Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case
www.irf.com5
Page 6
IRLR/U7821
A
+
-
15V
V
DS
R
G
20V
V
GS
L
D.U.T
I
AS
Ω
0.01
t
p
DRIVER
+
V
DD
-
Fig 12a. Unclamped Inductive Test Circuit
V
(BR)DSS
t
p
I
AS
Fig 12b. Unclamped Inductive Waveforms
Current Regulator
Same Type as D.U.T.
50KΩ
12V
.2µF
.3µF
D.U.T.
+
V
DS
-
1000
TOP
800
600
400
200
AS
E , Single Pulse Avalanche Energy (mJ)
0
255075100125150175
Starti ng Tj , Junction Temperature( C)
BOTTO M
°
Fig 12c. Maximum Avalanche Energy
Vs. Drain Current
R
V
DS
V
GS
R
G
V
GS
Pulse Width ≤ 1 µs
Duty Factor ≤ 0.1 %
D
D.U.T.
Fig 14a. Switching Time Test Circuit
V
DS
90%
I
D
4.9A
8.5A
12A
V
DD
V
GS
3mA
10%
I
G
Current Sampling Resistors
I
D
Fig 13. Gate Charge Test Circuit
V
GS
t
d(on)tr
t
d(off)tf
Fig 14b. Switching Time Waveforms
6www.irf.com
Page 7
IRLR/U7821
+
-
Reverse
Recovery
Current
Driver Gate Drive
D.U.T. ISDWaveform
D.U.T. VDSWaveform
Inductor Curent
* V
GS
D.U.T
+
-
R
G
+
Circuit Layout Considerations
• Low Stray Inductance
• Ground Plane
-
• Low Leakage Inductance
Current Transformer
-
• dv/dt controlled by R
• Driver same type as D.U.T.
• ISD controlled by Duty Factor "D"
• D.U.T. - Device Under Test
G
+
V
DD
Re-Applied
Voltage
Period
P.W.
Body Diode Forward
Current
di/dt
Diode Recovery
dv/dt
Body Diode Forward Drop
Ripple ≤ 5%
= 5V for Logic Level Devices
D =
P. W .
Period
VGS=10V
V
DD
I
SD
*
Fig 15. Peak Diode Recovery dv/dt Test Circuit for N-Channel
HEXFET® Power MOSFETs
Id
Vds
Vgs
Vgs(th)
Qgs1
Qgs2QgdQgodr
Fig 16. Gate Charge Waveform
www.irf.com7
Page 8
IRLR/U7821
)
Power MOSFET Selection for Non-Isolated DC/DC Converters
Control FET
Special attention has been given to the power losses
in the switching elements of the circuit - Q1 and Q2.
Power losses in the high side switch Q1, also called
the Control FET, are impacted by the R
MOSFET, but these conduction losses are only about
one half of the total losses.
Power losses in the control switch Q1 are given
by;
P
= P
loss
This can be expanded and approximated by;
P
loss
conduction
= I
()
rms
+ I ×
+ Q
()
g
Q
+
This simplified loss equation includes the terms Q
and Q
charge that is included in all MOSFET data sheets.
The importance of splitting this gate-source charge
into two sub elements, Q
Fig 16.
the gate driver between the time that the threshold
voltage has been reached and the time the drain current rises to I
gins to change. Minimizing Q
reducing switching losses in Q1.
put capacitance of the MOSFET during every switching cycle. Figure A shows how Q
parallel combination of the voltage dependant (nonlinear) capacitance’s Cds and Cdg when multiplied by
the power supply input buss voltage.
which are new to Power MOSFET data sheets.
oss
Q
is a sub element of traditional gate-source
gs2
Q
indicates the charge that must be supplied by
gs2
Q
is the charge that must be supplied to the out-
oss
2
Q
× R
gd
i
g
+ P
ds(on)
× Vin× f
switching
+ P
+ I ×
drive
+ P
Q
i
gs2
g
× Vg× f
oss
×Vin× f
2
dmax
and Q
gs1
at which time the drain voltage be-
, can be seen from
gs2
is a critical factor in
gs2
is formed by the
oss
of the
ds(on)
output
× Vin× f
Synchronous FET
The power loss equation for Q2 is approximated
by;
P
= P
loss
conduction
P
= I
loss
+ Qg× Vg× f
+
rms
()
Q
*dissipated primarily in Q1.
For the synchronous MOSFET Q2, R
portant characteristic; however, once again the im-
portance of gate charge must not be overlooked since
it impacts three critical areas. Under light load the
MOSFET must still be turned on and off by the control IC so the gate drive losses become much more
significant. Secondly, the output charge Q
verse recovery charge Qrr both generate losses that
are transfered to Q1 and increase the dissipation in
that device. Thirdly, gate charge will impact the
MOSFETs’ susceptibility to Cdv/dt turn on.
gs2
The drain of Q2 is connected to the switching node
of the converter and therefore sees transitions between ground and Vin. As Q1 turns on and off there is
a rate of change of drain voltage dV/dt which is capacitively coupled to the gate of Q2 and can induce
a voltage spike on the gate that is sufficient to turn
the MOSFET on, resulting in shoot-through current .
The ratio of Qgd/Q
potential for Cdv/dt turn on.
