Datasheet IS41LV44054-60JI, IS41LV44054-60J, IS41LV44054-50JI, IS41LV44054-50J, IS41LV44052-60JI Datasheet (ISSI)

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IS41C4405X
IS41LV4405X SERIES ISSI
4M x 4 (16-MBIT) DYNAMIC RAM
WITH FAST PAGE MODE
FEATURES
• Fast Page Mode Access Cycle
• TTL compatible inputs and outputs
• Refresh Interval:
-- 2,048 cycles/32 ms
-- 4,096 cycles/64 ms
• Refresh Mode: RAS-Only, CAS-before-RAS (CBR), and Hidden
• Single power supply: 5V±10% or 3.3V ± 10%
• Byte Write and Byte Read operation via two CAS
• Industrial temperature range -40°C to 85°C
PRODUCT SERIES OVERVIEW
Part No. Refresh Voltage
IS41C44052 2K 5V ± 10%
IS41C44054 4K 5V ± 10%
IS41LV44052 2K 3.3V ± 10%
IS41LV44054 4K 3.3V ± 10%
JUNE 2001
DESCRIPTION
The ISSI 4405x Series is a 4,194,304 x 4-bit high-performance CMOS Dynamic Random Access Memory. The Fast Page Mode allows 2,048 or 4096 random accesses within a single row with access cycle time as short as 20 ns per 4-bit word.
These features make the 4405x Series ideally suited for high-bandwidth graphics, digital signal processing, high-performance computing systems, and peripheral applications.
The 4405x Series is packaged in a 24-pin 300-mil SOJ with JEDEC standard pinouts.
KEY TIMING PARAMETERS
Parameter -50 -60 Unit
RAS Access Time (tRAC)5060ns CAS Access Time (tCAC)1315ns
Column Address Access Time (tAA) Fast Page Mode Cycle Time (tPC) Read/Write Cycle Time (tRC) 84 104 ns
25 30 ns 20 25 ns
PIN CONFIGURATION
24 (26) Pin SOJ
24
23
22
21
20
19
18
17
16
15
14
13
GND
I/O3
I/O2
CAS
OE
A9
A8
A7
A6
A5
A4
GND
1
VCC
2
I/O0
3
I/O1
4
WE
5
RAS
A10
A0
A1
A2
A3
VCC
6
7
8
9
10
11
12
*A11(NC)
* A11 is NC for 2K Refresh devices.
ISSI reserves the right to make changes to its products at any time without notice in order to improve design and supply the best possible product. We assume no responsibility for any errors which may appear in this publication. © Copyright 2001, Integrated Silicon Solution, Inc.
Integrated Silicon Solution, Inc. — 1-800-379-4774
Rev. C
06/24/01
PIN DESCRIPTIONS
A0-A11 Address Inputs (4K Refresh)
A0-A10 Address Inputs (2K Refresh)
I/O0-3 Data Inputs/Outputs
WE Write Enable OE Output Enable RAS Row Address Strobe CAS Column Address Strobe
Vcc Power
GND Ground
NC No Connection
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IS41C4405X
IS41LV4405X S ERIES ISSI
FUNCTIONAL BLOCK DIAGRAM
OE
WE
®
CAS
RAS
A0-A10(A11)
CAS
CONTROL
LOGIC
RAS
CLOCK
GENERATOR
REFRESH COUNTER
ADDRESS
BUFFERS
WE
CAS WE
RAS
CONTROL
LOGICS
DATA I/O BUS
COLUMN DECODERS
SENSE AMPLIFIERS
MEMORY ARRAY
4,194,304 x 4
ROW DECODER
OE
CONTROL
LOGIC
OE
I/O0-I/O3
DATA I/O BUFFERS
TRUTH TABLE
Function RAS CAS WE OE Address tR/tC I/O
Standby H H X X X High-Z
Read L L H L ROW/COL DOUT
Write: Word (Early Write) L L L X ROW/COL DIN
Read-Write L L HLL→H ROW/COL DOUT, DIN
Hidden Refresh Read L→H→L L H L ROW/COL DOUT
RAS-Only Refresh H→L H X X ROW/NA High-Z
CBR Refresh H→L L X X X High-Z
Note:
