLE (V
IN/VO
)
FIGURE 24. NORMALIZED INPUT-CAP ACITOR RMS
CURRENT FOR 3-PHASE CONVERTER
Low capacitance, high-frequency ceramic capacitors are needed in addition to the input bulk capacitors to suppress leading and falling edge voltage spikes. The spikes result from the high current slew rate produced by the upper MOSFET turn on and off. Select low ESL ceramic capacitors and place one as
32
There are two sets of critical components in a DC/DC converter using a ISL6312 controller. The power components are the most critical because they switch large amounts of energy. Next are small signal components that connect to sensitive nodes or supply critical bypassing current and signal coupling.
The power components should be placed first, which include the MOSFET s, input and output capacitors, and the inductors. It is important to have a symmetrical layout for each power train, preferably with the controller located equidistant from each. Symmetrical layout allows heat to be dissipated equally across all power trains. Equidistant placement of the controller to the first three power trains it controls through the integrated drivers helps keep the gate drive traces equally short, resulting in equal trace impedances and similar drive capability of all sets of MOSFETs.
FN9289.4
August 1, 2007
ISL6312
When placing the MOSFETs try to keep the source of the upper FETs and the drain of the lower FETs as close as thermally possible. Input Bulk capacitors should be placed close to the drain of the upper FETs and the source of the lower FETs. Locate the output inductors and output capacitors between the MOSFET s and the load. The high-frequency input and output decoupling capacitors (ceramic) should be placed as close as practicable to the decoupling target, making use of the shortest connection paths to any internal planes, such as vias to GND next or on the capacitor solder pad.
The critical small components include the bypass capacitors for VCC and PVCC, and many of the components surrounding the controller including the feedback network and current sense components. Locate the VCC/PVCC bypass capacitors as close to the ISL6312 as possible. It is especially important to locate the components associated with the feedback circuit close to their respective controller pins, since they belong to a high-impedance circuit loop, sensitive to EMI pick-up.
A multi-layer printed circuit board is recommended. Figure 26 shows the connections of the critical components for the converter. Note that capacitors C
xxIN
and C
xxOUT
could each represent numerous physical capacitors. Dedicate one solid layer, usually the one underneath the component side of the board, for a ground plane and make all critical component ground connections with vias to this layer. Dedicate another solid layer as a power plane and break this plane into smaller islands of common voltage levels. Keep the metal runs from the PHASE terminal to output inductors short. The power plane should support the input power and output power nodes. Use copper filled polygons on the top and bottom circuit layers for the phase nodes. Use the remaining printed circuit layers for small signal wiring.
Routing UGATE, LGA TE, and PHASE Traces
Great attention should be paid to routing the UGATE, LGATE, and PHASE traces since they drive the power train MOSFETs using short, high current pulses. It is important to size them as large and as short as possible to reduce their overall impedance and inductance. They should be sized to carry at least one ampere of current (0.02” t o 0 . 0 5 ” ) . G o i n g between layers with vias should also be avoided, but if so, use two vias for interconnection when possible.
Extra care should be given to the LGATE traces in particular since keeping their impedance and inductance lo w helps to significantly reduce the possibility of shoot-through. It is also important to route each channels UGATE and PHASE traces in as close proximity as possible to reduce their inductances.
Current Sense Component Placement and Trace Routing
One of the most critical aspects of the ISL6312 regulator layout is the placement of the inductor DCR current sense components and traces. The R-C current sense components must be placed as close to their respective ISEN+ and ISEN- pins on the ISL6312 as possible.
The sense traces that connect the R-C sense components to each side of the output inductors should be routed on the bottom of the board, away from the noisy switching components located on the top of the board. These traces should be routed side by side, and they should be very thin traces. It’s important to route these traces as far away from any other noisy traces or planes as possible. These traces should pick up as little noise as possible.
Thermal Management
For maximum thermal performance in high current, high switching frequency applications, connecting the thermal GND pad of the ISL6312 to the ground plane with multiple vias is recommended. This heat spreading allows the part to achieve its full thermal potential. It is also recommended that the controller be placed in a direct path of airflow if possible to help thermally manage the part.
