64K x 16 HIGH-SPEED CMOS STATIC RAM
WITH 3.3V SUPPLY
FEATURES
• High-speed access time: 8, 10, 12 ns
• CMOS low power operation
— 61LV6416:
75 mW (typical) operating current
0.5 mW (typical) standby current
— 61LV6416L:
65 mW (typical) operating current
50 µW (typical) standby current
• TTL compatible interface levels
• Single 3.3V power supply
• Fully static operation: no clock or refresh
required
• Three state outputs
• Data control for upper and lower bytes
• Industrial temperature available
• Lead-free available
DESCRIPTION
The ISSI IS61LV6416/IS61LV6416L is a high-speed,
1,048,576-bit static RAM organized as 65,536 words by 16
bits. It is fabricated using ISSI's high-performance CMOS
technology. This highly reliable process coupled with
innovative circuit design techniques, yields access times
as fast as 8 ns with low power consumption.
When CE is HIGH (deselected), the device assumes a
standby mode at which the power dissipation can be
reduced down with CMOS input levels.
Easy memory expansion is provided by using Chip
Enable and Output Enable inputs, CE and OE. The active
LOW Write Enable (WE) controls both writing and reading
of the memory. A data byte allows Upper Byte (UB) and
Lower Byte (LB) access.
The IS61LV6416/IS61LV6416L is packaged in the JEDEC
standard 44-pin 400-mil SOJ, 44-pin TSOP-II, and 48-pin
mini BGA (6mm x 8mm).
CEChip Enable Input
OEOutput Enable Input
WEWrite Enable Input
LBLower-byte Control (I/O0-I/O7)
UBUpper-byte Control (I/O8-I/O15)
NCNo Connection
VDDPower
GNDGround
Integrated Silicon Solution, Inc.
Rev. I
11/22/05
Page 3
IS61LV6416
IS61LV6416L
TRUTH TABLE
I/O PIN
Mode
Not SelectedXHXXXHigh-ZHigh-ZISB1, ISB2
Output DisabledHLHXXHigh-ZHigh-ZICC
ReadHLLLHD
WriteLLXLHDINHigh-ZICC
WEWE
WE
WEWE
XLXHHHigh-ZHigh-Z
HLLHLHigh-ZDOUT
HLLLL DOUTDOUT
LLXHLHigh-ZDIN
LLXLLDINDIN
CECE
CE
CECE
OEOE
OE
OEOE
LBLB
LB
LBLB
UBUB
UBI/O0-I/O7I/O8-I/O15VDD Current
UBUB
OUTHigh-ZICC
ISSI
®
1
2
3
ABSOLUTE MAXIMUM RATINGS
Symbol ParameterValueUnit
VTERMTerminal Voltage with Respect to GND–0.5 to VDD+0.5V
TSTGStorage Temperature–65 to +150°C
PTPower Dissipation1.5W
IOUTDC Output Current (LOW)20mA
Note:
1. Stress greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause
permanent damage to the device. This is a stress rating only and functional operation of
the device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect reliability.
OPERATING RANGE
RangeAmbient TemperatureVDD (8,10 ns)VDD (12 ns)
Commercial0°C to +70°C3.3V+10%,-5%3.3V ± 10%
Industrial–40°C to +85°C3.3V+10%,-5%3.3V ± 10%
(1)
4
5
6
7
8
9
DC ELECTRICAL CHARACTERISTICS (Over Operating Range)
SymbolParameterTest ConditionsMin.Max.Unit
VOHOutput HIGH VoltageVDD = Min., IOH = –4.0 mA2.4—V
MAX, address and data inputs are cycling at the maximum frequency, f = 0 means no input lines change.
DD=3.3V, TA=25
(1)
(Over Operating Range)
-8 ns-10 ns
(2)
typ.
(2)
o
C. Not 100% Tested.
—75 —70
—0.05—0.05
CAPACITANCE
(1)
SymbolParameterConditionsMax.Unit
CINInput CapacitanceVIN = 0V6pF
COUTInput/Output CapacitanceVOUT = 0V8pF
Note:
1. Tested initially and after any design or process changes that may affect these parameters.
4
Integrated Silicon Solution, Inc.
Rev. I
11/22/05
Page 5
IS61LV6416
IS61LV6416L
AC TEST CONDITIONS
ParameterUnit
Input Pulse Level0V to 3.0V
Input Rise and Fall Times3 ns
Input and Output Timing1.5V
and Reference Level
Output LoadSee Figures 1a and 1b
AC TEST LOADS
®
ISSI
1
2
3
319 Ω
3.3V
OUTPUT
30 pF
Including
jig and
scope
Figure 1a.Figure 1b.