1. EARLY WRITE only.
2
Write
(1)
LHL L L X ROW/COL DOUT
Integrated Silicon Solution, Inc. 1-800-379-4774
Rev. C
06/24/01
Page 3
IS41C4405X
IS41LV4405X S ERIES ISSI
®
Functional Description
The IS41C4405x and IS41LV4405x are CMOS DRAMs optimized for high-speed During READ or WRITE cycles, each bit is uniquely addressed through the 11 or 12 address bits. These are entered 11 bits (A0-A10) at a time for the 2K refresh device or 12 bits (A0-A11) at a time for the 4K refresh device. The row address is latched by the Row Address Strobe (RAS). The column address is latched by the Column Address Strobe (CAS). RAS is used to latch the first nine bits and CAS is used the latter ten bits.
bandwidth, low power applications.
Memory Cycle
A memory cycle is initiated by bring RAS LOW and it is terminated by returning both RAS and CAS HIGH. To ensures proper device operation and data integrity any memory cycle, once initiated, must not be ended or aborted before the minimum tRAS time has expired. A new cycle must not be initiated until the minimum precharge time tRP, tCP has elapsed.
Read Cycle
A read cycle is initiated by the falling edge of CAS or OE, whichever occurs last, while holding WE HIGH. The column address must be held for a minimum time speci­fied by tAR. Data Out becomes valid only when tRAC, tAA, tCAC and tOEA are all satisfied. As a result, the access time is dependent on the timing relationships between these parameters.
Auto Refresh Cycle
To retain data, 2,048 refresh cycles are required in each 32 ms period, or 4,096 refresh cycles are required in each 64ms period. There are two ways to refresh the memory:
1. By clocking each of the 2,048 row addresses (A0 through A10) or 4096 row addresses (A0 through A11) with RAS at least once every 32 ms or 64ms respectively. Any read, write, read-modify-write or RAS-only cycle refreshes the addressed row.
2.
Using a CAS-before-RAS refresh cycle. CAS-before-RAS refresh is activated by the falling edge of RAS, while holding CAS LOW. In CAS-before-RAS refresh cycle, an internal 9-bit counter provides the row addresses and the external address inputs are ignored.
CAS-before-RAS is a refresh-only mode and no data access or device selection is allowed. Thus, the output remains in the High-Z state during the cycle.
Power-On
After application of the VCC supply, an initial pause of 200 µs is required followed by a minimum of eight initialization cycles (any combination of cycles containing a RAS signal).
During power-on, it is recommended that RAS track with VCC or be held at a valid VIH to avoid current surges.
Write Cycle
A write cycle is initiated by the falling edge of CAS and WE, whichever occurs last. The input data must be valid
at or before the falling edge of CAS or WE, whichever occurs last.
Integrated Silicon Solution, Inc. 1-800-379-4774
Rev. C
06/24/01
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IS41C4405X
IS41LV4405X S ERIES ISSI
®
ABSOLUTE MAXIMUM RATINGS
(1)
Symbol Parameters Rating Unit
VT Voltage on Any Pin Relative to GND 5V –1.0 to +7.0 V
3.3V –0.5 to +4.6
CC Supply Voltage 5V –1.0 to +7.0 V
V
3.3V –0.5 to +4.6
IOUT Output Current 50 mA
PD Power Dissipation 1 W
A Commercial Operation Temperature 0 to +70 °C
T
Industrial Operation Temperature -40 to +85
TSTG Storage Temperature –55 to +125 °C
Note:
1. Stress greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
RECOMMENDED OPERATING CONDITIONS (Voltages are referenced to GND.)
Symbol Parameter Min. Typ. Max. Unit
VCC Supply Voltage 5V 4.5 5.0 5.5 V
3.3V 3.0 3.3 3.6
VIH Input High Voltage 5V 2.4 VCC + 1.0 V
3.3V 2.0 VCC + 0.3
VIL Input Low Voltage 5V –1.0 0.8 V
3.3V –0.3 0.8
TA Commercial Ambient Temperature 0 70 °C
Industrial Ambient Temperature -40 85 °C
CAPACITANCE
Symbol Parameter Max. Unit
CIN1 Input Capacitance: A0-A10(A11) 5 pF CIN2 Input Capacitance: RAS, CAS, WE, OE 7pF CIO Data Input/Output Capacitance: I/O0-I/O3 7 pF
Notes:
1. Tested initially and after any design or process changes that may affect these parameters.
2. Test conditions: T
(1,2)
A = 25°C, f = 1 MHz.