All Intersil U.S. products are manufactured, assembled and tested utilizing ISO9000 quality systems.
Intersil Corporation’s quality certifications can be viewed at www.intersil.com/design/quality
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design, software and/or specifications at any time without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implicat ion or oth erwise u nde r any p a tent or p at ent r ights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see www.intersil.com
33
FN9289.4
August 1, 2007
ISL6312
(CF1)
R
T
+5V
+12V
C
2
C
1
R
1
FB
COMP
VSEN RGND
VCC
R
OFS
OFS
FS REF
C
REF
SS
R
SS
OVPSEL
VID7
VID6
VID5
VID4
VID3
VID2 VID1 VID0
VRSEL
PGOOD
R
EN1
EN
R
EN2
DRSEL
R
DR
GND
IDROOP
R
FB
VDIFF
ISL6312
LOCATE CLOSE TO IC
(MINIMIZE CONNECTION PATH)
C
BOOT1
UGATE1
PHASE1
LGATE1
ISEN1­ISEN1+
PVCC1_2
BOOT2
UGATE2
PHASE2
LGATE2
ISEN2-
ISEN2+
PVCC3
BOOT3
UGATE3
PHASE3
LGATE3
ISEN3-
ISEN3+
EN_PH4
BOOT1
(CF2)
C
(CF2)
C
+12V
BOOT2
BOOT3
VCC PVCC
BOOT
ISL6612
PWM4
ISEN4-
ISEN4+
PWM
+12V
+12V
+12V
UGATE
PHASE
LGATE
GND
KEY
HEAVY TRACE ON CIRCUIT PLANE LAYER
ISLAND ON POWER PLANE LAYER
ISLAND ON CIRCUIT PLANE LAYER
VIA CONNECTION TO GROUND PLANE
C
BIN1
LOCATE NEAR SWITCHING TRANSISTORS;
(MINIMIZE CONNECTION PATH)
R
C
1
1
C
BIN2
R
C
1
1
C
BIN3
LOCATE NEAR LOAD;
(MINIMIZE CONNECTION
R
C
1
1
+12V
C
BIN4
R
C
1
1
(C
HFOUT
)
PATH)
C
BOUT
LOAD
FIGURE 26. PRINTED CIRCUIT BOARD POWER PLANES AND ISLANDS
34
FN9289.4
August 1, 2007
Package Outline Drawing
L48.7x7
48 LEAD QUAD FLAT NO-LEAD PLASTIC PACKAGE Rev 4, 10/06
7.00
6
PIN 1
INDEX AREA
A
B
ISL6312
36
37
4X
44X
5.5
0.50 48
6
PIN #1 INDEX AREA
1
(4X) 0.15
( 6 . 80 TYP )
( 4 . 30 )
TOP VIEW
TYPICAL RECOMMENDED LAND PATTERN
7.00
0 . 90 ± 0 . 1
( 44X 0 . 5 )
( 48X 0 . 23 )
( 48X 0 . 60 )
25
24
48X 0 . 40± 0 . 1
BOTTOM VIEW
SIDE VIEW
0 . 2 REF
C
DETAIL "X"
0 . 00 MIN. 0 . 05 MAX.
12
13
4
BASE PLANE
5
4. 30 ± 0 . 15
M0.10 C AB
0.23 +0.07 / -0.05
SEE DETAIL "X"
C
C
0.10
SEATING PLANE
C0.08
35
NOTES:
Dimensions are in millimeters.1. Dimensions in ( ) for Reference Only.
2.
Dimensioning and tolerancing conform to AMSE Y14.5m-1994.
3.
Unless otherwise specified, tolerance : Decimal ± 0.05
4.
Dimension b applies to the metallized terminal and is measured
between 0.15mm and 0.30mm from the terminal tip.
Tiebar shown (if present) is a non-functional feature.
5.
The configuration of the pin #1 identifier is optional, but must be
6. located within the zone indicated. The pin #1 indentifier may be
either a mold or mark feature.
FN9289.4
August 1, 2007
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