• Clock controlled, registered address, data and
control
• Pentium™ or linear burst sequence control using
MODE input
• Three chip enables for simple depth expansion
and address pipelining
• Common data inputs and data outputs
• JEDEC 100-Pin TQFP and
119-pin PBGA package
• Single +3.3V, +10%, -5% power supply
• Power-down snooze mode
APRIL 2001
DESCRIPTION
The ISSI IS61SP25616 and IS61SP25618 is a high-speed
synchronous static RAM designed to provide a burstable,
high-performance memory for high speed networking and
communication applications. It is organized as 262,144
words by 16 bits and 18 bits, fabricated with ISSI's
advanced CMOS technology. The device integrates a 2-bit
burst counter, high-speed SRAM core, and high-drive
capability outputs into a single monolithic circuit. All
synchronous inputs pass through registers controlled by
a positive-edge-triggered single clock input.
Write cycles are internally self-timed and are initiated by
the rising edge of the clock input. Write cycles can be from
one to four bytes wide as controlled by the write control
inputs.
Separate byte enables allow individual bytes to be written.
BW1 controls DQ1-8, BW2 controls DQ9-16, conditioned
by BWE being LOW. A LOW on GW input would cause all
bytes to be written.
Bursts can be initiated with either ADSP (Address Status
Processor) or ADSC (Address Status Cache Controller)
input pins. Subsequent burst addresses can be generated
internally and controlled by the ADV (burst address
advance) input pin.
The mode pin is used to select the burst sequence order,
Linear burst is achieved when this pin is tied LOW.
Interleave burst is achieved when this pin is tied HIGH or
left floating.
TBIASTemperature Under Bias–40 to +85°C
TSTGStorage Temperature–55 to +150°C
PDPower Dissipation1.6W
IOUTOutput Current (per I/O)100mA
VIN, VOUT Voltage Relative to GND for I/O Pins–0.5 to VCCQ + 0.3V
VINVoltage Relative to GND for–0.5 to VCC + 0.5V
for Address and Control Inputs
VCCVoltage on Vcc Supply Relatiive to GND–0.5 to 4.6V
(1)
Notes:
1. Stress greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at
these or any other conditions above those indicated in the operational sections of this
specification is not implied. Exposure to absolute maximum rating conditions for extended
periods may affect reliability.
2. This device contains circuitry to protect the inputs against damage due to high static voltages
or electric fields; however, precautions may be taken to avoid application of any voltage higher
than maximum rated voltages to this high-impedance circuit.
3. This device contains circuitry that will ensure the output devices are in High-Z at power up.
6
Integrated Silicon Solution, Inc. — 1-800-379-4774
Rev. A
04/17/01
IS61SP25616
IS61SP25618ISSI
OPERATING RANGE
RangeAmbient TemperatureVCC
Commercial0°C to +70°C3.3V, +10%, –5%
Industrial–40°C to +85°C3.3V, +10%, –5%
Clock Low Time2.4—2.6—2.8—3—ns
Clock Access Time—3.5—3.8—4—5ns
Clock High to Output Invalid3—3—3—3—ns
Clock High to Output Low-Z0—0—0—0—ns
Clock High to Output High-Z1.53.51.53.51.53.51.53.5ns
Output Enable to Output Valid—3.5—3.5—3.8—5ns
Output Disable to Output Invalid0—0—0—0—ns
Output Enable to Output Low-Z0—0—0—0—ns
Output Disable to Output High-Z23.523.523.825ns
Address Setup Time2—2—2—2—ns
Address Status Setup Time2—2—2—2—ns
Write Setup Time2—2—2—2—ns
Chip Enable Setup Time2—2—2—2—ns
Address Advance Setup Time2—2—2—2—ns
Address Hold Time0.5—0.5—0.5—0.5—ns
Address Status Hold Time0.5—0.5—0.5—0.5—ns
Write Hold Time0.5—0.5—0.5—0.5—ns
Chip Enable Hold Time0.5—0.5—0.5—0.5—ns
Address Advance Hold Time0.5—0.5—0.5—0.5—ns
®
Integrated Silicon Solution, Inc. — 1-800-379-4774
Rev. A
04/17/01
9
IS61SP25616
IS61SP25618ISSI
READ/WRITE CYCLE TIMING
t
KC
CLK
t
KL
t
AVS
t
SH
t
AVH
ADSP is blocked by CE inactive
ADSC initiate read
Suspend Burst
ADSP
ADSC
ADV
t
t
SS
AS
t
SH
t
AH
t
KH
t
SS
®
A17-A0
GW
BWE
BW2-BW1
CE
CE2
CE2
OE
RD1RD2
t
WS
t
WS
t
CES
t
CES
t
CES
t
CEH
t
CEH
t
CEH
t
OEQ
t
WH
t
WH
RD3
CE Masks ADSP
CE2 and CE2 only sampled with ADSP or ADSC
t
OEHZ
Unselected with CE2
10
DATA
OUT
DATA
IN
High-Z
High-Z
t
OELZ
t
KQLZ
t
Single Read
KQ
t
OEQX
1a
2a2b
2c2d3a
Pipelined Read
Burst Read
Integrated Silicon Solution, Inc. — 1-800-379-4774
Cycle Time6—6.7—7.5—10—ns
Clock High Time2.4—2.6—2.8—4—ns
Clock Low Time2.4—2.6—2.8—4—ns
Address Setup Time2—2—2—2—ns
Address Status Setup Time2—2—2—2—ns
Write Setup Time2—2—2—2—ns
Data In Setup Time2—2—2—2—ns
Chip Enable Setup Time2—2—2—2—ns
Address Advance Setup Time2—2—2—2—ns
Address Hold Time0.5—0.5—0.5—0.5—ns
Address Status Hold Time0.5—0.5—0.5—0.5—ns
Data In Hold Time0.5—0.5—0.5—0.5—ns
Write Hold Time0.5—0.5—0.5—0.5—ns
Chip Enable Hold Time0.5—0.5—0.5—0.5—ns
Address Advance Hold Time0.5—0.5—0.5—0.5—ns
®
Note:
1. Tested with load in Figure 1.
Integrated Silicon Solution, Inc. — 1-800-379-4774
Rev. A
04/17/01
11
IS61SP25616
IS61SP25618ISSI
WRITE CYCLE TIMING
t
KC
CLK
t
KL
t
AVS
ADSP is blocked by CE inactive
ADSC initiate Write
t
AVH
ADSP
ADSC
ADV
t
t
SS
AS
t
KH
t
SH
ADV must be inactive for ADSP Write
t
AH
®
A17-A0
GW
BWE
BW2-BW1
CE
CE2
CE2
OE
WR1WR2
t
WS
t
WS
t
WS
WR1WR2
t
CES
t
CES
t
CES
t
CEH
t
CEH
t
CEH
t
WH
t
WH
t
WH
WR3
t
WS
t
WH
WR3
CE Masks ADSP
CE2 and CE2 only sampled with ADSP or ADSC
Unselected with CE2
12
DATA
OUT
DATA
IN
High-Z
t
DS
High-Z
Single Write
1a
t
DH
BW4-BW1 only are applied to first cycle of WR2
2c2d2b2a
Burst Write
Write
Integrated Silicon Solution, Inc. — 1-800-379-4774
3a
Unselected
Rev. A
04/17/01
IS61SP25616
IS61SP25618ISSI
SNOOZE AND RECOVERY CYCLE SWITCHING CHARACTERISTICS (Over Operating Range)
Cycle Time6—6.7—7.5—10—ns
Clock High Time2.4—2.6—2.8—4—ns
Clock Low Time2.4—2.6—2.8—4—ns
Clock Access Time—3.5—3.8—4—5ns
Clock High to Output Invalid1.5—1.5—1.5—2.5—ns
(1,2)
Clock High to Output Low-Z0—0—0—0—ns
(1,2)
Clock High to Output High-Z1.53.51.53.51.53.51.53.5ns
Output Enable to Output Valid—3.5—3.5—3.9—5ns
(1)
Output Disable to Output Invalid0—0—0—0—ns
(1,2)
Output Enable to Output Low-Z0—0—0—0—ns
(1,2)
Output Disable to Output High-Z23.523.523.825ns
Address Setup Time2—2—2—2—ns
Address Status Setup Time2—2—2—2—ns
Chip Enable Setup Time2—2—2—2—ns
Address Hold Time0.5—0.5—0.5—0.5—ns
Address Status Hold Time0.5—0.5—0.5—0.5—ns
Chip Enable Hold Time0.5—0.5—0.5—0.5—ns
®
Notes:
1. Guaranteed but not 100% tested. This parameter is periodically sampled.
2. Tested with load in Figure 2.
3. Tested with load in Figure 1.
Integrated Silicon Solution, Inc. — 1-800-379-4774
Rev. A
04/17/01
13
IS61SP25616
IS61SP25618ISSI
SNOOZE AND RECOVERY CYCLE TIMING
t
KC
CLK
t
KL
ADSP
ADSC
ADV
t
t
SS
AS
t
SH
t
AH
t
KH
®
A17-A0
GW
BWE
BW2-BW1
CE
CE2
CE2
OE
t
CES
t
CES
t
CES
RD1
t
CEH
t
CEH
t
CEH
t
OEQ
t
OEHZ
RD2
14
DATA
OUT
DATA
IN
ZZ
High-Z
High-Z
t
OELZ
t
KQLZ
Single Read
t
KQ
t
OEQX
1a
t
KQX
t
KQHZ
t
ZZS
t
ZZREC
Snooze with Data Retention
Read
Integrated Silicon Solution, Inc. — 1-800-379-4774
Rev. A
04/17/01
IS61SP25616
IS61SP25618ISSI
®
ORDERING INFORMATION
Commercial Range: 0°C to +70°C