4
Integrated Silicon Solution, Inc. 1-800-379-4774
Rev. C
06/24/01
Page 5
IS41C4405X
IS41LV4405X S ERIES ISSI
®
ELECTRICAL CHARACTERISTICS
(1)
(Recommended Operating Conditions unless otherwise noted.)
Symbol Parameter Test Condition VCC Speed Min. Max. Unit
IIL Input Leakage Current Any input 0V VIN Vcc –55µA
Other inputs not under test = 0V
IIO Output Leakage Current Output is disabled (Hi-Z) –55µA
0V VOUT Vcc
OH
V
Output High Voltage Level
IOH = –5.0 mA, Vcc = 5V 2.4 V IOH = –2.0 mA, Vcc = 3.3V
V
OL
Output Low Voltage Level
IOL = 4.2 mA, Vcc = 5V 0.4 V IOL = 2 mA, Vcc = 3.3V
ICC1 Standby Current: TTL RAS, CAS VIH
Commercial
5V 2 mA
3.3V 0.5
Industrial
5V 3
3.3V 2
ICC2 Standby Current: CMOS RAS, CAS VCC – 0.2V 5V 1mA
3.3V 0.5
ICC3 Operating Current: RAS, CAS, -50 120 mA
Random Read/Write
(2,3)
Address Cycling, tRC = tRC (min.)
-60 110
Average Power Supply Current
ICC4 Operating Current: RAS= VIL, CAS VIH -50 90 mA
Fast Page Mode
(2,3,4)
tRC = tRC (min.) -60 80
Average Power Supply Current
ICC4 Refresh Current: RAS Cycling, CAS VIH -50 120 mA
RAS-Only
(2,3)
tRC = tRC (min.) -60 110
Average Power Supply Current
ICC5 Refresh Current: RAS, CAS Cycling -50 120 mA
(2,3,5)
CBR
tRC = tRC (min.) -60 110
Average Power Supply Current
Notes:
1. An initial pause of 200 µs is required after power-up followed by eight RAS refresh cycles (RAS-Only or CBR) before proper device operation is assured. The eight RAS cycles wake-up should be repeated any time the t
2. Dependent on cycle rates.
3. Specified values are obtained with minimum cycle time and the output open.
4. Column-address is changed once each Fast Page cycle.
5. Enables on-chip refresh and address counters.
REF refresh requirement is exceeded.
Integrated Silicon Solution, Inc. 1-800-379-4774
Rev. C
06/24/01
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IS41C4405X
IS41LV4405X S ERIES ISSI
®
AC CHARACTERISTICS
(1,2,3,4,5,6)
(Recommended Operating Conditions unless otherwise noted.)