READ CYCLE SWITCHING CHARACTERISTICS
SymbolParameterMin.Max.Min.Max.Min.Max.Unit
tRCRead Cycle Time8—10—12—ns
tAAAddress Access Time—8—10—12ns
tOHAOutput Hold Time3—3—3—n s
tACECE Access Time—8—10—12n s
tDOEOE Access Time—5—5—6ns
(2)
tHZOE
tLZOE
tHZCE
tLZCE
tBALB, UB Access Time—6—6—6ns
tHZBLB, UB to High-Z Output040506ns
OE to High-Z Output—5—5—6ns
(2)
OE to Low-Z Output0—0—0—n s
(2
CE to High-Z Output040506ns
(2)
CE to Low-Z Output3—3—3—n s
353 Ω
(1)
(Over Operating Range)
-8 ns-10 ns-12 ns
3.3V
OUTPUT
Including
319 Ω
5 pF
jig and
scope
353 Ω
4
5
6
7
8
9
10
11
tLZBLB, UB to Low-Z Output0—0—0—n s
Notes:
1. Test conditions assume signal transition times of 3 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V and
output loading specified in Figure 1a.
2. Tested with the load in Figure 1b. Transition is measured ±500 mV from steady-state voltage. Not 100% tested.
2. The device is continuously selected. OE, CE, UB, or LB = V
3. Address is valid prior to or coincident with CE LOW transition.
LZB
IL.
DATA VALID
t
HZOE
t
HZCE
t
HZB
6
Integrated Silicon Solution, Inc.
Rev. I
11/22/05
Page 7
IS61LV6416
IS61LV6416L
®
ISSI
WRITE CYCLE SWITCHING CHARACTERISTICS
SymbolParameterMin. Max.Min. Max.Min. Max.Unit
tWCWrite Cycle Time8—10—12—ns
tSCECE to Write End6—8—9—ns
tAWAddress Setup Time8—8—9—ns
to Write End
tHAAddress Hold from Write End0—0—0—ns
tSAAddress Setup Time0—0—0—ns
tPBWLB, UB Valid to End of Write7—8—9—ns
tPWE1/tPWE2WE Pulse Width (OE = HIGH/LOW)6—8—9—ns
tSDData Setup to Write End6—6—6—ns
tHDData Hold from Write End0—0—0—ns
(2)
tHZWE
(2)
tLZWE
Notes:
1. Test conditions assume signal transition times of 3 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V and
output loading specified in Figure 1a.
2. Tested with the load in Figure 1b. Transition is measured ±500 mV from steady-state voltage. Not 100% tested.
3. The internal write time is defined by the overlap of CE LOW and UB or LB, and WE LOW. All signals must be in valid states to
initiate a Write, but any one can go inactive to terminate the Write. The Data Input Setup and Hold timing are referenced to the
rising or falling edge of the signal that terminates the write.
WE LOW to High-Z Output—4—5—6ns
WE HIGH to Low-Z Output3—3—3—ns
(1,3)
(Over Operating Range)
-8 ns-10 ns-12 ns
1
2
3
4
5
6
7
8
9
10
11
12
Integrated Silicon Solution, Inc.
Rev. I
11/22/05
7
Page 8
IS61LV6416
IS61LV6416L
®
ISSI
WRITE CYCLE NO. 1
ADDRESS
CE
WE
UB, LB
OUT
D
(1,2)
(CE Controlled, OE = HIGH or LOW)
t WC
VALID ADDRESS
t SA
t SCE
t AW
t PWE1
t PWE2
t PBW
t HZWE
DATA UNDEFINED
t HA
t LZWE
HIGH-Z
DIN
t SD
DATAIN VALID
t HD
UB_CEWR1.eps
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Integrated Silicon Solution, Inc.
Rev. I
11/22/05
Page 9
IS61LV6416
IS61LV6416L
WRITE CYCLE NO. 2
(1)
(WE Controlled, OE = HIGH during Write Cycle)
t
WC
®
ISSI
ADDRESS
OE
CE
WE
UB, LB
OUT
D
D
IN
LOW
t
SA
DATA UNDEFINED
VALID ADDRESS
t
AW
t
PWE1
t
PBW
t
HZWE
HIGH-Z
t
SD
DATAIN VALID
1
t
HA
2
3
4
t
LZWE
5
t
HD
6
UB_CEWR2.eps
WRITE CYCLE NO. 3 (WE Controlled: OE is LOW During Write Cycle)
t
WC
ADDRESS
OE
CE
WE
UB, LB
OUT
D
D
IN
LOW
LOW
t
SA
DATA UNDEFINED
VALID ADDRESS
t
AW
t
PWE2
t
t
HZWE
PBW
HIGH-Z
t
SD
DATAIN VALID
7
8
t
HA
9
10
11
t
LZWE
t
HD
UB_CEWR3.eps
12
Integrated Silicon Solution, Inc.
Rev. I
11/22/05
9
Page 10
IS61LV6416
IS61LV6416L
®
ISSI
WRITE CYCLE NO. 4
ADDRESS
OE
CE
LOW
WE
UB, LB
OUT
D
D
DATA UNDEFINED
IN
(LB, UB Controlled, Back-to-Back Write)
t
WC
ADDRESS 1ADDRESS 2
t
SA
t
HA
t
SA
t
PBW
WORD 1
t
HZWE
HIGH-Z
t
HD
t
SD
DATA
IN
VALID
t
(1,3)
t
SD
WC
t
PBW
WORD 2
DATA
VALID
t
HA
t
LZWE
t
HD
IN
UB_CEWR4.eps
Notes:
1. The internal Write time is defined by the overlap of CE = LOW, UB and/or LB = LOW, and WE = LOW. All signals must be
in valid states to initiate a Write, but any can be deasserted to terminate the Write. The
tSA, tHA, tSD, and tHD timing is
referenced to the rising or falling edge of the signal that terminates the Write.
