• Single power supply
– 1.65V--2.2V V
– 2.5V--3.6V V
• Fully static operation: no clock or refresh
required
• Three state outputs
• Data control for upper and lower bytes
• Industrial temperature available
• Lead-free available
DD (62WV51216ALL)
DD (62WV51216BLL)
DESCRIPTION
The ISSI IS62WV51216ALL/ IS62WV51216BLL are high-
speed, 8M bit static RAMs organized as 512K words by 16
bits. It is fabricated using ISSI's high-performance CMOS
technology. This highly reliable process coupled with
innovative circuit design techniques, yields highperformance and low power consumption devices.
When CS1 is HIGH (deselected) or when CS2 is LOW
(deselected) or when CS1 is LOW, CS2 is HIGH and both
LB and UB are HIGH, the device assumes a standby mode
at which the power dissipation can be reduced down with
CMOS input levels.
Easy memory expansion is provided by using Chip Enable
and Output Enable inputs. The active LOW Write Enable
(WE) controls both writing and reading of the memory. A
data byte allows Upper Byte (UB) and Lower Byte (LB)
access.
The IS62WV51216ALL and IS62WV51216BLL are packaged
in the JEDEC standard 48-pin mini BGA (7.2mm x 8.7mm)
and 44-Pin TSOP (TYPE II).
RangeAmbient Temperature IS62WV51216ALL (70ns) IS62WV51216BLL (55ns, 70ns)IS62WV51216BLL (45ns)
Commercial0°C to +70°C1.65V - 2.2V2.5V - 3.6V3.0 - 3.6V
Industrial–40°C to +85°C1.65V - 2.2V 2.5V - 3.6V
Integrated Silicon Solution, Inc. — www.issi.com —
Rev. B
02/24/05
1-800-379-4774
3
IS62WV51216ALL, IS62WV51216BLLISSI
®
ABSOLUTE MAXIMUM RATINGS
(1)
SymbolParameterValueUnit
VTERMTerminal Voltage with Respect to GND–0.2 to VDD+0.3V
TBIASTemperature Under Bias–40 to +85°C
VDDVDD Related to GND–0.2 to +3.8V
TSTGStorage Temperature–65 to +150° C
PTPower Dissipation1.0W
Note:
1. Stress greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the
device. This is a stress rating only and functional operation of the device at these or any other conditions above
those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect reliability.
DC ELECTRICAL CHARACTERISTICS (Over Operating Range)
OE to High-Z Output—15—2 0—2 5ns
OE to Low-Z Output5—5—5—ns
(2)
CS1/CS2 to High-Z Output015020025ns
(2)
CS1/CS2 to Low-Z Output10—10—10—ns
tBALB, UB Access Time—45—55—70ns
tHZBLB, UB to High-Z Output015020025ns
tLZBLB, UB to Low-Z Output0—0—0—ns
Notes:
1. Test conditions assume signal transition times of 5 ns or less, timing reference levels of 0.9V/1.5V, input pulse levels of 0.4 to
DD-0.2V/0.4V to VDD-0.3V and output loading specified in Figure 1.
V
2. Tested with the load in Figure 2. Transition is measured ±500 mV from steady-state voltage. Not 100% tested.
AC WAVEFORMS
READ CYCLE NO. 1
ADDRESS
DQ0-D15
(1,2)
(Address Controlled) (CS1 = OE = VIL, CS2 = WE = VIH, UB or LB = VIL)
t
RC
t
AA
t
OHA
PREVIOUS DATA VALID
DATA VALID
t
OHA
8
Integrated Silicon Solution, Inc. — www.issi.com —
1-800-379-4774
Rev. B
02/24/05
IS62WV51216ALL, IS62WV51216BLLISSI
AC WAVEFORMS
READ CYCLE NO. 2
ADDRESS
OE
s
CS1
(1,3)
(CS1, CS2, OE, AND UB/LB Controlled)
t
RC
t
AA
t
DOE
t
LZOE
t
ACE1/tACE2
t
HZOE
t
OHA
®
LBs
DOUT
CS2s
,
UBs
t
LZCE1/
t
LZCE2
t
HIGH-Z
LZB
t
BA
Notes:
1. WE is HIGH for a Read Cycle.
2. The device is continuously selected. OE, CS1, UB, or LB = V
3. Address is valid prior to or coincident with CS1 LOW transition.
IL. CS2=WE=VIH.
t
HZCS1/
t
HZCS1
t
DATA VALID
HZB
Integrated Silicon Solution, Inc. — www.issi.com —
Rev. B
02/24/05
1-800-379-4774
9
IS62WV51216ALL, IS62WV51216BLLISSI
®
WRITE CYCLE SWITCHING CHARACTERISTICS
(1,2)
(Over Operating Range)
45ns55 ns70 ns
SymbolParameter Min.Max. Min.Max. Min.Max.Unit
tWCWrite Cycle Time 45— 55— 70—ns
tSCS1/tSCS2 CS1/CS2 to Write End 35— 45— 60—ns
tAWAddress Setup Time to Write End 35— 45— 60—ns
tHAAddress Hold from Write End 0— 0— 0—ns
tSAAddress Setup Time 0— 0— 0—ns
tPWBLB, UB Valid to End of Write 35— 45— 60—ns
(4)
tPWE
WE Pulse Width 35— 40— 50—ns
tSDData Setup to Write End 20— 25— 30—ns
tHDData Hold from Write End 0— 0— 0—ns
(3)
tHZWE
tLZWE
Notes:
1. Test conditions assume signal transition times of 5 ns or less, timing reference levels of 0.9V/1.5V, input pulse levels of 0.4 to
VDD-0.2V/0.4V to VDD-0.3V and output loading specified in Figure 1.
2.
The internal write time is defined by the overlap of CS1 LOW, CS2 HIGH and UB or LB, and WE LOW. All signals must be in valid states to initiate a Write, but
any one can go inactive to
write.
3. Tested with the load in Figure 2. Transition is measured ±500 mV from steady-state voltage. Not 100% tested.
PWE
4. t
WE LOW to High-Z Output —20 —20 —30ns
(3)
WE HIGH to Low-Z Output 5— 5— 5—ns
terminate the Write. The Data Input Setup and Hold timing are referenced to the rising or falling edge of the signal that terminates the
> tHZWE + tSD when OE is LOW.
AC WAVEFORMS
CS1
CS2
WE
DIN
(1,2)
(CS1 Controlled, OE = HIGH or LOW)
t
t
SCS1
t
SCS2
t
AW
t
t
t
SA
DATA UNDEFINED
t
HZWE
WC
PWE
PWB
HIGH-Z
t
SD
DATA-IN VALID
t
HA
t
LZWE
t
HD
WRITE CYCLE NO. 1
ADDRESS
LB, UB
DOUT
Notes:
1. WRITE is an internally generated signal asserted during an overlap of the LOW states on the CS1 , CS2 and WE inputs and at
least one of the LB and UB inputs being in the LOW state.
2. WRITE = (CS1) [ (LB) = (UB) ] (WE).
10
Integrated Silicon Solution, Inc. — www.issi.com —
1-800-379-4774
Rev. B
02/24/05
IS62WV51216ALL, IS62WV51216BLLISSI
WRITE CYCLE NO. 2 (WE Controlled: OE is HIGH During Write Cycle)
t
WC
ADDRESS
OE
t
HA
t
t
LZWE
HD
CS1
CS2
WE
LB, UB
DOUT
t
SA
DATA UNDEFINED
t
AW
t
HZWE
t
SCS1
t
SCS2
t
PWE
HIGH-Z
t
SD
®
DIN
DATA-IN VALID
WRITE CYCLE NO. 3 (WE Controlled: OE is LOW During Write Cycle)
t
WC
ADDRESS
OE
tSCS1
CS1
tSCS2
CS2
tAW
WE
LB, UB
DOUT
tSA
DATA UNDEFINED
tPWE
tHZWE
HIGH-Z
tSDtHD
tHA
tLZWE
DIN
Integrated Silicon Solution, Inc. — www.issi.com —
Rev. B
02/24/05
1-800-379-4774
DATA-IN VALID
11
IS62WV51216ALL, IS62WV51216BLLISSI
WRITE CYCLE NO. 4 (UB/LB Controlled)
t
t
WC
WC
®
ADDRESS
CS1
CS2
UB, LB
OUT
D
OE
WE
D
LOW
HIGH
DATA UNDEFINED
IN
t
HZWE
ADDRESS 1ADDRESS 2
t
SA
t
HA
t
SA
t
PBW
t
SD
WORD 1
HIGH-Z
DATA
VALID
t
HD
IN
t
SD
WORD 2
t
PBW
DATA
VALID
t
HA
t
LZWE
t
HD
IN
UB_CSWR4.eps
12
Integrated Silicon Solution, Inc. — www.issi.com —
1-800-379-4774
Rev. B
02/24/05
IS62WV51216ALL, IS62WV51216BLLISSI
DATA RETENTION SWITCHING CHARACTERISTICS
SymbolParameterTest ConditionMin.Max.Unit
VDRVDD for Data RetentionSee Data Retention Waveform1.23. 6V