-50 -60
Symbol Parameter Min. Max. Min. Max. Units
tRC Random READ or WRITE Cycle Time 84 104 ns tRAC Access Time from RAS tCAC Access Time from CAS
tAA Access Time from Column-Address
(6, 7)
(6, 8, 15)
50 60 ns
13 15 ns
(6)
25 30 ns
tRAS RAS Pulse Width 50 10K 60 10K ns tRP RAS Precharge Time 30 40 ns
(21)
(23)
8 10K 10 10K ns
(9)
9 9 ns
38 40 ns
(10, 20)
12 37 14 45 ns
tCAS CAS Pulse Width tCP CAS Precharge Time tCSH CAS Hold Time tRCD RAS to CAS Delay Time
tASR Row-Address Setup Time 0 0 ns
tRAH Row-Address Hold Time 8 10 ns
(20)
(20)
0 0 ns
8 10 ns
tASC Column-Address Setup Time
tCAH Column-Address Hold Time
tAR Column-Address Hold Time 30 40 ns
(referenced to RAS)
tRAD RAS to Column-Address Delay Time
(11)
10 25 12 30 ns
tRAL Column-Address to RAS Lead Time 25 30 ns tRPC RAS to CAS Precharge Time 5 5 ns tRSH RAS Hold Time 8 10 ns tRHCP RAS Hold Time from CAS Precharge 30 35 ns
(19, 24)
(15, 16)
(15, 24)
(21)
0 0 ns
5 5 ns
315 315 ns
12 15 ns
tCLZ CAS to Output in Low-Z tCRP CAS to RAS Precharge Time
tOD Output Disable Time
tOE Output Enable Time
tOED Output Enable Data Delay (Write) 12 15 ns tOEHC OE HIGH Hold Time from CAS HIGH 5 5 ns tOEP OE HIGH Pulse Width 10 10 ns tOES OE LOW to CAS HIGH Setup Time 5 5 ns
tRCS Read Command Setup Time
(17, 20)
0 0 ns
tRRH Read Command Hold Time 0 0 ns
(referenced to RAS)
(12)
tRCH Read Command Hold Time 0 0 ns
(referenced to CAS)
tWCH Write Command Hold Time
(12, 17, 21)
(17)
8 10 ns
tWCR Write Command Hold Time 40 50 ns
(referenced to RAS)
tWP Write Command Pulse Width
(17)
(17)
8 10 ns
tWPZ WE Pulse Widths to Disable Outputs 7 7 ns
6
Integrated Silicon Solution, Inc. 1-800-379-4774
Rev. C
06/24/01
Page 7
IS41C4405X
IS41LV4405X S ERIES ISSI
®
AC CHARACTERISTICS (Continued)
(1,2,3,4,5,6)
(Recommended Operating Conditions unless otherwise noted.)
-50 -60
Symbol Parameter Min. Max. Min. Max. Units
(14, 17, 20)
(17)
(17, 21)
13 15 ns
8 10 ns
0 0 ns
tRWL Write Command to RAS Lead Time tCWL Write Command to CAS Lead Time
tWCS Write Command Setup Time tDHR Data-in Hold Time (referenced to RAS)39 39 ns
t
ACH Column-Address Setup Time to CAS 15 15 ns
Precharge during WRITE Cycle
tOEH OE Hold Time from WE during 8 10 ns
READ-MODIFY-WRITE cycle tDS Data-In Setup Time tDH Data-In Hold Time
(15, 22)
(15, 22)
(18)
0 0 ns 8 10 ns
tRWC READ-MODIFY-WRITE Cycle Time 108 133 ns tRWD RAS to WE Delay Time during 64 77 ns
(14, 20)
(14)
(14)
26 32 ns 39 47 ns
READ-MODIFY-WRITE Cycle tCWD CAS to WE Delay Time tAWD Column-Address to WE Delay Time tPC Fast Page Mode READ or WRITE 20 25 ns
Cycle Time tRASP RAS Pulse Width 50 100K 60 100K ns tCPA Access Time from CAS Precharge tPRWC READ-WRITE Cycle Time
(24)
(15)
30 35 ns
56 68 ns
tCOH Data Output Hold after CAS LOW 5 5 ns tOFF Output Buffer Turn-Off Delay from 0 12 0 15 ns
CAS or RAS
(13,15,19, 24)
tWHZ Output Disable Delay from WE 310 310 ns tCSR CAS Setup Time (CBR REFRESH) tCHR CAS Hold Time (CBR REFRESH)
(20, 25)
( 21, 25)
5 5 ns 8 10 ns
tORD OE Setup Time prior to RAS during 0 0 ns
HIDDEN REFRESH Cycle tREF Auto Refresh Period 2,048 Cycles 32 32 ms
4,096 Cycles 64 64
tT Transition Time (Rise or Fall)
(2, 3)
150 150 ns
AC TEST CONDITIONS
Output load: Two TTL Loads and 50 pF (Vcc = 5.0V ±10%)
One TTL Load and 50 pF (Vcc = 3.3V ±10%)
Input timing reference levels: VIH = 2.4V, VIL = 0.8V (Vcc = 5.0V ±10%);
VIH = 2.0V, VIL = 0.8V (Vcc = 3.3V ±10%)
Output timing reference levels: VOH = 2.0V, VOL = 0.8V (Vcc = 5V ±10%, 3.3V ±10%)
Integrated Silicon Solution, Inc. 1-800-379-4774
Rev. C
06/24/01
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IS41C4405X
IS41LV4405X S ERIES ISSI
Notes:
1. An initial pause of 200 µs is required after power-up followed by eight RAS refresh cycle (RAS-Only or CBR) before proper device operation is assured. The eight RAS cycles wake-up should be repeated any time the t
IH (MIN) and VIL (MAX) are reference levels for measuring timing of input signals. Transition times, are measured between VIH and
2. V
IL (or between VIL and VIH) and assume to be 1 ns for all inputs.
