The ISSI IS63LV1024 is a very high-speed, low power,
131,072-word by 8-bit CMOS static RAM in revolutionary
pinout. The IS63LV1024 is fabricated using ISSI's
high-performance CMOS technology. This highly reliable
process coupled with innovative circuit design
techniques, yields higher performance and low power
consumption devices.
When CE is HIGH (deselected), the device assumes a
standby mode at which the power dissipation can be
reduced down to 250 µW (typical) with CMOS input levels.
The IS63LV1024 operates from a single 3.3V power
supply and all inputs are TTL-compatible.
VTERMTerminal Voltage with Respect to GND–0.5 to Vcc + 0.5V
TBIASTemperature Under Bias–55 to +125°C
TSTGStorage Temperature–65 to +150°C
PTPower Dissipation1.0W
Notes:
1. Stress greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause
permanent damage to the device. This is a stress rating only and functional operation of the
device at these or any other conditions above those indicated in the operational sections of
this specification is not implied. Exposure to absolute maximum rating conditions for extended
periods may affect reliability.
2
Integrated Silicon Solution, Inc. — 1-800-379-4774
Rev. H
10/02/00
®
IS63LV1024ISSI
OPERATING RANGE
RangeAmbient TemperatureVCC
Commercial0°C to +70°C3.3V ± 0.3V
Industrial–40°C to +85°C3.3V ± 0.15V
DC ELECTRICAL CHARACTERISTICS (Over Operating Range)
Symbol ParameterTest ConditionsMin.Max.Unit
VOHOutput HIGH VoltageVCC = Min., IOH = –4.0 mA2.4—V
tOHAOutput Hold Time2—2—3—3—ns
tACECE Access Time—8—10—12—15ns
tDOEOE Access Time—4—5—6—7ns
(2)
tLZOE
tHZOE
tLZCE
tHZCE
OE to Low-Z Output0—0—0—0—ns
(2)
OE to High-Z Output04050607ns
(2)
CE to Low-Z Output3—3—3—3—ns
(2)
CE to High-Z Output04050607ns
tPUCE to Power Up Time0—0—0—0—ns
tPDCE to Power Down Time—8—10—12—15ns
Notes:
1. Test conditions assume signal transition times of 3 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V and C1
output loading specified in Figure 1.
2. Tested with the C2 load in Figure 1. Transition is measured ±500 mV from steady-state voltage. Not 100% tested.
AC TEST CONDITIONS
ParameterUnit
Input Pulse Level0V to 3.0V
Input Rise and Fall Times3 ns
Input and Output Timing1.5V
and Reference Levels
Output LoadSee Figures 1a and 1b
AC TEST LOADS
OUT = 50 Ω
Z
OUTPUT
50 Ω
VT = 1.5V
3.3V
OUTPUT
5 pF
Including
jig and
scope
317 Ω
351 Ω
Figure 1
4
Figure 2
Integrated Silicon Solution, Inc. — 1-800-379-4774
Rev. H
10/02/00
IS63LV1024ISSI
AC WAVEFORMS
®
READ CYCLE NO. 1
ADDRESS
D
OUT
PREVIOUS DATA VALID
READ CYCLE NO. 2
ADDRESS
OE
(1,2)
(1,3)
t RC
t AA
t OHA
DATA VALID
t
RC
t
AA
t OHA
t
READ1.eps
OHA
t
DOE
t
CE
t
LZCE
OUT
D
Notes:
1. WE is HIGH for a Read Cycle.
2. The device is continuously selected. OE, CE = V
3. Address is valid prior to or coincident with CE LOW transitions.
HIGH-Z
LZOE
t
ACE
IL.
DATA VALID
t
HZCE
t
HZOE
CE_RD2.eps
Integrated Silicon Solution, Inc. — 1-800-379-4774
tWCWrite Cycle Time8—10—12—15—ns
tSCECE to Write End7—7—8—10—ns
tAWAddress Setup Time to8—8—8—10—ns
Write End
tHAAddress Hold from0—0—0—0—ns
Write End
tSAAddress Setup Time0—0—0—0—ns
(1)
tPWE
tPWE
1
(2)
2
WE Pulse Width (OE High)7—7—8—10—ns
WE Pulse Width (OE Low)8—10—12—15—ns
tSDData Setup to Write End5—5—6—7—ns
tHDData Hold from Write End0—0—0—0—ns
(2)
tHZWE
(2)
tLZWE
Notes:
1. Test conditions assume signal transition times of 3ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V and
output loading specified in Figure 1a.
2. Tested with the load in Figure 1b. Transition is measured ±500 mV from steady-state voltage. Not 100% tested.
3. The internal write time is defined by the overlap of CE LOW and WE LOW. All signals must be in valid states to initiate a Write, but
any one can go inactive to terminate the Write. The Data Input Setup and Hold timing are referenced to the rising or falling edge of
the signal that terminates the Write.
WE LOW to High-Z Output—4—5—6—7ns
WE HIGH to Low-Z Output3—3—3—3—ns
AC WAVEFORMS
WRITE CYCLE NO. 1
ADDRESS
CE
WE
D
OUT
D
IN
(1,2
(CE Controlled, OE = HIGH or LOW)
t
WC
VALID ADDRESS
t
SA
t
DATA UNDEFINED
t
AW
HZWE
t
PWE1
t
PWE2
t
SCE
HIGH-Z
t
SD
DATAIN VALID
t
t
HD
t
LZWE
HA
CE_WR1.eps
6
Integrated Silicon Solution, Inc. — 1-800-379-4774
Rev. H
10/02/00
IS63LV1024ISSI
(1)
WRITE CYCLE NO. 2
(WE Controlled, OE = HIGH during Write Cycle)
t
WC
®
ADDRESS
VALID ADDRESS
OE
CE
LOW
t
AW
t
PWE1
WE
t
D
OUT
D
IN
SA
DATA UNDEFINED
t
HZWE
HIGH-Z
t
SD
DATAIN VALID
WRITE CYCLE NO. 3 (WE Controlled: OE is LOW During Write Cycle)
t
HA
t
LZWE
t
HD
CE_WR2.eps
t
WC
ADDRESS
OE
CE
LOW
LOW
VALID ADDRESS
t
AW
t
PWE2
t
HA
WE
t
SA
D
OUT
D
IN
DATA UNDEFINED
Notes:
1. The internal write time is defined by the overlap of CE LOW and WE LOW. All signals must be in valid states to initiate a Write,
but any one can go inactive to terminate the Write. The Data Input Setup and Hold timing are referenced to the rising or falling
edge of the signal that terminates the Write.
2. I/O will assume the High-Z state if OE • V
IH.
t
HZWE
HIGH-Z
t
SD
DATAIN VALID
t
LZWE
t
HD
CE_WR3.eps
Integrated Silicon Solution, Inc. — 1-800-379-4774
Rev. H
10/02/00
7
IS63LV1024ISSI
ORDERING INFORMATION
Commercial Range: 0°C to +70°C