Datasheet IS61SF25618-10TQ, IS61SF25618-10B, IS61SF25616-8TQ, IS61SF25616-8.5TQ, IS61SF25616-8.5B Datasheet (ISSI)

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IS61SF25616
IS61SF25618 ISSI
®
Integrated Silicon Solution, Inc. — 1-800-379-4774
1
Rev. A
04/17/01
ISSI reserves the right to make changes to its products at any time without notice in order to improve design and supply the best possible product. We assume no responsibility for any errors which may appear in this publication. © Copyright 2001, Integrated Silicon Solution, Inc.
FEATURES
• Fast access times: 8 ns, 8.5 ns, 10 ns, and 12 ns
• Internal self-timed write cycle
• Individual Byte Write Control and Global Write
• Clock controlled, registered address, data inputs and control signals
• Pentium
TM
or linear burst sequence control
using MODE input
• Three chip enables for simple depth expansion and address pipelining
• Common data inputs and data outputs
• JEDEC 100-Pin TQFP and 119-pin PBGA package
• Single +3.3V +10%, –5% power supply
• Power-down snooze mode
256K x 16, 256K x 18 SYNCHRONOUS FLOW-THROUGH STATIC RAM
APRIL 2001
FAST ACCESS TIME
Symbol Parameter 8 8.5 10 12 Units
tKQ Clock Access Time 8 8.5 10 12 ns tKC Cycle Time 10 11 15 15 ns
Frequency 100 90 66 66 MHz
DESCRIPTION
The ISSI IS61SF25616 and IS61SF25618 is a high-speed, low-power synchronous static RAM designed to provide a burstable, high-performance memory for high speed networking and communication applications. It is organized as 262,144 words by 16 bits and 18 bits, fabricated with
ISSI's advanced CMOS technology. The device integrates
a 2-bit burst counter, high-speed SRAM core, and high-drive capability outputs into a single monolithic circuit. All synchronous inputs pass through registers controlled by a positive-edge-triggered single clock input.
Write cycles are internally self-timed and are initiated by the rising edge of the clock input. Write cycles can be from one to four bytes wide as controlled by the write control inputs.
Separate byte enables allow individual bytes to be written. BW1 controls DQ1-8, BW2 controls DQ9-16, conditioned by BWE being LOW. A LOW on GW input would cause all bytes to be written.
Bursts can be initiated with either ADSP (Address Status Processor) or ADSC (Address Status Cache Controller) input pins. Subsequent burst addresses can be generated internally by the IS61SF25616 and controlled by the ADV (burst address advance) input pin.
The mode pin is used to select the burst sequence order, Linear burst is achieved when this pin is tied LOW. Interleave burst is achieved when this pin is tied HIGH or left floating.
IS61SF25616
IS61SF25618 ISSI
®
2
Integrated Silicon Solution, Inc. — 1-800-379-4774
Rev. A
04/17/01
BLOCK DIAGRAM
BURST
COUNTER
A2-A17
A1 A0
GW
MODE
ADSC
ADSP
ADDRESS
REGISTER
BW1
BYTE WRITE
REGISTER
BW2
BYTE WRITE
REGISTER
ENABLE
REGISTER
ENABLE
REGISTER
BWE
BW1
BW2
256K x 16, 256K x 18
MEMORY ARRAY
16
or
18
DATA INPUT
REGISTER
CLK
16
or
18
2
ADV
CLK
2 18
18
16
2
CLK2
CLK2
CLK
OE
CE1
CE2
CE2
CLR
DQ1-DQ16
or
DQ1-DQ18
IS61SF25616
IS61SF25618 ISSI
®
Integrated Silicon Solution, Inc. — 1-800-379-4774
3
Rev. A
04/17/01
PIN CONFIGURATION
PIN DESCRIPTIONS
A0, A1 Synchronous Address Inputs. These
pins must tied to the two LSBs of the address bus.