V
3. In addition to meeting the transition rate specification, all input signals must transit between V monotonic manner.
4. If CAS and RAS = V
5. If CAS = V
IL, data output may contain data from the last valid READ cycle.
IH, data output is High-Z.
6. Measured with a load equivalent to one TTL gate and 50 pF.
7. Assumes that t amount that t
8. Assumes that t
RCD - tRCD (MAX). If tRCD is greater than the maximum recommended value shown in this table, tRAC will increase by the
RCD exceeds the value shown.
RCD tRCD (MAX).
9. If CAS is LOW at the falling edge of RAS, data out will be maintained from the previous cycle. To initiate a new cycle and clear the data output buffer, CAS and RAS must be pulsed for t
10. Operation with the t greater than the specified t
11. Operation within the t greater than the specified t
12. Either t
13. t
RCH or tRRH must be satisfied for a READ cycle.
OFF (MAX) defines the time at which the output achieves the open circuit condition; it is not a reference to VOH or VOL.
RCD (MAX) limit ensures that tRAC (MAX) can be met. tRCD (MAX) is specified as a reference point only; if tRCD is
RCD (MAX) limit, access time is controlled exclusively by tCAC.
RAD (MAX) limit ensures that tRCD (MAX) can be met. tRAD (MAX) is specified as a reference point only; if tRAD is
RAD (MAX) limit, access time is controlled exclusively by tAA.
CP.
14. tWCS, tRWD, tAWD and tCWD are restrictive operating parameters in LATE WRITE and READ-MODIFY-WRITE cycle only. If tWCS • t WCS (MIN), the cycle is an EARLY WRITE cycle and the data output will remain open circuit throughout the entire cycle. If tRWD • t RWD (MIN),
AWD • t AWD (MIN) and tCWD • t CWD (MIN), the cycle is a READ-WRITE cycle and the data output will contain data read from the selected
t cell. If neither of the above conditions is met, the state of I/O (at access time and until CAS and RAS or OE go back to VIH) is indeterminate. OE held HIGH and WE taken LOW after CAS goes LOW result in a LATE WRITE (OE-controlled) cycle.
15. Output parameter (I/O) is referenced to corresponding CAS input.
16. During a READ cycle, if OE is LOW then taken HIGH before CAS goes HIGH, I/O goes open. If OE is tied permanently LOW, a LATE WRITE or READ-MODIFY-WRITE is not possible.
17. Write command is defined as WE going low.
18. LATE WRITE and READ-MODIFY-WRITE cycles must have both t
OD and tOEH met (OE HIGH during WRITE cycle) in order to ensure
that the output buffers will be open during the WRITE cycle. The I/Os will provide the previously written data if CAS remains LOW and OE is taken back to LOW after t
OEH is met.
19. The I/Os are in open during READ cycles once tOD or tOFF occur.
20. Determined by falling edge of CAS.
21. Determined by rising edge of CAS.
22. These parameters are referenced to CAS leading edge in EARLY WRITE cycles and WE leading edge in LATE WRITE or READ-MODIFY-WRITE cycles.
23. CAS must meet minimum pulse width.
24. The 3 ns minimum is a parameter guaranteed by design.
25. Enables on-chip refresh and address counters.
REF refresh requirement is exceeded.
