Datasheet IS93C56-3GI, IS93C56-3G, IS93C56-3PI, IS93C56-3P, IS93C56-3GRI Datasheet (ISSI)

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IS93C56-3
2,048-BIT SERIAL ELECTRICALLY ERASABLE PROM
FEATURES
• State-of-the-art architecture — Non-volatile data storage — Low voltage operation:
3.0V (Vcc = 2.7V to 6.0V) — Full TTL compatible inputs and outputs — Auto increment for efficient data dump
• Low voltage read operation — Down to 2.7V
• Hardware and software write protection — Defaults to write-disabled state at power-up — Software instructions for write-enable/disable
2
• Advanced low voltage CMOS E technology
• Versatile, easy-to-use Interface — Self-timed programming cycle — Automatic erase-before-write — Programming status indicator — Word and chip erasable — Stop SK anytime for power savings
• Durable and reliable — 10-year data retention after 100K write cycles — 100,000 write cycles — Unlimited read cycles
PROM
OVERVIEW
The IS93C56-3 is a low cost 2,048-bit, non-volatile, serial E2PROM. It is fabricated using ISSI’s advanced CMOS E2PROM technology. The IS93C56-3 provides efficient non-volatile read/write memory arranged as 128 registers of 16 bits each. Seven 11-bit instructions control the operation of the device, which includes read, write, and mode enable functions. The data out pin (DOUT) indicates the status of the device during in the self-timed non­volatile programming cycle.
The self-timed write cycle includes an automatic erase­before-write capability. To protect against inadvertent writes, the WRITE instruction is accepted only while the chip is in the write enabled state. Data is written in 16 bits per write instruction into the selected register. If Chip Select (CS) is brought HIGH after initiation of the write cycle, the Data Output (DOUT) pin will indicate the READY/ BUSY status of the chip.
APPLICATIONS
The IS93C56-3 is ideal for high-volume applications requiring low power and low density storage. This device uses a low cost, space saving 8-pin package. Candidate applications include robotics, alarm devices, electronic locks, meters and instrumentation settings.
ISSI
MARCH 2001
FUNCTIONAL BLOCK DIAGRAM
DATA
REGISTER
D
IN
CS
SK
ISSI reserves the right to make changes to its products at any time without notice in order to improve design and supply the best possible product. We assume no responsibility for any errors which may appear in this publication. © Copyright 2001, Integrated Silicon Solution, Inc.
Integrated Silicon Solution, Inc. — 1-800-379-4774
Rev. G
04/26/01
INSTRUCTION
REGISTER
(11 BITS)
INSTRUCTION
DECODE,
CONTROL,
AND
CLOCK
GENERATION
(16 BITS)
ADDRESS
REGISTER
WRITE
ENABLE
DUMMY
BIT
R/W
AMPS
1 OF 128
DECODER
HIGH VOLTAGE
GENERATOR
EEPROM
(128 X 16)
ARRAY
D
OUT
1
IS93C56-3
®
ISSI
PIN CONFIGURATION
8-Pin DIP
8
VCC
7
NC
6
NC
5
GND
D
CS SK
D
OUT
1 2 3
IN
4
PIN DESCRIPTIONS
CS Chip Select SK Serial Data Clock DIN Serial Data Input DOUT Serial Data Output NC Not Connected Vcc Power GND Ground
PIN CONFIGURATION
8-Pin JEDEC Small Outline “G”
8
NC
VCC
CS
SK
1 2 3 4
NC
7
GND
6
D
OUT
5
D
IN
PIN CONFIGURATION
8-Pin JEDEC Small Outline “GR”
8
VCC
7
NC
6
NC
5
GND
D
CS SK
D
OUT
1 2 3
IN
4
ENDURANCE AND DATA RETENTION
The IS93C56-3 is designed for applications requiring up to 100,000 ERAL). power after the execution of
programming cycles
(WRITE, WRALL, ERASE and
It provides 10 years of secure data retention, without
100,000
programming cycles.
DEVICE OPERATION
The IS93C56-3 is controlled by seven 9-bit instructions. Instructions are clocked in (serially) on the DIN pin. Each instruction begins with a logical “1” (the start bit). This is followed by the opcode (2 bits), the address field (8 bits), if appropriate. The clock signal time and the IS93C56-3 will
(SK)
may be halted at any
remain in its last state. This
and data,
allows
full static flexibility and maximum power conservation.