A2-A17 Synchronous Address Inputs
CLK Synchronous Clock ADSP Synchronous Processor Address
Status
ADSC Synchronous Controller Address
Status
ADV Synchronous Burst Address Advance BW1-BW2 Synchronous Byte Write Enable
BWE Synchronous Byte Write Enable GW Synchronous Global Write Enable CE, CE2, CE2 Synchronous Chip Enable OE Output Enable
DQ1-DQ16 Synchronous Data Input/Output
MODE Burst Sequence Mode Selection
VCC +3.3V Power Supply
GND Ground
VCCQ Isolated Output Buffer Supply: +3.3V
ZZ Snooze Enable
A
B
C
D
E
F
G
H
J
K
L
M
N
P
R
T
U
VCCQ
NC
NC
DQ9
NC
VCCQ
NC
DQ12
VCCQ
NC
DQ14
VCCQ
DQ16
NC
NC
NC
VCCQ
A6
CE2
A7
NC
DQ10
NC
DQ11
NC
VCC
DQ13
NC
DQ15
NC
NC
A5
A11
NC
A4
A3
A2
GND
GND
GND
BW2
GND
NC
GND
GND
GND
GND
GND
MODE
A10
NC
ADSP
ADSC
VCC
NC
CE
OE
ADV
GW
VCC
CLK
NC
BWE
A1
A0
VCC
NC
NC
A8
A9
A12
GND
GND
GND
GND
GND
NC
GND
BW1
GND
GND
GND
GND
A14
NC
A16
CE2
A15
NC
NC
DQ7
NC
DQ5
VCC
NC
DQ3
NC
DQ2
NC
A13
A17
NC
VCCQ
NC
NC
NC
DQ8
VCCQ
DQ6
NC
VCCQ
DQ4
NC
VCCQ
NC
DQ1
NC
ZZ
VCCQ
1 2 3 4 5 6 7
A17 NC NC VCCQ GND NC NC DQ8 DQ7 GND VCCQ DQ6 DQ5 GND NC VCC ZZ DQ4 DQ3 VCCQ GND DQ2 DQ1 NC NC GND VCCQ NC NC NC
A6
A7CECE2NCNC
BW2
BW1
CE2
VCC
GND
CLK
GW
BWEOEADSC
ADSP
ADV
A8
A9
NC NC NC
VCCQ
GND
NC NC
DQ9
DQ10
GND
VCCQ
DQ11 DQ12
GND
VCC
NC
GND DQ13 DQ14
VCCQ
GND DQ15 DQ16
NC NC
GND
VCCQ
NC NC NC
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30
80 79 78 77 76 75 74 73 72 71 70 69 68 67 66 65 64 63 62 61 60 59 58 57 56 55 54 53 52 51
100
99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81
31 32 33 34 35 36 37 38 39 40 41 42 43 44 45
MODE
A5A4A3A2A1
A0
NC
NC
GND
VCC
NC
NC
A10
A11
A12
A13
A14
A15
A16
46 47 48 49 50
256K x 16
119-pin PBGA (Top View) 100-Pin TQFP
IS61SF25616
IS61SF25618 ISSI
®
4
Integrated Silicon Solution, Inc. — 1-800-379-4774
Rev. A
04/17/01
PIN DESCRIPTIONS
A0, A1 Synchronous Address Inputs. These
pins must tied to the two LSBs of the address bus.