IH and VIL (or between VIL and VIH) in a
®
8
Integrated Silicon Solution, Inc. 1-800-379-4774
Rev. C
06/24/01
Page 9
IS41C4405X
IS41LV4405X S ERIES ISSI
FAST-PAGE-MODE READ CYCLE
t
RC
t
RAS
CAS
t
CRP
t
ASR
t
RAH
t
RAD
t
RCD
t
ASC
t
AR
RAS
t
CSH
t
CAS
t
RAL
t
RSH
t
CLCH
t
CAH
t
RRH
t
RP
®
ADDRESS
WE
I/O
OE
Row Column Row
t
t
RCS
t
AA
t
RAC
t
CAC
t
CLC
Open Open
t
OE
t
OES
Valid Data
RCH
t
OFF
t
(1)
OD
Dont Care
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Rev. C
06/24/01
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IS41C4405X
IS41LV4405X S ERIES ISSI
FAST PAGE MODE READ-MODIFY-WRITE CYCLE
t
RAS
CAS
ADDRESS
WE
t
CRP
t
ASR
t
RAH
Row
t
RAD
t
RCS
t
RCD
t
AR
t
CSH
t
ASC
Column
t
RWD
t
AWD
t
CWD
t
CAS
t
CAH
t
CWL
RASP
t
t
PRWC
t
CAS
t
CP
t
CPWD
t
t
AWD
t
CWD
CAH
t
CWL
t
WP
t
ASC
t
AR
Column Column
t
WP
RSH
t
CAS
t
t
t
CWL
t
RWL
CRP
CAH
t
CP
t
CPWD
t
RAL
t
ASC
t
AWD
t
CWD
t
WP
t
RP
®
OE
I/O
t
RAC
t
CLZ
t
CAC
t
t
t
CLZ
CAC
t
DH
AA
OUT
t
OEA
t
OEZ
t
OED
t
AA
t
CAC
t
OEA
t
OEZ
t
t
DH
t
t
DS
CLZ
OUT
OED
t
DH
t
DS
t
AA
t
OEA
t
OEZ
t
OED
t
DS
OUT ININ IN
Dont Care
10
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Rev. C
06/24/01
Page 11
IS41C4405X
IS41LV4405X S ERIES ISSI
FAST-PAGE-MODE EARLY WRITE CYCLE (OE = DON'T CARE)
tRC
RAS
CAS
tCRP
tRAS
tCSH
tRCD
tAR
tRAD tRAL
tRAHtASR
tASC
tCAS
tCAH tACH
tRSH
tCLCH
tRP
®
ADDRESS
WE
I/O
Row Column Row
tCWL tRWL
tWCR
tWCS
tDHR tDS
tWCH
tWP
tDH
Valid Data
Dont Care
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Rev. C
06/24/01
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IS41C4405X
IS41LV4405X S ERIES ISSI
FAST-PAGE-MODE READ WRITE CYCLE (LATE WRITE and READ-MODIFY-WRITE Cycles)
t
RWC
t
RAS
CAS
t
CRP
t
ASR
t
RAH
t
RAD
t
RCD
t
ASC
t
AR
t
CSH
RAS
t
CAH
t
CAS
t
RSH
t
t
t
RAL
ACH
CLCH
t
RP
®
ADDRESS
WE
I/O
OE
Row Column Row
t
RWD
t
t
RCS
t
AA
t
RAC
t
CAC
t
CLZ
Open Open
t
OE
CWD
t
AWD
Valid D
t
OD
t
OUT
DS
Valid D
IN
t
CWL
t
RWL
t
WP
t
DH
t
OEH
Dont Care
12
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Rev. C
06/24/01
Page 13
IS41C4405X
IS41LV4405X S ERIES ISSI
FAST PAGE MODE EARLY WRITE CYCLE
t
RAS
CAS
ADDRESS
t
CRP
t
ASR
t
RAH
Row
t
RAD
t
RCD
t
AR
t
CSH
t
ASC
Column
t
CAS
t
CAH
t
AR
RASP
t
PC
t
CAS
t
CP
t
ASC
t
CAH
t
CP
Column Column
t
ASC
t
RHCP
t
RSH
t
CAS
t
RAL
t
CAH
t
CRP
t
RP
®
WE
OE
I/O
t
WCS
t
DS
t
WCR
t
DHR
t
WP
Valid DIN
t
CWL
t
WCH
t
DH
t
WCS
t
DS
t
CWL
t
WCS
t
WCH
t
WP
t
DH
t
DS
t
WP
Valid DIN Valid DIN
t
CWL
t
WCH
t
DH
Dont Care
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Rev. C
06/24/01
