Datasheet IS62WV51216ALL, IS62WV51216BLL Datasheet (ISSI)

IS62WV51216ALL
®
IS62WV51216BLL
512K x 16 LOW VOLTAGE, ULTRA LOW POWER CMOS STATIC RAM
FEATURES
• High-speed access time: 45ns, 55ns
• CMOS low power operation – 36 mW (typical) operating – 12 µW (typical) CMOS standby
• TTL compatible interface levels
• Single power supply – 1.65V--2.2V V – 2.5V--3.6V V
• Fully static operation: no clock or refresh required
• Three state outputs
• Data control for upper and lower bytes
• Industrial temperature available
• Lead-free available
DD (62WV51216ALL)
DD (62WV51216BLL)
DESCRIPTION
The ISSI IS62WV51216ALL/ IS62WV51216BLL are high- speed, 8M bit static RAMs organized as 512K words by 16 bits. It is fabricated using ISSI's high-performance CMOS technology. This highly reliable process coupled with innovative circuit design techniques, yields high­performance and low power consumption devices.
When CS1 is HIGH (deselected) or when CS2 is LOW (deselected) or when CS1 is LOW, CS2 is HIGH and both LB and UB are HIGH, the device assumes a standby mode at which the power dissipation can be reduced down with CMOS input levels.
Easy memory expansion is provided by using Chip Enable and Output Enable inputs. The active LOW Write Enable (WE) controls both writing and reading of the memory. A data byte allows Upper Byte (UB) and Lower Byte (LB) access.
The IS62WV51216ALL and IS62WV51216BLL are packaged in the JEDEC standard 48-pin mini BGA (7.2mm x 8.7mm) and 44-Pin TSOP (TYPE II).
ISSI
FEBRUARY 2005
FUNCTIONAL BLOCK DIAGRAM
A0-A18
VDD GND
I/O0-I/O7
Lower Byte
I/O8-I/O15
Upper Byte
CS2
CS1
OE
WE
UB
LB
DECODER
I/O
DATA
CIRCUIT
CONTROL
CIRCUIT
512K x 16
MEMORY ARRAY
COLUMN I/O
Integrated Silicon Solution, Inc. — www.issi.com —
Rev. B
02/24/05
1-800-379-4774
1
IS62WV51216ALL, IS62WV51216BLL ISSI
®
PIN CONFIGURATIONS 48-Pin mini BGA (7.2mm x 8.7mm)
1 2 3 4 5 6
A1
A B C D E F G H
LB
I/O
I/O
GND
V
I/O
I/O
A18
8
9
DD
14
15
A0
OE
UB A3
I/O10A5
A17
I/O
11
I/O12GND
A14
I/O
13
A12
NC
A9
A8
A6
A7
A16
A15
A13
A10
A4
A2
CS1 I/O
I/O1I/O
I/O
3
I/O
GND
4
I/O
5
WE
A11 NC
CS2
V
I/O
I/O
DD`
PIN DESCRIPTIONS
A0-A18 Address Inputs I/O0-I/O15 Data Inputs/Outputs
CS1, CS2 Chip Enable Input OE Output Enable Input WE Write Enable Input LB Lower-byte Control (I/O0-I/O7)
0
2
6
7
UB Upper-byte Control (I/O8-I/O15) N C No Connection VDD Power GND Ground
44-Pin TSOP (Type II)
1
A4
2
A3
3
A2
4
A1
5
A0
6