A2-A17 Synchronous Address Inputs
CLK Synchronous Clock ADSP Synchronous Processor Address
Status
ADSC Synchronous Controller Address
Status
ADV Synchronous Burst Address Advance BW1-BW2 Synchronous Byte Write Enable BWE Synchronous Byte Write Enable
GW Synchronous Global Write Enable CE, CE2, CE2 Synchronous Chip Enable OE Output Enable
DQ1-DQ16 Synchronous Data Input/Output
MODE Burst Sequence Mode Selection
VCC +3.3V Power Supply
GND Ground
VCCQ Isolated Output Buffer Supply: 3.3V
ZZ Snooze Enable
DQP1-DQP2 Parity Data I/O DQP1 is parity for
DQ1-8; DQP2 is parity for DQ9-16
A
B
C
D
E
F
G
H
J
K
L
M
N
P
R
T
U
VCCQ
NC
NC
DQ9
NC
VCCQ
NC
DQ12
VCCQ
NC
DQ14
VCCQ
DQ16
NC
NC
NC
VCCQ
A6
CE2
A7
NC
DQ10
NC
DQ11
NC
VCC
DQ13
NC
DQ15
NC
DQP2
A5
A11
NC
A4
A3
A2
GND
GND
GND
BW2
GND
NC
GND
GND
GND
GND
GND
MODE
A10
NC
ADSP
ADSC
VCC
NC
CE
OE
ADV
GW
VCC
CLK
NC
BWE
A1
A0
VCC
NC
NC
A8
A9
A12
GND
GND
GND
GND
GND
NC
GND
BW1
GND
GND
GND
GND
A14
NC
A16
CE2
A15
DQP1
NC
DQ7
NC
DQ5
VCC
NC
DQ3
NC
DQ2
NC
A13
A17
NC
VCCQ
NC
NC
NC
DQ8
VCCQ
DQ6
NC
VCCQ
DQ4
NC
VCCQ
NC
DQ1
NC
ZZ
VCCQ
1 2 3 4 5 6 7
A17 NC NC VCCQ GND NC DQP1 DQ8 DQ7 GND VCCQ DQ6 DQ5 GND NC VCC ZZ DQ4 DQ3 VCCQ GND DQ2 DQ1 NC NC GND VCCQ NC NC NC
A6
A7CECE2NCNC
BW2
BW1
CE2
VCC
GND
CLK
GW
BWEOEADSC
ADSP
ADV
A8
A9
NC NC NC
VCCQ
GND
NC NC
DQ9
DQ10
GND
VCCQ
DQ11 DQ12
GND
VCC
NC
GND DQ13 DQ14
VCCQ
GND DQ15 DQ16
DQP2
NC
GND
VCCQ
NC NC NC
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30
80 79 78 77 76 75 74 73 72 71 70 69 68 67 66 65 64 63 62 61 60 59 58 57 56 55 54 53 52 51
100
99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81
31 32 33 34 35 36 37 38 39 40 41 42 43 44 45
MODE
A5A4A3A2A1
A0
NC
NC
GND
VCC
NC
NC
A10
A11
A12
A13
A14
A15
A16
46 47 48 49 50
256K x 18
119-pin PBGA (Top View) 100-Pin TQFP
IS61SF25616
IS61SF25618 ISSI
®
Integrated Silicon Solution, Inc. — 1-800-379-4774
5
Rev. A
04/17/01
TRUTH TABLE
Address
Operation Used CE CE2 CE2 ADSP ADSC ADV WRITE OE DQ
Deselected, Power-down None H X X X L X X X High-Z Deselected, Power-down None L X H L X X X X High-Z Deselected, Power-down None L L X L X X X X High-Z Deselected, Power-down None X X H H L X X X High-Z Deselected, Power-down None X L X H L X X X High-Z Read Cycle, Begin Burst External L H L L X X X X Q Read Cycle, Begin Burst External L H L H L X Read X Q Write Cycle, Begin Burst External L H L H L X Write X D Read Cycle, Continue Burst Next X X X H H L Read L Q Read Cycle, Continue Burst Next X X X H H L Read H High-Z Read Cycle, Continue Burst Next H X X X H L Read L Q Read Cycle, Continue Burst Next H X X X H L Read H High-Z Write Cycle, Continue Burst Next X X X H H L Write X D Write Cycle, Continue Burst Next H X X X H L Write X D Read Cycle, Suspend Burst Current X X X H H H Read L Q Read Cycle, Suspend Burst Current X X X H H H Read H High-Z Read Cycle, Suspend Burst Current H X X X H H Read L Q Read Cycle, Suspend Burst Current H X X X H H Read H High-Z Write Cycle, Suspend Burst Current X X X H H H Write X D Write Cycle, Suspend Burst Current H X X X H H Write X D