Read (READ)
The READ instruction is the only instruction that outputs serial data on the DOUT pin. After the read instruction and address have been decoded, data is transferred from the selected memory register into a 16-bit serial shift register. (Please note that one logical “0” bit precedes the actual 16-bit output data string.) The output on DOUT changes during the low-to-high transitions of SK (see Figure 3).
Low Voltage Read
The IS93C56-3 has been designed to ensure that data read operations are reliable in low voltage environments. The IS93C56-3 is guaranteed to provide accurate data during read operations with Vcc as low as 2.7V.
Auto Increment Read Operations
In the interest of memory transfer operation applications, the IS93C56-3 has been designed to output a continuous stream of memory content in response to a single read operation instruction. To utilize this function, the system asserts a read instruction specifying a start location ad­dress. Once the 16 bits of the addressed word have been clocked out, the data in consecutively higher address locations is output. The address will wrap around continu­ously with CS HIGH until the chip select (CS) control pin is brought LOW. This allows for single instruction data dumps to be executed with a minimum of firmware overhead.
Write Enable (WEN)
The write enable (WEN) instruction must be executed before any device programming (WRITE, WRALL, ERASE, and ERAL) can be done. When Vcc is applied, this device
2
Integrated Silicon Solution, Inc. 1-800-379-4774
Rev. G
04/26/01
IS93C56-3
®
ISSI
powers up in the write disabled state. The device then remains in a write disabled state until a WEN instruction is executed. Thereafter, the device remains enabled until a WDS instruction is executed or until Vcc is removed. (NOTE: Neither the WEN nor the WDS instruction has any effect on the READ instruction.) (See Figure 4.)
Write (WRITE)
The WRITE instruction includes 16 bits of data to be written into the specified register. After the last data bit has been applied to DIN, and before the next rising edge of SK, CS must be brought LOW. The falling edge of CS initiates the self-timed programming cycle.
After a minimum wait of 250 ns (5V operation) from the falling edge of CS (tCS), if CS is brought HIGH, DOUT will indicate the READY/BUSY status of the chip: logical “0” means programming is still in progress; logical “1” means the selected register has been written, and the part is ready for another instruction (see Figure 5). (NOTE: The combination of CS HIGH, DIN HIGH and the rising edge of the SK clock, resets the READY/BUSY flag. Therefore, it is important if you want to access the READY/BUSY flag , not to reset it through this combination of control signals.) Before a WRITE instruction can be executed, the device must be write enabled (see WEN).
Write All (WRALL)
The write all (WRALL) instruction programs all registers with the data pattern specified in the instruction. While the
WRALL instruction is being loaded, the address field becomes a sequence of Dont Care bits (see Figure 6).
As with the WRITE instruction, if CS is brought HIGH after a minimum wait of 250 ns (tCS), the DOUT pin indicates the READY/BUSY status of the chip (see Figure 6).
Write Disable (WDS)
The write disable (WDS) instruction disables all program­ming capabilities. This protects the entire part against accidental modification of data until a WEN instruction is executed. (When Vcc is applied, this part powers up in the write disabled state.) To protect data, a WDS instruction should be executed upon completion of each programming operation. (NOTE: Neither the WEN nor the WDS instruction has any effect on the READ instruction.) (See Figure 7.)
Erase Register (ERASE)
After the erase instruction is entered, CS must be brought LOW. The falling edge of CS initiates the self-timed internal programming cycle. Bringing CS HIGH after a minimum of tCS, will cause DOUT to indicate the READ/BUSY status of the chip: a logical “0” indicates programming is still in progress; a logical “1” indicates the erase cycle is complete and the part is ready for another instruction (see Figure 8).
Erase All (ERAL)
Full chip erase is provided for ease of programming. Erasing the entire chip involves setting all bits in the entire memory array to a logical “1” (see Figure 9).
INSTRUCTION SET
Instruction Start Bit OP Code Address Input Data
READ 1 10 X(A6-A0) WEN 1 00 11XXXXXX
(Write Enable) WRITE 1 01 X(A6-A0) D15-D0 WRALL 1 00 01XXXXXX D15-D0
(Write All Registers)
WDS 1 00 00XXXXXX (Write Disable)
ERASE 1 11 X(A6-A0) ERAL 1 00 10XXXXXX
(Erase All Registers)
Note: 1. If input data is not 16 bits exactly, the last 16 bits will be taken as input data (a word).