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IS41C4405X
IS41LV4405X S ERIES ISSI
AC WAVEFORMS
®
READ CYCLE
RAS
CAS
ADDRESS
WE
I/O
(With WE-Controlled Disable)
tCRP
tRAD
tRAHtASR
Row Column
Open Open
tCSH
tRCD tCP
tAR
tASC
tAA
tRAC
tCAC
tCLZ
tCAS
tCAH tASC
tRCH tRCStRCS
tWHZ
Valid Data
tOE tOD
Column
tCLZ
OE
RAS-ONLY REFRESH CYCLE (OE, WE = DON'T CARE)
t
RAS
RAS
t
CRP
CAS
t
RAH
ADDRESS
I/O
t
ASR
Row Row
Open
t
RC
t
RPC
t
Dont Care
RP
14
Dont Care
Integrated Silicon Solution, Inc. 1-800-379-4774
Rev. C
06/24/01
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IS41C4405X
IS41LV4405X S ERIES ISSI
CBR REFRESH CYCLE (Addresses; WE, OE = DON'T CARE)
tRAS tRAStRP tRP
RAS
®
tRPC
tCHR
tCP
CAS
I/O
HIDDEN REFRESH CYCLE
RAS
tRPC
tCSR
(1)
(WE = HIGH; OE = LOW)
t
RAS
Open
t
RP
tCSR
t
RAS
tCHR
Dont Care
t
CRP
t
RCD
CAS
t
AR
t
RAD
t
RAH
t
ASC
Open Open
ADDRESS
I/O
t
ASR
Row Column
OE
Integrated Silicon Solution, Inc. 1-800-379-4774
Rev. C
06/24/01
t
CLZ
t
RAL
t
RAC
t
OE
t
AA
t
CAC
t
CAH
t
RSH
t
ORD
t
CHR
t
Valid Data
OFF
(2)
t
OD
Dont Care
15
Page 16
IS41C4405X
IS41LV4405X S ERIES ISSI
ORDERING INFORMATION
®
Commercial Range: 0
°°
°C to 70
°°
°°
°C
°°
Voltage: 5V
Speed (ns) Order Part No. Refresh Package
50 IS41C44052-50J 2K 300-mil SOJ
60 IS41C44052-60J 2K 300-mil SOJ
Speed (ns) Order Part No. Refresh Package
50 IS41C44054-50J 4K 300-mil SOJ
60 IS41C44054-60J 4K 300-mil SOJ
Voltage: 3.3V
Speed (ns) Order Part No. Refresh Package
50 IS41LV44052-50J 2K 300-mil SOJ
60 IS41LV44052-60J 2K 300-mil SOJ
Speed (ns) Order Part No. Refresh Package
50 IS41LV44054-50J 4K 300-mil SOJ
60 IS41LV44054-60J 4K 300-mil SOJ
16
Integrated Silicon Solution, Inc. 1-800-379-4774
Rev. C
06/24/01
Page 17
IS41C4405X
IS41LV4405X S ERIES ISSI
ORDERING INFORMATION
®
Industrial Range: -40 Voltage: 5V
Speed (ns) Order Part No. Refresh Package
50 IS41C44052-50JI 2K 300-mil SOJ
60 IS41C44052-60JI 2K 300-mil SOJ
Speed (ns) Order Part No. Refresh Package
50 IS41C44054-50JI 4K 300-mil SOJ
60 IS41C44054-60JI 4K 300-mil SOJ
Voltage: 3.3V
Speed (ns) Order Part No. Refresh Package
50 IS41LV44052-50JI 2K 300-mil SOJ
60 IS41LV44052-60JI 2K 300-mil SOJ
°°
°C to 85°C
°°
Speed (ns) Order Part No. Refresh Package
50 IS41LV44054-50JI 4K 300-mil SOJ
60 IS41LV44054-60JI 4K 300-mil SOJ
Integrated Silicon Solution, Inc.
®
ISSI
2231 Lawson Lane
Santa Clara, CA 95054
Tel: 1-800-379-4774 Fax: (408) 588-0806
E-mail: sales@issi.com
www.issi.com
Integrated Silicon Solution, Inc. 1-800-379-4774
Rev. C
06/24/01
17
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