CS1
7
I/O0
8
I/O1
9
I/O2
10
I/O3
11
V
DD
12
GND
13
I/O4
14
I/O5
15
I/O6
16
I/O7
17
WE
18
A16
19
A15
20
A14
21
A13
22
A12
44
A5
43
A6
42
A7
41
OE
40
UB
39
LB
38
I/O15
37
I/O14
36
I/O13
35
I/O12
34
GND
33
V
DD
32
I/O11
31
I/O10
30
I/O9
29
I/O8
28
A18
27
A8
26
A9
25
A10
24
A11
23
A17
2
Integrated Silicon Solution, Inc. — www.issi.com —
1-800-379-4774
Rev. B
02/24/05
IS62WV51216ALL, IS62WV51216BLL ISSI
TRUTH TABLE
I/O PIN
Mode
WEWE
WE
WEWE
Not Selected X H X X X X High-Z High-Z I
Output Disabled H L H H L X High-Z High-Z ICC
Read H L H L L H DOUT High-Z ICC
Write L L H X L H DIN High-Z ICC
CS1CS1
CS1 CS2
CS1CS1
OEOE
OE
OEOE
LBLB
LB
LBLB
UBUB
UB I/O0-I/O7 I/O8-I/O15 VDD Current
UBUB
SB1, ISB2
X X L X X X High-Z High-Z ISB1, ISB2 XXXXHH High-Z High-Z ISB1, ISB2
H L H H X L High-Z High-Z ICC
H L H L H L High-Z DOUT HLHLLL DOUT DOUT
L L H X H L High-Z DIN LLHXLL DIN DIN
®
OPERATING RANGE (VDD)
Range Ambient Temperature IS62WV51216ALL (70ns) IS62WV51216BLL (55ns, 70ns) IS62WV51216BLL (45ns)
Commercial 0°C to +70°C 1.65V - 2.2V 2.5V - 3.6V 3.0 - 3.6V Industrial –40°C to +85°C 1.65V - 2.2V 2.5V - 3.6V
Integrated Silicon Solution, Inc. — www.issi.com —
Rev. B
02/24/05
1-800-379-4774
3
IS62WV51216ALL, IS62WV51216BLL ISSI
®
ABSOLUTE MAXIMUM RATINGS
(1)
Symbol Parameter Value Unit
VTERM Terminal Voltage with Respect to GND –0.2 to VDD+0.3 V TBIAS Temperature Under Bias –40 to +85 °C VDD VDD Related to GND –0.2 to +3.8 V TSTG Storage Temperature –65 to +150 ° C PT Power Dissipation 1.0 W
Note:
1. Stress greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
DC ELECTRICAL CHARACTERISTICS (Over Operating Range)
Symbol Parameter Test Conditions VDD Min. Max. Unit
VOH Output HIGH Voltage IOH = -0.1 mA 1.65-2.2V 1.4 V
IOH = -1 mA 2.5-3.6V 2.2 V
VOL Output LOW Voltage IOL = 0.1 mA 1.65-2.2V 0.2 V
IOL = 2.1 mA 2.5-3.6V 0.4 V
VIH Input HIGH Voltage 1.65-2.2V 1.4 VDD + 0.2 V
2.5-3.6V 2.2 VDD + 0.3 V
(1)
VIL
Input LOW Voltage 1.65-2.2V – 0. 2 0 .4 V
2.5-3.6V –0.2 0.6 V ILI Input Leakage GND VIN VDD –1 1 µA ILO Output Leakage GND VOUT VDD, Outputs Disabled – 1 1 µA
Notes:
1. VIL (min.) = –1.0V for pulse width less than 10 ns.
4
Integrated Silicon Solution, Inc. — www.issi.com —
1-800-379-4774
Rev. B
02/24/05
IS62WV51216ALL, IS62WV51216BLL ISSI
®
CAPACITANCE
(1)
Symbol Parameter Conditions Max. Unit
CIN Input Capacitance VIN = 0V 8 pF COUT Input/Output Capacitance VOUT = 0V 10 pF
Note:
1. Tested initially and after any design or process changes that may affect these parameters.
AC TEST CONDITIONS
Parameter 62WV51216ALL 62WV51216BLL
(Unit) (Unit)
Input Pulse Level 0.4V to VDD-0.2 0.4V to VDD-0.3V Input Rise and Fall Times 5 ns 5ns Input and Output Timing VREF VREF
and Reference Level Output Load See Figures 1 and 2 See Figures 1 and 2
62WV51216ALL 62WV51216BLL
(1.65V - 2.2V) (2.5V - 3.6V)
R1(Ω) 3070 1029 R2(Ω) 3150 1728 VREF 0.9V 1.5V VTM 1.8V 2.8V
AC TEST LOADS
R1
VTM
OUTPUT
30 pF
Including
jig and
scope
R2
VTM
OUTPUT
5 pF
Including
jig and
scope
R1
R2
Figure 1
Integrated Silicon Solution, Inc. — www.issi.com —
Rev. B
02/24/05
1-800-379-4774
Figure 2
5
IS62WV51216ALL, IS62WV51216BLL ISSI
®
IS62WV51216ALL, POWER SUPPLY CHARACTERISTICS
(1)
(Over Operating Range)
Symbol Parameter Test Conditions Max. Unit
70
CC VDD Dynamic Operating VDD = Max., Com. 20 m A
I
Supply Current IOUT = 0 mA, f = fMAX Ind. 25
I
CC1 Operating Supply VDD = Max., CS1 = 0.2V Com. 4 m A
Current WE = VDD – 0.2V Ind. 4
CS2 = VDD – 0.2V, f = 1MHZ
ISB1 TTL Standby Current VDD = Max., Com. 0.3 mA
(TTL Inputs) VIN = VIH or VIL Ind. 0.3
CS1 = VIH , CS2 = VIL, f = 1 MHZ
OR
ULB Control
VDD = Max., VIN = VIH or VIL CS1 = VIL, f = 0, UB = VIH, LB = VIH
ISB2 CMOS Standby VDD = Max., Com. 1 5 µA
Current (CMOS Inputs) CS1 ≥ VDD – 0.2V, Ind. 2 1
CS2
0.2V, typ.
(1)
3 VIN ≥ VDD – 0.2V, or VIN
0.2V, f = 0
OR
ULB Control VDD = Max., CS1 = VIL, CS2=VIH
Note:.
1. Typical values are measured at V
VIN ≥ VDD – 0.2V, or VIN UB / LB = VDD – 0.2V
DD = 1.8V, TA = 25
o
C and not 100% tested.
0.2V, f = 0;
6
Integrated Silicon Solution, Inc. — www.issi.com —
1-800-379-4774
Rev. B
02/24/05
IS62WV51216ALL, IS62WV51216BLL ISSI
®
IS62WV51216BLL, POWER SUPPLY CHARACTERISTICS
(1)
(Over Operating Range)
Symbol Parameter Test Conditions Max. Max. Max. Unit
45 55 70
CC VDD Dynamic Operating VDD = Max., Com. 35 30 25 mA
I
Supply Current IOUT = 0 mA, f = fMAX Ind. 40 35 30
I
CC1 Operating Supply VDD = Max., CS1 = 0.2V Com. 5 5 5 m A
Current WE = VDD – 0.2V Ind. 5 5 5
CS2 = VDD – 0.2V, f = 1MHZ
ISB1 TTL Standby Current VDD = Max., Com. 0.3 0.3 0.3 m A
(TTL Inputs) VIN = VIH or VIL Ind. 0.3 0.3 0.3
CS1 = VIH , CS2 = VIL, f = 1 MHZ
OR
ULB Control
VDD = Max., VIN = VIH or VIL CS1 = VIL, f = 0, UB = VIH, LB = VIH
ISB2 CMOS Standby VDD = Max., Com. 20 20 20 µ A
Current (CMOS Inputs) CS1 ≥ VDD – 0.2V, Ind . 25 25 25
CS2
0.2V, typ.
(2)
444 VIN ≥ VDD – 0.2V, or VIN
0.2V, f = 0
OR
ULB Control VDD = Max., CS1 = VIL, CS2=VIH
VIN ≥ VDD – 0.2V, or VIN
0.2V, f = 0;
UB / LB = VDD – 0.2V
Note:
1. At f = f
2. Typical values are measured at VDD = 3.0V, TA = 25oC and not 100% tested.
MAX, address and data inputs are cycling at the maximum frequency, f = 0 means no input lines change.