Integrated Silicon Solution, Inc. 1-800-379-4774
Rev. G
04/26/01
(1)
(1)
3
IS93C56-3
®
ISSI
ABSOLUTE MAXIMUM RATINGS
Symbol Parameter Value Unit
VGND Voltage with Respect to GND –0.3 tp +6.5 V TBIAS Temperature Under Bias (IS93C56-3) 0 to +70 °C TBIAS Temperature Under Bias (IS93C56-3I) –40 to +85 °C TSTG Storage Temperature –65 to +125 °C
Notes:
1. Stress greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
(1)
OPERATING RANGE
Range Ambient Temperature VCC
Commercial 0°C to +70°C 2.7V to 6.0V Industrial –40°C to +85°C 2.7V to 6.0V
CAPACITANCE
Symbol Parameter Conditions Max. Unit
CIN Input Capacitance VIN = 0V 5 pF COUT Output Capacitance VOUT = 0V 5 pF
FIGURE 1. AC TEST CONDITIONS
+2.08V
800
D
OUT
100 pF
Vcc = 5.0V
4
Integrated Silicon Solution, Inc. 1-800-379-4774
Rev. G
04/26/01
®
IS93C56-3
ISSI
DC ELECTRICAL CHARACTERISTICS
TA = 0°C to +70°C for IS93C56-3 and –40°C to +85°C for IS93C56-3I.
Symbol Parameter Test Conditions Vcc Min. Max. Unit
VOL Output LOW Voltage IOL = 10 µA CMOS 2.7V to 3.3V 0.2 V VOL1 Output LOW Voltage IOL = 2.1 mA TTL 4.5V to 5.5V 0.4 V VOH Output HIGH Voltage IOH = –10 µA CMOS 2.7V to 3.3V VCC – 0.2 V VOH1 Output HIGH Voltage IOH = –400 µA TTL 4.5V to 5.5V 2.4 V VIH Input HIGH Voltage 2.7V to 3.3V 2.4 VCC V
4.5V to 5.5V 2 VCC
VIL Input LOW Voltage 2.7V to 3.3V -0.1 0.6 V
4.5V to 5.5V –0.1 0.8 ILI Input Leakage VIN = 0V to VCC (CS, SK, DIN)11µA ILO Output Leakage VOUT = 0V to VCC, CS = 0V 1 1 µA
POWER SUPPLY CHARACTERISTICS
TA = 0°C to +70°C for IS93C56-3 and –40°C to +85°C for IS93C56-3I.
IS93C56-3 IS93C56-3I
Symbol Parameter Test Conditions Vcc Min . Typ. Max. Min. Typ. Max. Unit
ICC Vcc Operating CS = VIH, SK = 500 KHz 2.7V to 3.3V 0.5 2 0.5 2 mA
Supply Current CMOS Input Levels
ICC Vcc Operating CS = VIH, SK = 1 MHz 4.5V to 5.5V 46 46 mA
Supply Current CMOS Input Levels
ISB Standby Current CS = DIN = SK = 0V 2.7V to 3.3V 210 210 µA
4.5V to 5.5V 10 50 10 50
Integrated Silicon Solution, Inc. 1-800-379-4774
Rev. G
04/26/01
5
IS93C56-3
ISSI
AC ELECTRICAL CHARACTERISTICS
TA = 0°C to +70°C for IS93C56-3 and –40°C to +85°C for IS93C56-3.