PARTIAL TRUTH TABLE
Function GW BWE BW1 BW2
Read H H X X Read H L H H Write Byte 1 H L L H Write All Bytes H L L L Write All Bytes L X X X
IS61SF25616
IS61SF25618 ISSI
®
6
Integrated Silicon Solution, Inc. — 1-800-379-4774
Rev. A
04/17/01
INTERLEAVED BURST ADDRESS TABLE (MODE = VCC or No Connect)
External Address 1st Burst Address 2nd Burst Address 3rd Burst Address
A1 A0 A1 A0 A1 A0 A1 A0
00 01 10 11 01 00 11 10 10 11 00 01 11 10 01 00
LINEAR BURST ADDRESS TABLE (MODE = GND)
ABSOLUTE MAXIMUM RATINGS
(1)
Symbol Parameter Value Unit
TBIAS Temperature Under Bias –40 to +85 °C TSTG Storage Temperature –55 to +150 °C PD Power Dissipation 1.6 W IOUT Output Current (per I/O) 100 mA VIN, VOUT Voltage Relative to GND for I/O Pins –0.5 to VCCQ + 0.3 V VIN Voltage Relative to GND for –0.5 to VCC + 0.5 V
for Address and Control Inputs
VCC Voltage on Vcc Supply Relatiive to GND –0.5 to 4.6 V
Notes:
1. Stress greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
2. This device contains circuitry to protect the inputs against damage due to high static voltages or electric fields; however, precautions may be taken to avoid application of any voltage higher than maximum rated voltages to this high-impedance circuit.
3. This device contains circuitry that will ensure the output devices are in High-Z at power up.
0,0
1,0
0,1A1', A0' = 1,1
IS61SF25616
IS61SF25618 ISSI
®
Integrated Silicon Solution, Inc. — 1-800-379-4774
7
Rev. A
04/17/01
OPERATING RANGE
Range Ambient Temperature VCC
Commercial 0°C to +70°C 3.3V +10%, –5%
Industrial –40°C to +85°C 3.3V +10%, –5%
DC ELECTRICAL CHARACTERISTICS
(1)
(Over Operating Range)
Symbol Parameter Test Conditions Min. Max. Unit
VOH Output HIGH Voltage IOH = –4.0 mA 2.4 V
VOL Output LOW Voltage IOL = 8.0 mA 0.4 V
VIH Input HIGH Voltage 2.0 VCC + 0.3 V
VIL Input LOW Voltage –0.3 0.8 V
ILI Input Leakage Current GND VIN VCCQ
(2)
Com. –22µA
Ind. –55
ILO Output Leakage Current GND VOUT VCCQ, OE = VIH Com. –22µA
Ind. –55
POWER SUPPLY CHARACTERISTICS (Over Operating Range)
8 8.5 10 12
Symbol Parameter Test Conditions Max. Max. Max. Max. Unit
ICC AC Operating Device Selected, Com. 180 170 160 150 mA
Supply Current All Inputs = VIL or VIH Ind. 180 170 160
OE = VIH, Vcc = Max. Cycle Time ≥ tKC min.
ISB Standby Current Device Deselected, Com. 50 50 50 50 mA
VCC = Max., Ind. 60 60 60 All Inputs = VIH or VIL CLK Cycle Time ≥ tKC min.
IZZ Power-down ZZ = VCCQ Com.10101010mA
Mode Current Clock Running Ind. 15 15 15
All Inputs GND + 0.2V or Vcc – 0.2V
Notes:
1. The MODE pin has an internal pullup. This pin may be a No Connect, tied to GND, or tied to V
CC.
2. The MODE pin should be tied to Vcc or GND. It exhibits ±10 µA maximum leakage current when tied to GND + 0.2V or Vcc – 0.2V.