Integrated Silicon Solution, Inc. — www.issi.com —
Rev. B
02/24/05
1-800-379-4774
7
IS62WV51216ALL, IS62WV51216BLL ISSI
®
READ CYCLE SWITCHING CHARACTERISTICS
(1)
(Over Operating Range)
45 ns 55 ns 70 ns
Symbol Parameter Min. Max. Min . Max. Min. Max. Unit
tRC Read Cycle Time 45 55 70 ns tAA Address Access Time 45 55 70 ns tOHA Output Hold Time 10 10 10 ns tACS1/tACS2 CS1/CS2 Access Time 45 55 70 ns tDOE OE Access Time 20 25 35 ns
(2)
tHZOE
(2)
tLZOE tHZCS1/tHZCS2 tLZCS1/tLZCS2
OE to High-Z Output 15 2 0 2 5 ns OE to Low-Z Output 5 5 5 ns
(2)
CS1/CS2 to High-Z Output 0 15 0 20 0 25 ns
(2)
CS1/CS2 to Low-Z Output 10 10 10 ns
tBA LB, UB Access Time 45 55 70 ns tHZB LB, UB to High-Z Output 0 15 0 20 0 25 ns tLZB LB, UB to Low-Z Output 0 0 0 ns
Notes:
1. Test conditions assume signal transition times of 5 ns or less, timing reference levels of 0.9V/1.5V, input pulse levels of 0.4 to
DD-0.2V/0.4V to VDD-0.3V and output loading specified in Figure 1.
V
2. Tested with the load in Figure 2. Transition is measured ±500 mV from steady-state voltage. Not 100% tested.
AC WAVEFORMS READ CYCLE NO. 1
ADDRESS
DQ0-D15
(1,2)
(Address Controlled) (CS1 = OE = VIL, CS2 = WE = VIH, UB or LB = VIL)
t
RC
t
AA
t
OHA
PREVIOUS DATA VALID
DATA VALID
t
OHA
8
Integrated Silicon Solution, Inc. — www.issi.com —
1-800-379-4774
Rev. B
02/24/05
IS62WV51216ALL, IS62WV51216BLL ISSI
AC WAVEFORMS READ CYCLE NO. 2
ADDRESS
OE
s
CS1
(1,3)
(CS1, CS2, OE, AND UB/LB Controlled)
t
RC
t
AA
t
DOE
t
LZOE
t
ACE1/tACE2
t
HZOE
t
OHA
®
LBs
DOUT
CS2s
,
UBs
t
LZCE1/
t
LZCE2
t
HIGH-Z
LZB
t
BA
Notes:
1. WE is HIGH for a Read Cycle.
2. The device is continuously selected. OE, CS1, UB, or LB = V
3. Address is valid prior to or coincident with CS1 LOW transition.
IL. CS2=WE=VIH.
t
HZCS1/
t
HZCS1
t
DATA VALID
HZB
Integrated Silicon Solution, Inc. — www.issi.com —
Rev. B
02/24/05
1-800-379-4774
9
IS62WV51216ALL, IS62WV51216BLL ISSI
®
WRITE CYCLE SWITCHING CHARACTERISTICS
(1,2)
(Over Operating Range)
45ns 55 ns 70 ns
Symbol Parameter Min. Max. Min. Max. Min. Max. Unit
tWC Write Cycle Time 45 55 70 ns tSCS1/tSCS2 CS1/CS2 to Write End 35 45 60 ns tAW Address Setup Time to Write End 35 45 60 ns tHA Address Hold from Write End 0 0 0 ns tSA Address Setup Time 0 0 0 ns tPWB LB, UB Valid to End of Write 35 45 60 ns
(4)
tPWE
WE Pulse Width 35 40 50 ns
tSD Data Setup to Write End 20 25 30 ns tHD Data Hold from Write End 0 0 0 ns
(3)
tHZWE tLZWE
Notes:
1. Test conditions assume signal transition times of 5 ns or less, timing reference levels of 0.9V/1.5V, input pulse levels of 0.4 to VDD-0.2V/0.4V to VDD-0.3V and output loading specified in Figure 1.
2.
The internal write time is defined by the overlap of CS1 LOW, CS2 HIGH and UB or LB, and WE LOW. All signals must be in valid states to initiate a Write, but any one can go inactive to write.
3. Tested with the load in Figure 2. Transition is measured ±500 mV from steady-state voltage. Not 100% tested.
PWE
4. t
WE LOW to High-Z Output 20 20 30 ns
(3)
WE HIGH to Low-Z Output 5 5 5 ns
terminate the Write. The Data Input Setup and Hold timing are referenced to the rising or falling edge of the signal that terminates the
> tHZWE + tSD when OE is LOW.