IS93C56-3 IS93C56-3I
Symbol Parameter Test Conditions Vcc Mi n. Max. Min. Max. Unit
SK SK Clock Frequency 2.7V to 6.0V 0 0.5 0 0.5 MHz
f
4.5V to 6.0V 0 1 0 1 MHz
tSKH SK HIGH Time 2.7V to 6.0V 500 500 ns
4.5V to 6.0V 250 250
SKL SK LOW Time 2.7V to 6.0V 1 1 µs
t
4.5V to 6.0V 250 250 ns
t
CS Minimum CS LOW Time 2.7V to 6.0V 500 500 ns
4.5V to 6.0V 250 250
tCSS CS Setup Time Relative to SK 2.7V to 6.0V 100 100 ns
4.5V to 6.0V 50 50 ns
tDIS DIN Setup Time Relative to SK 2.7V to 6.0V 200 200 ns
4.5V to 6.0V 100 100 ns
®
tCSH CS Hold Time Relative to SK 2.7V to 6.0V 0 0 ns
4.5V to 6.0V 0 0
tDIH DIN Hold Time Relative to SK 2.7V to 6.0V 400 400 ns
4.5V to 6.0V 100 100
tPD1 Output Delay to 1 AC Test 2.7V to 6.0V 500 500 ns
4.5V to 6.0V 500 500
tPD0 Output Delay to 0 AC Test 2.7V to 6.0V 500 500 ns
4.5V to 6.0V 500 500
tSV CS to Status Valid AC Test, CL = 100 pF 2.7V to 6.0V 500 500 ns
4.5V to 6.0V 500 500
tDF CS to DOUT in 3-state CS = VIL 2.7V to 6.0V 200 200 ns
4.5V to 6.0V 100 100
tWP Write Cycle Time 2.7V to 6.0V 10 10 ms
4.5V to 6.0V 10 10
6
Integrated Silicon Solution, Inc. 1-800-379-4774
Rev. G
04/26/01
IS93C56-3
AC WAVEFORMS
FIGURE 2. SYNCHRONOUS DATA TIMING
®
ISSI
CS
SK
DIN
DOUT
(READ)
OUT
D
(WRITE) (WRALL) (ERASE)
(ERAL)
T
tSV
tSKH
tPD0
tPD1 tDF
STATUS VALID
tCSS tSKL tCSH
tDIS tDIH
tDF
FIGURE 3. READ CYCLE TIMING
CS
SK
IN
D
D
OUT
*
Address Pointer Cycles to the Next Register
X is a don't care bit
110
XA0
A6...A1
D15
0
D0
t
CS
*
Integrated Silicon Solution, Inc. 1-800-379-4774
Rev. G
04/26/01
7
IS93C56-3
FIGURE 4. SYNCHRONOUS DATA TIMING
CS
SK
D
IN
DOUT = 3-state
FIGURE 5. WRITE (WRITE) CYCLE TIMING
1100 1
®
ISSI
tCS
CS
SK
D
IN
DOUT
X is a don't care bit
110
XA0
A6...A1
FIGURE 6. WRITE ALL (WRALL) TIMING
CS
SK
tCS
D15 D0
tSV tDF
BUSY
tWP
tCS
READY
D
DOUT
IN
110
00
8
D15 D0
tSV
BUSY READY
tWP
Integrated Silicon Solution, Inc. 1-800-379-4774
Rev. G
04/26/01
IS93C56-3
FIGURE 7. WRITE DISABLE (WDS) CYCLE TIMING
t
CS
CS
SK
®
ISSI
D
IN
100
00
DOUT = 3-STATE
FIGURE 8. ERASE (REGISTER ERASE) CYCLE TIMING
SK
t
CS
CS
D
IN
D
OUT
X is a don't care bit
111
X
A6
A0
t
WP
t
SV
BUSY
READY
t
DF
FIGURE 9. ERASE ALL (ERAL) CYCLE TIMING
SK
t
CS
CS
D
IN
D
OUT
Note for Figures 8 and 9:
After the completion of the instruction (D indicates BUSY status) then performs another instruction would cause device malfunction.
Integrated Silicon Solution, Inc. 1-800-379-4774
Rev. G
04/26/01
010
OUT is in READY status) then it may perform another instruction. If device is in BUSY status (DOUT
10
t
SV
BUSY READY
t
WP
t
DF
9
IS93C56-3
®
ISSI
ORDERING INFORMATION Commercial Range: 0°C to +70°C
Speed (MHz) Order Part No. Package
1 IS93C56-3P 300-mil Plastic DIP 1 IS93C56-3G Small Outline (JEDEC) 1 IS93C56-3GR Small Outline (JEDEC)
ORDERING INFORMATION Industrial Range: –40°C to +85°C
Speed (MHz) Order Part No. Package
1 IS93C56-3PI 300-mil Plastic DIP 1 IS93C56-3GI Small Outline (JEDEC) 1 IS93C56-3GRI Small Outline (JEDEC)
10
®
ISSI
Integrated Silicon Solution, Inc.
2231 Lawson Lane
Santa Clara, CA 95054
Tel: 1-800-379-4774 Fax: (408) 588-0806
E-mail: sales@issi.com
www.issi.com
Integrated Silicon Solution, Inc. 1-800-379-4774
Rev. G
04/26/01
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