Figure A: Q
+ P
2
× R
ds(on)()
oss
× Vin× f
2
must be minimized to reduce the
gs1
Characteristic
oss
drive
+ P
*
output
+ Q
(
× Vin× f
rr
ds(on)
oss
is an im-
and re-
8www.irf.com
Page 9
TO-252AA (D-Pak) Package Outline
I
N
T
E
R
N
A
T
I
O
N
A
L
L
O
G
O
R
E
C
T
I
F
I
E
R
3
4
1
2
I
R
F
U
1
2
0
9
1
6
A
L
O
T
C
O
D
E
A
S
S
E
M
B
L
Y
E
X
A
M
P
L
E
:
W
I
T
H
A
S
S
E
M
B
L
Y
T
H
I
S
I
S
A
N
I
R
F
R
1
2
0
Y
E
A
R
9
=
1
9
9
9
D
A
T
E
C
O
D
E
L
I
N
E
A
W
E
E
K
1
6
I
N
T
H
E
A
S
S
E
M
B
L
Y
L
I
N
E
"
A
"
A
S
S
E
M
B
L
E
D
O
N
W
W
1
6
,
1
9
9
9
L
O
T
C
O
D
E
1
2
3
4
P
A
R
T
N
U
M
B
E
R
Dimensions are shown in millimeters (inches)
IRLR/U7821
5.46 (.215 )
5.21 (.205 )
1.02 (.040)
1.64 (.025)
1.52 (.060)
1.15 (.045)
1.14 (.045)
2X
0.76 (.030)
2.28 (.090)
6.73 (.265)
6.35 (.250)
- A -
4
1 2 3
1.27 (.050 )
0.88 (.035 )
6.22 (.245)
5.97 (.235)
- B -
0.89 (.035)
3X
0.64 (.025)
0.25 (.010) M A M B
4.57 (.180)
2.38 (.094)
2.19 (.086)
10.42 (.410)
9.40 (.37 0)
NOTES:
1 DIMENSIONING & TOLERANCING PER ANSI Y14.5M, 1982.
2 CONTROLLING DIMENSION : INCH.
3 CONFORMS TO JE DEC OUTLINE TO-252AA.
4 DIMENSIONS SHOWN ARE BEFORE SOLDER DIP,
SOLD ER DIP MAX. +0. 16 (.0 06).
1.14 (.045)
0.89 (.035)
0.58 (.02 3)
0.46 (.01 8)
6.45 (.245)
5.68 (.224)
0.51 (.02 0)
MIN.
0.58 (.023)
0.46 (.018)
LEAD ASSIGNMENTS
1 - GATE
2 - DRAIN
3 - SOURCE
4 - DRAIN
TO-252AA (D-Pak) Part Marking Information
www.irf.com9
Page 10
IRLR/U7821
I-Pak (TO-251AA) Package Outline
Dimensions are shown in millimeters (inches)
5.46 (.215)
5.21 (.205)
1.52 (.060)
1.15 (.045)
- B -
2.28 (.090)
1.91 (.075)
1.14 (.045)
3X
0.76 (.030)
2.28 (.090)
6.73 (.265)
6.35 (.250)
- A -
4
1 2 3
3X
2X
1.27 (.050)
0.88 (.035)
6.22 (.245)
5.97 (.235)
9.65 (.380)
8.89 (.350)
0.89 (.035)
0.64 (.025)
0.25 (.010) M A M B
2.38 (.094)
2.19 (.086)
0.58 (.023)
0.46 (.018)
6.45 (.245)
5.68 (.224)
NOTES:
1 DIMENSIONING & TOLERANCING PER ANSI Y14.5M, 1982.
2 CONTROLLING DIMENSION : INCH.
3 C ONFORMS TO J EDEC OUTLINE TO-25 2AA.
4 D IMENSION S SHOW N ARE BEF ORE SOLDER DIP,
SOLDER DIP MAX. +0.16 (.006).
1.14 (.045)
0.89 (.035)
0.58 (.023)
0.46 (.018)
I-Pak (TO-251AA) Part Marking Information
LEAD ASSIGNMENTS
1 - GATE
2 - DRAIN
3 - SOURCE
4 - DRAIN
10www.irf.com
Page 11
D-Pak (TO-252AA) Tape & Reel Information
Dimensions are shown in millimeters (inches)
TR
TRR
IRLR/U7821
TRL
12.1 ( .47 6 )
11.9 ( .46 9 )
NOTES :
1. CONTROLLIN G DIMENSION : MILLIMETER.
2. ALL DIMENSIONS ARE SHOWN IN MILLIMETERS ( INCHES ).
3. OUTLINE CONFORMS TO EIA-481 & EIA-541.
13 INCH
NOTES :
1. OUTLINE CONFORMS TO EIA-481.
FEED DIRECT ION
Notes:
Repetitive rating; pulse width limited by
max. junction temperature.
Starting T
RG = 25Ω, I
= 25°C, L = 3.2mH
J
= 12A.
AS
Pulse width ≤ 400µs; duty cycle ≤ 2%.
16.3 ( .641 )
15.7 ( .619 )
16.3 ( .641 )
15.7 ( .619 )
8.1 ( .318 )
7.9 ( .312 )
16 mm
FEED DIRECTION
Calculated continuous current based on maximum allowable
junction temperature. Package limitation current is 30A.
When mounted on 1" square PCB (FR-4 or G-10 Material).
For recommended footprint and soldering techniques refer to
application note #AN-994.
Data and specifications subject to change without notice.
This product has been designed and qualified for the Industrial market.
Qualification Standards can be found on IR’s Web site.
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information.08/02
www.irf.com11
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