AC WAVEFORMS
CS1
CS2
WE
DIN
(1,2)
(CS1 Controlled, OE = HIGH or LOW)
t
t
SCS1
t
SCS2
t
AW
t
t
t
SA
DATA UNDEFINED
t
HZWE
WC
PWE
PWB
HIGH-Z
t
SD
DATA-IN VALID
t
HA
t
LZWE
t
HD
WRITE CYCLE NO. 1
ADDRESS
LB, UB
DOUT
Notes:
1. WRITE is an internally generated signal asserted during an overlap of the LOW states on the CS1 , CS2 and WE inputs and at least one of the LB and UB inputs being in the LOW state.
2. WRITE = (CS1) [ (LB) = (UB) ] (WE).
10
Integrated Silicon Solution, Inc. — www.issi.com —
1-800-379-4774
Rev. B
02/24/05
IS62WV51216ALL, IS62WV51216BLL ISSI
WRITE CYCLE NO. 2 (WE Controlled: OE is HIGH During Write Cycle)
t
WC
ADDRESS
OE
t
HA
t
t
LZWE
HD
CS1
CS2
WE
LB, UB
DOUT
t
SA
DATA UNDEFINED
t
AW
t
HZWE
t
SCS1
t
SCS2
t
PWE
HIGH-Z
t
SD
®
DIN
DATA-IN VALID
WRITE CYCLE NO. 3 (WE Controlled: OE is LOW During Write Cycle)
t
WC
ADDRESS
OE
tSCS1
CS1
tSCS2
CS2
tAW
WE
LB, UB
DOUT
tSA
DATA UNDEFINED
tPWE
tHZWE
HIGH-Z
tSD tHD
tHA
tLZWE
DIN
Integrated Silicon Solution, Inc. — www.issi.com —
Rev. B
02/24/05
1-800-379-4774
DATA-IN VALID
11
IS62WV51216ALL, IS62WV51216BLL ISSI
WRITE CYCLE NO. 4 (UB/LB Controlled)
t
t
WC
WC
®
ADDRESS
CS1
CS2
UB, LB
OUT
D
OE
WE
D
LOW
HIGH
DATA UNDEFINED
IN
t
HZWE
ADDRESS 1 ADDRESS 2
t
SA
t
HA
t
SA
t
PBW
t
SD
WORD 1
HIGH-Z
DATA
VALID
t
HD
IN
t
SD
WORD 2
t
PBW
DATA
VALID
t
HA
t
LZWE
t
HD
IN
UB_CSWR4.eps
12
Integrated Silicon Solution, Inc. — www.issi.com —
1-800-379-4774
Rev. B
02/24/05
IS62WV51216ALL, IS62WV51216BLL ISSI
DATA RETENTION SWITCHING CHARACTERISTICS
Symbol Parameter Test Condition Min. Max. Unit
VDR VDD for Data Retention See Data Retention Waveform 1.2 3. 6 V
IDR Data Retention Current VDD = 1.2V, CS1 VDD – 0.2V 20 µA
tSDR Data Retention Setup Time See Data Retention Waveform 0 ns tRDR Recovery Time See Data Retention Waveform tRC —ns
DATA RETENTION WAVEFORM (CS1 Controlled)
®
Data Retention Mode
CS1 V
1.65V
1.4V
GND
V
V
CS1
SDR
t
DD
DR
DATA RETENTION WAVEFORM (CS2 Controlled)
Data Retention Mode
V
DD
3.0 t
SDR
2.2V
CE2 V
DR
0.4V
DD
- 0.2V
CS2 0.2V
t
RDR
t
RDR
GND
Integrated Silicon Solution, Inc. — www.issi.com —
Rev. B
02/24/05
1-800-379-4774
13
IS62WV51216ALL, IS62WV51216BLL ISSI
ORDERING INFORMATION IS62WV51216ALL (1.65V - 2.2V)
Industrial Range: –40°C to +85°C
Speed (ns) Order Part No. Package
70 IS62WV51216ALL-70TI TSOP-II
IS62WV51216ALL-70BI mini BGA (7.2mm x 8.7mm) IS62WV51216ALL-70XI DIE
ORDERING INFORMATION IS62WV51216BLL (2.5V - 3.6V)
Commercial Range: 0°C to +70°C
®
Speed (ns) Order Part No. Package
45 IS62WV51216BLL-45B mini BGA (7.2mm x 8.7mm)
Industrial Range: –40°C to +85°C
Speed (ns) Order Part No. Package
55 IS62WV51216BLL-55TI TSOP-II
70 IS62WV51216BLL-70XI DIE
IS62WV51216BLL-55TLI TSOP-II, Lead-free IS62WV51216BLL-55BI mini BGA (7.2mm x 8.7mm) IS62WV51216BLL-55BLI mini BGA (7.2mm x 8.7mm), Lead-free
14
Integrated Silicon Solution, Inc. — www.issi.com —
1-800-379-4774
Rev. B
02/24/05
IS62WV51216ALL, IS62WV51216BLL ISSI
Mini Ball Grid Array Package Code: B (48-pin)
Top View Bottom View
φ b (48x)
6 5 4 3 2 11 2 3 4 5 6
®
A B C D
D
E F G H
A2
SEATING PLANE
mBGA - 7.2mm x 8.7mm
A1
e
D1
e
E1E
A
A B C D E F G H
Notes:
1. Controlling dimensions are in millimeters.
MILLIMETERS INCHES
Sym. M i n. Typ. Max. Min. Typ. Max.
N0. Leads 48
A 1.20 — 0.047
A1 0 .24 0.30 0.009 — 0.012
A2 0.60 0.024
D 8.60 8.70 8.80 0.339 0.343 0.346
D1 5.25BSC 0.207BSC
E 7.10 7.20 7.30 0.280 0.283 0.287
E1 3.75BSC 0.148BSC
e 0.75BSC 0.030BSC
b 0.30 0.35 0.40 0.012 0.014 0.016
Integrated Silicon Solution, Inc. — www.issi.com —
Rev. B
02/24/05
1-800-379-4774
15
PACKAGING INFORMATION ISSI
Plastic TSOP Package Code: T (Type II)
®
N/2+1N
E
E1
1
N/2
Notes:
1. Controlling dimension: millimieters, unless otherwise specified.
2. BSC = Basic lead spacing between centers.
3. Dimensions D and E1 do not include mold flash protrusions and should be measured from the
bottom of the package.
4. Formed leads shall be planar with respect to one another within
0.004 inches at the seating plane.
D
SEATING PLANE
A
ZD
.
e
b
A1
L
α
C
Plastic TSOP (T - Type II)
Millimeters Inches Millimeters Inches Millimeters Inches
Symbol Min Max Min Max Min Max Min Max Min Max Min Max
Ref. Std.
No. Leads (N) 32 44 50
A 1.20 0.047 1.20 0.047 1.20 0.047
A1 0.05 0.15 0.002 0.006 0.05 0.15 0.002 0.006 0.05 0.15 0.002 0.006
b 0.30 0.52 0.012 0.020 0.30 0.45 0.012 0.018 0.30 0.45 0.012 0.018 C 0.12 0.21 0.005 0.008 0.12 0.21 0.005 0.008 0.12 0.21 0.005 0.008 D 20.82 21.08 0.820 0.830 18.31 18.52 0.721 0.729 20.82 21.08 0.820 0.830
E1 10.03 10.29 0.391 0.400 10.03 10.29 0.395 0.405 10.03 10.29 0.395 0.405
E 11.56 11.96 0.451 0.466 11.56 11.96 0.455 0.471 11.56 11.96 0.455 0.471
e 1.27 BSC 0.050 BSC 0.80 BSC 0.032 BSC 0.80 BSC 0.031 BSC
L 0.40 0.60 0.016 0.024 0.41 0.60 0.016 0.024 0.40 0.60 0.016 0.024
ZD 0.95 REF 0.037 REF 0.81 REF 0.032 REF 0.88 REF 0.035 REF
α
Copyright © 2003 Integrated Silicon Solution, Inc. All rights reserved. ISSI reserves the right to make changes to this specification and its products at any time without notice. ISSI assumes no liability arising out of the application or use of any information, products or services described herein. Customers are advised to obtain the latest version of this device specification before relying on any published information and before placing orders for products.
Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774
Rev. F
06/18/03
Loading...