2. Tested with OE HIGH for a minimum of 4 ns before WE = LOW to place the I/O in a HIGH-Z state.
3. WE may be held LOW across many address cycles and the LB, UB pins can be used to control the Write function.
10
Integrated Silicon Solution, Inc.
Rev. I
11/22/05
Page 11
IS61LV6416
IS61LV6416L
DATA RETENTION SWITCHING CHARACTERISTICS
®
ISSI
SymbolParameterTest ConditionOptionsMin.Typ.
VDRVDD for Data RetentionSee Data Retention Waveform2.0—3.6V
I
DRData Retention CurrentVDD = 2.0V, CE ≥ VDD – 0.2VIS61LV6416—0.510mA
IS61LV6416L—0.051.5
tSDRData Retention Setup TimeSee Data Retention Waveform0——n s
tRDRRecovery TimeSee Data Retention WaveformtRC——ns
Note 1:
DATA RETENTION WAVEFORM (CE Controlled)
Typical values are measured at V
V
DD
DD
= 3.0V, TA = 25OC and not 100% tested.
SDRtRDR
t
Data Retention Mode
(1)
Max.Unit
1
2
3
4
5
6
GND
VDR
CE
7
CE ≥ VDD - 0.2V
8
9
10
11
12
Integrated Silicon Solution, Inc.
Rev. I
11/22/05
11
Page 12
IS61LV6416
IS61LV6416L
IS61LV6416
ORDERING INFORMATION
Speed (ns)Order Part No.PackageTemperature Range
8IS61LV6416-8TPlastic TSOPCommercial (0°C to +70°C )
8IS61LV6416-8TLPlastic TSOPCommercial (0°C to +70°C ), Lead-free
8IS61LV6416-8BImini BGA (6mm x 8mm)Industrial (-40°C to +85°C )
8IS61LV6416-8TIPlastic TSOPIndustrial (-40°C to +85°C )
8IS61LV6416-8KL
10IS61LV6416-10TPlastic TSOPCommercial (0°C to +70°C )
10IS61LV6416-10TLPlastic TSOPCommercial (0°C to +70°C ), Lead-free
10IS61LV6416-10K
10IS61LV6416-10BImini BGA (6mm x 8mm)Industrial (-40°C to +85°C )
10IS61LV6416-10BLImini BGA (6mm x 8mm)Industrial (-40°C to +85°C ), Lead-free
10IS61LV6416-10TIPlastic TSOPIndustrial (-40°C to +85°C )
10IS61LV6416-10TLIPlastic TSOPIndustrial (-40°C to +85°C ), Lead-free
10IS61LV6416-10KI
10IS61LV6416-10KLI
400-mil Plastic SOJ
400-mil Plastic SOJ
400-mil Plastic SOJ
400-mil Plastic SOJ
Commercial (0°C to +70°C ), Lead-free
Commercial (0°C to +70°C )
Industrial (-40°C to +85°C )
Industrial (-40°C to +85°C ), Lead-free
®
ISSI
12IS61LV6416-12TPlastic TSOPCommercial (0°C to +70°C )
12IS61LV6416-12K
12IS61LV6416-12KL
12IS61LV6416-12BImini BGA (6mm x 8mm)Industrial (-40°C to +85°C )
400-mil Plastic SOJ
400-mil Plastic SOJ
Commercial (0°C to +70°C )
Commercial (0°C to +70°C ), Lead-free
IS61LV6416L
ORDERING INFORMATION
Speed (ns)Order Part No.PackageTemperature Range
8IS61LV6416L-8TPlastic TSOPCommercial (0°C to +70°C )
8IS61LV6416L-8BImini BGA (6mm x 8mm)Industrial (-40°C to +85°C )
8IS61LV6416L-8TIPlastic TSOPIndustrial (-40°C to +85°C )
8IS61LV6416L-8KI
10IS61LV6416L-10TPlastic TSOPCommercial (0°C to +70°C )
10IS61LV6416L-10BImini BGA (6mm x 8mm)Industrial (-40°C to +85°C )
10IS61LV6416L-10TIPlastic TSOPIndustrial (-40°C to +85°C )
10IS61LV6416L-10KI
400-mil Plastic SOJ
400-mil Plastic SOJ
Industrial (-40°C to +85°C )
Industrial (-40°C to +85°C )
12
Integrated Silicon Solution, Inc.
Rev. I
11/22/05
Page 13
PACKAGING INFORMATIONISSI
400-mil Plastic SOJ
Package Code: K
Notes:
N
N/2+1
E1
E
1. Controlling dimension:
millimeters.
2. BSC = Basic lead spacing
between centers.
3. Dimensions D and E1 do not
include mold flash protrusions
and should be measured from
the bottom of the package.