IS61SF25616
IS61SF25618 ISSI
®
8
Integrated Silicon Solution, Inc. — 1-800-379-4774
Rev. A
04/17/01
CAPACITANCE
(1,2)
Symbol Parameter Conditions Max. Unit
CIN Input Capacitance VIN = 0V 6 pF
COUT Input/Output Capacitance VOUT = 0V 8 pF
Notes:
1. Tested initially and after any design or process changes that may affect these parameters.
2. Test conditions: T
A = 25°C, f = 1 MHz, Vcc = 3.3V.
AC TEST CONDITIONS
Parameter Unit
Input Pulse Level 0V to 3.0V Input Rise and Fall Times 1.5 ns Input and Output Timing 1.5V
and Reference Level Output Load See Figures 1 and 2
AC TEST LOADS
Figure 2
Figure 1
Output Buffer
Z
O
= 50
1.5V
50
30 pF
317
5 pF
Including
jig and
scope
351
OUTPUT
3.3V
IS61SF25616
IS61SF25618 ISSI
®
Integrated Silicon Solution, Inc. — 1-800-379-4774
9
Rev. A
04/17/01
READ/WRITE CYCLE SWITCHING CHARACTERISTICS (Over Operating Range)
8 8.5 10 12
Symbol Parameter Min. Max. Min. Max. Min. Max. Min. Max. Unit
fMAX
(3)
Clock Frequency 100 90 66 66 MHz
tKC
(3)
Cycle Time 10 11 15 15 ns
tKH Clock High Time 4 4.5 4.5 4.5 ns
tKL
(3)
Clock Low Time 4 4.5 4.5 4.5 ns
tKQ
(3)
Clock Access Time 8 8.5 10 12 ns
tKQX
(1)
Clock High to Output Invalid 2 2 2 2 ns
tKQLZ
(1,2)
Clock High to Output Low-Z 0 0 0 0 ns
tKQHZ
(1,2)
Clock High to Output High-Z 2 3.5 2 3.5 2 3.5 2 3.5 ns
tOEQ
(3)
Output Enable to Output Valid 3.5 3.5 3.5 5ns
tOELZ
(1,2)
Output Enable to Output Low-Z 0 0 0 0 ns
tOEHZ
(1,2)
Output Disable to Output High-Z 3.5 3.5 3.5 3.5 ns
tAS
(3)
Address Setup Time 2 2 2 4 ns
tSS
(3)
Address Status Setup Time 2 2 2 4 ns
tWS
(3)
Write Setup Time 2 2 2 4 ns
tCES
(3)
Chip Enable Setup Time 2 2 2 4 ns
tAVS
(3)
Address Advance Setup Time 2 2 2 4 ns
tAH
(3)
Address Hold Time 0.5 0.5 0.5 1.5 ns
tSH
(3)
Address Status Hold Time 0.5 0.5 0.5 1.5 ns
tWH
(3)
Write Hold Time 0.5 0.5 0.5 1.5 ns
tCEH
(3)
Chip Enable Hold Time 0.5 0.5 0.5 1.5 ns
tAVH
(3)
Address Advance Hold Time 0.5 0.5 0.5 1.5 ns
Notes:
1. Guaranteed but not 100% tested. This parameter is periodically sampled.
2. Tested with load in Figure 2.
3. Tested with load in Figure 1.
IS61SF25616
IS61SF25618 ISSI
®
10
Integrated Silicon Solution, Inc. — 1-800-379-4774
Rev. A
04/17/01
READ/WRITE CYCLE TIMING
Single Read Flow-through
Single Write
High-Z
High-Z
DATA
OUT
DATA
IN
OE
CE2
CE2
CE
BW2-BW1
BWE
GW
A17-A0
ADV
ADSC
ADSP
CLK
RD1 WR1
WR1
1a
1a
2a 2b 2c 2d
Unselected
Burst Read
t
KQX
t
KC
t
KL
t
KH
t
SS
t
SH
ADSP is blocked by CE inactive
t
SS
t
SH
t
AS
t
AH
t
WS
t
WH
t
WS
t
WH
t
WS
t
WH
RD2 RD3
t
CES
t
CEH
t
CES
t
CEH
t
CES
t
CEH
CE2 and CE2 only sampled with ADSP or ADSC
CE Masks ADSP
Unselected with CE2
t
OEQX
t
KQ
t
OEHZ
t
KQX
t
KQHZ
t
DS
t
DH
t
KQHZ
t
KQLZ
IS61SF25616
IS61SF25618 ISSI
®
Integrated Silicon Solution, Inc. — 1-800-379-4774
11
Rev. A
04/17/01
WRITE CYCLE SWITCHING CHARACTERISTICS (Over Operating Range)
8 8.5 10 12
Symbol Parameter Min. Max. Min. Max. Min. Max. Min. Max. Unit
tKC
(1)
Cycle Time 10 11 15 15 ns
tKH
(1)
Clock High Time 4 4.5 4.5 4.5 ns
tKL
(1)
Clock Low Time 4 4.5 4.5 4.5 ns
tAS
(1)
Address Setup Time 2 2 2 4 ns
tSS
(1)
Address Status Setup Time 2 2 2 4 ns
tWS
(1)
Write Setup Time 2 2 2 4 ns
tDS
(1)
Data In Setup Time 2 2 2 4 ns
tCES
(1)
Chip Enable Setup Time 2 2 2 4 ns
tAVS
(1)
Address Advance Setup Time 2 2 2 4 ns
tAH
(1)
Address Hold Time 0.5 0.5 0.5 1.5 ns
tSH
(1)
Address Status Hold Time 0.5 0.5 0.5 1.5 ns
tDH
(1)
Data In Hold Time 0.5 0.5 0.5 1.5 ns
tWH
(1)
Write Hold Time 0.5 0.5 0.5 1.5 ns
tCEH
(1)
Chip Enable Hold Time 0.5 0.5 0.5 1.5 ns
tAVH
(1)
Address Advance Hold Time 0.5 0.5 0.5 1.5 ns
Notes:
1. Tested with load in Figure 1.
IS61SF25616
IS61SF25618 ISSI
®
12
Integrated Silicon Solution, Inc. — 1-800-379-4774
Rev. A
04/17/01
WRITE CYCLE TIMING
Single Write
DATA
OUT
DATA
IN
OE
CE2
CE2
CE
BW2-BW1
BWE
GW
A17-A0
ADV
ADSC
ADSP
CLK
WR1 WR2
Unselected
Burst Write
t
KC
t
KL
t
KH
t
SS
t
SH
t
AS
t
AH
t
WS
t
WH
t
WS
t
WH
WR3
t
CES
t
CEH
t
CES
t
CEH
t
CES
t
CEH
CE2 and CE3 only sampled with ADSP or ADSC
CE1 Masks ADSP
Unselected with CE2
ADSC initiate Write
ADSP is blocked by CE1 inactive
t
AVH
t
AVS
ADV must be inactive for ADSP Write
WR1 WR2
t
WS
t
WH
WR3
t
WS
t
WH
High-Z
High-Z
1a
3a
t
DS
t
DH
BW4-BW1 only are applied to first cycle of WR2
Write
2c 2d2b2a
IS61SF25616
IS61SF25618 ISSI
®
Integrated Silicon Solution, Inc. — 1-800-379-4774
13
Rev. A
04/17/01
SNOOZE AND RECOVERY CYCLE SWITCHING CHARACTERISTICS (Over Operating Range)
8 8.5 10 12
Symbol Parameter Min. Max. Min. Max. Min. Max. Min. Max. Unit
tKC
(3)
Cycle Time 10 11 15 15 ns
tKH
(3)
Clock High Time 4 4.5 4.5 4.5 ns
tKL
(3)
Clock Low Time 4 4.5 4.5 4.5 ns
tKQ
(3)
Clock Access Time 8 8.5 10 12 ns
tKQX
(1)
Clock High to Output Invalid 2 2 2 2 ns
tKQLZ
(1,2)
Clock High to Output Low-Z 0 0 0 0 ns
tKQHZ
(1,2)
Clock High to Output High-Z 2 3.5 2 3.5 2 3.5 2 3.5 ns
tOEQ
(3)
Output Enable to Output Valid 3.5 3.5 3.5 5ns
tOELZ
(1,2)
Output Enable to Output Low-Z 0 0 0 0 ns
tOEHZ
(1,2)
Output Disable to Output High-Z 3.5 3.5 3.5 3.5 ns
tAS
(3)
Address Setup Time 2 2 2 4 ns
tSS
(3)
Address Status Setup Time 2 2 2 4 ns
tCES
(3)
Chip Enable Setup Time 2 2 2 4 ns
tAH
(3)
Address Hold Time 0.5 0.5 0.5 1.5 ns
tSH
(3)
Address Status Hold Time 0.5 0.5 0.5 1.5 ns
tCEH
(3)
Chip Enable Hold Time 0.5 0.5 0.5 1.5 ns
tZZS ZZ Standby 2 2 2 2 cyc
tZZREC ZZ Recovery 2 2 2 2 cyc
Notes:
1. Guaranteed but not 100% tested. This parameter is periodically sampled.
2. Tested with load in Figure 2.
3. Tested with load in Figure 1.
IS61SF25616
IS61SF25618 ISSI
®
14
Integrated Silicon Solution, Inc. — 1-800-379-4774
Rev. A
04/17/01
SNOOZE AND RECOVERY CYCLE TIMING
Single Read
High-Z
High-Z
DATA
OUT
DATA
IN
OE
CE2
CE2
CE
BW2-BW1
BWE
GW
A17-A0
ADV
ADSC
ADSP
CLK
RD1
1a
Read
Snooze with Data Retention
t
KC
t
KL
t
KH
t
SS
t
SH
t
AS
t
AH
RD2
t
CES
t
CEH
t
CES
t
CEH
t
CES
t
CEH
t
OEQ
t
OEQX
t
OELZ
t
KQLZ
t
KQ
t
OEHZ
t
KQX
t
KQHZ
ZZ
t
ZZS
t
ZZREC
IS61SF25616
IS61SF25618 ISSI
®
Integrated Silicon Solution, Inc. — 1-800-379-4774
15
Rev. A
04/17/01
ORDERING INFORMATION Commercial Range: 0°C to +70°C
Frequency Order Part Number Package
8 IS61SF25616-8TQ TQFP
IS61SF25616-8B PBGA
8.5 IS61SF25616-8.5TQ TQFP IS61SF25616-8.5B PBGA
10 IS61SF25616-10TQ TQFP
IS61SF25616-10B PBGA
12 IS61SF25616-12TQ TQFP
IS61SF25616-12B PBGA
Industrial Range: –40°C to +85°C
Frequency Order Part Number Package
8.5 IS61SF25616-8.5TQI TQFP
10 IS61SF25616-10TQI TQFP
12 IS61SF25616-12TQI TQFP
IS61SF25616
IS61SF25618 ISSI
®
16
Integrated Silicon Solution, Inc. — 1-800-379-4774
Rev. A
04/17/01
ORDERING INFORMATION Commercial Range: 0°C to +70°C
Frequency Order Part Number Package
8 IS61SF25618-8TQ TQFP
IS61SF25618-8B PBGA
8.5 IS61SF25618-8.5TQ TQFP IS61SF25618-8.5B PBGA
10 IS61SF25618-10TQ TQFP
IS61SF25618-10B PBGA
12 IS61SF25618-12TQ TQFP
IS61SF25618-12B PBGA
Industrial Range: –40°C to +85°C
Frequency Order Part Number Package
8.5 IS61SF25618-8.5TQI TQFP
10 IS61SF25618-10TQI TQFP
12 IS61SF25618-12TQI TQFP
ISSI
®
Integrated Silicon Solution, Inc.
2231 Lawson Lane
Santa Clara, CA 95054
Tel: 1-800-379-4774 Fax: (408) 588-0806
E-mail: sales@issi.com
www.issi.com
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